CN218350437U - Device for testing performance of semiconductor chip - Google Patents
Device for testing performance of semiconductor chip Download PDFInfo
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- CN218350437U CN218350437U CN202222491053.0U CN202222491053U CN218350437U CN 218350437 U CN218350437 U CN 218350437U CN 202222491053 U CN202222491053 U CN 202222491053U CN 218350437 U CN218350437 U CN 218350437U
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- fixedly connected
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- guide rail
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Abstract
The utility model discloses a device for semiconductor chip capability test relates to semiconductor chip technical field, including big base and support column, the top of big base and the bottom fixed connection of support column, the top swing joint of support column has the probe block, the one end swing joint of probe block has the tungsten filament probe, the surperficial swing joint of support column has little base. The utility model discloses an adopted the spout, the slider, the movable block, the connecting rod, the gyro wheel, the fixed block, the rack, the cooperation of pinion and cushion, pulling the connecting rod when needs adjusting position makes the slider remove the frictional force when reducing the removal in the spout, the gyro wheel removes on the movable block simultaneously, thereby the pinion and the rack of both sides mutually support simultaneously to the drive bracing piece, thereby it removes to make to remove more nimble drive little base, and the effect of fixed block can not make the bracing piece skew phenomenon appear when mediating, the inconsistent problem of testing personnel height and device has been solved, testing personnel's travelling comfort effect has been reached.
Description
Technical Field
The utility model relates to a chip testing device relates to semiconductor chip technical field, concretely relates to a device for semiconductor chip capability test.
Background
With the rapid development of the optical communication industry, the semiconductor chip plays an extremely important role as a core component, the application of optical devices is ubiquitous from data centers, mobile broadband, internet, national defense and military industry and the like, the performance reliability of the semiconductor chip directly influences the quality of signal transmission, the stability and the time limitation, and the qualified chips can be clearly known by testing the semiconductor chip on the device. The following problems exist in the prior art:
1. the traditional semiconductor chip performance testing device does not have the function of adjusting the position, and the comfort of testers is different due to different heights of each person;
2. in the traditional semiconductor chip performance test, different positions of a chip to be tested need to be adjusted by hands by testers, so that certain potential safety hazards are provided, the working efficiency is not conveniently reduced, and uncertain factors of the chip can be caused.
SUMMERY OF THE UTILITY MODEL
The utility model provides a device for semiconductor chip capability test to solve the problem that proposes among the above-mentioned background art.
In order to solve the technical problem, the utility model discloses the technical scheme who adopts is:
the utility model provides a device for semiconductor chip capability test, includes big base and support column, the top of big base and the bottom fixed connection of support column, the top swing joint of support column has the probe piece, the one end swing joint of probe piece has the tungsten filament probe, the surperficial swing joint of support column has little base.
The upper surface of the small base is connected with a chip base in a sliding mode, a chip groove is formed in the middle of the chip base, a sliding groove is formed in the bottom of the inner cavity of the supporting column, a sliding block is connected to the inner portion of the sliding groove in a sliding mode, and a moving block is fixedly connected to the top of the sliding block.
The utility model discloses technical scheme's further improvement lies in: the movable block comprises a movable block and is characterized in that a connecting rod is fixedly connected to one side of the movable block, idler wheels are movably connected to the upper surface of the movable block, supporting rods are fixedly connected to the tops of the idler wheels, fixing blocks are fixedly connected to the inside of supporting columns, the surface of each supporting rod is connected with the inside of each fixing block in a sliding mode, racks are fixedly connected to the surfaces of the supporting rods, pinions are movably connected to the inside of each supporting column, the racks are meshed with the pinions to be connected, cushion blocks are fixedly connected to the tops of the supporting rods, and the tops of the cushion blocks are fixedly connected with the bottoms of small bases.
By adopting the technical scheme, the roller on the moving block rolls on the roller through the pushing of the connecting rod in the scheme, and the pinion and the rack are mutually matched so that the supporting rod can move up and down to adjust the position.
The utility model discloses technical scheme's further improvement lies in: the anti-collision chip base is characterized in that a guide rail is fixedly connected to the inside of the small base, a guide rail pressing plate is connected to the upper surface of the guide rail in a sliding mode, a pressing plate fixing block is fixedly connected to the top of the guide rail pressing plate, anti-collision sponge is fixedly connected to one side of the pressing plate fixing block, the top of the pressing plate fixing block is fixedly connected with the bottom of the chip base, a small cushion block is fixedly connected to the other side of the pressing plate fixing block, and a polished rod is movably connected to the inside of the small cushion block.
By adopting the technical scheme, the guide rail pressing plate moves left and right upwards through the guide rail in the scheme to drive the pressing plate fixing block to move, and the anti-collision sponge can effectively prevent the guide rail pressing plate from touching the inner wall of the small base when sliding.
The utility model discloses technical scheme's further improvement lies in: the surface of the polished rod is provided with a groove, one side of the small base is movably connected with a locking rod, and one side of the small base is fixedly connected with an oil tank.
By adopting the technical scheme, the locking rod is locked by limiting the movement of the position when the polished rod moves to the required position through the matching of the groove on the polished rod and the locking rod.
The utility model discloses technical scheme's further improvement lies in: the inside swing joint of oil tank has the valve, the top fixedly connected with pipeline of oil tank, the bottom of pipeline extends to the inside of oil tank, the opposite side fixedly connected with spring backing plate of little base, one side fixedly connected with spring of spring backing plate, one side fixedly connected with telescopic baffle of spring, one side of pipeline extends to the inside of guide rail.
Adopt above-mentioned technical scheme, the cooperation through oil tank and pipeline in this scheme makes have in the oil tank to drip in the guide rail, and the spring has certain cushioning effect.
The utility model discloses technical scheme's further improvement lies in: the guide rail pressing plate is characterized in that a hairbrush fixing block is fixedly connected to the inside of the guide rail pressing plate, a connecting plate is fixedly connected to the inside of the hairbrush fixing block, small rolling shafts are movably connected to the two sides of the connecting plate, a connecting block is fixedly connected to the bottom of the hairbrush fixing block, a hairbrush is fixedly connected to the bottom of the connecting block, and the surfaces of the small rolling shafts are movably connected with the bottom of an inner cavity of the guide rail pressing plate.
By adopting the technical scheme, the small rolling shaft is rotated to realize movement through the sliding guide rail pressing plate in the scheme, and the small rolling shaft is stably rolled under the action of the connecting plate.
Owing to adopted above-mentioned technical scheme, the utility model discloses relative prior art, the technological progress who gains is:
1. the utility model provides a device for semiconductor chip capability test, the spout has been adopted, the slider, the movable block, the connecting rod, the gyro wheel, the fixed block, the rack, the cooperation of pinion and cushion, pulling connecting rod makes the slider remove the frictional force when reducing the removal in the spout when needs adjusting position, the gyro wheel moves on the movable block simultaneously, thereby the pinion and the rack that drive bracing piece both sides simultaneously mutually support, thereby make to remove more nimble drive little base and remove, and the effect of fixed block can not make the bracing piece appear skew phenomenon when mediating, the inconsistent problem of testing personnel height and device has been solved, testing personnel travelling comfort effect has been reached.
2. The utility model provides a device for semiconductor chip capability test, the guide rail has been adopted, the guide rail clamp plate, the connecting block, little roller bearing, the brush, the polished rod, a spring, telescopic baffle, the anticollision sponge, the oil tank, the valve, the pipeline, the cooperation of check lock lever and clamp plate fixed block, thereby make the guide rail clamp plate slide on the guide rail and make clamp plate fixed block and chip base cooperation realize removing when the pulling polished rod, put down the check lock lever card when removing the position that needs and advance the interior restricted position of recess and prevent to rock, and spring and anticollision sponge can prevent effectively that the clamp plate fixed block from hitting the inner wall of little base, the cooperation of oil tank and pipeline sprays lubricating oil in to the guide rail when not using for a long time makes the track clamp plate remove more nimble, adjust the size of lubricated oil mass through the valve, make the lubricating oil evenly distributed in the guide rail clamp plate when removing, the problem of uncertain factor after having solved the hand touching when testing, work efficiency's improvement and the convenient effect of test have been reached.
Drawings
Fig. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic view of the internal lifting and peeling structure of the support pillar of the present invention;
FIG. 3 is a schematic view of the structure of the utility model for moving and peeling off the small base;
fig. 4 is a schematic view of the stripping structure of the guide rail pressing plate of the present invention.
In the figure: 1. a large base; 2. a support pillar; 21. a chute; 22. a slider; 23. a moving block; 24. a connecting rod; 25. a roller; 26. a support bar; 27. a fixed block; 28. a rack; 29. a pinion gear; 210. a cushion block; 3. a probe block; 4. a tungsten wire probe; 5. a chip slot; 6. a chip base; 7. a small base; 71. a guide rail; 72. a guide rail pressing plate; 721. a connecting plate; 722. connecting blocks; 723. a small roller; 724. a brush; 725. a brush fixing block; 73. a small cushion block; 74. a polish rod; 75. a spring backing plate; 76. a spring; 77. a telescopic baffle; 78. anti-collision sponge; 79. an oil tank; 710. a valve; 711. a pipeline; 712. a locking lever; 713. a groove; 714. and a pressure plate fixing block.
Detailed Description
The present invention will be described in further detail with reference to the following examples:
example 1
As shown in fig. 1-4, the utility model provides a device for semiconductor chip capability test, including big base 1 and support column 2, the top of big base 1 and the bottom fixed connection of support column 2, the top swing joint of support column 2 has probe block 3, the one end swing joint of probe block 3 has tungsten filament probe 4, the surface swing joint of support column 2 has little base 7, the last sliding surface of little base 7 is connected with chip base 6, chip groove 5 has been seted up at the middle part of chip base 6, spout 21 has been seted up to the bottom of support column 2 inner chamber, the inside sliding connection of spout 21 has slider 22, the top fixedly connected with movable block 23 of slider 22, one side fixedly connected with connecting rod 24 of movable block 23, the last sliding surface of movable block 23 has gyro wheel 25, the top fixedly connected with bracing piece 26 of gyro wheel 25, the inside fixedly connected with fixed block 27 of support column 2, the surface of bracing piece 26 and the inside sliding connection of fixed block 27, the fixed surface of bracing piece 26 is connected with rack 28, the inside swing joint of support column 2 has pinion 29, rack 28 meshes with pinion 29 is connected, the top fixedly connected with of support bar 26, the cushion block 210 is connected with the bottom fixed block of little base 7.
In this embodiment, put into chip groove 5 the chip when semiconductor chip through needs test, rethread tungsten filament probe 4 tests on the chip, probe block 3 can adjusting position on support column 2, pulling connecting rod 24 makes slider 22 remove the frictional force when reducing the removal in spout 21 when needs adjust little base 7 position, gyro wheel 25 moves on movable block 23 simultaneously, thereby drive bracing piece 26, the pinion 29 and the rack 28 of both sides are mutually supported simultaneously, thereby it is more nimble to remove to drive little base 7 and remove more, and fixed block 27's effect can not make the bracing piece the skew phenomenon appear when adjusting.
Example 2
As shown in fig. 1-4, on the basis of embodiment 1, the utility model provides a technical solution: preferably, the inside fixedly connected with guide rail 71 of little base 7, the upper surface sliding connection of guide rail 71 has guide rail clamp plate 72, the top fixedly connected with clamp plate fixed block 714 of guide rail clamp plate 72, clamp plate fixed block 714 one side fixedly connected with anticollision sponge 78, the top of clamp plate fixed block 714 and the bottom fixed connection of chip base 6, the opposite side fixedly connected with little cushion 73 of clamp plate fixed block 714, the inside swing joint of little cushion 73 has polished rod 74, the surface of polished rod 74 is seted up flutedly 713, one side swing joint of little base 7 has check lock 712, one side fixedly connected with oil tank 79 of little base 7.
In this embodiment, the polished rod 74 is fixed by the action of the small spacers 73 by pushing the polished rod 74 to move the guide rails 71, the guide rail pressing plates 72 and the pressing plate fixing blocks 714, so that the polished rod 74 is fixed by the chip base 6, and the polished rod 74, the grooves 713 and the locking rods 712 are matched to lock the required positions.
Example 3
As shown in fig. 1-4, on the basis of embodiment 2, the utility model provides a technical solution: preferably, the valve 710 is movably connected inside the oil tank 79, the pipeline 711 is fixedly connected to the top of the oil tank 79, the bottom of the pipeline 711 extends into the oil tank 79, the spring pad 75 is fixedly connected to the other side of the small base 7, the spring 76 is fixedly connected to one side of the spring pad 75, the telescopic baffle 77 is fixedly connected to one side of the spring 76, and one side of the pipeline 711 extends into the guide rail 71.
In the embodiment, when the guide rail pressure plate 72 is not flexible to move, the oil tank 79 and the pipeline 711 are matched to spray lubricating oil in the guide rail pressure plate 72, the valve 710 can control the oil quantity, the spring 76 is fixed by the matching of the spring backing plate 75 and the telescopic baffle 77, and when the pressure plate fixing block 714 contacts the telescopic baffle 77 to press the spring 76, a certain buffering effect is achieved.
Example 4
As shown in fig. 1-4, on the basis of embodiment 2, the utility model provides a technical solution: preferably, the inside of the rail pressing plate 72 is fixedly connected with a brush fixing block 725, the inside of the brush fixing block 725 is fixedly connected with a connecting plate 721, two sides of the connecting plate 721 are movably connected with a small roller 723, the bottom of the brush fixing block 725 is fixedly connected with a connecting block 722, the bottom of the connecting block 722 is fixedly connected with a brush 724, and the surface of the small roller 723 is movably connected with the bottom of the inner cavity of the rail pressing plate 72.
In this embodiment, the small rollers 723 roll when the rail pressing plate 72 is moved, the connection plate 721 functions to limit the distance between the small rollers 723 on both sides from collision, and the brush fixing block 725, the connection block 722 and the brush 724 cooperate to uniformly distribute the lubricant in the rail 71 through the brush 724.
The operation of the apparatus for testing the performance of a semiconductor chip will be described in detail below.
As shown in fig. 1-4, when a semiconductor chip is required to be tested, the chip is placed in the chip slot 5, and then the tungsten wire probe 4 is used for testing on the chip, the position of the probe block 3 can be adjusted on the supporting column 2, when the position of the small base 7 is required to be adjusted, the connecting rod 24 is pulled to enable the sliding block 22 to move in the sliding slot 21 to reduce friction force during movement, the roller 25 moves on the moving block 23 to drive the supporting rod 26, meanwhile, the pinions 29 and the racks 28 on the two sides are matched with each other to enable the small base 7 to move slightly and flexibly, the supporting rod 27 does not enable the supporting rod to shift during adjustment, then the guide rail pressing plate 72 is pulled to slide on the guide rail 71 by the polish rod 74 to enable the pressing plate 714 and the chip base 6 to move in a matched mode, when the locking rod 712 is put down to be clamped in the limiting position in the groove to prevent shaking, the spring 76 and the anti-collision sponge 78 can effectively prevent the pressing plate 714 from colliding with the inner wall of the small base 7, when the lubricating oil tank 79 and the pipeline 711 are matched with the guide rail 71 to spray lubricating oil to enable the lubricating plate 72 to move to enable the guiding plate 72 to enable the lubricating oil to move flexibly, the size of the lubricating oil to be adjusted by the valve to enable the valve 710 to be more flexibly, and the lubricating oil to be distributed uniformly distributed in the guide rail 72 when the sliding plate 724.
The present invention has been described in detail with reference to the above general description, but it will be apparent to one of ordinary skill in the art that modifications and improvements can be made to the invention. Therefore, modifications or improvements without departing from the spirit of the invention are within the scope of the invention.
Claims (6)
1. A device for semiconductor chip performance test, includes big base (1) and support column (2), its characterized in that: the top of the large base (1) is fixedly connected with the bottom of the supporting column (2), the top end of the supporting column (2) is movably connected with a probe block (3), one end of the probe block (3) is movably connected with a tungsten wire probe (4), and the surface of the supporting column (2) is movably connected with a small base (7);
the upper surface of the small base (7) is connected with a chip base (6) in a sliding mode, a chip groove (5) is formed in the middle of the chip base (6), a sliding groove (21) is formed in the bottom of an inner cavity of the supporting column (2), a sliding block (22) is connected to the inside of the sliding groove (21) in a sliding mode, and a moving block (23) is fixedly connected to the top of the sliding block (22).
2. The apparatus of claim 1, wherein: one side fixedly connected with connecting rod (24) of movable block (23), the upper surface swing joint of movable block (23) has gyro wheel (25), top fixedly connected with bracing piece (26) of gyro wheel (25), the inside fixedly connected with fixed block (27) of support column (2), the surface of bracing piece (26) and the inside sliding connection of fixed block (27), the fixed surface of bracing piece (26) is connected with rack (28), the inside swing joint of support column (2) has pinion (29), rack (28) and pinion (29) meshing are connected, the top fixedly connected with cushion (210) of bracing piece (26), the top of cushion (210) and the bottom fixed connection of plinth (7).
3. The apparatus of claim 1, wherein: the inside fixedly connected with guide rail (71) of plinth (7), the last sliding surface of guide rail (71) is connected with guide rail clamp plate (72), the top fixedly connected with clamp plate fixed block (714) of guide rail clamp plate (72), one side fixedly connected with anticollision sponge (78) of clamp plate fixed block (714), the top of clamp plate fixed block (714) and the bottom fixed connection of chip base (6), the opposite side fixedly connected with little cushion (73) of clamp plate fixed block (714), the inside swing joint of little cushion (73) has polished rod (74).
4. The apparatus of claim 3, wherein: the surface of the polish rod (74) is provided with a groove (713), one side of the small base (7) is movably connected with a locking rod (712), and one side of the small base (7) is fixedly connected with an oil tank (79).
5. The apparatus of claim 4, wherein: the inside swing joint of oil tank (79) has valve (710), the top fixedly connected with pipeline (711) of oil tank (79), the bottom of pipeline (711) extends to the inside of oil tank (79), the opposite side fixedly connected with spring plate (75) of little base (7), one side fixedly connected with spring (76) of spring plate (75), one side fixedly connected with telescopic baffle (77) of spring (76), one side of pipeline (711) extends to the inside of guide rail (71).
6. The apparatus of claim 3, wherein: the inside fixedly connected with brush fixed block (725) of guide rail clamp plate (72), the inside fixedly connected with connecting plate (721) of brush fixed block (725), the both sides swing joint of connecting plate (721) has little roller bearing (723), the bottom fixedly connected with connecting block (722) of brush fixed block (725), the bottom fixedly connected with brush (724) of connecting block (722), the surface of little roller bearing (723) and the bottom swing joint of guide rail clamp plate (72) inner chamber.
Priority Applications (1)
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CN202222491053.0U CN218350437U (en) | 2022-09-21 | 2022-09-21 | Device for testing performance of semiconductor chip |
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CN202222491053.0U CN218350437U (en) | 2022-09-21 | 2022-09-21 | Device for testing performance of semiconductor chip |
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CN218350437U true CN218350437U (en) | 2023-01-20 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN116859222A (en) * | 2023-09-05 | 2023-10-10 | 苏州锐杰微科技集团有限公司 | Chip detection system and working method thereof |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN116859222A (en) * | 2023-09-05 | 2023-10-10 | 苏州锐杰微科技集团有限公司 | Chip detection system and working method thereof |
CN116859222B (en) * | 2023-09-05 | 2023-11-28 | 苏州锐杰微科技集团有限公司 | Chip detection system and working method thereof |
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