CN219391806U - Device for measuring solid thermal diffusivity by utilizing photo-thermal deflection technology - Google Patents
Device for measuring solid thermal diffusivity by utilizing photo-thermal deflection technology Download PDFInfo
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- CN219391806U CN219391806U CN202223306579.3U CN202223306579U CN219391806U CN 219391806 U CN219391806 U CN 219391806U CN 202223306579 U CN202223306579 U CN 202223306579U CN 219391806 U CN219391806 U CN 219391806U
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Abstract
The utility model discloses a device for measuring solid thermal diffusivity by utilizing a photo-thermal deflection technology, which comprises a detection table and a measuring device, wherein an objective table is arranged on the detection table; the detection table also comprises a lifting mechanism and a fixed bracket; the top of the fixed bracket is provided with a groove matched with the objective table, the objective table is connected in the groove in a sliding way, and the outer side wall of the objective table is in transition fit with the inside of the groove; the lifting mechanism is fixedly arranged on the fixed support, and the top of the power output end of the lifting mechanism is abutted against the bottom of the objective table; the lifting mechanism pushes the objective table to move towards the direction close to the detection light emitter; the detection platform is also connected with a vacuum pump, and the air suction end of the vacuum pump is connected to the bottom of the groove so as to provide negative pressure in the groove, so that the objective table has a movement trend of moving towards the bottom of the groove. The objective table is difficult for producing the slope in the gliding in-process of recess relatively, and the precision of adjusting is high.
Description
Technical Field
The utility model relates to the technical field of photo-thermal deflection technology measurement, in particular to a device for measuring solid thermal diffusivity by using the photo-thermal deflection technology.
Background
The traditional method for measuring the thermal diffusivity of the solid by using the laser as the excitation light needs to periodically modulate and scan the excitation light, meanwhile, the measurement is also needed to be carried out by using a phase-locked amplifier, the structure of the experimental device is relatively complex, and the period of time is consumed for the periodic modulation.
In the prior art, a beam of step light is emitted to focus on a solid surface for a period of time, the sample absorbs light energy and converts the light energy into heat energy, so that time-varying temperature field distribution is formed in the sample and air near the surface of the sample, and finally the temperature field distribution is stable. When the deflection signal is stabilized, the excitation light incident to the sample is blocked, the deflection signal is attenuated to zero from a stable state, and the thermal parameter of the sample can be measured by analyzing the attenuation speed of the deflection signal. The method only needs to extract the ascending part or the descending part of the photo-thermal light deflection time-varying signal, does not need to periodically modulate and scan the exciting light, does not need to use a lock-in amplifier for measurement, simplifies experimental devices and shortens measurement time.
In the experimental process, the rising edge and the falling edge of the photo-thermal light deflection signal are not only related to the thermal parameters of the sample to be detected, but also related to the height of the detection light from the surface of the sample to be detected, so that the distances between the surfaces of different samples to be detected and the detection light are required to be kept consistent. The prior object stage is easy to incline the plane of the object stage when the height is adjusted, and the measured result is influenced by different heights of the object to be measured.
Disclosure of Invention
The utility model aims to provide a device for measuring solid thermal diffusivity by utilizing photo-thermal deflection technology, which is used for solving the technical problems.
The utility model adopts the technical scheme that: the device for measuring the solid thermal diffusivity by utilizing the photo-thermal deflection technology comprises a detection table and a measuring device, wherein an objective table is arranged at the top of the detection table, the measuring device is provided with a detection light emitter, and the light emitted by the detection light emitter is perpendicularly irradiated on the plane of the objective table;
the detection table also comprises a lifting mechanism and a fixed bracket; the top of the fixed bracket is provided with a groove matched with the objective table, the objective table is connected in the groove in a sliding way, and the outer side wall of the objective table is in transition fit with the inside of the groove;
the lifting mechanism is fixedly arranged on the fixed support, and the top of the power output end of the lifting mechanism is abutted against the bottom of the objective table; the lifting mechanism pushes the objective table to move towards the direction close to the detection light emitter;
the detection platform is also connected with a vacuum pump, and the air suction end of the vacuum pump is connected to the bottom of the groove so as to provide negative pressure in the groove, so that the objective table has a movement trend of moving towards the bottom of the groove.
Further, the lifting mechanism comprises a lifting column and a fixed frame; the lifting mechanism is fixedly arranged on the fixed support through the fixed frame, and the top of the lifting column is propped against the bottom of the objective table.
Furthermore, the top surface of the lifting column is of a plane structure.
The other scheme is that the top surface of the lifting column is of a spherical structure.
The preferable technical proposal is that the lifting column is made of a screw micrometer.
Preferably, the measuring device comprises a probe light emitter and an output signal assembly; wherein the detection light emitter comprises a first detection light emitter component and a second detection light emitter component; the top surface of the fixed support of the detection platform is defined to be a horizontal plane, the first detection light emitter component is arranged above the detection platform, detection light emitted by the first detection light emitter component is perpendicularly irradiated on the plane of the object stage, the second detection light emitter component is arranged on one side of the detection platform, detection light emitted by the second detection light emitter component irradiates on the plane of the object stage along the horizontal direction and refracts out from the plane of the object stage, and the output signal component is arranged on the other side of the detection platform and corresponds to the second detection light emitter component and is used for receiving and processing the detection light emitted by the second detection light emitter component.
Further, a first probe light emitter, an attenuator, a first lens, a chopper disk, a reflector and a second lens are sequentially arranged along the emission of the first probe light emitter component.
Further, a second probe light emitter and a third lens are sequentially arranged along the emission of the second probe light emitter component.
Furthermore, the output signal component is sequentially provided with an optical filter, a position detector, an amplifier and a storage oscilloscope in the direction away from the detection table.
Further, the device also comprises a shell, wherein the first detection light emitter component is fixed on the inner top wall of the shell, and the second detection light emitter component and the output signal component are respectively fixed on the opposite inner side walls of the shell; the housing is also provided with an operating window.
The beneficial technical effects of the utility model are as follows:
this device simple structure inlays to be established in the recess through the objective table, adopts the cooperation of high accuracy, is difficult for producing the slope at the gliding in-process objective table of drive objective table relative groove when elevating system, and the vacuum pump applys the negative pressure to the recess for apply the planar even effort of perpendicular to the objective table, under the spacing effect of recess, the objective table steady reciprocates, makes the laminating that the objective table is tight at the elevating system top under the negative pressure effect simultaneously, guarantees the precision of regulation, ensures that the objective table everywhere after the adjustment is highly consistent, guarantees the accuracy of experimental result.
Other characteristic features and advantages of the utility model will become apparent from the following description of exemplary embodiments, which is to be read with reference to the accompanying drawings.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments of the utility model and together with the description, serve to explain the principles of the utility model. In the drawings, like reference numerals are used to identify like elements. The drawings, which are included in the description, illustrate some, but not all embodiments of the utility model. Other figures can be derived from these figures by one of ordinary skill in the art without undue effort.
FIG. 1 is a cross-sectional view of a first embodiment of the present utility model;
FIG. 2 is an enlarged view of a portion of FIG. 1;
FIG. 3 is a perspective view of a sample to be tested placed on a test station according to an embodiment of the present utility model;
FIG. 4 is an exploded view of a first embodiment of a test station;
FIG. 5 is an exploded view of a first embodiment of a test station;
fig. 6 is an exploded view of a test bench according to a second embodiment of the utility model.
Description of the reference numerals:
the device comprises a detection platform 100, a measuring device 200, a sample 300 to be detected, a stage 1, a lifting mechanism 2, a fixed support 3, a vacuum pump 4, a detection light emitter 5, an output signal component 6, a slot 11, a lifting column 21, a fixed frame 22, a groove 31, a through hole 32, a mounting hole 33, a first detection light emitter component 51 and a second detection light emitter component 52.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present utility model more apparent, the technical solutions of the embodiments of the present utility model will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present utility model, and it is apparent that the described embodiments are some embodiments of the present utility model, but not all embodiments of the present utility model. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model. It should be noted that, in the case of no conflict, the embodiments and features in the embodiments may be arbitrarily combined with each other.
The device for measuring solid thermal diffusivity by using photo-thermal deflection technique is described in detail below with reference to the accompanying drawings and examples.
Example 1
As shown in fig. 1 to 5, the present utility model provides a device for measuring thermal diffusivity of a solid by using a photo-thermal deflection technique. The device comprises a detection table 100 and a measuring device 200, wherein an objective table 1 is arranged at the top of the detection table 100, the measuring device 200 is provided with a detection light emitter 5, and light emitted by the detection light emitter 5 vertically irradiates on the plane of the objective table 1. The sample 300 to be detected is placed on the stage 1, and the measuring device 200 is used for measuring the sample 300 to be detected.
In this embodiment, the sample 300 to be tested is a solid material, such as aluminum, silicon, titanium, germanium, etc., and the surface area of the sample 300 to be tested is 25mm 2 Above, thickness is more than or equal to 0.6mm, and the size of the sample 300 that waits to detect of different materials is different, and this device adjustable objective table 1 and the distance between the probe light guarantees objective table 1 at the level of moving in-process keeps objective table 1 plane simultaneously, and then guarantees that the surface of different samples 300 that wait to detect keeps unanimous with the distance of probe light beam.
In this embodiment, the detection table 100 includes a lifting mechanism 2 and a fixed bracket 3; the top of the fixed support 3 is provided with a groove 31 matched with the objective table 1, the objective table 1 is connected in the groove 31 in a sliding way, and the outer side wall of the objective table 1 is in transition fit with the inside of the groove 31. Specifically, a gap is formed between the inside of the groove 31 and the outer side wall of the objective table 1, and the gap is 0.04mm, so that the objective table 1 can be ensured not to incline on the plane of the objective table 1 due to the fact that the groove 31 limits the objective table 1 in the sliding process of the objective table 1 relative to the groove 31. Of course, in other embodiments, the gap between the inner wall of the recess 31 and the outer side wall of the stage 1 can be made smaller when the inner wall of the recess 31 and the outer side wall of the stage 1 are smoother and have lower roughness.
The lifting mechanism 2 is fixedly arranged on the fixed bracket 3, and the top of the power output end of the lifting mechanism 2 is abutted against the bottom of the objective table 1; the lifting mechanism 2 pushes the object stage 1 to move towards the direction approaching the detection light emitter 5. Due to the limitation of the groove 31 to the objective table 1, the objective table 1 is not easy to incline in the moving process, and the stability is good. The lifting mechanism 2 can adjust the distance between the sample 300 to be detected and the probe light according to the height of the sample 300 to be detected.
The bottom wall of the groove 31 is provided with a through hole 32, as shown in fig. 4, the lifting mechanism 2 comprises a lifting column 21 and a fixed frame 22, and the top of the lifting column 21 is a power output end; the lifting mechanism 2 is fixedly arranged on the fixed bracket 3 through a fixed frame 22, and the fixed frame 22 can be fixed on the bottom wall of the fixed bracket 3 through bolts; the lifting column 21 passes through the through hole 32 and the top of the lifting column 21 abuts against the lower bottom surface of the bottom of the stage 1. Of course, in other embodiments, the fixing frame 22 may be fixed to the fixing bracket 3 by welding, and those skilled in the art may design the fixing frame as needed.
In this embodiment, as shown in fig. 1, the detection table 100 is further connected with a vacuum pump 4, and the suction end of the vacuum pump 4 is connected to the bottom of the groove 31 to provide negative pressure in the groove 31, so that the stage 1 has a movement tendency of moving toward the bottom of the groove 31. Specifically, a mounting hole 33 is provided on the bottom wall of the groove 31 of the fixing bracket 3, and the suction end of the vacuum pump 4 is fixedly provided on the mounting hole 33.
When the lifting mechanism 2 is far away from the detection light, the vacuum pump 4 is started to pump air in the groove 31, and a negative pressure area is formed in the groove 31, so that uniform acting force perpendicular to the plane of the object stage 1 is applied to the object stage 1, and meanwhile, under the self weight of the object stage 1 and the limiting effect of the groove 31, the object stage 1 can stably move towards the lifting mechanism 2 and tightly attached to the top of the lifting mechanism 2, and the movement is smooth; further ensuring the stability of the stage 1 during the up-and-down sliding of the stage relative to the recess 31.
In this embodiment, as shown in fig. 2, a slot 11 adapted to the top of the lifting column 21 is provided on the bottom surface of the stage 1, the stage 1 is sleeved on the lifting column 21, specifically, the size of the slot 11 is larger than the size of the top of the lifting column 21, so that the top of the lifting column 21 contacts with the inner top wall of the slot 11 of the stage 1, and the outer side wall of the lifting column 21 does not contact with the side wall of the slot 11; the influence of the shaking of the lifting column 21 possibly generated by the lifting column on the object stage 1 in the lifting process can be reduced, so that the object stage 1 slides in the relative groove 31 stably.
As shown in fig. 5, the top of the lifting column 21 is in a planar structure, the lifting column 21 is in surface contact with the objective table 1, and the lifting column 21 is abutted against the central position of the lower bottom surface of the objective table 1, so that the sliding stability of the objective table 1 relative to the groove 31 is ensured.
In this embodiment, the lifting column 21 is made of a screw micrometer, which has high precision, and can be accurate to 0.01mm. The screw micrometer is provided with an adjusting knob and a fine adjusting knob; specifically, the top end of the spiral micrometer is a power output end and is abutted against the lower bottom surface of the objective table 1; the adjusting knob and the fine tuning knob are positioned at the lower end of the spiral micrometer.
In this embodiment, as shown in fig. 5, the stage 1 has a circular structure; in other embodiments, the stage 1 may be square, elliptical, or the like, but is not limited thereto.
In this particular embodiment, as shown in fig. 1, measurement apparatus 200 includes a detection light emitter 5 and an output signal component 6, detection light emitter 5 including a first detection light emitter component 51 and a second detection light emitter component 52; the top surface of the fixed support defining the detection platform is a horizontal plane, the first detection light emitter component 51 is arranged above the detection platform 100, the first detection light emitter component 51 emits detection light to be vertically irradiated on the plane of the objective table 1, the second detection light emitter component 52 is arranged on one side of the detection platform 100, the second detection light emitter component 52 emits detection light to be irradiated on the plane of the objective table 1 along the horizontal direction and refracted out, and the output signal component 6 is arranged on the other side of the detection platform 100 and corresponds to the second detection light emitter component and is used for receiving and processing the detection light.
In this embodiment, as shown in fig. 1, a first probe light emitter, an attenuator, a first lens, a chopper disk, a reflecting mirror, and a second lens are sequentially disposed along the light path emitted by the first probe light emitter component 51.
In this embodiment, as shown in fig. 1, a second probe light emitter and a third lens are sequentially disposed along the light path emitted by the second probe light emitter component 52.
In this embodiment, as shown in fig. 1, the output signal assembly is sequentially provided with an optical filter, a position detector, an amplifier and a storage oscilloscope in a direction away from the detection table 100.
In this embodiment, as shown in fig. 1, the optical transceiver further comprises a housing, the first probe optical transmitter component 51 is fixed on the inner top wall of the housing, and the second probe optical transmitter component 52 and the output signal component 6 are respectively fixed on two opposite inner side walls of the housing; the housing is also provided with an operating window through which the lifting mechanism 2 is controlled to rise or fall. Specifically, when the distance between the sample 300 to be detected and the probe light needs to be reduced, the screw micrometer is adjusted to move the stage 1 in a direction approaching to the probe light; when the distance between the sample 300 to be detected and the probe light needs to be large; the whole screw micrometer moves the stage 1 in a direction approaching the probe light.
In this embodiment, the first laser transmitter is a semiconductor laser; the second laser transmitter is a He-Ne laser, and the He-Ne laser is a low-frequency laser.
Example two
As shown in fig. 6, the difference between the present embodiment and the first embodiment is that the top surface of the lifting column 21 has a spherical structure, the lower bottom surface of the stage 1 is provided with a spherical groove larger than the spherical structure, the spherical structure of the top surface of the lifting column 21 is abutted in the spherical groove, and the top surface of the lifting column 21 is in point contact with the stage 1. The influence of the shaking of the lifting column 21 possibly generated by the lifting column on the object stage 1 during the lifting process can be further reduced, so that the object stage 1 slides in the relative groove 31 stably.
The specific use process of the device comprises the following steps:
the semiconductor laser emits detection light, the detection light passes through the attenuator and is focused on the chopping disk through the first lens, the first lens focuses to enable the beam diameter of the detection light to be far smaller than the slit width of the chopping disk, the chopping disk carries out low-frequency modulation on the focused detection light, the detection light is emitted to the second lens through the reflecting mirror to be focused on the surface of the sample 300 to be detected again until stable temperature field distribution is formed on the surface of the sample 300 to be detected, and finally stable refractive index gradient distribution is formed.
The He-Ne laser emits detection light to sweep the surface of the sample 300 to be detected, which has formed stable refractive index gradient distribution, the propagation direction deflects, the detection light enters the optical filter, the deflection is measured through the position detector, the measured output signal is amplified by the amplifier and then sent to the storage oscilloscope, finally the output signal is output to the external computer for displaying, and the data is output, thus completing the detection. The measurement principle refers to paper, namely a novel method for measuring solid thermal diffusivity by utilizing a photo-thermal-optical deflection technology.
It is noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that an article or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such article or apparatus. Without further limitation, an element defined by the phrase "comprising … …" does not exclude the presence of other like elements in an article or apparatus that comprises the element.
The above embodiments are only for illustrating the technical scheme of the present utility model, not for limiting the same, and the present utility model is described in detail with reference to the preferred embodiments. It will be understood by those skilled in the art that various modifications and equivalent substitutions may be made to the technical solution of the present utility model without departing from the spirit and scope of the technical solution of the present utility model, and the present utility model is intended to be covered by the scope of the appended claims.
Claims (10)
1. The device for measuring the solid thermal diffusivity by utilizing the photo-thermal deflection technology comprises a detection table and a measuring device, wherein an objective table is arranged on the detection table, the measuring device is provided with a detection light emitter, and the detection light emitter emits light rays to vertically irradiate on the objective table; the method is characterized in that:
the detection table also comprises a lifting mechanism and a fixed bracket; the top of the fixed bracket is provided with a groove matched with the objective table, the objective table is connected in the groove in a sliding way, and the outer side wall of the objective table is in transition fit with the inside of the groove;
the lifting mechanism is fixedly arranged on the fixed support, and the top of the power output end of the lifting mechanism is abutted against the bottom of the objective table; the lifting mechanism pushes the objective table to move towards the direction close to the detection light emitter;
the detection platform is also connected with a vacuum pump, and the air suction end of the vacuum pump is connected to the bottom of the groove so as to provide negative pressure in the groove, so that the objective table has a movement trend of moving towards the bottom of the groove.
2. The apparatus for measuring thermal diffusivity of a solid using photo-thermal deflection techniques of claim 1, wherein: the lifting mechanism comprises a lifting column and a fixed frame; the bottom wall of the groove is provided with a through hole, the lifting mechanism is fixedly arranged on the fixed support through the fixed frame, the lifting column penetrates through the through hole, and the top of the lifting column abuts against the bottom of the objective table.
3. The apparatus for measuring thermal diffusivity of a solid using photothermal deflection techniques of claim 2, wherein: the top surface of the lifting column is of a plane structure.
4. The apparatus for measuring thermal diffusivity of a solid using photothermal deflection techniques of claim 2, wherein: the top surface of the lifting column is of a spherical structure.
5. The apparatus for measuring thermal diffusivity of a solid using photothermal deflection techniques of claim 2, wherein: the lifting column is made of a spiral micrometer.
6. The apparatus for measuring thermal diffusivity of a solid using photo-thermal deflection techniques of claim 1, wherein: the measuring device comprises a detection light emitter and an output signal component; wherein the detection light emitter comprises a first detection light emitter component and a second detection light emitter component; the top surface of a fixed support of a detection table is defined to be a horizontal plane, a first detection light emitter component is arranged above the detection table, detection light emitted by the first detection light emitter component is perpendicularly irradiated on the plane of an objective table, a second detection light emitter component is arranged on one side of the detection table, detection light emitted by the second detection light emitter component irradiates on the plane of the objective table along the horizontal direction and refracts out from the plane of the objective table, and an output signal component is arranged on the other side of the detection table and corresponds to the second detection light emitter component and is used for receiving and processing the detection light emitted by the second detection light emitter component.
7. The apparatus for measuring thermal diffusivity of a solid using photo-thermal deflection techniques of claim 6, wherein: the first detection light emitter, the attenuator, the first lens, the chopper disk, the reflector and the second lens are sequentially arranged along the light path emitted by the first detection light emitter component.
8. The apparatus for measuring thermal diffusivity of a solid using photo-thermal deflection techniques of claim 6, wherein: the second detection light emitter and the third lens are sequentially arranged along the light path emitted by the second detection light emitter component.
9. The apparatus for measuring thermal diffusivity of a solid using photo-thermal deflection techniques of claim 6, wherein: the output signal assembly is sequentially provided with an optical filter, a position detector, an amplifier and a storage oscilloscope in the direction away from the detection table.
10. The apparatus for measuring thermal diffusivity of a solid using photo-thermal deflection techniques of claim 6, wherein: the first detection light emitter component is fixed on the inner top wall of the shell, and the second detection light emitter component and the output signal component are respectively fixed on opposite inner side walls of the shell; the housing is also provided with an operating window.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223306579.3U CN219391806U (en) | 2022-12-09 | 2022-12-09 | Device for measuring solid thermal diffusivity by utilizing photo-thermal deflection technology |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223306579.3U CN219391806U (en) | 2022-12-09 | 2022-12-09 | Device for measuring solid thermal diffusivity by utilizing photo-thermal deflection technology |
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| Publication Number | Publication Date |
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| CN219391806U true CN219391806U (en) | 2023-07-21 |
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| CN202223306579.3U Active CN219391806U (en) | 2022-12-09 | 2022-12-09 | Device for measuring solid thermal diffusivity by utilizing photo-thermal deflection technology |
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| CN (1) | CN219391806U (en) |
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