CN210347854U - Semi-automatic chip test fixture - Google Patents
Semi-automatic chip test fixture Download PDFInfo
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- CN210347854U CN210347854U CN201921065505.0U CN201921065505U CN210347854U CN 210347854 U CN210347854 U CN 210347854U CN 201921065505 U CN201921065505 U CN 201921065505U CN 210347854 U CN210347854 U CN 210347854U
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Abstract
The utility model relates to a semi-automatic chip testing tool, which belongs to the technical field of chip testing and comprises a box body, wherein a support plate base and a display screen are fixedly arranged on the upper surface of the box body, a testing probe is fixedly arranged on the support plate base, and a manual pressing mechanism matched with the support plate base is arranged above the support plate base; the manual installation mechanism comprises a fixed plate, a supporting plate and a fixed sleeve are fixedly installed on the front side of the fixed plate, a supporting column is fixedly installed at the bottom of the fixed plate, a gland pressing column which is connected with the fixed sleeve in a sliding mode is installed in the fixed sleeve, a testing cover plate which is matched with the support plate base is fixedly installed at the bottom of the gland pressing column, the testing cover plate is arranged outside the supporting column and is connected with the supporting column in a sliding mode, and a pressing handle is fixedly installed at the. The utility model discloses a manual control presses down the handle and accomplishes the test, has realized the semi-automatic control test, and structural design is reasonable, easy operation, and convenient to use can in time discover bad product through the test, has improved efficiency of software testing, has guaranteed product quality.
Description
Technical Field
The utility model relates to a chip testing technology field specifically is a semi-automatic chip testing frock.
Background
CMOS is an abbreviation for Complementary Metal Oxide Semiconductor. The technology is used for manufacturing large-scale integrated circuit chips or chips manufactured by the technology, and the chips are a RAM chip which can be read and written on a computer mainboard and are used for storing data on the computer mainboard due to the characteristic of being read and written. After the CMOS chip is mounted, it is necessary to determine whether welding is abnormal, whether a circuit is connected, whether the polarity of a part is correct, and whether the voltage of the circuit is normal in order to ensure the product quality, and therefore, it is necessary to test the CMOS chip.
The current chip test is mainly manual test, the chip is connected with a test tool through manual work, and the condition that the connection is unstable to cause inaccurate test results occurs easily due to manual connection during the test, so that the test efficiency is influenced.
Disclosure of Invention
An object of the utility model is to provide a semi-automatic chip test fixture to solve the problem that proposes among the above-mentioned background art.
In order to achieve the above object, the utility model provides a following technical scheme:
the utility model provides a semi-automatic chip test fixture, includes the box, fixed surface installs support plate base and display screen on the box, fixed mounting have with display screen electric connection's test probe on the support plate base, support plate base top is installed rather than the manual pressing means of matched with.
As a further technical solution of the present invention: manual pressing means includes the fixed plate, fixed plate front side fixed mounting has backup pad and fixed cover, fixed plate bottom fixed mounting has the support column, install in the fixed cover rather than sliding connection's gland compression leg, gland compression leg bottom fixed mounting have with support plate base matched with test apron, the test apron sets up outside the support column and rather than sliding connection, gland compression leg upper end fixed mounting has the press handle.
As a further technical solution of the present invention: the support plate base is fixedly provided with a support plate limiting column, and the support plate limiting column is in threaded connection with the support plate base.
As the utility model discloses a further technical scheme again: the box upper surface still fixed mounting have with display screen electric connection's first pilot lamp and second pilot lamp.
As the utility model discloses a further technical scheme again: the power source is arranged on the rear side of the box body, and a power switch is arranged above the power source.
As the utility model discloses a further technical scheme again: the fixed plate rear side fixed mounting has the strengthening rib, strengthening rib bottom and box fixed connection.
Compared with the prior art, the beneficial effects of the utility model are that: the testing is completed by pressing the handle through manual control, so that semi-automatic control testing is realized, the structural design is reasonable, the operation is simple, the use is convenient, bad products can be found in time through testing, the testing efficiency is improved, and the product quality is ensured.
Drawings
FIG. 1 is a front view of a semi-automatic chip testing tool;
fig. 2 is a schematic view of a partial rear view structure of the semi-automatic chip testing tool.
In the figure: the test device comprises a box body 1, a first indicator lamp 2, a carrier plate base 3, a carrier plate limiting column 4, a second indicator lamp 5, a test cover plate 6, a handle 7, a display screen 8, a fixing plate 9, a pressing handle 10, a pressing cover pressing column 11, a supporting plate 12, a fixing sleeve 13, a supporting column 14, a power interface 15, a power switch 16 and a reinforcing rib 17.
Detailed Description
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", and the like, indicate the orientation or positional relationship indicated based on the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically limited otherwise.
In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," and "fixed" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.
The technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention.
Example 1
The semi-automatic chip testing tool shown in fig. 1 and 2 comprises a box body 1, wherein a carrier plate base 3 and a display screen 8 are fixedly mounted on the upper surface of the box body 1, the carrier plate base 3 is used for placing a chip for testing, a testing result is displayed through the display screen 8, specifically, a testing probe electrically connected with the display screen 8 is fixedly mounted on the carrier plate base 3, the testing is performed on the conditions that the welding of the chip is abnormal, the circuit is conducted, the polarity of a part is correct, the voltage of the circuit is normal and the like through the testing probe, and then the testing result is displayed on the display screen 8 for a tester to judge; further, install rather than the manual pressing mechanism of matched with above support plate base 3, press through setting up manual pressing mechanism, guaranteed test chip and support plate base 3's good stable contact, the inaccurate problem of test that probably causes when having avoided manual test, the test is more accurate, and it is more convenient to operate moreover, has improved efficiency of software testing.
The manual pressing mechanism comprises a fixing plate 9, a supporting plate 12 and a fixing sleeve 13 are fixedly mounted on the front side of the fixing plate 9, a supporting column 14 is fixedly mounted at the bottom of the fixing plate 9, a gland pressing column 11 connected with the fixing sleeve in a sliding manner is mounted in the fixing sleeve 13, a testing cover plate 6 matched with the carrier plate base 3 is fixedly mounted at the bottom of the gland pressing column 11, when the gland pressing column 11 is pressed, the testing cover plate 6 at the bottom presses a chip to enable the chip to be in full contact with the carrier plate base 3 for testing, the testing cover plate 6 is parallel to the carrier plate base 3 when the pressing is ensured, the testing cover plate 6 is arranged outside the supporting column 14 and is connected with the supporting column in a sliding manner, specifically, a sliding hole matched with the supporting column 14 is formed in the testing cover plate 6, further, the pressing handle 10 is fixedly mounted at the upper end of the, the reset function can be realized by connecting the existing springs, and the reset function is the prior known technology and is not described in detail.
In order to prevent the chip from being damaged due to excessive pressing, a support plate limiting column 4 is fixedly mounted on the support plate base 3, specifically, the support plate limiting column 4 is in threaded connection with the support plate base 3, so that the height of the support plate limiting column 4 can be conveniently adjusted, and the chip can be conveniently adapted to chips with different thicknesses.
The utility model discloses a test box, including box 1, box 8, display screen, the last surface of box is fixed mounting still have with display screen 8 electric connection's first pilot lamp 2 and second pilot lamp 5, be used for instructing the chip whether qualified through setting up two pilot lamps, specifically be used for showing for one of them pilot lamp qualified, preferred green, another pilot lamp is used for showing unqualifiedly, and preferred red makes things convenient for the tester to directly judge the test result, and the test result is more directly perceived, is difficult for makeing mistakes.
The rear side of the box body 1 is provided with a power supply interface 15, a power supply switch 16 is installed above the power supply interface 15, the test tool is powered by the power supply interface 15, and the control is performed through the power supply switch 16.
Example 2
This embodiment further optimizes on embodiment 1's basis, fixed plate 9 rear side fixed mounting has strengthening rib 17, strengthening rib 17 bottom and 1 fixed connection of box have improved the good intensity of stability of fixed plate 9 through setting up strengthening rib 17, have guaranteed the normal operating of test.
It is obvious to a person skilled in the art that the invention is not restricted to details of the above-described exemplary embodiments, but that it can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be combined as appropriate to form other embodiments understood by those skilled in the art.
Claims (7)
1. The utility model provides a semi-automatic chip test frock, includes box (1), fixed surface installs support plate base (3) and display screen (8) on box (1), fixed mounting has the test probe with display screen (8) electric connection on support plate base (3), its characterized in that: and a manual pressing mechanism matched with the support plate base is arranged above the support plate base (3).
2. The semi-automatic chip testing tool of claim 1, characterized in that: manual pressing means includes fixed plate (9), fixed plate (9) front side fixed mounting has backup pad (12) and fixed cover (13), fixed plate (9) bottom fixed mounting has support column (14), install gland compression leg (11) rather than sliding connection in fixed cover (13), gland compression leg (11) bottom fixed mounting have with support plate base (3) matched with test apron (6), test apron (6) set up in support column (14) outside and rather than sliding connection, gland compression leg (11) upper end fixed mounting has pressing handle (10).
3. The semi-automatic chip testing tool of claim 1 or 2, characterized in that: and a support plate limiting column (4) is fixedly arranged on the support plate base (3).
4. The semi-automatic chip testing tool of claim 3, characterized in that: the support plate limiting column (4) is in threaded connection with the support plate base (3).
5. The semi-automatic chip testing tool of claim 3, characterized in that: the upper surface of the box body (1) is also fixedly provided with a first indicator lamp (2) and a second indicator lamp (5) which are electrically connected with the display screen (8).
6. The semi-automatic chip testing tool of claim 3, characterized in that: the rear side of the box body (1) is provided with a power interface (15), and a power switch (16) is arranged above the power interface (15).
7. The semi-automatic chip testing tool of claim 2, characterized in that: fixed plate (9) rear side fixed mounting has strengthening rib (17), strengthening rib (17) bottom and box (1) fixed connection.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921065505.0U CN210347854U (en) | 2019-07-09 | 2019-07-09 | Semi-automatic chip test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921065505.0U CN210347854U (en) | 2019-07-09 | 2019-07-09 | Semi-automatic chip test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN210347854U true CN210347854U (en) | 2020-04-17 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921065505.0U Active CN210347854U (en) | 2019-07-09 | 2019-07-09 | Semi-automatic chip test fixture |
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| Country | Link |
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| CN (1) | CN210347854U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112150792A (en) * | 2020-09-16 | 2020-12-29 | 欧姆(重庆)电子技术有限公司 | Industry wireless remote control B system receiver mainboard test fixture |
| CN115430879A (en) * | 2022-09-30 | 2022-12-06 | 上海季丰电子股份有限公司 | Welding auxiliary fixtures |
-
2019
- 2019-07-09 CN CN201921065505.0U patent/CN210347854U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112150792A (en) * | 2020-09-16 | 2020-12-29 | 欧姆(重庆)电子技术有限公司 | Industry wireless remote control B system receiver mainboard test fixture |
| CN115430879A (en) * | 2022-09-30 | 2022-12-06 | 上海季丰电子股份有限公司 | Welding auxiliary fixtures |
| CN115430879B (en) * | 2022-09-30 | 2024-01-19 | 上海季丰电子股份有限公司 | Welding auxiliary tool |
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