CN218629979U - Device for testing high-temperature insulation resistance of pulse capacitor and clamp thereof - Google Patents
Device for testing high-temperature insulation resistance of pulse capacitor and clamp thereof Download PDFInfo
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- CN218629979U CN218629979U CN202222776349.7U CN202222776349U CN218629979U CN 218629979 U CN218629979 U CN 218629979U CN 202222776349 U CN202222776349 U CN 202222776349U CN 218629979 U CN218629979 U CN 218629979U
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- insulation resistance
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Abstract
A device and its clamp used for insulating resistance test of high temperature of the pulse capacitor, including testing the board and multiple clamps arranged on testing the board evenly at intervals; the fixture is used for clamping the pulse capacitor and comprises a clamping seat and a clamping mechanism. The clamping mechanism comprises a contact pressing sheet, a clamping rod and a reset piece for driving the clamping rod to reset and clamp the pulse capacitor; the reset piece comprises a reset block, a moving hole arranged on the reset block and a reset spring, one end of the reset spring is connected with the front end of the clamping rod, and the other end of the reset spring is connected with the reset block; during the use, through setting up the fixture who is used for the fixed pulse capacitor of centre gripping on the holder, utilize reset spring in the piece that resets can press from both sides pulse capacitor completely tight between contact preforming and clamping rod, be difficult for removing for can exert effectual test voltage to pulse capacitor in the high temperature insulation resistance test, guarantee the reliability of test result.
Description
Technical Field
The utility model belongs to condenser high temperature insulation resistance test field, concretely relates to a device and anchor clamps for pulse capacitor high temperature insulation resistance test.
Background
After the voltage aging test or the charge and discharge screening test, a high-temperature insulation resistance test is required. In order to screen or eliminate unqualified devices, the devices have inherent defects or defects generated by improper control of the manufacturing process, the defects are not completely exposed after a voltage aging test or a charge-discharge screening test, and further confirmation on the performance aspect is needed; these defective devices can exhibit incipient catastrophic or early life failure under conditions of use; in the existing high-temperature insulation resistance test, a push plate with 35 stations is matched with a small-sized ultralow-temperature test box and a high resistance meter to carry out the test, only 35 samples can be completed in each test, the test mode is manual test, the installation mode is complicated, and the efficiency is low; the device needs to be subjected to high-temperature insulation resistance test screening conditions in percentage, and the market demand can not be met under the condition of ensuring the quality.
SUMMERY OF THE UTILITY MODEL
The utility model aims at overcoming prior art's shortcoming, providing an efficient, convenient device and anchor clamps for pulse capacitor high temperature insulation resistance test of operating.
The utility model adopts the following technical scheme:
the utility model provides an anchor clamps for pulse capacitor high temperature insulation resistance test for clamping pulse capacitor, includes holder and the fixture who is used for the fixed pulse capacitor of centre gripping of setting on the holder, fixture is including setting up the contact preforming on the holder, the portable clamping bar that sets up on the holder relative with the contact preforming and set up and drive the clamping bar on the holder and reset the piece that resets and press from both sides tight pulse capacitor, pulse capacitor installs and fixes between contact preforming and clamping bar.
Furthermore, the reset piece includes that the setting is on the holder and the relative reset block of contact preforming, setting supply the removal hole of clamping bar round trip movement, cover establish on clamping bar one end and clamping bar front end be connected the other end and the reset spring that the reset block is connected on the reset block.
Furthermore, the piece that resets still includes the fixing bolt who sets up in the clamping bar rear end, the rear end of clamping bar is formed with the screw thread section with fixing bolt complex, through fixing bolt and screw thread section cooperation in order to fix the reset block on the holder.
Further, be provided with the first mounting groove that is used for installing the reset block on the holder, the reset block is including setting up canned paragraph in first mounting groove, setting at canned paragraph bottom downwardly extending's positioning segment and setting at the spacing section of canned paragraph front end, reset spring one end is connected the other end with the clamping bar and is connected with spacing section front end.
Furthermore, the clamping rod comprises a rod body and a contact block arranged at the front end of the rod body, the pulse capacitor is clamped between the contact pressing sheet and the contact block, and the reset spring is sleeved on the rod body, one end of the reset spring is connected with the contact block, and the other end of the reset spring is connected with the front end of the limiting section.
Furthermore, a second mounting groove for mounting the contact pressing sheet is formed in the clamping seat.
A device for testing the high-temperature insulation resistance of a pulse capacitor comprises a test board and a plurality of clamps which are uniformly arranged on the test board at intervals.
Furthermore, the reset piece comprises a reset block which is arranged on the clamping seat and is opposite to the contact pressing sheet, a moving hole which is arranged on the reset block and is used for the clamping rod to move back and forth, and a reset spring which is sleeved on the moving rod, wherein one end of the reset spring is connected with the front end of the moving rod, and the other end of the reset spring is connected with the reset block; the reset block comprises a fixed section arranged in the first mounting groove, a positioning section arranged at the bottom of the fixed section and extending downwards, and a limiting section arranged at the front end of the fixed section; the test board is provided with a positioning hole for the positioning section to pass through.
It can be known from the above description of the present invention, compared with the prior art, the beneficial effects of the present invention are: through the technical scheme, when the clamping device is used, the pulse capacitor can be completely clamped between the contact pressing sheet and the clamping rod by the aid of the clamping mechanism which is arranged on the clamping seat and used for clamping and fixing the pulse capacitor, and the reset spring in the reset piece is not easy to move, so that effective test voltage can be applied to the pulse capacitor in a high-temperature insulation resistance test, and reliability of a test result is guaranteed;
the test board arranged on the device for testing the high-temperature insulation resistance of the pulse capacitor and the plurality of clamps uniformly arranged on the test board at intervals can be used for testing the high-temperature insulation resistance in a large batch, so that the test efficiency of the high-temperature insulation resistance test is improved;
the pulse capacitor can be effectively fixed through the test board arranged on the device for testing the high-temperature insulation resistance of the pulse capacitor, the plurality of clamps uniformly arranged on the test board at intervals and the clamping mechanism arranged on the clamps, so that the accuracy and the reliability of a test result are ensured; the high-temperature insulation resistance test can be carried out on the pulse capacitor in large batch, and the test efficiency of the high-temperature insulation resistance test is improved.
Drawings
FIG. 1 is a schematic structural diagram of an apparatus for high temperature insulation resistance testing;
FIG. 2 is a schematic view of the structure of the clamp;
FIG. 3 is a schematic structural view of the holder;
FIG. 4 is a schematic structural view of a reset member;
FIG. 5 is a schematic diagram of a reset block;
in the figure: 1-test board, 2-clamp, 21-clamp seat, 22-clamping mechanism, 23-contact pressing sheet, 24-clamping rod, 241-rod body, 242-contact block, 25-reset piece, 251-reset block, 252-moving hole, 253-reset spring, 254-fixed bolt, 255-thread section, 256-fixed section, 257-positioning section and 258-limiting section.
Detailed Description
The present invention will be further described with reference to the following detailed description.
A device for testing high-temperature insulation resistance of a pulse capacitor and a clamp thereof comprise a test board 1 and a plurality of clamps 2 which are uniformly arranged on the test board 1 at intervals.
The clamp 2 is made of an insulating material and comprises a clamp holder 21 and a clamping mechanism 22 used for clamping and fixing the pulse capacitor, wherein a first mounting groove 211 used for mounting a reset block 251 and a second mounting groove 212 used for mounting a contact pressing sheet 25 are formed in the clamp holder 21, the clamping mechanism 22 comprises the contact pressing sheet 23 arranged on the clamp holder 21, a clamping rod 24 movably arranged on the clamp holder 21 and opposite to the contact pressing sheet 23, and a reset piece 25 arranged on the clamp holder 21 and driving the clamping rod 24 to reset and clamp the pulse capacitor, the pulse capacitor is fixedly arranged between the contact pressing sheet 23 and the clamping rod 24, specifically, the reset piece 25 comprises a reset block 251 arranged on the clamp holder 21 and opposite to the contact pressing sheet 23, a moving hole 252 arranged on the reset block 251 and used for the clamping rod 24 to move back and forth, a reset spring 253 sleeved on the clamping rod 24 and connected with the reset block 251 at the other end and the front end of the clamping rod 24, and a fixed bolt 254 arranged at the rear end of the clamping rod 24, a threaded section 255 matched with the reset block 251 to fix the clamp holder 21; further, the clamping rod 24 includes a rod body 241 and a contact block 242 disposed at the front end of the rod body 241, the pulse capacitor is clamped between the contact pressing sheet 23 and the contact block 242, the reset block 251 includes a fixing section 256 disposed in the first mounting groove 211, a positioning section 257 disposed at the bottom of the fixing section 256 and extending downward, and a limiting section 258 disposed at the front end of the fixing section 256, and a reset spring 253 is sleeved on the rod body 241, one end of the reset spring is connected with the contact block 242, and the other end of the reset spring is connected with the front end of the limiting section 258; when in use, the contact block 242 presses the return spring 253 backwards, so that the distance between the contact block 242 and the contact pressing sheet 23 can be used for installing the pulse capacitor; then, the pulse capacitor is placed between the contact block 242 and the contact wafer 23; then the contact block 242 is released, at this time, under the action of the return spring 253, the contact block 242 moves to the direction close to the pulse capacitor to clamp the pulse capacitor between the contact pressing sheet 23 and the contact block 242; finally, the reset block 251 is fixed on the clamping seat 21 by matching the fixing bolt 254 with a thread section 255 formed at the rear end of the clamping rod 24, so that the pulse capacitor is tightly fixed between the clamping rod 24 and the contact pressing sheet 23; each clamp 2 is provided with and only can clamp 1 pulse capacitor, so that effective test voltage can be applied to the pulse capacitor in a high-temperature insulation resistance test, and the reliability of a test result is ensured.
The testing board 1 is made of insulating materials, and a plurality of positioning holes which are uniformly arranged and used for the positioning sections 277 to penetrate through are formed in the testing board 1; specifically, the jig 2 is placed on the test board 7 through the positioning segment 257 arranged at the bottom of the fixing segment 256 of the reset block 251, and the test board 1 can be connected with a plurality of jigs 2; further, the maximum bearing temperature of the test board 1 is 150 ℃, and the maximum bearing temperature of the clamp 2 is 200 ℃; when the test board is used, at most forty-five pulse capacitors can be mounted on each test board 1, high-temperature insulation resistance test can be carried out in a large batch, and the test efficiency of the high-temperature insulation resistance test can be improved on the premise of ensuring the accuracy and reliability of test results.
In summary, with the aid of the technical solution of the present invention, the clamping mechanism 22 disposed on the clamping seat 21 for clamping and fixing the pulse capacitor enables the pulse capacitor to be completely clamped on the clamping seat 21 when performing a high-temperature insulation resistance test, and applies an effective test voltage to the pulse capacitor, thereby ensuring that the pulse capacitor can complete the test and improving the reliability of the test result; in addition, through the arrangement of the plurality of uniformly arranged positioning holes on the test boards 1, in the high-temperature insulation resistance test process, at most forty-five pulse capacitors can be installed on each test board 1, high-temperature insulation resistance test can be carried out in a large batch, and the test efficiency of the high-temperature insulation resistance test is improved.
The above description is only a preferred embodiment of the present invention, and therefore the scope of the present invention should not be limited thereby, and all equivalent changes and modifications made within the scope of the claims and the specification should be considered within the scope of the present invention.
Claims (8)
1. The utility model provides a anchor clamps for pulse capacitor high temperature insulation resistance test for clamping pulse capacitor, its characterized in that: the pulse capacitor clamping device comprises a clamping seat and a clamping mechanism arranged on the clamping seat and used for clamping and fixing a pulse capacitor, wherein the clamping mechanism comprises a contact pressing sheet arranged on the clamping seat, a clamping rod movably arranged on the clamping seat and opposite to the contact pressing sheet, and a reset piece arranged on the clamping seat and used for driving the clamping rod to reset and clamp the pulse capacitor, and the pulse capacitor is fixedly arranged between the contact pressing sheet and the clamping rod.
2. The fixture for testing the high-temperature insulation resistance of the pulse capacitor according to claim 1, wherein: the reset piece comprises a reset block arranged on the clamping seat and opposite to the contact pressing sheet, a moving hole arranged on the reset block and used for the clamping rod to move back and forth, and a reset spring sleeved on the clamping rod, wherein one end of the reset spring is connected with the front end of the clamping rod, and the other end of the reset spring is connected with the reset block.
3. The fixture for testing the high-temperature insulation resistance of the pulse capacitor according to claim 2, wherein: the reset piece further comprises a fixing bolt arranged at the rear end of the clamping rod, a thread section matched with the fixing bolt is formed at the rear end of the clamping rod, and the reset piece is fixed on the clamping seat through the matching of the fixing bolt and the thread section.
4. The fixture for testing the high-temperature insulation resistance of the pulse capacitor according to claim 2, wherein: the clamp holder is provided with a first mounting groove for mounting a reset block, the reset block comprises a fixing section arranged in the first mounting groove, a positioning section arranged at the bottom of the fixing section and extending downwards, and a limiting section arranged at the front end of the fixing section, and one end of the reset spring is connected with the clamping rod, while the other end is connected with the front end of the limiting section.
5. The fixture for testing the high-temperature insulation resistance of the pulse capacitor according to claim 2, wherein: the clamping rod comprises a rod body and a contact block arranged at the front end of the rod body, the pulse capacitor is clamped between the contact pressing sheet and the contact block, and the reset spring is sleeved at one end of the rod body and connected with the contact block, and the other end of the reset spring is connected with the front end of the limiting section.
6. The fixture for testing the high-temperature insulation resistance of the pulse capacitor according to claim 1, wherein: and a second mounting groove for mounting the contact pressing sheet is formed in the clamping seat.
7. The utility model provides a device that is used for pulse capacitor high temperature insulation resistance to test which characterized in that: comprising a test plate and a plurality of the holders of claim 1 uniformly spaced on the test plate.
8. The apparatus of claim 7, wherein the apparatus comprises: the reset piece comprises a reset block which is arranged on the clamping seat and is opposite to the contact pressing sheet, a moving hole which is arranged on the reset block and is used for the clamping rod to move back and forth, and a reset spring which is sleeved on the moving rod, wherein one end of the reset spring is connected with the front end of the moving rod, and the other end of the reset spring is connected with the reset block; the reset block comprises a fixed section arranged in the first mounting groove, a positioning section arranged at the bottom of the fixed section and extending downwards, and a limiting section arranged at the front end of the fixed section; the test board is provided with a positioning hole for the positioning section to pass through.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222776349.7U CN218629979U (en) | 2022-10-21 | 2022-10-21 | Device for testing high-temperature insulation resistance of pulse capacitor and clamp thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222776349.7U CN218629979U (en) | 2022-10-21 | 2022-10-21 | Device for testing high-temperature insulation resistance of pulse capacitor and clamp thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN218629979U true CN218629979U (en) | 2023-03-14 |
Family
ID=85472864
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202222776349.7U Active CN218629979U (en) | 2022-10-21 | 2022-10-21 | Device for testing high-temperature insulation resistance of pulse capacitor and clamp thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN218629979U (en) |
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2022
- 2022-10-21 CN CN202222776349.7U patent/CN218629979U/en active Active
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