CN218546924U

CN218546924U - High-efficient chip testing device

Info

Publication number: CN218546924U
Application number: CN202123050582.9U
Authority: CN
Inventors: 张�成; 姚燕杰; 王丽; 位贤龙
Original assignee: Jiangsu A Kerr Bio Identification Technology Co Ltd
Current assignee: Jiangsu A Kerr Bio Identification Technology Co Ltd
Priority date: 2021-12-07
Filing date: 2021-12-07
Publication date: 2023-02-28
Anticipated expiration: 2031-12-07

Abstract

The utility model discloses a high-efficient chip testing arrangement, include: the cabinet body, a plurality of drawer is installed to the equal drawable ground in the preceding, the back both sides of the cabinet body, every the chip groove that is used for placing the chip that awaits measuring is offered to the upper surface of drawer, cabinet body bottom is provided with a bottom plate, and four corners of this bottom plate lower surface are provided with the footing with ground contact, two arc spouts along circumference distribution are seted up to the upper surface of bottom plate, two at least travelers are installed to cabinet body bottom surface, in the arc spout that the traveler embedding corresponds to can slide at the arc spout. The utility model discloses can realize getting fast convenient the getting of chip in the less space to the two-sided drawer and put, improve the efficiency of processing.

Description

High-efficient chip testing device

Technical Field

The utility model relates to a high-efficient chip testing arrangement belongs to optical communication chip test technical field.

Background

The aging test project is a process of simulating various factors related to a product in actual use conditions to carry out corresponding condition strengthening experiments on the aging condition of the product, and common aging mainly comprises illumination aging, damp-heat aging and hot air aging. The existing high-efficiency chip testing device is generally in the shape of a cabinet as a whole, the chip is subjected to hot air blowing ageing treatment by a fan and a heater at the top, and the chip subjected to ageing treatment is tested by a detection pin. However, the cabinet body of the existing chip aging test device is generally small, and the chips are placed on a single surface, so that the number of the chips subjected to one-time aging treatment is small, and the working efficiency is low.

SUMMERY OF THE UTILITY MODEL

The utility model aims at providing a high-efficient chip testing arrangement, this high-efficient chip testing arrangement can realize in less space getting fast of chip in the drawer of two sides conveniently and putting, improves the efficiency of processing.

In order to achieve the above purpose, the utility model adopts the technical scheme that: an efficient chip testing device, comprising: the chip testing device comprises a cabinet body, wherein a plurality of drawers are arranged on the front side and the rear side of the cabinet body in a drawable manner, a chip groove for placing a chip to be tested is formed in the upper surface of each drawer, a bottom plate is arranged at the bottom of the cabinet body, bottom feet which are contacted with the ground are arranged at four corners of the lower surface of the bottom plate, two arc-shaped sliding grooves which are distributed along the circumferential direction are formed in the upper surface of the bottom plate, at least two sliding columns are arranged on the bottom surface of the cabinet body, and the sliding columns are embedded into the corresponding arc-shaped sliding grooves and can slide in the arc-shaped sliding grooves;

the roof that a level set up is installed on the internal upper portion of cabinet, this roof all around the edge all with cabinet internal wall sealing connection to form a heating chamber between roof and the cabinet body, cabinet body top install with the fan of heating chamber intercommunication, the cabinet is internal and lie in the heating chamber below and set up the wind channel that a plurality of layers were arranged along vertical direction interval, preceding, back both ends that the wind channel link up separately with preceding, the back inner wall connection of the cabinet body, wind channel confined left and right both ends set up with the left and right inner wall interval of the cabinet body separately, between the upper and lower adjacent two-layer wind channel, lie in between the wind channel of superiors and the heating chamber all through the tuber pipe intercommunication of many vertical settings, slidable mounting has on the upper surface in every layer of wind channel the drawer.

The further improved scheme in the technical scheme is as follows:

1. in the scheme, the lower surface of the top plate or the air channel above each drawer is provided with the testing mechanism corresponding to the drawer.

2. In the above scheme, the fan is rotationally connected with the top surface of the cabinet body through the bearing.

3. In the scheme, the edge of the drawer is connected with the cabinet body through at least one group of slots and the inserting columns in a matched mode.

4. In the above scheme, the left and right ends of the air duct at the lowest layer are provided with air exhaust holes, and the lower part of the cabinet body is provided with air outlets communicated with the air exhaust holes.

Because of above-mentioned technical scheme's application, compared with the prior art, the utility model have the following advantage:

the utility model discloses high-efficient chip testing arrangement, it is through all setting up the drawer of sliding connection around the cabinet body, has both improved the space utilization of the internal portion of cabinet, and is convenient for again get in and put the chip in the drawer, and further, through the rotation between cabinet body whole and bottom plate, realize getting in and putting fast convenient of chip in the drawer of two sides in less space, further improve the efficiency of processing; in addition, it is connected the heating chamber of roof top with every layer of wind channel through the tuber pipe to hug closely the wind channel setting with the drawer bottom surface, thereby will heat in the intracavity through heating and the even steam of temperature evenly send into each layer of wind channel, heat the drawer of the examination chip of awaiting measuring of placing of wind channel top, make the examination chip of awaiting measuring of each position of the internal cabinet be heated balancedly, thereby guarantee the uniformity and the comparability of test data.

Drawings

FIG. 1 is a schematic structural view of the high-efficiency chip testing device of the present invention;

FIG. 2 is a structural bottom view of the high-efficiency chip testing device of the present invention;

FIG. 3 is a schematic side-sectional view of the high-efficiency chip testing device of the present invention;

FIG. 4 is a schematic diagram of a front-cut structure of the high-efficiency chip testing device of the present invention;

FIG. 5 is a first schematic structural view of the drawer opening state of the high-efficiency chip testing device of the present invention;

FIG. 6 is a second schematic structural view of the high-efficiency chip testing device according to the present invention showing the opened state of the drawer;

FIG. 7 is an enlarged view of the structure of FIG. 3 at A;

FIG. 8 is an enlarged view of the structure of FIG. 4 at B;

FIG. 9 is an enlarged view of the structure of FIG. 5 at C;

fig. 10 is an enlarged view of the structure at D in fig. 6.

In the above drawings: 1. a cabinet body; 2. an air duct; 3. a drawer; 4. a handle; 5. a chip slot; 6. a base plate; 7. a traveler; 8. an arc-shaped chute; 9. inserting a column; 10. a slot; 11. a fan; 12. footing; 13. an air exhaust hole; 14. a top plate; 15. a heating cavity; 16. and (7) an air pipe.

Detailed Description

In the description of this patent, it is noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore should not be construed as limiting the present invention; the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance; furthermore, unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, as they may be fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The meaning of the above terms in this patent may be specifically understood by those of ordinary skill in the art.

Example 1: an efficient chip testing device, comprising: the chip testing cabinet comprises a cabinet body 1, wherein a plurality of drawers 3 are arranged on the front side and the rear side of the cabinet body 1 in a drawable manner, a chip groove 5 for placing a chip to be tested is arranged on the upper surface of each drawer 3, a bottom plate 6 is arranged at the bottom of the cabinet body 1, bottom feet 12 which are in contact with the ground are arranged at four corners of the lower surface of the bottom plate 6, two arc-shaped sliding grooves 8 which are distributed along the circumferential direction are arranged on the upper surface of the bottom plate 6, at least two sliding columns 7 are arranged on the bottom surface of the cabinet body 1, and the sliding columns 7 are embedded into the corresponding arc-shaped sliding grooves 8 and can slide in the arc-shaped sliding grooves 8;

the roof 14 that a level set up is installed on the internal upper portion of cabinet 1, this roof 14 edge all around all with 1 internal wall sealing connection of the cabinet to form a heating chamber 15 between roof 14 and the cabinet body 1, the cabinet body 1 top install with the fan 11 of heating chamber 15 intercommunication, the internal wind channel 2 that sets up a plurality of layers of arranging along vertical direction interval that is located heating chamber 15 below of cabinet, preceding, back both ends that wind channel 2 link up separately with the preceding, the back wall connection of the cabinet body 1, wind channel 2 confined left and right both ends set up with the left and right inner wall interval of the cabinet body 1 separately, between the upper and lower adjacent two-layer wind channel 2, lie in between the wind channel 2 of the superiors and the heating chamber 15 all through the 16 intercommunications of tuber pipe of many vertical settings, and slidable mounting has on the upper surface of every layer of wind channel 2 drawer 3.

A testing mechanism corresponding to the drawer 3 is arranged on the top plate 14 above each drawer 3 or the lower surface of the air duct 2; the air duct 2 is obtained by integrally forming and processing an aluminum plate;

the fan 11 is rotatably connected with the top surface of the cabinet body 1 through a bearing; the edge of the drawer 3 is connected with the cabinet 1 through at least one group of slots 10 and the inserting columns 9 in a matching way.

Example 2: an efficient chip testing device, comprising: the chip testing cabinet comprises a cabinet body 1, wherein a plurality of drawers 3 are arranged on the front side and the rear side of the cabinet body 1 in a drawable manner, a chip groove 5 for placing a chip to be tested is arranged on the upper surface of each drawer 3, a bottom plate 6 is arranged at the bottom of the cabinet body 1, bottom feet 12 which are in contact with the ground are arranged at four corners of the lower surface of the bottom plate 6, two arc-shaped sliding grooves 8 which are distributed along the circumferential direction are arranged on the upper surface of the bottom plate 6, at least two sliding columns 7 are arranged on the bottom surface of the cabinet body 1, and the sliding columns 7 are embedded into the corresponding arc-shaped sliding grooves 8 and can slide in the arc-shaped sliding grooves 8;

The left end and the right end of the air duct 2 positioned at the lowest layer are provided with air exhaust holes 13, and the lower part of the cabinet body 1 is provided with an air outlet communicated with the air exhaust holes 13;

a heating wire is arranged in the heating cavity 15, and the area of the drawer 3 provided with the chip groove 5 is made of heat-conducting metal; the air duct 2 is obtained by integrally forming and processing a copper plate; the end surface of one end of the drawer 3 far away from the cabinet body 1 is provided with a handle 4.

When the high-efficiency chip testing device is adopted, the working principle is as follows: when the device is used, the drawer 3 can be drawn out by holding the handle 4, a chip to be tested is placed in the chip groove 5, the drawer 3 can be pushed back, the inserting column 9 is inserted into the inserting groove 10, the drawer 3 can be fixed, when the chip is required to be placed on the other side, the cabinet body 1 only needs to be rotated, the sliding column 7 is matched with the arc-shaped sliding groove 8, the rotating range of the cabinet body 1 can be limited, and the wire is prevented from being damaged due to overlarge rotating range;

starting the fan 11, the fan 11 can drive the air in the cabinet body 1 to flow, so that the air is blown in from the top of the cabinet body 1 after being heated from the fan 11, the hot air entering the cabinet body 1 can respectively enter each layer of air channel 2 through the air pipe 16, and the chips are heated through the heat conductivity of the air channels 2 and the drawers 3;

the drawers which are connected in a sliding mode are arranged at the front and the rear of the cabinet body, so that the space utilization rate of the interior of the cabinet body is improved, chips in the drawers are convenient to take and place, and further, the chips in the drawers on two sides can be taken and placed quickly and conveniently in a small space through rotation between the whole cabinet body and the bottom plate, and the processing efficiency is further improved;

in addition, the heating chamber above the top plate is connected with each layer of air channel through the air pipe, and the bottom surface of the drawer is tightly attached to the air channel, so that hot air in the heating chamber is uniformly fed into each layer of air channel through heating and uniform temperature, the drawer above the air channel, on which the chips to be tested are placed, is heated, the chips to be tested at all positions in the cabinet body are heated uniformly, and the consistency and the comparability of test data are ensured.

The above embodiments are only for illustrating the technical concept and features of the present invention, and the purpose of the embodiments is to enable people skilled in the art to understand the contents of the present invention and to implement the present invention, which cannot limit the protection scope of the present invention. All equivalent changes and modifications made according to the spirit of the present invention should be covered by the protection scope of the present invention.

Claims

1. An efficient chip testing device, comprising: cabinet body (1), its characterized in that: the multifunctional wardrobe is characterized in that a plurality of drawers (3) are installed on the front side and the rear side of the wardrobe body (1) in a drawable manner, a chip groove (5) for placing a chip to be tested is formed in the upper surface of each drawer (3), a bottom plate (6) is arranged at the bottom of the wardrobe body (1), bottom feet (12) which are in contact with the ground are arranged at four corners of the lower surface of the bottom plate (6), two arc-shaped sliding grooves (8) which are distributed along the circumferential direction are formed in the upper surface of the bottom plate (6), at least two sliding columns (7) are installed on the bottom surface of the wardrobe body (1), and the sliding columns (7) are embedded into the corresponding arc-shaped sliding grooves (8) and can slide in the arc-shaped sliding grooves (8);

roof (14) that a level set up are installed on upper portion in the cabinet body (1), this roof (14) edge all around all with the cabinet body (1) inner wall sealing connection to form a heating chamber (15) between roof (14) and the cabinet body (1), the cabinet body (1) top install with fan (11) of heating chamber (15) intercommunication, set up wind channel (2) that a plurality of layers were arranged along vertical direction interval in the cabinet body (1) and be located heating chamber (15) below, preceding, back both ends that wind channel (2) link up are separately with preceding, the back wall connection of the cabinet body (1), wind channel (2) confined left and right both ends set up with the left and right inner wall interval of the cabinet body (1) separately, between upper and lower adjacent two-layer wind channel (2), lie in between wind channel (2) of the superiors and the heating chamber (15) all through tuber pipe (16) of many vertical settings, slidable mounting has on the upper surface of every layer of wind channel (2) drawer (3).

2. The high efficiency chip test apparatus of claim 1, wherein: and a testing mechanism corresponding to the drawer (3) is arranged on the lower surface of the top plate (14) or the air duct (2) above each drawer (3).

3. The high efficiency chip test apparatus according to claim 1 or 2, wherein: the fan (11) is rotatably connected with the top surface of the cabinet body (1) through a bearing.

4. The high efficiency chip test apparatus according to claim 1 or 2, wherein: the edge of the drawer (3) is connected with the cabinet body (1) through at least one group of slots (10) and inserting columns (9) in a matched mode.

5. The high efficiency chip test apparatus of claim 1, wherein: the left end and the right end of the air duct (2) positioned at the lowest layer are provided with air exhaust holes (13), and the lower part of the cabinet body (1) is provided with an air outlet communicated with the air exhaust holes (13).