CN219475646U - Crimping mechanism capable of being vertically depressed and testing device - Google Patents
Crimping mechanism capable of being vertically depressed and testing device Download PDFInfo
- Publication number
- CN219475646U CN219475646U CN202222975634.1U CN202222975634U CN219475646U CN 219475646 U CN219475646 U CN 219475646U CN 202222975634 U CN202222975634 U CN 202222975634U CN 219475646 U CN219475646 U CN 219475646U
- Authority
- CN
- China
- Prior art keywords
- base
- cover plate
- floating
- crimping mechanism
- crimping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
The utility model discloses a crimping mechanism capable of vertically downwards crimping and a testing device, and belongs to the field of crimping testing. The crimping mechanism comprises a base, a cover plate and a probe module. The base is provided with a boss, floating plates which are arranged at intervals in parallel are arranged above the base, the base is connected with the floating plates through a plurality of elastic pieces, the top surface of the floating plates is higher than the top surface of the boss, one side edge of the floating plates is hinged with one side edge of the cover plate, the probe module is located on one side surface of the cover plate, which faces the base, and the probe module is arranged opposite to the boss. According to the crimping mechanism capable of vertically downwards crimping, the probe can be straightened in advance by overturning at first and vertically downwards crimping in the crimping process, so that the probe vertically crimps the pad point, the probe is prevented from obliquely scratching the pad point, and further the connector is prevented from being damaged.
Description
Technical Field
The utility model belongs to the field of crimping test, and particularly relates to a crimping mechanism capable of being vertically depressed and a testing device.
Background
Along with the continuous progress of technology, display panels are rapidly developed in the society of today, and are widely used in the fields of mobile phones, computers and televisions. In order to ensure the service life of products such as mobile phones, computer screens and the like, a series of index tests are required to be carried out on the display panel.
In the related art, when the upper contact is in press connection (the pad point of the connector of the display panel is arranged upwards), the cover plate of the press connection mechanism is provided with the probe module, and the probe in the probe module is pressed down to conduct the pad point (the probe is compressed in the press connection process) by turning the cover plate over, so that the display panel is conducted.
However, the cover plate can drive the probe to overturn in the overturning process, and when the probe contacts with the pad point, the probe is not completely aligned (perpendicular to the pad point), so that the probe can obliquely scratch the pad point, and the connector can be damaged.
Disclosure of Invention
Aiming at the defects or improvement demands of the prior art, the utility model provides a vertically downward pressing crimping mechanism and a testing device, which aim at vertically downward pressing by overturning in advance in the crimping process, so that a probe can be aligned in advance to vertically press pad points, and the probe is prevented from obliquely scratching the pad points, and further the connector is prevented from being damaged.
In a first aspect, the utility model provides a crimping mechanism capable of being vertically depressed, the crimping mechanism comprising a base, a cover plate and a probe module;
the base is provided with a boss, floating plates which are arranged at intervals in parallel are arranged above the base, the base is connected with the floating plates through a plurality of elastic pieces, the top surface of the floating plates is higher than the top surface of the boss, one side edge of the floating plates is hinged with one side edge of the cover plate, the probe module is located on one side surface of the cover plate, which faces the base, and the probe module is arranged opposite to the boss.
Optionally, a plurality of pins arranged at intervals are inserted on the floating plate, each pin is perpendicular to the base, each pin penetrates through the floating plate, a plurality of linear bearings are inserted on the base, and the bottom ends of the pins are coaxially inserted in the inner rings of the corresponding linear bearings.
Optionally, a bump is arranged at the top end of the pin shaft, and the bump is in threaded fit with the base.
Optionally, a rotating shaft is inserted at one side of the floating plate, one side of the cover plate is rotatably sleeved on the rotating shaft, a torsion spring is sleeved on the rotating shaft, and two ends of the torsion spring are respectively abutted against the cover plate and the floating plate.
Optionally, the base is provided with a hook, and the hook is hinged with the base to hook the cover plate.
Optionally, a plurality of limit rods are inserted on the base, the top ends of the limit rods vertically penetrate through the floating plate, the top end parts of the limit rods are provided with limit tables, and the limit tables are located above the floating plate to prop against the floating plate.
Optionally, a plurality of positioning rods are inserted into the floating plate, a plurality of positioning holes are formed in the cover plate, and each positioning rod is movably inserted into the corresponding positioning hole.
Optionally, the top surface of the boss is provided with a connector positioning groove, and the connector positioning groove and the probe module are oppositely arranged.
Optionally, a side surface of the cover plate, which is opposite to the base, is provided with a PCB, and the PCB is in conduction with the probes in the probe module.
In a second aspect, the present utility model provides a testing device comprising a vertically compressible crimping mechanism as described in the first aspect.
The technical scheme provided by the embodiment of the utility model has the beneficial effects that:
for the crimping mechanism capable of being vertically and downwards crimped, when crimping the display panel with the pad point of the connector upwards, firstly, the connector of the display panel is placed on the boss. Then, the cover plate is rotated to enable the cover plate to be buckled with the floating plate, at the moment, the probe module is parallel to the boss, and probes on the probe module can be rotated to the direction perpendicular to the connector in advance. Then, the cover plate is pressed downwards, the cover plate and the floating plate move downwards together, and in the process, the probes in the probe module vertically move downwards, and finally, the press connection and conduction with the pad points on the connector are realized. When the probe contacts the pad point, the probe is adjusted in advance, the probe is vertically pressed against the pad point, and the pad point is not scratched obliquely, so that the connector is prevented from being damaged.
That is, according to the crimping mechanism capable of vertically downwards crimping provided by the embodiment of the utility model, the probe can be aligned in advance by firstly overturning and vertically downwards crimping in the crimping process, so that the probe vertically crimps the pad point, and the probe is prevented from obliquely scratching the pad point, and further the connector is prevented from being damaged.
Drawings
Fig. 1 is a schematic view of a first state of a crimping mechanism capable of being vertically depressed according to an embodiment of the present utility model;
FIG. 2 is a schematic structural view of a base according to an embodiment of the present utility model;
FIG. 3 is a schematic view illustrating a second state of a crimping mechanism capable of being vertically depressed according to an embodiment of the present utility model;
fig. 4 is an assembly schematic diagram of a pin according to an embodiment of the present utility model.
The symbols in the drawings are as follows:
1. a base; 11. a boss; 111. a connector positioning groove; 12. a floating plate; 121. a pin shaft; 122. a bump; 123. a rotating shaft; 124. a torsion spring; 125. a positioning rod; 13. a linear bearing; 14. a hook; 15. a limiting table; 2. a cover plate; 21. positioning holes; 22. a PCB board; 3. a probe module; 100. a connector.
Detailed Description
The present utility model will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present utility model more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the utility model. In addition, the technical features of the embodiments of the present utility model described below may be combined with each other as long as they do not collide with each other.
Fig. 1 is a schematic view of a first state of a vertically downward pressing mechanism according to an embodiment of the present utility model, as shown in fig. 1, the pressing mechanism includes a base 1, a cover 2, and a probe module 3.
Fig. 2 is a schematic structural diagram of a base provided in an embodiment of the present utility model, as shown in fig. 2, a boss 11 is provided on the base 1, floating plates 12 arranged in parallel and spaced above the base 1 are provided, the base 1 and the floating plates 12 are connected by a plurality of elastic members, the top surface of the floating plates 12 is higher than the top surface of the boss 11, one side edge of the floating plates 12 is hinged to one side edge of the cover plate 2, the probe module 3 is located on one side surface of the cover plate 2 facing the base 1, and the probe module 3 and the boss 11 are arranged oppositely.
With the crimping mechanism capable of being vertically depressed provided in the embodiment of the present utility model, when crimping the display panel with the pad point of the connector 100 arranged upward, first, the connector 100 of the display panel is placed on the boss 11. Then, the cover plate 2 is rotated to make the cover plate 2 and the floating plate 12 buckled, at this time, the probe module 3 is parallel to the boss 11, and the probes on the probe module 3 are rotated to a direction perpendicular to the connector 100 in advance. Next, the cover plate 2 is pressed downward, and the cover plate 2 and the floating plate 12 move downward together, and in the process, the probes in the probe module 3 move vertically downward, and finally press-fit conduction with pad points on the connector 100 is achieved (see fig. 3). When the probe contacts the pad point, the probe is aligned in advance, and the probe is vertically pressed against the pad point, so that the pad point is not scratched obliquely, and the connector 100 is prevented from being damaged.
That is, according to the vertically downward pressing mechanism provided by the embodiment of the utility model, the probe can be aligned in advance by turning over and pressing down vertically in the pressing process, so that the probe vertically presses the pad point, and the probe is prevented from obliquely scratching the pad point, and further the connector 100 is prevented from being damaged.
In addition, the elastic member can provide a certain buffering effect, so that the probe is prevented from being damaged due to excessive pressure when the floating plate 12 and the cover plate 2 move downwards.
The elastic member may be a spring, for example.
Fig. 4 is an assembly schematic diagram of a pin shaft provided in an embodiment of the present utility model, as shown in fig. 4, a plurality of pin shafts 121 arranged at intervals are inserted on a floating plate 12, each pin shaft 121 is perpendicular to a base 1, each pin shaft 121 penetrates through the floating plate 12, a plurality of linear bearings 13 are inserted on the base 1, and bottom ends of each pin shaft 121 are coaxially inserted in inner rings of the corresponding linear bearings 13.
In the above embodiment, the pin 121 is inserted into the linear bearing 13, so that the pin 121 can play a guiding role in the vertical downward movement of the floating plate 12 and ensure the downward movement precision of the floating plate 12. The linear bearing 13 can reduce the friction force applied to the pin 121.
Illustratively, the top end of the pin 121 has a protrusion 122, and the protrusion 122 is in threaded engagement with the base 1, so as to connect the pin 121 with the base 1.
Referring to fig. 1 again, a rotating shaft 123 is inserted into one side of the floating plate 12, one side of the cover plate 2 is rotatably sleeved on the rotating shaft 123, a torsion spring 124 is sleeved on the rotating shaft 123, and two ends of the torsion spring 124 respectively abut against the cover plate 2 and the floating plate 12. The hinge 123 is used for hinging the floating plate 12 and the cover plate 2, and the torsion spring 124 can provide restoring force, so that the cover plate 2 can be quickly opened after the test is completed to replace the product.
Illustratively, the base 1 has a hook 14 thereon, and the hook 14 is hinged with the base 1 to hook the cover plate 2, so that the press-contact state can be continuously maintained by the hook 14.
Further, a plurality of positioning rods 125 are inserted on the floating plate 12, a plurality of positioning holes 21 are formed in the cover plate 2, each positioning rod 125 is movably inserted in the corresponding positioning hole 21, and the precision of the cover plate 2 and the probe module 3 buckled on the floating plate 12 can be ensured through the matching of the positioning rods 125 and the positioning holes 21, so that the crimping precision in the subsequent downward movement is ensured.
Illustratively, the top surface of the boss 11 has a connector positioning groove 111, and the connector positioning groove 111 and the probe module 3 are disposed opposite to each other. The connector positioning groove 111 plays a role in positioning the placement of the connector 100.
In one implementation of the present utility model, a plurality of limiting rods (not shown) are inserted on the base 1, the top ends of the limiting rods vertically penetrate through the floating plate 12, the top end of each limiting rod is provided with a limiting table 15, and each limiting table 15 is located above the floating plate 12 so as to be propped against the floating plate 12.
In the above embodiment, the limiting rod plays a role in limiting the floating plate 12, so that before the floating plate 12 is not pressed, the elastic member is in a compressed state to maintain an upward acting force on the floating plate 12 (via the limiting table 15 against the floating plate 12), and the floating plate 12 is prevented from shaking.
In this embodiment, a side of the cover plate 2 facing away from the base 1 has a PCB 22, and the PCB 22 is electrically connected to the probes in the probe module 3.
In the above embodiment, the PCB 22 plays a role in transferring the probe module 3, and the stability is high. After the crimping is completed, the display panel can be conducted by providing an electrical signal to the PCB 22.
The utility model also provides a testing device which comprises the crimping mechanism capable of being vertically depressed.
It should be noted that the compression test object of the present application is not limited to a display panel or a display module, and may be a product such as a semiconductor integrated circuit or a PCB board, which requires a precision compression test.
It will be readily appreciated by those skilled in the art that the foregoing description is merely a preferred embodiment of the utility model and is not intended to limit the utility model, but any modifications, equivalents, improvements or alternatives falling within the spirit and principles of the utility model are intended to be included within the scope of the utility model.
Claims (10)
1. The crimping mechanism capable of being vertically depressed is characterized by comprising a base, a cover plate and a probe module;
the base is provided with a boss, floating plates which are arranged at intervals in parallel are arranged above the base, the base is connected with the floating plates through a plurality of elastic pieces, the top surface of the floating plates is higher than the top surface of the boss, one side edge of the floating plates is hinged with one side edge of the cover plate, the probe module is located on one side surface of the cover plate, which faces the base, and the probe module is arranged opposite to the boss.
2. The crimping mechanism capable of being vertically depressed according to claim 1, wherein a plurality of spaced pins are inserted on the floating plate, each of said pins is perpendicular to said base, each of said pins extends through said floating plate, a plurality of linear bearings are inserted on said base, and the bottom end of each of said pins is coaxially inserted in the inner race of the corresponding linear bearing.
3. The vertically compressible crimping mechanism of claim 2, wherein the top end of the pin has a projection, the projection threadably engaging the base.
4. The crimping mechanism capable of being vertically depressed according to claim 1, wherein a rotating shaft is inserted at one side of said floating plate, one side of said cover plate is rotatably sleeved on said rotating shaft, and said rotating shaft is sleeved with a torsion spring, and both ends of said torsion spring are respectively abutted against said cover plate and said floating plate.
5. The vertically compressible crimping mechanism of claim 4 wherein the base has a hook thereon, the hook being hinged to the base to hook the cover.
6. The vertically downward pressing and connecting mechanism according to any one of claims 1 to 5, wherein a plurality of stopper rods are inserted into the base, the top ends of the stopper rods vertically penetrate through the floating plate, the top end of the stopper rods are provided with stopper tables, and the stopper tables are located above the floating plate to abut against the floating plate.
7. A vertically compressible crimping mechanism according to any one of claims 1 to 5, wherein a plurality of locating posts are inserted into said floating plate, said cover plate having a plurality of locating apertures therein, each of said locating posts being movably inserted into a corresponding one of said locating apertures.
8. The vertically downward pressing and connecting mechanism according to any one of claims 1 to 5, wherein the top surface of the boss is provided with a connector positioning groove, and the connector positioning groove and the probe module are arranged opposite to each other.
9. The crimping mechanism of any one of claims 1-5, wherein a side of the cover plate facing away from the base has a PCB, and the PCB is in electrical communication with the probes of the probe module.
10. A testing device comprising a vertically compressible crimping mechanism as claimed in any one of claims 1 to 9.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202222975634.1U CN219475646U (en) | 2022-11-07 | 2022-11-07 | Crimping mechanism capable of being vertically depressed and testing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202222975634.1U CN219475646U (en) | 2022-11-07 | 2022-11-07 | Crimping mechanism capable of being vertically depressed and testing device |
Publications (1)
Publication Number | Publication Date |
---|---|
CN219475646U true CN219475646U (en) | 2023-08-04 |
Family
ID=87440584
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202222975634.1U Active CN219475646U (en) | 2022-11-07 | 2022-11-07 | Crimping mechanism capable of being vertically depressed and testing device |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN219475646U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN117890632A (en) * | 2024-01-09 | 2024-04-16 | 苏州法特迪科技股份有限公司 | Chip test socket |
-
2022
- 2022-11-07 CN CN202222975634.1U patent/CN219475646U/en active Active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN117890632A (en) * | 2024-01-09 | 2024-04-16 | 苏州法特迪科技股份有限公司 | Chip test socket |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN219475646U (en) | Crimping mechanism capable of being vertically depressed and testing device | |
US8007309B2 (en) | Swayable electronic connector with aligning structure and electronic apparatus employing the same | |
CN111308323A (en) | Aging test seat and aging test device | |
US7172448B2 (en) | Electrical connector | |
CN212008835U (en) | Aging test seat and aging test device | |
US6966783B2 (en) | Contact pin and socket for electrical parts provided with contact pin | |
CN109147631B (en) | Down-pressure height-adjustable display panel conduction crimping structure | |
US6984142B2 (en) | Socket for electrical parts | |
US7955092B2 (en) | Connection base assembly for an IC testing apparatus | |
KR20210124913A (en) | Probe card and probe module thereof | |
CN208173201U (en) | A kind of needle mould laminating mechanism | |
KR100901830B1 (en) | Flexible pcb test socket | |
US6428337B2 (en) | Socket for electrical parts | |
CN213398828U (en) | Capacitive fingerprint module testing base and capacitive fingerprint module testing device | |
CN205562595U (en) | Tool to winding displacement accurate positioning | |
CN111536373B (en) | Bearing structure and game paddle | |
CN213068921U (en) | Prevent tool of bad connector of pressure | |
US6439913B1 (en) | Simplified ZIF socket assembly | |
US20140321083A1 (en) | Electronic device with expansion card | |
KR102678579B1 (en) | Jig for testing printed circuit board | |
CN2488191Y (en) | Fixer for electric connector | |
CN217425467U (en) | Mobile terminal test fixture | |
CN216718501U (en) | Manual push-down mechanical structure | |
CN111198693A (en) | Signal connection device and chip burning device | |
CN219417656U (en) | FCT test equipment |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
GR01 | Patent grant | ||
GR01 | Patent grant |