CN219038211U - Anti-interference dual-wavelength active laser temperature measuring device - Google Patents

Abstract

The utility model provides an anti-interference dual-wavelength active laser temperature measuring device, which comprises: a first laser generator and a second laser generator; the laser modulator is connected with the first laser generator and the second laser generator; the anti-interference shell is internally provided with an object to be detected, a reflecting mirror and an objective lens; a first hole and a second hole are formed in the anti-interference shell; the first laser or the second laser enters the anti-interference shell from a first hole of the anti-interference shell, and the radiation signal exits from a second hole; the first photo-thermal effect detector and the second photo-thermal effect detector are arranged on the outer side of the second hole. The device can conveniently and accurately acquire the real surface temperature of the measured physical.

Description

An anti-interference dual-wavelength active laser temperature measurement device

technical field

The utility model relates to the technical field of radiation temperature measurement, in particular to an anti-interference dual-wavelength active laser temperature measurement device.

Background technique

The radiation temperature measurement method is based on the functional relationship between the radiation intensity of the object and the temperature, which can realize the non-contact temperature measurement of the measured object, effectively reducing the influence on the original temperature field, and the theoretical upper limit of the temperature measurement is not limited, which is an important means of temperature measurement.

Common radiation thermometers include luminance thermometers, total radiation thermometers, and colorimetric thermometers. These thermometers have played a huge role in industrial production, national defense, scientific research, and social life. However, they are limited by the accuracy of the surface emissivity of the measurement object. Acquisition, the measurement accuracy of the traditional radiation temperature measurement method needs to be improved, especially for the temperature measurement of low emissivity physics.

Utility model content

The purpose of the utility model is to provide an anti-interference dual-wavelength active laser temperature measurement device to solve the problem that the traditional radiation temperature measurement method is limited by the emissivity of the surface of the measured object.

In order to achieve the above purpose, the utility model provides a dual-wavelength active laser temperature measuring device, which includes:

a first laser generator that generates a first laser light having a first wavelength;

a second laser generator that generates a second laser light having a second wavelength;

A laser modulator, the laser modulator is connected to the first laser generator and the second laser generator;

An anti-interference housing, the object to be measured, a reflector and an objective lens are arranged in the anti-interference housing; a first hole and a second hole are provided on the anti-interference housing; it is characterized in that:

Laser light enters the anti-interference housing from the first hole, and radiation signals exit from the second hole; a first photothermal effect detector and a second photothermal effect detector are arranged outside the second hole.

Wherein, the first laser generator includes a laser diode, a resonant cavity, a fiber-coupled optical device, a laser power supply, an LD current and a crystal temperature controller.

Wherein, the second laser generator includes a laser diode, a resonant cavity, a fiber-coupled optical device, a laser power supply, an LD current and a crystal temperature controller.

Wherein, the laser modulator outputs high and low level signals through the function generator to directly control the power supply of the laser, so as to realize the modulation function of the required frequency.

Wherein, a first optical filter is further included, and the working center wavelength range of the first optical filter is 800-1200 nm, and the bandwidth is 5-20 nm.

Wherein, a second optical filter is further included, and the working center wavelength range of the second optical filter is 1400-1800 nm, and the bandwidth is 30-50 nm.

The utility model provides an anti-interference dual-wavelength active laser temperature measuring device. By setting an anti-interference housing, it effectively gets rid of the dilemma that the traditional radiation temperature measurement method is restricted by the emissivity of the surface of the measured object, and obtains more conveniently and accurately The real surface temperature of the measured object promotes the development of radiation temperature measurement technology and improves the accuracy of measurement.

Additional aspects and advantages of the invention will be set forth in part in the description which follows, and will become apparent from the description, or may be learned by practice of the invention.

Description of drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings that need to be used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings in the following description are only some embodiments of the present invention , for those skilled in the art, other drawings can also be obtained according to these drawings on the premise of not paying creative work.

Fig. 1 is a schematic diagram of a dual-wavelength active laser temperature measuring device according to an embodiment of the present invention.

Detailed ways

Embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals represent the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary, and are only used to explain the present invention, and cannot be construed as limiting the present invention.

Those skilled in the art will understand that unless otherwise stated, the singular forms "a", "an", "said" and "the" used herein may also include plural forms. It should be further understood that the word "comprising" used in the description of the present utility model refers to the presence of the stated features, integers, steps, operations, elements and/or components, but does not exclude the presence or addition of one or more other features , integers, steps, operations, elements, components, and/or groups thereof. It will be understood that when an element is referred to as being "connected" or "coupled" to another element, it can be directly connected or coupled to the other element or intervening elements may also be present. Additionally, "connected" or "coupled" as used herein may include wirelessly connected or coupled. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.

Those skilled in the art can understand that, unless otherwise defined, all terms (including technical terms and scientific terms) used herein have the same meanings as commonly understood by those of ordinary skill in the art to which the present invention belongs. It should also be understood that terms such as those defined in commonly used dictionaries should be understood to have a meaning consistent with the meaning in the context of the prior art, and unless defined as herein, are not to be interpreted in an idealized or overly formal sense explain.

In order to facilitate the understanding of the embodiments of the present utility model, further explanations will be given below by taking specific embodiments as examples in conjunction with the accompanying drawings.

Example

Fig. 1 is a schematic diagram of a dual-wavelength active laser temperature measuring device according to an embodiment of the present invention. As shown in Figure 1, the temperature measurement device includes: a first laser generator 1, which generates a first laser with a first wavelength; a second laser generator 2, which generates a second laser with a second wavelength; laser modulation 3, the laser modulator 3 is connected with the first laser generator 1 and the second laser generator 2; the combination of the first laser generator 1, the second laser generator 2 and the laser modulator 3 as The laser light source system is used to provide laser light with two different wavelengths. The laser light source system is not limited to the first laser generator 1, the second laser generator 2 and the laser modulator 3, and may also include other optical components.

Among them, the first laser generator 1 preferably includes a laser diode, a resonant cavity, a fiber-coupled optical device, a laser power supply, an LD current, and a crystal temperature controller, etc., and has an optical fiber output function, and the central wavelength range of the output laser is 800-1200nm. Output power 8～12W, LD temperature control range 15～30℃.

Wherein, the second laser generator 2 preferably includes a laser diode, a resonant cavity, a fiber-coupled optical device, a laser power supply, an LD current, and a crystal temperature controller, etc., and has an optical fiber output function, and the central wavelength range of the output laser is 1400-1800nm. Output power 8～12W, LD temperature control range 15～30℃.

Wherein, the laser modulator 3 directly controls the power supply of the laser by outputting high and low level signals through the function generator, so as to realize the modulation function of the required frequency;

The first laser emitted by the first laser generator 1 is perpendicular to the second laser emitted by the second laser generator 2, the first laser is incident on the first side of the first beam splitter 4, and the second laser is incident on the The second side of the first beam splitter, the first laser beam is transmitted through the first beam splitter, and the second laser beam is reflected from the first beam splitter; the first laser or the second laser beam is incident on the anti-interference housing 15 for the first hole.

The anti-interference housing 15 is made of metal material, which can play the role of electromagnetic shielding, and black paint is arranged inside the anti-interference housing 15, which can absorb the stray reflection on the surface of the object 6 to be measured laser signal to avoid secondary heating of the surface of the object 6 to be measured by stray laser light. The anti-interference housing is provided with an object to be measured, a mirror and an objective lens. The anti-interference housing 15 includes a first hole and a second hole, the first laser or the second laser is incident on the first hole of the anti-interference housing 15, and is irradiated to the target surface of the object to be measured 6 through the reflector 5 Target surface produces temperature rise T under the heating of laser, and the radiant energy that target surface sends in certain solid angle is through objective lens 7, then emerges from the second hole of anti-interference housing, and is incident on the second beam splitter 8, and the temperature rise The corresponding radiation signal is split by the second beam splitter 8, a part is transmitted from the second beam splitter 8, and the other part is reflected from the second beam splitter 8, and the transmitted radiation signal passes through the first collimating lens group 9 and the first The optical filter 10 is incident to the first photothermal effect detector 11; the radiation signal reflected from the second beam splitter 8 passes through the second collimating lens group 12 and the second optical filter 13, and is incident to the second photothermal effect detector The detector 14, the first photothermal effect detector 11 and the second photothermal effect detector 12 are connected to amplifiers and display instruments.

The working central wavelength range of the first collimating transparent group and the first optical filter is 800-1200 nm, and the bandwidth is 5-20 nm; wherein, the working central wavelength range of the second collimating transparent group and the second optical filter is 1400-1800nm, with a bandwidth of 30-50nm; wherein, the central aperture of the first aperture 9 can be adjusted to control the intensity of the light signal received by the first photothermal effect detector 11; wherein, the first The photothermal effect detector 11 and the second photothermal effect detector 14 can convert received radiation energy of different intensities into corresponding electrical signals.

The combination of the objective lens, the second beam splitter, the collimating lens and the optical filter is used as an imaging system for transmitting optical signals, and the imaging system is not limited to the above components, but may also include other optical elements; the first photothermal effect detection The combination of the detector 11 and the second photothermal effect detector 14 is used as a dual-wavelength radiation measurement system, which converts optical signals of two wavelengths into thermal signals; the amplifier amplifies the signal from the detector; converts the electrical signal into a temperature value; The display instrument is used to display the temperature measurement value. The amplifier amplifies the signal from the detector; the single-chip microcomputer converts the electrical signal into a temperature value; the display instrument is used for displaying the temperature measurement value. Wherein, the amplifier includes a low-noise amplifier and a lock-in amplifier, which effectively amplifies the weak signal sent by the detector. Wherein, through a circuit board, such as a single-chip microcomputer, the received electrical signal is converted into a temperature value.

The concrete process that adopts measuring device of the present invention to carry out radiation temperature measurement comprises the following steps:

First, the high and low level signals output by the laser modulator 3 directly control the power supply of the first laser generator 1 and the second laser generator 2, and the first laser generator 1 starts to work and emits laser light of the first wavelength λ ₁ (980nm) The beam is projected onto the target surface of the object to be measured 6 after passing through the first beam splitter 4, the first hole of the anti-interference housing 15, and the reflector 5. The target surface generates a temperature rise ΔT ₁ under the heating of the laser, and the target surface is at Radiation energy emitted within a certain solid angle reaches the second collimating lens group after passing through the objective lens and the second beam splitter, and obtains a radiation beam with a wavelength λ ₂ (1550) after passing through the second filter, and the radiation beam is irradiated on the second The photothermal effect detector 14 measures the temperature rise ΔT ₁ generated by the target surface under the heating of the laser through the second photothermal effect detector to obtain the photocurrent I _p (λ ₂ ):

In the formula, R ₂ is the spectral responsivity function of the detector, ε ₂ is the spectral emissivity of the material at the wavelength λ ₂ , Ω ₂ is the measurement solid angle, △λ ₂ is the measurement bandwidth, τ ₂ is the instrument system at the wavelength λ ₂ τ ₁ is the spectral transmittance of the instrument system at wavelength λ ₁ , G ₁ (t) is the coefficient related to the temperature response of the measured object, P ₁ is the laser power, ρ ₁ is the instrument system Spectral reflectance at wavelength λ ₁ , L ₀ (λ ₂ ,T) is the spectral radiance of a blackbody at temperature T at wavelength λ ₂ .

For semi-infinite opaque objects, we have

In the formula, K is the thermal conductivity, D is the thermal diffusivity, and ω is the laser modulation frequency.

Similarly, the second laser transmitter is controlled by the laser modulator 3 to send a laser beam of the second wavelength λ ₂ (1550nm), which is projected onto the target surface of the object to be measured 6 after the first beam splitter 4 and the reflector 5, and the target surface is at The temperature rise ΔT ₂ is generated under the heating of the laser, and the radiant energy emitted by the target surface within a certain solid angle reaches the first collimator lens group through the objective lens and the second beam splitter, and the wavelength λ ₁ (980 ) radiation beam, the radiation beam is irradiated on the first photothermal effect detector 11, the temperature rise ΔT ₂ generated by the target surface under the heating of the laser is measured by the first photothermal effect detector 11, and the photocurrent I _p (λ ₁ ):

Dividing formula (1) and formula (3) together with Wien's law can eliminate the influence of the emissivity of the measured target:

In the formula, C _ALP is the intrinsic constant of the instrument, and c ₂ is the second radiation constant.

It can be seen from formula (4) that the high-precision calibration of the intrinsic constants of the instrument can be achieved by designing a calibration system with known surface temperature. Therefore, when carrying out the temperature measurement of the target surface, the measured value of I _p (λ ₂ ) and I _p (λ ₁ ) can be converted to obtain the surface temperature of the measured target. After measuring I _p (λ ₂ ) and I _p (λ ₁ ), the electrical signal is amplified by an amplifier and transmitted to a single-chip microcomputer, and the electrical signal is converted into a temperature value and displayed by a display instrument.

It can be seen from the above-mentioned technical scheme of a dual-wavelength active laser temperature measuring device based on photothermal effect of the present invention that the core components of the system of the present invention are: laser light source system, imaging system and dual-wavelength radiation measurement system. Through the cooperative work of the laser light source system and the dual-wavelength radiation measurement system, the precise measurement of the surface temperature can be realized under the condition that the surface emissivity of the object is unknown, and the setting of the anti-interference shell improves the accuracy of the measurement.

The utility model provides a dual-wavelength active laser temperature measurement device based on the photothermal effect, so that the surface emissivity of the measured object does not need to be known in advance when carrying out radiation temperature measurement, effectively getting rid of the traditional radiation temperature measurement method being restricted by the measured object The dilemma of surface emissivity and the more convenient and accurate acquisition of the real surface temperature of the measured object have promoted the development of radiation temperature measurement technology.

Those skilled in the art should be able to understand that the above-mentioned application types are only examples, and other existing or future application types, if applicable to the embodiments of the present utility model, should also be included in the protection scope of the present utility model, and hereby Included herein by reference.

Those skilled in the art should be able to understand that the number of various elements shown in Figure 1 may be less than the number in an actual system for the sake of simplicity, but this omission is undoubtedly so as not to affect the clarity of the utility model embodiment. full disclosure.

The above is only a preferred embodiment of the utility model, but the scope of protection of the utility model is not limited thereto, and any person familiar with the technical field can easily think of All changes or replacements should fall within the protection scope of the present utility model. Therefore, the protection scope of the present utility model should be based on the protection scope of the claims.

Claims (6)

1. An anti-interference dual-wavelength active laser temperature measuring device, comprising: a first laser generator that generates a first laser light having a first wavelength; a second laser generator that generates a second laser light having a second wavelength; A laser modulator, the laser modulator is connected to the first laser generator and the second laser generator; An anti-interference housing, the object to be measured, a mirror and an objective lens are arranged in the anti-interference housing; a first hole and a second hole are provided on the anti-interference housing; It is characterized by: The first laser or the second laser is incident into the anti-interference casing from the first hole of the anti-interference casing, and the radiation signal is emitted from the second hole; a first photothermal effect detector and a first photothermal effect detector are arranged outside the second hole The second photothermal effect detector; the anti-interference casing is made of metal material, and black paint is arranged inside the anti-interference casing. 2. The anti-interference dual-wavelength active laser temperature measuring device according to claim 1, wherein the first laser generator includes a laser diode, a resonant cavity, a fiber-coupled optical device, a laser power supply, an LD current, and a crystal thermostat. 3. The anti-interference dual-wavelength active laser temperature measuring device according to claim 1, wherein the second laser generator includes a laser diode, a resonant cavity, a fiber-coupled optical device, a laser power supply, an LD current, and a crystal thermostat. 4. The anti-interference dual-wavelength active laser temperature measuring device according to claim 1, wherein the laser modulator outputs high and low level signals through the function generator to directly control the power supply of the laser to realize the modulation of the required frequency Function. 5. The anti-interference dual-wavelength active laser temperature measuring device according to claim 1, further comprising a first optical filter, the working center wavelength range of the first optical filter is 800-1200nm, and the bandwidth is 5 ~20nm. 6. The anti-interference dual-wavelength active laser temperature measuring device according to claim 1, further comprising a second optical filter, the working center wavelength range of the second optical filter is 1400-1800nm, and the bandwidth is 30 ~50nm.

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