CN218240134U

CN218240134U - Back luminescent device probe test platform

Info

Publication number: CN218240134U
Application number: CN202222022548.9U
Authority: CN
Inventors: 王福辉
Original assignee: Mapuno Guangzhou Technology Co ltd
Current assignee: Mapuno Guangzhou Technology Co ltd
Priority date: 2022-08-03
Filing date: 2022-08-03
Publication date: 2023-01-06
Anticipated expiration: 2032-08-03

Abstract

The utility model belongs to the technical field of back luminescent device probe test and specifically relates to a back luminescent device probe test platform, the on-line screen storage device comprises a base, the top of base all fixedly connected with support all around, the top fixedly connected with top platform of support, the top middle part fixedly connected with testboard of top platform, the anterior probe of top fixedly connected with of top platform, the top middle part fixedly connected with frame of base, the top fixedly connected with back shaft of frame, the top fixedly connected with objective table of back shaft, the inside of back shaft is equipped with the bottom probe, the bottom probe runs through the back shaft, the utility model discloses in, through the bottom probe that sets up, solid fixed ring, spring and pull rod, the bottom probe that can promote directly tests the back luminescent device of bottom on the objective table, reduces staff's work load, solves the problem that the staff carries out manual upset to back luminescent device.

Description

Back luminescent device probe test platform

Technical Field

The utility model relates to a back luminescent device probe test field specifically is a back luminescent device probe test platform.

Background

The probe test bench is a metering instrument used in the field of mechanical engineering, is used for testing the performance of a chip before pilot-scale packaging, and comprises an IV test instrument and a probe bench, wherein the IV test instrument is mainly used for providing voltage and current excitation signals for a device and testing the signals fed back to determine the performance of the device, and the probe bench is used for providing physical signal connection between the device and the IV test instrument.

In the back luminescent device uses the probe test process, because back luminescent device need test two-sided, will the staff to carry out manual upset to back luminescent device, improve staff's work load, and the objective table is fixed, and the back luminescent device position of placing is stable inadequately, all random at every turn puts, and the position of test is different, leads to the decline of test data precision.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a back emitting device probe test platform to solve the problem that proposes in the above-mentioned background art.

In order to achieve the above object, the utility model provides a following technical scheme:

the utility model provides a back emitting device probe test platform, includes the base, equal fixedly connected with support all around on the top of base, the top fixedly connected with top platform of support, the top middle part fixedly connected with testboard of top platform, the anterior probe of top fixedly connected with of top platform, the top middle part fixedly connected with frame of base, the top fixedly connected with back shaft of frame, the top fixedly connected with objective table of back shaft, the inside of back shaft is equipped with the bottom probe, the bottom probe runs through the back shaft, and bottom probe and back shaft sliding connection.

Preferably, the outer side of the bottom probe is sleeved with a limiting frame, the limiting frame is fixedly connected with the supporting shaft, and the middle of the objective table is in an open shape.

Preferably, the solid fixed ring of bottom fixedly connected with of bottom probe, solid fixed ring's front end fixedly connected with pull rod, solid fixed ring's bottom fixedly connected with spring, and the other end and the back shaft fixed connection of spring, solid fixed ring's one side fixedly connected with transmission line.

Preferably, a vertical groove is formed in the front end of the supporting shaft, and a clamping groove is formed in the vertical groove of the supporting shaft.

Preferably, the top end of the objective table is embedded with a push plate, the bottom end of the push plate is fixedly connected with a rotating shaft, and the rotating shaft is rotatably connected with the objective table.

Preferably, the number of the push plates is four, and the push plates are uniformly arranged.

Preferably, one side of the push plate is fixedly connected with a side plate, and one side of the side plate is fixedly connected with a lifting ring.

Compared with the prior art, the beneficial effects of the utility model are that:

1. in the utility model, the bottom probe which can be lifted directly tests the back luminescent device at the bottom on the objective table through the bottom probe, the fixing ring, the spring and the pull rod, thereby reducing the workload of workers and solving the problem that the workers manually turn over the back luminescent device;

2. the utility model discloses in, through push pedal, pivot, curb plate and the promotion ring that sets up, rotate the push pedal and open, can directly remove the positive position with back luminescent device, improve the test data precision, solve the back luminescent device position of placing and stable inadequately, all random at every turn puts, the different problem in position of test.

Drawings

FIG. 1 is a schematic view of the overall structure of the present invention;

FIG. 2 is a schematic view of the structure at the position A of FIG. 1 according to the present invention;

fig. 3 is a schematic view of the installation structure of the push plate of the present invention.

In the figure: 1-base, 2-bracket, 3-top platform, 4-test platform, 5-front probe, 6-base, 7-support shaft, 8-objective platform, 9-bottom probe, 10-spacing rack, 11-fixing ring, 12-pull rod, 13-clamping groove, 14-spring, 15-transmission line, 16-push plate, 17-rotation shaft, 18-side plate and 19-lifting ring.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1-3, the present invention provides a technical solution:

the utility model provides a back emitting device probe test platform, which comprises a base 1, equal fixedly connected with support 2 all around on the top of base 1, the top fixedly connected with top platform 3 of support 2, top middle part fixedly connected with testboard 4 of top platform 3, the anterior probe 5 of top fixedly connected with of top platform 3, the top middle part fixedly connected with frame 6 of base 1, the top fixedly connected with back shaft 7 of frame 6, the top fixedly connected with objective table 8 of back shaft 7, the inside of back shaft 7 is equipped with bottom probe 9, bottom probe 9 runs through back shaft 7, and bottom probe 9 and back shaft 7 sliding connection, place back emitting device on objective table 8, anterior probe 5 cooperates bottom probe 9 to be located the upper and lower both ends of objective table 8, detect back emitting device's two sides, detect effectual and manual operation less.

The limiting frame 10 is sleeved on the outer side of the bottom probe 9, the limiting frame 10 is fixedly connected with the supporting shaft 7, the middle part of the objective table 8 is arranged in an opening shape, the limiting frame 10 can conveniently limit the bottom probe 9, stably move up and down, open or store the bottom probe 9, and the bottom probe is arranged close to the bottom of the back light-emitting device through the opening of the objective table 8; the bottom end of the bottom probe 9 is fixedly connected with a fixing ring 11, the front end of the fixing ring 11 is fixedly connected with a pull rod 12, the bottom end of the fixing ring 11 is fixedly connected with a spring 14, the other end of the spring 14 is fixedly connected with the supporting shaft 7, one side of the fixing ring 11 is fixedly connected with a transmission line 15, and the bottom probe 9 can be conveniently deformed through the spring 14 below the fixing ring 11 at the bottom so as to rapidly open the bottom probe 9; a vertical groove is formed in the front end of the supporting shaft 7, a clamping groove 13 is formed in the vertical groove of the supporting shaft 7, and the pull rod 12 can be conveniently clamped into the clamping groove 13 of the vertical groove in the front end of the supporting shaft 7 in a rotating mode to position and connect the fixing ring 11; a push plate 16 is embedded at the top end of the objective table 8, a rotating shaft 17 is fixedly connected at the bottom end of the push plate 16, and the rotating shaft 17 is rotatably connected with the objective table 8, so that the push plate 16 on the objective table 8 is connected, rotated and opened through the rotating shaft 17, and a back light-emitting device on the objective table 8 is pushed to the middle position on the objective table 8 for rapid positioning; the four push plates 16 are uniformly arranged, so that the four push plates 16 can move the back light-emitting device to a fixed position; one side fixedly connected with curb plate 18 of push pedal 16, one side fixedly connected with of curb plate 18 promote ring 19, and the pulling of being convenient for promotes ring 19 and drives curb plate 18 and rotate, and better control push pedal 16 is opened.

The working process is as follows: this device is external power supply with electrical apparatus, the staff takes out back emitting device and transports probe test platform department, the staff places the top of objective table 8 with back emitting device, the staff holds promotion ring 19, it drives push pedal 16 through curb plate 18 and begins to rotate to mention promotion ring 19, push pedal 16 begins to rotate through pivot 17 and opens, the whole upset of push pedal 16 all around is opened, can promote back emitting device and remove the position to the middle part directly over objective table 8, loosen promotion ring 19, push pedal 16 rotates and closes and fixes a position in the recess of objective table 8, switch on, open switch, testboard 4 begins to detect back emitting device on objective table 8, cooperation front portion probe 5 detects, and need detect back emitting device, when needing to detect back emitting device, pull rod 12 in the vertical groove portion 13 of rotation back shaft 7 opens, pull rod 12 breaks away from draw-in groove 13 after, spring 14 promotes solid fixed ring 11 and bottom probe 9 and begins to promote, it enters into objective table 8 through spacing frame 10 to promote bottom near back emitting device detects, transmit the signal to this back emitting device through transmission line 15, use this back emitting device to transport to the probe test platform, the top of drawing is accomplished to the back 12 and the pull rod of drawing down the simple pull rod 12 that the operation personnel can take and take the back emitting device and take in the vertical groove 8 along the pull-up and take in the pull-up the computer.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. The utility model provides a back emitting device probe test platform, includes base (1), its characterized in that: the utility model discloses a probe card, including base (1), the top of base (1) all around equal fixedly connected with support (2), the top fixedly connected with top platform (3) of support (2), top middle part fixedly connected with testboard (4) of top platform (3), the anterior probe (5) of top fixedly connected with of top platform (3), the top middle part fixedly connected with frame (6) of base (1), the top fixedly connected with back shaft (7) of frame (6), the top fixedly connected with objective table (8) of back shaft (7), the inside of back shaft (7) is equipped with bottom probe (9), bottom probe (9) run through back shaft (7), and bottom probe (9) and back shaft (7) sliding connection.

2. The backside illuminated device probe test platform of claim 1, wherein: the outside of bottom probe (9) has cup jointed spacing (10), and spacing (10) and back shaft (7) fixed connection, the middle part of objective table (8) is the opening form and sets up.

3. The backside illuminated device probe test platform of claim 1, wherein: the utility model discloses a probe, including bottom probe (9), the fixed ring of bottom fixedly connected with (11), the front end fixedly connected with pull rod (12) of fixed ring (11), the bottom fixedly connected with spring (14) of fixed ring (11), and the other end and back shaft (7) fixed connection of spring (14), one side fixedly connected with transmission line (15) of fixed ring (11).

4. The backside illuminated device probe test platform of claim 1, wherein: the front end of the supporting shaft (7) is provided with a vertical groove, and a clamping groove (13) is formed in the vertical groove of the supporting shaft (7).

5. The backside illuminated device probe test platform of claim 1, wherein: the top of objective table (8) gomphosis has push pedal (16), the bottom fixedly connected with pivot (17) of push pedal (16), and pivot (17) are connected with objective table (8) rotation.

6. The backside illuminated device probe test platform of claim 5, wherein: the number of the push plates (16) is four, and the push plates (16) are uniformly arranged.

7. The backside illuminated device probe test platform of claim 5, wherein: one side of the push plate (16) is fixedly connected with a side plate (18), and one side of the side plate (18) is fixedly connected with a lifting ring (19).