CN219106113U

CN219106113U - Supporting bench suitable for high-pin DIP sample

Info

Publication number: CN219106113U
Application number: CN202222794247.8U
Authority: CN
Inventors: 金龙; 冯霞; 彭士益; 林廷伟
Original assignee: Hongkang Technology Testing Shanghai Co ltd
Current assignee: Hongkang Technology Testing Shanghai Co ltd
Priority date: 2022-10-22
Filing date: 2022-10-22
Publication date: 2023-05-30
Anticipated expiration: 2032-10-22

Abstract

The utility model relates to a DIP encapsulation technical field especially relates to a supporting bench suitable for high pin DIP sample, including the main tributary fagging, the top surface of main tributary fagging is the main tributary fagging, and the area of main tributary fagging is greater than the area on DIP sample surface, is provided with a plurality of auxiliary stay plates on the lateral wall of main tributary fagging, and the top surface of auxiliary stay plate is the auxiliary stay face, and the width of auxiliary stay face is less than or equal to the interval between two rows of pins of DIP sample. The method and the device can be suitable for DIP samples of different specifications.

Description

Supporting bench suitable for high-pin DIP sample

Technical Field

The application relates to the technical field of DIP packaging, in particular to a supporting table suitable for high-pin DIP samples.

Background

Dual in-line package (DIP package), also known as DIP package or DIP package, is a package type of integrated circuit, and DIP packaged CPU chips have two rows of metal pins, called pins, that need to be plugged into a chip socket having DIP structure.

In the related art, it is necessary to perform a line repair on a chip portion of a DIP sample using a specific apparatus. When the DIP sample is subjected to line repair, the DIP sample needs to be stuck on a circular supporting table of the equipment, and the equipment is used for carrying out line repair on the sample on the circular supporting table. Since the distance between the sealing door of the apparatus and the circular support table is a constant pitch value, only DIP samples of a specific height can be placed on the circular support table.

For the above related art, the inventor considers that the device in the related art has a height limitation due to the problem of loadlock, and only DIP samples with a height smaller than the distance between the sealing door of the device and the circular support table can be placed on the circular support table, and cannot be applied to DIP samples with higher pin heights.

Disclosure of Invention

In order to enable the supporting table to be suitable for DIP samples of different specifications, the application provides a supporting table suitable for high-pin DIP samples.

The application provides a supporting bench suitable for high pin DIP sample adopts following technical scheme:

the utility model provides a supporting bench suitable for high pin DIP sample, includes the main tributary fagging, the top surface of main tributary fagging is the main tributary fagging, the area of main tributary fagging is greater than the area on DIP sample surface, be provided with a plurality of auxiliary support boards on the lateral wall of main tributary fagging, the top surface of auxiliary support board is the auxiliary supporting surface, the width of auxiliary supporting surface is less than or equal to the interval between the two rows of pins of DIP sample.

Through adopting above-mentioned technical scheme, because the cross-section of main holding surface is greater than the DIP sample, the DIP sample can directly paste on the main holding surface, when the pin height of DIP sample is higher, can paste the chip part of DIP sample in vice holding surface department for the pin of DIP sample is vertical downwards, and two rows of pins of DIP sample are located the both sides of vice backup pad, can be applicable to the DIP sample of unnecessary specification after main holding plate and the vice backup pad are mutually supported.

Preferably, the widths of the sub supporting surfaces of the plurality of sub supporting plates are different.

By adopting the technical scheme, the auxiliary supporting plates with different sizes can be suitable for multi-specification DIP samples with different pin pitches.

Preferably, the main support plate and the sub support plate are integrally connected.

By adopting the technical scheme, the main support plate and the auxiliary support plate which are integrally connected have higher structural strength.

Preferably, the main support plate and the auxiliary support plate are detachably mounted, and a fastener for fixing the main support plate and the auxiliary support plate is arranged between the main support plate and the auxiliary support plate.

Through adopting above-mentioned technical scheme, after vice backup pad damage, can change alone the vice backup pad, need not to change to whole brace table, can save the cost.

Preferably, the side wall of the main support plate, which is close to the auxiliary support plate, is provided with a mounting groove, and the auxiliary support plate is clamped in the mounting groove.

Through adopting above-mentioned technical scheme, the mounting groove can improve the stability between auxiliary stay board and the main tributary fagging for the auxiliary stay board is difficult for producing to rock.

Preferably, a baffle is arranged on the side wall of the auxiliary supporting plate far away from the main supporting plate.

Through adopting above-mentioned technical scheme, the baffle can block the DIP sample, can reduce the possibility that makes the DIP sample drop from the accessory supporting plate because of the inclination appears in the brace table.

Preferably, the top of the main support plate is provided with a placement groove.

By adopting the technical scheme, the DIP sample can be conveniently placed in the placing groove, and the DIP sample can be conveniently positioned on the main support plate by the placing groove.

Preferably, adjacent auxiliary supporting plates are obliquely arranged, and the included angles of the adjacent auxiliary supporting plates are the same.

By adopting the technical scheme, because the included angles of the adjacent auxiliary supporting plates are the same, the relative positions between the DIP samples adhered on the auxiliary supporting plates can be ensured, and the sufficient spacing between the adjacent DIP samples can be kept.

In summary, the present application includes at least one of the following beneficial technical effects:

1. through setting up the auxiliary support plate, when the pin height of DIP sample is higher, can paste the chip part of DIP sample in auxiliary supporting surface department for the pin of DIP sample is vertical downwards, and two rows of pins of DIP sample are located the both sides of auxiliary support plate, make the brace table can be applicable to the DIP sample of different specifications;

2. through setting up the vice backup pad of a plurality of different size specifications, improved the holistic performance of brace table for the brace table can be applicable to the different many specifications DIP samples of pin interval.

Drawings

FIG. 1 is a schematic view showing the overall structure of embodiment 1 of the present application;

FIG. 2 is a schematic view showing the overall structure of embodiment 2 of the present application;

FIG. 3 is a schematic view showing the overall structure of embodiment 3 of the present application;

fig. 4 is a schematic view showing the overall structure of embodiment 4 of the present application.

Reference numerals: 1. a main support plate; 2. an auxiliary supporting plate; 3. a main support surface; 4. a secondary support surface; 5. a plug pin; 6. a mounting groove; 7. a fastener; 8. a baffle; 9. and (5) placing a groove.

Detailed Description

The present application is described in further detail below in conjunction with figures 1-4.

The embodiment of the application discloses a supporting bench suitable for high-pin DIP samples.

Example 1:

referring to fig. 1, a support table suitable for high-pin DIP samples includes a square plate-shaped main support plate 1, a plurality of sub support plates 2 are integrally connected to vertical sidewalls of the main support plate 1, and the integrally connected main support plate 1 and sub support plates 2 make the support table overall have high structural strength. The top surface of the main support plate 1 is a main support surface 3 for supporting the DIP samples, and the area of the main support surface 3 is larger than that of the DIP samples, so that a plurality of DIP samples can be adhered to the main support surface 3 at the same time.

The auxiliary supporting plates 2 are located at the same horizontal height, the top surface of the auxiliary supporting plate 2 is an auxiliary supporting surface 4, the width of the auxiliary supporting surface 4 is smaller than or equal to the distance between two rows of pins of the corresponding DIP sample, the widths of the auxiliary supporting surfaces 4 of the auxiliary supporting plates 2 are different, and the auxiliary supporting plates 2 with different specifications can be matched with the DIP samples with different specifications.

When the pin height of the DIP sample is smaller than the height of the device limit, the DIP sample can be directly adhered to the main supporting surface 3. When the pin height of the DIP sample is greater than the height of the equipment limit, the DIP sample with corresponding specification can be placed on the corresponding auxiliary supporting plate 2, so that the chip part of the DIP sample is adhered on the auxiliary supporting surface 4, the pins of the DIP sample are vertically downward, and two rows of pins of the DIP sample are respectively positioned on two sides of the auxiliary supporting plate 2.

In this way, the DIP sample is placed on the sub supporting plate 2 so that the top height of the DIP sample does not exceed the height limited by the apparatus. The main support plate 1 and the sub support plate 2 can be adapted to DIP samples of different specifications after being fitted to each other.

The central area of the bottom of the main supporting plate 1 is integrally connected with a bolt 5, and the bolt 5 is convenient for the supporting platform to be inserted on the base platform of the equipment. The adjacent sub-support plates 2 are arranged obliquely to each other, and the included angles between the adjacent sub-support plates 2 are the same. In the present embodiment, there are four sub-support plates 2 of different specifications, and the angle between adjacent sub-support plates 2 is 60 °. In this way, the relative position between DIP samples attached to the sub-support plate 2 can be ensured, and a sufficient distance between adjacent DIP samples can be maintained.

Example 2:

referring to fig. 2, the difference from embodiment 1 is that the main support plate 1 and the sub support plate 2 are detachably installed, the vertical side wall of the main support plate 1 is provided with a mounting groove 6, and the sub support plate 2 is clamped in the mounting groove 6. The mounting grooves 6 improve stability between the main support plate 1 and the sub support plate 2, so that the sub support plate 2 is less likely to shake on the main support plate 1.

A fastening piece 7 for fixing the main support plate 1 and the auxiliary support plate 2 is arranged between the main support plate 1 and the auxiliary support plate 2, and in the embodiment, the fastening piece 7 is a bolt, and the main support plate 1 is positioned in the mounting groove 6 and provided with a threaded hole matched with the bolt. The end of the bolt far away from the main support plate 1 penetrates into the auxiliary support plate 2 from the auxiliary support plate 2, the end of the bolt is connected with the threaded hole at the mounting groove 6 in a threaded mode, and the fastening piece 7 improves stability between the main support plate 1 and the auxiliary support plate 2.

When the auxiliary supporting plate 2 is damaged, the damaged auxiliary supporting plate 2 can be detached from the main supporting plate 1, and the auxiliary supporting plate 2 with good quality is installed on the main supporting plate 1, so that the whole supporting table is not required to be replaced, and the cost can be saved.

Example 3:

referring to fig. 3, the difference from embodiment 1 is that a baffle plate 8 is integrally connected to a side wall of the sub-support plate 2 remote from the main support plate 1, and a section of a side of the baffle plate 8 near the sub-support plate 2 is larger than a section of a side of the sub-support plate 2 near the baffle plate 8. The barrier 8 can block the DIP sample, and can reduce the possibility that the DIP sample falls from the sub-support plate 2 due to the inclination of the support table.

Example 4:

referring to fig. 4, the difference from embodiment 1 is that a plurality of placement grooves 9 are formed on the top of the main support plate 1, DIP samples of corresponding specifications can be clamped in the placement grooves 9, and DIP samples can be adhered to the main support surface 3 as well. The placement slot 9 provides a new embodiment for the DIP sample to mate with the support table.

The implementation principle of the supporting table suitable for the high-pin DIP sample in the embodiment of the application is as follows: when the pin height of the DIP sample is smaller than the height of the device limit, the DIP sample can be directly adhered to the main supporting surface 3. When the pin height of the DIP sample is greater than the height of the equipment limit, the DIP sample with corresponding specification can be placed on the corresponding auxiliary supporting plate 2, so that the chip part of the DIP sample is adhered on the auxiliary supporting surface 4, the pins of the DIP sample are vertically downward, and two rows of pins of the DIP sample are respectively positioned on two sides of the auxiliary supporting plate 2.

The foregoing are all preferred embodiments of the present application, and are not intended to limit the scope of the present application in any way, therefore: all equivalent changes in structure, shape and principle of this application should be covered in the protection scope of this application.

Claims

1. Supporting bench suitable for high pin DIP sample, its characterized in that: the DIP test device comprises a main support plate (1), wherein the top surface of the main support plate (1) is a main support surface (3), the area of the main support surface (3) is larger than that of the surface of a DIP sample, a plurality of auxiliary support plates (2) are arranged on the side wall of the main support plate (1), the top surface of each auxiliary support plate (2) is an auxiliary support surface (4), and the width of each auxiliary support surface (4) is smaller than or equal to the interval between two rows of pins of the DIP sample.

2. A support table for high pin DIP samples as claimed in claim 1, wherein: the widths of the auxiliary supporting surfaces (4) of the plurality of auxiliary supporting plates (2) are different.

3. A support table for high pin DIP samples according to claim 1 or 2, wherein: the main support plate (1) and the auxiliary support plate (2) are integrally connected.

4. A support table for high pin DIP samples according to claim 1 or 2, wherein: the main support plate (1) and the auxiliary support plate (2) are detachably mounted, and a fastener (7) for fixing the main support plate (1) and the auxiliary support plate (2) is arranged between the main support plate and the auxiliary support plate.

5. A support table for high pin DIP samples as set forth in claim 4, wherein: the side wall of the main supporting plate (1) close to the auxiliary supporting plate (2) is provided with a mounting groove (6), and the auxiliary supporting plate (2) is clamped in the mounting groove (6).

6. A support table for high pin DIP samples as claimed in claim 1, wherein: the side wall of the auxiliary supporting plate (2) far away from the main supporting plate (1) is provided with a baffle plate (8).

7. A support table for high pin DIP samples as claimed in claim 1, wherein: a placing groove (9) is formed in the top of the main supporting plate (1).

8. A support table for high pin DIP samples as claimed in claim 1, wherein: the adjacent auxiliary supporting plates (2) are obliquely arranged, and the included angles of the adjacent auxiliary supporting plates (2) are the same.