CN218584554U

CN218584554U - Slideway type memory card testing device with angle

Info

Publication number: CN218584554U
Application number: CN202222732705.5U
Authority: CN
Inventors: 谭超
Original assignee: Shenzhen Youlin Electronic Co ltd
Current assignee: Shenzhen Youlin Electronic Co ltd
Priority date: 2022-10-17
Filing date: 2022-10-17
Publication date: 2023-03-07
Anticipated expiration: 2032-10-17

Abstract

The utility model discloses a slideway type memory card testing device with an angle, which comprises a frame, wherein a testing platform is arranged on the frame, a plurality of rows of slideways and a plurality of rows of placing grooves are arranged on the testing platform, one end of each slideway is communicated with the placing grooves, an electric slide rail is arranged in each slideway in a sliding manner, a sliding table is arranged on each electric slide rail in a sliding manner, an impact block is fixed on one side of each sliding table, and an impact part is arranged on each impact block; a connecting block is arranged in the placing groove, a limiting groove is formed in the connecting block, a central limiting column is arranged at the bottom of the limiting groove, and a limiting clamping groove is formed in the central limiting column; the surface of connecting block sets up the external screw thread, and the inner wall of standing groove sets up the internal thread, and internal thread and external screw thread phase-match pass through threaded engagement after the connecting block inserts to the standing groove in, and the side of connecting block sets up a plurality of jacks, and the diameter of striking portion is less than the diameter of jack. The utility model discloses be convenient for operate, be convenient for carry on the crashproof test of storage card resistance to compression, easy operation can follow a plurality of angles and carry out the test to the storage card, and the measuring accuracy is high.

Description

Slideway type memory card testing device with angle

Technical Field

The utility model relates to a storage card test field, concretely relates to slide formula storage card testing arrangement who has angle.

Background

The SD card is an independent storage medium used in mobile phones, digital cameras, portable computers, MP3 and other digital products, and is generally in the form of a card, and is also called a "memory card", which is also called a "digital memory card", a "memory card", or the like.

The existing memory card is often required to be tested before being put into specific use, such as waterproofness, pressure resistance and the like, and if the performances are poor, the possibility of failure of the memory card after long-time use is easy to cause data loss and great loss.

Therefore, it is very necessary to test the compression resistance of the memory card, and a structure capable of performing a rapid compression and collision resistance test on the memory card and performing the compression and collision resistance test from a plurality of positions is urgently needed.

SUMMERY OF THE UTILITY MODEL

The utility model aims to solve the technical problem that a slideway type memory card testing device with an angle can quickly test the compression resistance and collision avoidance of a memory card by impacting the memory card through an impacting part; the compression resistance test of the storage card can be carried out from multiple angles, and the effect is better.

The utility model discloses a realize through following technical scheme: a slideway type memory card testing device with an angle comprises a rack, wherein a testing platform is arranged on the rack, a plurality of rows of slideways and a placing groove are arranged on the testing platform, one end of each slideway is communicated with the placing groove, an electric sliding rail is arranged in each slideway in a sliding manner, a sliding table is arranged on each electric sliding rail in a sliding manner, an impact block is fixed on one side of each sliding table, and an impact part is arranged on each impact block; set up the connecting block in the standing groove, set up the spacing groove on the connecting block, the tank bottom of spacing groove sets up the spacing post in center, sets up spacing draw-in groove on the spacing post in center.

As the preferred technical scheme, the placing groove is arranged at the central position of the test platform.

As preferred technical scheme, the surface of connecting block sets up the external screw thread, and the inner wall of standing groove sets up the internal thread, and internal thread and external screw thread phase-match, connecting block insert to the standing groove in back through thread engagement, the side of connecting block sets up a plurality of jacks, the diameter of striking portion is less than the diameter of jack, striking portion passes the jack and inserts to the spacing inslot.

As a preferred technical scheme, a control panel is arranged on the rack.

As the preferred technical scheme, the sliding table is provided with an extension part, aligned screw holes are formed between the extension part and the sliding block, and screws are inserted into the screw holes for fixing.

Preferably, the impact block is provided with a pressure sensor.

As the preferred technical scheme, the jacks are arranged on the connecting block from top to bottom.

As the preferred technical scheme, a colloidal layer is fixed on the groove wall of the limiting groove.

The utility model has the advantages that: the utility model has convenient test, can carry out the compression resistance and collision resistance test of the memory card from a plurality of angles and a plurality of positions, and has simple operation; the storage card is convenient for limit and fix, convenient for test and simple in operation.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the description below are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.

Fig. 1 is a front view of the present invention;

FIG. 2 is a connection diagram of the connection block and the test board of the present invention;

FIG. 3 is a sectional view of the structure of the present invention;

fig. 4 is an enlarged view of the point a of the present invention.

Detailed Description

All of the features disclosed in this specification, or all of the steps in any method or process so disclosed, may be combined in any combination, except combinations of features and/or steps that are mutually exclusive.

This specification includes any features disclosed in the appended claims, abstract and drawings, which are, unless expressly stated otherwise, replaceable with other equivalent or similarly purposed alternative features. That is, unless expressly stated otherwise, each feature is only an example of a generic series of equivalent or similar features.

As shown in fig. 1 to 4, the device comprises a rack 1, wherein a testing platform 2 is arranged on the rack 1, a plurality of rows of slideways 3 and placing grooves 4 are arranged on the testing platform 2, one ends of the slideways 3 are communicated with the placing grooves 4, electric sliding rails 5 are arranged in the slideways 3 in a sliding manner, sliding tables 6 are arranged on the electric sliding rails 5 in a sliding manner, impact blocks 7 are fixed on one sides of the sliding tables 6, and impact parts 27 are arranged on the impact blocks 7; set up connecting block 8 in the standing groove 4, set up spacing groove 9 on the connecting block 8, the tank bottom of spacing groove 9 sets up central spacing post 10, sets up spacing draw-in groove 13 on the spacing post 10 in center.

Wherein the placing groove 4 is arranged at the center position of the testing platform 2.

Wherein, connecting block 8's surface sets up the external screw thread, and the inner wall of standing groove 4 sets up the internal thread, and internal thread and external screw thread phase-match, connecting block 8 insert through the thread engagement in standing groove 4 back, and connecting block 8's side sets up a plurality of jacks 12, and striking portion 27's diameter is less than the diameter of jack 12, and striking portion 27 passes jack 12 and inserts to spacing groove 9 in.

Wherein, a control panel 14 is arranged on the frame 1, and the control panel is provided with a display screen, keys and other structures.

Wherein, the slip table 6 is provided with an integrated extension part, aligned screw holes are arranged between the extension part and the slide block, and screws are inserted into the screw holes for fixation.

Wherein, the impact block 7 is provided with a pressure sensor which is used for collecting the numerical value generated by the contact between the impact block and the memory card, and the numerical value is displayed on the display screen of the control panel. The rack is internally provided with a general control main board, a power supply and other structures, and a pressure sensor, an electric sliding rail, a control panel and the like are all connected with the control main board.

Wherein, the jack 12 is arranged on the connecting block 8 from top to bottom.

Wherein, the fixed colloidal layer 19 of cell wall of spacing groove 9, when using, in memory card one side inserts to spacing draw-in groove, and its opposite side and colloidal layer are contradicted for spacing memory card.

When the card is used, one end of the storage card is inserted into the limiting card slot. Then control electronic slide rail, slip table through control panel, the slip table removes and has driven the removal of striking piece, striking portion, and striking portion passes jack striking memory card, and the speed of slip removal, by slow to fast, when observing what kind of speed, the striking portion on the striking piece of being connected with the slip table can break or hit and damage the memory card to take notes corresponding numerical value, reachs the resistance to compression anti-collision effect of memory card.

And the slide rails are distributed on the side face of the connecting block in a multi-angle manner, so that the impact block connected with the slide rails can impact the memory card from multiple angles, and the test of the memory card is facilitated.

The above description is only for the specific embodiments of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that are not thought of through the creative work should be covered within the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the protection scope defined by the claims.

Claims

1. A kind of slideway type memory card testing device with angle, characterized by that: the device comprises a rack (1), wherein a testing platform (2) is arranged on the rack (1), a plurality of rows of slideways (3) and a plurality of rows of placing grooves (4) are arranged on the testing platform (2), one ends of the slideways (3) are communicated with the placing grooves (4), electric sliding rails (5) are arranged in the slideways (3) in a sliding manner, sliding tables (6) are arranged on the electric sliding rails (5) in a sliding manner, impact blocks (7) are fixed on one sides of the sliding tables (6), and impact parts (27) are arranged on the impact blocks (7); set up connecting block (8) in standing groove (4), set up spacing groove (9) on connecting block (8), the tank bottom of spacing groove (9) sets up central spacing post (10), sets up spacing draw-in groove (13) on central spacing post (10).

2. The angled slide-type memory card testing apparatus of claim 1, wherein: the placing groove (4) is arranged in the center of the test platform (2).

3. The angled slide-type memory card testing device of claim 1, wherein: the surface of connecting block (8) sets up the external screw thread, and the inner wall of standing groove (4) sets up the internal thread, internal thread and external screw thread phase-match, and connecting block (8) are inserted through threaded engagement behind standing groove (4), and the side of connecting block (8) sets up a plurality of jacks (12), and the diameter of striking portion (27) is less than the diameter of jack (12), and striking portion (27) pass jack (12) and insert to spacing groove (9) in.

4. The angled slide-type memory card testing device of claim 1, wherein: a control panel (14) is arranged on the frame (1).

5. The angled slide-type memory card testing device of claim 1, wherein: an extension part is arranged on the sliding table (6), aligned screw holes are formed between the extension part and the sliding block, and screws are inserted into the screw holes for fixation.

6. The angled slide-type memory card testing device of claim 1, wherein: the impact block (7) is provided with a pressure sensor.

7. The angled slide-type memory card testing apparatus of claim 1, wherein: the jack (12) is arranged on the connecting block (8) from top to bottom.

8. The angled slide-type memory card testing device of claim 1, wherein: a colloidal layer (19) is fixed on the groove wall of the limit groove (9).