CN218629885U

CN218629885U - Nixie tube test structure

Info

Publication number: CN218629885U
Application number: CN202221109931.1U
Authority: CN
Inventors: 万维
Original assignee: Nanchang Jinsheng Electronic Technology Co ltd
Current assignee: Nanchang Jinsheng Electronic Technology Co ltd
Priority date: 2022-05-10
Filing date: 2022-05-10
Publication date: 2023-03-14
Anticipated expiration: 2032-05-10

Abstract

The utility model discloses a charactron test structure, including setting up in the test mechanism support and setting up the equipment base in the front portion of test mechanism support, place the detection charactron in the equipment base, the test mechanism support sets up first vertical moving mechanism, second vertical moving mechanism respectively near the upper and lower both ends of one side of equipment base, first vertical moving mechanism bottom sets up the first test connecting plate that extends to the direction of equipment base, the one end that first test connecting plate kept away from the test mechanism support sets up the locating plate downwards, the locating plate bottom sets up the constant head tank; the utility model discloses a first vertical moving mechanism drives test connecting plate, locating plate downstream, makes the locating plate press and waits to detect the charactron top and fix a position, drives second test connecting plate, test version rebound through second vertical moving mechanism for the conical contact groove at test probe top with wait to detect each pin needle contact in charactron bottom, can connect each pin needle simultaneously, the operation detects, improves detection efficiency greatly.

Description

Nixie tube test structure

Technical Field

The utility model relates to a charactron processing field, concretely relates to charactron test structure.

Background

The nixie tube is a display screen, and can display numbers by inputting relative currents to different pins of the nixie tube and enabling the nixie tube to shine and emit light. Because it is cheap and simple, it can be widely used in electric appliances. The nixie tube test is mainly used for detecting the polarity of nixie tubes with different digits, can contrast brightness according to the specifications of the nixie tubes, and is particularly used for sample verification, production and maintenance, brightness contrast during incoming materials of suppliers, detection of aging conditions of the nixie tubes under different current intensities and the like. At present, all pins of the test are manually inserted into the pin connectors and then the power supply is switched on for testing, the test mode of manually inserting the pins can meet certain use requirements, but the test mode also has the defects of high labor intensity, high labor cost, inaccurate pin alignment, low test accuracy and incapability of meeting the use requirements due to the fact that the number of the pins of a product is large, and the trouble and low efficiency of pin plugging and unplugging are caused.

SUMMERY OF THE UTILITY MODEL

In order to solve the technical problem, the utility model provides a technical scheme does: a nixie tube testing structure comprises an assembling base arranged on a testing mechanism support and arranged in front of the testing mechanism support, wherein a nixie tube to be tested is placed in the assembling base, a first vertical moving mechanism and a second vertical moving mechanism are respectively arranged at the upper end and the lower end of one side, close to the assembling base, of the testing mechanism support, a first testing connecting plate extending towards the assembling base is arranged at the bottom of the first vertical moving mechanism, a positioning plate is downwards arranged at one end, away from the testing mechanism support, of the first testing connecting plate, and a positioning groove is formed in the bottom of the positioning plate; the bottom of the second vertical moving mechanism is provided with a second testing connecting plate extending towards the direction of the assembling base, one end, away from the testing mechanism support, of the second testing connecting plate is upwards provided with a testing plate, the top of the testing plate is provided with a testing probe, the testing plate and the positioning plate correspond to each other in the vertical position and correspond to a to-be-detected nixie tube in the assembling base on the assembling base from top to bottom.

Further, the first vertical moving mechanism and the second vertical moving mechanism are the same in structure, the first vertical moving mechanism comprises a guide slide rail arranged on the testing mechanism support, a sliding plate is arranged on the guide slide rail in a matched mode, a pushing plate extending to the bottom of the guide slide rail is arranged at the bottom of the sliding plate, and a pushing cylinder connected with the pushing plate is arranged in the guide slide rail.

Furthermore, a pin joint is arranged at the top of the test probe, and a conical contact groove is arranged on the top surface of the pin joint downwards.

Further, the assembly base comprises a bottom base, a workpiece positioning groove with an opening in the upper portion of the bottom base, end positioning blocks are arranged at two ends of the workpiece positioning groove respectively, a workpiece placing area is formed between the end positioning blocks and the workpiece positioning groove, and a workpiece detection hole corresponding to the workpiece placing area is formed in the bottom base.

Furthermore, clamping positioning grooves corresponding to the nixie tubes are respectively arranged on the bottom bases on two sides of the workpiece placing area.

Further, the end positioning block is fixed with the bottom base through a bolt.

Furthermore, the top surface of the positioning groove is an inclined surface which corresponds to the top surface of the nixie tube base in an inclined angle.

Further, the test mechanism support comprises a test mechanism support base and a support front plate which is arranged at the front part of the test support base and connected with the first vertical moving mechanism and the second vertical moving mechanism, and a triangular reinforcing plate is arranged between the support front plate and the support base.

After the scheme more than adopting, the utility model has the advantages of as follows: the utility model discloses a first vertical moving mechanism drives test connecting plate, locating plate downstream, makes the locating plate press and waits to detect the charactron top and fix a position, drives second test connecting plate, test version rebound through second vertical moving mechanism for the conical contact groove at test probe top with wait to detect each pin needle contact in charactron bottom, can connect each pin needle simultaneously, the operation detects, improves detection efficiency greatly.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention, and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to these drawings without inventive efforts.

Fig. 1 is a schematic structural diagram of the nixie tube testing structure of the present invention.

Fig. 2 is a schematic structural diagram of the nixie tube testing structure of the present invention.

Fig. 3 is a schematic view of the contact between the test probe and the nixie tube to be tested in the nixie tube test structure of the present invention.

Fig. 4 is a schematic diagram of a front structure of a first vertical moving mechanism in a nixie tube testing structure of the present invention.

Fig. 5 is a schematic diagram of a rear structure of a first vertical moving mechanism in a nixie tube test structure of the present invention.

Fig. 6 is a schematic cross-sectional view of a test probe in the nixie tube test structure of the present invention.

Fig. 7 is a schematic structural diagram of an assembly base in a nixie tube test structure according to the present invention.

Fig. 8 is a schematic structural diagram of a bottom base in the nixie tube test structure of the present invention.

Fig. 9 is a schematic diagram of a combination of the assembly base and the to-be-detected nixie tube in the nixie tube testing structure of the present invention.

Detailed Description

To make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the attached drawings in the embodiments of the present invention are combined to clearly and completely describe the technical solution in the embodiments of the present invention, and obviously, the described embodiments are part of the embodiments of the present invention, rather than all embodiments. The components of embodiments of the present invention, as generally described and illustrated in the figures herein, may be arranged and designed in a wide variety of different configurations.

Thus, the following detailed description of the embodiments of the invention, as presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.

It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.

In the description of the embodiments of the present invention, it should be noted that, if the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer" and the like indicate the position or positional relationship based on the position or positional relationship shown in the drawings, or the position or positional relationship which is usually placed when the product of the present invention is used, the description is only for convenience of description of the present invention and simplification, but the indication or suggestion that the device or element to be referred must have a specific position, be constructed and operated in a specific position, and therefore, the present invention should not be construed as being limited thereto. Furthermore, the terms "first," "second," "third," and the like are used solely to distinguish one from another, and are not to be construed as indicating or implying relative importance.

Furthermore, the terms "horizontal", "vertical", "suspended" and the like do not require that the components be absolutely horizontal or suspended, but may be slightly inclined. For example, "horizontal" merely means that the direction is more horizontal than "vertical" and does not mean that the structure must be perfectly horizontal, but may be slightly inclined.

In the description of the embodiments of the present invention, "a plurality" means at least 2.

In the description of the embodiments of the present invention, it should be further noted that unless explicitly stated or limited otherwise, the terms "disposed," "mounted," "connected," and "connected" should be interpreted broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.

Examples

With reference to the attached drawings 1-9, a nixie tube testing structure comprises an assembly base 2 arranged on a testing mechanism support 1 and arranged in front of the testing mechanism support 1, a nixie tube 3 to be tested is placed in the assembly base 2, the upper end and the lower end of one side, close to the assembly base 2, of the testing mechanism support 1 are respectively provided with a first vertical moving mechanism 4 and a second vertical moving mechanism 5, the bottom of the first vertical moving mechanism 4 is provided with a first testing connecting plate 6 extending towards the direction of the assembly base 2, one end, away from the testing mechanism support 1, of the first testing connecting plate 6 is downwards provided with a positioning plate 7, the bottom of the positioning plate 7 is provided with a positioning groove 8, the top surface of the positioning groove 8 is an inclined surface, and the inclined surface corresponds to the inclined angle of the top surface of the nixie tube base; a second testing connecting plate 9 extending towards the direction of the assembly base 2 is arranged at the bottom of the second vertical moving mechanism 5, a testing plate 10 is arranged upwards at one end, away from the testing mechanism support 1, of the second testing connecting plate 9, a testing probe 11 is arranged at the top of the testing plate 10, a pin joint 12 is arranged at the top of the testing probe 11, and a conical contact groove 13 is formed downwards in the top surface of the pin joint 12; the test board 10 and the positioning board 7 correspond to each other in the vertical position and correspond to the nixie tube 3 to be detected in the assembly base on the assembly base 2 in the vertical position.

The first vertical moving mechanism 4 and the second vertical moving mechanism 5 are identical in structure, the first vertical moving mechanism 4 comprises a guide slide rail 401 arranged on the testing mechanism support 1, a sliding plate 402 is arranged on the guide slide rail 401 in a matched mode, a pushing plate 403 extending to the bottom of the guide slide rail 401 is arranged at the bottom of the sliding plate 402, and a pushing cylinder 404 connected with the pushing plate 403 is arranged in the guide slide rail 401.

The assembly base 2 comprises a bottom base 201 and a workpiece positioning groove 202 with an opening at the upper part of the bottom base 201, wherein end positioning blocks 203 are respectively arranged at two ends of the workpiece positioning groove 202, so that a workpiece placing area 204 is formed between the end positioning blocks 203 and the workpiece positioning groove 202, and a workpiece detection hole 205 corresponding to the workpiece placing area 204 is arranged on the bottom base 201; clamping positioning grooves 206 corresponding to the nixie tubes are respectively arranged on the bottom bases 201 on two sides of the workpiece placing area 205; the end positioning block 203 is fixed to the bottom base 201 by bolts.

The test mechanism support 1 comprises a test mechanism support base 101 and a support front plate 102 which is arranged at the front part of the test mechanism support base 101 and is connected with the first vertical moving mechanism 4 and the second vertical moving mechanism 5, and a triangular reinforcing plate 103 is arranged between the support front plate 102 and the support base 101.

The utility model discloses when using, the equipment base sets up on conveyer, convey to each process by conveyer, when the equipment base conveys to test procedure, first vertical moving mechanism drives the test connecting plate, the locating plate downstream, make the locating plate press and wait to detect the charactron top and fix a position, second vertical moving mechanism drives second test connecting plate, test version upward movement, make the conical contact groove at test probe top with wait to detect each pin needle contact in charactron bottom, test probe detects with outside upper computer connection, the host computer part does not belong to this scheme design content, when concrete implementation, can select according to particular case.

The present invention and the embodiments thereof have been described above, but the description is not limited thereto, and the embodiment shown in the drawings is only one of the embodiments of the present invention, and the actual structure is not limited thereto. In summary, those skilled in the art should understand that they should not be limited to the embodiments described above, and that they can design the similar structure and embodiments without departing from the spirit of the invention.

Claims

1. A nixie tube testing structure is characterized by comprising an assembling base arranged on a testing mechanism support and arranged in front of the testing mechanism support, wherein a nixie tube to be tested is placed in the assembling base, a first vertical moving mechanism and a second vertical moving mechanism are respectively arranged at the upper end and the lower end of one side, close to the assembling base, of the testing mechanism support, the bottom of the first vertical moving mechanism is provided with a first testing connecting plate extending towards the assembling base, a positioning plate is downwards arranged at one end, far away from the testing mechanism support, of the first testing connecting plate, and a positioning groove is formed in the bottom of the positioning plate; the bottom of the second vertical moving mechanism is provided with a second testing connecting plate extending towards the direction of the assembling base, one end, far away from the testing mechanism support, of the second testing connecting plate is upwards provided with a testing plate, the top of the testing plate is provided with a testing probe, the testing plate and the positioning plate vertically correspond to each other and vertically correspond to a nixie tube to be detected in the assembling base on the assembling base.

2. The charactron testing structure of claim 1, wherein the first vertical moving mechanism and the second vertical moving mechanism are identical in structure, the first vertical moving mechanism comprises a guide slide rail disposed on the testing mechanism support, a slide plate is disposed on the guide slide rail in a matching manner, a pushing plate extending to the bottom of the guide slide rail is disposed at the bottom of the slide plate, and a pushing cylinder connected to the pushing plate is disposed in the guide slide rail.

3. The nixie tube test structure according to claim 1, wherein the top of the test probe is provided with a pin joint, and the top surface of the pin joint is provided with a tapered contact groove.

4. The nixie tube testing structure according to claim 1, wherein the assembly base includes a bottom base, the bottom base has a workpiece positioning slot with an opening at an upper portion thereof, end positioning blocks are respectively disposed at two ends of the workpiece positioning slot, such that a workpiece placing area is formed between the end positioning blocks and the workpiece positioning slot, and the bottom base has a workpiece detecting hole corresponding to the workpiece placing area.

5. The nixie tube test structure according to claim 4, wherein the bottom bases on both sides of the workpiece placement area are respectively provided with a clamping positioning groove corresponding to the nixie tube.

6. The charactron test structure of claim 4, wherein the end positioning block is secured to the bottom base by a bolt.

7. The nixie tube test structure according to claim 1, wherein the top surface of the positioning groove is an inclined surface corresponding to the top surface of the nixie tube base in inclination angle.

8. The nixie tube testing structure according to claim 1, wherein the testing mechanism holder includes a testing mechanism holder base, a holder front plate disposed at a front portion of the testing mechanism holder base and connected to the first vertical moving mechanism and the second vertical moving mechanism, and a triangular reinforcing plate is disposed between the holder front plate and the holder base.