CN218788164U

CN218788164U - IVI testing device and testing system

Info

Publication number: CN218788164U
Application number: CN202223581272.4U
Authority: CN
Inventors: 毛积钧; 张敬锋; 刘明良
Original assignee: BDstar Intelligent and Connected Vehicle Technology Co Ltd
Current assignee: BDstar Intelligent and Connected Vehicle Technology Co Ltd
Priority date: 2022-12-30
Filing date: 2022-12-30
Publication date: 2023-04-04
Anticipated expiration: 2032-12-30

Abstract

The utility model discloses an IVI testing device and a testing system, wherein the IVI testing device comprises a power supply module, a control module, a switch module and a communication module; the power supply module is respectively connected with the control module and the communication module, the control module is respectively connected with the switch module and the communication module, and the communication module is also connected with a test module of the IVI test system; when the switch module is switched on, the control module controls the test module to test through the communication module. The utility model discloses operation when not only can simplifying the test has improved the convenience moreover.

Description

IVI testing device and testing system

Technical Field

The utility model relates to the field of automotive technology, especially, relate to an IVI testing arrangement and test system.

Background

The IVI (in-vehicle entertainment control system) is a vehicle-mounted integrated information processing system formed on the basis of a vehicle body main system and internet services, is used for coordinating and controlling the whole vehicle-mounted electronic control information entertainment equipment, and can improve the comfort and the safety of an automobile.

The performance of IVI product need be tested to the IVI product when the development to the IVI product, present test method generally tests through computer and relevant agreement analysis box, the computer passes through the agreement analysis box and is connected with the IVI product, issue corresponding instruction through the computer and test the IVI product, need input complicated instruction to realize simple test action when testing, the maloperation appears easily, simultaneously, need have the computer just can test, it is comparatively inconvenient.

SUMMERY OF THE UTILITY MODEL

The utility model provides a IVI testing arrangement and test system aims at solving the problem that maloperation appears easily and rely on the computer in present IVI product when the test.

In a first aspect, the present invention provides an IVI testing device, comprising a power supply module, a control module, a switch module and a communication module; the power supply module is respectively connected with the control module and the communication module, the control module is respectively connected with the switch module and the communication module, and the communication module is also connected with a test module of the IVI test system; when the switch module is switched on, the control module controls the test module to test through the communication module.

Further, the communication module includes a CANFD transceiver, a first receiving pin and a first transmitting pin of the CANFD transceiver are both connected to the control module, and a first differential pin and a second differential pin of the CANFD transceiver are both connected to the test module.

Further, the communication module further comprises a first resistor and a second resistor; one end of the first resistor is connected with the first sending pin, the other end of the first resistor is connected with the control module, one end of the second resistor is connected with the first receiving pin, and the other end of the second resistor is connected with the control module.

Furthermore, the communication module further comprises a filter circuit, one end of the filter circuit is connected with the first differential pin and the second differential pin respectively, and the other end of the filter circuit is connected with the test module.

Further, the filter circuit comprises a first capacitor, a second capacitor and a common-mode inductor; one end of the common mode inductor is connected with the first differential pin and the second differential pin respectively, the other end of the common mode inductor is connected with one end of the first capacitor, one end of the second capacitor and the test module respectively, and the other ends of the first capacitor and the second capacitor are grounded.

Furthermore, the communication module further comprises a protection circuit, one end of the protection circuit is connected with the filter circuit, and the other end of the protection circuit is connected with the test module.

Further, the protection circuit includes a first diode and a second diode; the cathode of the first diode is connected with the second differential pin, the cathode of the second diode is connected with the first differential pin, and the anodes of the first diode and the second diode are both grounded.

Furthermore, the switch module comprises a reversing analog switch, and the reversing analog switch is connected with the control module.

Further, the switch module further comprises an ignition analog switch, and the ignition analog switch is connected with the control module.

In a second aspect, the present invention further provides an IVI testing system, the IVI testing system comprising a testing module and any one of the above mentioned IVI testing apparatus.

The utility model provides a IVI testing arrangement and test system is the power supply of control module and communication module through power module, and control module communicates through communication module and IVI test system's test module, can control the start-up and close of test through switch module to can realize the test to the IVI product through simple on-off operation, reduce the maloperation, improve the convenience.

Drawings

In order to more clearly illustrate the technical solution of the present invention, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.

Fig. 1 is a schematic block diagram of an IVI testing apparatus according to an embodiment of the present invention;

fig. 2 is a schematic block diagram of a communication module according to an embodiment of the present invention;

fig. 3 is a circuit diagram of a communication module according to an embodiment of the present invention.

Detailed Description

The technical solution of the present invention will be described clearly and completely with reference to the accompanying drawings, and obviously, the described embodiments are some, but not all embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

It will be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.

It is also to be understood that the terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used in the specification and the appended claims, the singular forms "a", "an", and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It should be further understood that the term "and/or" as used in the specification and the appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes such combinations.

Referring to fig. 1 to 3, fig. 1 is a block diagram illustrating an IVI testing apparatus 10 according to an embodiment of the present invention; fig. 2 is a schematic block diagram of a communication module 13 according to an embodiment of the present invention; fig. 3 is a circuit diagram of a communication module 13 according to an embodiment of the present invention. As shown in fig. 1, the IVI testing apparatus 10 provided by the present invention includes a power supply module 11, a control module 12, a switch module 14 and a communication module 13; the power supply module 11 is respectively connected with the control module 12 and the communication module 13, the control module 12 is respectively connected with the switch module 14 and the communication module 13, and the communication module 13 is further connected with a test module 20 of the IVI test system; when the switch module 14 is turned on, the control module 12 controls the test module 20 to perform a test through the communication module 13.

Specifically, the power supply module 11 may include two power chips for respectively supplying power to the control module 12 and the communication module 13. The communication module 13 is used for communicating with the test module 20 of the IVI test system, the communication protocol of the IVI product is generally a CAN bus or a CANFD bus, and the communication module 13 may include a CAN communication chip or a CANFD communication chip. The testing module 20 refers to the functions to be tested in the IVI product, including but not limited to ignition modules, reversing modules, air conditioning modules, and window modules. The switch module 14 is used to control the start and stop of the test, and the number of switches of the switch module 14 is the same as the number of functions to be tested contained in the test module 20. When the reversing function of the IVI product needs to be tested, the test can be started through the switch module 14, the control module 12 sends a control instruction to the reversing module in the test module 20 through the communication module 13, if the test module 20 can execute the control instruction, the function is normal, and when the test needs to be finished, the switch module 14 is closed, so that the operation is convenient and fast.

As a further embodiment, referring to fig. 2 and fig. 3, the communication module 13 includes a CANFD transceiver 131, the first receive pin RXD and the first transmit pin TXD of the CANFD transceiver 131 are both connected to the control module 12, and the first differential pin CANH and the second differential pin CANL of the CANFD transceiver 131 are both connected to the test module 20.

The first receiving pin RXD and the first transmitting pin TXD are used for communicating with the control module 12, the control module 12 may be an MCU, as shown in fig. 3, the U1 chip is a CANFD transceiver 131, and the first receiving pin RXD and the first transmitting pin TXD are connected to corresponding pins of the MCU, so as to implement communication with the control module 12. The first differential pin CANH and the second differential pin CANL are connected to the test module 20, so as to ensure the communication between the communication module 13 and the test module 20. The CANFD transceiver 131 may further include a chip power supply pin VCC, a sleep pin STB _ N, an enable pin EN, an interference suppression pin INH, an error detection pin ERR _ N, a WAKE-up pin WAKE, and a battery power supply pin VBAT, in addition to the above-mentioned pins, for ensuring normal operation of the CANFD transceiver 131, and other components of the circuit diagram shown in fig. 3 are all used for ensuring normal operation of the CANFD transceiver 131, and will not be described herein.

As a further embodiment, the communication module 13 further includes a first resistor R1 and a second resistor R2; one end of the first resistor R1 is connected to the first transmit pin TXD, the other end of the first resistor R1 is connected to the control module 12, one end of the second resistor R2 is connected to the first receive pin RXD, and the other end of the second resistor R2 is connected to the control module 12.

The first resistor R1 and the second resistor R2 are impedance matching resistors, which ensure that the CANFD transceiver 131 can communicate with the control module 12.

As a further embodiment, the communication module 13 further includes a filter circuit 132, one end of the filter circuit 132 is connected to the first differential pin CANH and the second differential pin CANL, respectively, and the other end of the filter circuit 132 is connected to the test module 20.

As a further embodiment, the filter circuit 132 includes a first capacitor C1, a second capacitor C2, and a common mode inductor L1; one end of the common mode inductor L1 is connected to the first differential pin CANH and the second differential pin CANL, the other end of the common mode inductor L1 is connected to one end of the first capacitor C1, one end of the second capacitor C2 and the test module 20, and the other ends of the first capacitor C1 and the second capacitor C2 are grounded.

The filter circuit 132 is used for filtering out interference signals, so as to ensure that the communication module 13 and the test module 20 can communicate normally.

As a further embodiment, the communication module 13 further includes a protection circuit 133, one end of the protection circuit 133 is connected to the filter circuit 132, and the other end of the protection circuit 133 is connected to the test module 20.

As a further embodiment, the protection circuit 133 includes a first diode D1 and a second diode D2; the negative electrode of the first diode D1 is connected with the second differential pin CANL, the negative electrode of the second diode D2 is connected with the first differential pin CANH, and the positive electrodes of the first diode D1 and the second diode D2 are both grounded.

The first diode D1 and the second diode D2 are protection tubes to prevent the CANFD transceiver 131 from being damaged by high voltage.

As a further embodiment, the switch module 14 includes a reverse analog switch 141, and the reverse analog switch 141 is connected to the control module 12.

As a further embodiment, the switch module 14 further includes an ignition analog switch 142, and the ignition analog switch 142 is connected to the control module 12.

The switch module 14 may include a reverse analog switch 141 and an ignition analog switch 142 for controlling the reverse function and the ignition function of the test module 20.

The utility model also provides an IVI test system, the IVI test system includes test module 20 and IVI testing arrangement 10 of any one of the above-mentioned examples; the IVI testing device 10 comprises a power supply module 11, a control module 12, a switch module 14 and a communication module 13; the power supply module 11 is respectively connected with the control module 12 and the communication module 13, the control module 12 is respectively connected with the switch module 14 and the communication module 13, and the communication module 13 is further connected with a test module 20 of the IVI test system; when the switch module 14 is turned on, the control module 12 controls the test module 20 to perform a test through the communication module 13.

The test module 20 may include a plurality of different modules for testing different functions of the IVI product. For example, an ignition module, a reversing module, a window module and an air conditioning module may be included, and the switch module 14 controls the start and stop of the test module 20 to determine whether the communication is performed normally. For example, when the air conditioning module is tested, if the switch module 14 is turned on, the air conditioning module is turned on synchronously, it indicates that the communication is normal, and if the switch module 14 is turned on, the air conditioning module is not turned on, it indicates that there is a problem in the communication.

The utility model discloses can realize the communication between control module and the test module through communication module, through switch module control to test module's test, simplify the operation, improve the convenience.

The above description is only for the specific embodiments of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily think of various equivalent modifications or replacements within the technical scope of the present invention, and these modifications or replacements should be covered within the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims

1. An IVI testing device is applied to an IVI testing system and is characterized by comprising a power supply module, a control module, a switch module and a communication module;

the power supply module is respectively connected with the control module and the communication module, the control module is respectively connected with the switch module and the communication module, and the communication module is also connected with a test module of the IVI test system;

when the switch module is switched on, the control module controls the test module to test through the communication module.

2. The IVI test apparatus of claim 1, wherein the communication module comprises a CAN FD transceiver, wherein a first receive pin and a first transmit pin of the CAN FD transceiver are both connected to the control module, and wherein a first differential pin and a second differential pin of the CAN FD transceiver are both connected to the test module.

3. The IVI test device of claim 2, wherein the communication module further comprises a first resistor and a second resistor;

one end of the first resistor is connected with the first sending pin, the other end of the first resistor is connected with the control module, one end of the second resistor is connected with the first receiving pin, and the other end of the second resistor is connected with the control module.

4. The IVI test device of claim 2, wherein the communication module further comprises a filter circuit, one end of the filter circuit is connected to the first differential pin and the second differential pin, respectively, and the other end of the filter circuit is connected to the test module.

5. The IVI test apparatus of claim 4, wherein the filter circuit comprises a first capacitor, a second capacitor, and a common mode inductor;

one end of the common mode inductor is connected with the first differential pin and the second differential pin respectively, the other end of the common mode inductor is connected with one end of the first capacitor, one end of the second capacitor and the test module respectively, and the other ends of the first capacitor and the second capacitor are grounded.

6. The IVI test apparatus of claim 4, wherein the communication module further comprises a protection circuit, one end of the protection circuit being connected to the filter circuit and the other end of the protection circuit being connected to the test module.

7. The IVI test apparatus of claim 6, wherein the protection circuit comprises a first diode and a second diode;

the cathode of the first diode is connected with the second differential pin, the cathode of the second diode is connected with the first differential pin, and the anodes of the first diode and the second diode are both grounded.

8. The IVI testing apparatus of claim 1, wherein the switch module comprises a reverse analog switch coupled to the control module.

9. The IVI test device of claim 8, wherein the switch module further comprises an ignition analog switch coupled to the control module.

10. An IVI test system comprising a test module and an IVI test apparatus according to any of the claims 1 to 9.