CN219142617U - Infrared spectrum attenuation total reflection accessory - Google Patents
Infrared spectrum attenuation total reflection accessory Download PDFInfo
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- CN219142617U CN219142617U CN202223121718.5U CN202223121718U CN219142617U CN 219142617 U CN219142617 U CN 219142617U CN 202223121718 U CN202223121718 U CN 202223121718U CN 219142617 U CN219142617 U CN 219142617U
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Abstract
The application provides an infrared spectrum attenuation total reflection annex, includes: the light source comprises a cavity, wherein a light inlet channel and a light outlet channel which are communicated with the cavity are formed in one side surface of the cavity, and a light hole is formed in the top surface of the cavity; the crystal assembly is positioned below the light hole, the crystal assembly comprises a crystal and a sample platform, the sample is positioned above the crystal, the crystal comprises a first surface, a second surface, a light incident surface and a light emergent surface, the first surface and the second surface are parallel, and the light incident surface and the light emergent surface are obliquely arranged with the first surface; the reflecting mirror assembly comprises a first reflecting mirror assembly and a second reflecting mirror assembly, and the first reflecting mirror assembly and the second reflecting mirror assembly are respectively arranged at two sides of the crystal assembly and correspond to the positions of the light inlet channel and the light outlet channel; and a plunger assembly. The application provides an infrared attenuation total reflection accessory capable of reflecting repeatedly, which enhances the detection capability of a sample with weaker infrared absorption or a sample with low concentration.
Description
Technical Field
The application relates to the technical field of infrared spectrum detection, in particular to an infrared spectrum attenuation total reflection accessory.
Background
Fourier infrared spectroscopy (Fourier Transform Infrared, FTIR) is an analytical method for determining the molecular structure of a substance and identifying compounds based on information such as relative vibrations between atoms in the molecule and molecular rotation. When a beam of infrared light passes through a substance to be detected, the vibration frequency or rotation frequency of groups in molecules of the substance is the same as that of the infrared light, the molecules can absorb the energy of the infrared light with the frequency, and the energy level of the ground state vibration (rotation) energy is transited to the energy level of the vibration (rotation) energy with higher energy. The Fourier infrared interferometer is based on the interference principle of light, the infrared light passing through the substance to be detected is collected, the interference pattern contains the frequency and intensity information of the infrared light, and the Fourier transform is carried out to calculate the Fourier infrared spectrogram. The molecular structure and concentration information of the substance to be detected can be deduced and calculated by analyzing the frequency and intensity of the absorption peak in the Fourier infrared spectrogram.
The infrared attenuation total reflection technology (Attenuated Total Refraction, ATR) is based on the principle of total reflection of light to realize detection of the chemical composition structural information of the surface layer with a small depth on the surface of the sample. The ATR uses a material with a larger refractive index as an ATR crystal, infrared light is projected onto the surface of a sample to be detected with a small refractive index from the crystal with the large refractive index, and when the incident angle is larger than the critical angle, the infrared light also penetrates to a certain depth in the surface of the sample and returns to the ATR crystal to be reflected. In the process, the characteristic absorption of the sample to be detected to infrared light also occurs, and the infrared spectrogram with the information of the chemical components of the surface layer of the sample to be detected can be obtained by analyzing the reflected infrared light through an interferometer.
Compared with the conventional transmission method infrared spectrum, the ATR technology can detect special samples which are difficult to dissolve, refractory, grind, low in transmissivity and the like, greatly simplifies the sample preparation process, and is simple and convenient to operate and quick to detect.
FTIR technology in combination with ATR technology has been widely used in the fields of physics, chemistry, materials, biomedicine, etc. However, the detection ability is weak for a sample having weak infrared absorption or a sample having low concentration, and the detection sensitivity is low.
Disclosure of Invention
The application provides an infrared spectrum attenuation total reflection accessory, which solves the problem of weak detection capability of the current weak infrared absorption sample or the sample with low concentration.
An infrared spectrum attenuating total reflection accessory according to a first embodiment of the application, comprising:
the light source comprises a cavity, wherein a light inlet channel and a light outlet channel which are communicated with the cavity are formed in one side surface of the cavity, and a light hole is formed in the top surface of the cavity;
the crystal assembly is positioned below the light hole and comprises a crystal and a sample platform, the sample platform is used for bearing the crystal and the sample, the sample is positioned above the crystal, the crystal comprises a first surface, a second surface, a light incident surface and a light emergent surface, the first surface and the second surface are parallel, and the light incident surface and the light emergent surface are obliquely arranged with the first surface;
the reflecting mirror assembly is positioned in the cavity and below the crystal assembly, and comprises a first reflecting mirror assembly and a second reflecting mirror assembly which are respectively arranged at two sides of the crystal assembly and correspond to the positions of the light inlet channel and the light outlet channel, so that infrared light entering from the light inlet channel enters the crystal assembly after being reflected, and infrared light exiting from the crystal assembly after being reflected exits from the light outlet channel;
the compression bar assembly is positioned above the cavity to compress the sample on the crystal.
Optionally, in other embodiments of the present application, the light incident surface and the light emergent surface are inclined at 45 ° to the first surface.
Optionally, in other embodiments of the present application, the light incident surface and the light emergent surface are symmetrically disposed along a central line of the first surface.
Optionally, in other embodiments of the present application, the crystal assembly further comprises a crystal mount, the crystal mount being centered on the sample platform, the crystal being mounted on the crystal mount.
Optionally, in other embodiments of the present application, the first surface of the crystal is flush with the upper surface of the crystal-holding support.
Optionally, in other embodiments of the present application, the first mirror assembly includes a first mirror and a first adjustment bracket, the second mirror assembly includes a second mirror and a second adjustment bracket, and adjustment of the angle and the position of the first mirror and the second mirror is achieved by adjusting the first adjustment bracket and the second adjustment bracket.
Optionally, in other embodiments of the present application, the pressure bar assembly includes a pressure bar, a support bar and a knob, the support bar is located on an upper surface of the cavity, the pressure bar and the knob are located on the support bar, and a height of the pressure bar is adjusted by adjusting the knob.
Alternatively, in other embodiments of the present application, when the number of reflections is N, the relationship between the length a of the first surface of the crystal and the height h of the crystal is: a= (n+1) ×h.
Alternatively, in other embodiments of the present application, the length B of the second surface of the crystal is related to the height h of the crystal as: b= (N-1) ×h.
Alternatively, in other embodiments of the present application, the crystal mount and the sample platform are removably connected.
The infrared spectrum attenuation total reflection accessory provided by the embodiment of the application has at least the following technical effects:
the crystal in the infrared spectrum attenuation total reflection accessory can realize multiple reflection, and the multiple reflection can penetrate the surface of a sample for characteristic absorption, so that the infrared attenuation total reflection crystal capable of multiple reflection has the advantages of high detection precision, high signal-to-noise ratio, large detection surface and the like compared with single reflection, and can be used for detecting a sample with weaker infrared absorption or a sample with low concentration.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the description of the embodiments will be briefly introduced below, it being obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a front view of an infrared spectrum attenuating total reflection attachment provided in an embodiment of the present application;
FIG. 2 is a top view of an infrared spectrum attenuating total reflection attachment provided in an embodiment of the present application;
FIG. 3 is a schematic diagram of a crystal provided in an embodiment of the present application;
fig. 4 is a schematic view of an optical path provided in an embodiment of the present application.
The label score in the figures is expressed as: 1-cavity, 11-light entrance channel, 12-light exit channel, 13-light transmission hole, 2-crystal component, 21-crystal, 211-first surface, 212-second surface, 213-light entrance surface, 214-light exit surface, 22-sample platform, 23-crystal fixing support, 3-reflector component, 31-first reflector component, 311-first reflector, 312-first adjusting support, 32-second reflector component, 321-second reflector, 322-second adjusting support, 4-compression bar component, 41-compression bar, 42-support bar, 43-knob, 5-sample.
Detailed Description
The following description of the embodiments of the present application will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all, of the embodiments of the present application. All other embodiments, based on the embodiments herein, which are within the scope of the protection of the present application, will be within the skill of the art without inventive effort. Furthermore, it should be understood that the detailed description is presented herein for purposes of illustration and explanation only and is not intended to limit the present application. In this application, unless otherwise indicated, terms of orientation such as "upper", "lower", "left" and "right" are generally used to refer to the directions of the drawings in which the device is actually used or in an operating state.
The embodiment of the application provides an infrared spectrum attenuation total reflection accessory. The following will describe in detail. The following description of the embodiments is not intended to limit the preferred embodiments.
The embodiment of the application provides an infrared spectrum attenuation total reflection accessory, which comprises: the light source comprises a cavity body 1, wherein a light inlet channel 11 and a light outlet channel 12 which are communicated with the cavity body 1 are formed in one side surface of the cavity body 1, and a light hole 13 is formed in the top surface of the cavity body 1; the crystal assembly 2 is positioned below the light hole 13, the crystal assembly 2 comprises a crystal 21 and a sample platform 22, the sample platform 22 is used for bearing the crystal 21 and the sample 5, the sample 5 is positioned above the crystal, the crystal 21 comprises a first surface 211, a second surface 212, a light incident surface 213 and a light emergent surface 214, the first surface 211 and the second surface 212 are parallel, and the light incident surface 213 and the light emergent surface 214 are obliquely arranged with the first surface 211; the reflecting mirror assembly 3 is positioned in the cavity 1 and below the crystal assembly 2, the reflecting mirror assembly 3 comprises a first reflecting mirror assembly 31 and a second reflecting mirror assembly 32, and the first reflecting mirror assembly 31 and the second reflecting mirror assembly 32 are respectively arranged on two sides of the crystal assembly 2 and correspond to the positions of the light inlet channel 11 and the light outlet channel 12, so that infrared light entering from the light inlet channel 11 enters the crystal assembly 2 after being reflected, and infrared light exiting from the crystal assembly 2 after being reflected exits from the light outlet channel 12; the compression bar assembly 4. The compression bar assembly 4 is positioned above the cavity 1 to compress the sample 5 onto the crystal 21. The crystal 21 in the infrared spectrum attenuation total reflection accessory can realize multiple reflection, and as the multiple reflection can penetrate the surface of the sample 5 for characteristic absorption, the infrared attenuation total reflection crystal capable of multiple reflection has the advantages of high detection precision, high signal to noise ratio, large detection surface and the like compared with single reflection, and can be used for detecting the sample 5 with weaker infrared absorption or the sample 5 with low concentration.
Referring to fig. 1 and 2, the cavity 1 is a hollow cuboid, the cavity 1 is made of an aluminum alloy material of stainless steel, oxidation blackening treatment is performed inside the cavity 1, stray light is prevented from being reflected by the inner surface of the cavity 1, and the cavity 1 is used for fixing other parts and playing a role in shading light so as to prevent the detection result from being influenced by external environment light. The light-in channel 11 and the light-out channel 12 are arranged on one side surface of the cavity 1 and are respectively positioned on two sides of the crystal assembly 2, and infrared light enters from the light-in channel 11 and exits from the light-out channel 12. The light hole 13 is arranged on the top surface of the cavity 1 and is used for installing the crystal assembly 2, and the sample 5 can pass through the light hole 13 and is positioned above the light hole 13 and is pressed on the crystal 21 through the pressing rod assembly 4.
Referring to fig. 3, the light incident surface 213 and the light emergent surface 214 of the crystal 21 are inclined at 45 ° to the first surface 211, the light incident surface 213 and the light emergent surface 214 are symmetrically disposed along a center line of the first surface 211, and the light incident surface 213 and the light emergent surface 214 of the crystal 21 face the first mirror 311 and the second mirror 321, respectively. The crystal 21 has an isosceles trapezoid shape when viewed from the side. The first surface 211 and the second surface 212 of the crystal are rectangular, wherein the first surface 211 is adapted to carry the sample 5. The crystal material can be selected from diamond, zinc selenide, germanium crystal, silicon crystal and the like according to the application and the requirement.
With continued reference to fig. 1 and 2, the sample platform 22 is rotatably mounted under the light hole 13 of the cavity 1, and the sample platform 22 is made of 304 stainless steel.
Further, the crystal assembly 2 further comprises a crystal holder 23, the crystal holder 23 is mounted at the center of the sample platform 22, the crystal is fixed on the crystal holder 23, and the first surface 211 of the crystal 21 is flush with the upper surface of the crystal holder 23. The center of the crystal fixing support 23 is provided with a gap for placing and fixing the crystal 21. The crystal fixing support 23 is made of 304 stainless steel, and has the effects of corrosion resistance and easy cleaning. The crystal fixing support 23 and the sample platform 22 are detachably connected, so that different crystals 21 can be conveniently replaced, the possibility of pollution to optical components is reduced, and the service life and stability of the infrared spectrum attenuation total reflection accessory are improved.
Further, the first reflecting component and the second reflecting component are symmetrically arranged along the central line of the first surface 211, the first reflecting component 31 comprises a first reflecting mirror 311 and a first adjusting bracket 312, the second reflecting component 32 comprises a second reflecting mirror 321 and a second adjusting bracket 322, and the angle and the position of the first reflecting mirror 311 and the second reflecting mirror 321 are adjusted by adjusting the first adjusting bracket 312 and the second adjusting bracket 322. The first mirror 311 and the second mirror 321 are off-axis parabolic mirrors. The first mirror 311 and the second mirror 321 are used for focusing the incident light and collimating the outgoing light, respectively.
Specifically, the first mirror 311 is adjusted in angle and position by three adjusting screws on the first adjusting bracket 312. The first mirror 311 is adjusted by the first adjustment bracket 312 to be coupled with the incident light path. After the adjustment is completed, the lock nut on the adjusting screw is screwed. The second mirror 321 is adjusted in the same way as the first mirror 311 to be coupled to the outgoing light path.
Further, the compression bar assembly 4 includes a compression bar 41, a support bar 42 and a knob 43, the support bar 42 is located on the upper surface of the cavity 1, the compression bar 41 and the knob 43 are located on the support bar 42, and the height of the compression bar 41 is adjusted through the adjustment knob 43. The compression bar 41 is made of anti-corrosion materials and is used for fixing and compressing the sample 5 to be detected, so that the surface of the sample 5 is in tight contact with the crystal 21, the knob 43 is used for rotationally adjusting the height of the compression bar 41, and an overpressure protection accessory is arranged, so that the sample 5 or the crystal 21 is prevented from being damaged due to overlarge pressure.
Further, when the number of reflections is N, the relationship between the length a of the first surface 211 of the crystal 21 along the x-axis direction and the height h of the crystal 21 is: a= (n+1) ×h; the length B of the second surface 212 of the crystal 21 in the x-axis direction is related to the height h of the crystal 21 as follows: b= (N-1) ×h. The number of reflections of the crystal 21 is selectable 3 times, 5 times, 7 times, 9 times, etc. odd numbers according to the requirement, the number of reflections of the crystal 21 is adjusted by adjusting the lengths of the first surface 211 and the second surface 212 of the crystal 21, and the number of reflections of the crystal 21 is reduced when the lengths of the first surface 211 and the second surface 212 of the crystal 21 are reduced; it is also necessary to adjust the focal lengths of the first mirror 311 and the second mirror 321 so that the mirror focus center is at the very center of the first surface 211 of the crystal 21. The height h of the crystal 21 should be
The entrance aperture D of the doubler crystal 21.
Specifically, the incident light path of the infrared spectrum attenuation total reflection accessory can be coupled with a parallel infrared light path emitted by a Fourier infrared spectrometer light source, the emergent light path is parallel infrared light, and the incident light path of the Fourier infrared spectrum detector can be coupled.
Referring to fig. 4, in the implementation, red light emitted from an infrared light source outside the infrared spectral attenuation total reflection accessory is taken as incident light, enters the cavity 1 from the light entrance channel 11, focuses and reflects external parallel infrared light entering from the light entrance channel 11 through the first reflector 311, enters the inside of the crystal 21 from the light entrance surface 213 of the crystal 21, enters the surface of the sample 5 in the form of evanescent waves while the infrared light enters the surface of the sample 5 through internal total reflection, and is reflected or emitted again after being absorbed by the surface features of the sample 5, the infrared light emitted from the crystal 21 is reflected and collimated through the second reflector 321, and is emitted to an external infrared detector through the light exit channel 12 for spectral signal detection, so as to obtain an infrared absorption spectrum graph, thereby realizing detection of information of the sample 5.
Example 1,
The embodiment provides an infrared spectrum attenuation total reflection accessory, which comprises the following structures:
the infrared spectrum attenuated total reflection accessory comprises: a cavity 1, a crystal assembly 2, a mirror assembly 3 and a plunger assembly 4. A light inlet channel 11 and a light outlet channel 12 which are communicated with the cavity 1 are formed in one side surface of the cavity 1, and a light hole 13 is formed in the top surface of the cavity 1.
The crystal assembly 2 is located below the light hole 13, the crystal assembly 2 comprises a crystal 21 and a sample platform 22, the sample platform 22 is used for bearing the crystal 21 and the sample 5, the sample 5 is located above the crystal 21, the crystal 21 comprises a first surface 211, a second surface 212, a light incident surface 213 and a light emergent surface 214, the first surface 211 and the second surface 212 are parallel, and the light incident surface 213 and the light emergent surface 214 are obliquely arranged with the first surface 211. The light incident surface 213 and the light emergent surface 214 are inclined at 45 ° to the first surface 211, and the light incident surface 213 and the light emergent surface 214 are symmetrically disposed along a center line of the first surface 211. The crystal 21 has a height h of 5mm, a width (perpendicular to the paper surface) of 4.5mm, a length A of 40mm on the first surface 211, and a length B of 30mm on the second surface 212. The crystal assembly 2 further comprises a crystal holder 23, the crystal holder 23 being located in the center of the sample platform 22, the crystal being fixed to the crystal holder 23, the first surface 211 of the crystal 21 being flush with the upper surface of the crystal holder 23.
The reflecting mirror assembly 3, the reflecting mirror assembly 3 is located in the cavity 1 and below the crystal assembly 2, the reflecting mirror assembly 3 comprises a first reflecting mirror assembly 31 and a second reflecting mirror assembly 32, the first reflecting mirror assembly 31 and the second reflecting mirror assembly 32 are respectively arranged on two sides of the crystal assembly 2 and correspond to the positions of the light inlet channel 11 and the light outlet channel 12, so that infrared light entering from the light inlet channel 11 enters the crystal assembly 2 after being reflected, and infrared light exiting from the crystal assembly 2 exits from the light outlet channel 12 after being reflected. The first mirror assembly 31 includes a first mirror 311 and a first adjustment bracket 312, and the second mirror assembly 32 includes a second mirror 321 and a second adjustment bracket 322, and the adjustment of the angles and positions of the first mirror 311 and the second mirror 321 is achieved by adjusting the first adjustment bracket 312 and the second adjustment bracket 322.
The plunger assembly 4 is located above the chamber 1 to compress the sample 5 against the crystal 21. The pressure bar assembly 4 comprises a pressure bar 41, a support bar 42 and a knob 43, wherein the support bar 42 is positioned on the upper surface of the cavity 1, the pressure bar 41 and the knob 43 are positioned on the support bar 42, and the height of the pressure bar 41 is adjusted through the adjustment knob 43.
The embodiment of the application provides an infrared spectrum attenuation total reflection accessory, which enhances the detection capability of a weaker infrared absorption sample 5 or a sample 5 with low concentration, reduces the detection lower limit of the concentration of substances, ensures that different crystals 21 are quickly and conveniently switched, reduces the possibility of pollution of various optical components, and prolongs the service life and the stability of the infrared spectrum attenuation total reflection accessory.
The foregoing has outlined a detailed description of an infrared spectrum attenuating total reflection accessory provided herein, wherein specific examples are provided herein to illustrate the principles and embodiments of the present application, the above examples being provided only to assist in understanding the method and core ideas of the present application; meanwhile, as those skilled in the art will have modifications in the specific embodiments and application scope in accordance with the ideas of the present application, the present description should not be construed as limiting the present application in view of the above.
Claims (10)
1. An infrared spectrum attenuating total reflection accessory, comprising:
the light source comprises a cavity (1), wherein a light inlet channel (11) and a light outlet channel (12) which are communicated with the cavity (1) are formed in one side surface of the cavity (1), and a light hole (13) is formed in the top surface of the cavity (1);
the crystal assembly (2), crystal assembly (2) is located the below of light trap (13), crystal assembly (2) include crystal (21) and sample platform (22), sample platform (22) are used for bearing crystal (21) and sample (5), sample (5) are located crystal (21) top, crystal (21) include first surface (211), second surface (212), income plain noodles (213) and play plain noodles (214), first surface (211) with second surface (212) are parallel, income plain noodles (213) with go out plain noodles (214) with first surface (211) slope sets up;
the reflecting mirror assembly (3), the reflecting mirror assembly (3) is located in the cavity (1) and below the crystal assembly (2), the reflecting mirror assembly (3) comprises a first reflecting mirror assembly (31) and a second reflecting mirror assembly (32), the first reflecting mirror assembly (31) and the second reflecting mirror assembly (32) are respectively arranged on two sides of the crystal assembly (2) and correspond to the positions of the light inlet channel (11) and the light outlet channel (12), so that infrared light entering from the light inlet channel (11) enters the crystal assembly (2) after being reflected, and infrared light exiting from the crystal assembly (2) exits from the light outlet channel (12) after being reflected;
and the compression bar assembly (4) is positioned above the cavity (1) so as to compress the sample (5) on the crystal (21).
2. The infrared spectrum attenuated total reflection accessory according to claim 1, wherein the light entrance surface (213) and the light exit surface (214) are inclined at 45 ° to the first surface (211).
3. The infrared spectrum attenuating total reflection accessory according to claim 1, wherein the light entrance surface (213) and the light exit surface (214) are symmetrically arranged along a midline of the first surface (211).
4. The infrared spectrum attenuating total reflection accessory according to claim 1, wherein the crystal assembly (2) further comprises a crystal holder (23), the crystal holder (23) being located in the center of the sample platform (22), the crystal (21) being fixed to the crystal holder (23).
5. The infrared spectrum attenuating total reflection accessory of claim 4, wherein the first surface (211) of the crystal (21) is flush with the upper surface of the crystal mount (23).
6. The infrared spectrum attenuating total reflection accessory according to claim 1, wherein the first mirror assembly (31) comprises a first mirror (311) and a first adjustment bracket (312), the second mirror assembly (32) comprises a second mirror (321) and a second adjustment bracket (322), and the adjustment of the angle and the position of the first mirror (311) and the second mirror (321) is achieved by adjusting the first adjustment bracket (312) and the second adjustment bracket (322).
7. The infrared spectrum attenuating total reflection accessory according to claim 1, wherein the pressure bar assembly (4) comprises a pressure bar (41), a support bar (42) and a knob (43), the support bar (42) is located on the upper surface of the cavity (1), the pressure bar (41) and the knob (43) are located on the support bar (42), and the height of the pressure bar (41) is adjusted by adjusting the knob (43).
8. The infrared spectrum attenuating total reflection accessory according to claim 1, characterized in that, when the number of reflections is N, the relation between the length a of the first surface of the crystal (21) and the height h of the crystal (21) is: a= (n+1) ×h.
9. The infrared spectrum attenuating total reflection accessory according to claim 8, characterized in that the length B of the second surface of the crystal (21) is related to the height h of the crystal (21) by: b= (N-1) ×h.
10. The infrared spectrum attenuating total reflection accessory of claim 4, wherein the crystal mount (23) and the sample platform (22) are detachably connected.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223121718.5U CN219142617U (en) | 2022-11-23 | 2022-11-23 | Infrared spectrum attenuation total reflection accessory |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202223121718.5U CN219142617U (en) | 2022-11-23 | 2022-11-23 | Infrared spectrum attenuation total reflection accessory |
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| CN219142617U true CN219142617U (en) | 2023-06-06 |
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| CN202223121718.5U Active CN219142617U (en) | 2022-11-23 | 2022-11-23 | Infrared spectrum attenuation total reflection accessory |
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