CN204536369U - A kind of Surface Mount test potentiometer fixture - Google Patents
A kind of Surface Mount test potentiometer fixture Download PDFInfo
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- CN204536369U CN204536369U CN201520012268.7U CN201520012268U CN204536369U CN 204536369 U CN204536369 U CN 204536369U CN 201520012268 U CN201520012268 U CN 201520012268U CN 204536369 U CN204536369 U CN 204536369U
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- conducting strip
- thimble
- static housing
- pad
- surface mount
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Abstract
The utility model discloses a kind of Surface Mount test potentiometer fixture, comprise back up pad and be arranged on static housing, thimble, spring, fixed block, the first conducting strip, the second conducting strip, the 3rd conducting strip, brace and the lead-in wire above described back up pad; Wherein, static housing is fixed in back up pad, and thimble lower end penetrates from the upper end of static housing, passes from the lower end of static housing; The upper end of thimble has part to stay outside, static housing upper end; Fixed block is arranged on thimble, and the fixed block on thimble is provided with spring between the inside surface of static housing upper end; Pass static housing place in the lower end of thimble and the first conducting strip is installed; Be separately installed with the second conducting strip, the 3rd conducting strip in the arranged on left and right sides of the first conducting strip bottom, the second conducting strip is connected with respective lead-in wire respectively by brace with the 3rd conducting strip.Therefore, Surface Mount test potentiometer fixture described in the utility model can be specifically applied to the test of Surface Mount potentiometer.
Description
Technical field
The utility model relates to mechanical field, refers to a kind of Surface Mount test potentiometer fixture especially.
Background technology
At present, Surface Mount potentiometer obtains in circuit and applies more and more widely, and the supporting test facilities of existing non-Surface Mount potentiometer are very perfect.But due to the structure of Surface Mount potentiometer and the singularity of packing forms, the test of its comprehensive electrical quantity is fully solved, and testing efficiency is lower, and flatness cannot be tested always.Therefore, owing to lacking the Special-purpose testing jig of Surface Mount potentiometer, limit existing power of test, cause existing potentiometer comprehensive tester not to be used adequately reasonably.
Utility model content
In view of this, the purpose of this utility model is to propose a kind of Surface Mount test potentiometer fixture, can be specifically applied to the test of Surface Mount potentiometer.
Based on a kind of Surface Mount test potentiometer fixture that above-mentioned purpose the utility model provides, comprise back up pad and be arranged on static housing, thimble, spring, fixed block, the first conducting strip, the second conducting strip, the 3rd conducting strip, brace and the lead-in wire above described back up pad;
Wherein, described static housing is fixed in described back up pad, and described thimble lower end penetrates from the upper end of described static housing, passes from the lower end of described static housing; Further, the upper end of described thimble has part to stay outside, described static housing upper end; Described fixed block is arranged on described thimble, is provided with described spring between the described fixed block on described thimble to described static housing upper end inside surface; In addition, pass described static housing place in the lower end of described thimble and the first described conducting strip is installed;
Be separately installed with described second conducting strip, described 3rd conducting strip in the arranged on left and right sides of described first conducting strip bottom, and this second conducting strip and the 3rd conducting strip are all individually fixed in described back up pad; Further, the second described conducting strip is connected with respective described lead-in wire respectively by described brace with the 3rd described conducting strip.
Alternatively, described second conducting strip, described 3rd conducting strip is separately installed with in the arranged on left and right sides of described first conducting strip bottom.
Further, the part that described second conducting strip occupy lower semisection with described 3rd conducting strip is fixedly connected with described brace respectively, and the second namely described conducting strip has lap with the described brace be connected respectively with the 3rd described conducting strip.
Alternatively, between described first conducting strip and described second conducting strip, described screens sheet is installed, and this screens sheet is fixed in described back up pad.
Alternatively, between described first conducting strip and described second conducting strip and between described first conducting strip and described 3rd conducting strip, be separately installed with described screens sheet, and these two screens sheets are individually fixed in described back up pad.
Further, the distance of described first conducting strip and described second conducting strip, described 3rd conducting strip is 1mm-3mm.
Further, the distance of described first conducting strip and described second conducting strip, described 3rd conducting strip is 2mm.
Further, the distance between described second conducting strip, described 3rd conducting strip is 0.5mm-2.5mm.
Further, the distance between described second conducting strip, described 3rd conducting strip is 1.5mm.
As can be seen from above, the Surface Mount test potentiometer fixture that the utility model provides, be fixed in back up pad by static housing, thimble lower end penetrates from the upper end of static housing, passes from the lower end of static housing; The upper end of thimble has part to stay outside, static housing upper end; Fixed block is arranged on thimble, and the fixed block on thimble is provided with spring between the inside surface of static housing upper end; Pass static housing place in the lower end of thimble and the first conducting strip is installed; Be separately installed with the second conducting strip, the 3rd conducting strip in the arranged on left and right sides of the first conducting strip bottom, the second conducting strip is connected with respective lead-in wire respectively by brace with the 3rd conducting strip.Thus Surface Mount test potentiometer fixture described in the utility model can promote the power of test of existing Surface Mount potentiometer, ensure the reliability of Surface Mount potentiometer quality.
Accompanying drawing explanation
Fig. 1 is the structural representation of the utility model embodiment Surface Mount test potentiometer fixture.
Embodiment
For making the purpose of this utility model, technical scheme and advantage clearly understand, below in conjunction with specific embodiment, and with reference to accompanying drawing, the utility model is further described.
Consult shown in Fig. 1, for the structural representation of the utility model embodiment Surface Mount test potentiometer fixture, described Surface Mount test potentiometer fixture comprises back up pad 101 and is arranged on static housing 102, thimble 103, spring 104, fixed block 105, first conducting strip 106, second conducting strip 108, the 3rd conducting strip 109, brace 110 and the lead-in wire 111 above this back up pad 101.
Wherein, static housing 102 is fixed in back up pad 101, and thimble 103 lower end penetrates from the upper end of static housing 102, passes from the lower end of static housing 102.Further, the upper end of thimble 103 has part to stay outside, static housing 102 upper end.Fixed block 105 is arranged on thimble 103, is provided with spring 104 between fixed block 105 to the static housing 102 upper end inside surface on thimble 103.In addition, pass static housing 102 place in thimble 103 lower end and the first conducting strip 106 is installed.
Preferably, be separately installed with the second conducting strip 108, the 3rd conducting strip 109 in the arranged on left and right sides of distance the first conducting strip 106 bottom certain distance, and this second conducting strip 108 and the 3rd conducting strip 109 are all individually fixed in described back up pad 101.Further, the second described conducting strip 108 is connected with respective lead-in wire 111 respectively by brace 110 with the 3rd conducting strip 109.Preferably, the part that the second conducting strip 108 occupy lower semisection with the 3rd conducting strip 109 is fixedly connected with brace 110 respectively, and namely the second conducting strip 108 has lap with the brace 110 be connected respectively with the 3rd conducting strip 109.
In addition, preferably, the distance of the first conducting strip 106 and the second conducting strip 108, the 3rd conducting strip 109 is 1mm-3mm, and in embodiment of the present utility model, the distance of the first conducting strip 106 and the second conducting strip 108, the 3rd conducting strip 109 is 2mm.Further, the distance between the second conducting strip 108, the 3rd conducting strip 109 is 0.5mm-2.5mm, and in embodiment of the present utility model, the distance between the second conducting strip 108, the 3rd conducting strip 109 is 1.5mm.
As another embodiment of the present utility model, between the first conducting strip 106 and the second conducting strip 108, screens sheet 107 (as shown in fig. 1) is installed, and this screens sheet 107 is fixed in described back up pad 101.
In another embodiment of the present utility model, between the first conducting strip 106 and the second conducting strip 108 and be separately installed with screens sheet 107 between the first conducting strip 106 and the 3rd conducting strip 109, and these two screens sheets 107 are individually fixed in described back up pad 101.This screens sheet 107 can be fixed tested Surface Mount potentiometer and not move left and right.
When Surface Mount test potentiometer fixture described in the utility model carries out work, tested Surface Mount potentiometer mark is had 1,2,3 pins are corresponding to be respectively arranged on the first conducting strip 106, second conducting strip 108, the 3rd conducting strip 109.Further, tested Surface Mount potentiometer mark has the leads ends of 1 to be withstood by the lower end of thimble 103, and mark has the leads ends of 2,3 to be withstood by the brace 110 that the second conducting strip 108, the 3rd conducting strip 109 connect respectively.Preferably, in order to prevent the movement of tested Surface Mount potentiometer left and right directions, screens sheet 107 can be utilized to withstand the two ends, left and right of this tested Surface Mount potentiometer respectively.After tested Surface Mount potentiometer is clamped by described Surface Mount test potentiometer fixture, the pin that just testing apparatus can be indicated 1 is connected with the upper end of thimble 103, pin testing apparatus being indicated 2 connects with the lead-in wire 111 that the second conducting strip 108 is connected by brace 110, and pin testing apparatus being indicated 3 connects with the lead-in wire 111 that the 3rd conducting strip 109 is connected by brace 110.Thus this testing apparatus can facilitate, tested tested Surface Mount potentiometer by Surface Mount test potentiometer fixture described in the utility model accurately.
As can be seen from above, Surface Mount test potentiometer fixture provided by the utility model, creatively designs a kind of test fixture being specifically designed to test Surface Mount potentiometer; And creatively utilize a spring thimble and the second conducting strip further, measured device is locked on fixture by the 3rd conducting strip, then be connected with testing tool by thimble, brace and lead-in wire, just accurately can complete the test of multinomial electrical quantity; The utility model improves power of test, effectively ensure that the reliability of Surface Mount potentiometer; Further, this subsides test potentiometer fixture adopts a spring thimble, meets the Surface Mount potentiometer of locking different size specification; During test and potentiometer comprehensive tester compact siro spinning technology, within the shortest time, just can complete that potentiometer always hinders, the test of front zero-bit, rear zero-bit, CRV, all parameters of sliding noise; Meanwhile, the utility model is convenient, flexible, and convenience is connected with testing tool and error is less; And this subsides test potentiometer jig Design composition is simple, be easy to buying and assembling; And cost is lower; Because this subsides test potentiometer fixture inner structure is easily understood, can need to carry out transforming and upgrading according to difference easily; Finally, whole described Surface Mount test potentiometer fixture is simple and reliable, uses flexibly, easily promotes in working practice.
Those of ordinary skill in the field are to be understood that: the foregoing is only specific embodiment of the utility model; be not limited to the utility model; all within spirit of the present utility model and principle; any amendment of making, equivalent replacement, improvement etc., all should be included within protection domain of the present utility model.
Claims (9)
1. a Surface Mount test potentiometer fixture, is characterized in that, comprises back up pad and is arranged on static housing, thimble, spring, fixed block, the first conducting strip, the second conducting strip, the 3rd conducting strip, brace and the lead-in wire above described back up pad;
Wherein, described static housing is fixed in described back up pad, and described thimble lower end penetrates from the upper end of described static housing, passes from the lower end of described static housing; Further, the upper end of described thimble has part to stay outside, described static housing upper end; Described fixed block is arranged on described thimble, is provided with described spring between the described fixed block on described thimble to described static housing upper end inside surface; In addition, pass described static housing place in the lower end of described thimble and the first described conducting strip is installed;
Be separately installed with described second conducting strip, described 3rd conducting strip in the arranged on left and right sides of described first conducting strip bottom, and this second conducting strip and the 3rd conducting strip are all individually fixed in described back up pad; Further, the second described conducting strip is connected with respective described lead-in wire respectively by described brace with the 3rd described conducting strip.
2. test fixture according to claim 1, is characterized in that, is separately installed with described second conducting strip, described 3rd conducting strip in the arranged on left and right sides of described first conducting strip bottom.
3. test fixture according to claim 2, it is characterized in that, the part that described second conducting strip occupy lower semisection with described 3rd conducting strip is fixedly connected with described brace respectively, and the second namely described conducting strip has lap with the described brace be connected respectively with the 3rd described conducting strip.
4. test fixture according to claim 1, is characterized in that, between described first conducting strip and described second conducting strip, be provided with screens sheet, and this screens sheet is fixed in described back up pad.
5. test fixture according to claim 1, it is characterized in that, between described first conducting strip and described second conducting strip and between described first conducting strip and described 3rd conducting strip, be separately installed with screens sheet, and these two screens sheets are individually fixed in described back up pad.
6. the test fixture according to claim 1 to 5 any one, is characterized in that, the distance of described first conducting strip and described second conducting strip, described 3rd conducting strip is 1mm-3mm.
7. test fixture according to claim 6, is characterized in that, the distance of described first conducting strip and described second conducting strip, described 3rd conducting strip is 2mm.
8. test fixture according to claim 7, is characterized in that, the distance between described second conducting strip, described 3rd conducting strip is 0.5mm-2.5mm.
9. test fixture according to claim 8, is characterized in that, the distance between described second conducting strip, described 3rd conducting strip is 1.5mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520012268.7U CN204536369U (en) | 2015-01-08 | 2015-01-08 | A kind of Surface Mount test potentiometer fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520012268.7U CN204536369U (en) | 2015-01-08 | 2015-01-08 | A kind of Surface Mount test potentiometer fixture |
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| Publication Number | Publication Date |
|---|---|
| CN204536369U true CN204536369U (en) | 2015-08-05 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201520012268.7U Active CN204536369U (en) | 2015-01-08 | 2015-01-08 | A kind of Surface Mount test potentiometer fixture |
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| CN (1) | CN204536369U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111398156A (en) * | 2020-04-07 | 2020-07-10 | 赣州有色冶金研究所 | Sample clamp for electrochemical experiment and using method thereof |
-
2015
- 2015-01-08 CN CN201520012268.7U patent/CN204536369U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111398156A (en) * | 2020-04-07 | 2020-07-10 | 赣州有色冶金研究所 | Sample clamp for electrochemical experiment and using method thereof |
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