CN219512292U - Welding type chip test socket suitable for chips with multiple sizes - Google Patents

Abstract

The utility model relates to a welded chip test socket suitable for chips with multiple sizes, which comprises a test cover, buckles, an opening and closing knob assembly, a pressing block assembly, a limiting frame, a PCB adapter plate and a PCB board, wherein the buckles are arranged on two sides of the test cover through rotating shafts and are in rotating connection with the test cover, the opening and closing knob assembly is positioned in the test cover, the pressing block assembly is positioned in the limiting frame, the limiting frame is positioned at the upper end of the PCB adapter plate, a fixed guide seat is embedded in the limiting frame, a test probe retaining plate is arranged in the fixed guide seat, the chips are placed on the test probe retaining plate, and the PCB adapter plate is welded on the PCB board. The beneficial effects of the utility model are as follows: the test cover, the buckle, the pressing block assembly of the opening and closing knob assembly and the limit frame are matched for use, so that the chip test of various shapes and various thicknesses can be adapted, the problems of non-universality, inconvenience in replacement, low applicability and the like of the pressing block are solved, meanwhile, the structure is simple, the whole size is small, the manufacturing cost is low, the reliability is high, and the detection efficiency is high.

Description

Welding type chip test socket suitable for chips with multiple sizes

Technical Field

The utility model relates to the technical field of semiconductor chips, in particular to a welded chip test socket applicable to chips with multiple sizes.

Background

After the semiconductor chip is packaged, the packaged semiconductor element is subjected to confirmation of structure and electrical functions so as to ensure that the semiconductor element meets the system requirement, the process is called packaging test, and a chip test socket is an indispensable consumable in the semiconductor packaging test and plays an important role in connecting the tested chip with the electric signal transmission of a test system board;

the common chip test socket is generally used for directly placing the chip in the chip socket and testing the chip after being connected with the test system board, the chip is easy to move in the test process due to the fact that the test socket is easy to use in the test process, the size of the pressing block is single, and the replacement is inconvenient, so that the chips with different shapes and different thicknesses cannot be tested or errors occur in the test results, and the test results of the chips are not accurate enough.

Disclosure of Invention

The purpose of the utility model is that: a soldered chip test socket suitable for multi-size chips is provided to solve the above-mentioned problems.

In order to achieve the above object, the present utility model provides the following technical solutions: the utility model provides a welded chip test socket suitable for multisize chip, includes test lid, buckle, the knob subassembly that opens and shuts, briquetting subassembly, spacing frame, PCB keysets and test system board, the buckle through the hinge pin set up in test lid both sides and rotate with it and be connected, the knob subassembly that opens and shuts is located in the test lid, the briquetting subassembly is located in the spacing frame, the spacing frame is located PCB keysets upper end, the spacing frame is embedded to be equipped with fixed guide holder, be equipped with test probe holder in the fixed guide holder, the chip has been placed on the test probe holder, PCB keysets welding set up in on the test system board.

Preferably, the opening and closing knob assembly comprises a knob handle and an opening and closing bolt, wherein two adjusting studs are arranged at the lower end of the knob handle, and the lower ends of the two adjusting studs are in threaded connection with the opening and closing bolt.

Preferably, the knob handle is provided with an adjusting hole, and the adjusting hole is a kidney-shaped through hole.

Preferably, the pressing block assembly comprises an upper pressing block and a lower pressing block, a plurality of springs are arranged between the upper pressing block and the lower pressing block, and the lower pressing block is a T-shaped block.

Preferably, a stop bolt is arranged at the upper end of the test cover, and the stop bolt penetrates through the adjusting hole.

Preferably, the limit frame and the fixed guide seat are provided with mounting grooves matched with the PCB adapter plate.

Preferably, the PCB adapter plate is fixedly connected with the limiting frame through a plurality of patch nuts and socket head cap screws.

Preferably, a certain gap is formed between the upper end of the buckle and the test cover, and the lower end of the buckle is connected with the limiting frame in a clamping mode.

The beneficial effects of the utility model are as follows: the utility model provides a welded chip test socket suitable for multisize chip adopts test lid, buckle, the cooperation of knob subassembly briquetting subassembly and spacing frame that opens and shuts to use, but the chip test of multiple appearance of adaptation, multiple thickness has solved because of the briquetting is not general, change inconvenient, the suitability is not high scheduling problem, and the while structure is succinct, and whole small, low in manufacturing cost, reliability are high, and detection efficiency is high.

Drawings

FIG. 1 is a schematic diagram of the overall structure of the present utility model;

FIG. 2 is an exploded view of the overall structure of the present utility model;

FIG. 3 is a schematic diagram of a test system board according to the present utility model.

In the figure: 1-test cover, 2-buckle, 3-opening and closing knob assembly, 31-knob handle, 32-opening and closing bolt, 33-adjusting stud, 34-adjusting hole, 4-press block assembly, 41-upper press block, 42-lower press block, 43-spring, 5-limit frame, 6-PCB adapter plate, 7-fixed guide seat, 8-test probe retaining plate, 9-test system plate, 10-stop bolt, 11-mounting groove, 12-patch nut and 13-hexagon socket head cap screw.

Detailed Description

The present utility model will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present utility model more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the utility model.

Referring to fig. 1-3, a welded chip test socket suitable for chips with multiple sizes comprises a test cover 1, a buckle 2, an opening and closing knob assembly 3, a pressing block assembly 4, a limiting frame 5, a PCB adapter plate 6 and a test system board 9, wherein the buckle 2 is arranged on two sides of the test cover 1 through a hinge shaft and is rotationally connected with the two sides of the test cover 1, the test cover 1 and the limiting frame 5 are locked through the buckle 2, the opening and closing knob assembly 3 is positioned in the test cover 1, the pressing block assembly 4 is positioned in the limiting frame 5 after rotation, the pressing block assembly 4 is used for pressing the chips downwards, the limiting frame 5 is positioned at the upper end of the PCB adapter plate 6, the limiting frame 5 is detachably connected with the PCB adapter plate 6, a fixed guide seat 7 is embedded in the limiting frame 5, the fixed guide seat 7 can be replaced according to the outline size of the chips, a test probe retaining plate 8 is arranged in the fixed guide seat 7, the chips are placed on the test probe retaining plate 8, and the PCB adapter plate 6 is welded on the test system board 9.

The opening and closing knob assembly 3 comprises a knob handle 31 and an opening and closing bolt 32, wherein two adjusting studs 33 are arranged at the lower end of the knob handle 31, the knob handle 31 is positioned at the upper end of the test cover 1, the lower ends of the two adjusting studs 33 are in threaded connection with the opening and closing bolt 32, and the two adjusting studs 33 penetrate through the test cover 1 and are in threaded connection with the opening and closing bolt 32 in the test cover 1.

The knob handle 31 is provided with an adjusting hole 34, and the adjusting hole 34 is a waist-shaped through hole.

The briquetting assembly 4 comprises an upper briquetting 41 and a lower briquetting 42, a plurality of springs 43 are arranged between the upper briquetting 41 and the lower briquetting 42, the lower briquetting 42 is a T-shaped block, the lower pressure is transmitted to the lower briquetting 42 through the springs 43 in a buffering mode, and the springs 43 which are uniformly distributed enable the lower briquetting 42 to be parallel to the chip contact surface.

The upper end of the test cover 1 is provided with a stop bolt 10, the stop bolt 10 penetrates through the adjusting hole 34, and the stop bolt 10 plays a role in limiting the rotation angle of the knob handle 31 when the knob handle is rotated and is used for controlling the pressing block acting force.

The limiting frame 5 and the fixed guide seat 7 are respectively provided with a mounting groove 11 matched with the PCB adapter plate 6, the limiting frame 5 and the fixed guide seat 7 are in hollow design, and the bottom of a loaded chip is pressed against the test probe retaining plate 8 through the mounting grooves 11 and is connected with the PCB adapter plate.

The PCB adapter plate 6 is fixedly connected with the limiting frame 5 through a plurality of patch nuts 12 and socket head cap screws 13, the PCB adapter plate 6 is fixedly welded on the PCB, the limiting frame 5 is fixedly connected with the upper end of the PCB adapter plate through the socket head cap screws 13, and the limiting frame 5 can be replaced according to the outline dimension of a chip.

A certain gap is reserved between the upper end of the buckle 2 and the test cover 1, the lower end of the buckle 2 is clamped and connected with the limiting frame 5, and when the test cover is used, the upper ends of the buckles 2 on two sides of the test cover 1 are inwards extruded to open the lower ends of the buckles, the lower ends of the buckles are separated from the limiting frame 5, and after release, the lower ends of the buckles 2 are clamped on two sides of the limiting frame 5.

Welding a PCB adapter plate 6 of the chip test socket on a test system board for testing, and fixing a limit frame 5 corresponding to the PCB adapter plate 6 through an inner hexagon screw 13;

before the TEST, firstly release buckle 2 and spacing frame 5 separation, take out the whole of TEST lid 1, switching knob subassembly 3 and briquetting subassembly 4, later place the chip on TEST probe keeps board 8, again lock TEST lid 1 and spacing frame 5, rotate knob handle 31, make the downward extrusion briquetting subassembly 4 of switch bolt 32, briquetting subassembly 4 compresses tightly the chip and can TEST, knob handle 31 clockwise rotation is to the end for the TEST state, briquetting 32 compresses tightly the chip down, anticlockwise rotation is to the end for OPEN state, briquetting 32 leaves the chip surface down.

The above examples are provided to further illustrate the utility model and do not limit the utility model to these specific embodiments. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present utility model should be construed as being within the protection scope of the present utility model.

Claims (8)

1. A soldered chip test socket for use with a multi-sized chip, comprising: including test lid (1), buckle (2), switch knob subassembly (3), briquetting subassembly (4), spacing frame (5), PCB keysets (6) and test system board (9), buckle (2) through the hinge pin set up in test lid (1) both sides and rotate with it and be connected, switch knob subassembly (3) are located in test lid (1), briquetting subassembly (4) are located in spacing frame (5), spacing frame (5) are located PCB keysets (6) upper end, spacing frame (5) are embedded to be equipped with fixed guide holder (7), be equipped with test probe holder (8) in fixed guide holder (7), place the chip on test probe holder (8), PCB (6) welding set up in on test system board (9).

2. A soldered chip test socket for multiple size chips according to claim 1, wherein: the opening and closing knob assembly (3) comprises a knob handle (31) and an opening and closing bolt (32), wherein two adjusting studs (33) are arranged at the lower end of the knob handle (31), and the lower ends of the two adjusting studs (33) are in threaded connection with the opening and closing bolt (32).

3. A soldered chip test socket for multiple size chips according to claim 2, wherein: an adjusting hole (34) is formed in the knob handle (31), and the adjusting hole (34) is a kidney-shaped through hole.

4. A soldered chip test socket for multiple size chips according to claim 1, wherein: the briquetting assembly (4) comprises an upper briquetting (41) and a lower briquetting (42), a plurality of springs (43) are arranged between the upper briquetting (41) and the lower briquetting (42), and the lower briquetting (42) is a T-shaped block.

5. A soldered chip test socket for multiple size chips according to claim 3, wherein: the upper end of the test cover (1) is provided with a stop bolt (10), and the stop bolt (10) penetrates through the adjusting hole (34).

6. A soldered chip test socket for multiple size chips according to claim 1, wherein: and the limiting frame (5) and the fixed guide seat (7) are provided with mounting grooves (11) matched with the PCB adapter plate (6).

7. A soldered chip test socket for multiple size chips according to claim 1, wherein: the PCB adapter plate (6) is fixedly connected with the limiting frame (5) through a plurality of patch nuts (12) and socket head cap screws (13).

8. A soldered chip test socket for multiple size chips according to claim 1, wherein: a certain gap is reserved between the upper end of the buckle (2) and the test cover (1), and the lower end of the buckle (2) is in clamping connection with the limiting frame (5).