CN218180576U - Semiconductor cold and hot impact test box for rapidly detecting sample - Google Patents
Semiconductor cold and hot impact test box for rapidly detecting sample Download PDFInfo
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- CN218180576U CN218180576U CN202221636401.2U CN202221636401U CN218180576U CN 218180576 U CN218180576 U CN 218180576U CN 202221636401 U CN202221636401 U CN 202221636401U CN 218180576 U CN218180576 U CN 218180576U
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Abstract
The utility model relates to a semiconductor cold and hot impact test case of short-term test sample, include: a box body; the refrigerator body is arranged in the refrigerator body so as to be divided into a heating cavity and a freezing cavity through a partition plate, and the partition plate is provided with a through groove penetrating through the thickness direction of the partition plate; locate the accommodate device in the box, accommodate device includes: the rotary type assembles in the division board and contains the rotation post of the holding tank of symmetry setting, inlays to be located be used for the centre gripping subassembly of clamping work piece in the holding tank. The utility model discloses a cavity that division board divide into the box heats the chamber and freezes the chamber, and two holding tank fixation clamps through on the rotor plate hold the centre gripping subassembly of work piece, realize the work piece through the rotation of rotating the post in the transfer that heats the chamber and freeze the chamber, reach experimental purpose.
Description
Technical Field
The utility model relates to a cold and hot impact test technical field, in particular to semiconductor cold and hot impact test case of short-term test sample.
Background
The cold and hot impact test box is the necessary test equipment of material trades such as metal, plastics, rubber, electron for test material structure or combined material endure the degree under extreme high temperature and extreme low temperature's continuous environment in the twinkling of an eye, can detect the chemical change or the physical injury that the sample arouses because of expend with heat and contract with cold in the shortest time.
The cold and hot impact test case that uses on the market at present is basket type usually, and it is at the in-process that shifts the work piece, and the division board between heating chamber and the freezing chamber can be in the open mode, makes to communicate between heating chamber and the freezing chamber to produce the interact, make the temperature decline in the heating chamber, the temperature rise in the freezing intracavity influences experimental data.
SUMMERY OF THE UTILITY MODEL
In order to solve the technical problem, the utility model provides a semiconductor cold and hot impact test case of short-term test sample, it carries out the in-process of cold and hot conversion at the work piece, and heating chamber and freezing chamber are difficult for appearing the circulation of air to reduce experimental error.
In order to achieve the above purpose, the technical scheme of the utility model is as follows: the method comprises the following steps: a box body;
the refrigerator body is arranged in the refrigerator body so as to be divided into a heating cavity and a freezing cavity through a partition plate, and the partition plate is provided with a through groove penetrating through the thickness direction of the partition plate;
locate the accommodate device in the box, accommodate device includes: the rotary type assembles in the division board and contains the rotation post of the holding tank of symmetry setting, inlays to be located be used for the centre gripping subassembly of clamping work piece in the holding tank.
Realize above-mentioned technical scheme, centre gripping subassembly centre gripping work piece inlays and locates in the holding tank, and the division board is separated the box for heating chamber and freezing chamber, and rotation through the rotation post realizes that the work piece makes a round trip and heating chamber and freezing chamber between realize cold and hot shock test.
As an optimized scheme of the utility model, be provided with heating mechanism in the heating chamber, freezing intracavity is provided with cooling mechanism.
According to the technical scheme, the heating mechanism and the cooling mechanism are used for controlling the temperature in the heating cavity and the freezing cavity so as to reach the temperature required by the test.
As a preferred scheme of the utility model, the fixedly connected with pivot on the rotating column length direction, the pivot runs through division board and box and sets up at the outside motor coaxial coupling of box.
Realize above-mentioned technical scheme, the rotation through the motor drives and rotates the post and accomplish the rotation in leading to the inslot.
As the utility model discloses an optimal scheme, the centre gripping subassembly is including holding the box, it is provided with first fixed plate and second fixed plate in the box to hold, threaded connection has the screw rod on the first fixed plate, it is connected with the dwang to rotate on the second fixed plate.
As a preferred scheme of the utility model, a pot head that the screw rod is close to the dwang is equipped with the holder, a pot head that the dwang is close to the screw rod is equipped with the corresponding setting element of holder.
As a preferred scheme of the utility model, be provided with the fixture block in the holding tank, hold the box and seted up the draw-in groove with the corresponding position of fixture block.
According to the technical scheme, the workpiece is placed between the clamping piece and the positioning piece, then the screw rod is rotated to enable the clamping piece to move in the direction of the positioning piece, so that the workpiece is fixed, and then the accommodating box is fixed in the accommodating groove through the clamping block and the clamping groove.
As an optimized scheme of the utility model, first air guide passageway and the second air guide passageway in intercommunication heating chamber or freezing chamber are seted up respectively to the corresponding both sides of division board and rotating column length direction, all be provided with the pipeline of being connected with the air pump in first air guide passageway and the second air guide passageway.
Realize above-mentioned technical scheme, at the pivoted in-process of rotation post, can shift the high temperature air in the holding tank to the heating intracavity through first air guide channel, can shift the low temperature air in the holding tank to freezing intracavity through second air guide channel, reduced the air exchange in heating chamber and the freezing intracavity.
As an optimized scheme of the utility model, be provided with the sealing washer on the perisporium that leads to the groove, the through-hole has all been seted up with the corresponding position of first air guide passageway and second air guide passageway to the sealing washer.
According to the technical scheme, the sealing effect of the whole body is better through the sealing ring, and the normal use of the first air guide channel and the second air guide channel cannot be influenced under the sealing condition due to the through hole.
To sum up, the utility model discloses following beneficial effect has: realize the heating chamber through the division board and freeze the isolation in chamber, through the fixed work piece of holder and setting element, will hold the box through fixture block and draw-in groove and fix and hold the intracavity, the motor initiative drives the rotation post and rotates the transfer that realizes the work piece between heating chamber and freezing chamber, because the width of holding tank is less than the division board thickness, make the rotation post heat the chamber at pivoted in-process and also be difficult for taking place the circulation of air with freezing chamber, and simultaneously, first air guide channel can shift the high temperature air in the holding tank to the heating intracavity through the air pump, second air guide channel can shift the low temperature air in the holding tank to freezing intracavity through the air pump, the air exchange in heating chamber and freezing intracavity has been reduced, make the heating chamber and the difficult emergence of the air in the freezing intracavity change.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a first cross-sectional view of the present invention.
Fig. 2 is a second cross-sectional view of the present invention.
Fig. 3 is a third cross-sectional view of the present invention.
Fig. 4 is an explosion diagram of the isolation board and the rotating column of the present invention.
FIG. 5 is a schematic structural view of the accommodating box of the present invention;
fig. 6 is a schematic structural diagram of the present invention.
The corresponding part names indicated by the numbers and letters in the drawings:
1. a box body; 2. a heating cavity; 3. a freezing chamber; 4. a separator plate; 5. a through groove; 6. rotating the column; 7. accommodating grooves; 8. accommodating the box; 9. a rotating shaft; 10. a motor; 11. a first fixing plate; 12. a second fixing plate; 13. a screw; 14. rotating the rod; 15. a clamping member; 16. a positioning member; 17. a first air guide channel; 18. a second air guide channel; 19. an air pump; 20. a clamping block; 21. a clamping groove.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
Practice of
As shown in fig. 1 to 6, a semiconductor cold and hot impact test chamber for rapidly detecting a sample includes a chamber body 1, a partition plate 4 is arranged in the chamber body 1 and divides a cavity in the chamber body 1 into a heating chamber 2 and a freezing chamber 3, the heating chamber 2 and the freezing chamber 3 are respectively provided with a heating mechanism (not shown) and a cooling mechanism (not shown), the partition plate 4 is provided with a through groove 5 penetrating through the thickness direction of the partition plate 4, a rotating column 6 is rotated in the through groove 5, the rotating column 6 is fixedly connected with a rotating shaft 9 in the length direction, the rotating shaft 9 penetrates through the partition plate 4 and is coaxially connected with a motor 10 arranged outside the chamber body 1, the rotating column 6 is provided with symmetrically arranged accommodating grooves 7, and the width of the accommodating grooves 7 is smaller than the thickness of the partition plate 4;
a clamping block 20 is arranged on the accommodating groove 7, an accommodating box 8 with a clamping groove 21 is clamped and embedded in the clamping block 20, a first fixing plate 11 and a second fixing plate 12 are arranged in the accommodating box 8, a screw 13 is connected to the first fixing plate 11 in a threaded manner, a rotating rod 14 is connected to the second fixing plate 12 in a rotating manner, and a clamping piece 15 and a positioning piece 16 are respectively sleeved at the ends, close to each other, of the screw 13 and the rotating rod 14;
the corresponding both sides of division board 4 and the corresponding both sides of rotation post 6 length direction set up first air guide channel 17 and the second air guide channel 18 of intercommunication heating chamber 2 or freezing chamber 3 respectively, all be provided with air pump 19 in first air guide channel 17 and the second air guide channel 18, be provided with the sealing washer (not drawn in the figure) on the perisporium that leads to groove 5, the through-hole has all been seted up with the corresponding position of first air guide channel 17 and second air guide channel 18 to the sealing washer.
Firstly, manufacturing a clamping piece 15 matched with a workpiece according to the workpiece, placing one end of the workpiece in the clamping piece 15, then rotating a screw 13 to enable a clamping piece 15 component to be close to a positioning piece 16 to fix the workpiece, and then placing an accommodating box 8 in an accommodating groove 7 to enable a clamping block 20 to be clamped and embedded in a clamping groove 21 to realize positioning and fixing;
then the box door is closed, the heating mechanism and the cooling mechanism are started, so that the temperatures of the heating cavity 2 and the freezing cavity 3 reach the preset temperature, after a period of time, the motor 10 is started to drive the rotating column 6 to rotate, meanwhile, the air pump 19 is started, and the width of the behavior accommodating tank 7 is smaller than the thickness of the partition plate 4, so that the heating cavity 2 and the freezing cavity 3 cannot be communicated in the rotating process, the mutual influence generated between the heating cavity 2 and the freezing cavity 3 is reduced, when the accommodating tank 7 completely rotates into the through groove 5, the air pump 19 pumps out high-temperature air in the accommodating tank 7 through the first air guide channel 17 and transmits the high-temperature air to the heating cavity 2, and when the accommodating tank 7 rotates into the freezing cavity 3, too much high-temperature air does not enter, and the temperature environment in the freezing cavity 3 is influenced; the rotating column 6 is provided with two accommodating grooves 7, so that two workpieces can be tested at the same time, and when the workpieces in the freezing cavity 3 are rotated into the heating cavity 2, the air pump 19 can pump low-temperature air in the accommodating grooves 7 out and discharge the low-temperature air into the freezing cavity 3, so that the influence on the temperature environment in the heating cavity 2 is reduced;
the sealing ring arranged on the circumferential wall of the through groove 5 can ensure that the sealing environment between the heating cavity 2 and the freezing cavity 3 is better, and the temperature change in the heating cavity 2 and the freezing cavity 3 caused by the air circulation is not easy to occur.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (8)
1. The utility model provides a semiconductor cold and hot impact test case of short-term test sample which characterized in that includes: a box body;
the refrigerator body is arranged in the refrigerator body so as to be divided into a heating cavity and a freezing cavity through a partition plate, and the partition plate is provided with a through groove penetrating through the thickness direction of the partition plate;
locate the accommodate device in the box, accommodate device includes: the rotary type assembly just contains the rotation post of the holding tank that the symmetry set up, inlays and locates in the division board be used for the centre gripping subassembly of clamping work piece in the holding tank.
2. The semiconductor cold-hot impact test chamber for rapidly testing the sample according to claim 1, wherein a heating mechanism is arranged in the heating cavity, and a cooling mechanism is arranged in the freezing cavity.
3. The semiconductor cold-hot impact test chamber for rapidly detecting the sample according to claim 1, wherein a rotating shaft is fixedly connected in the length direction of the rotating column, penetrates through the isolation plate, is coaxially connected with a motor arranged outside the chamber body, and is coaxially connected with the chamber body.
4. The semiconductor cold-hot impact test box for rapidly detecting the test sample according to claim 1, wherein the clamping assembly comprises an accommodating box, a first fixing plate and a second fixing plate are arranged in the accommodating box, a screw rod is connected to the first fixing plate through a thread, and a rotating rod is rotatably connected to the second fixing plate.
5. The test chamber for rapidly detecting cold and hot impacts of semiconductors on samples according to claim 4, wherein a clamping piece is sleeved at one end of the screw rod close to the rotating rod, and a positioning piece corresponding to the clamping piece is sleeved at one end of the rotating rod close to the screw rod.
6. The semiconductor cold-hot impact test box for rapidly detecting the test sample according to claim 4, wherein a clamping block is arranged in the accommodating groove, and a clamping groove is formed in a position of the accommodating box corresponding to the clamping block.
7. The semiconductor cold-hot impact test box for rapidly detecting the test sample according to claim 1, wherein a first air guide channel and a second air guide channel which are communicated with a heating cavity or a freezing cavity are respectively formed in two sides of the isolation plate corresponding to the length direction of the rotating column, and pipelines connected with an air pump are respectively arranged in the first air guide channel and the second air guide channel.
8. The semiconductor cold-hot impact test box for rapidly detecting the test sample according to claim 7, wherein the peripheral wall of the through groove is provided with a sealing ring, and through holes are formed in the positions of the sealing ring corresponding to the first air guide channel and the second air guide channel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221636401.2U CN218180576U (en) | 2022-06-28 | 2022-06-28 | Semiconductor cold and hot impact test box for rapidly detecting sample |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221636401.2U CN218180576U (en) | 2022-06-28 | 2022-06-28 | Semiconductor cold and hot impact test box for rapidly detecting sample |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN218180576U true CN218180576U (en) | 2022-12-30 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202221636401.2U Active CN218180576U (en) | 2022-06-28 | 2022-06-28 | Semiconductor cold and hot impact test box for rapidly detecting sample |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN218180576U (en) |
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2022
- 2022-06-28 CN CN202221636401.2U patent/CN218180576U/en active Active
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