CN218727425U

CN218727425U - Light sense chip test fixture of many stations

Info

Publication number: CN218727425U
Application number: CN202222066448.6U
Authority: CN
Inventors: 姚羊洋; 何俊; 胡晓蔚
Original assignee: Zhejiang Bangruida Technology Co ltd
Current assignee: Zhejiang Bangruida Technology Co ltd
Priority date: 2022-08-03
Filing date: 2022-08-03
Publication date: 2023-03-24
Anticipated expiration: 2032-08-03

Abstract

The utility model provides a light sense chip test fixture of multistation, its includes base mechanism, tool moving mechanism to and test station mechanism, base mechanism includes base, guide rail. The jig moving mechanism comprises a support, a component, a power-on PCB and a chip mounting rod. The adjusting component comprises an upper elbow clamp, a sliding rail and sliding block component, a sliding block fine adjustment platform and a PCB fixing plate. The slider with go up the output that the elbow pressed from both sides and be connected, the extending direction of slide rail sliding block set spare is on a parallel with the direction of gravity, the moving direction of fine setting platform with the moving direction of slider is the same. The jig moving mechanism moves the chip, so that the chip can be moved to different testing stations for testing, and the efficiency is improved. The fine adjustment platform can further fine adjust the height of the chip so as to be suitable for chips with different thicknesses. The power-on elbow clamp can drive the probe to move up to contact the chip quickly, so that quick power-on is realized, and operation is facilitated.

Description

Light sense chip test fixture of many stations

Technical Field

The utility model belongs to the technical field of the chip test, especially a light sense chip test fixture of many stations.

Background

Along with the rise of wearable equipment with health function now for adopt the light sense chip to gather the application of health data more and more, the light sense chip also can a large amount of applications in the cell-phone trade simultaneously. During manufacturing, the chip needs to be subjected to various tests, such as a light sensation test, a gray card test, an aging test and the like. However, the existing light sensation test fixture is of a single-station type and is difficult to meet the compatibility of chips of different models, the chips need to be taken down from one test device after one test is completed, the chips are tested by being mounted on another test device, and the chips need to be loaded and unloaded for multiple times, so that the working efficiency is low, the probes of the existing fixture are troublesome to push up and electrify, the pressing in place cannot be achieved at one time, and the operation is not convenient.

SUMMERY OF THE UTILITY MODEL

In view of this, the utility model provides a light sense chip test fixture of many stations to solve above-mentioned technical problem.

The utility model provides a light sense chip test fixture of multistation, includes a base mechanism, a setting is in tool moving mechanism on the base mechanism, and a setting is in test station mechanism on the base mechanism, base mechanism includes a base, and two settings are in guide rail on the base, tool moving mechanism includes that a slip sets up support on the guide rail, a setting is in adjusting part on the support, a setting is in last circular telegram PCB board of adjusting part, and a setting is in chip erection pole on the support, adjusting part includes that one sets up last elbow clamp on the support, a setting is in slide block assembly on the support, a slip sets up slider on the slide block assembly, a setting is in fine setting platform on the slider, and a setting is in PCB fixed plate on the fine setting platform, the slider with the output of going up the elbow clamp is connected, slide block assembly's extending direction is on a parallel with the direction of gravity, fine setting platform's moving direction with the moving direction of slider is the same, PCB fixed plate is used for setting up circular telegram board, be equipped with a plurality of probes on the PCB board.

Furthermore, the light sense chip test fixture of multistation position still includes a plurality of settings and is in positioning mechanism on the base mechanism, positioning mechanism includes that one sets up base on the base, one sets up elbow clamp on the base, one sets up location guide rail on the base, and one slides and sets up locating piece on the location guide rail.

Furthermore, the elbow clamp is a horizontally-pulled elbow clamp, and the output end of the elbow clamp is connected with the positioning block.

Furthermore, the sliding direction of the positioning block is close to or far away from the jig moving mechanism, and one end, facing the jig moving mechanism, of the positioning block is of a wedge-shaped structure.

Furthermore, the jig moving mechanism further comprises two positioning movable blocks arranged on the support, the positioning movable blocks are located at one end, close to the positioning mechanism, of the support, and the two positioning movable blocks are arranged at intervals and opposite to each other, and one ends of the positioning movable blocks are of wedge-shaped structures.

Furthermore, the adjusting component further comprises a first limiting block arranged on the support and a second limiting block arranged on the sliding block, the second limiting block moves along with the sliding block, and the first limiting block is located in the moving direction of the second limiting block.

Furthermore, the test station mechanism comprises a dust card test station arranged on the base, a metal plate test station arranged on the base and an illumination test station arranged on the base.

Furthermore, ash card test station includes that one sets up first support on the base, a setting is in first logical light briquetting on the first support, a plurality of settings are in ash card cushion on the first logical light briquetting, and a setting is in ash cardboard on the ash card cushion, it is equipped with a through-hole that is used for leading to light, a plurality of to lead to on the light briquetting first the mutual stack of ash card cushion.

Furthermore, the metal plate test station comprises a second support arranged on the base, a second light-transmitting pressing block arranged on the second support, a supporting rod arranged on the base, a metal plate arranged on the supporting rod and two nuts arranged on the supporting rod, wherein the metal plate is positioned between the two nuts.

Furthermore, the illumination test station comprises a third support arranged on the base, a third light-passing press block arranged on the third support, a first light cylinder arranged on the third light-passing press block, a second light cylinder sleeved on the first light cylinder and an LED light source plate arranged on the second light cylinder, wherein the second light cylinder slides along the axial direction of the first light cylinder.

Compared with the prior art, the utility model provides a light sense chip test fixture of multistation passes through tool moving mechanism removes the chip, makes the chip can remove to test on the different test station, only needs a material loading just can realize multiple detection, raises the efficiency. Through positioning mechanism advances line location fixed, positioning mechanism passes through the elbow press from both sides with quick location is realized to the mode of locating piece. The sliding block is arranged on the sliding rail sliding block assembly in a sliding mode and penetrates through the opening to be connected with the output end of the upper elbow clamp, the upper elbow clamp is pulled to drive the sliding block to move up and down, and the upper elbow clamp is only pulled to drive the sliding block and a plurality of parts arranged on the sliding block to move up, so that the power-on PCB can move up to insert the probes into the chip to achieve power-on, and the convenience and the rapidness are achieved in one step. The height is occasionally fine-tuned by the fine tuning stage to accommodate chips of different thicknesses.

Drawings

Fig. 1 is a schematic structural view of a multi-station light sensing chip testing fixture provided by the present invention.

Fig. 2 is a schematic structural view of a jig moving mechanism of the multi-station light-sensing chip testing jig of fig. 1.

Fig. 3 is a schematic structural view of another angle of the jig moving mechanism of the multi-station photo-sensing chip testing jig shown in fig. 1.

Fig. 4 is a schematic structural view of an energized PCB of the multi-station optical sensor chip testing fixture of fig. 1.

Fig. 5 is a schematic structural diagram of a gray card testing station of the multi-station light-sensing chip testing fixture of fig. 1.

Fig. 6 is a schematic structural diagram of a metal plate testing station of the multi-station light-sensing chip testing fixture of fig. 1.

Fig. 7 is a schematic structural view of an illumination testing station of the multi-station light-sensing chip testing fixture of fig. 1.

Detailed Description

Specific examples of the present invention will be described in further detail below. It should be understood that the description herein of embodiments of the invention is not intended to limit the scope of the invention.

As shown in fig. 1 to 7, it is a schematic structural view of the light sensing chip testing fixture with multiple stations according to the present invention. The light sensation chip test fixture with multiple stations comprises a base mechanism 10, a plurality of positioning mechanisms 20 arranged on the base mechanism 10, a fixture moving mechanism 30 arranged on the base mechanism 10, and a test station mechanism 40 arranged on the base mechanism 10. It is understood that the multi-station optical sensor chip test fixture further includes other functional modules, such as an assembling module, a mounting module, a connecting module, etc., which are well known to those skilled in the art and will not be described herein again.

The base mechanism 10 includes a base 11, two guide rails 12 disposed on the base 11, and two moving flaps 13 disposed on one side of the base 11.

The base 11 is used for setting the above functional components, two guide rails 12 are arranged at intervals and have the same direction, and the guide rails 12 are used for supporting the jig moving mechanism 30 to move so as to switch different testing stations. The movable blocking pieces 13 are disposed on two sides of the base 11 and are used for preventing the jig moving mechanism 30 from moving out of the base 11.

The positioning mechanism 20 includes a base 21 disposed on the base 11, an elbow clip 22 disposed on the base 21, a positioning rail 23 disposed on the base 11, and a positioning block 24 slidably disposed on the positioning rail 23.

The base 21 is used for setting the elbow clip 22, the elbow clip 22 is a horizontally-pulled elbow clip, the output end of the elbow clip 22 is connected with the positioning block 24, the elbow clip 22 is pulled to drive the positioning block 24 to slide along the positioning guide rail 23, and the elbow clip 22 is the prior art and is not described in detail herein. The sliding direction of the positioning block 24 is close to or away from the jig moving mechanism 30, so that the jig moving mechanism 30 is locked by the positioning block 24. One end of the positioning block 24 facing the jig moving mechanism 30 is formed into a wedge-shaped structure, which is used for locking in cooperation with the jig moving mechanism 30, and the specific description will be described together below.

The jig moving mechanism 30 includes a support 31 slidably disposed on the guide rail 12, two positioning movable blocks 32 disposed on the support 31, an adjusting component 33 disposed on the support 31, an electrified PCB 34 disposed on the adjusting component 33, and a chip mounting rod 35 disposed on the support 31.

The bracket 31 slides along the guide rail 12, so that the jig moving mechanism 30 can move to different test stations for fast switching. An opening 311 is disposed at an end of the bracket 31 away from the guide rail 12, and the opening 311 is used for disposing the adjusting component 33 and providing a space for the jig moving mechanism 30 to move up and down.

The positioning movable blocks 32 are located at one end of the bracket 31 close to the positioning mechanism 20, and two positioning movable blocks 32 are arranged at intervals and have opposite ends in a wedge-shaped structure, so that the positioning blocks 24 are mutually matched with one ends in a wedge-shaped structure. When the jig moving mechanism 30 moves to the normal position, the elbow clamp 22 is snapped to insert the positioning block 24 between the two positioning moving blocks 32, so that the jig moving mechanism 30 is fixed and cannot move, and quick positioning is realized.

The adjusting assembly 33 includes an upper elbow clip 331 disposed on the support 31, a sliding rail assembly 332 disposed on the support 31, a sliding block 333 slidably disposed on the sliding rail assembly 332, a first stop block 334 disposed on the support 31, a second stop block 335 disposed on the sliding block 333, a fine adjustment platform 336 disposed on the sliding block 333, and a PCB fixing plate 337 disposed on the fine adjustment platform 336.

The upper elbow clamp 331 and the sliding rail slider assembly 332 are respectively arranged on two end surfaces of the bracket 31. The sliding rail slider assembly 332 extends in a direction parallel to the direction of gravity, thereby supporting the slider 333 to move up and down. The slide block is of an L-shaped structure, the slide block 333 is slidably disposed on the slide rail slide block assembly 332 and passes through the opening 311 to be connected with the output end of the upper elbow clamp 331, so that the upper elbow clamp 331 is pulled to drive the slide block 333 to move up and down. The first limit block 334 is arranged at one end of the bracket 31, where the opening 311 is formed, the second limit block 335 moves along with the sliding block 333, the first limit block 334 is located in the moving direction of the second limit block 335, when the sliding block 333 moves upwards, the first limit block 334 blocks the second limit block 335, so that the sliding block 333 cannot move, and then the upper elbow clamp 331 is locked to fix the sliding block 333. The moving direction of the fine tuning platform 336 is the same as that of the sliding block 333, and the fine tuning platform 336 is used for adjusting the height, and because the upper elbow clamp 331 only has two positions, the positions cannot be finely tuned, and the fine tuning platform is difficult to adapt to different testing stations, the height is occasionally finely tuned through the fine tuning platform 336 so as to adapt to chips with different thicknesses. The PCB fixing plate 337 is used to set the power-on PCB board 34.

The power-on PCB 34 is provided with a plurality of probes 341, the probes 341 are retractable micro contacts, and the chip mounting rod 35 is disposed at the opening of the opening 311 and is used for placing a chip to be tested. When power-on is needed, the power-on elbow clamp 331 is only pulled to drive the slide block 333 and the plurality of parts arranged on the slide block 333 to move upwards, so that the power-on PCB 34 moves upwards to insert the probe 341 into a chip to realize power-on, and the convenience and the rapidness can be realized in one step.

The test station mechanism 40 includes a gray card test station 41 disposed on the base 11, a metal plate test station 42 disposed on the base 11, and an illumination test station 43 disposed on the base 11.

The gray card testing station 41 comprises a first bracket 411 arranged on the base 11, a first light-transmitting pressing block 412 arranged on the first bracket 411, a plurality of gray card cushion blocks 413 arranged on the first light-transmitting pressing block 412, and a gray card plate 414 arranged on the gray card cushion blocks 413.

The first light-transmitting pressing block 412 is provided with a through hole for transmitting light, and the first light-transmitting pressing block 412 and the chip mounting rod 35 are arranged at intervals. When the jig moving mechanism 30 moves to the corresponding position, the plurality of probes 341 are inserted into the chip on the chip mounting rod 35 and pushed upward, so that the chip is pressed between the probes 341 and the first light-passing pressing block 412, thereby fixing the chip for testing. The plurality of the ash clamping cushion blocks 413 are mutually overlapped, and a certain number of the ash clamping cushion blocks 413 are removed according to needs, so that the ash clamping plates 414 can be different in distance from the surface of the chip, and different testing requirements can be met. The gray card testing station 41 detects the exposure of the chip, which should be the prior art and will not be described herein.

The metal plate testing station 42 includes a second support 421 disposed on the base 11, a second light passing block 422 disposed on the second support 421, a support rod 423 disposed on the base 11, a metal plate 424 disposed on the support rod 423, and two nuts 425 disposed on the support rod 423.

The structures of the second holder 421 and the second light-passing block 422 are the same as the structures of the first holder 411 and the first light-passing block 412, and are not described again. The metal plate 424 is a special metal thin plate for testing, the metal plate 424 is located between the two nuts 422, the metal plate 424 is fixed on the support rod 423 through the two nuts 425, and the metal plate 424 can be adjusted to different heights through the screw connection of the two nuts 425 so as to meet testing requirements.

The illumination test station 43 includes a third bracket 431 disposed on the base 11, a third light passing pressing block 432 disposed on the third bracket 431, a first light cylinder 433 disposed on the third light passing pressing block 432, a second light cylinder 434 sleeved on the first light cylinder 434, and an LED light source plate 435 disposed on the second light cylinder 434.

The third frame 431 and the third light-passing block 432 have the same structure as the first frame 411 and the first light-passing block 412, and thus, a description thereof is omitted. The LED light source plate 435 is used for emitting light, and the second light cylinder 434 can slide along the axial direction of the first light cylinder 433, so as to meet the test requirements of different light source distances. After the distance is adjusted, the second optical cylinder 434 and the first optical cylinder 433 are locked and fixed by a fastener.

Compared with the prior art, the utility model provides a light sense chip test fixture of multistation passes through tool moving mechanism 30 removes the chip, makes the chip can remove to test on the different test station, only needs a material loading just can realize multiple detection, raises the efficiency. The positioning mechanism 20 is used for positioning and fixing, and the positioning mechanism 20 realizes quick positioning by means of the elbow clamp 22 and the positioning block 24. The slide block 333 is slidably disposed on the slide rail slide block assembly 332 and passes through the opening 311 to be connected to the output end of the upper elbow clip 331, the upper elbow clip 331 is pulled to drive the slide block 333 to move up and down, and only the upper elbow clip 331 is pulled to drive the slide block 333 and a plurality of parts disposed on the slide block 333 to move up, so that the power-on PCB 34 moves up to insert the probe 341 into a chip to achieve power-on, thereby achieving convenience and rapidness in one step. The height is occasionally fine-tuned by the fine tuning platform 336 to accommodate chips of different thicknesses.

The above description is only for the preferred embodiment of the present invention and should not be construed as limiting the scope of the present invention, and any modification, equivalent replacement or improvement within the spirit of the present invention is encompassed by the claims of the present invention.

Claims

1. The utility model provides a light sense chip test fixture of multistation which characterized in that: the light sensation chip test fixture of multistation position includes a base mechanism, a setting is in tool moving mechanism on the base mechanism, and a setting is in test station mechanism on the base mechanism, base mechanism includes a base, and two settings are in guide rail on the base, tool moving mechanism includes that a slip sets up support on the guide rail, a setting is in adjusting part on the support, a setting is in last circular telegram PCB board of adjusting part, and a setting is in chip erection pole on the support, adjusting part includes that one sets up last elbow clamp on the support, a setting is in slide rail sliding block set up on the support, a slip sets up slider on the slide rail set up, a setting is in fine setting platform on the slider, and a setting is in PCB fixed plate on the fine setting platform, the slider with the output that goes up the elbow clamp is connected, slide rail set's extending direction is on a parallel with the direction of gravity, the moving direction of fine setting platform with the moving direction of slider is the same, PCB fixed plate is used for setting up circular telegram PCB board, be equipped with a plurality of probes on the circular telegram PCB board.

2. The multi-station optical sensor chip testing fixture of claim 1, wherein: the light sense chip test fixture of multistation position still includes a plurality of settings and is in positioning mechanism on the base mechanism, positioning mechanism includes that one sets up base on the base, one sets up elbow clamp on the base, one sets up location guide rail on the base, and a slip setting is in locating piece on the location guide rail.

3. The multi-station optical sensor chip testing fixture as claimed in claim 2, wherein: the elbow clamp is a horizontally-pulled elbow clamp, and the output end of the elbow clamp is connected with the positioning block.

4. The multi-station optical sensor chip testing fixture as claimed in claim 2, wherein: the sliding direction of the positioning block is close to or far away from the jig moving mechanism, and one end of the positioning block, which faces the jig moving mechanism, is of a wedge-shaped structure.

5. The multi-station optical sensor chip testing fixture as claimed in claim 2, wherein: the jig moving mechanism further comprises two positioning movable blocks arranged on the support, the positioning movable blocks are located at one ends, close to the positioning mechanism, of the supports, and the two positioning movable blocks are arranged at intervals and opposite to each other, and are of wedge-shaped structures.

6. The multi-station optical sensor chip testing fixture of claim 1, wherein: the adjusting component further comprises a first limiting block arranged on the support and a second limiting block arranged on the sliding block, the second limiting block moves along with the sliding block, and the first limiting block is located in the moving direction of the second limiting block.

7. The multi-station optical sensor chip testing fixture of claim 1, wherein: the test station mechanism comprises a dust card test station arranged on the base, a metal plate test station arranged on the base and an illumination test station arranged on the base.

8. The multi-station optical sensor chip testing fixture of claim 7, wherein: the ash card test station comprises a first support, a first light-passing press block, a plurality of ash card cushion blocks and an ash clamping plate, wherein the first support is arranged on the base, the first light-passing press block is arranged on the first support, the ash card cushion blocks are arranged on the first light-passing press block, the ash clamping plate is arranged on the ash card cushion block, a through hole used for passing light is formed in the first light-passing press block, and the ash card cushion blocks are mutually overlapped.

9. The multi-station optical sensor chip testing fixture of claim 7, wherein: the metal plate testing station comprises a second support arranged on the base, a second light-transmitting pressing block arranged on the second support, a supporting rod arranged on the base, a metal plate arranged on the supporting rod and two nuts arranged on the supporting rod, wherein the metal plate is located between the two nuts.

10. The multi-station optical sensor chip testing fixture of claim 7, wherein: the illumination test station comprises a third support arranged on the base, a third light-passing press block arranged on the third support, a first light cylinder arranged on the third light-passing press block, a second light cylinder arranged on the first light cylinder in a sleeved mode, and an LED light source plate arranged on the second light cylinder, wherein the second light cylinder is arranged along the axial sliding direction of the first light cylinder.