CN219201355U - Diffuse reflection collection system based on symmetrical homogenization light source - Google Patents

Abstract

The utility model relates to a diffuse reflection collecting system based on a symmetrical homogenizing light source, which comprises a plurality of light source devices, a plurality of first light processing devices, a plurality of second light processing devices, a light collecting device and a spectrum detecting device. The light source device has the advantages that the first light processing device is arranged at the light outlet of the light source device, and the light emitted by the light source device is subjected to homogenization treatment, so that the light intensity irradiated on the surface of the sample to be detected is more uniform; the second light processing device is arranged at the light incidence port of the light collecting device, and the light reflected by the sample to be tested is subjected to homogenization treatment or focusing treatment, so that the diffuse reflection light is good in collecting effect and spectrum repeatability, and the accuracy of a spectrum analysis result is improved.

Description

Diffuse reflection collection system based on symmetrical homogenization light source

Technical Field

The utility model relates to the technical field of optics, in particular to a diffuse reflection collecting system based on a symmetrical homogenizing light source.

Background

The spectrum analysis can identify the substance according to the spectrum of the substance and determine the chemical composition and the relative content of the substance, and has important significance and effect in the substance analysis industry.

In spectroscopic analysis, transmission methods are often used to measure spectra for uniform or transparent samples. For solid samples to be measured, diffuse reflection light on the surface of the samples to be measured is collected by a diffuse reflection method so as to analyze and obtain the spectrum of the samples to be measured. Because of the difference of sample loading conditions of the same sample, the internal arrangement and distribution condition of the sample are changed, the scattering coefficient is changed, and the spectral repeatability is poor. Sample particle size, density and flatness all affect the repeatability of the diffuse reflectance spectrum. The better the diffuse reflection light collection effect is, the higher the accuracy of the spectrum obtained by measurement is, so how to improve the spectrum repeatability and optimize the diffuse reflection light collection effect is the key point in spectrum analysis.

Aiming at the technical problems, chinese patent CN208537398U discloses a diffuse reflection collecting system based on multiple light sources, which ensures that the illumination intensity projected on the surface of a sample to be measured is higher and more uniform through the arrangement of the multiple light sources, and ensures that the diffuse reflection light collecting effect is better. However, the diffuse reflection collection system described above has drawbacks. For example, the light source does not irradiate the sample to be measured with the same intensity after being reflected from the reflecting bowl, so that the uniformity of the light is poor; after the light is diffusely reflected by the sample to be detected, the light is incident into the light collecting device at an irregular angle, so that the diffuse reflection light collecting effect is poor, the spectrum repeatability is poor, and the spectrum analysis result accuracy is low.

At present, no effective solution is proposed for solving the problems of poor light uniformity, poor diffuse reflection light collection effect, poor spectrum repeatability, low accuracy of spectrum analysis results and the like in the related technology.

Disclosure of Invention

The utility model aims to overcome the defects in the prior art and provides a diffuse reflection collecting system based on a symmetrical homogenizing light source, so as to solve the problems of poor light uniformity, poor diffuse reflection light collecting effect, poor spectrum repeatability, low spectrum analysis result accuracy and the like in the related art.

In order to achieve the above purpose, the technical scheme adopted by the utility model is as follows:

the utility model provides a diffuse reflection collecting system based on a symmetrical homogenizing light source, which comprises the following components:

the light source devices are symmetrically arranged on the same side of the sample to be tested, and each light source device and the sample to be tested are arranged at a preset angle and are used for emitting light rays to the sample to be tested;

the first light processing devices are arranged at the positions of the light emergent openings of the corresponding light source devices and are used for homogenizing the light emitted by the light source devices;

the second light processing device is arranged on one side of the sample to be detected, irradiated by the light source devices, and is used for processing the light reflected by the sample to be detected;

the light collecting device is arranged on one side of the sample to be detected, irradiated by the light source devices, and positioned at the downstream of the second light processing device, and is used for collecting the light processed by the second light processing device;

and the spectrum detection device is connected with the light collecting device and is used for carrying out spectrum detection and spectrum analysis on the light collected by the light collecting device.

In some embodiments, the illuminated area formed by the combined action of the homogenized light rays emitted by the light source devices on the surface of the sample to be measured is an elliptical light spot, and the elliptical light spot covers the sample to be measured.

In some of these embodiments, the light source device includes:

the reflecting unit is arranged on one side of the sample to be detected, and the first light processing device is arranged at the position of a light emergent port of the reflecting unit;

and the light source unit is arranged at the focus position of the reflecting unit.

In some of these embodiments, the longitudinal section of the reflecting unit has a parabolic structure.

In some of these embodiments, the width of the second end of the longitudinal section of the reflection unit is 1 to 3mm.

In some of these embodiments, the first end of the longitudinal section of the reflecting unit has a width of 18 to 20mm.

In some of these embodiments, the inner surface of the reflecting unit is a reflecting film.

In some embodiments, the light source unit is a halogen tungsten lamp.

In some of these embodiments, the power of the light source unit is 0 to 5W.

In some embodiments, the color temperature of the light source unit is equal to or greater than 2800K.

In some of these embodiments, the preset angle between the light source unit and the sample to be measured is an acute angle.

In some of these embodiments, the preset angle between the light source unit and the sample to be measured is 30 ° to 60 °.

In some of these embodiments, the first light processing device includes:

the first light homogenizing unit is arranged at the position of the light emergent opening of the corresponding light source device and is used for homogenizing the light emitted by the light source device.

In some embodiments, the first dodging unit is made of a material having a transmittance of not less than 80% for the spectral band of interest.

In some of these embodiments, the second light processing device includes:

the second light homogenizing unit is arranged on one side of the sample to be detected, irradiated by the light source devices, and used for homogenizing the light reflected by the sample to be detected.

In some embodiments, the second dodging unit is made of a material having a transmittance of not less than 80% for the spectral band of interest.

In some embodiments thereof, the second light processing device includes:

the lens unit is arranged on one side of the sample to be detected, which is irradiated by the light source devices, and the focal position of the lens unit is provided with a first end of the light collecting device, which is used for focusing the light reflected by the sample to be detected.

In some of these embodiments, the lens unit is a plano-convex lens or a biconvex lens.

In some of these embodiments, the convex surface of the lens unit is spherical or aspherical.

In some of these embodiments, the focal length of the lens unit is 0-15 mm.

In some of these embodiments, the light collection device comprises:

the optical fiber unit is arranged at one side of the sample to be detected, irradiated by the light source devices, and positioned at the downstream of the second light processing device;

the two probe units are respectively arranged at the end parts of the optical fiber units, one probe unit is opposite to the sample to be detected and positioned at the downstream of the second light processing device, and the other probe unit is connected with the spectrum detection device.

In some of these embodiments, the fiber unit is a single-core or multi-core multimode quartz fiber.

In some of these embodiments, the fiber unit is U-shaped or spiral.

In some of these embodiments, the optical fiber unit has an optical fiber core diameter of 50 to 600 μm.

In some of these embodiments, the probe unit is an SMA905 or an FC/APC.

In some of these embodiments, further comprising:

the fixing device is used for fixing the light source devices and the light collecting devices respectively.

In some of these embodiments, the securing means comprises:

the first fixing units are connected with the corresponding light source devices and are used for adjusting preset angles between the light source devices and the sample to be tested and fixing the light source devices;

the second fixing unit is connected with the second light processing device and used for fixing the second light processing device;

and the third fixing unit is connected with the light collecting device and used for fixing the light collecting device.

Compared with the prior art, the utility model has the following technical effects:

according to the diffuse reflection collecting system based on the symmetrical homogenizing light source, the first light processing device is arranged at the light outlet of the light source device, and the light emitted by the light source device is subjected to homogenizing treatment, so that the light intensity irradiated on the surface of a sample to be detected is more uniform; the second light processing device is arranged at the light incidence port of the light collecting device, and the light reflected by the sample to be tested is subjected to homogenization treatment or focusing treatment, so that the diffuse reflection light is good in collecting effect and spectrum repeatability, and the accuracy of a spectrum analysis result is improved.

Drawings

FIG. 1 is a schematic diagram of a diffuse reflection collection system according to an embodiment of the present utility model;

fig. 2 is a schematic view of a light source device according to an embodiment of the present utility model;

FIG. 3 is a schematic diagram of a first light processing device according to an embodiment of the present utility model;

FIG. 4 is a schematic diagram (one) of a second light processing device according to an embodiment of the present utility model;

FIG. 5 is a schematic view of a light collection device according to an embodiment of the utility model;

FIG. 6 is a schematic view of a fixture according to an embodiment of the utility model;

FIG. 7 is a ray path diagram (one) of a diffuse reflection collection system according to an embodiment of the present utility model;

FIG. 8 is a schematic diagram (II) of a second light processing device according to an embodiment of the present utility model;

fig. 9 is a ray path diagram (two) of a diffuse reflection collection system according to an embodiment of the present utility model.

Wherein the reference numerals are as follows: 100. a light source device; 110. a reflection unit; 120. a light source unit;

200. a first light processing device; 210. a first light homogenizing unit;

300. a second light processing device; 310. a second light homogenizing unit; 320. a lens unit;

400. a light collection device; 410. an optical fiber unit; 420. a probe unit;

500. a spectrum detection device;

600. a fixing device; 610. a first fixing unit; 620. a second fixing unit; 630. and a third fixing unit.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

It should be noted that, without conflict, the embodiments of the present utility model and features of the embodiments may be combined with each other.

The utility model is further described below with reference to the drawings and specific examples, which are not intended to be limiting.

Example 1

An exemplary embodiment of the present utility model, as shown in fig. 1, is a diffuse reflection collecting system based on a symmetrical homogenized light source, which comprises a plurality of light source devices 100, a plurality of first light processing devices 200, a plurality of second light processing devices 300, a light collecting device 400 and a spectrum detecting device 500. The light source devices 100 are symmetrically arranged on the same side of the sample to be tested, and each light source device 100 and the sample to be tested are arranged at a preset angle and are used for emitting light rays to the sample to be tested; the first light processing device 200 is disposed at a position of a light exit of the corresponding light source device 100, and is configured to perform homogenization treatment on light emitted by the light source device 100; the second light processing device 300 is disposed at one side of the sample to be measured irradiated by the light source devices 100, and is used for processing the light reflected by the sample to be measured; the light collecting device 400 is disposed at one side of the sample to be measured irradiated by the light source devices 100 and located downstream of the second light processing device 300, and is used for collecting the light processed by the second light processing device 300; the spectrum detection device 500 is connected to the light collecting device 400, and is used for performing spectrum detection and spectrum analysis on the light collected by the light collecting device 400.

In some embodiments, the illuminated area formed by the uniform light emitted by the light source devices 100 acting together on the surface of the sample to be measured is an elliptical light spot, and the elliptical light spot covers the sample to be measured.

In some embodiments, in the case that the number of the light source devices 100 is greater than or equal to three, the light source devices 100 are circumferentially arranged with the sample to be measured as a center. I.e. the angle between two adjacent light source devices 100 is 360 °/the number of light source devices 100.

The number of first light processing devices 200 matches the number of light source devices 100. Generally, the number of the first light processing devices 200 is equal to the number of the light source devices 100.

The light collecting device 400 is disposed perpendicular to the sample to be measured.

The center of the first end of the light collection device 400 is opposite the center of the sample to be measured.

In some of these embodiments, the spectral detection device 500 is a spectrometer.

As shown in fig. 2, the light source device 100 includes a reflection unit 110 and a light source unit 120. The reflection unit 110 is disposed at one side of the sample to be measured, and the first light processing device 200 is disposed at the light exit of the reflection unit 110; the light source unit 120 is disposed at a focal position of the reflection unit 110.

In some of these embodiments, the longitudinal section of the reflection unit 110 has a parabolic structure.

In some of these embodiments, the longitudinal section of the reflection unit 110 has an isosceles triangle structure or an isosceles trapezoid structure.

In some of these embodiments, the difference between the width of the first end of the longitudinal section of the reflection unit 110 and the width of the second end of the longitudinal section of the reflection unit 110 is not less than 15mm.

In some of these embodiments, the width of the second end of the longitudinal section of the reflection unit 110 is 1 to 3mm.

In some of these embodiments, the width of the first end of the longitudinal section of the reflection unit 110 is 18 to 20mm.

In some of these embodiments, the inner surface of the reflection unit 110 is a reflection film.

In some of these embodiments, the reflective film has a reflectance of 60% or more.

In some of these embodiments, the reflective film is an aluminum reflective film.

In some of these embodiments, the reflective unit 110 is a reflective bowl.

In some of these embodiments, the power of the light source unit 120 is 0-5W.

In some of these embodiments, the color temperature of the light source unit 120 is equal to or greater than 2800K.

In some of these embodiments, the preset angle between the light source unit 120 and the sample to be measured is an acute angle.

In some of these embodiments, the preset angle between the light source unit 120 and the sample to be measured is 30 to 60 °.

In some of these embodiments, the light source unit 120 is a halogen tungsten lamp.

As shown in fig. 3, the first light processing device 200 includes a first light homogenizing unit 210. The first light homogenizing unit 210 is disposed at a position of a light exit of the corresponding light source device 100, and is configured to perform homogenization treatment on light emitted by the light source device 100.

Specifically, the first dodging unit 210 is disposed at a position of a light exit of the corresponding reflecting unit 110.

More specifically, the first dodging unit 210 is disposed close to the light exit position of the reflecting unit 110.

The shape of the first dodging unit 210 is the same as the shape of the light exit position of the reflecting unit 110, and the outer edge of the first dodging unit 210 overlaps with the outer edge of the reflecting unit 110.

Specifically, in the case that the cross section of the light exit position of the reflection unit 110 is circular, the cross section of the first dodging unit 210 is circular, and the outer diameter of the first dodging unit 210 is equal to or greater than the outer diameter of the light exit position of the reflection unit 110.

In some of these embodiments, the first dodging unit 210 is adhered to the light exit position of the reflecting unit 110.

In some of these embodiments, the first light homogenizing unit 210 is made of a material having a transmittance of not less than 80% for the spectral band of interest.

In some of these embodiments, the thickness of the first light homogenizing unit 210 is 0.1mm to 0.2mm.

Preferably, the thickness of the first light homogenizing unit 210 is 0.188mm.

As shown in fig. 4, the second light processing device 300 includes a second light homogenizing unit 310. The second light homogenizing unit 310 is disposed at a side of the sample to be measured irradiated by the light source devices 100, and is used for homogenizing the light reflected by the sample to be measured.

The distance between the second light homogenizing unit 310 and the sample to be measured is greater than the distance between the highest point of the first light homogenizing unit 210 and the sample to be measured.

The minimum width of the second light homogenizing unit 310 is greater than the maximum width of the light collecting device 400.

Specifically, the projection shape of the light entrance of the light collecting device 400 on the horizontal plane is located on the projection shape of the second dodging unit 310 on the horizontal plane in a top view.

In some of these embodiments, the cross-section of the second light homogenizing unit 310 is circular, elliptical, rectangular.

In some of these embodiments, the second light homogenizing unit 310 is made of a material having a transmittance of not less than 80% for the spectral band of interest.

In some of these embodiments, the thickness of the second light homogenizing unit 310 is 0.5mm to 2mm.

Preferably, the thickness of the second light homogenizing unit 310 is 1mm.

In some of these embodiments, the second light homogenizing unit 310 is a light homogenizing sheet or frosted glass.

As shown in fig. 5, the light collecting device 400 includes an optical fiber unit 410 and two probe units 420. The optical fiber unit 410 is disposed at one side of the sample to be measured irradiated by the light source devices 100 and is located downstream of the second light processing device 300; two probe units 420 are respectively disposed at the end portions of the optical fiber unit 410, one probe unit 420 is opposite to the sample to be measured and is located downstream of the second light processing device 300, and the other probe unit 420 is connected with the spectrum detection device 500.

Specifically, the optical fiber unit 410 is located downstream of the second dodging unit 310; the probe unit 420 is located downstream of the second dodging unit 310.

In some of these embodiments, the fiber unit 410 is U-shaped or spiral.

In some of these embodiments, the fiber core of the fiber unit 410 is 50-600 μm.

In some of these embodiments, the fiber unit 410 is a single-core or multi-core multimode quartz fiber.

In some embodiments, the distance between the probe unit 420 adjacent to the second dodging unit 310 and the second dodging unit 310 is equal to or greater than 0.

In some of these embodiments, the probe unit 420 is an SMA905 or an FC/APC.

Further, the diffuse reflection collecting system further comprises a fixture 600. The fixing device 600 is connected to the light source devices 100 and the light collecting device 400.

As shown in fig. 6, the fixing device 600 includes a plurality of first fixing units 610, second fixing units 620, and third fixing units 630. The first fixing unit 610 is connected to the corresponding light source device 100, and is used for adjusting a preset angle between the light source device 100 and the sample to be tested and fixing the light source device 100; the second fixing unit 620 is connected to the second light processing device 300, and is used for fixing the second light processing device 300; the third fixing unit 630 is connected to the light collecting device 400 for fixing the light collecting device 400.

Specifically, the first fixing unit 610 is connected to the reflecting unit 110, and is used for adjusting a preset angle between the reflecting unit 110 and the light source unit 120 and the sample to be measured and fixing the reflecting unit 110; the second fixing unit 620 is connected to the second light homogenizing unit 310, and is used for fixing the second light homogenizing unit 310; the third fixing unit 630 is connected to the optical fiber unit 410 or the probe unit 420 for fixing the optical fiber unit 410 or the probe unit 420.

The number of the first fixing units 610 matches the number of the light source devices 100. In general, the number of first fixing units 610 is equal to the number of light source devices 100.

The first fixing unit 610 is a first fixing bracket with an adjustable angle. Specifically, the first fixing unit 610 includes a first base, a first adjusting lever, a second adjusting lever, a first locking member, a second locking member, and a first clamping member. Wherein the first base is arranged on a horizontal plane; the first adjusting rod is vertically arranged on the upper surface of the first base; the first end of the second adjusting rod is rotationally connected with the second end of the first adjusting rod; the first locking piece is respectively connected with the second end of the first adjusting rod and the first end of the second adjusting rod; the second locking piece is rotationally connected with the first locking piece; the first clamping member is disposed at the second end of the second adjusting rod and detachably connected with the reflecting unit 110.

Specifically, under the condition that an angle needs to be adjusted, the second locking piece and the first locking piece rotate relatively, so that the second locking piece rotates outwards along the axial direction of the first locking piece, and the second adjusting rod and the first adjusting rod can rotate; under the condition that a fixed angle is needed, the second locking piece and the first locking piece rotate relatively, so that the second locking piece rotates inwards along the axial direction of the first locking piece, and the second adjusting rod and the first adjusting rod cannot rotate.

In some of these embodiments, the second fixing unit 620 may be a second fixing bracket of which the height is not adjustable. Specifically, the second fixing unit 620 includes a second base, a first fixing lever, and a second clamping member. Wherein the second base is arranged on the horizontal plane; the first fixing rod is vertically arranged on the upper surface of the second base; the second clamping member is disposed at the second end of the first fixing rod and detachably connected to the second light homogenizing unit 310.

In some of these embodiments, the second fixing unit 620 may be a second fixing bracket that adjusts the height. Specifically, the second fixing unit 620 includes a second base, a third adjusting lever, a fourth adjusting lever, a third locking member, a fourth locking member, and a second clamping member. Wherein the second base is arranged on the horizontal plane; the third adjusting rod is vertically arranged on the upper surface of the second base; the first end of the fourth adjusting rod is in sliding connection with the second end of the third adjusting rod; the third locking piece is respectively connected with the second end of the third adjusting rod and the first end of the fourth adjusting rod; the fourth locking piece is detachably connected with the third locking piece; the second clamping member is disposed at the second end of the fourth adjusting rod and detachably connected to the second light homogenizing unit 310.

Specifically, under the condition that the height needs to be adjusted, the fourth locking piece is separated from the third locking piece or rotates relatively, so that the fourth locking piece moves outwards along the axial direction of the third locking piece, and the fourth adjusting rod and the third adjusting rod can slide; under the condition that the height is required to be fixed, the fourth locking piece is connected with the third locking piece or rotates relatively, so that the fourth locking piece moves inwards along the axial direction of the third locking piece, and the fourth adjusting rod and the third adjusting rod cannot slide.

In some of these embodiments, the third fixing unit 630 may be a third fixing bracket of which the height is not adjustable. Specifically, the third fixing unit 630 includes a third base, a second fixing lever, and a third clamp. Wherein the third base is arranged on the horizontal plane; the second fixing rod is vertically arranged on the upper surface of the third base; the third clamping member is disposed at the second end of the second fixing rod and detachably connected to the optical fiber unit 410 or the probe unit 420.

In some of these embodiments, the third fixing unit 630 may be a third fixing bracket that adjusts the height. Specifically, the third fixing unit 630 includes a third base, a fifth adjusting lever, a sixth adjusting lever, a fifth locking member, a sixth locking member, and a third clamping member. Wherein the third base is arranged on the horizontal plane; the fifth adjusting rod is vertically arranged on the upper surface of the third base; the first end of the sixth adjusting rod is in sliding connection with the second end of the fifth adjusting rod; the fifth locking piece is respectively connected with the second end of the fifth adjusting rod and the first end of the sixth adjusting rod; the sixth locking piece is detachably connected with the fifth locking piece; the third clamping member is disposed at the second end of the sixth adjusting lever and detachably connected to the optical fiber unit 410 or the probe unit 420.

Specifically, under the condition that the height needs to be adjusted, the sixth locking piece is separated from the fifth locking piece or rotates relatively, so that the sixth locking piece moves outwards along the axial direction of the fifth locking piece, and the sixth adjusting rod and the fifth adjusting rod can slide; under the condition that the height is required to be fixed, the sixth locking piece is connected with the fifth locking piece or rotates relatively, so that the sixth locking piece moves inwards along the axial direction of the fifth locking piece, and the sixth adjusting rod and the fifth adjusting rod cannot slide.

In some of these embodiments, the second fixing unit 620 and the third fixing unit 630 are integrally formed, and are fourth fixing brackets, which cannot be adjusted in height. Specifically, the device comprises a fourth base, a third fixed rod, a fourth fixed rod, a fifth fixed rod, a second clamping piece and a third clamping piece. Wherein the fourth base is arranged on the horizontal plane; the third fixing rod is vertically arranged on the upper surface of the fourth base; the fourth fixed rod is vertically arranged in the middle of the third fixed rod; the fifth fixed rod is vertically arranged at the second end of the third fixed rod; the second clamping piece is arranged at the second end of the fourth fixed rod and is detachably connected with the second light homogenizing unit 310; the third clamping member is disposed at the second end of the fifth fixing rod and detachably connected to the optical fiber unit 410 or the probe unit 420.

In some of these embodiments, the second fixing unit 620 and the third fixing unit 630 are integrally formed, and are fifth fixing brackets of non-adjustable height. Specifically, the device comprises a fifth base, a seventh adjusting rod, an eighth adjusting rod, a seventh locking piece, an eighth locking piece, a sixth fixing rod, a second clamping piece, a ninth adjusting rod, a ninth locking piece, a tenth locking piece, a seventh fixing rod and a third clamping piece. Wherein the fifth base is arranged on the horizontal plane; the seventh adjusting rod is vertically arranged on the upper surface of the fifth base; the first end of the eighth adjusting rod is in interactive connection with the second end of the seventh adjusting rod; the seventh locking piece is respectively connected with the second end of the seventh adjusting rod and the first end of the eighth adjusting rod; the eighth locking piece is detachably connected with the seventh locking piece; the sixth fixed rod is vertically arranged in the middle of the eighth adjusting rod; the second clamping piece is arranged at the second end of the sixth fixing rod and is detachably connected with the second light homogenizing unit 310; the first end of the ninth adjusting rod is connected with the second end of the eighth adjusting rod in a sliding manner; the ninth locking piece is respectively connected with the second end of the eighth adjusting rod and the first end of the ninth adjusting rod; the tenth locking piece is detachably connected with the ninth locking piece; the seventh fixing rod is vertically arranged at the second end of the ninth adjusting rod; the third clamping member is disposed at the second end of the seventh fixing rod and detachably connected to the optical fiber unit 410 or the probe unit 420.

Specifically, in the case that the height of the second light homogenizing unit 310 needs to be adjusted, the eighth locking member is separated from the seventh locking member or rotates relatively, so that the eighth locking member moves outwards along the axial direction of the seventh locking member, and the eighth adjusting lever and the seventh adjusting lever can slide; in the case where the height of the second light homogenizing unit 310 needs to be fixed, the eighth locking member is connected to or rotates relative to the seventh locking member, so that the eighth locking member moves inward in the axial direction of the seventh locking member, and the eighth adjusting lever and the seventh adjusting lever cannot slide.

Specifically, in the case that the height of the optical fiber unit 410 or the probe unit 420 needs to be adjusted, the tenth locking member is separated from the ninth locking member or rotates relatively, so that the tenth locking member moves outwards along the axial direction of the ninth locking member, and the tenth adjusting lever and the ninth adjusting lever can slide; in the case where the height of the optical fiber unit 410 or the probe unit 420 needs to be fixed, the tenth locking member is connected to or rotates relative to the ninth locking member, so that the tenth locking member moves inward in the axial direction of the ninth locking member, and the tenth adjusting lever and the ninth adjusting lever cannot slide.

The application method of the utility model is as follows:

as shown in fig. 7, the angles between the reflecting unit 110 and the light source unit 120 and the sample to be measured are adjusted;

adjusting the distance between the second dodging unit 310 and the sample to be measured;

adjusting a distance between the probe unit 420 at the first end of the optical fiber unit 410 and the second dodging unit 310;

turning on the light source unit 120, the light source unit 120 emits light to the inside of the reflection unit 110;

the light reflected by the reflection unit 110 passes through the first light homogenizing unit 210 and irradiates the sample to be measured;

the light reflected by the sample to be measured passes through the second light homogenizing unit 310 and then enters the optical fiber unit 410;

the spectrum detection device 500 performs detection analysis on the collected light.

The utility model has the advantages that the first light processing device is arranged at the light ray outlet of the light source device, and the light rays emitted by the light source device are subjected to homogenization treatment, so that the intensity of the light rays irradiated on the surface of the sample to be detected is more uniform; the second light processing device is arranged at the light incidence port of the light collecting device, and light reflected by the sample to be tested is subjected to homogenization treatment, so that the diffuse reflection light collecting effect is good, the spectrum repeatability is good, and the accuracy of the spectrum analysis result is improved.

Example 2

This embodiment is a modified embodiment of embodiment 1. This embodiment differs from embodiment 1 in that: the second light processing device 300 is different in structure.

As shown in fig. 8, the second light processing device 300 includes a lens unit 320. The lens unit 320 is disposed on one side of the sample to be measured irradiated by the light source devices 100, and a first end of the light collecting device 400 is disposed at a focal position of the lens unit 320, so as to focus the light reflected by the sample to be measured. .

In some of these embodiments, the lens unit 320 is a plano-convex lens or a biconvex lens.

In some of these embodiments, the convex surface of lens unit 320 is spherical or aspherical.

In some of these embodiments, the focal length of lens unit 320 is 0-15 mm.

The application method of the utility model is as follows:

as shown in fig. 9, the angles between the reflecting unit 110 and the light source unit 120 and the sample to be measured are adjusted;

adjusting the distance between the second dodging unit 310 and the sample to be measured;

adjusting a distance between the probe unit 420 at the first end of the optical fiber unit 410 and the second dodging unit 310;

turning on the light source unit 120, the light source unit 120 emits light to the inside of the reflection unit 110;

the light reflected by the reflection unit 110 passes through the first light homogenizing unit 210 and irradiates the sample to be measured;

the light reflected by the sample to be measured passes through the lens unit 320 and then enters the optical fiber unit 410;

the spectrum detection device 500 performs detection analysis on the collected light.

The advantage of this embodiment lies in, set up the second light processing apparatus at the light entrance of light collection device, carry out focusing treatment to the light that awaits measuring sample reflection for diffuse reflection light collection effect is good, spectral repeatability is good, thereby improves spectral analysis result's accuracy.

The foregoing description is only illustrative of the preferred embodiments of the present utility model and is not to be construed as limiting the scope of the utility model, and it will be appreciated by those skilled in the art that equivalent substitutions and obvious variations may be made using the description and illustrations of the present utility model, and are intended to be included within the scope of the present utility model.

Claims (10)

1. A diffuse reflection collection system based on a symmetrical homogenized light source, comprising:

the light source devices are symmetrically arranged on the same side of the sample to be tested, and each light source device and the sample to be tested are arranged at a preset angle and are used for emitting light rays to the sample to be tested;

the first light processing devices are arranged at the positions of the light emergent openings of the corresponding light source devices and are used for homogenizing the light emitted by the light source devices;

the second light processing device is arranged on one side of the sample to be detected, irradiated by the light source devices, and is used for processing the light reflected by the sample to be detected;

the light collecting device is arranged on one side of the sample to be detected, irradiated by the light source devices, and positioned at the downstream of the second light processing device, and is used for collecting the light processed by the second light processing device;

and the spectrum detection device is connected with the light collecting device and is used for carrying out spectrum detection and spectrum analysis on the light collected by the light collecting device.

2. The diffuse reflection collection system of claim 1, wherein said light source means comprises:

the reflecting unit is arranged on one side of the sample to be detected, and the first light processing device is arranged at the position of a light emergent port of the reflecting unit;

a light source unit disposed at a focal position of the reflection unit; and/or

The light collecting device includes:

the optical fiber unit is arranged at one side of the sample to be detected, irradiated by the light source devices, and positioned at the downstream of the second light processing device;

the two probe units are respectively arranged at the end parts of the optical fiber units, one probe unit is opposite to the sample to be detected and positioned at the downstream of the second light processing device, and the other probe unit is connected with the spectrum detection device.

3. The diffuse reflection collecting system according to claim 2, wherein a longitudinal section of said reflecting unit has a parabolic structure; and/or

The width of the second end of the longitudinal section of the reflecting unit is 1-3 mm; and/or

The width of the first end of the longitudinal section of the reflecting unit is 18-20 mm; and/or

The inner surface of the reflecting unit is a reflecting film; and/or

The light source unit is a halogen tungsten lamp; and/or

The power of the light source unit is 0-5W; and/or

The color temperature of the light source unit is more than or equal to 2800K; and/or

The preset angle between the light source unit and the sample to be detected is an acute angle; and/or

The optical fiber unit is a single-core or multi-core multimode quartz optical fiber; and/or

The optical fiber unit is U-shaped, spiral or spiral; and/or

The optical fiber core diameter of the optical fiber unit is 50-600 mu m; and/or

The probe unit is SMA905 or FC/APC.

4. The diffuse reflection collection system of claim 1, wherein said first light processing device comprises:

the first light homogenizing unit is arranged at the position of the light emergent opening of the corresponding light source device and is used for homogenizing the light emitted by the light source device.

5. The diffuse reflection collection system of claim 4, wherein the first light homogenizing unit is made of a material having a transmittance of not less than 80% for the spectral band of interest.

6. The diffuse reflection collection system of claim 1, wherein said second light processing device comprises:

the second light homogenizing unit is arranged on one side of the sample to be detected, irradiated by the light source devices, and used for homogenizing the light reflected by the sample to be detected; or (b)

The lens unit is arranged on one side of the sample to be detected, which is irradiated by the light source devices, and the focal position of the lens unit is provided with a first end of the light collecting device, which is used for focusing the light reflected by the sample to be detected.

7. The diffuse reflection collection system of claim 6, wherein said second light homogenizing unit is made of a material having a transmittance of not less than 80% for the spectral band of interest; and/or

The lens unit is a plano-convex lens or a biconvex lens; and/or

The convex surface of the lens unit is a spherical surface or an aspheric surface; and/or

The focal length of the lens unit is 0-15 mm.

8. The diffuse reflection collecting system according to claim 1, wherein the illuminated area formed by the combined action of the homogenized light rays emitted by the light source devices on the surface of the sample to be measured is an elliptical light spot, and the elliptical light spot covers the sample to be measured.

9. The diffuse reflection collection system of any one of claims 1-8, further comprising:

the fixing device is used for fixing the light source devices and the light collecting devices respectively.

10. The diffuse reflection collection system of claim 9, wherein said fixture comprises:

the first fixing units are connected with the corresponding light source devices and are used for adjusting preset angles between the light source devices and the sample to be tested and fixing the light source devices;

the second fixing unit is connected with the second light processing device and used for fixing the second light processing device;

and the third fixing unit is connected with the light collecting device and used for fixing the light collecting device.

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