CN219143032U - Needle point testing structure of annular embedded multi-position PCB - Google Patents
Needle point testing structure of annular embedded multi-position PCB Download PDFInfo
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- CN219143032U CN219143032U CN202223109358.7U CN202223109358U CN219143032U CN 219143032 U CN219143032 U CN 219143032U CN 202223109358 U CN202223109358 U CN 202223109358U CN 219143032 U CN219143032 U CN 219143032U
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Abstract
The utility model relates to an annular embedded multi-position PCB pin point test structure, which is characterized in that: the device comprises a carrier plate, wherein a rotating disc is arranged on the carrier plate, a plurality of embedded grooves are uniformly formed in the rotating disc, product carriers are embedded in the embedded grooves, and the product carriers are combined to form an annular embedded multi-position product clamping structure; the carrier plate is provided with a test area, the test area is provided with a down-pressing type test head, the down-pressing type test head is arranged corresponding to a product carrier, and the annular embedded multi-position production clamping structure on the rotating disc is combined with the down-pressing type test head to form a continuous test high-efficiency PCB needle point test structure.
Description
Technical Field
The utility model relates to a precision machining technology and precision machining equipment, in particular to automatic precision machining test equipment, and specifically relates to an annular embedded multi-position PCB pin point test structure.
Background
The PCB pinpoint test is a vital link in the processing and preparation of electronic products, an integrated circuit board of the electronic products is formed by loading required elements on the PCB, the qualification rate of the products can be effectively guaranteed by carrying out the pinpoint test on the PCB, the product fixing carrier is generally arranged by adopting a corresponding pressing-down type test head in the current stage of the PCB pinpoint test, the pressing-down type test head presses down after the product is loaded into the fixing carrier, and the test is carried out through a test needle, so that the problem to be solved exists: the product clamping efficiency influences the testing efficiency, and the PCB pin point test at the present stage is a down-pressing type testing head correspondingly provided with a product carrier, and each testing flow is required to carry out clamping of a product to be tested and taking out of the tested product, so that the testing efficiency is directly influenced.
Therefore, it is desirable to provide an annular embedded multi-bit PCB pin test structure to solve the above-mentioned problems.
Disclosure of Invention
The utility model aims to provide an annular embedded multi-position PCB pin point test structure.
The utility model realizes the aim through the following technical scheme:
the needle point test structure of the annular embedded multi-position PCB comprises a carrier plate, wherein a rotating disc is arranged on the carrier plate, a plurality of embedded grooves are uniformly formed in the rotating disc, product carriers are embedded in the embedded grooves, and the product carriers are combined to form an annular embedded multi-position product clamping structure;
the carrier plate is provided with a test area, the test area is provided with a down-pressing type test head, the down-pressing type test head is arranged corresponding to a product carrier, and the annular embedded multi-position production clamping structure on the rotating disc is combined with the down-pressing type test head to form a continuous test high-efficiency PCB needle point test structure.
Further, one of the product carriers on two sides of the down-pressing type test head is located in the product clamping area to be tested, and the other product carrier is located in the product taking-out area after testing.
Furthermore, the clamping area of the product to be tested and the product taking-out area after the test are correspondingly provided with clamping manipulators, so that the loading, testing and taking-out integrated PCB pin point testing equipment is formed.
Further, the down-pressure type test head comprises a vertical plate arranged on the carrier plate, and a lifting driving piece is arranged on the vertical plate and connected with the test head.
Further, the test head comprises a test substrate, a test connection block used for connecting the lifting driving piece is arranged on the test substrate, a test needle is arranged on the test connection block, a plurality of test group partition boards are connected with the test connection block through a spring shaft, and the test needle is combined with the test group partition boards to form an elastic pressing type test probe structure.
Further, the test substrate is correspondingly provided with a guide post, a pressing buffer pressure spring is arranged at the joint of the guide post and the test substrate, and the pressing buffer pressure spring is combined with the elastic pressing type test probe structure to form a double-elastic buffer high-protection PCB pin point test structure.
Further, the product carrier comprises a carrier plate, a carrier area is arranged on the carrier plate, a profiling positioning groove is formed in the carrier area, and a fixing block is correspondingly arranged on the profiling positioning groove.
Further, the fixed block quantity is two, corresponds to set up in imitative groove both sides, including rotating the rotatory stand of connecting in rotating to do, is provided with on the rotatory stand and presses and hold the diaphragm.
Further, the pressing transverse plate is used as a test pressure-bearing body for pressing and bearing the dry test set partition plate, the dry test set partition plate presses and bears the test pressure-bearing body to bear and elastically retract, and the test needle is exposed to perform PCB needle point test, so that a direct-pressing type PCB needle point test structure is formed.
Compared with the prior art, the pressing type test head is arranged corresponding to a product carrier, the annular embedded multi-position production clamping structure on the rotating disc is combined with the pressing type test head to form a continuous test high-efficiency PCB pin point test structure, continuous PCB pin point test is guaranteed, PCB pin point test efficiency is improved, the direct-pressing type PCB pin point test structure is prevented from being damaged by test during test, and product quality is guaranteed.
Drawings
Fig. 1 is a schematic diagram of the structure of the present utility model.
FIG. 2 is a second schematic structural view of the present utility model.
FIG. 3 is a third schematic diagram of the structure of the present utility model.
FIG. 4 is a schematic diagram of the structure of the present utility model.
Detailed Description
Referring to fig. 1-4, an annular embedded multi-position PCB needle point testing structure includes a carrier plate 1, a rotating disc 2 is provided on the carrier plate 1, a plurality of embedded grooves are uniformly provided on the rotating disc 2, product carriers 100 are embedded in the embedded grooves, and a plurality of product carriers 100 are combined to form an annular embedded multi-position product clamping structure;
the carrier plate 1 is provided with a test area 200, the test area 200 is provided with a down-pressing type test head 3, the down-pressing type test head 3 is arranged corresponding to a product carrier 100, and the annular embedded multi-position production clamping structure on the rotating disc 2 is combined with the down-pressing type test head 3 to form a continuous test efficient PCB needle point test structure.
One of the product carriers 100 on both sides of the push-down type test head 3 is located in the product clamping area 400 to be tested, and the other is located in the product taking-out area 500 after testing.
The clamping area 400 of the product to be tested and the product taking-out area 500 after testing are correspondingly provided with clamping manipulators, so that loading, testing and taking-out integrated PCB pin point testing equipment is formed.
The down-pressure test head 3 includes a vertical plate 31 provided on the carrier plate, a lift driving member 32 is provided on the vertical plate 31, and the lift driving member 32 is connected with a test head 33.
The test head 33 comprises a test substrate 34, a test connection block 35 for connecting the lifting driving piece 32 is arranged on the test substrate 34, a test needle 36 is arranged on the test connection block 35, a plurality of test group partition plates 37 are connected with the test connection block 35 through a spring shaft, and the test needle 36 is combined by the plurality of test group partition plates 37 to form an elastic pressing type test probe structure.
The test substrate 34 is correspondingly provided with a guide post 38, the joint of the guide post 38 and the test substrate 34 is provided with a downward-pressing buffer pressure spring 39, and the downward-pressing buffer pressure spring 39 is combined with the elastic pressing type test probe structure to form a double-elastic buffer high-protection PCB pin point test structure.
The product carrier 100 comprises a carrier plate 4, a carrier region 41 is arranged on the carrier plate 4, a profiling positioning groove 42 is formed in the carrier region 41, a fixing block 43 is correspondingly arranged in the profiling positioning groove 42, and the product 300 is loaded.
The number of the fixing blocks 43 is two, the fixing blocks are correspondingly arranged on two sides of the imitation groove 42, the imitation groove comprises a rotary upright 45 which is rotatably connected with a rotary seat 44, and a pressing transverse plate 46 is arranged on the rotary upright 45.
The pressing transverse plate 46 is used as a test bearing body for pressing and bearing the dry test set partition plate 37, the dry test set partition plate 37 presses and bearing the test bearing body to elastically retract, and the test needle 36 is exposed to perform PCB pin point test, so that a direct-pressing type PCB pin point test structure is formed.
Compared with the prior art, the pressing type test head is arranged corresponding to a product carrier, the annular embedded multi-position production clamping structure on the rotating disc is combined with the pressing type test head to form a continuous test high-efficiency PCB pin point test structure, continuous PCB pin point test is guaranteed, PCB pin point test efficiency is improved, the direct-pressing type PCB pin point test structure is prevented from being damaged by test during test, and product quality is guaranteed.
What has been described above is merely some embodiments of the present utility model. It will be apparent to those skilled in the art that various modifications and improvements can be made without departing from the spirit of the utility model.
Claims (9)
1. An annular embedded multi-position PCB needle point test structure is characterized in that: the device comprises a carrier plate, wherein a rotating disc is arranged on the carrier plate, a plurality of embedded grooves are uniformly formed in the rotating disc, product carriers are embedded in the embedded grooves, and the product carriers are combined to form an annular embedded multi-position product clamping structure;
the carrier plate is provided with a test area, the test area is provided with a down-pressing type test head, the down-pressing type test head is arranged corresponding to a product carrier, and the annular embedded multi-position production clamping structure on the rotating disc is combined with the down-pressing type test head to form a continuous test high-efficiency PCB needle point test structure.
2. The annular embedded multi-position PCB pin testing structure according to claim 1, wherein: one of the product carriers on two sides of the down-pressing type testing head is positioned in a product clamping area to be tested, and the other product carrier is positioned in a product taking-out area after testing.
3. The annular embedded multi-position PCB pin testing structure according to claim 2, wherein: and the clamping area of the product to be tested and the product taking-out area after the test are correspondingly provided with clamping manipulators, so that the loading, testing and taking-out integrated PCB needle point testing equipment is formed.
4. The annular embedded multi-position PCB pin testing structure according to claim 3, wherein: the down-pressure test head comprises a vertical plate arranged on the carrier plate, and a lifting driving piece is arranged on the vertical plate and connected with the test head.
5. The annular embedded multi-position PCB pin testing structure according to claim 4, wherein: the test head comprises a test substrate, a test connection block used for connecting the lifting driving piece is arranged on the test substrate, a test needle is arranged on the test connection block, a plurality of test group partition boards are connected with the test connection block through a spring shaft, and the test needle is combined with the test group partition boards to form an elastic pressing type test probe structure.
6. The annular embedded multi-position PCB pin testing structure according to claim 5, wherein: the test substrate is correspondingly provided with a guide post, a pressing buffer pressure spring is arranged at the joint of the guide post and the test substrate, and the pressing buffer pressure spring is combined with the elastic pressing type test probe structure to form a double-elastic buffer high-protection PCB pin point test structure.
7. The annular embedded multi-position PCB pin testing structure according to claim 6, wherein: the product carrier comprises a carrier plate, a carrier area is arranged on the carrier plate, a profiling positioning groove is formed in the carrier area, and a fixing block is correspondingly arranged in the profiling positioning groove.
8. The annular embedded multi-position PCB pin testing structure according to claim 7, wherein: the fixed block quantity is two, corresponds to set up in imitative groove both sides, including rotating the rotatory stand of connecting in rotating to do, is provided with on the rotatory stand and presses and hold the diaphragm.
9. The annular embedded multi-position PCB pin testing structure of claim 8, wherein: the pressing transverse plate is used as a test pressure-bearing body for pressing and bearing the dry test group partition plate, the dry test group partition plate presses the tested pressure-bearing body to bear and elastically retract, and the test needle is exposed to perform PCB needle point test, so that a direct-pressing type PCB needle point test structure is formed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223109358.7U CN219143032U (en) | 2022-11-23 | 2022-11-23 | Needle point testing structure of annular embedded multi-position PCB |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223109358.7U CN219143032U (en) | 2022-11-23 | 2022-11-23 | Needle point testing structure of annular embedded multi-position PCB |
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| CN219143032U true CN219143032U (en) | 2023-06-06 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202223109358.7U Active CN219143032U (en) | 2022-11-23 | 2022-11-23 | Needle point testing structure of annular embedded multi-position PCB |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116774012A (en) * | 2023-08-15 | 2023-09-19 | 深圳市微特精密科技股份有限公司 | ICT test fixture and testing arrangement |
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2022
- 2022-11-23 CN CN202223109358.7U patent/CN219143032U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116774012A (en) * | 2023-08-15 | 2023-09-19 | 深圳市微特精密科技股份有限公司 | ICT test fixture and testing arrangement |
| CN116774012B (en) * | 2023-08-15 | 2023-10-20 | 深圳市微特精密科技股份有限公司 | ICT test fixture and testing arrangement |
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