CN219320412U - Precession type probe mechanism and electronic element detection device - Google Patents

Abstract

The utility model belongs to the field of electronic element detection, and particularly relates to a screw-in type probe mechanism and an electronic element detection device. Comprises a probe translation mechanism; a detection assembly coupled to the probe translation mechanism for driving the detection assembly toward or away from an element detection location; the detection assembly comprises a probe seat connected to the probe translation mechanism, a rotating mechanism and a probe are arranged on the probe seat, a first gear is arranged at the power output end of the rotating mechanism, a second gear meshed with the first gear is sleeved on the probe, and the rotating mechanism is used for driving the probe to axially rotate. The utility model can realize stable contact and nondestructive test of the electronic element covered by the carrier tape sealing material film, does not need to increase the size of the probe or use materials with higher hardness, is not easy to cause material waste, and has the advantages of long service life and high detection precision.

Description

Precession type probe mechanism and electronic element detection device

Technical Field

The utility model belongs to the field of electronic element detection, and particularly relates to a screw-in type probe mechanism and an electronic element detection device.

Background

In the modern electronic component mounting industry, in order to protect electronic components such as resistors, capacitors, transistors, diodes, etc. from contamination and damage during transportation, the electronic components are carried and housed in pockets of a carrier tape, and a closed package is formed by sealing a sealing material film (i.e., a material film) over the carrier tape. When an electronic component under the coverage of a material film needs to be tested, a detection device is required to position the electronic component, and a feeding probe, a penetrating material film and a contact of the electronic component are required to realize the test. In the process of penetrating the material film, as the material film is mainly PET, PC and the like, the hardness of the material film is higher than that of PVC, and the sharpness of the probe is reduced after the detection device works for many times, the effect of penetrating the material film by the probe is poor, so that the probe cannot stably contact with an electronic element, and the probe needs to be replaced frequently.

To solve this problem, a mode of applying a larger force to the probe when the material film is pierced and the probe contacts the electronic component is generally selected in the industry, however, besides the need to use a material with a larger size and higher hardness to manufacture the probe, on one hand, applying a larger force to the electronic component is very likely to cause the problems of breaking, edge breakage, short circuit, open circuit and the like of the electronic component taking ceramic as a matrix, and material waste is caused; on the other hand, when detecting some small-size electronic elements such as 01005 resistor, the larger-size probe can only adopt a 2-wire electrical measurement scheme due to limited space, and the detection precision is low.

Therefore, there is a need for a screw-in probe mechanism and an electronic component detecting device that can improve the service life of the probe, are less prone to waste materials, and have high detection accuracy.

Disclosure of Invention

Aiming at the defects of the prior art, the utility model provides the precession type probe mechanism and the electronic element detection device, which can realize stable contact and nondestructive test of the electronic element covered by the carrier tape sealing material film, do not need to increase the size of a probe or use materials with higher hardness, are not easy to cause material waste, and have the advantages of long service life and high detection precision.

In order to achieve the above purpose, the present utility model adopts the following technical scheme:

a precession probe mechanism, comprising:

a probe translation mechanism;

a detection assembly coupled to the probe translation mechanism for driving the detection assembly toward or away from an element detection location;

the detection assembly comprises a probe seat connected to the probe translation mechanism, a rotating mechanism and a probe are arranged on the probe seat, a first gear is arranged at the power output end of the rotating mechanism, a second gear meshed with the first gear is sleeved on the probe, and the rotating mechanism is used for driving the probe to axially rotate.

Further, a plurality of probes are arranged on the probe seat, the probes are arranged around the rotating mechanism, and the second gear on each probe is meshed with the first gear.

Further, the probe seat comprises a probe base connected to the probe translation mechanism and a probe fixing seat arranged on the probe base, and the rotating mechanism and the probe are arranged on the probe fixing seat.

Further, the device further comprises a detection assembly base, the probe translation mechanism comprises a first sliding rail arranged on the detection assembly base and a first sliding block slidably connected to the first sliding rail, the detection assembly is arranged on the first sliding block, and when the first sliding block slides on the first sliding rail, the probe is close to or far away from the element detection position.

Further, the detection assembly base is provided with two detection assemblies, and the displacement directions of the two detection assemblies are not parallel to each other.

Further, the two detection assemblies are respectively provided with a pulley and a reset spring on the probe seat, the probe translation mechanism further comprises a second sliding rail arranged above the detection assemblies and a second sliding block slidably connected to the second sliding rail, a lower pressing block is arranged on the second sliding block and is close to the two pulleys, when the second sliding block moves downwards, the lower pressing block presses the detection assemblies to move towards the direction close to the element detection position, and the reset springs are stretched.

Further, a guide block is arranged on the base of the detection assembly, a guide hole is formed in the guide block, and the probe penetrates through the guide hole.

The utility model also provides an electronic component detection device which comprises a carrier flow channel and the screw-in probe mechanism, wherein the component detection position is on the carrier flow channel.

Further, the electronic component detecting device further comprises a first bearing plate, the precession type probe mechanism is arranged on the first bearing plate, a transverse translation mechanism is further arranged on the first bearing plate, and the transverse translation mechanism is used for driving the detecting assembly to transversely move relative to the first bearing plate.

Further, the electronic component detecting device further comprises a second bearing plate, the first bearing plate is arranged on the second bearing plate, a longitudinal translation mechanism is further arranged on the second bearing plate, and the longitudinal translation mechanism is used for driving the first bearing plate to longitudinally move relative to the second bearing plate.

The utility model has the beneficial effects that:

according to the utility model, the probe translation mechanism is arranged and used for driving the detection assembly to move, the rotating mechanism and the probe are arranged, and the second gear rotates and drives the probe to rotate under the drive of the first gear, so that the precession type feeding of the probe is realized, the probe is easier to penetrate through a material film, no larger force is required to be applied to the probe, the waste of materials is not easy to be caused, the service life is long, and more probes can be used for detection in the detection process because the size of the probe is not required to be increased, and the detection precision is improved; through the arrangement of the plurality of probes, kelvin four-wire detection is convenient to realize, and the detection precision is high; by arranging the pressing block and the pulley, the two detection assemblies can be simultaneously pushed to move when the pressing block presses the pulley, and by arranging the reset spring, the automatic reset of the two detection assemblies can be conveniently realized after the detection is finished; by arranging the guide block and the guide hole, the guide function is realized when the probe moves; the carrier tape runner is arranged for placing the carrier tape; the transverse translation mechanism is used for driving the detection assembly to transversely move; the longitudinal translation mechanism is used for driving the first bearing plate to longitudinally move; the utility model can realize stable contact and nondestructive test of the electronic element covered by the carrier tape sealing material film, does not need to increase the size of the probe or use materials with higher hardness, is not easy to cause material waste, and has the advantages of long service life and high detection precision.

Drawings

FIG. 1 is a schematic diagram of an electronic component inspection apparatus according to the present utility model;

FIG. 2 is a schematic diagram of an exploded structure of the electronic component inspection apparatus of the present utility model;

FIG. 3 is a schematic view showing a partial structure of an electronic component inspection apparatus according to the present utility model;

FIG. 4 is a schematic diagram of an exploded construction of the precession probe mechanism of the present utility model;

FIG. 5 is a schematic diagram of the explosive construction of the detection assembly of the present utility model;

the marks in the figure are as follows: 1-a probe translation mechanism, 110-a first slide rail, 120-a first slide block, 130-a second slide rail, 140-a second slide block and 150-a pressing block; 2-detecting assembly, 210-probe seat, 211-probe base, 212-probe fixing seat, 213-pulley, 214-reset spring, 220-rotating mechanism, 221-first gear, 230-probe, 231-second gear; 3-detection assembly base, 310-left base, 320-right base; 4-guide blocks, 410-guide holes; 5-carrying a runner; 6-a first carrier plate; 7-a transverse translation mechanism, 710-a third slide rail, 720-a third slide block, 730-a first driving mechanism; 8-a second carrier plate; 9-a longitudinal translation mechanism, 910-a fourth slide rail, 920-a fourth slide block, 930-a second driving mechanism; 10-carrying a belt; 11-carrier tape transfer mechanism.

Description of the embodiments

Embodiments of the present utility model are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to the drawings are illustrative and intended to explain the present utility model and should not be construed as limiting the utility model.

In the description of the present utility model, it should be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like indicate orientations or positional relationships based on the orientation or positional relationships shown in the drawings, merely to facilitate describing the present utility model and simplify the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and therefore should not be construed as limiting the present utility model.

Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature. In the description of the present utility model, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.

In the embodiments of the present utility model, unless explicitly specified and limited otherwise, the terms "mounted," "connected," "secured" and the like are to be construed broadly and include, for example, either permanently connected, removably connected, or integrally formed; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communicated with the inside of two elements or the interaction relationship of the two elements. The specific meaning of the above terms in the present utility model can be understood by those of ordinary skill in the art according to the specific circumstances.

Referring to fig. 1 to 4, an embodiment of a screw-in probe mechanism and an electronic component inspection apparatus according to the present utility model is shown.

Referring to fig. 4 and 5, the precession probe mechanism includes:

a probe translation mechanism 1;

a detection assembly 2 connected to the probe translation mechanism 1, the probe translation mechanism 1 being configured to drive the detection assembly 2 toward or away from the component detection position;

the detection assembly 2 comprises a probe seat 210 connected to the probe translation mechanism 1, a rotating mechanism 220 and a probe 230 are arranged on the probe seat 210, a first gear 221 is arranged at the power output end of the rotating mechanism 220, a second gear 231 meshed with the first gear 221 is sleeved on the probe 230, and the rotating mechanism 220 is used for driving the probe 230 to axially rotate.

Referring to fig. 4, in the above embodiment, the screw-in probe mechanism is disposed above the component detecting position, and the probe translation mechanism 1 is used to push the detecting component 2 to move up and down so that the probe 230 can approach to or separate from the component detecting position, so as to facilitate the detection of the component to be detected located on the component detecting position. Referring to fig. 5, in order to enhance the penetrating effect of the probe 230 when penetrating the material film, in this embodiment, a second gear 231 is sleeved on the probe 230, a first gear 221 on a rotating mechanism 220 disposed close to the second gear 231 engages with the second gear 231, and when the rotating mechanism 220 works, the first gear 221 connected to the power output end of the rotating mechanism 220 rotates, the first gear 221 drives the second gear 231 to rotate, and the second gear 231 sleeved on the probe 230 drives the probe 230 to rotate along the axis direction thereof. Under the driving of the probe translation mechanism 1, the probe 230 rotates and approaches to the element detection position, the penetration of the material film is realized in the precession process, and the material film is contacted with the electronic element for detection after penetration. Due to the adoption of precession type feeding, the probe 230 is not required to be applied with larger force, material waste is not easy to cause, the service life is long, the size of the probe 230 is not required to be increased, more probes 230 are convenient to detect in the detection process, and the detection precision is improved. In an embodiment, the rotation mechanism 220 is a motor.

Referring to fig. 5, in the above embodiment, the probe holder 210 is provided with a plurality of probes 230, the plurality of probes 230 are disposed around the rotating mechanism 220, and the second gear 231 on each probe 230 engages with the first gear 221. In the embodiment, the number of probes 230 on the probe seat 210 is 4, the probes are arranged around the rotating mechanism 220, and when the rotating mechanism 220 works, the first gear 221 drives the 4 second gears 231 meshed with the first gear 221 to rotate, so that the synchronous rotation of the 4 probes 230 is realized, the Kelvin four-wire detection of electronic elements such as resistors after the material film is penetrated is facilitated, and the detection precision is improved.

Referring to fig. 5, in the above embodiment, the probe holder 210 includes the probe base 211 connected to the probe translation mechanism 1 and the probe fixing base 212 provided with the probe base 211, and the rotation mechanism 220 and the probe 230 are provided on the probe fixing base 212. In an embodiment, the probe 230 penetrates the probe holder 212 and is fixed relative to the probe holder 212.

Referring to fig. 4, in the above embodiment, the probe translation mechanism 1 further includes a detection assembly base 3, the probe translation mechanism includes a first slide rail 110 disposed on the detection assembly base 3 and a first slider 120 slidably connected to the first slide rail 110, the detection assembly 2 is disposed on the first slider 120, and when the first slider 120 slides on the first slide rail 110, the probe 230 will approach or separate from the component detection position. In the embodiment, the detection assembly base 3 is used for carrying the detection assembly 2, a first sliding rail 110 and a first sliding block 120 are arranged between the detection assembly base 3 and the detection assembly 2, and are used for enabling the detection assembly 2 to move relative to the detection assembly base 3, and further, driving devices such as an electric cylinder or an air cylinder can be further arranged on the detection assembly base 3 to push the detection assembly 2 to move.

Referring to fig. 4, in the above embodiment, two detecting elements 2 are disposed on the detecting element base 3, and the displacement directions of the two detecting elements 2 are not parallel to each other. In the embodiment, the probes 230 of the two detecting assemblies 2 are all directed to the element detecting positions, each detecting assembly 2 is provided with a rotating mechanism 220 and four probes 230, the bottoms of the two detecting assemblies 2 are all provided with a first sliding rail 110 and a first sliding block 120, and the length directions of the two first sliding rails 110 are not parallel to each other and are all directed to the element detecting positions.

Referring to fig. 4, in an alternative embodiment, two driving means can be provided to drive the two detection assemblies 2 in their respective directions. In this embodiment, the probe holders 210 of the two detection assemblies 2 are provided with pulleys 213 and a return spring 214, the probe translation mechanism 1 further includes a second slide rail 130 disposed above the detection assemblies 2 and a second slide block 140 slidably connected to the second slide rail 130, the second slide block 140 is provided with a lower pressing block 150, the lower pressing block 150 is close to the two pulleys 213, when the second slide block 140 moves downward, the lower pressing block 150 presses the detection assemblies 2 to move in a direction close to the element detection position, and the return spring 214 is stretched; in the embodiment, two detection assemblies 2 are arranged close to each other side by side, wherein one pulley 213 is arranged at the upper right corner of the probe base 211 of the detection assembly 2 on the left side, the other pulley 213 is arranged at the upper left corner of the probe base 211 of the detection assembly 2 on the right side, the two pulleys 213 are close to each other and are not in contact, the lower pressing block 150 is located above the two pulleys 213, the lower pressing block 150 arranged on the second sliding rail 130 and the second sliding block 140 has the capability of sliding up and down, one end of the return spring 214 is connected to the probe base 211 of the detection assembly 2, the other end is connected to the detection assembly base 3, and when the lower pressing block 150 moves downwards, the lower pressing block 150 presses the two pulleys 213 to push the two detection assemblies 2 to move downwards synchronously. In this embodiment, therefore, only one driving device is provided on the second slider 140 to achieve the synchronous movement of the two detection assemblies 2.

In the above embodiment, the guide block 4 is provided on the detection assembly base 3, the guide hole 410 is formed on the guide block 4, and the probe 230 passes through the guide hole 410. In the embodiment, the guide block 4 is disposed at the end position of the probe 230, and the probe 230 passes through the guide hole 410 on the guide block 4, so that the probe 230 can only rotate or move within the range defined by the guide hole 410, and the probe 230 is prevented from being deflected or bent during the working process.

Referring to fig. 1, the present embodiment further provides an electronic component detecting device, which includes a carrier flow channel 5 and the above-mentioned screw-in probe mechanism, and the component detecting device is disposed on the carrier flow channel 5. In the embodiment, the carrier tape runner 5 is used for placing the carrier tape 10, the carrier tape 10 is used for storing electronic components to be tested, the carrier tape runner 5 is located below the precession type probe mechanism, the carrier tape transferring mechanism 11 is further arranged below the carrier tape runner 5, and comprises a carrier tape motor and a carrier tape transferring wheel, the carrier tape motor drives the carrier tape transferring wheel to rotate, and the carrier tape 10 placed on the carrier tape runner 5 is driven by the carrier tape transferring wheel to move.

Referring to fig. 3, in the above embodiment, the electronic component inspection apparatus further includes a first carrier plate 6, the screw-in probe mechanism is disposed on the first carrier plate 6, and the first carrier plate 6 is further provided with a lateral translation mechanism 7, where the lateral translation mechanism 7 is used to drive the inspection component 2 to move laterally relative to the first carrier plate 6. In the embodiment, the detecting assembly base 3 includes a left base 310 and a right base 320, and the two detecting assemblies 2 are respectively located on the left base 310 and the right base 320. The two transverse translation mechanisms 7 are respectively connected to the left base 310 and the right base 320, and can respectively and independently control the left base 310 or the right base 320 to move left and right in the horizontal direction, that is, the two transverse translation mechanisms 7 can control the two detection assemblies 2 to be close to or far away from each other, or simultaneously move left or right relative to the first bearing plate 6. Specifically, the transverse translation mechanism 7 includes a third sliding rail 710 transversely disposed on the first bearing plate 6 and a third sliding block 720 slidingly disposed on the third sliding rail 710, the detection component base 3 is disposed on the third sliding block 720, and the detection component base 3 is connected with a first driving mechanism 730 for driving the detection component base 3 to move left and right, where the first driving mechanism 730 is an electric cylinder.

Referring to fig. 2, in the above embodiment, the electronic component inspection device further includes a second carrying board 8, the first carrying board 6 is disposed on the second carrying board 8, and the second carrying board 8 is further provided with a longitudinal translation mechanism 9, where the longitudinal translation mechanism 9 is used to drive the first carrying board 6 to move longitudinally relative to the second carrying board 8. In the embodiment, the longitudinal translation mechanism 9 includes a fourth sliding rail 910 longitudinally disposed on the second bearing plate 8 and a fourth sliding block 920 slidingly disposed on the fourth sliding rail 910, the first bearing plate 6 is disposed on the fourth sliding block 920, and the first bearing plate 6 is connected with a second driving mechanism 930 for driving the first bearing plate 6 to move up and down, where the second driving mechanism 930 is a motor, and the rotation of the motor is converted into the up-down movement of the first bearing plate 6 by a threaded screw. In the embodiment, when the device works, the longitudinal translation mechanism 9 drives the first bearing plate 6 to move downwards, the probe 230 is relatively greatly close to the element detection position in the vertical direction, the transverse translation mechanism 7 drives the detection assembly base 3 to move in the horizontal direction so as to be close to the element detection position, the probe translation mechanism 1 pushes the detection assembly 2 to move, in the process of puncturing a material film, the rotation mechanism 220 drives the probe 230 to rotate and penetrate the material film, and after penetrating the material film, the probe 230 contacts an electronic element to be tested, so that stable contact and nondestructive testing of the electronic element covered by the carrier tape sealing material film are realized.

In summary, the embodiment provides a screw-in probe mechanism and an electronic component detecting device, which are configured with a probe translation mechanism 1 for driving a detecting component 2 to move, and a rotating mechanism 220 and a probe 230 for driving a second gear 231 to rotate and driving a probe 230 to rotate under the driving of a first gear 221, so that screw-in feeding of the probe 230 is realized, the probe 230 is easier to penetrate a material film, no larger force is applied to the probe 230, material waste is not easy to be caused, the service life is long, and more probes 230 can be used for detection in the detection process because the size of the probe 230 is not increased, and the detection accuracy is improved; by arranging a plurality of probes 230, kelvin four-wire detection is convenient to realize, and the detection precision is high; by arranging the pressing block 150 and the pulley 213, the two detection assemblies 2 can be simultaneously pushed to move when the pressing block 150 presses the pulley 213, and by arranging the reset spring 214, the automatic reset of the two detection assemblies 2 can be conveniently realized after the detection is finished; by providing the guide block 4 and the guide hole 410, a guiding function is performed when the probe 230 moves; by providing the carrier tape flow path 5, the carrier tape 10 is placed; by arranging a transverse translation mechanism 7 for driving the detection assembly 2 to move transversely; by providing a longitudinal translation mechanism 9 for driving the first carrier plate 6 to move longitudinally; the embodiment can realize stable contact and nondestructive testing of the electronic element covered by the carrier tape sealing material film, does not need to increase the size of the probe 230 or use a material with higher hardness, is not easy to cause material waste, and has the advantages of long service life and high detection precision.

The above-described embodiments are only one of the preferred embodiments of the present utility model, and the ordinary changes and substitutions made by those skilled in the art within the scope of the present utility model should be included in the scope of the present utility model.

Claims (10)

1. A precession probe mechanism, comprising:

a probe translation mechanism (1);

a detection assembly (2) connected to the probe translation mechanism (1), the probe translation mechanism (1) being adapted to drive the detection assembly (2) towards or away from an element detection position;

the detection assembly (2) comprises a probe seat (210) connected to the probe translation mechanism (1), a rotating mechanism (220) and a probe (230) are arranged on the probe seat (210), a first gear (221) is arranged at the power output end of the rotating mechanism (220), a second gear (231) meshed with the first gear (221) is sleeved on the probe (230), and the rotating mechanism (220) is used for driving the probe (230) to axially rotate.

2. A precession probe mechanism according to claim 1, wherein a plurality of said probes (230) are provided on said probe holder (210), a plurality of said probes (230) are provided around said rotation mechanism (220), and said second gear (231) on each of said probes (230) engages said first gear (221).

3. A precession probe mechanism according to claim 2, wherein the probe mount (210) comprises a probe mount (211) connected to the probe translation mechanism (1) and a probe mount (212) disposed on the probe mount (211), the rotation mechanism (220) and the probe (230) being disposed on the probe mount (212).

4. A screw-in probe mechanism according to any of claims 1-3, further comprising a detection assembly base (3), said probe translation mechanism (1) comprising a first slide rail (110) arranged on said detection assembly base (3) and a first slider (120) slidably connected to said first slide rail (110), said detection assembly (2) being arranged on said first slider (120), said probe (230) being arranged to approach or separate from said element detection position when said first slider (120) slides on said first slide rail (110).

5. A screw-in probe mechanism according to claim 4, wherein the detection assembly base (3) is provided with two detection assemblies (2), and the displacement directions of the two detection assemblies (2) are not parallel to each other.

6. The precession type probe mechanism according to claim 5, wherein pulleys (213) and a return spring (214) are disposed on the probe holders (210) of the two detection assemblies (2), the probe translation mechanism (1) further comprises a second slide rail (130) disposed above the detection assemblies (2) and a second slider (140) slidably connected to the second slide rail (130), a pressing block (150) is disposed on the second slider (140), the pressing block (150) is close to the two pulleys (213), and when the second slider (140) moves downward, the pressing block (150) presses the detection assemblies (2) to move in a direction close to the element detection position, and the return spring (214) is stretched.

7. The screw-in probe mechanism according to claim 4, wherein a guide block (4) is provided on the detection assembly base (3), a guide hole (410) is formed on the guide block (4), and the probe (230) passes through the guide hole (410).

8. An electronic component inspection apparatus comprising a carrier flow path (5) and a screw-in probe mechanism according to any one of claims 1 to 7, said component inspection position being provided on said carrier flow path (5).

9. An electronic component inspection device according to claim 8, further comprising a first carrier plate (6), wherein the precession probe mechanism is disposed on the first carrier plate (6), and a lateral translation mechanism (7) is further disposed on the first carrier plate (6), and the lateral translation mechanism (7) is configured to drive the inspection assembly (2) to move laterally relative to the first carrier plate (6).

10. An electronic component inspection device according to claim 9, further comprising a second carrier plate (8), wherein the first carrier plate (6) is disposed on the second carrier plate (8), and a longitudinal translation mechanism (9) is further disposed on the second carrier plate (8), and the longitudinal translation mechanism (9) is used for driving the first carrier plate (6) to move longitudinally relative to the second carrier plate (8).

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