CN219417926U

CN219417926U - Expansion device and test system based on multichannel TYPEC interface

Info

Publication number: CN219417926U
Application number: CN202223214827.1U
Authority: CN
Inventors: 黄雄飞
Original assignee: Guangzhou Shixiang Technology Co Ltd
Current assignee: Guangzhou Shixiang Technology Co Ltd
Priority date: 2022-12-01
Filing date: 2022-12-01
Publication date: 2023-07-25
Anticipated expiration: 2032-12-01

Abstract

The disclosure provides an extension device and a test system based on a multipath TYPEC interface. The expansion device based on the multipath TYPE EC interface comprises a TYPE EC input interface, a USB expansion module, a DP expansion module and a plurality of TYPE EC output interfaces; the TYPE EC input interface is used for being connected with test equipment; the TYPEC output interfaces are used for being connected with a plurality of devices to be tested; the TYPE EC input interface is connected with a plurality of TYPE EC output interfaces through the USB expansion module and the DP expansion module. The expansion device is connected with the test equipment through the TYPE C input interface, and is used for obtaining test signals, and the TYPE C output interfaces are arranged to respectively transmit the test signals to each equipment to be tested, so that synchronous connection between the equipment to be tested and the test equipment is realized, synchronous function test is realized, and the expansion device has the advantages of high test efficiency and low test cost.

Description

Expansion device and test system based on multichannel TYPEC interface

Technical Field

The utility model relates to the field of USB interface expansion, in particular to an expansion device and a test system based on a multipath TYPE C interface.

Background

Functional test is needed to be carried out on the intelligent glasses in the production process of the intelligent glasses, and as the data transmission interface of the intelligent glasses is a TYPE C interface, test equipment provided with the TYPE C interface is needed to be adopted for testing the intelligent glasses. In general, the test device is only configured with a single TYPEC interface, and can only be used for being connected with a single intelligent glasses to realize the function test or the aging test of the single intelligent glasses, so that the problems of low test efficiency, high test cost and the like exist.

Disclosure of Invention

In order to overcome the problems existing in the related art, the embodiment of the disclosure provides an expansion device and a test system based on a multipath TYPEC interface, and the expansion device can connect a plurality of devices to be tested with the TYPEC interface of the test device at the same time, so that synchronous test of the plurality of devices to be tested is realized, and the expansion device has the advantages of high test efficiency and low test cost.

According to a first aspect of an embodiment of the present disclosure, there is provided an expansion device based on a multipath type ec interface, including a type ec input interface, a USB expansion module, a DP expansion module, and a plurality of type ec output interfaces;

the TYPE EC input interface is used for being connected with test equipment; the TYPEC output interfaces are used for being connected with a plurality of devices to be tested; the TYPE EC input interfaces are connected with a plurality of TYPE EC output interfaces through the USB expansion module and the DP expansion module;

the TYPEC input interface is used for receiving a test signal output by the test equipment, dividing the test signal into a first test signal and a second test signal, and transmitting the first test signal and the second test signal to the USB expansion module and the DP expansion module respectively; the USB expansion module receives the first test signals, is divided into a plurality of identical first test signals, and transmits the identical first test signals to each TYPE C output interface respectively, and outputs the same to each device to be tested through the TYPE C output interfaces; the DP expansion module receives the second test signals, divides the second test signals into a plurality of identical second test signals, respectively transmits the second test signals to each TYPE C output interface, and outputs the second test signals to each device to be tested through the TYPE C output interfaces.

According to a second aspect of the embodiments of the present disclosure, there is provided a test system, including a test device, a plurality of devices under test, and an expansion device based on a multipath TYPEC interface according to any one of the embodiments above;

and the devices to be tested are simultaneously connected to the test device through the expansion device based on the multipath TYPEC interface.

By applying the technical scheme of the embodiment of the disclosure, the TYPE C input interface is arranged to be connected with the test equipment to obtain the test signal, and the TYPE C output interfaces are arranged to respectively transmit the test signal to each equipment to be tested, so that synchronous connection between the equipment to be tested and the test equipment is realized, synchronous function test is realized, and the device has the advantages of high test efficiency and low test cost.

It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the disclosure.

For a better understanding and implementation, the present disclosure is described in detail below with reference to the drawings.

Drawings

Fig. 1 is a schematic block diagram of an expansion device based on a multipath type ec interface according to an embodiment of the present disclosure;

FIG. 2 is a pin definition diagram of a TYPE EC interface shown in an embodiment of the present disclosure;

fig. 3 is a functional block diagram of a test system shown in an embodiment of the present disclosure.

Reference numerals illustrate: 100. an expansion device; 11. a TYPEC input interface; 12. a USB expansion module; 13. a DP expansion module; 131. DP changes HDMI chip; 132. HDMI changes the DP chip; 14. a TYPEC output interface; 200. a testing device; 300. and the device to be tested.

Detailed Description

Reference will now be made in detail to exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numbers in different drawings refer to the same or similar elements, unless otherwise indicated. The implementations described in the following exemplary examples are not representative of all implementations consistent with the present disclosure. Rather, they are merely examples of apparatus and methods consistent with some aspects of the present disclosure as detailed in the accompanying claims.

The terminology used in the present disclosure is for the purpose of describing particular embodiments only and is not intended to be limiting of the disclosure. As used in this disclosure and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It should also be understood that the term "and/or" as used herein refers to and encompasses any or all possible combinations of one or more of the associated listed items.

It should be understood that although the terms first, second, third, etc. may be used in this disclosure to describe various information, these information should not be limited to these terms. These terms are only used to distinguish one type of information from another. For example, first information may also be referred to as second information, and similarly, second information may also be referred to as first information, without departing from the scope of the present disclosure. The word "if"/"if" as used herein may be interpreted as "at … …" or "at … …" or "in response to a determination", depending on the context.

The embodiment of the disclosure provides an extension device and test system based on multichannel TYPEC interface, and this extension device can be simultaneously with a plurality of equipment that awaits measuring and the TYPEC interface connection of test equipment, realizes the synchronous test of a plurality of equipment that await measuring, has the efficiency of software testing height, advantage that the testing cost is low.

Embodiments of the present disclosure will be described below with reference to the accompanying drawings.

Referring to fig. 1 and 3, fig. 1 is a schematic block diagram of an expansion device based on a multi-path type ec interface according to an embodiment of the disclosure; fig. 3 is a functional block diagram of a test system shown in an embodiment of the present disclosure.

According to a first aspect of an embodiment of the present disclosure, there is provided an expansion device based on a multi-path type ec interface, including a type ec input interface 11, a usb expansion module 12, a DP expansion module 13, and a plurality of type ec output interfaces 14.

The TYPE EC input interface 11 is used for connecting with a TYPE EC interface of the test equipment 200; the TYPE EC output interfaces 14 are used for connecting with TYPE EC interfaces of the devices 300 to be tested; the TYPE EC input interface 11 is connected with a plurality of TYPE EC output interfaces 14 through the USB expansion module 12 and the DP expansion module 13.

The TYPEC input interface 11 is configured to receive a test signal output by the test device 200, divide the test signal into a first test signal and a second test signal, and transmit the first test signal and the second test signal to the USB expansion module 12 and the DP expansion module 13, respectively; the USB extension module 12 receives the first test signal, divides the first test signal into a plurality of identical first test signals, and transmits the first test signals to each type ec output interface 14, and outputs the first test signals to each device 300 to be tested through the type ec output interfaces 14; the DP extension module 13 receives the second test signal, divides the second test signal into a plurality of identical second test signals, and transmits the second test signals to each type ec output interface 14, and outputs the second test signals to each device 300 to be tested through the type ec output interfaces 14, thereby synchronously implementing the test of a plurality of devices to be tested.

In this embodiment, TYPC input interface and TYPE EC output interface are USB Type-C interface. The USB Type-C interface is a USB interface appearance standard and can be used for realizing charging, display, data transmission and the like.

As shown in fig. 2, fig. 2 is a pin definition diagram of the TYPC interface. The USB Type-C interface has 4 pairs of TX/RX differential lines, 2 pairs of USBD+/D-, a pair of SBUs, 2 CCs, and 4 VBUS and 4 ground lines.

In an alternative embodiment, the TYPE EC input interface 11 includes a first USB data port (2 pairs of USBD+/D-); the TYPE EC output interface 14 includes a second USB data port (2 pairs of USBD+/D-); the USB extension module 12 has a USB input interface and a USB output interface, the USB input interface is connected to the first USB data port, and the USB output interface is connected to the second USB data port of each TYPEC output interface 14, so as to divide the first test signal into multiple paths and send the multiple paths to each device under test.

If the USB extension module 12 has a plurality of USB output interfaces, each of the USB output interfaces may be connected to a second USB data port of the corresponding type ec output interface 14.

In an alternative embodiment, the TYPE EC input interface 11 includes a first differential data port (4 pairs of TX/RX differential lines); the TYPE EC output interface 14 includes a second differential data port (4 pairs of TX/RX differential lines); the DP expansion module 13 has a DP input interface and a DP output interface, the DP input interface is connected to the first differential data port (4 pairs of TX/RX differential lines), and the DP output interface is connected to the second differential data port (4 pairs of TX/RX differential lines) of each of the TYPEC output interfaces 14, so as to divide the second test signal into multiple paths and send the multiple paths to each device under test.

Optionally, the DP extension module 13 includes a DP-to-HDMI chip 131, and a plurality of HDMI-to-DP chips 132 connected to the DP-to-HDMI chip 131; the DP-to-HDMI chip 131 is connected to the first differential data port, and the HDMI-to-DP chip 132 is connected to the second differential data port; the DP-to-HDMI chip 131 receives the second test signal transmitted by the first differential data port, and converts the second test signal into an HDMI signal to transmit to each HDMI-to-DP chip 132; each HDMI-to-DP chip 132 receives the HDMI signal, converts the HDMI signal into a second test signal, transmits the second test signal to the second differential data port of the corresponding type ec output interface 14, and transmits the second test signal to the corresponding device under test 300.

Optionally, the USB expansion module 12 is a USB2.0 expansion module. The USB2.0 expansion module is a USB expansion chip, and the specific model is not limited.

Optionally, the expansion device 100 includes several USB expansion modules 12 with the same structure and several DP expansion modules 13 with the same structure, so as to connect more devices 300 to be tested with the test device 200 at the same time, and perform synchronous test, so as to speed up the test efficiency.

Optionally, the type ec input interface may be a type ec male socket or a type ec female socket, so long as the type ec input interface can be connected with a type ec interface of the test device in a matching manner; the TYPE EC output interface can be a TYPE EC male seat or a TYPE EC female seat, so long as the TYPE EC output interface can be in matched connection with the TYPE EC interface of the device to be tested.

On the basis of the above embodiment, when the device function test is performed by the expansion device 100 based on the multiple type ec interfaces, the expansion device 100 operates in the dp+usb2.0 mode, that is, the USB expansion module 12 is configured to multiplex and expand the USB2.0 test signal and output the multiplexed and expanded USB2.0 test signal to the type ec output interface 14, and the DP expansion module 13 is configured to multiplex and expand the DP test signal and output the multiplexed and expanded DP test signal to the type ec output interface 14 and further output the multiplexed and expanded DP test signal to each device under test 300.

On the basis of the embodiment, when the device test is performed by adopting the expansion device, the first test signal can be divided into four paths of identical first test signals, the second test signal can be divided into four paths of identical second test signals, and the four paths of identical second test signals are transmitted to four devices to be tested, namely, the four devices to be tested are synchronously tested by the same test device.

In other embodiments, the method can also be used for synchronously testing more devices under test.

By applying the technical solution of the above embodiment of the present disclosure, a test signal is obtained by setting the type ec input interface 11 to connect with the test device 200, and setting a plurality of type ec output interfaces 14 to transmit the test signal to each device 300 to be tested, so as to realize synchronous connection between a plurality of devices 300 to be tested and the test device 200, and realize synchronous function test; one test device is not required to be configured for each device to be tested, so that the number of the test devices is reduced, and the test cost is reduced. The technical scheme has the advantages of high testing efficiency and low testing cost.

Meanwhile, the aging signals can be transmitted to each device 200 to be tested through the expansion device, so that each device 200 to be tested is driven to work normally, components are aged, and stability of the device to be tested is enhanced.

According to a second aspect of the present disclosure, a test system is provided. As shown in fig. 3, the test system includes a test device 200, a plurality of devices under test 300, and the expansion device 100 based on the multiple TYPEC interfaces according to the above embodiment; the plurality of devices 300 to be tested are simultaneously connected to the testing device 200 through the expansion device 100 based on the multipath TYPEC interface, and when the testing device 200 outputs a testing signal, the testing signal is split through the expansion device 100 and then output to each device 300 to be tested, so that synchronous testing of the plurality of devices 300 to be tested is realized.

The device 300 to be tested may be a smart glasses, and the test system may be a smart glasses test system.

The smart glasses may be AR glasses, VR glasses, or MR glasses.

The test device 200 may be an electronic device such as a personal computer, an industrial computer, an interactive tablet, a notebook computer, or a smart phone, which is not limited in this embodiment.

By using the test system, the TYPE C input interface 11 is arranged to be connected with the test equipment 200 to obtain the test signals, and the TYPE C output interfaces 14 are arranged to respectively transmit the test signals to the equipment 300 to be tested, so that synchronous connection between the equipment 300 to be tested and the test equipment 200 is realized, synchronous function test is realized, and the test system has the advantages of high test efficiency and low test cost.

The foregoing examples merely represent several embodiments of the present disclosure, which are described in more detail and are not to be construed as limiting the scope of the utility model. It should be noted that variations and modifications can be made by those skilled in the art without departing from the spirit of the disclosure, which are within the scope of the disclosure.

Claims

1. The expansion device based on the multipath TYPE EC interface is characterized by comprising a TYPE EC input interface, a USB expansion module, a DP expansion module and a plurality of TYPE EC output interfaces;

2. The expansion device based on multiple TYPEC interfaces of claim 1, wherein said TYPEC input interface comprises a first USB data port; the TYPE EC output interface comprises a second USB data port;

the USB expansion module is provided with a USB input interface and a USB output interface, the USB input interface is connected with the first USB data port, and the USB output interface is connected with the second USB data port of each TYPEC output interface.

3. The expansion device based on the multiple TYPEC interfaces according to claim 2, wherein the USB expansion module is a USB expansion chip.

4. The expansion device based on a multiple-way type ec interface of claim 1, wherein the type ec input interface comprises a first differential data port; the TYPE EC output interface comprises a second differential data port;

the DP expansion module is provided with a DP input interface and a DP output interface, the DP input interface is connected with the first differential data port, and the DP output interface is connected with the second differential data port of each TYPEC output interface.

5. The expansion device based on the multiple TYPE EC interface according to claim 4, wherein the DP expansion module comprises a DP-to-HDMI chip and a plurality of HDMI-to-DP chips connected with the DP-to-HDMI chip;

the DP-to-HDMI chip is connected with the first differential data port, and the HDMI-to-DP chip is connected with the second differential data port;

the DP-to-HDMI chip receives a second test signal transmitted by the first differential data port, converts the second test signal into an HDMI signal and transmits the HDMI signal to each HDMI-to-DP chip;

and each HDMI-to-DP chip receives the HDMI signal, converts the HDMI signal into a second test signal, transmits the second test signal to a second differential data port of the TYPEC output interface, and transmits the second test signal to the corresponding device to be tested.

6. The expansion device based on the multiple TYPEC interfaces according to claim 1, wherein the USB expansion module is a USB2.0 expansion module.

7. The expansion device based on the multiple TYPEC interfaces according to claim 1, comprising a plurality of USB expansion modules with the same structure, and a plurality of DP expansion modules with the same structure.

8. The expansion device based on the multiple-type ec interface according to any one of claims 1 to 7, wherein the expansion device operates in dp+usb2.0 mode when performing a device function test by the expansion device.

9. A test system, comprising a test device, a plurality of devices under test, and the expansion device based on the multiple-channel type ec interface according to any one of claims 1 to 8;

10. The test system of claim 9, wherein the device under test is a smart glasses and the test system is a smart glasses test system.