CN219225005U

CN219225005U - Power-on and power-off test device for integrated circuit

Info

Publication number: CN219225005U
Application number: CN202223425385.5U
Authority: CN
Inventors: 秦井武; 王智强; 张明飞; 时晓洁; 辛国庆
Original assignee: Shenzhen Youlian Semiconductor Co ltd
Current assignee: Shenzhen Youlian Semiconductor Co ltd
Priority date: 2022-12-21
Filing date: 2022-12-21
Publication date: 2023-06-20
Anticipated expiration: 2032-12-21

Abstract

The utility model discloses an up-down electric testing device for an integrated circuit, which belongs to the technical field of integrated circuits and comprises an operation table, wherein one side of the top of the operation table is fixedly provided with a mounting plate, a clamping structure is movably arranged on the mounting plate, the rear side of the top of the operation table is fixedly provided with a supporting plate, the front surface of the supporting plate is fixedly provided with a reset structure, the bottom of the reset structure is in butt joint with a detection probe, the top of the supporting plate is fixedly provided with a shell, and the shell is internally fixedly provided with a detection mechanism matched with the operation table; according to the technical scheme, the integrated circuit board to be tested can be clamped and fixed by the device through the clamping structure arranged on the mounting plate, and the upper test surface and the lower test surface of the integrated circuit can be switched through the rotating and overturning mode, so that the upper test operation and the lower test operation of personnel on the integrated circuit are met, and the situation that the components on the integrated circuit are affected and interfered by the manual overturning of the personnel during rotation is avoided.

Description

Power-on and power-off test device for integrated circuit

Technical Field

The present utility model relates to the field of integrated circuit technology, and more particularly, to a power-on and power-off test device for an integrated circuit.

Background

An integrated circuit is a type of microelectronic device or component. Through adopting certain technology, the components and wiring needed in the circuit, such as transistors, resistors, capacitors, inductors and the like, are connected with each other, manufactured on one or a plurality of small semiconductor wafers or dielectric substrates, and then packaged in a package body to form a microstructure with the needed circuit function; all components are integrated into a whole in structure, so that the electronic components are greatly advanced towards miniaturization, low power consumption, intellectualization and high reliability, and the integrated circuit board can be tested by a corresponding testing device after being prepared.

The patent document with the publication number of CN216900801U in the prior art provides an on-off electricity test device of an integrated circuit, which can improve the efficiency of the on-off electricity test of the integrated circuit. The device comprises a power supply module, a switch module, a processing module, a detection module and a clamp module, wherein the processing module sends a first test signal to the switch module, so that the power supply module supplies power to the clamp module and receives test information fed back by the detection module. However, the overall operation performance of the device and most of such test devices on the market is single, the operation requirement of the test device during the test of the integrated circuit on the power supply and the power supply can not be better met, although the steps of power supply, detection and power supply can be repeatedly and circularly executed in the prior art CN216900801U, the power supply is not required to be manually cut off or closed to finish the test of the integrated circuit on the power supply and the power supply of the integrated circuit to be tested, the test efficiency of the integrated circuit on the power supply and the power supply of the integrated circuit can be greatly improved, but because the integrated circuit surface of the integrated circuit board is the upper surface and the lower surface, the electronic component on the integrated circuit board is easily influenced due to the frequent overturn of personnel in a manual mode during the test, and the contactless simultaneous test can not be performed. In view of this, we propose a power-on and power-off test apparatus for an integrated circuit.

Disclosure of Invention

1. Technical problem to be solved

The present utility model is directed to a power-on/power-off test device for an integrated circuit, so as to solve the above-mentioned problems in the prior art.

2. Technical proposal

A go up and down electric testing arrangement for integrated circuit, including the operation panel, movable mounting has clamping structure on the mounting panel in one side fixed mounting at operation panel top, the rear side fixed mounting at operation panel top has the backup pad, the positive fixed mounting of backup pad has reset structure, detection probe is installed in reset structure's bottom butt joint, the top fixed mounting of backup pad has the casing, the front of casing is embedded installs warning light, display, button respectively, the detection mechanism that the cooperation was used is installed to fixed mounting in the casing.

As an alternative scheme of this application technical scheme, the clamping structure includes adjust knob, positioning knob, chuck, the chuck is installed in one side rotation of mounting panel, and the butt joint is installed the positioning knob that the cooperation was used on the chuck, the opposite side of mounting panel is installed with chuck butt joint complex adjust knob.

As an alternative scheme of this application technical scheme, detection mechanism includes digital circuit board, microcontroller, CPU, memory, AD/DA converter, analog switch, integrated adapter, the inside fixed mounting of casing has digital circuit board, the last microcontroller, CPU, memory, AD/DA converter, the analog switch of welding respectively of digital circuit board is installed, the internal fixed mounting of casing of digital circuit board one side has integrated adapter.

As an alternative scheme of this application technical scheme, the operation panel passes through platen and stabilizer blade constitution, and the bottom fixed mounting of platen has the stabilizer blade, and mounting panel and backup pad are fixed mounting at the top of platen.

As an alternative scheme of this application technical scheme, reset structure is including installation cavity, reset spring line, accomodate the groove, the front fixed mounting of backup pad has the installation cavity, be provided with three groups in the installation cavity and accomodate the groove, accomodate the inslot butt joint and install the reset spring line of being connected with the test probe.

3. Advantageous effects

Compared with the prior art, the utility model has the advantages that:

1. according to the technical scheme, the integrated circuit board to be tested can be clamped and fixed by the device through the clamping structure arranged on the mounting plate, and the upper test surface and the lower test surface of the integrated circuit can be switched through the rotating and overturning mode, so that the upper test operation and the lower test operation of personnel on the integrated circuit are met, and the situation that the components on the integrated circuit are affected and interfered by the manual overturning of the personnel during rotation is avoided.

2. According to the technical scheme, the reset structure in the supporting plate is arranged, so that the device is more convenient and quick when matched with personnel to operate, the personnel do not need to reset in situ after operation, the personnel only need to place the detection assembly in a shelving mode, the reset operation of the detection assembly can be completed, the personnel are light and quick during operation, and the detection assembly is stable and orderly during test operation.

Drawings

FIG. 1 is a schematic diagram of the overall internal structure of a power-on and power-off testing apparatus for an integrated circuit disclosed in an embodiment of the present application;

FIG. 2 is a schematic diagram of the overall appearance of a power-on and power-off testing device for an integrated circuit according to an embodiment of the present application;

FIG. 3 is a schematic diagram of a reset structure of a power-on/power-off testing device for an integrated circuit according to an embodiment of the present disclosure;

FIG. 4 is a schematic diagram of a clamping structure of a power-on/power-off testing device for an integrated circuit according to an embodiment of the present disclosure;

the reference numerals in the figures illustrate: 1. an operation table; 2. a mounting plate; 3. a clamping structure; 301. an adjustment knob; 302. a positioning knob; 303. a chuck; 4. a detection mechanism; 401. a digital circuit board; 402. a microcontroller; 403. a CPU; 404. a memory; 405. an AD/DA converter; 406. an analog switch; 407. an integrated adapter; 5. a support plate; 6. a detection probe; 7. a reset structure; 701. installing a cavity; 702. a return spring wire; 703. a storage groove; 8. a housing; 801. a warning light; 802. a display; 803. and (5) a key.

Detailed Description

The utility model provides a technical scheme that:

as shown in fig. 1 and 4, the power-on and power-off testing device for the integrated circuit comprises an operation table 1, wherein the operation table 1 is composed of a table plate and supporting legs, the supporting legs are fixedly arranged at the bottom of the table plate, a mounting plate 2 and a supporting plate 5 are fixedly arranged at the top of the table plate, a clamping structure 3 is fixedly arranged on one side of the top of the operation table 1, the clamping structure 3 comprises an adjusting knob 301, a positioning knob 302 and a clamping head 303, the clamping head 303 is rotatably arranged on one side of the mounting plate 2, the positioning knob 302 matched with the clamping head 303 is arranged on the clamping head 303 in a butt joint mode, and the adjusting knob 301 matched with the clamping head 303 in a butt joint mode is arranged on the other side of the mounting plate 2.

In this embodiment, during the preparation operation, a person places the device at a suitable operation position through the operation table 1 to perform a corresponding test operation, then inserts one side of the integrated circuit board into the chuck 303, then realizes the clamping and fixing of the integrated circuit board through the positioning knob 302 on the chuck 303, during the operation, the person can dial the chuck 303 to rotate to realize two-side switching adjustment, and the rotation-adjusted chuck 303 is installed and fixed through the adjusting knob 301. The device can clamp and fix the integrated circuit board to be tested through the clamping structure 3 on the mounting plate 2, and the upper test surface and the lower test surface of the integrated circuit can be switched through a rotary overturning mode, so that the upper test operation and the lower test operation of personnel on the integrated circuit are met, and the situation that the components on the integrated circuit are affected and interfered by the manual overturning of the personnel during rotation is avoided.

In some technical schemes, as shown in fig. 1 and 2, a casing 8 is fixedly installed at the top of a supporting plate 5, a warning lamp 801, a display 802 and a key 803 are respectively embedded in the front surface of the casing 8, a detection mechanism 4 matched with the casing 8 is fixedly installed in the casing 8, the detection mechanism 4 comprises a digital circuit board 401, a microcontroller 402, a CPU403, a memory 404, an AD/DA converter 405, an analog switch 406 and an integrated adapter 407, the digital circuit board 401 is fixedly installed in the casing 8, the microcontroller 402, the CPU403, the memory 404, the AD/DA converter 405 and the analog switch 406 are respectively welded on the digital circuit board 401, and the integrated adapter 407 is fixedly installed in the casing 8 on one side of the digital circuit board 401.

In this embodiment, during the operation period, the device is then powered on, so as to ensure that the detection mechanism 4 in the casing 8 can start the operation, the detection mechanism 4 detects and adapts the tested power current signal information through the digital circuit board 401, the microcontroller 402, the CPU403, the memory 404, the AD/DA converter 405, the analog switch 406 and the integrated adapter 407, analyzes the signal information, and then displays and prompts the analyzed signal information through the warning lamp 801 and the display 802, thereby completing the testing operation of the device on the integrated circuit.

In some technical schemes, as shown in fig. 1 and 3, a supporting plate 5 is fixedly installed at the rear side of the top of an operation platform 1, a reset structure 7 is fixedly installed on the front side of the supporting plate 5, the reset structure 7 comprises an installation cavity 701, a reset spring wire 702 and a storage groove 703, the installation cavity 701 is fixedly installed on the front side of the supporting plate 5, three groups of storage grooves 703 are arranged in the installation cavity 701, the reset spring wire 702 connected with a detection probe 6 is installed in the storage groove 703 in a butt joint mode, and the detection probe 6 is installed in the bottom of the reset structure 7 in a butt joint mode.

In this embodiment, during operation, a person takes the test probe 6 on the reset structure 7, performs electrical collection and detection on the integrated circuit board on the chuck 303 through the contact on the test probe 6, and when the test is completed or the test component needs to be switched, the person only needs to slightly put down the test probe 6, the test probe 6 will rest on the support plate 5, then reset the test probe 6 through the reset structure 7, the reset spring wire 702 in the storage groove 703 will stretch the test probe 6 during operation of the person, will stretch the reset spring wire 702, and the test probe 6 losing the pulling force after the operation is completed will be pulled and reset by the reset spring wire 702, so that the test probe 6 is autonomously received in the storage groove 703. The reset structure 7 on the support plate 5 enables the device to be more convenient and rapid when being matched with a person to operate, the person does not need to reset in situ after operation, the person only needs to place the detection assembly in a shelving mode to complete reset operation of the detection assembly, the person is enabled to be lighter and faster during operation, and the detection assembly is stable and orderly during test operation.

Claims

1. A power on and power off testing device for integrated circuit, including operation panel (1), its characterized in that: one side of the top of the operating platform (1) is fixedly provided with a mounting plate (2) and a clamping structure (3) is movably arranged on the mounting plate,

the rear side of the top of the operating platform (1) is fixedly provided with a supporting plate (5), the front surface of the supporting plate (5) is fixedly provided with a reset structure (7), and the bottom of the reset structure (7) is in butt joint with a detection probe (6);

the top of backup pad (5) fixed mounting has casing (8), fixed mounting has detection mechanism (4) that the cooperation was used in casing (8).

2. The power up and down test apparatus for an integrated circuit of claim 1, wherein: the clamping structure (3) comprises an adjusting knob (301), a positioning knob (302) and a chuck (303), the chuck (303) is rotatably arranged on one side of the mounting plate (2), the positioning knob (302) matched with the chuck (303) is arranged on the chuck (303) in a butt joint mode, and the adjusting knob (301) matched with the chuck (303) in a butt joint mode is arranged on the other side of the mounting plate (2).

3. The power up and down test apparatus for an integrated circuit of claim 1, wherein: the detection mechanism (4) comprises a digital circuit board (401), a microcontroller (402), a CPU (403), a memory (404), an AD/DA converter (405), an analog switch (406) and an integrated adapter (407), wherein the digital circuit board (401) is fixedly arranged in the machine shell (8), the microcontroller (402), the CPU (403), the memory (404), the AD/DA converter (405) and the analog switch (406) are respectively welded on the digital circuit board (401), and the integrated adapter (407) is fixedly arranged in the machine shell (8) on one side of the digital circuit board (401).

4. The power up and down test apparatus for an integrated circuit of claim 1, wherein: the operating table (1) is composed of a table plate and supporting legs, the supporting legs are fixedly arranged at the bottom of the table plate, and the mounting plate (2) and the supporting plate (5) are fixedly arranged at the top of the table plate.

5. The power up and down test apparatus for an integrated circuit of claim 1, wherein: the reset structure (7) comprises an installation cavity (701), a reset spring wire (702) and a storage groove (703), wherein the installation cavity (701) is fixedly installed on the front surface of the supporting plate (5), three groups of storage grooves (703) are formed in the installation cavity (701), and the reset spring wire (702) connected with the detection probe (6) is installed in the storage grooves (703) in a butt joint mode.

6. The power up and down test apparatus for an integrated circuit of claim 1, wherein: the front of the shell (8) is respectively embedded with a warning lamp (801), a display (802) and keys (803).