CN219113837U - Impedance matching debugging fixture - Google Patents
Impedance matching debugging fixture Download PDFInfo
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- CN219113837U CN219113837U CN202223285507.5U CN202223285507U CN219113837U CN 219113837 U CN219113837 U CN 219113837U CN 202223285507 U CN202223285507 U CN 202223285507U CN 219113837 U CN219113837 U CN 219113837U
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Abstract
The embodiment of the application relates to the technical field of impedance debugging of electronic equipment, in particular to an impedance matching debugging clamp, which comprises: the clamping device is provided with a clamping structure for clamping the component and a fixing structure fixed with the clamping structure; the amplifying device is fixedly connected with the fixing structure, the amplifying device is provided with a light incident side, the light incident side of the amplifying device faces the clamping structure, and the amplifying device is used for amplifying the clamping structure and components located at the clamping structure. The impedance matching debugging clamp provided by the embodiment of the application can avoid that debugging personnel consume a great deal of energy to clamp the resistance-capacitance sensing device when carrying out impedance debugging on the electronic equipment.
Description
Technical Field
The embodiment of the application relates to the technical field of impedance debugging of electronic equipment, in particular to an impedance matching debugging clamp.
Background
At present, the impedance of the actually produced electronic equipment is limited by deviation of simulation effect of a simulation technology, process errors generated in the manufacturing process of a circuit board and even process errors generated in the manufacturing process of an electronic component, and the impedance of the actually produced electronic equipment is also required to be debugged by using a resistance-capacitance sensing device. When the impedance of the electronic equipment is debugged, the resistance-capacitance sensing device is manually clamped by naked eyes of debugging personnel.
However, as the demand of people for miniaturization of products is increasing, the packaging size of the resistive-capacitive sensing device for debugging the impedance of the electronic device is decreasing, so that a large amount of effort is consumed by a debugger to clamp the resistive-capacitive sensing device when the electronic device is subjected to impedance debugging.
Disclosure of Invention
The embodiment of the application aims to provide an impedance matching debugging clamp so as to avoid that debugging personnel consume a great deal of energy to clamp a resistance-capacitance sensing device when carrying out impedance debugging on electronic equipment.
To solve the above problems, an embodiment of the present application provides an impedance matching debugging fixture, including: the clamping device is provided with a clamping structure for clamping the component and a fixing structure fixed with the clamping structure; the amplifying device is fixedly connected with the fixing structure, the amplifying device is provided with a light incident side, the light incident side of the amplifying device faces the clamping structure, and the amplifying device is used for amplifying the clamping structure and components located at the clamping structure.
When a debugger performs blocking matching debugging on electronic equipment, the debugger can clamp the resistance-capacitance sensing device by using the clamping structure of the impedance matching debugging clamp. Specifically, when utilizing the clamping structure centre gripping resistance-capacitance sensing device, because the income light side of amplification device orientation the clamping structure sets up, just amplification device is used for the amplification the clamping structure reaches the components and parts of clamping structure centre gripping, so debugging personnel observe the clamping structure after the amplification through amplification device and make the clamping structure after the amplification just to the components and parts with synchronous amplification to make debugging personnel accessible observe the clamping structure clamping components and parts after the amplification, in order to avoid debugging personnel bore hole observation and manual clamp to get resistance-capacitance sensing device, then avoid debugging personnel to consume a large amount of efforts clamp when carrying out impedance debugging to electronic equipment and get resistance-capacitance sensing device.
In some embodiments, the clamping structure has a first flexible clamping member and a second flexible clamping member disposed opposite to each other with a space therebetween, wherein a dimension of the space is configured to be smaller than a dimension of the component for clamping by the clamping structure in a direction in which the first flexible clamping member is directed toward the second flexible clamping member.
In some embodiments, the spacing between the first flexible gripping member and the second flexible gripping member gradually decreases in a direction in which the gripping structure is away from the fixed structure.
In some embodiments, a side of the first flexible gripping member facing the second flexible gripping member is provided with a plurality of first protrusions; and/or a plurality of second bulges are arranged on one side of the second flexible clamping piece, which faces the first flexible clamping piece.
In some embodiments, the fixing structure has an abutment surface, and the first flexible clamping member and the second flexible clamping member are both fixed on the abutment surface, where the abutment surface is used for abutting against a component clamped by the first flexible clamping member and the second flexible clamping member together.
In some embodiments, the number of gripping devices is a plurality, the spacing of different gripping devices being of different sizes; the amplifying device is selectively detachably and fixedly connected with the fixing structure of one of the clamping devices.
In some embodiments, in a direction in which the first flexible gripping member points to the second flexible gripping member, a distance between edges of the first flexible gripping member and the second flexible gripping member away from each other is configured to be greater than 1 time size of a component that the gripping structure uses to grip, and less than or equal to 2 times size of a component that the gripping structure uses to grip.
In some embodiments, the clamping structure and the fixing structure are sequentially arranged along a preset direction; in a direction perpendicular to the direction in which the first flexible clamping member points to the second flexible clamping member and perpendicular to the preset direction, the dimension of either one of the first flexible clamping member and the second flexible clamping member is configured to be greater than 1 time the dimension of the component for clamping by the clamping structure and less than or equal to 2 times the dimension of the component for clamping by the clamping structure.
In some embodiments, the clamping structure, the fixing structure and the amplifying device are sequentially arranged along a preset direction, wherein the clamping structure and the fixing structure are configured to be transparent.
In some embodiments, the impedance matching debug fixture further comprises: the holding structure is fixed with the fixing structure and is used for holding by debugging personnel.
In some embodiments, the clamping structure, the fixing structure, the holding structure, and the amplifying device are sequentially disposed along a preset direction, wherein the clamping structure, the fixing structure, and the holding structure are all configured to be transparent.
In some embodiments, the magnification device is a convex lens or an imaging device.
Drawings
Fig. 1 is a schematic structural diagram of an impedance matching debugging fixture according to some embodiments of the present application;
FIG. 2 is a schematic diagram of an impedance matching tuning jig according to another view angle of some embodiments of the present application;
fig. 3 is a schematic structural diagram of an impedance matching debugging fixture according to some embodiments of the present application.
In the drawings, reference numerals are as follows:
a clamping device 110, a clamping structure 111, a fixing structure 112, a first flexible clamping member 113, a second flexible clamping member 114, and an abutment surface 115; an amplifying device 120; a grip structure 130; component 200.
Detailed Description
As known from the background art, at present, when impedance debugging is performed on an electronic device, the electronic device is observed by naked eyes of debugging personnel and manually clamped with a resistive-capacitive sensor. As the demand of people for miniaturization of products is increasing, the packaging size of the resistive-capacitive sensing device for debugging the impedance of the electronic equipment is decreasing, so that debugging personnel consume a great deal of effort to clamp the resistive-capacitive sensing device when the electronic equipment is subjected to impedance debugging.
The inventor of the application has found through intensive research that the reason why debugging personnel need consume a great deal of effort to clamp the resistive-capacitive sensing device when carrying out impedance debugging on electronic equipment is that, because the packaging size of the resistive-capacitive sensing device is smaller, when the debugging personnel only observe the resistive-capacitive sensing device with naked eyes and clamp the resistive-capacitive sensing device, the phenomenon that the clamping position cannot align with the resistive-capacitive sensing device often occurs, and then the debugging personnel can clamp the resistive-capacitive sensing device successfully only by clamping for many times when clamping the resistive-capacitive sensing device, so that the effort required by the debugging personnel is excessive.
In this regard, the present inventors devised an impedance matching debugging jig including: the clamping device is provided with a clamping structure for clamping the component and a fixing structure fixed with the clamping structure; the amplifying device is fixedly connected with the fixing structure, the amplifying device is provided with a light incident side, the light incident side of the amplifying device faces the clamping structure, and the amplifying device is used for amplifying the clamping structure and components located at the clamping structure.
When a debugger performs blocking matching debugging on electronic equipment, the debugger can clamp the resistance-capacitance sensing device by using the clamping structure of the impedance matching debugging clamp. Specifically, when the resistance-capacitance sensing device is clamped by the clamping structure, as the light incident side of the amplifying device faces the clamping structure, and the amplifying device is used for amplifying the clamping structure and the components clamped by the clamping structure, a debugging person observes the amplified clamping structure through the amplifying device and enables the amplified clamping structure to be opposite to the components so as to synchronously amplify the components, so that the debugging person can observe the amplified clamping structure to clamp the components, the probability that the debugging person successfully clamps the resistance-capacitance sensing device when clamping the resistance-capacitance sensing device is improved, and accordingly, the debugging person is prevented from consuming a great deal of energy to clamp the resistance-capacitance sensing device when carrying out impedance debugging on the electronic equipment.
For the purposes of making the objects, technical solutions and advantages of the embodiments of the present application more apparent, the following detailed description of each embodiment of the present application will be given with reference to the accompanying drawings. However, those of ordinary skill in the art will understand that in various embodiments of the present application, numerous technical details have been set forth in order to provide a better understanding of the present application. However, the technical means claimed in the present application can be realized based on various changes and modifications of the following embodiments.
See fig. 1-3. The impedance matching debugging fixture provided by some embodiments of the present application comprises: a clamping device 110 having a clamping structure 111 for clamping the component 200 and a fixing structure 112 fixed to the clamping structure 111; the amplifying device 120 is fixedly connected with the fixing structure 112, wherein the amplifying device 120 has a light incident side, the light incident side of the amplifying device 120 is disposed towards the clamping structure 111, and the amplifying device 120 is used for amplifying the clamping structure 111 and the component 200 located at the clamping structure 111.
Therefore, when a debugger performs the blocking matching debugging on the electronic equipment, the circuit board of the electronic equipment is connected with the instrument, the position of the circuit board, which is required to be subjected to the impedance matching debugging, is determined, and then the component 200 with a certain resistance value/capacitance value/inductance value (namely the resistance-capacitance sensing device in the above description) is selected. Then, the debugger observes the amplified clamping structure 111 through the amplifying device 120 and makes the amplified clamping structure 111 face the component 200 to synchronously amplify the component 200, and then uses the clamping structure 111 to clamp the component 200. And then the debugger places the component 200 at the position where the impedance matching debugging of the circuit board is required to be carried out, which is determined in the previous step, and the debugger obtains whether the impedance matching debugging of the electronic equipment meets the standard or not through the observation instrument. If the standard is reached, the component 200 is welded and fixed at the determined position of the circuit board, which is required to be subjected to impedance matching debugging; and if the impedance matching debugging is not up to standard, the components 200 with different resistance values/capacitance values/inductance values can be replaced for debugging again until the impedance matching debugging of the electronic equipment is up to standard.
In some embodiments, the clamping structure 111 has a first flexible clamping member 113 and a second flexible clamping member 114 that are disposed opposite to each other, and a space is provided between the first flexible clamping member 113 and the second flexible clamping member 114, where a dimension of the space is configured to be smaller than a dimension of the component 200 that is used for clamping by the clamping structure 111 in a direction in which the first flexible clamping member 113 points toward the second flexible clamping member 114.
Thus, when the clamping structure 111 faces the component 200, the space between the first flexible clamping member 113 and the second flexible clamping member 114 can be faced to the component 200, and then the space between the first flexible clamping member 113 and the second flexible clamping member 114 can be placed; wherein, since the dimension of the space is configured to be smaller than the dimension of the component 200 that is used for clamping by the clamping structure 111 in the direction in which the first flexible clamping member 113 points to the second flexible clamping member 114, after the component 200 is placed between the first flexible clamping member 113 and the second flexible clamping member 114, the first flexible clamping member 113 and the second flexible clamping member 114 can be elastically deformed, and then the component 200 is clamped by using the elastic force generated by the deformation of the first flexible clamping member 113 and the second flexible clamping member 114.
In particular, the specific size of the space between the first flexible clamping member 113 and the second flexible clamping member 114 is not limited in this application. The specific size of the space may be set according to the size of the component 200 that the clamping structure 111 is used to clamp. In one example, when the component 200 that the clamping structure 111 is used to clamp is a 0201-packaged component used in the fifth generation communication technology, the size of the component 200 packaged based on 0201 is around 0.6mm×0.3mm (mm: millimeters), and therefore, the size of the space between the first flexible clamping member 113 and the second flexible clamping member 114 can be set to 0.5mm. In still another example, when the component 200 that the clamping structure 111 is used to clamp is a 01005-packaged component used in the fifth-generation communication technology, the size of the component 200 packaged based on 01005 is around 0.3mm×0.15mm, and thus, the size of the space between the first flexible clamping piece 113 and the second flexible clamping piece 114 may be set to 0.2mm.
In some embodiments, the spacing between the first flexible clamping member 113 and the second flexible clamping member 114 gradually decreases in a direction of the clamping structure 111 away from the fixed structure 112 (i.e., in a direction opposite to the X direction shown in fig. 2).
In this way, after the component 200 is disposed between the first flexible clamping member 113 and the second flexible clamping member 114, when the first flexible clamping member 113 and the second flexible clamping member 114 move along the direction away from each other to generate elastic deformation, the elastic force generated when the first flexible clamping member 113 and the second flexible clamping member 114 generate deformation is larger, so that the first flexible clamping member 113 and the second flexible clamping member 114 can clamp the component 200 relatively stably.
In some embodiments, a side of the first flexible clamping member 113 facing the second flexible clamping member 114 is provided with a plurality of first protrusions (not shown in the drawings); and/or, a side of the second flexible clamping member 114 facing the first flexible clamping member 113 is provided with a plurality of second protrusions (not shown).
In this way, after the component 200 is placed between the first flexible clamping member 113 and the second flexible clamping member 114, the friction force between the first flexible clamping member 113 and/or the second flexible clamping member 114 and the component 200 can be increased by using the first protrusion and/or the second protrusion, so that the first flexible clamping member 113 and the second flexible clamping member 114 can clamp the component 200 more stably.
In some embodiments, the fixing structure 112 has an abutment surface 115, and the first flexible clamping member 113 and the second flexible clamping member 114 are both fixed to the abutment surface 115, where the abutment surface 115 is used to abut against the component 200 that is commonly clamped by the first flexible clamping member 113 and the second flexible clamping member 114.
Thus, after the component 200 is clamped by the clamping structure 111, and when a debugger places the component 200 at a determined position where impedance matching debugging is required for the circuit board, the debugger can make the abutting surface 115 and the board surface of the circuit board oppositely arranged at two sides of the component 200, and apply force to the fixing structure 112 so that the abutting surface 115 presses the component 200 to enable the component 200 to be in close contact with the circuit board, thereby ensuring that the component 200 is electrically connected with the circuit board. When the debugger applies force to the fixing structure 112 to make the abutting surface 115 press the component 200 so as to make the component 200 closely contact with the circuit board, the debugger can apply force to the other surface of the fixing structure 112 opposite to the abutting surface 115 so as to make the abutting surface 115 press the component 200 so as to make the component 200 closely contact with the circuit board.
In some embodiments, the number of gripping devices 110 is a plurality, the spacing of different gripping devices 110 being of different sizes; the amplifying device 120 is selectively detachably and fixedly connected with the fixing structure 112 of one of the plurality of clamping devices 110. Since the sizes of the different components 200 are different, the impedance matching debugging fixture can clamp a plurality of components 200 with different sizes through the different sizes of the intervals of the clamping devices 110.
In some embodiments, in a direction in which the first flexible clamping member 113 points to the second flexible clamping member 114, a distance between edges of the first flexible clamping member 113 and the second flexible clamping member 114 away from each other is configured to be greater than 1 time size of a component that the clamping structure 111 is used to clamp, and less than or equal to 2 times size of a component that the clamping structure 111 is used to clamp.
The distance between the edges of the first flexible clamping member 113 and the second flexible clamping member 114 that are away from each other is the distance between the edge of the first flexible clamping member 113 that is away from the second flexible clamping member 114 and the edge of the second flexible clamping member 114 that is away from the first flexible clamping member 113; the size of the component in this embodiment is the size of the component in the direction in which the first flexible holding member 113 is directed toward the second flexible holding member 114.
In this way, while ensuring that the first flexible clamping member 113 and the second flexible clamping member 114 can clamp the component, the dimensions of the first flexible clamping member 113 and the second flexible clamping member 114 in the direction in which the first flexible clamping member 113 points to the second flexible clamping member 114 can be smaller, so that when the impedance matching debugging clamp is used on a circuit board with dense components, the possibility of interference between the impedance matching debugging clamp and other components is reduced.
When the component 200 is 0201 packaged, the dimension of the component in the direction in which the first flexible clamping member 113 points to the second flexible clamping member 114 may be 0.6mm, and at this time, the distance between the edges of the first flexible clamping member 113 and the second flexible clamping member 114 away from each other may be 1mm.
In some embodiments, the clamping structure 111 and the fixing structure 112 are sequentially arranged along a preset direction; in a direction perpendicular to the direction in which the first flexible clamping member 113 points to the second flexible clamping member 114 and perpendicular to the preset direction, the dimension of either one of the first flexible clamping member 113 and the second flexible clamping member 114 is configured to be greater than 1-fold dimension of the component for clamping by the clamping structure 111 and less than or equal to 2-fold dimension of the component for clamping by the clamping structure. The size of the component in this embodiment is a size of the component in a direction perpendicular to the direction in which the first flexible clamping member 113 points to the second flexible clamping member 114 and perpendicular to the preset direction. In this way, the dimension of either the first flexible clamping member 113 and the second flexible clamping member 114 may be made smaller in the direction perpendicular to the direction in which the first flexible clamping member 113 points to the second flexible clamping member 114 and perpendicular to the preset direction, so as to reduce the possibility of interference of the impedance matching debugging fixture and other devices when the impedance matching debugging fixture is used on a circuit board with dense devices.
When the component 200 is 0201 packaged, the dimension of the component in the direction perpendicular to the direction in which the first flexible clamping member 113 points to the second flexible clamping member 114 and perpendicular to the preset direction may be 0.3mm, and at this time, the distance between the edges of the first flexible clamping member 113 and the second flexible clamping member 114 away from each other may be 0.5mm.
It should be noted that this embodiment (i.e., the above-described embodiment in which the dimension of either one of the first flexible clamping member 113 and the second flexible clamping member 114 is configured in the direction perpendicular to the direction in which the first flexible clamping member 113 is directed toward the second flexible clamping member 114 and perpendicular to the preset direction) may be combined with the above-described "arrangement of the space between the edges of the first flexible clamping member 113 and the second flexible clamping member 114 apart from each other in the direction in which the first flexible clamping member 113 is directed toward the second flexible clamping member 114". In this way, when the impedance matching debugging fixture is used on a circuit board with dense devices, the possibility of interference between the impedance matching debugging fixture and other devices can be reduced as much as possible.
In some embodiments, the clamping structure 111, the fixing structure 112, and the amplifying device 120 are sequentially disposed along a predetermined direction (i.e., an X direction shown in fig. 2), wherein the clamping structure 111 and the fixing structure 112 are configured to be transparent. In this way, it is convenient for a debugging person to observe the clamping structure 111 and the components 200 positioned at the clamping structure 111 through the amplifying device 120; the component 200 can be observed through the fixing structure 112 and the clamping structure 111 when the component is observed through the magnifying device 120.
In some embodiments, the impedance matching debug fixture further comprises: the holding structure 130 is fixed with the fixing structure 112, and the holding structure 130 is used for holding by a debugging person. Thus, the debugging personnel can conveniently hold the impedance matching debugging clamp.
In some embodiments, the clamping structure 111, the fixing structure 112, the holding structure 130, and the amplifying device 120 are sequentially disposed along a predetermined direction (i.e., an X direction shown in fig. 2), wherein the clamping structure 111, the fixing structure 112, and the holding structure 130 are all configured to be transparent. In this way, it is also convenient for a commissioning person to observe the clamping structure 111 and the components 200 located at said clamping structure 111 through the magnifying device 120; the component 200 can be viewed through the holding structure 130, the fixing structure 112, and the clamping structure 111 when viewed through the magnifying device 120. In addition, when the fixing structure 112 in the previous embodiment is combined with the abutting surface 115, the fixing structure 112 can be conveniently used for exerting force on the other surface of the fixing structure 112 opposite to the abutting surface 115 by a user through the holding structure 130.
The specific configuration of the amplifying device 120 is not limited in this application, as long as the amplifying device 120 can be used to amplify the clamping structure 111 and the component 200 located at the clamping structure 111. In one example, the amplifying device 120 is an image capturing device. In yet another example, the amplifying device 120 is a convex lens, which may result in lower manufacturing costs for the impedance matching tuning jig.
Referring to fig. 3, it should be further noted that, when the size of the component used for clamping by the impedance matching debugging fixture is smaller and the sizes of the first flexible clamping member 113 and the second flexible clamping member 114 of the clamping structure 111 are defined in combination, the sizes of the first flexible clamping member 113 and the second flexible clamping member 114 are smaller, the size of the amplifying device 120 may be larger than the sizes of the first flexible clamping member 113 and the second flexible clamping member 114, so that the debugging personnel can observe through the amplifying device 120 conveniently. In addition, the size of the holding structure 130 may be larger than the sizes of the first flexible clamping member 113 and the second flexible clamping member 114, so as to be convenient for a debugger to hold.
In addition, when the sizes of the first and second flexible clamping members 113 and 114 are smaller, the size of the fixing structure 112 may be kept to match the sizes of the first and second flexible clamping members 113 and 114. The dimension of the fixing structure 112 in the direction of the first flexible clamping member 113 toward the second flexible clamping member 114 is the same as the distance between the edges of the first flexible clamping member 113 and the second flexible clamping member 114 away from each other.
It will be understood by those of ordinary skill in the art that the foregoing embodiments are specific examples of implementing the present application and that various changes in form and details may be made therein without departing from the spirit and scope of the present application. Various changes and modifications may be made by one skilled in the art without departing from the spirit and scope of the utility model, and the scope of the utility model shall be defined by the appended claims.
Claims (10)
1. An impedance matching debug fixture, comprising:
the clamping device is provided with a clamping structure for clamping the component and a fixing structure fixed with the clamping structure;
the amplifying device is fixedly connected with the fixing structure, the amplifying device is provided with a light incident side, the light incident side of the amplifying device faces the clamping structure, and the amplifying device is used for amplifying the clamping structure and components located at the clamping structure.
2. The impedance matching debugging fixture of claim 1, wherein the impedance matching debugging fixture comprises a plurality of clamping devices,
the clamping structure is provided with a first flexible clamping piece and a second flexible clamping piece which are oppositely arranged, a space is reserved between the first flexible clamping piece and the second flexible clamping piece, and the size of the space is smaller than the size of the component used for clamping by the clamping structure in the direction that the first flexible clamping piece points to the second flexible clamping piece.
3. The impedance matching debugging fixture of claim 2, wherein the impedance matching debugging fixture comprises a plurality of clamping devices,
in the direction that the clamping structure is far away from the fixed structure, the interval between the first flexible clamping piece and the second flexible clamping piece gradually decreases.
4. The impedance matching debugging fixture of claim 2, wherein the impedance matching debugging fixture comprises a plurality of clamping devices,
a plurality of first bulges are arranged on one side of the first flexible clamping piece, which faces the second flexible clamping piece;
and/or a plurality of second bulges are arranged on one side of the second flexible clamping piece, which faces the first flexible clamping piece.
5. The impedance matching debugging fixture of claim 2, wherein the impedance matching debugging fixture comprises a plurality of clamping devices,
the fixing structure is provided with an abutting surface, the first flexible clamping piece and the second flexible clamping piece are both fixed on the abutting surface, wherein the abutting surface is used for abutting against components clamped by the first flexible clamping piece and the second flexible clamping piece together.
6. The impedance matching debugging fixture of claim 2, wherein the impedance matching debugging fixture comprises a plurality of clamping devices,
the number of the clamping devices is a plurality, and the intervals of different clamping devices are different in size;
the amplifying device is selectively detachably and fixedly connected with the fixing structure of one of the clamping devices.
7. The impedance matching debugging fixture of claim 2, wherein the impedance matching debugging fixture comprises a plurality of clamping devices,
in the direction that the first flexible clamping piece points to the second flexible clamping piece, the distance between the edges of the first flexible clamping piece and the second flexible clamping piece, which are far away from each other, is configured to be larger than 1 time size of the component used for clamping by the clamping structure and smaller than or equal to 2 times size of the component used for clamping by the clamping structure;
the clamping structure and the fixing structure are sequentially arranged along a preset direction; in a direction perpendicular to the direction in which the first flexible clamping member points to the second flexible clamping member and perpendicular to the preset direction, the dimension of either one of the first flexible clamping member and the second flexible clamping member is configured to be greater than 1 time the dimension of the component for clamping by the clamping structure and less than or equal to 2 times the dimension of the component for clamping by the clamping structure.
8. The impedance matching debugging fixture of claim 1, wherein the impedance matching debugging fixture comprises a plurality of clamping devices,
the clamping structure, the fixing structure and the amplifying device are sequentially arranged along a preset direction, wherein the clamping structure and the fixing structure are both configured to be transparent.
9. The impedance matching debug fixture of claim 1, further comprising: the holding structure is fixed with the fixing structure and is used for holding by debugging personnel.
10. The impedance matching debug fixture of claim 9, wherein,
the clamping structure, the fixing structure, the holding structure and the amplifying device are sequentially arranged along a preset direction, wherein the clamping structure, the fixing structure and the holding structure are all configured to be transparent.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202223285507.5U CN219113837U (en) | 2022-12-07 | 2022-12-07 | Impedance matching debugging fixture |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202223285507.5U CN219113837U (en) | 2022-12-07 | 2022-12-07 | Impedance matching debugging fixture |
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| CN219113837U true CN219113837U (en) | 2023-06-02 |
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| CN202223285507.5U Active CN219113837U (en) | 2022-12-07 | 2022-12-07 | Impedance matching debugging fixture |
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