CN218546095U - Tool for rapidly evaluating performance of laser diode - Google Patents
Tool for rapidly evaluating performance of laser diode Download PDFInfo
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- CN218546095U CN218546095U CN202222825889.XU CN202222825889U CN218546095U CN 218546095 U CN218546095 U CN 218546095U CN 202222825889 U CN202222825889 U CN 202222825889U CN 218546095 U CN218546095 U CN 218546095U
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Abstract
The utility model discloses a frock for appraise laser diode performance fast, comprising a base plate, be equipped with the fin in the one end of bottom plate, the upper portion of fin is equipped with peltier refrigeration piece, peltier refrigeration piece's cold side contacts with the inside heat conduction copper pipe that is equipped with the laser diode that awaits measuring, the laser diode that awaits measuring passes through the laser diode sectional fixture and fixes, the inner of laser diode sectional fixture be equipped with the coaxial collimating lens of laser diode emergent light that awaits measuring. The utility model discloses a carry out the collimation to laser diode's emergent light and handle, accurate control laser diode's excitation current, accurate dynamic output laser power of measuring, accurate control laser instrument's operating temperature marks the power information of record laser instrument, exports I-P, T-P and P-t curve visually, and then reaches quick screening laser diode's in batches purpose, can improve laser diode performance detection efficiency and accuracy greatly.
Description
Technical Field
The utility model relates to the field of optical technology, particularly, relate to a frock for evaluating laser diode performance fast.
Background
Semiconductor lasers, also known as laser diodes, are lasers that use semiconductor materials as the working substance. Common working substances are gallium arsenide (GaAs), cadmium sulfide (CdS), indium phosphide (InP), zinc sulfide (ZnS), and the like. Semiconductor diode lasers are the most practical and important class of lasers, are small, have long lifetimes, and can be pumped by simple injection of current, with operating voltages and currents compatible with, and thus monolithically integrated with, integrated circuits. And may also be directly current modulated at frequencies up to GHz to obtain high speed modulated laser output. Because of these advantages, semiconductor laser diodes are widely used in laser communication, optical storage, optical gyro, laser printing, distance measurement, radar, and the like.
However, the performance dispersion of the semiconductor device is large, so that the characteristics of the laser diode such as the center wavelength, the electro-optic conversion efficiency, the maximum optical power, the optical power stability, the temperature drift and the like of the output laser have large dispersion, and in the specific application process, the characteristics need to be screened to meet the use requirement.
SUMMERY OF THE UTILITY MODEL
To the above-mentioned technical problem among the correlation technique, the utility model provides a frock for assessing laser diode performance fast can greatly improve accuracy and the efficiency of assessing laser diode performance.
In order to achieve the technical purpose, the technical scheme of the utility model is realized as follows:
a tool for rapidly evaluating the performance of a laser diode comprises a bottom plate, wherein a radiating fin is arranged in one end of the bottom plate, a Peltier cooling plate is arranged on the upper portion of the radiating fin, the cold surface of the Peltier cooling plate is in contact with a heat conduction copper pipe internally provided with a laser diode to be tested, the laser diode to be tested is fixed through a laser diode mounting clamp, a collimating lens coaxial with emergent light of the laser diode to be tested is arranged at the inner end of the laser diode mounting clamp, and a temperature sensor is arranged at the outer end of the laser diode mounting clamp;
bottom plate from the middle part from the right side to the left side be equipped with 200mm focus convex lens, optical power meter probe anchor clamps one, spectroscope and photodiode in proper order, 200mm focus convex lens optical power meter probe anchor clamps one with photodiode all with the same axle center of laser diode's that awaits measuring emergent light, the spectroscope with the optical axis of laser diode's that awaits measuring emergent light is 45, one side of bottom plate is relative the spectroscope is equipped with optical power meter probe anchor clamps two, be equipped with the optical power meter probe in the optical power meter probe anchor clamps two, the spectroscope with it is equipped with darkroom light-avoiding cover still to overlap on the photodiode.
Further, the hot surface of the Peltier cooling plate is in contact with the cooling fin.
Furthermore, the positive pin and the negative pin of the laser diode to be tested are connected with the laser control circuit board through the quick connector.
Further, a fan is arranged at the position of the heat radiating fin at the bottom of the bottom plate.
Furthermore, four corners of the bottom plate are also provided with support legs.
The utility model has the advantages that: the utility model discloses a carry out the collimation to laser diode's emergent light and handle, accurate control laser diode's excitation current, accurate dynamic output laser power of measuring, accurate control laser instrument's operating temperature marks the power information of record laser instrument, exports I-P, T-P and P-t curve visually, and then reaches quick batch screening laser diode's purpose, can improve laser diode performance detection efficiency and accuracy greatly, has very big practical value.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a first schematic structural diagram of a tool for rapidly evaluating the performance of a laser diode according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a tooling for rapidly evaluating the performance of a laser diode according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of a tooling for rapidly evaluating the performance of a laser diode according to an embodiment of the present invention;
fig. 4 is a schematic structural diagram of a tool for rapidly evaluating the performance of a laser diode according to an embodiment of the present invention;
in the figure: the device comprises a base plate 1, a heat radiating plate 2, a heat radiating plate 3, a Peltier refrigerating plate 4, a laser diode to be tested 5, a laser diode mounting clamp, a convex lens with a focal length of 6-200mm, a dark room light avoiding cover 7, an optical power meter probe 8, an optical power meter probe clamp I9, a fan 10, a temperature sensor 11, a spectroscope 12, a photodiode 13, a collimating lens 14 and an optical power meter probe clamp II 15.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art all belong to the protection scope of the present invention.
As shown in fig. 1-4, a tool for rapidly evaluating the performance of a laser diode according to an embodiment of the present invention includes: the device comprises a bottom plate 1, a cooling fin 2, a Peltier refrigerating sheet 3, a laser diode 4 to be detected, a laser diode mounting clamp 5, a 200mm focal length convex lens 6, a darkroom shading cover 7, an optical power meter probe 8, an optical power meter probe clamp I9, an optical power meter probe clamp II 15, a fan 10, a temperature sensor 11, a spectroscope 12, a photodiode 13, a collimating lens 14, a laser control circuit board, a switching power supply, a PC and a cable (not shown in the figure).
The laser diode is reliably assembled in a heat conduction copper tube through a laser diode mounting clamp, the coaxial center of the emergent light of the laser diode and a collimating lens is ensured, the cold surface of the Peltier cooling plate is contacted with the heat conduction copper tube, the hot surface is attached to one side of a radiating fin, and the other side of the radiating fin is provided with a radiating fan. The positive and negative pins of the laser diode are connected with the laser control circuit board through the quick connector. The collimated parallel laser passes through a convex lens with a focal length of 200mm, and the light spot is reduced to be within the range of the target surface area of the photodiode. A spectroscope is arranged in front of the photodiode at an angle of 45 degrees with the optical axis, and the laser spot transmitted through the spectroscope is completely arranged in the photosensitive target surface of the photodiode. And the other laser spot reflected by the beam splitter is arranged in the center of the clamp of the probe of the optical power meter so as to place the probe of the optical power meter to measure the laser power. The laser control circuit board can dynamically adjust the exciting current of the laser diode from small to large or with a fixed value, and simultaneously monitor the output photocurrent of the photodiode, thereby achieving the purpose of monitoring the optical power. The excitation current, the output waveform information using temperature, can be set by software in the PC. An embedded software algorithm in the laser control circuit board converts the photocurrent of the photodiode into the optical power of the laser. The accuracy of the laser diode detection circuit can be calibrated by externally connecting an optical power probe. The laser control circuit board sends information such as optical power, photocurrent and actual temperature to visual software on the PC through a USB, and the software can draw curves of I-P (current-optical power), T-P (temperature-optical power) and P-T (optical power stability). The embedded software algorithm in the laser control circuit board can also dynamically adjust the refrigeration and heating power of the Peltier refrigerating sheet, and the working temperature of the laser diode is subjected to closed-loop control through the feedback temperature of the temperature sensor. By the method, parameter indexes such as the electro-optic conversion efficiency, the driving current, the maximum optical power, the temperature drift characteristic, the optimal working temperature, the optical power stability and the like of the laser diode can be accurately identified.
For the convenience of understanding the above technical solutions of the present invention, the above technical solutions of the present invention are explained in detail through specific use modes below.
When specifically using, according to a frock for assessing laser diode performance fast, laser diode 4 that awaits measuring can pass through laser diode sectional fixture 5, conveniently assemble on the frock, guarantees its shell and the reliable contact of anchor clamps for the heat of diode can be through the quick cold side of conducting to peltier cooling plate 3 of anchor clamps, peltier cooling plate 3's hot side and fin 2 in close contact with, fan 10 cools off the heat on the fin 2 fast. Meanwhile, the coaxial center of the emergent light of the laser diode 4 to be detected and the collimating lens 14 is ensured, and the collimation requirement is met after the laser passes through.
The laser control circuit board provides excitation current for the laser diode 4 to be tested, and meanwhile, according to the use temperature set by a user, the refrigeration and heating power of the Peltier cooling plate 3 is controlled in a two-way mode by monitoring the feedback temperature value of the temperature sensor 11 installed on the laser diode installation clamp 5, so that the actual temperature of the laser diode 4 to be tested is stabilized near the set working temperature value (about minus 0.1 to plus 0.1 ℃).
The collimated laser is converged by a convex lens 6 with 200mm focal length and enters a dark room 7. The laser beam is split into two laser beams (transmission and refraction ratio 4:1) by the beam splitter 12: the transmitted laser light strikes the photosensitive target surface of the photodiode 13, and the reflected laser light strikes the photosensitive target surface of the optical power meter probe 8. The optical power meter probe 8 is mounted on the optical power meter probe clamp 9 and used for comparing and calibrating optical power values corresponding to the photodiode 13 and the rear-stage circuit. The optical power probe 8 is only used during calibration of the tool and can be detached after calibration is completed.
One possible evaluation procedure is:
1. a user sets the central wavelength, the working temperature, the working voltage and current range, the output waveform (generally sine wave or trapezoidal wave) of the exciting current, the temperature output waveform, the light power sampling rate, the light power lower limit judgment threshold, the light power stability rate and the like of the laser diode 4 to be tested on PC software;
2. the PC software transmits the setting information to the laser control circuit board through a USB cable;
3. the laser control circuit board provides a proper forward starting voltage for the laser diode 4 to be tested according to a set working voltage range, outputs an excitation current I to the laser diode 4 to be tested according to a set excitation current output waveform (a common sine waveform is a sine waveform, a wave peak value corresponds to a maximum current value, and the longer the sine wave period is, the smaller the output step distance of the excitation current is);
4. the laser control circuit board controls the refrigeration and heating power of the Peltier cooling plate 3 in a bidirectional manner by monitoring the feedback temperature value T of the temperature sensor 11 according to the working temperature set by a user, so that the actual temperature of the laser diode 4 to be measured is stabilized near the set working temperature value (about-0.1 to +0.1 ℃);
5. the laser control circuit board monitors the light power value P of the laser in real time according to the light power information obtained by the photodiode 13 and the post-processing and sampling circuits thereof;
6. the photodiode 13 and the post-processing and sampling circuit thereof can be calibrated by calibrating the optical power meter probe 8, the optical power probe is only used during calibrating the tool and can be removed after calibration is finished, and the PC software writes calibration information corresponding to different wavelengths into the laser control circuit board through a USB cable;
7. the PC software collects the optical power signal P in real time according to the set optical power sampling rate and outputs an I-P curve;
8. the laser control circuit board outputs a waveform according to the set temperature, and the refrigeration and heating power of the Peltier cooling plate 3 is controlled in a two-way mode, so that the actual use temperature of the laser diode 4 to be measured changes according to the waveform requirement;
9. the PC software collects the optical power signal P in real time according to the set optical power sampling rate and outputs a T-P curve;
10. the laser control circuit board controls the refrigeration and heating power of the Peltier cooling plate 3 in a bidirectional manner according to the set working temperature value, so that the actual temperature of the laser diode 4 to be measured is stabilized near the set working temperature value (about-0.1 to +0.1 ℃);
11. the PC software collects the optical power signal P in real time according to the set optical power sampling rate and outputs an optical power curve P-t for at least 30 minutes;
12. the PC software analyzes the I-P and T-P curves to ensure that the optical power does not have large mutation (otherwise, the power closed-loop control purpose of the laser in actual use cannot be met) and the optical power is not too low (lower than the lower limit judgment threshold of the optical power and cannot meet the application requirement) in the whole range of the use temperature and the excitation current;
13. the PC software analyzes the P-t curve to ensure that the fluctuation range of the optical power does not exceed the preset optical power stability rate requirement within at least 30 minutes;
14. the PC software collates all data and outputs a report.
To sum up, with the help of the above technical scheme of the utility model, the utility model discloses an emergent light to laser diode carries out collimation processing, and output laser power is measured accurately dynamically to accurate control laser diode's excitation current, and accurate control laser instrument's operating temperature marks the power information of record laser instrument, outputs I-P, T-P and P-t curve visually, and then reaches quick screening laser diode's purpose in batches, can improve laser diode performance detection efficiency and accuracy greatly, has very big practical value.
The above description is only a preferred embodiment of the present invention, and should not be taken as limiting the invention, and any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (5)
1. The tool for rapidly evaluating the performance of the laser diode is characterized by comprising a bottom plate (1), wherein a radiating fin (2) is arranged in one end of the bottom plate (1), a Peltier refrigerating sheet (3) is arranged on the upper portion of the radiating fin (2), a cold surface of the Peltier refrigerating sheet (3) is in contact with a heat conduction copper pipe in which a laser diode (4) to be tested is arranged, the laser diode (4) to be tested is fixed through a laser diode mounting fixture (5), a collimating lens (14) coaxial with emergent light of the laser diode (4) to be tested is arranged at the inner end of the laser diode mounting fixture (5), and a temperature sensor (11) is arranged at the outer end of the laser diode mounting fixture (5);
bottom plate (1) is equipped with 200mm focus convex lens (6), optical power meter probe anchor clamps one (9), spectroscope (12) and photodiode (13) from the middle part in proper order from the right side left, 200mm focus convex lens (6) optical power meter probe anchor clamps one (9) with photodiode (13) all with the emergent light coaxial center of laser diode (4) await measuring, spectroscope (12) with the optical axis of the emergent light of laser diode (4) await measuring is 45, one side of bottom plate (1) is relative spectroscope (12) are equipped with optical power meter probe anchor clamps two (15), be equipped with optical power meter probe (8) in optical power meter probe anchor clamps two (15), spectroscope (12) with it has darkroom light-avoiding cover (7) still to overlap on photodiode (13).
2. The tool for rapidly evaluating the performance of the laser diode according to claim 1, wherein the hot surface of the peltier cooler (3) is in contact with the heat sink (2).
3. The tool for rapidly evaluating the performance of the laser diode according to claim 1, wherein the positive pin and the negative pin of the laser diode (4) to be tested are connected with a laser control circuit board through a quick connector.
4. The tool for rapidly evaluating the performance of the laser diode according to claim 1, wherein the bottom of the base plate (1) is provided with a fan (10) at the heat sink (2).
5. The tool for rapidly evaluating the performance of the laser diode according to claim 1, wherein four corners of the bottom of the base plate (1) are further provided with supporting legs.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222825889.XU CN218546095U (en) | 2022-10-26 | 2022-10-26 | Tool for rapidly evaluating performance of laser diode |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222825889.XU CN218546095U (en) | 2022-10-26 | 2022-10-26 | Tool for rapidly evaluating performance of laser diode |
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| Publication Number | Publication Date |
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| CN218546095U true CN218546095U (en) | 2023-02-28 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202222825889.XU Active CN218546095U (en) | 2022-10-26 | 2022-10-26 | Tool for rapidly evaluating performance of laser diode |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116577627A (en) * | 2023-07-14 | 2023-08-11 | 深圳市星汉激光科技股份有限公司 | Semiconductor laser reliability test method, system and medium |
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2022
- 2022-10-26 CN CN202222825889.XU patent/CN218546095U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116577627A (en) * | 2023-07-14 | 2023-08-11 | 深圳市星汉激光科技股份有限公司 | Semiconductor laser reliability test method, system and medium |
| CN116577627B (en) * | 2023-07-14 | 2023-10-03 | 深圳市星汉激光科技股份有限公司 | Semiconductor laser reliability test method, system and medium |
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