CN218482116U - Feedthrough capacitor aging board - Google Patents
Feedthrough capacitor aging board Download PDFInfo
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- CN218482116U CN218482116U CN202222453210.9U CN202222453210U CN218482116U CN 218482116 U CN218482116 U CN 218482116U CN 202222453210 U CN202222453210 U CN 202222453210U CN 218482116 U CN218482116 U CN 218482116U
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Abstract
The utility model belongs to the technical field of the electric capacity performance measurement, a cross-core electric capacity smelts board always is disclosed, smelts the seat always and connects the board of smelting always through the golden finger, smelts the seat upper end always and is equipped with the preformed hole, and the preformed hole is inside to be fixed with the screw hole, and the screw hole is inside to be fixed with the screw thread utmost point, and the screw thread utmost point passes through wire and pin fixed connection, and the pin is fixed inside smelting seat below copper sheet always, and the lead wire utmost point passes through semicircle copper sheet and smelts a fixed connection always. The finger is provided with an anode interface, a reserved interface, a self-return inspection plug board state interface and 40 cathode interfaces which are connected in parallel, the anode 1 interface is connected to the cathode 40 interface, the aging seat is divided into 40 groups, the T1 group is connected to the T40 group, each cathode is connected with 1T group, and after the aging plate is linearly connected with the Hangzhou Kong device DEVC-V, the state of each T group can be inquired in real time, the adverse effect caused by aging test is reduced, and the overall social cost in the aging test is reduced; good use effect and convenient popularization and use.
Description
Technical Field
The utility model belongs to the technical field of the electric capacity performance measurement, especially, relate to a cross-core electric capacity smelts board always.
Background
The aging treatment of the capacitor is generally to add high temperature (85 or 125 ℃) and high voltage (1.5 times, 2 times or 3 times of rated voltage), so that the defective capacitor can be removed in the initial stage after the production of the capacitor is finished, and the reliability in practical use is improved. The components are aged and screened to remove the components which are easy to generate early failure, so that the batch of components enter the working period with stable testing efficiency in advance, and the reliability of the whole machine is improved.
During screening, under the combined action of thermoelectric stress, various potential defects in the body and on the surface of the component can be well exposed, and the method is an important item for reliability screening. Various electronic components are typically aged for several hours to hundreds of hours at rated power. Some products, such as integrated circuits, cannot be subjected to condition changes at will, but can be subjected to high-temperature operation to increase the junction temperature and reach a high-stress state. The electrical stresses on the various components are suitably chosen to be equal to or slightly above rated conditions, but without introducing new failure mechanisms.
Currently, feedthrough capacitors use a fixed burn-in approach because the size of the device itself is a regular multifaceted size, resulting in insufficient contact with all common surfaces during the burn-in process. In the aging process, because the devices are horizontally arranged and the size of the devices is larger, more devices cannot be placed on one aging board, and the aging board has great influence on the period of a client; meanwhile, the square type is adopted for aging the feedthrough capacitor, and the common surfaces cannot be fully contacted; there are significant drawbacks to having sufficient contact and periodicity in the device.
Through the above analysis, the problems and defects of the prior art are as follows: the size problem of the existing device can not fully contact all common surfaces in the aging process, and the period and contact of a client during use are influenced.
The significance for solving the problems and the defects is as follows: the device can be fully contacted with the aging board, and the function failure of the device caused by poor contact is avoided. The aging board with the same size can age the devices to a greater extent, and the screening period of a customer is ensured.
SUMMERY OF THE UTILITY MODEL
To the problem that prior art exists, the utility model provides a cross-core electric capacity smelts board always.
The utility model discloses a realize like this, a punching electric capacity smelts board always is equipped with:
aging seat;
the aging seat is connected with an aging board through a golden finger, a reserved hole is formed in the upper end of the aging seat, a threaded hole is fixed in the reserved hole, a threaded pole is fixed in the threaded hole, the threaded pole is fixedly connected with a pin through a wire, the pin is fixed in a copper sheet below the aging seat, and a lead pole is fixedly connected with the aging seat through a semicircular copper sheet.
Further, it is equipped with the positive pole interface, reserves the interface, parallelly connected constitution of self-checking picture peg state interface and 40 negative pole interfaces to advance the finger, is negative pole 1 interface to negative pole 40 interface respectively, the seat of smelting old divide into 40 groups, is T1 group to T40 group respectively, and 1T group is connected to every negative pole, and back in the board of smelting old through linear connection Hangzhou can equipment DEVC-V can be according to the state of real-time query every T group.
Further, the negative electrode 1 is connected with the T1 group through an interface, corresponds to B1-B4 aging seats, the negative electrode 2 is connected with the T2 group through an interface, corresponds to B5-B8 aging seats, the negative electrode 3 is connected with the T3 group through an interface, corresponds to B9-B12 aging seat, is connected with the T4 group through an interface, corresponds to B13-B16 aging seats, the negative electrode 5 is connected with the T5 group through an interface, corresponds to B17-B20 aging seats, the negative electrode 6 is connected with the T6 group through an interface, corresponds to B21-B24 aging seats, the negative electrode 7 is connected with the T7 group through an interface, corresponds to B25-B28 aging seats, the negative electrode 8 is connected with the T8 group through an interface, corresponds to B29-B32 aging seats, the negative electrode 9 is connected with the T9 group through an interface, corresponds to B33-B36 aging seats, the negative electrode 10 is connected with the T10 group through an interface, and corresponds to B37-B40 aging seats.
Further, the negative electrode 11 is connected with a T11 group through an interface, corresponds to B41-B44 burn-in seats, the negative electrode 12 is connected with a T12 group through an interface, corresponds to B45-B48 burn-in seats, the negative electrode 13 is connected with a T13 group through an interface, corresponds to B49-B52 burn-in seats, the negative electrode 14 is connected with a T14 group through an interface, corresponds to B53-B56 burn-in seats, the negative electrode 15 is connected with a T15 group through an interface, corresponds to B57-B60 burn-in seats, the negative electrode 16 is connected with a T16 group through an interface, corresponds to B61-B64 burn-in seats, the negative electrode 17 is connected with a T17 group through an interface, corresponds to B65-B68 burn-in seats, the negative electrode 18 is connected with a T18 group through an interface, corresponds to B69-B72 burn-in seats, the negative electrode 19 is connected with a T19 group through an interface, corresponds to B73-B76 burn-in seats, the negative electrode 20 is connected with a T20 group through an interface, and corresponds to B77-B80 burn-in seats.
Further, the negative electrode 21 is connected with a T21 group through an interface, corresponds to B81-B84 aging seats, the negative electrode 22 is connected with a T22 group through an interface, corresponds to B85-B88 aging seats, the negative electrode 23 is connected with a T23 group through an interface, corresponds to B89-B92 aging seats, the negative electrode 24 is connected with a T24 group through an interface, corresponds to B93-B96 aging seats, the negative electrode 25 is connected with a T25 group through an interface, corresponds to B97-B100 aging seats, the negative electrode 26 is connected with a T26 group through an interface, corresponds to B101-B104 aging seats, the negative electrode 27 is connected with a T27 group through an interface, corresponds to B105-B108 aging seats, the negative electrode 28 is connected with a T28 group through an interface, corresponds to B109-B112 aging seats, the negative electrode 29 is connected with a T29 group through an interface, corresponds to B113-B116 aging seats, the negative electrode 30 is connected with a T30 group through an interface, and corresponds to B117-B120 aging seats.
Further, the negative electrode 31 is connected with a T31 group through an interface, corresponds to B121-B124 burn-in seats, the negative electrode 32 is connected with a T32 group through an interface, corresponds to B125-B128 burn-in seats, the negative electrode 33 is connected with a T33 group through an interface, corresponds to B129-B132 burn-in seats, the negative electrode 34 is connected with a T34 group through an interface, corresponds to B133-B136 burn-in seats, the negative electrode 35 is connected with a T35 group through an interface, corresponds to B137-B140 burn-in seats, the negative electrode 36 is connected with a T36 group through an interface, corresponds to B141-B144 burn-in seats, the negative electrode 37 is connected with a T37 group through an interface, corresponds to B145-B148 burn-in seats, the negative electrode 38 is connected with a T38 group through an interface, corresponds to B149-B152 burn-in seats, the negative electrode 39 is connected with a T39 group through an interface, corresponds to B153-B156 burn-in seats, the negative electrode 40 group through an interface, and corresponds to B157-B160 burn-in seats.
In combination with the technical problems of the above technical solutions and solutions, please analyze from the following aspects the utility model discloses the advantages and positive effects that technical solution to be protected possessed are:
first, to the technical problem that above-mentioned prior art exists and the degree of difficulty of solving this problem, combine closely the utility model discloses an in-process result and data etc. of technical scheme and the research and development that will protect, analyze in detail, deeply the utility model discloses technical problem that technical scheme how solved, some that bring after the solution problem possess creative technological effect. The specific description is as follows:
the utility model discloses a burn-in seat passes through the golden finger and connects the board of smelting always, and burn-in seat upper end is equipped with the preformed hole, and the preformed hole inside is fixed with the screw hole, and threaded hole inside is fixed with the screw thread utmost point, is applicable to the burn-in of punching condenser, and it can make the better connection of punching electric capacity board of smelting always.
The utility model discloses a screw thread utmost point passes through wire and pin fixed connection, and the pin is fixed inside the seat below copper sheet of smelting always, and the lead wire utmost point passes through the semicircle copper sheet and smelts always seat fixed connection, reduces because of smelting always the harmful effects that the test itself brought to finally reduce the whole cost of society in the aspect of the aging testing at to a great extent.
The utility model discloses back in the board that smelts passes through linear connection Hangzhou can equipment DEVC-V can be according to the state of every T group of real-time query.
Second, regard as a whole or from the angle of product to technical scheme, the utility model discloses technical effect and advantage that technical scheme that will protect possesses, the concrete description is as follows:
the utility model is suitable for the burn-in of the feedthrough capacitor, which can make the feedthrough capacitor better connect with the burn-in board, and reduce the adverse effect caused by the burn-in test, thereby finally reducing the overall social cost in the aspect of the burn-in test to a great extent; reasonable in design, job stabilization, excellent in use effect, convenient to popularize and use.
Drawings
Fig. 1 is a schematic diagram of a feedthrough capacitor aging board structure provided by an embodiment of the present invention;
in the figure: 1. aging seat; 2. a threaded pole; 3. a wire; 4. a pin; 5. a copper sheet.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail with reference to the following embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
1. Illustrative embodiments are explained. This section is an explanatory embodiment for expanding the technical solutions of the claims so as to make those skilled in the art fully understand how to implement the present invention.
As shown in fig. 1, the utility model is provided with: the device comprises a burn-in seat 1, a thread pole 2, a lead 3, a pin 4 and a copper sheet 5.
Burn the seat 1 and connect through the golden finger and burn the board always, burn the 1 upper end of seat always and be equipped with the preformed hole, the preformed hole internal fixation threaded hole, threaded hole internal fixation threaded pole 2, threaded pole 2 is through wire 3 and 4 fixed connection of pin, and pin 4 is fixed inside 1 below copper sheet 5 of burn the seat always, and the lead wire utmost point is through semicircle copper sheet 5 and burn seat 1 fixed connection always.
The hand is advanced and is equipped with positive pole interface, reserve interface, from going back inspection picture peg state interface and 40 negative pole interfaces and parallelly connected the constitution, is negative pole 1 interface to negative pole 40 interface respectively, smelts seat 1 and divide into 40 groups, is T1 group to T40 group respectively, and 1T group is connected to every negative pole, but the back in linear connection Hangzhou equipment DEVC-V of ageing board, can be according to the state of real-time query every T group.
The negative electrode 1 is connected with the T1 group through an interface, corresponds to the B1-B4 aging seats 1, the negative electrode 2 is connected with the T2 group through an interface, corresponds to the B5-B8 aging seats 1, the negative electrode 3 is connected with the T3 group through an interface, corresponds to the B9-B12 aging seats 1, is connected with the T4 group through a negative electrode 4 interface, corresponds to the B13-B16 aging seats 1, is connected with the T5 group through a negative electrode 5 interface, corresponds to the B17-B20 aging seats 1, is connected with the T6 group through a negative electrode 6 interface, corresponds to the B21-B24 aging seats 1, is connected with the T7 group through a negative electrode 7 interface, corresponds to the B25-B28 aging seats 1, is connected with the T8 group through a negative electrode 8 interface, corresponds to the B29-B32 aging seats 1, is connected with the T9 group through a negative electrode 9 interface, corresponds to the B33-B36 aging seats 1, is connected with the T10 group through a negative electrode 10 interface, and corresponds to the B37-B40 aging seats 1.
The negative electrode 11 is connected with a T11 group through an interface, corresponds to B41-B44 aging seats 1, the negative electrode 12 is connected with a T12 group through an interface, corresponds to B45-B48 aging seats 1, the negative electrode 13 is connected with a T13 group through an interface, corresponds to B49-B52 aging seats 1, the negative electrode 14 is connected with a T14 group through an interface, corresponds to B53-B56 aging seats 1, the negative electrode 15 is connected with a T15 group through an interface, corresponds to B57-B60 aging seats 1, the negative electrode 16 is connected with a T16 group through an interface, corresponds to B61-B64 aging seats 1, the negative electrode 17 is connected with a T17 group through an interface, corresponds to B65-B68 aging seats 1, the negative electrode 18 is connected with a T18 group through an interface, corresponds to B69-B72 aging seats 1, the negative electrode 19 is connected with a T19 group through an interface, corresponds to B73-B76 aging seats 1, the negative electrode 20 is connected with a T20 group through an interface, and corresponds to B77-B80 aging seats 1.
The cathode 21 is connected with the T21 group through an interface, corresponds to B81-B84 aging seat 1, the cathode 22 is connected with the T22 group through an interface, corresponds to B85-B88 aging seat 1, the cathode 23 is connected with the T23 group through an interface, corresponds to B89-B92 aging seat 1, the cathode 24 is connected with the T24 group through an interface, corresponds to B93-B96 aging seat 1, the cathode 25 is connected with the T25 group through an interface, corresponds to B97-B100 aging seat 1, the cathode 26 is connected with the T26 group through an interface, corresponds to B101-B104 aging seat 1, the cathode 27 is connected with the T27 group through an interface, corresponds to B105-B108 aging seat 1, the cathode 28 is connected with the T28 group through an interface, corresponds to B109-B112 aging seat 1, the cathode 29 is connected with the T29 group through an interface, corresponds to B113-B116 aging seat 1, the cathode 30 is connected with the T30 group through an interface, and corresponds to B117-B120 aging seat 1.
The negative electrode 31 is connected with a T31 group through an interface, corresponds to B121-B124 aging seat 1, the negative electrode 32 is connected with a T32 group through an interface, corresponds to B125-B128 aging seat 1, the negative electrode 33 is connected with a T33 group through an interface, corresponds to B129-B132 aging seat 1, the negative electrode 34 is connected with a T34 group through an interface, corresponds to B133-B136 aging seat 1, the negative electrode 35 is connected with a T35 group through an interface, corresponds to B137-B140 aging seat 1, the negative electrode 36 is connected with a T36 group through an interface, corresponds to B141-B144 aging seat 1, the negative electrode 37 is connected with a T37 group through an interface, corresponds to B145-B148 aging seat 1, the negative electrode 38 is connected with a T38 group through an interface, corresponds to B149-B152 aging seat 1, the negative electrode 39 is connected with a T39 group through an interface, corresponds to B153-B156 aging seat 1, the negative electrode 40 is connected with a T40 group through an interface, and corresponds to B157-B160 aging seat 1.
The utility model is composed of an aging seat 1 and a PCB aging plate, the whole aging plate is connected through a golden finger, then the aging plate is used for aging a device to the aging seat 1, a thread hole is made for the thread polarity to fix the device, and then a thread electrode 2 is led out to a pin 4 by a lead 3 to be electrified; the lead electrode is inserted into the aging seat 1 and then connected with the copper sheet 5 below, the copper sheet 5 locks the lead electrode, and then the copper wire is connected with the pin 4 below to be powered on.
2. Application examples. In order to prove the creativity and the technical value of the technical scheme of the invention, the part is an application example of the technical scheme of the claims on specific products or related technologies.
The utility model discloses use in the burn-in of punching condenser.
In the description of the present invention, "a plurality" means two or more unless otherwise specified; the terms "upper", "lower", "left", "right", "inner", "outer", "front", "rear", "head", "tail", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are merely for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," "third," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
The above description is only for the specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto, and any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention should be covered within the protection scope of the present invention by those skilled in the art within the technical scope of the present invention.
Claims (6)
1. The feed-through capacitor aging board is characterized by being provided with:
aging seat;
the burn-in seat is connected with the burn-in board through a golden finger, a preformed hole is formed in the upper end of the burn-in seat, a threaded hole is fixed in the preformed hole, a threaded pole is fixed in the threaded hole, the threaded pole is fixedly connected with pins through a wire, the pins are fixed in copper sheets below the burn-in seat, and lead poles are fixedly connected with the burn-in seat through semicircular copper sheets.
2. The feedthrough capacitor aging board of claim 1, wherein the gold finger is provided with a positive electrode interface, a reserved interface, a self-return check socket state interface and 40 negative electrode interfaces which are connected in parallel, the negative electrode interfaces are respectively from 1 interface to 40 interfaces of the negative electrode, the aging base is divided into 40 groups, the groups are respectively from T1 to T40, each negative electrode is connected with 1T group, and the aging board is linearly connected with a device DEVC-V.
3. The feedthrough capacitor aging board of claim 2, wherein the negative electrode 1 interfaces with the T1 set corresponding to the B1-B4 aging mounts, the negative electrode 2 interfaces with the T2 set corresponding to the B5-B8 aging mounts, the negative electrode 3 interfaces with the T3 set, the negative electrode 4 interfaces with the T4 set corresponding to the B9-B12 aging mounts, the negative electrode 5 interfaces with the T5 set corresponding to the B17-B20 aging mounts, the negative electrode 6 interfaces with the T6 set corresponding to the B21-B24 aging mounts, the negative electrode 7 interfaces with the T7 set corresponding to the B25-B28 aging mounts, the negative electrode 8 interfaces with the T8 set, the B29-B32 aging mounts, the negative electrode 9 interfaces with the T9 set, the B33-B36 aging mounts, the negative electrode 10 interfaces with the T10 set, and the B37-B40 aging mounts corresponding to the B9-B40 aging mounts.
4. The feedthrough capacitor aging board of claim 2, wherein the negative electrode 11 interfaces with the T11 set corresponding to the B41-B44 aging bases, the negative electrode 12 interfaces with the T12 set corresponding to the B45-B48 aging bases, the negative electrode 13 interfaces with the T13 set corresponding to the B49-B52 aging bases, the negative electrode 14 interfaces with the T14 set corresponding to the B53-B56 aging bases, the negative electrode 15 interfaces with the T15 set corresponding to the B57-B60 aging bases, the negative electrode 16 interfaces with the T16 set corresponding to the B61-B64 aging bases, the negative electrode 17 interfaces with the T17 set corresponding to the B65-B68 aging bases, the negative electrode 18 interfaces with the T18 set corresponding to the B69-B72 aging bases, the negative electrode 19 interfaces with the T19 set corresponding to the B73-B76 aging bases, the negative electrode 20 interfaces with the T20 set corresponding to the B77-B80 aging bases.
5. The feedthrough capacitor aging board of claim 2, wherein the negative electrode 21 is interfaced with a T21 group corresponding to B81-B84 aging bases, the negative electrode 22 is interfaced with a T22 group corresponding to B85-B88 aging bases, the negative electrode 23 is interfaced with a T23 group corresponding to B89-B92 aging bases, the negative electrode 24 is interfaced with a T24 group corresponding to B93-B96 aging bases, the negative electrode 25 is interfaced with a T25 group corresponding to B97-B100 aging bases, the negative electrode 26 is interfaced with a T26 group corresponding to B101-B104 aging bases, the negative electrode 27 is interfaced with a T27 group corresponding to B105-B108 aging bases, the negative electrode 28 is interfaced with a T28 group corresponding to B109-B112 aging bases, the negative electrode 29 is interfaced with a T29 group corresponding to B113-B116 aging bases, the negative electrode 30 is interfaced with a T30 group corresponding to B117-B120 aging bases.
6. The feedthrough capacitor aging board of claim 2, wherein the negative electrode 31 is interfaced with a T31 set corresponding to B121-B124 aging seats, the negative electrode 32 is interfaced with a T32 set corresponding to B125-B128 aging seats, the negative electrode 33 is interfaced with a T33 set corresponding to B129-B132 aging seats, the negative electrode 34 is interfaced with a T34 set corresponding to B133-B136 aging seats, the negative electrode 35 is interfaced with a T35 set corresponding to B137-B140 aging seats, the negative electrode 36 is interfaced with a T36 set corresponding to B141-B144 aging seats, the negative electrode 37 is interfaced with a T37 set corresponding to B145-B148 aging seats, the negative electrode 38 is interfaced with a T38 set corresponding to B149-B152 aging seats, the negative electrode 39 is interfaced with a T39 set corresponding to B153-B156 aging seats, the negative electrode 40 is interfaced with a T40 set corresponding to B157-B160 aging seats.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222453210.9U CN218482116U (en) | 2022-09-16 | 2022-09-16 | Feedthrough capacitor aging board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222453210.9U CN218482116U (en) | 2022-09-16 | 2022-09-16 | Feedthrough capacitor aging board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN218482116U true CN218482116U (en) | 2023-02-14 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202222453210.9U Active CN218482116U (en) | 2022-09-16 | 2022-09-16 | Feedthrough capacitor aging board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN218482116U (en) |
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2022
- 2022-09-16 CN CN202222453210.9U patent/CN218482116U/en active Active
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