CN219038211U - Anti-interference dual-wavelength active laser temperature measuring device - Google Patents
Anti-interference dual-wavelength active laser temperature measuring device Download PDFInfo
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- CN219038211U CN219038211U CN202220908519.XU CN202220908519U CN219038211U CN 219038211 U CN219038211 U CN 219038211U CN 202220908519 U CN202220908519 U CN 202220908519U CN 219038211 U CN219038211 U CN 219038211U
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Abstract
The utility model provides an anti-interference dual-wavelength active laser temperature measuring device, which comprises: a first laser generator and a second laser generator; the laser modulator is connected with the first laser generator and the second laser generator; the anti-interference shell is internally provided with an object to be detected, a reflecting mirror and an objective lens; a first hole and a second hole are formed in the anti-interference shell; the first laser or the second laser enters the anti-interference shell from a first hole of the anti-interference shell, and the radiation signal exits from a second hole; the first photo-thermal effect detector and the second photo-thermal effect detector are arranged on the outer side of the second hole. The device can conveniently and accurately acquire the real surface temperature of the measured physical.
Description
Technical Field
The utility model relates to the technical field of radiation temperature measurement, in particular to an anti-interference dual-wavelength active laser temperature measurement device.
Background
The radiation temperature measurement method is based on the functional relation between the radiation intensity and the temperature of the object, can realize non-contact temperature measurement of the measured object, effectively reduces the influence on the original temperature field, has no limit on the theoretical upper limit of temperature measurement, and is an important temperature measurement means.
Common radiation thermometers include a brightness thermometer, a total radiation thermometer, a colorimetric thermometer and the like, and the thermometers have great roles in industrial production, national defense, scientific research and social life at present, but are subject to accurate acquisition of the surface emissivity of a measured object, and the measurement accuracy of the traditional radiation temperature measurement method is required to be improved, especially for low-emissivity physical temperature measurement.
Disclosure of Invention
The utility model aims to provide an anti-interference dual-wavelength active laser temperature measuring device, which solves the problem that the traditional radiation temperature measuring method is limited by the surface emissivity of a measured object.
In order to achieve the above object, the present utility model provides a dual wavelength active laser temperature measuring device, comprising:
a first laser generator that generates a first laser light having a first wavelength;
a second laser generator that generates a second laser light having a second wavelength;
the laser modulator is connected with the first laser generator and the second laser generator;
the anti-interference shell is internally provided with an object to be detected, a reflecting mirror and an objective lens; a first hole and a second hole are formed in the anti-interference shell; the method is characterized in that:
the laser enters the anti-interference shell from the first hole, and the radiation signal exits from the second hole; the first photo-thermal effect detector and the second photo-thermal effect detector are arranged on the outer side of the second hole.
The first laser generator comprises a laser diode, a resonant cavity, an optical fiber coupling optical device, a laser power supply, an LD current and a crystal temperature controller.
The second laser generator comprises a laser diode, a resonant cavity, an optical fiber coupling optical device, a laser power supply, an LD current and a crystal temperature controller.
The laser modulator directly controls the power supply of the laser through the high-low level signal output by the function generator, and realizes the modulation function of the required frequency.
The optical filter further comprises a first optical filter, wherein the working center wavelength range of the first optical filter is 800-1200 nm, and the bandwidth is 5-20 nm.
The optical filter further comprises a second optical filter, wherein the working center wavelength range of the second optical filter is 1400-1800 nm, and the bandwidth is 30-50 nm.
The utility model provides an anti-interference dual-wavelength active laser temperature measuring device, which effectively gets rid of the dilemma that the traditional radiation temperature measuring method is limited by the surface emissivity of a measured object by arranging an anti-interference shell, more conveniently and accurately obtains the real surface temperature of the measured physical, promotes the development of radiation temperature measuring technology and improves the measuring accuracy.
Additional aspects and advantages of the utility model will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the utility model.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the drawings required for the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present utility model, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a dual wavelength active laser temperature measuring device according to an embodiment of the present utility model.
Detailed Description
Embodiments of the present utility model are described in detail below, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals refer to the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the drawings are exemplary only for explaining the present utility model and are not to be construed as limiting the present utility model.
As used herein, the singular forms "a", "an", "the" and "the" are intended to include the plural forms as well, unless expressly stated otherwise, as understood by those skilled in the art. It will be further understood that the terms "comprises" and/or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof. It will be understood that when an element is referred to as being "connected" or "coupled" to another element, it can be directly connected or coupled to the other element or intervening elements may also be present. Further, "connected" or "coupled" as used herein may include wirelessly connected or coupled. The term "and/or" as used herein includes any and all combinations of one or more of the associated listed items.
It will be understood by those skilled in the art that, unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this utility model belongs. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the prior art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.
For the purpose of facilitating an understanding of the embodiments of the present utility model, reference will now be made to the following description of specific embodiments, taken in conjunction with the accompanying drawings.
Examples
FIG. 1 is a schematic diagram of a dual wavelength active laser temperature measuring device according to an embodiment of the present utility model. As shown in fig. 1, the temperature measuring device includes: a first laser generator 1 that generates a first laser light having a first wavelength; a second laser generator 2 that generates a second laser light having a second wavelength; the laser modulator 3, the said laser modulator 3 connects with said first laser generator 1 and second laser generator 2; the combination of the first laser generator 1, the second laser generator 2 and the laser modulator 3 serves as a laser light source system for providing laser light of two different wavelengths, and the laser light source system is not limited to the first laser generator 1, the second laser generator 2 and the laser modulator 3, but may also include other optical components.
The first laser generator 1 preferably comprises a laser diode, a resonant cavity, an optical fiber coupling optical device, a laser power supply, an LD current, a crystal temperature controller and the like, has an optical fiber output function, outputs laser with a central wavelength range of 800-1200 nm, outputs power of 8-12W and an LD temperature control range of 15-30 ℃.
The second laser generator 2 preferably comprises a laser diode, a resonant cavity, an optical fiber coupling optical device, a laser power supply, an LD current, a crystal temperature controller and the like, has an optical fiber output function, and outputs laser with a center wavelength range of 1400-1800 nm, output power of 8-12W and an LD temperature control range of 15-30 ℃.
The laser modulator 3 directly controls the power supply of the laser through the high-low level signal output by the function generator, so as to realize the modulation function of the required frequency;
the first laser emitted by the first laser generator 1 is perpendicular to the second laser emitted by the second laser generator 2, the first laser is incident on a first side of the first spectroscope 4, the second laser is incident on a second side of the first spectroscope, the first laser is transmitted from the first spectroscope, and the second laser is reflected from the first spectroscope; either the first laser light or the second laser light is incident to the first hole of the tamper-proof housing 15.
The anti-interference shell 15 is made of a metal material, the metal material can play a role of electromagnetic shielding, black paint is arranged in the anti-interference shell 15, laser signals reflected by the surface of the object 6 to be detected in a stray mode can be absorbed, and secondary heating of the surface of the object 6 to be detected by the stray laser is avoided. An object to be detected, a reflecting mirror and an objective lens are arranged in the anti-interference shell. The anti-interference shell 15 comprises a first hole and a second hole, wherein the first laser or the second laser is incident into the first hole of the anti-interference shell 15 and irradiates the target surface of the object 6 to be detected through the reflector 5; the target surface generates temperature rise T under the heating of laser, radiant energy emitted by the target surface in a certain solid angle passes through the objective lens 7, then exits from a second hole of the anti-interference shell, and enters the second beam splitter 8, a radiant signal corresponding to the temperature rise is split by the second beam splitter 8, one part of the radiant signal is transmitted from the second beam splitter 8, the other part of the radiant signal is reflected from the second beam splitter 8, and the transmitted radiant signal enters the first photo-thermal effect detector 11 through the first collimating lens group 9 and the first optical filter 10; the radiation signal reflected from the second beam splitter 8 passes through the second collimating lens group 12 and the second optical filter 13, and is incident on the second photo-thermal effect detector 14, and the first photo-thermal effect detector 11 and the second photo-thermal effect detector 12 are connected to an amplifier and a display instrument.
The working center wavelength range of the first quasi-transparent group and the first optical filter is 800-1200 nm, and the bandwidth is 5-20 nm; the working center wavelength range of the second collimation transparent group and the second optical filter is 1400-1800 nm, and the bandwidth is 30-50 nm; the central caliber of the first diaphragm 9 is adjustable, and is used for controlling the intensity of an optical signal received by the first photo-thermal effect detector 11; the first photo-thermal effect detector 11 and the second photo-thermal effect detector 14 can convert received radiant energy with different intensities into corresponding electrical signals.
The combination of the objective lens, the second beam splitter, the collimating lens, the optical filter and the like is used as an imaging system for transmitting optical signals, and the imaging system is not limited to the components and can also comprise other optical elements; the combination of the first photo-thermal effect detector 11 and the second photo-thermal effect detector 14 as a dual wavelength radiation measurement system converts the optical signals of the two wavelengths into thermal signals, respectively; an amplifier amplifies the signal from the detector; converting the electrical signal into a temperature value; the display instrument is used for displaying the temperature measurement value. The amplifier amplifies the signal from the detector; the singlechip converts the electric signal into a temperature value; the display instrument is used for displaying the temperature measurement value. The amplifier comprises a low noise amplifier and a phase-locked amplifier, and is used for effectively amplifying weak signals sent by the detector. The received electric signals are converted into temperature values through a circuit board, such as a singlechip.
The specific process of radiation temperature measurement by adopting the measuring device comprises the following steps:
first, the power supply of the first laser generator 1 and the second laser generator 2 is directly controlled by the high-low level signal output by the laser modulator 3, the first laser generator 1 starts to work and emits a first wavelength lambda 1 The laser beam (980 nm) is projected to the target surface of the object 6 to be measured after passing through the first spectroscope 4, the first hole of the anti-interference shell 15 and the reflecting mirror 5, and the target surface generates temperature rise delta T under the heating of the laser 1 The radiation energy emitted by the target surface in a certain solid angle reaches the second collimating lens group after passing through the objective lens and the second beam splitter, and the wavelength lambda is obtained after passing through the second optical filter 2 (1550) A radiation beam which irradiates a second photo-thermal effect detector 14 by which a temperature rise DeltaT of the target surface generated by heating of the laser light is measured 1 Obtaining photocurrent I p (λ 2 )：
Wherein R is 2 Epsilon as a function of spectral responsivity of the detector 2 For material at wavelength lambda 2 Spectral emissivity at omega 2 For measuring solid angle, deltalambda 2 To measure bandwidth τ 2 At wavelength lambda for instrument system 2 Spectral transmittance at τ 1 At wavelength lambda for instrument system 1 Spectral transmission underOverrate, G 1 (t) is a coefficient related to the temperature response of the measured object, P 1 Is the laser power ρ 1 At wavelength lambda for instrument system 1 Spectral reflectance at L 0 (λ 2 T) is the temperature of T at the wavelength lambda 2 The spectral radiance below.
For semi-infinite opaque objects, there are
Wherein K is a heat conductivity coefficient, D is a thermal diffusivity, and ω is a laser modulation frequency.
Likewise, the second laser transmitter is controlled by the laser modulator 3 to emit a second wavelength lambda 2 The laser beam (1550 nm) is projected to the target surface of the object 6 to be measured after passing through the first spectroscope 4 and the reflecting mirror 5, and the target surface generates temperature rise DeltaT under the heating of the laser 2 The radiation energy emitted by the target surface in a certain solid angle reaches the first collimating lens group through the objective lens and the second beam splitter, and the wavelength lambda is obtained after passing through the first optical filter 1 (980) The radiation beam irradiates the first photo-thermal effect detector 11, and the temperature rise DeltaT of the target surface under the heating of the laser is measured by the first photo-thermal effect detector 11 2 Obtaining photocurrent I p (λ 1 )：
Dividing the formula (1) and the formula (3) and combining with Venn law, the influence of the emissivity of the measured target can be eliminated:
wherein C is ALP C is the intrinsic constant of the instrument 2 Is the second radiation constant.
From formula (4), it is known that by designing the surface temperatureThe known scaling system achieves a high-precision scaling of the instrument's natural constant. Thus, in performing temperature measurement of the target surface, the temperature is measured by I p (λ 2 ) And I p (λ 1 ) The measured value of the temperature sensor can be converted to obtain the surface temperature of the measured object. In the measurement to obtain I p (λ 2 ) And I p (λ 1 ) And amplifying the electric signal by using an amplifier, transmitting the electric signal to the singlechip, converting the electric signal into a temperature value, and displaying the temperature value by using a display instrument.
According to the technical scheme of the dual-wavelength active laser temperature measuring device based on the photo-thermal effect, the system comprises the following core components: a laser light source system, an imaging system and a dual wavelength radiation measurement system. Through the cooperative work of the laser light source system and the dual-wavelength radiation measurement system, the accurate measurement of the surface temperature can be realized under the condition that the emissivity of the surface of an object is unknown, the setting of the anti-interference shell is improved, and the measurement accuracy is improved.
The utility model provides a dual-wavelength active laser temperature measuring device based on a photo-thermal effect, so that the surface emissivity of a measured object is not required to be known in advance when radiation temperature measurement is carried out, the dilemma that the traditional radiation temperature measuring method is limited by the surface emissivity of the measured object is effectively eliminated, the surface real temperature of the measured physical is more conveniently and accurately obtained, and the development of a radiation temperature measuring technology is promoted.
It will be appreciated by those skilled in the art that the above application types are merely examples, and that other application types that may be present in the present utility model or that may be present in the future are intended to be within the scope of the present utility model as applicable thereto and are hereby incorporated by reference herein.
Those skilled in the art will appreciate that the number of various elements shown in fig. 1 for simplicity only may be less than in a practical system, but such omission is certainly not provided for clarity and full disclosure of embodiments of the utility model.
The present utility model is not limited to the above-mentioned embodiments, and any changes or substitutions that can be easily understood by those skilled in the art within the technical scope of the present utility model are intended to be included in the scope of the present utility model. Therefore, the protection scope of the present utility model should be subject to the protection scope of the claims.
Claims (6)
1. An anti-interference dual-wavelength active laser temperature measuring device, comprising:
a first laser generator that generates a first laser light having a first wavelength;
a second laser generator that generates a second laser light having a second wavelength;
the laser modulator is connected with the first laser generator and the second laser generator;
the anti-interference shell is internally provided with an object to be detected, a reflecting mirror and an objective lens; a first hole and a second hole are formed in the anti-interference shell;
the method is characterized in that:
the first laser or the second laser enters the anti-interference shell from a first hole of the anti-interference shell, and the radiation signal exits from a second hole; a first photo-thermal effect detector and a second photo-thermal effect detector are arranged on the outer side of the second hole; the anti-interference shell is made of metal materials, and black paint is arranged inside the anti-interference shell.
2. The tamper resistant dual wavelength active laser thermometry device of claim 1, wherein the first laser generator comprises a laser diode, a resonant cavity, fiber optic coupling optics, a laser power supply, an LD current, and a crystal temperature controller.
3. The tamper resistant dual wavelength active laser thermometry device of claim 1, wherein the second laser generator comprises a laser diode, a resonant cavity, fiber optic coupling optics, a laser power supply, an LD current, and a crystal temperature controller.
4. The anti-interference dual-wavelength active laser temperature measuring device according to claim 1, wherein the laser modulator directly controls the power supply of the laser through the high-low level signal output by the function generator, so as to realize the modulation function of the required frequency.
5. The anti-interference dual-wavelength active laser temperature measuring device according to claim 1, further comprising a first optical filter, wherein the working center wavelength range of the first optical filter is 800-1200 nm, and the bandwidth is 5-20 nm.
6. The anti-interference dual-wavelength active laser temperature measuring device according to claim 1, further comprising a second optical filter, wherein the working center wavelength range of the second optical filter is 1400-1800 nm, and the bandwidth is 30-50 nm.
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| CN202220908519.XU CN219038211U (en) | 2022-04-19 | 2022-04-19 | Anti-interference dual-wavelength active laser temperature measuring device |
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| CN202220908519.XU CN219038211U (en) | 2022-04-19 | 2022-04-19 | Anti-interference dual-wavelength active laser temperature measuring device |
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