CN218631330U

CN218631330U - 8080 interface SPI (serial peripheral interface) conversion test system

Info

Publication number: CN218631330U
Application number: CN202222081004.XU
Authority: CN
Inventors: 黄卓明; 郑宇成
Original assignee: Shenzhen Tongxingda Technology Co Ltd
Current assignee: Shenzhen Tongxingda Technology Co Ltd
Priority date: 2022-08-05
Filing date: 2022-08-05
Publication date: 2023-03-14
Anticipated expiration: 2032-08-05

Abstract

The utility model discloses a 8080 interface changes SPI test system, include: the device comprises an MCU module and an 8080-to-SPI module electrically connected with the MCU module; the MCU module is used for sending data to the 8080 to SPI conversion module through an 8080 interface; the 8080 to SPI module is used for receiving data of the MCU module and lightening the display module through SPI or QSPI time sequence driving. The beneficial effects of the utility model reside in that: under the condition that a test system is changed very little, an 8080 SPI (serial peripheral interface) conversion module is added, the image sending efficiency is improved by times, and the production test efficiency of the display module of the SPI interface and the QSPI interface is greatly improved.

Description

8080 interface SPI (serial peripheral interface) conversion test system

Technical Field

The utility model relates to a display module assembly technical field especially relates to a 8080 interface changes SPI test system.

Background

In display module assembly, need light display module assembly and show that specific image comes to test display module assembly, among the prior art, run into the SPI interface, during the display module assembly of QSPI interface, when testing, the corresponding data of hardware SPI interface or QSPI interface transmission through test system's MCU give display module assembly, because hardware speed limit, walk line interference, electromagnetic interference scheduling problem, data transmission speed is difficult to promote, lead to the brush drawing slow excessively, seriously influence the efficiency of production test.

Thus, the prior art is deficient and needs improvement.

SUMMERY OF THE UTILITY MODEL

The utility model aims at overcoming prior art's not enough, provide an 8080 interface commentaries on classics SPI test system.

The technical scheme of the utility model as follows: the utility model provides a 8080 interface changes SPI test system, include: the device comprises an MCU module and an 8080-to-SPI module electrically connected with the MCU module; the MCU module is used for sending data to the 8080 to SPI conversion module through an 8080 interface; the 8080 to SPI module is used for receiving data of the MCU module and lightening the display module through SPI or QSPI time sequence driving.

Further, the 8080 SPI module comprises an FPGA (programmable logic array).

Adopt above-mentioned scheme, the beneficial effects of the utility model reside in that: under the condition that a test system is changed very little, an 8080 SPI (serial peripheral interface) conversion module is added, the image sending efficiency is improved by times, and the production test efficiency of the display module of the SPI interface and the QSPI interface is greatly improved.

Drawings

Fig. 1 is a block diagram of an embodiment of the present invention.

Detailed Description

The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.

Referring to fig. 1, in this embodiment, the utility model provides a 8080 interface changes SPI test system, include: the MCU module is electrically connected with the 8080-to-SPI module; the MCU module is used for sending data to the 8080 SPI conversion module through an 8080 interface; the 8080 SPI conversion module is used for receiving data of the MCU module and lightening the display module through SPI or QSPI time sequence driving.

Further, the 8080 SPI module comprises an FPGA (programmable logic array).

Please continue to refer to fig. 1, in this solution, by adding an 8080 to turn SPI module, when in operation, the MCU module sends data to the 8080 to turn SPI module by outputting an 8080 parallel time sequence, and then the 8080 to turn SPI module lights the television module by SPI or QSPI time sequence, so that the serial time sequence output of the original MCU module can be changed into a parallel time sequence output, which is transmitted to the FPGA with a faster speed, and then changed into a corresponding serial time sequence output by using a communication protocol, which can increase the speed by 4 to 8 times compared with the conventional method.

To sum up, the beneficial effects of the utility model reside in that: under the condition that a test system is changed slightly, an 8080-turn SPI module can be added, the image sending efficiency is improved in multiples, and the production test efficiency of the display module of the SPI interface and the QSPI interface is greatly improved.

The present invention is not limited to the above preferred embodiments, and any modifications, equivalent replacements, and improvements made within the spirit and principle of the present invention should be included within the protection scope of the present invention.

Claims

1. An 8080 interface to SPI test system, comprising: the MCU module is electrically connected with the 8080-to-SPI module; the MCU module is used for sending data to the 8080 to SPI conversion module through an 8080 interface; the 8080 to SPI module is used for receiving data of the MCU module and lightening the display module through SPI or QSPI time sequence driving.

2. The 8080 interface to SPI test system of claim 1, wherein said 8080 to SPI module comprises an FPGA.