CN218917521U - Electromagnetic near-field diagnosis system - Google Patents
Electromagnetic near-field diagnosis system Download PDFInfo
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- CN218917521U CN218917521U CN202222830544.3U CN202222830544U CN218917521U CN 218917521 U CN218917521 U CN 218917521U CN 202222830544 U CN202222830544 U CN 202222830544U CN 218917521 U CN218917521 U CN 218917521U
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Abstract
The utility model discloses an electromagnetic near-field diagnosis system, and belongs to the technical field of antenna near-field diagnosis equipment. The device comprises an upper computer, a mechanical arm shaft, an electromagnetic measuring probe, a receiver, a controller, a micrometer, a camera and a piece to be measured; the micrometer, the camera and the electromagnetic measuring probe are arranged at the tail end of the mechanical arm shaft, the electromagnetic measuring probe is connected with the receiver, the control end of the mechanical arm shaft and the signal transmission ends of the micrometer, the camera and the receiver are connected with the upper computer; the piece to be measured is located directly under the electromagnetic measuring probe. The system integrates the multi-component probe, improves the scanning efficiency, can test the radiation field information of the passive device and the active device, including amplitude information and phase information, and meets various test requirements; the distance from the electromagnetic measuring probe to the surface of the to-be-measured piece is calculated by utilizing the micrometer, the information of the radiation fields at different heights can be accurately measured, and the electromagnetic interference source is positioned by scanning the electromagnetic field leaked or radiated by the electronic equipment, so that a reference is provided for the rectification of the electromagnetic interference.
Description
Technical Field
The utility model relates to the technical field of antenna near field diagnostic equipment, in particular to an electromagnetic near field diagnostic device.
Background
With the rapid development of the front-edge application fields such as 5G and 6G communication, intelligent driving, smart phones, high-performance computing and the like, the integration level of the circuit is higher and higher, and the internal clock frequency and the conversion rate are faster and higher. The problem of electromagnetic interference (EMI) is further increased, and even the electronic products cannot work, thereby influencing the time to market of the products. At low frequencies, the structure, packaging, of the circuit is small compared to the wavelength and does not radiate the electromagnetic field efficiently. However, in high-speed and high-frequency systems, the size of the antenna can be compared with the harmonic wavelength of the clock frequency, and the antenna becomes an unexpected antenna, so that the problem of EMI can often occur, and electromagnetic interference can be directly conducted to a circuit board through a signal pin or a power pin, and can also be coupled through a radiated electric field or a radiated magnetic field.
The near field scanning system utilizes an electric field probe and a magnetic field probe to point-by-point detect electromagnetic fields radiated by devices such as wireless communication terminals, integrated circuits, automobile electronics, chips, displays and the like and products of the whole machine, and obtains relative values or absolute values of the electric field and the magnetic field of a corresponding test area so as to analyze electromagnetic radiation interference conditions, and can rapidly locate and analyze interference sources on a piece to be tested, thereby becoming a powerful tool for electromagnetic interference rectification. EMI near field scanning has now become part of the international IEC 61967 standard.
The electric/magnetic probe is a key component of the near field scanning technology, most of the existing probes are single component probes, only one electric and magnetic field component can be detected, the speed is low, and the mechanical positioning error is caused by replacing/rotating the probes. On the other hand, most of the existing scanning platforms work in a single mode, namely, only the spectrometer is connected to test the radiation field amplitude of the to-be-tested piece, the functions are single, and all electromagnetic diagnosis requirements, such as a scene of testing the radiation field phase of the to-be-tested piece and an antenna test scene, cannot be met.
Disclosure of Invention
In order to overcome the defects of the prior art, the utility model provides an electromagnetic near-field diagnosis system, which is used for positioning an electromagnetic interference source by scanning an electromagnetic field leaked or radiated by electronic equipment and providing reference for the rectification of electromagnetic interference.
The technical scheme adopted by the utility model is as follows:
an electromagnetic near-field diagnosis system comprises an upper computer, a mechanical arm shaft, an electromagnetic measurement probe, a receiver, a controller, a micrometer, a clamp, a camera and a piece to be tested;
the micrometer and the camera are arranged at the tail end of the mechanical arm shaft through the clamp, the electromagnetic measuring probe is arranged at the bottom of the micrometer, the signal transmission end of the electromagnetic measuring probe is connected with the receiver, and the control end of the mechanical arm shaft, and the signal transmission ends of the micrometer, the camera and the receiver are connected with the upper computer; the to-be-measured piece is positioned right below the electromagnetic measuring probe and is an active device or a passive device;
the clamp is used for connecting the mechanical arm, the camera, the micrometer and the electromagnetic measuring probe, the camera is used for positioning the scanning area, the micrometer is used for calculating the distance from the electromagnetic measuring probe to the surface of the piece to be measured, and the electromagnetic measuring probe is a multi-component probe.
Preferably, the receiver is a spectrometer; the electromagnetic near field diagnostic system also comprises a signal source, wherein the signal source is used for connecting a passive device and providing external excitation for the passive device.
Preferably, the electromagnetic near-field diagnosis system further comprises a reference probe, wherein the reference probe is fixed beside the to-be-detected piece.
Preferably, the receiver is a vector network analyzer, the electromagnetic measurement probe is connected with a first signal port of the vector network analyzer, and the part to be measured or the reference probe is connected with a second signal port of the vector network analyzer.
The electromagnetic near-field diagnosis system provided by the utility model integrates the multi-component probe, improves the scanning efficiency, can test the radiation field information of the passive device and the active device, including amplitude information and phase information, and meets various test requirements; the distance from the electromagnetic measuring probe to the surface of the to-be-measured piece is calculated by using the micrometer, so that the radiation field information at different heights can be accurately measured.
Drawings
Fig. 1 is a schematic diagram of the structure of an electromagnetic near field diagnostic system.
Fig. 2 illustrates four modes of operation of the electromagnetic near field diagnostic system.
Fig. 3 is a workflow of an electromagnetic near field diagnostic system.
Fig. 4 calculates the scanning height Z of the electromagnetic probe using a micrometer. Left: the probe contacts the piece to be measured, right: the probe is raised to a scanning height.
FIG. 5 shows a tangential magnetic field profile obtained by scanning 2mm above the SiP. Left: 6GHz, right: 20GHz.
Detailed Description
The utility model is further described below with reference to the drawings.
As shown in fig. 1, the near field diagnosis system provided by the utility model comprises a host computer, a mechanical arm shaft, an electromagnetic measurement probe, a receiver, a controller, a micrometer, a clamp, a camera and a piece to be measured;
the clamp is connected to the shaft of the mechanical arm, the camera is connected to the middle part of the clamp, and the camera data line is connected with the upper computer; the micrometer is arranged at the tail end of the mechanical arm shaft through a clamp, the electromagnetic measuring probe is arranged at the bottom of the micrometer, the electromagnetic measuring probe and the signal transmission end of the micrometer are connected with the receiver through a cable, and the control end of the mechanical arm shaft and the signal transmission end of the receiver are connected with the upper computer; the to-be-measured piece is positioned right below the electromagnetic measuring probe and is an active device or a passive device;
the clamp is used for connecting the mechanical arm, the camera, the micrometer and the electromagnetic measuring probe, the camera is used for positioning the scanning area, the micrometer is used for calculating the distance from the electromagnetic measuring probe to the surface of the piece to be measured, and the electromagnetic measuring probe is a multi-component probe.
The main function of the receiver is to receive the detection signal of the test probe, and in one implementation of the utility model, the receiver can use a spectrometer for testing the amplitude information of the radiation field. For example, as shown in fig. 2 (a), when the amplitude of a radiation field of a passive device under external excitation is tested, the electromagnetic near-field diagnostic system connects the passive device through a signal source (signal generator) to provide external excitation for the passive device, and the test mode can be used to test shielding effectiveness of an electronic package, etc.
As shown in fig. 2 (b), when the radiation field amplitude of the active device is tested, no external excitation is required to be provided for the to-be-tested device, no external signal source is required to be connected at this time, and the test mode can be used for testing the radiation of the mobile phone camera module and the like.
In another embodiment of the utility model, the receiver may employ a vector network analyzer for simultaneously testing amplitude information and phase information of the radiation field. For example, as shown in fig. 2 (c), when testing the amplitude and phase information of the radiation field of the passive device under the external excitation, the electromagnetic measurement probe is connected to the first signal port of the vector network analyzer, the part to be tested is connected to the second signal port of the vector network analyzer, the external excitation of the part to be tested is provided by the vector network analyzer, and the test mode can be used for testing the radiation near field of the antenna/antenna array. As shown in fig. 2 (d), the amplitude and phase information of the radiation field of the active device are tested, a reference probe is arranged on one side of the to-be-tested device, the electromagnetic measurement probe is connected with a first signal port of the vector network analyzer, the reference probe is connected with a second signal port of the vector network analyzer, the amplitude of the radiation field is represented by the wave quantity measured by the first signal port of the vector network analyzer, and the phase of the radiation field is represented by the wave quantity phase difference of the first signal port and the second signal port of the vector network analyzer, such as testing the phase of the radiation field of an unknown source.
From the above four requirements of near field scanning, the electromagnetic near field diagnostic system provided by the utility model can meet various testing requirements, and the electromagnetic near field diagnostic system can be divided into various measurement modes:
measurement mode 1: under the condition that the to-be-measured piece does not have an excitation source, a signal source is required to provide an excitation signal for the to-be-measured piece, and a frequency spectrograph is adopted by the receiver. This is referred to as the "spectrometer + source" mode.
Measurement mode 2: under the condition that the to-be-detected piece has an excitation source, the receiving instrument adopts a frequency spectrograph. This time referred to as Shan Pinpu gauge mode.
Measurement mode 3: when the scattering parameter or wave quantity of the to-be-measured piece needs to be measured, the receiver adopts a vector network analyzer. This time referred to as the vector network measurement mode.
The workflow of the near field diagnostic system proposed by the present utility model is shown in fig. 3.
The preparation stage: the device is connected with an upper computer, a mechanical arm, an electromagnetic measuring probe, a receiver, a controller, a micrometer, a clamp, a camera and a piece to be measured according to the test requirement, and a measuring mode is set.
Mechanical calibration stage: the method comprises the steps of calibrating the rotation error of the probe, and calibrating the relative distance between the center of the camera and the center of the probe;
the probe rotation error calibration refers to the rotation of an electromagnetic measurement probe by 90 percent 0 The center point of the probe section is then offset from the center of the mechanical arm shaft, which is calculated and rotated 90 each time the electromagnetic measuring probe rotates 0 And then performing displacement compensation.
The calibration of the relative distance between the center of the camera and the center of the probe refers to calculating the relative distance between the center of the camera and the center of the detection part of the probe, so that after a scanning area is defined in a photo taken by the camera, the detection part of the probe can be controlled to move to a correct scanning position.
Scanning: setting the surface of the piece to be detected as Z=0, acquiring the actual length corresponding to the unit pixel, determining a scanning area according to camera shooting, setting an XY scanning range, starting scanning and saving the reading of the receiver.
In this embodiment, a micrometer is used to calculate the scan height Z of the electromagnetic probe. As shown in FIG. 4, the mechanical arm shaft moves downwards to enable the bottom of the probe to contact the to-be-detected piece, at the moment, the reading Z1 of the micrometer is recorded, and then the vertical coordinate Z2+Z1+ of the mechanical arm shaft is controlled by the upper computer to control the height Z3 from the self-defined electromagnetic probe to the surface of the to-be-detected piece to serve as the Z coordinate during scanning.
In this embodiment, the multi-component probe is used to improve the scanning efficiency. Before the multicomponent probe is mounted to the robotic arm, electromagnetic calibration is required. For example, a matched microstrip line is used as a calibration piece, a multi-component probe is vertically arranged at a position 1mm above the microstrip line, and a field generated by the microstrip line generates induced voltage at a terminal of the probe. For the three-component probe for simultaneously measuring Ez, hx and Hy, respectively defining the calibration factors of Ez, hx and Hy as the ratio of the radiation field values Ez, hx and Hy of the microstrip line at the electric center of the probe obtained by simulation to the induction voltages at the three ports of the probe obtained by measurement. Of course, the person skilled in the art can also replace the multi-component probe with a single-component probe according to actual requirements, and for the single-component probe, the calibration factor is defined as the ratio of the radiation field value E/H of the microstrip line at the electric center of the probe obtained through simulation to the induction voltage of the probe obtained through measurement.
The test results of the system are demonstrated below by taking the leakage field of the test System In Package (SiP) as an example. The SiP is soldered to the PCB via an array of solder balls, and a radiation source is provided within the SiP, to which external stimulus is connected in turn via the SMA connector and traces in the PCB. In the test, a signal source is adopted to provide excitation for a radiation source of the SiP, and a probe is connected with a spectrometer to test the amplitude of a radiation field, so that the working mode 1 is adopted. During testing, the probe scans within the range of 20mm x 20mm on a plane 2mm above the SiP to be tested, and tangential magnetic fields Hx and Hy are tested simultaneously by adopting the dual-component probe. FIG. 5 is a tangential magnetic field at a height of 2mm above a SiP obtained by near field scanning
The left and right of the distribution diagram are the field distribution diagrams under the condition that the excitation frequency of the signal source is 6GHz and 20GHz respectively. The field distribution of the scanning range can be accurately obtained through near field scanning, obvious field hot spots exist below the SiP, the radiation of the area is strong, and the graphical display is beneficial to further electromagnetic interference correction.
The foregoing list is only illustrative of specific embodiments of the utility model. Obviously, the utility model is not limited to the above embodiments, but many variations are possible. All modifications directly derived or suggested to one skilled in the art from the present disclosure should be considered as being within the scope of the present utility model.
Claims (5)
1. An electromagnetic near-field diagnosis system is characterized by comprising an upper computer, a mechanical arm shaft, an electromagnetic measurement probe, a receiver, a controller, a micrometer, a clamp, a camera and a piece to be tested;
the micrometer and the camera are arranged at the tail end of the mechanical arm shaft through the clamp, the electromagnetic measuring probe is arranged at the bottom of the micrometer, the signal transmission end of the electromagnetic measuring probe is connected with the receiver, and the control end of the mechanical arm shaft, and the signal transmission ends of the micrometer, the camera and the receiver are connected with the upper computer; the to-be-measured piece is positioned right below the electromagnetic measuring probe and is an active device or a passive device;
the clamp is used for connecting the mechanical arm, the camera, the micrometer and the electromagnetic measuring probe, the camera is used for positioning the scanning area, the micrometer is used for calculating the distance from the electromagnetic measuring probe to the surface of the piece to be measured, and the electromagnetic measuring probe is a multi-component probe.
2. An electromagnetic near field diagnostic system as claimed in claim 1 wherein said receiver is a spectrometer.
3. The electromagnetic near field diagnostic system of claim 2, further comprising a signal source, wherein the signal source is configured to couple to a passive device to provide external excitation to the passive device.
4. The electromagnetic near field diagnostic system of claim 1, further comprising a reference probe, the reference probe being fixed beside the test piece.
5. An electromagnetic near field diagnostic system as claimed in claim 1 or 4, wherein said receiver is a vector network analyzer, said electromagnetic measurement probe is connected to a first signal port of the vector network analyzer, and the part under test or reference probe is connected to a second signal port of the vector network analyzer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222830544.3U CN218917521U (en) | 2022-10-26 | 2022-10-26 | Electromagnetic near-field diagnosis system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222830544.3U CN218917521U (en) | 2022-10-26 | 2022-10-26 | Electromagnetic near-field diagnosis system |
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| Publication Number | Publication Date |
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| CN218917521U true CN218917521U (en) | 2023-04-25 |
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| CN202222830544.3U Active CN218917521U (en) | 2022-10-26 | 2022-10-26 | Electromagnetic near-field diagnosis system |
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