CN219161862U

CN219161862U - Jig for chip aging test

Info

Publication number: CN219161862U
Application number: CN202223312637.3U
Authority: CN
Inventors: 卢世雄
Original assignee: Shenzhen Bindebao Electronic Technology Co ltd
Current assignee: Shenzhen Bindebao Electronic Technology Co ltd
Priority date: 2022-12-09
Filing date: 2022-12-09
Publication date: 2023-06-09
Anticipated expiration: 2032-12-09

Abstract

The utility model discloses a jig for chip burn-in test, which relates to the technical field of chip test and comprises a jig base and a jig bracket arranged on the top surface of the jig base, wherein a chip limiting mechanism is arranged on the top surface of the jig base and used for fixing a chip on the jig base so as to facilitate compression test, a testing mechanism is arranged on the outer side surface of the jig bracket, and a gear mechanism is arranged on the outer side surface of the jig bracket. According to the utility model, the position of the limiting frame is detected through the infrared grating, the driving cylinder is controlled by the controller to be connected with the circuit, the driving main shaft is used for driving the driving main plate to press down, so that the testing pressing plate is in contact with the elastic film covered with the chip to be detected, the chip is subjected to compression testing, and the testing pressing plate synchronously moves down at the moment of positioning and fixing the testing pressing plate, thereby shortening the testing reaction time and improving the testing efficiency.

Description

Jig for chip aging test

Technical Field

The utility model relates to the technical field of chip testing, in particular to a jig for chip burn-in testing.

Background

With the rapid growth of semiconductor technology and the year-by-year increase in chip complexity, chip testing has throughout the entire design development and production process, with the ultimate goal of chip burn-in testing being to predict the life of a product, to evaluate or predict the durability of a product produced by a manufacturer, and with the increasing challenges, burn-in testing being an important test for eliminating early failure products prior to delivery to customers.

The semiconductor laser is also called laser diode, which uses semiconductor material as working substance, because of the difference of substance structure, the specific process of different kinds of laser is special, the common working substance is gallium arsenide, cadmium sulfide, indium phosphide, zinc sulfide, etc., the excitation mode is three forms of electric injection, electron beam excitation and optical pumping, the semiconductor laser device can be divided into homojunction, single heterojunction, double heterojunction, etc., the homojunction laser and single heterojunction laser are pulse devices at room temperature, and the double heterojunction laser can realize continuous operation at room temperature.

Various tests are needed to be carried out on the semiconductor laser chip in the manufacturing process at present, wherein the compression resistance of the semiconductor laser chip is needed to be tested, the chip which cannot reach a certain index is needed to be destroyed, otherwise, the whole service life of the semiconductor laser is influenced, but the existing testing device needs to be placed one by one when the chip is fixed, so that the efficiency of discharging and taking materials is low, and the testing efficiency is influenced.

Disclosure of Invention

The utility model provides a jig for chip burn-in test, which has the advantage of high test efficiency, and aims to solve the problems that the efficiency of discharging and taking materials is low and the test efficiency is affected because the conventional test device needs to be placed one by one when fixing chips.

In order to achieve the aim of high test efficiency, the utility model provides the following technical scheme: the utility model provides a tool for chip burn-in test, includes the tool base and installs the tool support at tool base top surface, the top surface mounting of tool base has chip stop gear, chip stop gear is used for fixing the chip on the tool base and is convenient for carry out the resistance to compression test, the outside surface mounting of tool support has testing mechanism, testing mechanism is used for carrying out the resistance to compression test to the chip of fixing on the tool base, the outside surface mounting of tool support has gear mechanism, gear mechanism is used for fixed spacing testing mechanism.

As a preferable technical scheme of the utility model, the chip limiting mechanism comprises a test plate and a limiting assembly, wherein the test plate is arranged on the top end surface of the jig base, and the limiting assembly is arranged on the top end surface of the jig base adjacent to the outer side of the test plate.

As a preferable technical scheme of the utility model, the limiting assembly comprises a turnover shaft and a limiting frame, wherein the turnover shaft is movably arranged on the top end surface of the jig base adjacent to the outer side of the test board, the limiting frame is arranged on the outer side surface of the turnover shaft, an elastic membrane is arranged in the limiting frame, a first magnetic block is arranged on one side surface of the limiting frame, and a second magnetic block is arranged on the top end surface of the jig base.

As a preferable technical scheme of the utility model, the test mechanism comprises a driving cylinder and a test assembly, wherein the driving cylinder is arranged on the top end surface of the jig support, the output end of the driving cylinder is provided with a driving spindle, the tail end surface of the driving spindle extends to the lower part of the jig support, and the test assembly is arranged on the tail end surface of the driving spindle.

As a preferable technical scheme of the utility model, the test assembly comprises a driving main board and a test pressing board, wherein the driving main board is arranged on the tail end surface of a driving main shaft, the test pressing board is arranged on the bottom end surface of the driving main board, an infrared grating is arranged on the outer side surface of the jig support, a controller is arranged on the top end surface of the jig support on one side of the driving cylinder, the infrared grating is electrically connected to the controller, and the controller is electrically connected to the driving cylinder.

As a preferable technical scheme of the utility model, the gear mechanism comprises a movable sleeve and a connecting component, wherein the two movable sleeves are movably arranged on the outer side surface of the jig bracket, and the connecting component is arranged between the two movable sleeves.

As a preferable technical scheme of the utility model, the connecting assembly comprises fixing screws and a connecting shaft, wherein the connecting shaft is arranged on one side surface of any movable sleeve, the other movable sleeve is arranged on the outer side surface of the connecting shaft, the other side surfaces of the two movable sleeves are both provided with fixing plates, and the fixing screws are arranged in the two fixing plates.

Compared with the prior art, the utility model provides the jig for the chip aging test, which has the following beneficial effects:

1. this a tool for chip burn-in test, will wait to test the chip in proper order pendulum in test board top, then rotate the trip shaft for spacing frame upset is to another plane, makes elastic membrane and wait to test the chip surface contact, and first magnetic path and second magnetic path coincide each other this moment, because first magnetic path and second magnetic path correspond the face and take magnetism opposite, consequently make spacing frame fix in tool base top under the effect of magnetic attraction, thereby carry out synchronous fixed spacing with waiting to test the chip through the elastic membrane, conveniently carry out the compression test.

2. This a tool for chip ageing test, after spacing frame upset to setpoint, spacing frame's one side is passed through two infrared gratings this moment, detects spacing frame's position through the infrared grating, with detection information transfer to the controller this moment, access circuit through controller control drive cylinder, it pushes down to drive the mainboard through the drive main shaft drive, make test clamp plate and cover the elastic membrane contact of waiting to detect the chip, thereby carry out the resistance to compression test to the chip, test clamp plate moves down in step in the twinkling of an eye at test clamp plate location is fixed, test reaction time has been shortened, and test efficiency has been improved.

Drawings

FIG. 1 is a schematic view of the external structure of the present utility model;

FIG. 2 is a schematic view of an external structure at another angle according to the present utility model;

fig. 3 is a schematic view of an external structure according to another angle of the present utility model.

In the figure: 1. a jig base; 2. a jig bracket; 3. a test board; 4. a turnover shaft; 5. a limit frame; 6. an elastic film; 7. a first magnetic block; 8. a second magnetic block; 9. a driving cylinder; 10. driving a main shaft; 11. driving a main board; 12. a test press plate; 13. an infrared grating; 14. a controller; 15. a movable sleeve; 16. a connecting shaft; 17. a fixing plate; 18. and (5) fixing the screw.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

Referring to fig. 1-3, the utility model discloses a jig for chip burn-in testing, which comprises a jig base 1 and a jig support 2 arranged on the top surface of the jig base 1, wherein a chip limiting mechanism is arranged on the top surface of the jig base 1, the chip limiting mechanism is used for fixing a chip on the jig base 1 so as to facilitate the compression test, a testing mechanism is arranged on the outer side surface of the jig support 2, the testing mechanism is used for carrying out the compression test on the chip fixed on the jig base 1, a gear mechanism is arranged on the outer side surface of the jig support 2, and the gear mechanism is used for fixing the limiting testing mechanism.

Specifically, chip stop gear includes test board 3 and spacing subassembly, test board 3 installs the top surface at tool base 1, spacing subassembly installs the tool base 1 top surface in the outside adjacent test board 3, spacing subassembly includes trip shaft 4 and spacing frame 5, trip shaft 4 movable mounting is in the tool base 1 top surface in the outside adjacent test board 3, spacing frame 5 installs the outside surface at trip shaft 4, the internally mounted of spacing frame 5 has elastic membrane 6, one side surface mounting of spacing frame 5 has first magnetic path 7, tool base 1 top surface mounting has second magnetic path 8, the chip to be tested is put in proper order in test board 3 top, then rotate trip shaft 4, make spacing frame 5 upset to another plane, make elastic membrane 6 and chip surface contact to be tested at this moment, first magnetic path 7 and second magnetic path 8 coincide each other, because first magnetic path 7 and second magnetic path 8 correspond the face and carry magnetism opposite, consequently, make spacing frame 5 fix in tool base 1 top under the effect of magnetic attraction, thereby wait to carry out synchronous fixed compression resistance test with the chip 6 through elastic membrane, thereby it is convenient to carry out synchronous fixed compression resistance test.

Further, the testing mechanism includes actuating cylinder 9 and test assembly, actuating cylinder 9 installs the top surface of tool support 2, actuating spindle 10 is installed to actuating cylinder 9's output, actuating spindle 10's terminal surface extends to tool support 2's below, test assembly installs the terminal surface at actuating spindle 10, test assembly includes drive mainboard 11 and test clamp plate 12, actuating mainboard 11 installs the terminal surface at actuating spindle 10, test clamp plate 12 installs the bottom surface at actuating mainboard 11, tool support 2's outside surface mounting has infrared raster 13, actuating cylinder 9 one side tool support 2 top surface mounting has controller 14, infrared raster 13 electric connection is to controller 14, controller 14 electric connection is to actuating cylinder 9, after spacing frame 5 upset to the setpoint, spacing frame 5's one side is through two infrared raster 13 at this moment, detect spacing frame 5's position through infrared raster 13, at this moment, with detection information transfer to controller 14, control actuating cylinder 9 access circuit through controller 14, drive mainboard 11 pushes down, make test clamp plate 12 and cover the chip 6 who waits to detect the chip contact with the test, thereby test efficiency is fixed at the test clamp plate 12, the test is shortened, the test time is shortened, the test is synchronous, the test is carried out to the chip 12, the test is moved at the test is time is shortened.

Further, the gear mechanism comprises a movable sleeve 15 and a connecting component, wherein the two movable sleeves 15 are movably arranged on the outer side surfaces of the jig support 2, the connecting component is arranged between the two movable sleeves 15 and comprises a fixing screw 18 and a connecting shaft 16, the connecting shaft 16 is arranged on one side surface of any movable sleeve 15, the other movable sleeve 15 is arranged on the outer side surface of the connecting shaft 16, fixing plates 17 are arranged on the other side surfaces of the two movable sleeves 15, the fixing screw 18 is arranged in the two fixing plates 17, and before testing, the fixing screw 18 is unscrewed so that the two movable sleeves 15 are separated from each other, and the two movable sleeves 15 are taken down from the jig support 2.

The working principle and the using flow of the utility model are as follows: before testing, the fixing screws 18 are unscrewed to separate the two movable sleeves 15 from each other, the two movable sleeves 15 are taken down from the jig support 2, then chips to be tested are sequentially placed above the test board 3, then the turnover shaft 4 is rotated to enable the limiting frame 5 to be turned to the other plane, the elastic membrane 6 is enabled to be in contact with the surfaces of the chips to be tested, at the moment, the first magnetic block 7 and the second magnetic block 8 are mutually overlapped, and the limiting frame 5 is fixed above the jig base 1 under the action of magnetic attraction force due to the fact that the magnetism carried by the corresponding surfaces of the first magnetic block 7 and the second magnetic block 8 is opposite, so that the chips to be tested are synchronously fixed and limited through the elastic membrane 6, and compression testing is facilitated;

after the spacing frame 5 overturns to the setpoint, one side of spacing frame 5 passes through two infrared grating 13 this moment, detects the position of spacing frame 5 through infrared grating 13, at this moment with detection information transfer to controller 14, access circuit through controller 14 control drive cylinder 9, it pushes down to drive mainboard 11 through drive main shaft 10, make test clamp plate 12 and cover the elastic membrane 6 contact of waiting to detect the chip, thereby carry out the resistance to compression test to the chip, test clamp plate 12 moves down in step at the fixed moment of test clamp plate 12 location, test reaction time has been shortened, and test efficiency has been improved.

It should be noted that in this document, terms such as "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.

Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.

Claims

1. A tool for chip ageing test, includes tool base (1) and installs tool support (2) at tool base (1) top surface, its characterized in that: the device is characterized in that a chip limiting mechanism is arranged on the top end surface of the jig base (1), the chip limiting mechanism is used for fixing a chip on the jig base (1) and is convenient for compression testing, a testing mechanism is arranged on the outer side surface of the jig support (2), the testing mechanism is used for compression testing of the chip fixed on the jig base (1), a gear mechanism is arranged on the outer side surface of the jig support (2), and the gear mechanism is used for fixing the limiting testing mechanism.

2. The fixture for chip burn-in testing according to claim 1, wherein: the chip limiting mechanism comprises a test plate (3) and a limiting assembly, wherein the test plate (3) is arranged on the top surface of the jig base (1), and the limiting assembly is arranged on the top surface of the jig base (1) adjacent to the outer side of the test plate (3).

3. The fixture for chip burn-in testing according to claim 2, wherein: the limiting assembly comprises a turnover shaft (4) and a limiting frame (5), wherein the turnover shaft (4) is movably mounted on the top end surface of the jig base (1) adjacent to the outer side of the test plate (3), the limiting frame (5) is mounted on the outer side surface of the turnover shaft (4), an elastic membrane (6) is mounted in the limiting frame (5), a first magnetic block (7) is mounted on one side surface of the limiting frame (5), and a second magnetic block (8) is mounted on the top end surface of the jig base (1).

4. The fixture for chip burn-in testing according to claim 1, wherein: the testing mechanism comprises a driving air cylinder (9) and a testing component, wherein the driving air cylinder (9) is arranged on the top end surface of the jig support (2), a driving main shaft (10) is arranged at the output end of the driving air cylinder (9), the tail end surface of the driving main shaft (10) extends to the lower side of the jig support (2), and the testing component is arranged on the tail end surface of the driving main shaft (10).

5. The fixture for chip burn-in testing of claim 4, wherein: the test assembly comprises a drive main board (11) and a test pressing board (12), wherein the drive main board (11) is arranged on the tail end surface of a drive main shaft (10), the test pressing board (12) is arranged on the bottom end surface of the drive main board (11), an infrared grating (13) is arranged on the outer side surface of the jig support (2), a controller (14) is arranged on the top end surface of the jig support (2) on one side of the drive cylinder (9), and the infrared grating (13) is electrically connected to the controller (14), and the controller (14) is electrically connected to the drive cylinder (9).

6. The fixture for chip burn-in testing according to claim 1, wherein: the gear mechanism comprises a movable sleeve (15) and a connecting assembly, wherein the two movable sleeves (15) are movably mounted on the outer side surface of the jig support (2), and the connecting assembly is mounted between the two movable sleeves (15).

7. The fixture for chip burn-in testing of claim 6, wherein: the connecting assembly comprises fixing screws (18) and a connecting shaft (16), the connecting shaft (16) is arranged on one side surface of any movable sleeve (15) in a movable mode, the other movable sleeve (15) is arranged on the outer side surface of the connecting shaft (16), fixing plates (17) are arranged on the other side surfaces of the two movable sleeves (15), and the fixing screws (18) are arranged inside the two fixing plates (17).