CN218824402U

CN218824402U - Laser chip testing device with test tool structure

Info

Publication number: CN218824402U
Application number: CN202222850811.3U
Authority: CN
Inventors: 朱华; 杨惠婷; 黄兴
Original assignee: Wuxi Huachenxin Optical Semiconductor Technology Co ltd
Current assignee: Wuxi Huachenxin Optical Semiconductor Technology Co ltd
Priority date: 2022-10-28
Filing date: 2022-10-28
Publication date: 2023-04-07
Anticipated expiration: 2032-10-28

Abstract

The utility model provides a laser instrument chip testing arrangement with test fixture structure belongs to the chip field for the problem that the chip needs the one-by-one to detect has been solved, including examining test table and test fixture mechanism, examine test table and have a plurality of test groove, every the inslot is equipped with the platform of placing that is used for depositing the chip examine test table bottom and be fixed with the base station, the guide block of travelling slide rail is connected in test fixture mechanism, drives test fixture mechanism makes reciprocating motion, the utility model discloses the staff only needs to set up the procedure in advance, just can make two travelling slide rails and cylinder automatic operation, makes to detect the feeler lever and has the preface of transferring to detect the chip in proper order, and the staff just can carry out other work, just can carry out through observing detection data after the definite time, masters the chip production quality of same batch.

Description

Laser chip testing device with test tool structure

Technical Field

The utility model belongs to the chip field relates to the chip testing technique, specifically is a laser chip testing arrangement with test fixture structure.

Background

Along with the integrated trend that becomes of chip module integration, the module function trend is complicated, it is multi-functional, for example, SIP module etc., when producing in the workshop now, need take out the volume inspection to the chip, thereby judge whether the chip of this batch of production satisfies the demand of performance and quality, the inspection mode to the chip is for adopting the mode of connecing the electricity, go to judge whether the circuit of chip inside is qualified, adopt the mode that detects the feeler lever for this reason, electrically conduct to internal chip, see whether form the return circuit, detect, and the workshop detects now, it places the chip of different grade type on detecting the platform to need the staff, carry out the detection one by one, need a large amount of manpower auxiliarily, cause manpower resources's waste for this reason, it constantly operates to need the staff to detect the platform side, consuming time and consuming effort. Therefore, the laser chip testing device with the testing tool structure is provided.

Disclosure of Invention

The utility model aims at providing a laser instrument chip testing arrangement with test fixture structure to solve the problem of proposing among the above-mentioned background art.

The purpose of the utility model can be realized by the following technical scheme:

a laser chip testing device with a testing tool structure comprises a detection table and a testing tool mechanism, wherein the detection table is provided with a plurality of test slots, a placing table for storing chips is arranged in each test slot, a bottom table is fixed at the bottom of the detection table, a moving mechanism is arranged in the bottom table and drives each placing table to synchronously lift, a moving slide rail is arranged in the middle of the detection table, and a guide block of the moving slide rail is connected to the testing tool mechanism and drives the testing tool mechanism to do reciprocating motion;

the test tool mechanism comprises a Y-shaped rod, the side wall of the Y-shaped rod is fixedly connected with the guide block of the movable slide rail, the transverse rod of the Y-shaped rod extends to the position right above the two sides of the detection table, the transverse rod of the Y-shaped rod is provided with a second movable slide rail, and the guide block of the second movable slide rail is provided with a detection contact rod matched with the chip and drives the detection contact rod to make reciprocating motion.

Preferably, the number of the test slots on two sides of the movable slide rail is equal, the guide block of the second movable slide rail is fixedly connected with a clamping piece, and an air cylinder is fixed on the inner wall of the clamping piece.

Preferably, the end part of the piston rod of the cylinder is fixedly connected with a detection contact rod, and the piston rod of the cylinder stretches and retracts to drive the detection contact rod to contact with the chip so as to detect the chip.

Preferably, the moving mechanism comprises a motor, a cavity is formed in the bottom table in a hollow mode, and the motor is fixed in the cavity through a fixing support.

Preferably, an output shaft of the motor is fixedly connected with a screw rod, and the screw rod penetrates through a connecting part of the base platform and the detection platform and extends to the position above the movable sliding rail.

Preferably, the moving mechanism further comprises a bottom plate, the bottom of each placing table is integrally connected with the bottom plate through a fixing rod, a screw rod sleeve is arranged on the bottom plate and is in threaded connection with a screw rod, each fixing rod penetrates through the bottom wall of the test groove in a sliding mode, the bottom plate is arranged in a moving groove in the bottom of the detection table, and two sides of the bottom plate are connected in the moving groove in a sliding mode.

Compared with the prior art, the beneficial effects of the utility model are that:

the staff only needs to set up the procedure in advance, just can make two sliding rail and cylinder automatic operation, make the detection feeler lever have the preface of transferring to detect the chip in proper order, the staff just can carry out other work, just can go on after the definite time through observing the detection data, grasp the chip production quality of same batch, thereby avoided needing the staff to place the chip of different grade type on examining test table, carry out the one-by-one and detect, the effectual manpower resources that utilizes, need not the staff and examine test table side and operate constantly, time saving and labor saving.

To sum up, the utility model discloses can carry out automated inspection to the chip of different kinds of chips and large quantity, during the staff can take time out and drop into other work when detecting, liberated the manpower, saved manufacturing cost.

Drawings

In order to facilitate understanding for those skilled in the art, the present invention will be further described with reference to the accompanying drawings.

Fig. 1 is a schematic diagram of an overall structure of a laser chip testing device with a testing tool structure according to the present invention;

fig. 2 is a partially enlarged view of fig. 1 of the laser chip testing device with the testing tool structure according to the present invention;

fig. 3 is a perspective view of a lifting mechanism in a laser chip testing device with a testing tool structure according to the present invention;

FIG. 4 is a schematic diagram illustrating the connection between a fixing rod and a bottom plate of a laser chip testing apparatus with a testing tool structure according to the present invention;

in the figure: 1. a detection table; 2. a base table; 3. testing the tool mechanism; 301. a Y-shaped rod; 302. a second movable slide rail; 303. a clamping member; 304. a cylinder; 305. detecting a feeler lever; 4. moving the slide rail; 5. a test slot; 6. a moving mechanism; 601. a motor; 602. a fixed bracket; 603. a screw rod; 604. fixing the rod; 605. a base plate; 606. a screw rod sleeve; 7. and (6) placing the table.

Detailed Description

The technical solution of the present invention will be described clearly and completely with reference to the following embodiments, and it should be understood that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.

Referring to fig. 1-4, a laser chip testing device with a testing tool structure includes a testing table 1 and a testing tool mechanism 3, where the testing table 1 has a plurality of testing slots 5, each testing slot 5 is provided with a placing table 7 for placing a chip, the bottom of the testing table 1 is fixed with a base table 2, and a moving mechanism 6 is arranged inside the base table 2, firstly, a worker samples the chip to separate different types, and then starts a motor 601, and the rotation of a lead screw 603 and the cooperation of a lead screw sleeve 606 drive a bottom plate 605 to move along the inner wall of the moving slot, so as to drive the placing table 7 to move upwards and move to the position right above the testing slot 5, thereby facilitating the worker to place the chip on the placing table 7, and simultaneously place the testing table 7 in a rectangular distribution, and place different types of chips in different areas, thereby facilitating the worker to divide the chip. The moving mechanism 6 drives each placing table 7 to synchronously lift, a moving slide rail 4 is arranged in the middle of the detection table 1, and a guide block of the moving slide rail 4 is connected to the testing tool mechanism 3 to drive the testing tool mechanism 3 to reciprocate; the test tool mechanism 3 comprises a Y-shaped rod 301, the side wall of the Y-shaped rod 301 is fixedly connected with the guide blocks of the movable slide rail 4, the transverse rod of the Y-shaped rod 301 extends to the position right above the two sides of the detection table 1, the transverse rod of the Y-shaped rod 301 is provided with a second movable slide rail 302, and the guide blocks of the second movable slide rail 302 are provided with detection contact rods 305 matched with chips to drive the detection contact rods 305 to reciprocate.

In this embodiment, the number of the test slots 5 located on two sides of the movable slide rail 4 is equal, the guide block of the second movable slide rail 302 is fixedly connected with the clamping member 303, the inner wall of the clamping member 303 is fixed with the cylinder 304, the end part of the piston rod of the cylinder 304 is fixedly connected with the detection contact rod 305, the piston rod of the cylinder 304 stretches and retracts to drive the detection contact rod 305 to contact with the chip, chip detection is performed, the moving mechanism 6 includes the motor 601, the inside of the base 2 is hollow to form a cavity, the motor 601 is fixed in the cavity through the fixing support 602, the output shaft of the motor 601 is fixedly connected with the lead screw 603, the lead screw 603 passes through the connection part between the base 2 and the detection table 1 and extends to the top of the movable slide rail 4, the chip is fixed on the placement table 7, then the placement table 7 moves downwards, the detection contact rod 305Y-axis is driven to move through the movable slide rail 4, the detection contact rod 305X-axis is driven to move through the second movable slide rail 302, each detection contact rod 305 can detect the chip on the placement tables 7 in different areas, and the chip after a certain period of time, the detection data can be observed by the worker only needing to set in advance.

In this embodiment, the moving mechanism 6 further includes a bottom plate 605, the bottom of each placing table 7 is integrally connected with the bottom plate 605 through a fixing rod 604, a screw rod sleeve 606 is arranged on the bottom plate 605, the screw rod sleeve 606 is in threaded connection with the screw rod 603, each fixing rod 604 penetrates through the bottom wall of the test slot 5 in a sliding manner, the bottom plate 605 is arranged in the moving slot at the bottom of the detection table 1, and two sides of the bottom plate 605 are connected in the moving slot in a sliding manner.

The utility model discloses when specifically implementing: firstly, a worker samples chips, separates different types of chips, then starts a motor 601, drives a bottom plate 605 to move along the inner wall of a moving groove by the rotation of a screw 603 and the cooperation of a screw sleeve 606, so as to drive a placing table 7 to move upwards and directly above a test groove 5, so that the worker can place the chips on the placing table 7 conveniently, the placing table 7 is distributed in a rectangular shape, the different types of chips can be placed in different areas, the worker can divide the chips conveniently, fix the chips on the placing table 7, then move the placing table 7 downwards, drive a detection touch rod 305Y axis to move through a moving slide rail 4, drive a detection touch rod 305X axis to move through a second moving slide rail 4, make every detection feeler lever 305 all can detect the chip of placing on the platform 7 of different regions, the staff only needs to set up the procedure in advance, just can make two sliding rails and cylinder 304 automatic operation, make and detect feeler lever 305 and have the chip of accent preface and detect in proper order, the staff just can carry out other work, just can carry out through observing the detected data after the definite time, grasp the chip production quality of same batch, thereby avoided needing the staff to place the chip of different grade type on detecting platform 1, carry out the one-by-one detection, effectual utilization manpower resources, need not the staff and operate constantly by detecting platform 1, time saving and labor saving.

The preferred embodiments of the present invention disclosed above are intended only to help illustrate the present invention. The preferred embodiments are not exhaustive and do not limit the invention to the precise embodiments disclosed. Obviously, many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles of the invention and its practical applications, thereby enabling others skilled in the art to best understand the invention and its practical application. The present invention is limited only by the claims and their full scope and equivalents.

Claims

1. The laser chip testing device with the testing tool structure comprises a testing table (1) and a testing tool mechanism (3), wherein the testing table (1) is provided with a plurality of testing grooves (5), and each testing groove (5) is internally provided with a placing table (7) for storing chips, and the laser chip testing device is characterized in that a bottom table (2) is fixed at the bottom of the testing table (1), a moving mechanism (6) is arranged inside the bottom table (2), the moving mechanism (6) drives each placing table (7) to synchronously lift, a moving slide rail (4) is arranged in the middle of the testing table (1), and a guide block of the moving slide rail (4) is connected to the testing tool mechanism (3) to drive the testing tool mechanism (3) to reciprocate;

test fixture mechanism (3) are including Y type pole (301), the lateral wall of Y type pole (301) and the guide block fixed connection of sliding rail (4), the transverse bar of Y type pole (301) extends to and examines directly over the both sides of test table (1), the transverse bar of Y type pole (301) is provided with second sliding rail (302), the guide block of second sliding rail (302) be provided with chip complex detection feeler lever (305), drive detect feeler lever (305) and make reciprocating motion.

2. The laser chip testing device with the testing tool structure is characterized in that the number of the test slots (5) on two sides of the movable sliding rail (4) is equal, a clamping piece (303) is fixedly connected to a guide block of the second movable sliding rail (302), and a cylinder (304) is fixed to the inner wall of the clamping piece (303).

3. The laser chip testing device with the testing tool structure as claimed in claim 2, wherein a detection contact rod (305) is fixedly connected to an end portion of a piston rod of the air cylinder (304), and the piston rod of the air cylinder (304) stretches and retracts to drive the detection contact rod (305) to contact a chip, so that chip detection is performed.

4. The laser chip testing device with the test tool structure is characterized in that the moving mechanism (6) comprises a motor (601), a cavity is formed in the bottom table (2) in a hollow mode, and the motor (601) is fixed in the cavity through a fixing support (602).

5. The laser chip testing device with the testing tool structure as claimed in claim 4, wherein an output shaft of the motor (601) is fixedly connected with a lead screw (603), and the lead screw (603) penetrates through a connecting portion of the base platform (2) and the detection platform (1) and extends to a position above the movable sliding rail (4).

6. The laser chip testing device with the testing tool structure as claimed in claim 5, wherein the moving mechanism (6) further comprises a bottom plate (605), the bottom of each placing table (7) is integrally connected with the bottom plate (605) through a fixing rod (604), a screw rod sleeve (606) is arranged on the bottom plate (605), the screw rod sleeve (606) is in threaded connection with a screw rod (603), each fixing rod (604) penetrates through the bottom wall of the test slot (5) in a sliding manner, the bottom plate (605) is arranged in a moving groove in the bottom of the detection table (1), and two sides of the bottom plate (605) are connected in the moving groove in a sliding manner.