CN218917654U

CN218917654U - Gamma probe tube test system

Info

Publication number: CN218917654U
Application number: CN202222525511.8U
Authority: CN
Inventors: 刘宇超; 王政
Original assignee: Beijing Judian Weilai Technology Co ltd
Current assignee: Beijing Judian Weilai Technology Co ltd
Priority date: 2022-09-23
Filing date: 2022-09-23
Publication date: 2023-04-25
Anticipated expiration: 2032-09-23

Abstract

The embodiment of the utility model provides a gamma probe tube testing system, which comprises an upper computer, a control device and a probe tube environment box; the probe environment box includes: vibration and fixation tools, a heating device and a temperature sensor; the vibration and fixation tool comprises a plurality of fixation channels for fixing the gamma probe; the temperature sensor and the heating device are all arranged in the box; the gamma probe tube is fixed through the vibration and fixing tool, an underground vibration environment is provided for the probe tube, a heating device is used for providing an underground high-temperature working condition for the gamma probe tube, and the control device is used for starting counting gamma photons when receiving a test instruction sent by the upper computer, and simultaneously receiving temperature information and counting information acquired by the temperature sensor and sending the temperature information and the counting information to the upper computer for visual display. The utility model can complete the gamma probe detection function and simultaneously test a plurality of gamma probes, thereby improving the testing efficiency.

Description

Gamma probe tube test system

Technical Field

The utility model relates to the technical field of gamma ray detection engineering in petroleum, coal mine and geological exploration, in particular to a gamma probe tube testing system.

Background

The wireless measurement while drilling instrument is a novel measurement and logging instrument representing a new drilling technology developed in the drilling professional field, can continuously monitor stratum parameters, borehole tracks and the like, and is increasingly widely used and important. Gamma probes are key devices for measurement while drilling and use with rotary steerable tools, and their reliability has a major impact on the reliability of logging tools in field operations.

The gamma probe belongs to a precise instrument and is influenced by environmental factors. Therefore, the gamma probe is required to detect whether the gamma probe is normal or not before the gamma probe is in the well, and whether the gamma probe can count correctly, so that the gamma probe can work normally when working underground.

Disclosure of Invention

In order to ensure that a gamma probe can normally work when a well is in operation, the embodiment of the utility model provides a gamma probe testing system, which comprises an upper computer, a control device and a probe environment box; the probe tube environment box is used for fixing the gamma probe tube and providing a testing environment for the gamma probe tube; the control device is used for starting a power supply to supply power to a plurality of gamma probe tubes fixed in the probe tube environment box, and simultaneously collecting the quantity of gamma photons collected by the gamma probe tubes and returning the quantity of gamma photons to the upper computer; the upper computer is used for sending a control instruction to the control device, receiving counting information of the gamma probe sent by the control device and visually displaying the counting information on the display screen; the tester can judge whether the gamma probe corresponding to the channel is normal by checking whether the counting information of the gamma probes corresponding to the channel is normal or not on the display screen, and the testing of the gamma probes is completed. The specific technical scheme is as follows:

the gamma probe testing system provided by the embodiment of the utility model comprises: the upper computer, the control device and the probe environment box; the probe environment box comprises: the device comprises a vibration and fixing tool, a plurality of gamma probe tubes, a heating device and a temperature sensor; the vibration and fixation tool comprises a plurality of fixation channels, and each channel is used for fixing one gamma probe; the temperature sensor and the heating device are both arranged in the box; the upper computer is in communication connection with the control device, the control device is electrically connected with the gamma probe, and the temperature sensor is electrically connected with the control device;

the vibration and fixation tool is used for fixing the gamma probe tube and providing a vibration test environment for the gamma probe tube; the heating device is used for providing a high-temperature test environment for the gamma probe in the probe environment box; the control device is used for receiving a control instruction sent by the upper computer, controlling the power supply to start to supply power to a plurality of gamma probe tubes fixed in the probe tube environment box, and simultaneously collecting counting information of the gamma probe tubes and temperature information of the current probe tube environment box collected by the temperature sensor, and returning the counting information and the temperature information to the upper computer; the upper computer is used for sending a control instruction to the control device, receiving counting information and temperature information of the gamma probe sent by the control device, and displaying the counting information and the temperature information on the display screen in a visual mode.

Further, the gamma probe tubes are multiple, the vibration and fixation tool comprises multiple fixation channels, and each fixation channel is used for fixing one gamma probe tube.

Further, the control device comprises a main control MCU module, a probe tube power interface, a probe tube connecting interface, a probe tube power acquisition circuit, a temperature sensing circuit and a USB interface; the probe tube connecting interface, the probe tube power interface, the temperature sensing circuit, the probe tube power acquisition circuit and the USB interface are respectively connected with the main control MCU module; the probe connecting interface is connected with the gamma probes and is used for collecting counting information of the probes; the power interface of the probe tube is connected with an external power supply and is used for starting the power supply to supply power for the probe tube after receiving a power-on instruction sent by the main control MCU module; the probe power supply acquisition circuit is also connected with the probe power supply interface and is used for acquiring voltage and current information of the probe in real time; the temperature sensing circuit is also connected with the temperature sensor and used for collecting the real-time temperature of the probe tube environment box.

Further, the probe power supply acquisition circuit comprises: the voltage and current detection amplifying circuit, the analog-to-digital conversion circuit and the ADC data acquisition circuit are connected in sequence; the ADC data acquisition circuit is also connected with the main control MCU module, and the voltage and current detection amplifying circuit is also connected with the probe power interface; the voltage and current detection amplifying circuit is used for amplifying the acquired voltage or current signals and then transmitting the amplified voltage or current signals to the analog-to-digital conversion circuit, the analog-to-digital conversion circuit converts the analog voltage or current signals into digital signals, the analog-to-digital conversion circuit transmits the digital signals obtained after conversion to the data acquisition circuit and then transmits the digital signals to the main control MCU module, and the main control MCU module transmits the received digital signals to the upper computer for storage, processing and display.

Further, the control device further includes: the device comprises a communication indicator lamp, a power indicator lamp, a probe power indicator lamp and a probe counting indicator lamp; the probe tube power supply interface is connected with a probe tube power supply indicator lamp, and the probe tube counting indicator lamp is connected with the probe tube connecting interface; the detecting tube power supply indicator lamp is used for indicating whether the detecting tube power supply is connected normally or not, the detecting tube counting indicator lamp is used for indicating whether the detecting tube output is normal or not, the communication indicator lamp is used for indicating whether communication between the upper computer and the control device is normal or not, and the power supply indicator lamp is connected with the main control MCU module and used for indicating the power-on state of the power supply of the control device.

Further, the control device further includes: the alarm is connected with the main control MCU module, the main control MCU module is used for collecting voltage or current information collected by the probe tube power supply collecting circuit and sending the voltage or current information to the upper computer, and when the upper computer receives an instruction that the upper computer judges that the voltage or current information is abnormal, the alarm is controlled to alarm.

Further, the temperature sensing circuit includes: analog-to-digital conversion chip U10, sensor interface U11, resistor R22, resistor R23, resistor R24, resistor R25, resistor R26, resistor R27, resistor R28, and resistor R29; a capacitor C29, a capacitor C30, and a capacitor C31; the pin 1 of the analog-to-digital conversion chip U10 is connected with one end of the resistor R22, and the other end of the resistor R22 is connected with the main control MCU chip U1B; one end of the capacitor C29 is connected with the analog-digital conversion chip U10, and the other end of the capacitor C is grounded; one end of the capacitor C30 is grounded, and the other end of the capacitor C is connected with the pin 3 of the analog-digital conversion chip U10; one end of the resistor R23 is connected with VCC_3P3, and the other end is connected with the pin 3 of the analog-digital conversion chip U10; one end of the resistor R25 is connected with the pin 4 of the analog-to-digital conversion chip U10, and the other end of the resistor R25 is connected with the resistor R28; pin 5 and pin 4 of the analog-to-digital conversion chip U10 are in short circuit, and pin 6 and pin 7 are in short circuit; the pin 8 of the analog-to-digital conversion chip U10 is in short circuit with the pin 9, the pin 8 is connected with the pin 3 of the sensor interface U11, the pin 10 of the analog-to-digital conversion chip U10 is connected with the pin 2 of the sensor interface U11, and the pin 11 of the analog-to-digital conversion chip U10 is connected with the pin 1 of the sensor interface U11; the pin 11 and the pin 12 of the analog-to-digital conversion chip U10 are in short circuit, one end of the capacitor C31 is connected with the pin 10 of the U10, and the other end is connected with the pin 11 of the U11; the pin 13 and the pin 18 of the U11 are grounded, one end of the resistor R24 is connected with the pin 17 of the U10, the other end of the resistor R24 is connected with the pin K16 of the main control MCU chip U1B, one end of the resistor R26 is connected with the pin 16 of the U10, the other end of the resistor R26 is connected with the pin J14 of the main control MCU chip U1B, one end of the resistor R27 is connected with the pin 15 of the U10, and the other end of the resistor R27 is connected with the pin J16 of the main control MCU chip U1B; one end of the resistor R29 is connected with the pin 14 of the analog-to-digital conversion chip U10, and the other end of the resistor R is connected with the pin H15 of the main control MCU chip U1B; the pin 19 of the analog-digital conversion chip U10 is grounded.

Further, the probe power supply acquisition circuit further comprises a probe power supply switch circuit; and the probe tube power supply switch circuit is respectively connected with the main control MCU module and the probe tube power supply interface.

Further, the probe power switch includes: the probe power switching circuit comprises: p-channel field effect transistor U36, resistor R88, resistor R89, resistor R90, resistor R91, resistor R92, resistor R94, triode Q7; the resistor R88 and the resistor R89 are connected in parallel, and one end of the resistor R88 is simultaneously connected with the pin 5, the pin 6, the pin 7 and the pin 8 of the P-channel field effect transistor U36; the other end is connected with a power interface of the probe tube; pin 1, pin 2 and pin 3 of P channel field effect tube U36 are short circuited, and pin 1, pin 2 and pin 3 all connect VCC_24V, the one end of resistance R92 termination P channel field effect tube U36's pin 4, the other end termination P channel field effect tube U36's pin 1, the one end of resistance R90 connects the switch control pin of master control MCU chip, the other end termination triode Q7's base, the one end termination of resistance R94 triode Q7's collecting electrode, the other end termination P channel field effect tube U36's pin 4, the one end termination of resistance R91 triode Q7's projecting pole, the other end termination triode Q7's base.

Further, the voltage-current detection amplifying circuit includes: amplifying chip U39, resistor R93, resistor R97, capacitor C74, capacitor C75, capacitor C76, capacitor C77 and diode D10; the pin 1 of the amplifying chip U39 is connected with the probe power interface, the pin 2 of the amplifying chip U39 is short-circuited with the pin 3 and grounded, the pin 8 of the amplifying chip U39 is connected with the pin 8 of the P-channel field effect transistor U36, the pin 7 of the amplifying chip U39 is grounded, one end of the capacitor C76 is grounded, the other end of the capacitor C76 is connected with the pin 6 of the amplifying chip U39, and the capacitor C77 is connected with the capacitor C76 in parallel; the pin 5 of the amplifying chip U39 is connected with a current detection channel of the analog-to-digital conversion circuit; one end of the resistor R93 is connected with the resistor R89, the other end of the resistor R93 is connected with the resistor R97, and the capacitor C74 is connected with the resistor R93 in parallel; one end of the resistor R97 is connected with the resistor R93, the other end of the resistor R97 is grounded, and the capacitor C75 is connected with the resistor R97; the voltage detection channel of the analog-to-digital conversion circuit is connected between the resistor R94 and the resistor R97.

The embodiment of the utility model provides a gamma probe tube testing system, which comprises an upper computer, a control device and a probe tube environment box; the probe environment box includes: the device comprises a vibration and fixing tool, a plurality of gamma probe tubes, a heating device and a temperature sensor; the vibration and fixation tool comprises a plurality of fixation channels, and each channel is fixed with a gamma probe; the temperature sensor and the heating device are all arranged in the box; the upper computer is in communication connection with the control device, the control device is electrically connected with the gamma probe, and the temperature sensor is electrically connected with the control device. According to the utility model, a plurality of gamma probe tubes are fixed through the vibration and fixing tool, an underground vibration environment is provided for the probe tubes, a heating device is used for providing an underground high-temperature environment for the gamma probe tubes, when a control device receives a test instruction sent by an upper computer, a power supply is started to supply power to the gamma probe tubes, the gamma probe tubes start to collect detected counting information and send the counting information to the control device, the control device receives temperature information collected by a temperature sensor and sends the received counting information to the upper computer for display, and a tester directly judges whether the function of the gamma probe tubes at the current temperature is normal or not from a display screen. According to the utility model, a plurality of gamma probe tubes can be tested simultaneously on the basis of completing the detection function of the gamma probe tubes, so that the testing efficiency is improved; the detection function of the gamma probe can be directly judged according to the displayed data from the upper computer display screen, the testing efficiency is further improved, and the judgment of testers is facilitated.

Further, the control device comprises a main control MCU module, a probe tube power interface, a probe tube connecting interface, a probe tube power acquisition circuit, a temperature sensing circuit and a USB interface; and the probe tube power interface starts a power supply to supply power to the gamma probe tube after receiving a power supply start instruction sent by the main control MCU module, and starts to collect gamma photons and count the collected gamma photons after the gamma probe tube is electrified. The gamma probe starts counting the counting information of the collected gamma photons after receiving the instruction of the main control MCU module. Because gamma photons do not need to be detected when the underground shallow layer is formed, gamma photons are detected when the underground shallow layer is formed, the gamma probe tube starts to detect gamma photon information after receiving a power-on instruction of the main control MCU module, and on the basis of meeting the test of the gamma probe tube, the requirement scene of the underground work of the gamma probe tube is simulated, electric energy is saved, and the detection efficiency is improved.

Furthermore, the control device of the utility model also comprises a probe power supply acquisition circuit which is also connected with the probe power supply interface and used for acquiring the voltage and current information of the probe in real time; the temperature sensing circuit is also connected with the temperature sensor and used for collecting the real-time temperature of the probe environment box so as to judge the temperature information corresponding to the current probe counting information; the utility model collects the voltage and the current of the probe tube power supply in real time and judges the power supply condition of the probe tube power supply in real time so as to ensure the normal power supply condition of the probe tube and ensure the accuracy of gamma probe tube test.

Drawings

FIG. 1 is a schematic block diagram of a gamma probe testing system according to an embodiment of the present utility model;

FIG. 2 is a block diagram of a specific architecture of a gamma probe testing system according to an embodiment of the present utility model;

FIG. 3a is a schematic circuit diagram of a first portion of a main control MCU module of a gamma probe testing system according to an embodiment of the present utility model;

FIG. 3b is a schematic circuit diagram of a second portion of a main control MCU module of a gamma probe testing system according to an embodiment of the present utility model;

FIG. 4 is a schematic diagram of a temperature sensing circuit of a gamma probe testing system according to an embodiment of the present utility model;

fig. 5 is a schematic circuit diagram of a probe power switch and a voltage and current detection amplifying circuit of a gamma probe testing system according to an embodiment of the present utility model.

Detailed Description

The following description of the technical solutions in the embodiments of the present utility model will be clear and complete, and it is obvious that the described embodiments are only some embodiments of the present utility model, but not all embodiments. All other embodiments, based on the embodiments of the utility model, which would be apparent to one of ordinary skill in the art without making any inventive effort, are intended to be within the scope of the utility model.

Fig. 1 is a schematic system structure diagram of a gamma probe testing system according to an embodiment of the present utility model, where in fig. 1, the gamma probe testing system includes: the upper computer, the control device and the probe environment box; the probe environment box includes: the device comprises a vibration and fixing tool, a plurality of gamma probe tubes, a heating device and a temperature sensor; the vibration and fixation tool comprises a plurality of fixation channels, and each channel is fixed with a gamma probe; the temperature sensor and the heating device are all arranged in the box; the upper computer is in communication connection with the control device, the control device is electrically connected with the gamma probe, and the temperature sensor is electrically connected with the control device. According to the utility model, a plurality of gamma probe tubes are fixed through the vibration and fixing tool, an underground vibration environment is provided for the probe tubes, a heating device is used for providing an underground high-temperature environment for the gamma probe tubes, when a control device receives a test instruction sent by an upper computer, a power supply is started to supply power to the gamma probe tubes, the gamma probe tubes start to collect detected gamma photon information and count the collected gamma photon information, count information is obtained and sent to the control device, the control device receives temperature information collected by a temperature sensor and sends the received gamma photon information to the upper computer for display, and a tester can directly judge whether the gamma probe tubes are normal or not under the current temperature from a display screen. According to the utility model, a plurality of gamma probe tubes can be tested simultaneously on the basis of completing the detection function of the gamma probe tubes, so that the testing efficiency is improved; the detection function of the gamma probe can be directly judged according to the displayed data from the upper computer display screen, the testing efficiency is further improved, and the judgment of testers is facilitated.

Fig. 2 is a schematic diagram of a specific structure of a gamma probe testing system according to an embodiment of the present utility model, where the control device includes a main control MCU module, a probe power interface, a probe connection interface, a temperature sensing circuit, a probe power acquisition circuit, and a USB interface; the probe tube connecting interface, the probe tube power interface, the temperature sensing circuit, the probe tube power acquisition circuit and the USB interface are respectively connected with the main control MCU module; the probe tube connecting interface is connected with a plurality of probe tubes and is used for collecting counting information of the probe tubes; the power interface of the probe tube is connected with an external power supply and is used for starting the power supply to supply power for the probe tube after receiving a power-on instruction sent by the main control MCU module; the probe power supply acquisition circuit is connected with the probe power supply interface and is used for acquiring voltage and current information of the probe in real time; the temperature sensing circuit is also connected with the temperature sensor and used for collecting the real-time temperature of the probe environment box so as to judge the temperature information corresponding to the current probe count.

Fig. 3a is a schematic circuit diagram of a first part of a main control MCU module of a gamma probe tube testing system according to AN embodiment of the present utility model, where a main control MCU chip U1A is AN FPGA chip with a model XC3S200AN-4FTG256C, in fig. 3a, a D5 pin of the main control MCU chip U1A is connected to a 68 ohm resistor R5, the resistor R5 is connected to a power vcc_3p3, and the pin A4 is connected to a RESET circuit through a network label RESET, and is connected to AN IIC bus peripheral through network labels iic_scl and iic_sda; the main control MCU chip U1A is connected with the ADC data acquisition circuit through pins B12, A14, A13, B15, B14 and C13; the main control MCU chip U1A is connected with a power supply VCC_3P3 through pins B5, B9, B13 and E8.

Fig. 3B is a schematic circuit diagram of a second part of a main control MCU module of a gamma probe test system according to an embodiment of the present utility model, in fig. 3B, a main control MCU chip U1B is connected to a power source vcc_3p3 through pins E15, H12, J15, N15, connected to a probe connection interface through pins N14, P15, M16, L14, and collects count information of a gamma probe connected thereto through pins N14, P15, M16, L14; the main control MCU chip U1B is connected with the temperature sensing interface through a pin J16, a pin K16, a pin H14, a pin J14, a pin H16 and a pin H15. The main control MCU chip U1B is connected with the USB interface through a pin C15 and a pin C16, and is connected with the ADC data acquisition circuit through an E14, a D15 and a D16.

The control device comprises a main control MCU module, a probe tube power interface, a probe tube connecting interface, a probe tube power acquisition circuit, a temperature sensing circuit and a USB interface; the main control MCU module starts a power supply to supply power to the gamma probe after receiving a power supply start instruction sent by the main control MCU module, and the gamma probe starts to acquire gamma photon information after being electrified. According to the utility model, the gamma photon quantity is counted only after the gamma probe receives the instruction of the main control MCU module, so that the working condition of the gamma probe in the underground is met, and the accuracy of the gamma probe is improved.

Furthermore, the control device of the utility model also comprises a probe power supply acquisition circuit which is also connected with the probe power supply interface and used for acquiring the voltage and current information of the probe in real time; the temperature sensing circuit is also connected with the temperature sensor and used for collecting the real-time temperature of the probe environment box so as to judge the temperature information corresponding to the current probe counting information. Because gamma photons do not need to be detected when the underground shallow layer is formed, gamma photons are detected when the underground shallow layer is formed, the gamma probe tube starts to detect gamma photon information after receiving a power-on instruction of the main control MCU module, and on the basis of meeting the test of the gamma probe tube, the requirement scene of the underground work of the gamma probe tube is simulated, electric energy is saved, and the detection efficiency is improved.

The detecting tube power supply acquisition circuit comprises a voltage and current detection amplifying circuit, an analog-to-digital conversion circuit and an ADC data acquisition circuit which are sequentially connected, wherein the ADC data acquisition circuit is also connected with the main control MCU module, and the voltage and current detection amplifying circuit is also connected with the detecting tube power supply interface; the voltage and current detection amplifying circuit is used for amplifying the acquired voltage or current signals and then transmitting the amplified voltage or current signals to the analog-to-digital conversion circuit, the analog-to-digital conversion circuit converts the analog voltage or current signals into digital signals, the analog-to-digital conversion circuit transmits the converted digital signals to the data acquisition circuit and then transmits the converted digital signals to the main control MCU module, and the main control MCU module transmits the received digital signals to the upper computer for storage, processing and display.

Fig. 4 is a schematic circuit diagram of a temperature sensing circuit of a gamma probe testing system according to an embodiment of the present utility model, where the temperature sensing circuit includes: analog-to-digital conversion chip U10, sensor interface U11, resistor R22, resistor R23, resistor R24, resistor R25, resistor R26, resistor R27, resistor R28, and resistor R29; capacitor C29, capacitor C30, and capacitor C31. The pin 1 of the analog-to-digital conversion chip U10 is connected with one end of the resistor R22, and the other end of the resistor R22 is connected with the main control MCU chip U1B; one end of the capacitor C29 is connected with the analog-digital conversion chip U10, and the other end of the capacitor C is grounded; one end of the capacitor C30 is grounded, and the other end of the capacitor C is connected with the pin 3 of the analog-digital conversion chip U10; one end of the resistor R23 is connected with VCC_3P3, and the other end is connected with the pin 3 of the analog-digital conversion chip U10; one end of the resistor R25 is connected with the pin 4 of the analog-to-digital conversion chip U10, and the other end of the resistor R25 is connected with the resistor R28; pin 5 and pin 4 of the analog-to-digital conversion chip U10 are in short circuit, and pin 6 and pin 7 are in short circuit; the pin 8 of the analog-to-digital conversion chip U10 is in short circuit with the pin 9, the pin 8 is connected with the pin 3 of the sensor interface U11, the pin 10 of the analog-to-digital conversion chip U10 is connected with the pin 2 of the sensor interface U11, and the pin 11 of the analog-to-digital conversion chip U10 is connected with the pin 1 of the sensor interface U11; the pin 11 and the pin 12 of the analog-to-digital conversion chip U10 are in short circuit, one end of the capacitor C31 is connected with the pin 10 of the U10, and the other end is connected with the pin 11 of the U11; the pin 13 and the pin 18 of the U11 are grounded, one end of the resistor R24 is connected with the pin 17 of the U10, the other end of the resistor R24 is connected with the pin K16 of the main control MCU chip U1B, one end of the resistor R26 is connected with the pin 16 of the U10, the other end of the resistor R26 is connected with the pin J14 of the main control MCU chip U1B, one end of the resistor R27 is connected with the pin 15 of the U10, and the other end of the resistor R27 is connected with the pin J16 of the main control MCU chip U1B; one end of the resistor R29 is connected with the pin 14 of the analog-to-digital conversion chip U10, and the other end of the resistor R is connected with the pin H15 of the main control MCU chip U1B; the pin 19 of the analog-digital conversion chip U10 is grounded.

Referring to fig. 5, fig. 5 is a schematic circuit diagram of a probe power switch and a voltage and current detection amplifying circuit of a gamma probe testing system according to an embodiment of the present utility model, where the probe power switch and the voltage and current detection circuit include a probe power switch circuit and a voltage and current detection circuit, and the probe power switch circuit includes: p-channel field effect transistor U36, resistor R88, resistor R89, resistor R90, resistor R91, resistor R92, resistor R94, triode Q7; the resistor R88 and the resistor R89 are connected in parallel, and one end of the resistor R88 is simultaneously connected with the pin 5, the pin 6, the pin 7 and the pin 8 of the P-channel field effect transistor U36; the other end is connected with a power interface of the probe tube; pin 1, pin 2 and pin 3 of P channel field effect tube U36 are short circuited, and pin 1, pin 2 and pin 3 all connect VCC_24V, the one end of resistance R92 termination P channel field effect tube U36's pin 4, the other end termination P channel field effect tube U36's pin 1, the one end of resistance R90 connects the switch control pin of master control MCU chip, the other end termination triode Q7's base, the one end termination of resistance R94 triode Q7's collecting electrode, the other end termination P channel field effect tube U36's pin 4, the one end termination of resistance R91 triode Q7's projecting pole, the other end termination triode Q7's base. When the switch control pin of the main control MCU chip is set at a high level, the triode is conducted, the pin 4 of the P-channel field effect transistor U36 is conducted, the drain electrode is conducted, and voltage meeting the requirement is output to supply power for the probe.

The voltage-current detection amplifying circuit includes: amplifying chip U39, resistor R93, resistor R97, capacitor C74, capacitor C75, capacitor C76, capacitor C77 and diode D10; the pin 1 of the amplifying chip U39 is connected with the probe power interface, the pin 2 of the amplifying chip U39 is short-circuited with the pin 3 and grounded, the pin 8 of the amplifying chip U39 is connected with the pin 8 of the P-channel field effect transistor U36, the pin 7 of the amplifying chip U39 is grounded, one end of the capacitor C76 is grounded, the other end of the capacitor C76 is connected with the pin 6 of the amplifying chip U39, and the capacitor C77 is connected with the capacitor C76 in parallel; the pin 5 of the amplifying chip U39 is connected with a current detection channel of the analog-to-digital conversion circuit; one end of the resistor R93 is connected with the resistor R89, the other end of the resistor R93 is connected with the resistor R97, and the capacitor C74 is connected with the resistor R93 in parallel; one end of the resistor R97 is connected with the resistor R93, the other end of the resistor R97 is grounded, and the capacitor C75 is connected with the resistor R97; the voltage detection channel of the analog-to-digital conversion circuit is connected between the resistor R94 and the resistor R97.

In an optional implementation manner of the embodiment of the present utility model, the control device further includes an indicator light, where the indicator light includes a communication indicator light, a power indicator light, a probe power indicator light, and a probe count indicator light; the probe tube power interface is connected with a probe tube power indicator lamp, and the probe tube counting indicator lamp is connected with the probe tube counting indicator lamp; the detecting tube power supply indicator lamp is used for indicating whether the detecting tube power supply is connected normally or not, the detecting tube counting indicator lamp is used for indicating whether the detecting tube output is normal or not, the communication indicator lamp is used for indicating whether communication between the upper computer and the control device is normal or not, and the power supply indicator lamp is connected with the main control MCU module and used for indicating the power-on state of the power supply of the control device.

In an optional implementation manner of the embodiment of the utility model, the control device further comprises an alarm, the alarm is connected with the main control MCU module, the main control MCU module collects voltage or current information collected by the probe power collection circuit and sends the voltage or current information to the upper computer, and when the upper computer judges that the voltage or current information is abnormal, a control instruction is sent to the main control MCU module, and the main control MCU module controls the alarm to alarm.

While the utility model has been described in detail in the foregoing general description and specific examples, it will be apparent to those skilled in the art that modifications and improvements can be made thereto. Accordingly, such modifications or improvements may be made without departing from the spirit of the utility model and are intended to be within the scope of the utility model as claimed.

Claims

1. A gamma probe testing system, comprising: the upper computer, the control device and the probe environment box; the probe environment box comprises: vibration and fixation tools, a heating device and a temperature sensor; the upper computer is in communication connection with the control device, the control device is electrically connected with the gamma probe, and the temperature sensor is electrically connected with the control device;

the vibration and fixation tool comprises a fixation channel for fixing the gamma probe and providing a vibration test environment for the gamma probe; the heating device is used for providing a high-temperature test environment for the gamma probe in the probe environment box; the control device is used for receiving a control instruction sent by the upper computer, controlling the power supply to supply power to the gamma probe tube fixed in the probe tube environment box, and simultaneously collecting the counting information of the gamma probe tube and the temperature information of the current probe tube environment box collected by the temperature sensor, and returning the counting information and the temperature information to the upper computer; the upper computer is used for sending a control instruction to the control device, receiving counting information and temperature information of the gamma probe sent by the control device, and displaying the counting information and the temperature information on the display screen in a visual mode.

2. The gamma probe testing system of claim 1, wherein the fixed channels comprise a plurality of fixed channels, each fixed channel securing one of the gamma probes.

3. The gamma probe testing system according to claim 1, wherein the control device comprises a main control MCU module, a probe power interface, a probe connection interface, a probe power acquisition circuit, a temperature sensing circuit, and a USB interface; the probe tube connecting interface, the probe tube power interface, the temperature sensing circuit, the probe tube power acquisition circuit and the USB interface are respectively connected with the main control MCU module; the probe connecting interface is connected with a plurality of gamma probes and is used for collecting counting information of the gamma probes; the power interface of the probe tube is connected with an external power supply and is used for starting the power supply to supply power for the probe tube after receiving a power-on instruction sent by the main control MCU module; the probe power supply acquisition circuit is also connected with the probe power supply interface and is used for acquiring voltage and current information of the probe in real time; the temperature sensing circuit is also connected with the temperature sensor and used for collecting real-time temperature information of the probe tube environment box.

4. A gamma probe testing system according to claim 3, wherein the probe power acquisition circuit comprises: the voltage and current detection amplifying circuit, the analog-to-digital conversion circuit and the data acquisition circuit are connected in sequence, the data acquisition circuit is also connected with the main control MCU module, and the voltage and current detection amplifying circuit is also connected with the probe power interface; the voltage and current detection amplifying circuit is used for amplifying the acquired voltage or current signals and then transmitting the amplified voltage or current signals to the analog-to-digital conversion circuit, the analog-to-digital conversion circuit converts the analog voltage or current signals into digital signals, the analog-to-digital conversion circuit transmits the converted digital signals to the data acquisition circuit and then transmits the converted digital signals to the main control MCU module, and the main control MCU module transmits the received digital signals to the upper computer for storage, processing and display.

5. A gamma probe testing system according to claim 3, wherein the control device further comprises: the device comprises a communication indicator lamp, a power indicator lamp, a probe power indicator lamp and a probe counting indicator lamp; the probe tube power interface is connected with a probe tube power indicator lamp, and the probe tube counting indicator lamp is connected with the probe tube counting indicator lamp; the detecting tube power supply indicator lamp is used for indicating whether the detecting tube power supply is connected normally or not, the detecting tube counting indicator lamp is used for indicating whether the detecting tube output is normal or not, the communication indicator lamp is used for indicating whether communication between the upper computer and the control device is normal or not, and the power supply indicator lamp is connected with the main control MCU module and used for indicating the power-on state of the power supply of the control device.

6. A gamma probe testing system according to claim 3, wherein the control device further comprises: the alarm is connected with the main control MCU module, the main control MCU module is used for collecting voltage or current information collected by the probe tube power supply collecting circuit and sending the voltage or current information to the upper computer, and when the upper computer receives an instruction that the upper computer judges that the voltage or current information is abnormal, the alarm is controlled to alarm.

7. The gamma probe testing system of claim 3, wherein the probe power acquisition circuit further comprises a probe power switching circuit; and the probe tube power supply switch circuit is respectively connected with the main control MCU module and the probe tube power supply interface.