CN218885974U

CN218885974U - Pressed block

Info

Publication number: CN218885974U
Application number: CN202222731651.0U
Authority: CN
Inventors: 周秋香; 万克壮
Original assignee: Prosystems Electronic Technology Co ltd
Current assignee: Prosystems Electronic Technology Co ltd
Priority date: 2022-10-17
Filing date: 2022-10-17
Publication date: 2023-04-18
Anticipated expiration: 2032-10-17

Abstract

The utility model discloses a briquetting, including base and upper cover, the base with the upper cover can fix the connection and form briquetting main body frame, be equipped with test module in the briquetting main body frame, test module includes double-end probe and circuit board, the one end of double-end probe connect in the circuit board, the other end of double-end probe can be used to detect the material, the upper cover all is equipped with a plurality of locating holes with the base, the locating hole can play the positioning action when connecting outside test fixture, and this briquetting can improve the accuracy nature of test fixture location, can reduce the loss of probe and protect the test material.

Description

Pressed block

Technical Field

The utility model relates to an integrated circuit tests technical field, especially relates to a briquetting.

Background

The PCBA test refers to the detection of electrical conductivity and input and output numerical values of the PCBA circuit board mounted with the electronic components. The production mode of the existing PCBA test fixture is that a manual quick clamp is used for performing vertical press fit test, or an upper needle plate test fixture and a lower needle plate test fixture pressed by a cylinder are integrated in automatic equipment, but the test fixture is easy to generate errors in positioning, so that test probes are damaged or test materials are crushed.

SUMMERY OF THE UTILITY MODEL

In order to overcome the defects of the prior art, the utility model provides a pressing block, this pressing block can improve the accuracy nature of test fixture location, can reduce the loss of probe and protect the test material.

The utility model provides a technical scheme that its technical problem adopted is:

the utility model provides a briquetting, includes base and upper cover, the base with the upper cover is fixed connection and is formed briquetting main body frame, be equipped with test module in the briquetting main body frame, test module includes double-end probe and circuit board, the one end of double-end probe connect in the circuit board, the other end of double-end probe can be used to detect the material, the upper cover all is equipped with a plurality of locating holes with the base, the locating hole can play the positioning action when connecting outside test fixture.

As a further improvement of the above scheme, the base and the upper cover are fixedly connected through screws.

As a further improvement of the scheme, the periphery of the screw is sleeved with a first buffer spring.

As a further improvement of the scheme, the middle part of the base is provided with a hollow structure, and one end of the double-ended probe, which is used for detecting the material, can be in contact with the detected material through the hollow structure.

As a further improvement of the scheme, the upper cover is provided with a first positioning hole, a second positioning hole and a third positioning hole, and the three positioning holes can play a positioning role when being connected with an external test fixture.

As a further improvement of the above scheme, fourth positioning holes are arranged on two sides of the base, and the fourth positioning holes can play a positioning role when being connected with an external test fixture.

As a further improvement of the above solution, the test module further includes a fixed plate and a floating plate, the fixed plate includes a fixed upper plate and a fixed lower plate, the fixed upper plate is provided with a plurality of first through holes, the fixed lower plate is provided with a plurality of second through holes, one end of the dual-headed probe can penetrate through the first through holes and is connected to the circuit board, and the other end of the dual-headed probe penetrates through the second through holes and is connected to the floating plate.

As a further improvement of the scheme, a plurality of buffer spring mounting positions are arranged on the floating plate, and second buffer springs are arranged on the buffer spring mounting positions.

As a further improvement of the above scheme, the test module includes a pin, a first pin hole is provided on the circuit board, a second pin hole is provided on the fixed upper plate, a third pin slot is provided on the base, and the pin penetrates through the first pin hole and the second pin hole and is fixed in the third pin slot to realize the fixed connection of the circuit board and the fixed upper plate on the base.

The utility model has the advantages that:

the utility model provides a briquetting, this briquetting can improve the accuracy nature of test fixture location, can reduce the loss of probe and protect the test material.

Drawings

The present invention will be further explained with reference to the drawings and examples.

FIG. 1 is a first angular assembly schematic of the present invention;

fig. 2 is a second angle assembly diagram of the present invention;

FIG. 3 is a cross-sectional view taken along line G-G of FIG. 2;

fig. 4 is a third angle assembly diagram of the present invention;

FIG. 5 is a cross-sectional view taken along line F-F of FIG. 4;

FIG. 6 is a structural exploded view of the present invention;

fig. 7 is an assembly schematic diagram of the present invention applied to a test fixture.

Detailed Description

The conception, the specific structure, and the technical effects produced by the present invention will be clearly and completely described below in conjunction with the embodiments and the accompanying drawings to fully understand the objects, the features, and the effects of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all embodiments, and other embodiments obtained by those skilled in the art without inventive labor based on the embodiments of the present invention all belong to the protection scope of the present invention. In addition, all the connection/connection relations referred to in the patent do not mean that the components are directly connected, but mean that a better connection structure can be formed by adding or reducing connection auxiliary components according to specific implementation conditions. The utility model discloses each technical feature in the creation can the interactive combination under the prerequisite that does not contradict conflict each other.

Referring to fig. 1 to 6, a compact 1 is used by being mounted on a test fixture 2. The briquetting includes base 17 and upper cover 11, base 17 and upper cover 11 form briquetting main body frame after passing through screw 116 fixed connection, establish to hollow structure 175 at the middle part of base 17, the junction of upper cover 11 and base 17 still is equipped with first buffer spring 163, screw 116 periphery is located to first buffer spring 163 cover, this first buffer spring can guarantee the good contact of probe and test material when upper cover 11 is connected with base 17, provide effectual pressure for the test, upper cover 11 is equipped with first locating hole 112, second locating hole 113 and third locating hole 114, the both sides of base 17 are equipped with two fourth locating holes 173, above-mentioned a plurality of locating holes can play the positioning action when this briquetting is applied to outside test fixture, can reduce the error and realize the accurate detection of probe to the test material, can guarantee simultaneously that the probe can well contact with the test material.

The pressing block is provided with a testing module, the testing module comprises a double-headed probe 14, a circuit board 12, a fixing plate and a floating plate 16, the fixing plate comprises a fixing upper plate 13 and a fixing lower plate 15, the fixing upper plate 13 is provided with a plurality of first through holes 133, one end of the double-headed probe 14 penetrates through the first through holes 133 and is connected to the circuit board 12, the circuit board 12 is connected with an external testing instrument through a cable 126, a detection signal of the double-headed probe 14 to a material can be transmitted to the external testing instrument through the cable 126, the testing module further comprises a pin 124, the circuit board 12 is provided with a first pin hole 122, the fixing upper plate 13 is provided with a second pin hole 131, the base 17 is provided with a third pin groove 174, the pin 124 sequentially penetrates through the first pin hole 121 and the second pin hole 131 and is arranged in the third pin groove 174 to fixedly connect the circuit board 12 and the fixed upper board 13 to the base 17, the fixed lower board 15 is provided with a plurality of second through holes 152, the other end of the double-ended probe 14 penetrates through the second through holes 152 and is connected to the floating board 16, the floating board 16 is provided with a plurality of third through holes 162, a plurality of second buffer spring installation positions 161 are arranged above the floating board 16, a second buffer spring 154 is arranged on each second buffer spring installation position 161, the second buffer spring 154 can play a role in buffering and protecting materials when the materials are tested, and meanwhile, the good contact of the probe detection end is ensured not to be damaged. After the positioning hole on the control briquetting carries out accurate location assembly with outside test fixture, the briquetting receives the power of pushing down, and the tip of double-end probe 14 can run through the third through-hole of floating plate 16 and test with the contact of test material, and floating plate 16 can play the effect of protection probe, reduces the loss of probe.

While the preferred embodiments of the present invention have been described, the present invention is not limited to the above embodiments, and those skilled in the art can make various equivalent modifications or substitutions without departing from the spirit of the present invention, and such equivalent modifications or substitutions are intended to be included within the scope of the present invention as defined by the appended claims.

Claims

1. A compact, characterized by: including base and upper cover, the base with the upper cover is fixed connection and is formed briquetting main body frame, be equipped with test module in the briquetting main body frame, test module includes double-end probe and circuit board, the one end of double-end probe connect in the circuit board, the other end of double-end probe can be used to detect the material, the upper cover all is equipped with a plurality of locating holes with the base, the locating hole can play the positioning action when connecting outside test fixture.

2. A compact according to claim 1, wherein: the base is fixedly connected with the upper cover through screws.

3. A compact according to claim 2, wherein: the periphery cover of screw is equipped with first buffer spring.

4. A compact according to claim 1, wherein: the middle part of the base is of a hollow structure, and one end of the double-ended probe, which is used for detecting materials, can be in contact with the detection materials through the hollow structure.

5. A compact according to claim 1, wherein: the upper cover is provided with a first positioning hole, a second positioning hole and a third positioning hole, and the three positioning holes can play a positioning role when being connected with an external test fixture.

6. A compact according to claim 1, wherein: and fourth positioning holes are formed in two sides of the base, and can play a role in positioning when the base is connected with an external test fixture.

7. A compact according to claim 1, wherein: the test module further comprises a fixed plate and a floating plate, the fixed plate comprises a fixed upper plate and a fixed lower plate, the fixed upper plate is provided with a plurality of first through holes, the fixed lower plate is provided with a plurality of second through holes, one end of the double-headed probe can penetrate through the first through holes and is connected to the circuit board, and the other end of the double-headed probe penetrates through the second through holes and is connected to the floating plate.

8. A compact according to claim 7, wherein: the floating plate is provided with a plurality of buffer spring installation positions, and the buffer spring installation positions are provided with second buffer springs.

9. A compact according to claim 7, wherein: the test module comprises a pin, a first pin hole is formed in the circuit board, a second pin hole is formed in the fixed upper plate, a third pin groove is formed in the base, and the pin penetrates through the first pin hole and the second pin hole and is fixed in the third pin groove to fixedly connect the circuit board and the fixed upper plate to the base.