CN219455436U - Device for high-voltage pulse vibration test of electronic component - Google Patents

Abstract

The utility model provides a device for a high-voltage pulse vibration test of an electronic component, which comprises an insulating base, a PCB (printed circuit board), a first pressing piece, a second pressing piece and a shell, wherein the PCB is arranged on the insulating base, the first pressing piece is arranged on the insulating base and presses the PCB to fix the PCB on the insulating base, a first abdication hole is formed in the first pressing piece, the lower end of the electronic component is welded on the PCB, the upper end of the electronic component upwards penetrates out of the first abdication hole, a hollowed-out hole is formed in a part, which is not welded with the electronic component, of the PCB and is positioned below the electronic component, an insulating paint layer is coated on the PCB, the second pressing piece is arranged between the upper end of the electronic component and the insulating base to downwards press the electronic component, and the shell is arranged between the second pressing piece and the insulating base. The utility model provides a device for high-voltage pulse vibration test of electronic components, which can apply higher voltage to meet the harsher test requirement.

Description

Device for high-voltage pulse vibration test of electronic component

Technical Field

The utility model relates to a device for high-voltage pulse vibration test of electronic components.

Background

The high-voltage pulse vibration test of the electronic component is an important means for determining and evaluating the structural integrity and the performance adaptability of the electronic component in a high-voltage vibration environment, and the mechanical strength limit value of the electronic component package, the internal metallization and lead system, the welding of a chip or a substrate and other components of the device can be detected through the test, so that the electronic component with the mechanical strength lower than the nominal value is removed, and the quality and the performance of the electronic component are ensured.

Along with the continuous improvement of the manufacturing technology of electronic components, the requirements of various industries on the electronic components are continuously improved, and the rated voltage applicable to the electronic components is correspondingly higher and higher, so that the applied voltage is higher when the high-voltage pulse vibration test is carried out on the electronic components. The existing test device cannot meet the high requirements.

Disclosure of Invention

The utility model provides a device for a high-voltage pulse vibration test of an electronic component, which can apply higher voltage to meet the harsher test requirement, so as to ensure the reliability of a test result.

The utility model is realized by the following technical scheme:

the utility model provides a device for electronic components high voltage pulse vibration test, including insulating base, the PCB board, first casting die, second casting die and shell, the PCB board sets up on insulating base, first casting die sets up on insulating base and pushes down the PCB board in order to fix it on insulating base, first hole of stepping down has been seted up to first casting die, electronic components lower extreme welding is on the PCB board and the upper end upwards wears out first hole of stepping down, the part that does not weld with electronic components on the PCB board and lie in electronic components below is provided with the fretwork hole, the coating has insulating paint layer on the PCB board, the second casting die sets up between electronic components upper end and insulating base in order to push down electronic components, the shell sets up between second casting die and insulating base. The first casting die, the rigidity of second casting die realization PCB board, electronic components is fixed to appear resonance, resonance or figure distortion's problem in avoiding the vibration experiment, the PCB board sets up the fretwork hole and coats insulating paint layer, can reduce the area of contact of PCB board and electronic components in order to strengthen the insulativity, thereby can apply bigger voltage and test, satisfy more harsh test condition promptly, guarantee the reliability of test result, also can satisfy the test demand of applying high-pressure vibration of more heterogeneous electronic components, increase test breadth.

Further, a plurality of connecting positions are arranged on the PCB, each connecting position is provided with a positive electrode connecting part and a negative electrode connecting part which are respectively welded with a positive electrode connecting end and a negative electrode connecting end of the electronic component, and a positive electrode connecting point and a negative electrode connecting point which are respectively connected with the positive electrode connecting part and the negative electrode connecting part, and the hollowed holes are formed between the positive electrode connecting part and the negative electrode connecting part of each station, so that the positions where the hollowed holes are formed are skillfully selected, the contact area can be reduced, and the normal use of the PCB can be ensured; each connecting position can be welded with one electronic component, so that a plurality of electronic components can be tested at the same time, and the test efficiency is effectively improved.

Furthermore, the positive electrode connection point of each connection position is connected by a high-voltage line and is led out as a positive electrode, and the negative electrode connection point of each connection position is connected by a high-voltage line and is led out as a negative electrode, so that the safety and the operation feasibility of the voltage applying process can be ensured.

Further, the four corners of the first abdicating hole of the first pressing piece respectively extend inwards to form four downwards pressing parts, and the downwards pressing parts are overlapped with the four corners of the PCB to downwards press the PCB, so that the structure is reasonable.

Further, the second casting die is including setting up the layering in electronic components upper end, seting up the screw at layering both ends, vertical rotation setting on insulating base and pass the screw in order to adjust the screw of layering height, rotate the screw and can adjust layering height for layering and not unidimensional electronic components homoenergetic zonal close connection, effectively play the fixed action.

Further, the second pressing piece further comprises a silica gel pad arranged at the lower end of the pressing bar, and the appearance of the electronic component can be prevented from being damaged.

Further, the first pressing piece is locked on the insulating base through a first screw.

Further, the second pressing member may simultaneously press down the plurality of electronic components in a row.

Further, the shell includes the horizontal part of pressing on the second casting die, sets up at horizontal part both ends and two vertical portions of downwardly extending and set up respectively at two vertical lower extreme and lock the horizontal extension portion on insulating base through the second screw, can avoid the object that pops out when the unexpected cracked of electronic components in the test process to cause the potential safety hazard.

Furthermore, the insulating base, the first pressing piece and the pressing strip are all made of a high-insulating material keep material, so that the pressure resistance level is further improved.

Drawings

The utility model is described in further detail below with reference to the accompanying drawings.

Fig. 1 is a schematic structural view of the present utility model.

Fig. 2 is a schematic view of the structure of the utility model with the outer shell removed.

Fig. 3 is a schematic structural diagram of the first pressing member and the PCB board according to the present utility model.

1, an insulating base; 2. a PCB board; 21. a hollowed hole; 221. a positive electrode connection end; 222. a negative electrode connection end; 223. a positive electrode connection point; 224. a negative electrode connection point; 3. a first press member; 31. a pressing part; 31. a first relief hole; 41. pressing strips; 42. a screw hole; 43. a screw; 51. a horizontal portion; 52. a vertical portion; 53. a horizontal extension; 6. an electronic component.

Detailed Description

As shown in fig. 1 to 3, the apparatus for high voltage pulse vibration test of electronic components includes an insulating base 1, a PCB board 2, a first pressing member 3, a second pressing member, and a housing. The PCB board 2 sets up on insulating base 1, first casting die 3 sets up on insulating base 1 and pushes down PCB board 2 in order to fix it on insulating base 1, first hole 31 of stepping down has been seted up to first casting die 3, electronic components 6 lower extreme welding is on PCB board 2 and the upper end upwards wears out first hole 31 of stepping down, the part that does not weld with electronic components 6 and lie in electronic components 6 below on the PCB board 2 is provided with fretwork hole 21, the coating has insulating paint layer on the PCB board 2, the second casting die sets up between electronic components 6 upper end and insulating base 1 in order to push down electronic components 6, the shell sets up between second casting die and insulating base 1.

The PCB board 2 is rectangular, and a plurality of connection sites are provided thereon, each of which is connected with one electronic component 6. More specifically, the connection sites have a positive electrode connection part and a negative electrode connection part welded with the positive electrode connection end 221 and the negative electrode connection end 222 of the electronic component 6, respectively, a positive electrode connection point 223 and a negative electrode connection point 224 connected with the positive electrode connection part and the negative electrode connection part, respectively, the positive electrode connection point 223 of each connection site is connected by a high voltage wire and is led out as a positive electrode, the negative electrode connection point 224 of each connection site is connected by a high voltage wire and is led out as a negative electrode, and a hollowed-out hole 21 is formed between the positive electrode connection part and the negative electrode connection part of each station.

The first pressing piece 3 is locked on the insulating base 1 through a first screw, a first abdication hole 31 formed in the first pressing piece 3 is rectangular, four corners of the first abdication hole 31 respectively extend inwards to form four pressing parts 31, and each pressing part 31 is respectively overlapped with four corners of the PCB 2 to press the PCB 2 downwards.

The second pressing piece comprises a pressing strip 41 arranged at the upper end of the electronic component 6, a silica gel pad arranged at the lower end of the pressing strip 41, screw holes 42 formed at two ends of the pressing strip 41, and a screw 43 vertically arranged on the insulating base 1 in a rotating mode and penetrating through the screw holes 42 to adjust the height of the pressing strip 41. In this embodiment, the pressing bar 41 may simultaneously press down three electronic components 6 in a longitudinal horizontal row. For electronic components 6 of different sizes, the height of the pressing strip 41 can be adjusted by rotating the screw 43, so that the pressing strip 41 is tightly connected with the electronic components 6.

The housing includes a horizontal portion 51 pressed against the second pressing member, two vertical portions 52 provided at both ends of the horizontal portion 51 and extending downward, and horizontal extending portions 53 provided at lower ends of the two vertical portions 52, respectively, and locked to the insulating base 1 by second screws.

In the embodiment, the insulating base 1, the first pressing piece 3 and the pressing strip 41 are all made of a high-insulating material keeper, so that the withstand voltage of the device in an experiment can reach 12KV, and various voltage selections are met. The device can also be used for other mechanical test projects, such as impact, collision, drop, jolt, centrifugal test and the like.

The foregoing description is only illustrative of the preferred embodiments of the present utility model and is not to be construed as limiting the scope of the utility model, i.e., the utility model is not to be limited to the details of the claims and the description, but rather is to cover all modifications which are within the scope of the utility model.

Claims (10)

1. A device for electronic components high voltage pulse vibration test, its characterized in that: including insulating base, the PCB board, first casting die, second casting die and shell, the PCB board sets up on insulating base, first casting die sets up on insulating base and pushes down the PCB board in order to fix it on insulating base, first hole of stepping down has been seted up to first casting die, electronic components lower extreme welding is on the PCB board and the upper end upwards wears out first hole of stepping down, the part that does not weld with electronic components and lie in electronic components below is provided with the fretwork hole on the PCB board, the coating has insulating paint layer on the PCB board, the second casting die sets up in order to push down electronic components between electronic components upper end and insulating base, the shell sets up between second casting die and insulating base.

2. The apparatus for high voltage pulse vibration testing of electronic components according to claim 1, wherein: the PCB is provided with a plurality of connecting positions, each connecting position is provided with a positive electrode connecting part and a negative electrode connecting part which are welded with a positive electrode connecting end and a negative electrode connecting end of the electronic component respectively, and a positive electrode connecting point and a negative electrode connecting point which are connected with the positive electrode connecting part and the negative electrode connecting part respectively, and hollow holes are formed between the positive electrode connecting part and the negative electrode connecting part of each station.

3. The apparatus for high voltage pulse vibration testing of electronic components according to claim 2, wherein: the positive electrode connection point of each connection position is connected by a high-voltage line and is led out as a positive electrode, and the negative electrode connection point of each connection position is connected by a high-voltage line and is led out as a negative electrode.

4. A device for high voltage pulse vibration testing of electronic components according to claim 1 or 2 or 3, characterized in that: four corners of the first abdicating hole of the first pressing piece respectively extend inwards to form four pressing parts, and the pressing parts are overlapped with the four corners of the PCB to press the PCB downwards.

5. A device for high voltage pulse vibration testing of electronic components according to claim 1 or 2 or 3, characterized in that: the second pressing piece comprises a pressing strip arranged at the upper end of the electronic component, screw holes formed at two ends of the pressing strip, and a screw rod vertically arranged on the insulating base in a rotating mode and penetrating through the screw holes to adjust the height of the pressing strip.

6. The device for high-voltage pulse vibration testing of electronic components according to claim 5, wherein: the second pressing piece further comprises a silica gel pad arranged at the lower end of the pressing bar.

7. A device for high voltage pulse vibration testing of electronic components according to claim 1 or 2 or 3, characterized in that: the first pressing piece is locked on the insulating base through a first screw.

8. A device for high voltage pulse vibration testing of electronic components according to claim 1 or 2 or 3, characterized in that: the second press may simultaneously press down the plurality of electronic components in a column.

9. A device for high voltage pulse vibration testing of electronic components according to claim 1 or 2 or 3, characterized in that: the shell comprises a horizontal part pressed on the second pressing piece, two vertical parts arranged at two ends of the horizontal part and extending downwards, and horizontal extending parts respectively arranged at the lower ends of the two vertical parts and locked on the insulating base through second screws.

10. A device for high voltage pulse vibration testing of electronic components according to claim 1 or 2 or 3, characterized in that: the insulating base, the first pressing piece and the pressing strip are all made of a high-insulating material keeper.