CN114295956A - Aging test device for chip detection - Google Patents
Aging test device for chip detection Download PDFInfo
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- CN114295956A CN114295956A CN202111483457.9A CN202111483457A CN114295956A CN 114295956 A CN114295956 A CN 114295956A CN 202111483457 A CN202111483457 A CN 202111483457A CN 114295956 A CN114295956 A CN 114295956A
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- cabinet body
- drawer
- chip
- air
- wind channel
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- 238000012360 testing method Methods 0.000 title claims abstract description 46
- 230000032683 aging Effects 0.000 title abstract description 20
- 238000001514 detection method Methods 0.000 title abstract description 10
- 238000007689 inspection Methods 0.000 claims description 7
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims description 3
- 239000010949 copper Substances 0.000 claims description 3
- 229910052751 metal Inorganic materials 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 3
- 238000012545 processing Methods 0.000 claims description 3
- 238000010438 heat treatment Methods 0.000 abstract description 8
- 230000002093 peripheral effect Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 230000005389 magnetism Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 238000005728 strengthening Methods 0.000 description 1
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Abstract
The invention discloses an aging test device for chip detection, which comprises: the cabinet body and a plurality of movable mounting are in the internal drawer of cabinet, the cabinet is internal and lie in the cavity below and set up the wind channel that a plurality of layers were arranged along vertical direction interval, preceding, back both ends that the wind channel link up separately with preceding, the back inner wall connection of the cabinet body, wind channel confined left and right both ends set up with the left and right inner wall interval of the cabinet body separately, between the upper and lower adjacent two-layer wind channel, lie in all through many vertical setting's tuber pipe intercommunication between the wind channel of the superiors and the cavity, lie in and offer on the roof of drawer top or the lower surface in wind channel with a plurality of wind hole of cavity or wind channel intercommunication that corresponds. The invention can not only ensure that the chips to be tested at each position in the cabinet body are heated evenly, ensure the consistency and comparability of test data, but also improve the heating uniformity of each chip and further improve the test precision of the chips.
Description
Technical Field
The invention relates to an aging test device for chip detection, and belongs to the technical field of optical communication chip testing.
Background
The aging test project is a process of simulating various factors related to a product in actual use conditions to carry out corresponding condition strengthening experiments on the aging condition of the product, and common aging mainly comprises illumination aging, damp-heat aging and hot air aging. The existing aging test device for chip detection is generally in a cabinet shape as a whole, the chip is subjected to hot air blowing aging treatment by a fan and a heater at the top, and the chip subjected to aging treatment is tested by a probe pin. However, the existing chip aging test device blows hot air downwards through the top, the upper drawer can block the lower chips from the wind, the aging degree of each chip is different, and the test result can be influenced.
Disclosure of Invention
The invention aims to provide an aging test device for chip detection, which can ensure that chips to be tested at various positions in a cabinet body are heated uniformly, ensure the consistency and comparability of test data, improve the heating uniformity of each chip and further improve the test precision of the chips.
In order to achieve the purpose, the invention adopts the technical scheme that: a burn-in test apparatus for chip testing, comprising: the chip testing device comprises a cabinet body and a plurality of drawers which are movably arranged in the cabinet body, wherein a chip groove for placing a chip to be tested is formed in the upper surface of each drawer, a horizontally arranged top plate is arranged at the upper part in the cabinet body, and the peripheral edges of the top plate are hermetically connected with the inner wall of the cabinet body, so that a cavity is formed between the top plate and the cabinet body;
a plurality of layers of air channels which are arranged at intervals along the vertical direction are arranged in the cabinet body and below the cavity, the front end and the rear end of each air channel which are communicated with each other are respectively connected with the front inner wall and the rear inner wall of the cabinet body, the closed left end and the closed right end of each air channel are respectively arranged at intervals with the left inner wall and the right inner wall of the cabinet body, the air channels between the two layers of air channels which are adjacent from top to bottom and the air channels between the air channels at the uppermost layer are communicated with the cavity through a plurality of vertically arranged air pipes, the left end and the right end of the air channel at the bottommost layer are both provided with air exhaust holes, and the drawer is arranged on the upper surface of each air channel in a sliding manner;
the top in the cabinet body is provided with a heater, the heater is connected with a fan arranged on the top surface of the outer side of the cabinet body and used for heating gas from the fan, the lower parts of the left side and the right side of the cabinet body are respectively provided with a pipeline, one end of the pipeline is communicated with the interior of the cabinet body, and the other end of the pipeline is connected with the fan;
the utility model discloses a chip electric conduction test device, including the drawer, be located the roof of every drawer top or install the telescopic link that corresponds with the drawer on the lower surface in wind channel or the roof that is located every drawer top, set up on the lower surface in wind channel with the cavity or the wind channel intercommunication that correspond a plurality of wind hole, the wind hole is located the both sides of telescopic link, a circuit push pedal is installed to the lower extreme of telescopic link, be provided with on the circuit push pedal be used for with the chip inslot await measuring the stitch that the chip electric conduction was led to of awaiting measuring.
The further improved scheme in the technical scheme is as follows:
1. in the above scheme, the region of the drawer provided with the chip groove is made of heat-conducting metal.
2. In the above scheme, the air duct is obtained by integrally forming and processing an aluminum plate or a copper plate.
3. In the scheme, the end face of one end, far away from the cabinet body, of the drawer is provided with the handle.
4. In the scheme, the edge of the drawer is connected with the cabinet body through at least one group of slots and the inserting columns in a matched mode.
5. In the above scheme, install magnet in the slot, insert the post and insert the post for the magnetism that can with the magnet actuation.
6. In the scheme, the bottom surface of each drawer is connected with the upper surface of the corresponding air duct in a matched manner through at least two groups of limiting sliding grooves and sliding blocks.
Due to the application of the technical scheme, compared with the prior art, the invention has the following advantages:
according to the aging test device for chip detection, the cavity above the top plate is connected with each layer of air channel through the air pipe, and the bottom surface of the drawer is arranged in a manner of being tightly attached to the air channel, so that hot air heated in the cavity and with uniform temperature is uniformly fed into each layer of air channel, the drawer provided with the chips to be tested above the air channel is heated, the chips to be tested at each position in the cabinet body are heated uniformly, and the consistency and the comparability of test data are ensured; furthermore, through the matching arrangement of the fan, the pipeline and the air duct, the stable flow of hot air in the cabinet body can be ensured, secondary hot air which is used for heating the chip once can be recycled, the waste is avoided, the energy is saved, and the efficiency is improved; in addition, through the arrangement of the air holes in the lower surfaces of the top plate and the air duct, the flowing uniformity and the flowing sufficiency of hot air in the cabinet body can be improved, the chips to be tested can be heated from the upper part, the heating uniformity of each chip is improved, and the testing precision of the chips is further improved.
Drawings
FIG. 1 is a schematic structural diagram of an aging test device for chip detection according to the present invention;
FIG. 2 is a schematic side sectional view of the burn-in test apparatus for chip inspection according to the present invention;
FIG. 3 is a schematic front sectional view of the burn-in test apparatus for chip testing according to the present invention;
FIG. 4 is a schematic structural diagram of a second aging test apparatus for chip detection according to the present invention;
FIG. 5 is an enlarged view of the structure of FIG. 2 at A;
FIG. 6 is an enlarged view of the structure of FIG. 3 at B;
FIG. 7 is an enlarged view of the structure of FIG. 4 at C;
FIG. 8 is a schematic view of a drawer of the burn-in apparatus for chip testing according to the present invention.
In the above drawings: 1. a cabinet body; 2. an air duct; 3. a drawer; 4. a handle; 5. a chip slot; 6. a telescopic rod; 7. a circuit push plate; 8. a stitch; 9. inserting a column; 10. a slot; 11. a fan; 12. a heater; 13. a pipeline; 14. a top plate; 15. a wind hole; 16. an air duct; 21. a slider; 22. a limiting chute; 23. an air exhaust hole; 24. a cavity.
Detailed Description
In the description of this patent, it is noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the present invention; the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance; furthermore, unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, as they may be fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The meaning of the above terms in this patent may be specifically understood by those of ordinary skill in the art.
Example 1: a burn-in test apparatus for chip testing, comprising: the testing device comprises a cabinet body 1 and a plurality of drawers 3 movably arranged in the cabinet body 1, wherein a chip groove 5 for placing a chip to be tested is formed in the upper surface of each drawer 3, a top plate 14 which is horizontally arranged is arranged at the upper part in the cabinet body 1, and the peripheral edges of the top plate 14 are hermetically connected with the inner wall of the cabinet body 1, so that a cavity 24 is formed between the top plate 14 and the cabinet body 1;
a plurality of layers of air ducts 2 which are arranged at intervals along the vertical direction are arranged in the cabinet body 1 and below the cavity 24, the front end and the rear end of each air duct 2 which are communicated with the front inner wall and the rear inner wall of the cabinet body 1 are respectively connected, the closed left end and the closed right end of each air duct 2 are respectively arranged at intervals with the left inner wall and the right inner wall of the cabinet body 1, the air ducts 2 between the two layers of air ducts 2 which are adjacent from top to bottom and the air ducts 2 between the air ducts 2 at the uppermost layer and the cavity 24 are respectively communicated through a plurality of vertically arranged air pipes 16, the left end and the right end of the air duct 2 at the bottommost layer are respectively provided with an exhaust hole 23, and the drawer 3 is arranged on the upper surface of each layer of air duct 2 in a sliding manner;
a heater 12 is installed at the top inside the cabinet body 1, the heater 12 is connected with a fan 11 installed on the top surface of the outer side of the cabinet body 1 and heats air from the fan 11, a pipeline 13 with one end communicated with the inside of the cabinet body 1 is installed on the lower portions of the left side and the right side of the cabinet body 1, and the other end of the pipeline 13 is connected with the fan 11;
the telescopic link 6 that corresponds with drawer 3 is installed on the lower surface that is located roof 14 or wind channel 2 of every drawer 3 top, is located and offers a plurality of wind hole 15 with cavity 24 or wind channel 2 intercommunication that corresponds on the lower surface of roof 14 or wind channel 2 of drawer 3 top, wind hole 15 is located the both sides of telescopic link 6, a circuit push pedal 7 is installed to the lower extreme of telescopic link 6, be provided with on the circuit push pedal 7 be used for with the chip groove 5 internal examination of awaiting measuring the stitch 8 of chip electric conductance expert.
The area of the drawer 3 provided with the chip groove 5 is made of heat-conducting metal; the air duct 2 is obtained by integrally forming and processing an aluminum plate or a copper plate; the end surface of one end of the drawer 3 far away from the cabinet body 1 is provided with a handle 4.
Example 2: a burn-in test apparatus for chip testing, comprising: the testing device comprises a cabinet body 1 and a plurality of drawers 3 movably arranged in the cabinet body 1, wherein a chip groove 5 for placing a chip to be tested is formed in the upper surface of each drawer 3, a top plate 14 which is horizontally arranged is arranged at the upper part in the cabinet body 1, and the peripheral edges of the top plate 14 are hermetically connected with the inner wall of the cabinet body 1, so that a cavity 24 is formed between the top plate 14 and the cabinet body 1;
a plurality of layers of air ducts 2 which are arranged at intervals along the vertical direction are arranged in the cabinet body 1 and below the cavity 24, the front end and the rear end of each air duct 2 which are communicated with the front inner wall and the rear inner wall of the cabinet body 1 are respectively connected, the closed left end and the closed right end of each air duct 2 are respectively arranged at intervals with the left inner wall and the right inner wall of the cabinet body 1, the air ducts 2 between the two layers of air ducts 2 which are adjacent from top to bottom and the air ducts 2 between the air ducts 2 at the uppermost layer and the cavity 24 are respectively communicated through a plurality of vertically arranged air pipes 16, the left end and the right end of the air duct 2 at the bottommost layer are respectively provided with an exhaust hole 23, and the drawer 3 is arranged on the upper surface of each layer of air duct 2 in a sliding manner;
a heater 12 is installed at the top inside the cabinet body 1, the heater 12 is connected with a fan 11 installed on the top surface of the outer side of the cabinet body 1 and heats air from the fan 11, a pipeline 13 with one end communicated with the inside of the cabinet body 1 is installed on the lower portions of the left side and the right side of the cabinet body 1, and the other end of the pipeline 13 is connected with the fan 11;
the telescopic link 6 that corresponds with drawer 3 is installed on the lower surface that is located roof 14 or wind channel 2 of every drawer 3 top, is located and offers a plurality of wind hole 15 with cavity 24 or wind channel 2 intercommunication that corresponds on the lower surface of roof 14 or wind channel 2 of drawer 3 top, wind hole 15 is located the both sides of telescopic link 6, a circuit push pedal 7 is installed to the lower extreme of telescopic link 6, be provided with on the circuit push pedal 7 be used for with the chip groove 5 internal examination of awaiting measuring the stitch 8 of chip electric conductance expert.
The edge of the drawer 3 is connected with the cabinet body 1 through at least one group of slots 10 and inserting columns 9 in a matching way; a magnet is arranged in the slot 10, and the inserting column 9 is a magnetic inserting column which can be attracted with the magnet; the bottom surface of each drawer 3 is connected with the upper surface of the corresponding air duct 2 in a matching way through at least two groups of limiting sliding grooves 22 and sliding blocks 21.
When the aging test device for chip detection is adopted, the working principle is as follows: when the testing device is used, the drawer 3 can be drawn out by holding the handle 4, the slide block 21 is matched with the limiting slide groove 22 to prevent the drawer 3 from being drawn out and falling or inclining, a chip to be tested is placed in the chip groove 5, the drawer 3 can be pushed back, and the inserting column 9 is inserted into the inserting groove 10 to fix the drawer 3;
then, the fan 11 is started, the fan 11 can drive the air in the cabinet body 1 to flow through the pipeline 13, the air is heated from the fan 11 through the heater 12 and then blown in from the top of the cabinet body 1 through the pipeline, hot air entering the cabinet body 1 can respectively enter each layer of air channel 2 through the air pipe 16, the chips are heated through the heat conductivity of the air channels 2 and the drawer 3, meanwhile, hot air can blow and heat the tops of the chips through the top plate 14 and the air holes 15 in the air channels 2, the heating is more uniform, and the effect is better;
air blown to the top of the chip can flow to the pipeline 13 through two sides of the air duct 2, air in the air duct 2 can flow into the pipeline 13 through the exhaust holes 23 on two sides of the lowest air duct 2, and the air which is heated after heat absorption can continuously enter the heater 12 through the pipeline 13 through the fan 11 to be reheated, so that energy is saved, and after the chip is heated and aged, the telescopic rod 6 can be controlled to push the circuit push plate 7 to descend, so that the pins 8 are in contact with pins of the chip to detect the chip;
the cavity above the top plate is connected with each layer of air channel through the air pipe, and the bottom surface of the drawer is arranged to be close to the air channel, so that hot air which is heated in the cavity and has uniform temperature is uniformly fed into each layer of air channel, the drawer which is arranged above the air channel and is provided with the chips to be tested is heated, the chips to be tested at each position in the cabinet body are heated uniformly, and the consistency and the comparability of test data are ensured; furthermore, through the matching arrangement of the fan, the pipeline and the air duct, the stable flow of hot air in the cabinet body can be ensured, secondary hot air which is used for heating the chip once can be recycled, the waste is avoided, the energy is saved, and the efficiency is improved; in addition, through the arrangement of the air holes in the lower surfaces of the top plate and the air duct, the flowing uniformity and the flowing sufficiency of hot air in the cabinet body can be improved, the chips to be tested can be heated from the upper part, the heating uniformity of each chip is improved, and the testing precision of the chips is further improved.
The above embodiments are merely illustrative of the technical ideas and features of the present invention, and the purpose thereof is to enable those skilled in the art to understand the contents of the present invention and implement the present invention, and not to limit the protection scope of the present invention. All equivalent changes and modifications made according to the spirit of the present invention should be covered within the protection scope of the present invention.
Claims (7)
1. A burn-in test apparatus for chip testing, comprising: the cabinet body (1) and drawer (3) of a plurality of movable mounting in the cabinet body (1), every chip groove (5) that are used for placing the chip that awaits measuring, its characterized in that are offered to the upper surface of drawer (3): a top plate (14) which is horizontally arranged is installed at the upper part in the cabinet body (1), the edges of the periphery of the top plate (14) are hermetically connected with the inner wall of the cabinet body (1), and a cavity (24) is formed between the top plate (14) and the cabinet body (1);
a plurality of layers of air ducts (2) which are arranged at intervals along the vertical direction are arranged in the cabinet body (1) and below the cavity (24), the front end and the rear end of each air duct (2) which are communicated with the front inner wall and the rear inner wall of the cabinet body (1) respectively, the closed left end and the closed right end of each air duct (2) are arranged at intervals with the left inner wall and the right inner wall of the cabinet body (1) respectively, the air ducts (2) between the two adjacent layers of air ducts (2) at the upper bottom and the air ducts between the air ducts (2) at the uppermost layer and the cavity (24) are communicated through a plurality of vertically arranged air pipes (16), the air exhaust holes (23) are formed at the left end and the right end of the air duct (2) at the bottommost layer, and the drawer (3) is installed on the upper surface of each air duct (2) in a sliding manner;
a heater (12) is installed at the top in the cabinet body (1), the heater (12) is connected with a fan (11) installed on the top surface of the outer side of the cabinet body (1) and heats gas from the fan (11), pipelines (13) with one ends communicated with the interior of the cabinet body (1) are installed at the lower parts of the left side and the right side of the cabinet body (1), and the other ends of the pipelines (13) are connected with the fan (11);
the utility model discloses a chip electric conduction test device, including be located the lower surface of roof (14) or wind channel (2) of every drawer (3) top and install telescopic link (6) that correspond with drawer (3) on being located the lower surface of roof (14) or wind channel (2) of every drawer (3) top, be located on the lower surface of roof (14) or wind channel (2) of drawer (3) top set up with a plurality of wind hole (15) of cavity (24) or wind channel (2) intercommunication that correspond, wind hole (15) are located the both sides of telescopic link (6), a circuit push pedal (7) is installed to the lower extreme of telescopic link (6), be provided with on circuit push pedal (7) and be used for with the examination to await measuring pin (8) of chip electric conduction in chip groove (5).
2. The burn-in test apparatus for chip inspection according to claim 1, wherein: the area of the drawer (3) provided with the chip groove (5) is made of heat-conducting metal.
3. The burn-in test apparatus for chip inspection according to claim 1, wherein: the air duct (2) is formed by integrally forming and processing an aluminum plate or a copper plate.
4. The burn-in test apparatus for chip inspection according to claim 1, wherein: and a handle (4) is arranged on the end surface of the drawer (3) far away from one end inside the cabinet body (1).
5. The burn-in test apparatus for chip inspection according to claim 1, wherein: the edge of the drawer (3) is connected with the cabinet body (1) through at least one group of slots (10) and inserting columns (9) in a matched mode.
6. The burn-in test apparatus for chip inspection according to claim 5, wherein: the magnetic power socket is characterized in that magnets are installed in the slots (10), and the inserting columns (9) are magnetic inserting columns capable of being attracted by the magnets.
7. The burn-in test apparatus for chip inspection according to claim 1, wherein: the bottom surface of each drawer (3) is connected with the upper surface of the corresponding air duct (2) in a matched manner through at least two groups of limiting sliding grooves (22) and sliding blocks (21).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111483457.9A CN114295956A (en) | 2021-12-07 | 2021-12-07 | Aging test device for chip detection |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111483457.9A CN114295956A (en) | 2021-12-07 | 2021-12-07 | Aging test device for chip detection |
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| Publication Number | Publication Date |
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| CN114295956A true CN114295956A (en) | 2022-04-08 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202111483457.9A Pending CN114295956A (en) | 2021-12-07 | 2021-12-07 | Aging test device for chip detection |
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| CN (1) | CN114295956A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114689910A (en) * | 2022-05-27 | 2022-07-01 | 苏州联讯仪器有限公司 | Chip reliability testing device |
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| US20210247439A1 (en) * | 2020-02-06 | 2021-08-12 | Hongbang Automation Co., Ltd. | Feedback burn-in device of burn-in oven |
| CN219224995U (en) * | 2021-12-07 | 2023-06-20 | 江苏凯尔生物识别科技有限公司 | Automatic change chip aging testing device |
| CN219320334U (en) * | 2021-12-07 | 2023-07-07 | 江苏凯尔生物识别科技有限公司 | Aging test device |
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| CN211043579U (en) * | 2019-09-30 | 2020-07-17 | 苏州联讯仪器有限公司 | Testing device for high-power laser chip |
| CN112578149A (en) * | 2019-09-30 | 2021-03-30 | 苏州联讯仪器有限公司 | Aging equipment for chip reliability test |
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| US20210247439A1 (en) * | 2020-02-06 | 2021-08-12 | Hongbang Automation Co., Ltd. | Feedback burn-in device of burn-in oven |
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| CN114689910A (en) * | 2022-05-27 | 2022-07-01 | 苏州联讯仪器有限公司 | Chip reliability testing device |
| CN114689910B (en) * | 2022-05-27 | 2022-08-16 | 苏州联讯仪器有限公司 | Chip reliability testing device |
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