CN218158212U

CN218158212U - Performance testing device for optical communication chip

Info

Publication number: CN218158212U
Application number: CN202221267731.9U
Authority: CN
Inventors: 黄建军; 吴永红; 赵山; 胡海洋
Original assignee: Stelight Instrument Inc
Current assignee: Suzhou Lianxun Instrument Co ltd
Priority date: 2022-05-24
Filing date: 2022-05-24
Publication date: 2022-12-27
Anticipated expiration: 2032-05-24

Abstract

The utility model discloses a capability test device for optical communication chip, include: the base plate, install in the testboard of base plate upper surface, install in the drive support in the base plate outside and install on drive support and be located the at least three test probe subassembly of testboard top, install the probe that is used for with the chip electrical contact that awaits measuring on the probe seat, the upper surface of probe seat one end is opened there is a through-hole, the upper end of the through-hole that the slope set up is located between the lower extreme of through-hole and the probe seat other end, the connecting portion of a reed and the last fixed surface of the probe seat other end are connected, be connected through the elastic component of a vertical setting between body and the hanging deck, a articulated shaft is installed to hanging deck middle part top, the top both sides of the articulated shaft that perpendicular to hanging deck length direction set up are provided with parallel mount first round pin axle, the second round pin axle on the body. The utility model discloses the stability and the uniformity of effort between probe and the chip when guaranteeing the test probe.

Description

Performance testing device for optical communication chip

Technical Field

The utility model relates to a capability test device for optical communication chip belongs to chip testing technical field.

Background

In the production test link of the Laser in the optical communication industry, before the COC aging process, the photoelectric performance test of a single Laser chip (LD) is required, so that the performance of the Laser chip (LD) is screened once before aging, and the Laser with the problem performance is selected in advance. In the power-on link of the test probe and the chip in the test process, the pressure change of the probe acting on the chip can cause the change of the contact resistance, thereby affecting the consistency of test data.

SUMMERY OF THE UTILITY MODEL

The utility model aims at providing a capability test device for optical communication chip, this a capability test device for optical communication chip can guarantee that the reed is to the stable pressure holding power of probe, and then stability and the uniformity of effort between probe and the chip when guaranteeing the test probe, guarantee the precision and unanimity, the comparability of test result.

In order to achieve the purpose, the utility model adopts the technical proposal that: a performance testing apparatus for an optical communication chip, comprising: the test probe assembly further comprises a body, a suspension plate hinged below the body and a probe seat arranged at one end of the suspension plate, wherein a probe used for being in electric contact with a chip to be tested is arranged on the probe seat;

the upper surface of one end of the probe seat, which is far away from the suspension plate, is provided with a through hole, the upper end of the through hole which is obliquely arranged is positioned between the lower end of the through hole and the other end of the probe seat, the connecting part of a reed is fixedly connected with the upper surface of the other end of the probe seat, and the main part of the reed, which extends to the upper part of the through hole, is provided with an installation through hole positioned between the connecting part and the through hole;

an articulated shaft is installed to suspension plate middle part top, and perpendicular to suspension plate length direction sets up the top both sides of articulated shaft are provided with first round pin axle, the second round pin axle of parallel mount on the body, are on a parallel with the articulated shaft setting first round pin axle both ends are stretched out and are installed first bearing, second bearing from body both sides surface outwards, the both ends of second round pin axle are stretched out and are installed third bearing, fourth bearing from body both sides surface outwards, the periphery of the respective movable coil of first bearing, second bearing, third bearing, fourth bearing and the outer periphery rolling contact of articulated shaft.

The further improved scheme in the technical scheme is as follows:

1. in the above scheme, when the main body part of the reed is bent upwards, one end of the mounting through hole, which is far away from the connecting part, is collinear with the inclined through hole, and the upper end of the probe, the lower end of which penetrates out of the through hole, penetrates into the mounting through hole.

2. In the above scheme, the articulated shaft includes the shaft body portion and is located the flange portion at shaft body portion both ends, first bearing, third bearing are located between a flange portion and the body of articulated shaft, second bearing, fourth bearing are located between another flange portion and the body of articulated shaft.

3. In the above scheme, the upper end of a vertically arranged elastic member is connected with the body, and the lower end of the elastic member in a stretching state is connected with the central area of the shaft body part of the articulated shaft, so that the outer circumferential surfaces at two ends of the shaft body part of the articulated shaft are in pressing contact with the circumferential surfaces of the respective moving coils of the first bearing, the second bearing, the third bearing and the fourth bearing.

4. In the above scheme, the lower end of the elastic part is provided with a lower hook sleeved in the middle of the hinge shaft.

Because of the application of above-mentioned technical scheme, compared with the prior art, the utility model has the following advantage:

1. the utility model discloses a capability test device for optical communication chip, the upper surface of its probe seat one end is opened there is a through-hole, the upper end of the through-hole that the slope set up is located between the lower extreme of through-hole and the probe seat other end, the connecting portion of a reed and the last fixed surface of the probe seat other end are connected, extend to and offer an installation through-hole that is located between its connecting portion and the through-hole on the main part of the reed of through-hole top, both can shield when not installing the probe, the protection through-hole, be convenient for again to the installation and the accuracy of probe, one-way regulation, still can be for passing through the junction at reed and pedestal, contact department and probe and the through-hole contact department of probe and installation through-hole form stable bearing structure between the three points, guarantee the main part of reed and hold the power to the stable pressure of probe, and then guarantee stability and the uniformity of effort between probe and the chip when testing the probe, guarantee the precision and the unanimity of test result, comparability.

2. The utility model discloses a capability test device for optical communication chip, be connected through the elastic component of a vertical setting between its body and the hanger plate, a articulated shaft is installed to hanger plate middle part top, the top both sides of the articulated shaft that perpendicular to hanger plate length direction set up are provided with the first round pin axle of parallel mount on the body, the second round pin axle, the articulated shaft includes axle body portion and the flange portion that is located axle body portion both ends, install in the epaxial first bearing of round pin, the third bearing is located between one flange portion and the body of articulated shaft, install in the epaxial second bearing of round pin, the fourth bearing is located between another flange portion and the body of articulated shaft, be in tensile state the lower extreme of elastic component is connected with the central zone of articulated shaft body portion, effort when probe and chip is very little, avoid in the long-term use because of the rotatory unnecessary frictional force that produces of each bearing too big influence the stability of effort between probe and the chip and because of changing the probe and need the condition of recalibrating to the effort increase of chip, improve and test many chips and carry out the stability, uniformity and the comparability of the test data that a lot of a chip obtained to many chips.

Drawings

FIG. 1 is a schematic diagram of the overall structure of the chip testing mechanism in the state of no probe assembly;

FIG. 2 is a schematic view of a partial structure of the assembled probe state of the chip testing mechanism of the present invention;

fig. 3 is a partial sectional perspective view of the performance testing apparatus for optical communication chips according to the present invention;

fig. 4 is a perspective view of the local structure of the performance testing apparatus for optical communication chips of the present invention.

In the above drawings: 1. a substrate; 2. a test bench; 3. a drive bracket; 4. testing the probe assembly; 5. a body; 6. a suspension plate; 7. a probe base; 8. a probe; 9. a reed; 901. a connecting portion; 902. a main body part; 10. a through hole; 11. mounting through holes; 12. an elastic member; 13. hinging shafts; 131. a shaft portion; 132. a flange portion; 14. a first pin shaft; 141. a first bearing; 142. a second bearing; 15. a second pin shaft; 151. a third bearing; 152. and a fourth bearing.

Detailed Description

In the description of this patent, it is noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore should not be construed as limiting the present invention; the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance; furthermore, unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, as they may be fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The meaning of the above terms in this patent may be understood in a concrete sense to those of ordinary skill in the art.

Example 1: a performance testing apparatus for an optical communication chip, comprising: the testing device comprises a substrate 1, a testing platform 2 arranged on the upper surface of the substrate 1, a driving bracket 3 arranged on the outer side of the substrate 1 and at least three testing probe assemblies 4 arranged on the driving bracket 3 and positioned above the testing platform 2, wherein each testing probe assembly 4 further comprises a body 5, a suspension plate 6 connected below the body 5 in a hinged mode and a probe seat 7 arranged at one end of the suspension plate 6, and a probe 8 used for being in electric contact with a chip to be tested is arranged on the probe seat 7;

the body 5 is connected with the suspension plate 6 through an elastic part 12 which is vertically arranged, a hinge shaft 13 is arranged above the middle part of the suspension plate 6, a first pin shaft 14 and a second pin shaft 15 which are arranged on the body 5 in parallel are arranged at two sides above the hinge shaft 13 of the hinge shaft 13 which is arranged vertical to the length direction of the suspension plate 6, two ends of the first pin shaft 14 which is arranged in parallel with the hinge shaft 13 extend outwards from the surfaces of two sides of the body 5 and are provided with a first bearing 141 and a second bearing 142, the two ends of the second pin 15 extend outwards from the two side surfaces of the body 5 and are provided with a third bearing 151 and a fourth bearing 152, the hinge shaft 13 includes a shaft body portion 131 and flange portions 132 at both ends of the shaft body portion 131, the first and

third bearings

141 and 151 are positioned between the one flange portion 132 of the hinge shaft 13 and the body 5, the second bearing 142 and the fourth bearing 152 are positioned between the other flange portion 132 of the hinge shaft 13 and the body 5, the lower end of the elastic member 12 in a stretched state is connected to the central region of the shaft portion 131 of the hinge shaft 13, so that the outer circumferential surfaces of both ends of the shaft body 131 of the hinge shaft 13 are in press contact with the circumferential surfaces of the respective moving coils of the first bearing 141, the second bearing 142, the third bearing 151 and the fourth bearing 152, in addition to the necessary friction between the circumferential surface of the outer ring of each bearing and the shaft body of the hinge shaft during long-term use, relative friction may also occur between the outer end surface of the outer ring of the bearing and the limit structure thereof (the flange portion of the hinge shaft, the side surface of the body), the bearing is limited by arranging the flange part on the articulated shaft, so that the friction point between the bearing outer ring and the limiting structure is close to the rotation center, therefore, the friction torque is reduced, and unnecessary friction force which is possibly generated between the bearing outer ring and the limiting structure is further reduced.

The lower end of the elastic member 12 has a lower hook 51 fitted around the middle of the hinge shaft 13.

Example 2: a performance testing apparatus for an optical communication chip, comprising: the testing device comprises a substrate 1, a testing platform 2 arranged on the upper surface of the substrate 1, a driving bracket 3 arranged on the outer side of the substrate 1 and a testing probe assembly 4 arranged on the driving bracket 3 and positioned above the testing platform 2, wherein the testing probe assembly 4 further comprises a body 5, a suspension plate 6 connected below the body 5 in a hinged mode and a probe seat 7 arranged at one end of the suspension plate 6, and a probe 8 used for being in electric contact with a chip to be tested is arranged on the probe seat 7;

the upper surface of one end of the probe base 7, which is far away from the suspension plate 6, is provided with a through hole 10, the upper end of the obliquely arranged through hole 10 is positioned between the lower end of the through hole 10 and the other end of the probe base 7, the connecting part 901 of a reed 9 is fixedly connected with the upper surface of the other end of the probe base 7, the main part 902 of the reed 9, which extends to the upper part of the through hole 10, is provided with an installation through hole 11 positioned between the connecting part 901 and the through hole 10, and when the main part 902 of the reed 9 is bent upwards, one end of the installation through hole 11, which is far away from the connecting part 901, is collinear with the oblique through hole 10, and the upper end of the probe 8, the lower end of which penetrates out of the through hole 10, penetrates into the installation through hole 11.

When the performance testing device for the optical communication chip is adopted, the upper surface of one end of the probe seat is provided with the through hole, the upper end of the obliquely arranged through hole is positioned between the lower end of the through hole and the other end of the probe seat, the connecting part of the reed is fixedly connected with the upper surface of the other end of the probe seat, the main body part of the reed extending above the through hole is provided with the mounting through hole positioned between the connecting part and the through hole, the through hole can be shielded and protected when the probe is not mounted, the mounting, the accuracy and the one-way adjustment of the probe are facilitated, and a stable supporting structure can be formed among the connecting part of the reed and the seat body, the contact part of the probe and the mounting through hole and the contact part of the probe and the through hole, so that the stable pressing force of the main body part of the reed on the probe is ensured, the stability and the consistency of the acting force between the probe and the chip when the probe is tested are further ensured, and the accuracy, the consistency and the comparability of the test result are ensured;

in addition, the body of the device is connected with the suspension plate through an elastic part which is vertically arranged, a hinge shaft is arranged above the middle of the suspension plate, a first hinge pin and a second hinge pin which are arranged on the body in parallel are arranged on two sides above the hinge shaft which is arranged in the length direction of the suspension plate, the hinge shaft comprises a shaft body part and flange parts which are arranged at two ends of the shaft body part, a first bearing and a third bearing which are arranged on the hinge shaft are arranged between one flange part of the hinge shaft and the body, the second bearing and the fourth bearing which are arranged on the hinge shaft are arranged between the other flange part of the hinge shaft and the body, the lower end of the elastic part in a stretching state is connected with the central area of the shaft body part of the hinge shaft, when the acting force between the probe and the chip is very small, the situation that the stability of the acting force between the probe and the chip is influenced by the overlarge unnecessary friction force generated by the rotation of each bearing in the long-term use process and the situation that the increase of the acting force of the probe on the chip needs to be corrected again due to the change of the probe is avoided, and the stability, the consistency and the comparability of the test data obtained by testing a plurality of chips are improved.

The utility model is used for the capability test device of optical communication chip can expand other trades to the test of semiconductor chip, and the usage is not only limited to the optical communication trade, and all trades that need be used for the capability test device of optical communication chip all can synchronous extension use, and accommodation is wide.

The above embodiments are only for illustrating the technical concept and features of the present invention, and the purpose of the embodiments is to enable those skilled in the art to understand the contents of the present invention and implement the present invention, which cannot limit the protection scope of the present invention. All equivalent changes and modifications made according to the spirit of the present invention should be covered by the protection scope of the present invention.

Claims

1. A performance testing apparatus for an optical communication chip, comprising: base plate (1), install in testboard (2) of base plate (1) upper surface, install in drive bracket (3) in base plate (1) outside and install on drive bracket (3) and be located testboard (2) top test probe subassembly (4), its characterized in that: the test probe assembly (4) further comprises a body (5), a suspension plate (6) connected below the body (5) in a hinged mode and a probe seat (7) installed at one end of the suspension plate (6), wherein a probe (8) used for being in electric contact with a chip to be tested is installed on the probe seat (7);

the upper surface of one end, far away from the suspension plate (6), of the probe seat (7) is provided with a through hole (10), the upper end of the through hole (10) which is obliquely arranged is positioned between the lower end of the through hole (10) and the other end of the probe seat (7), a connecting part (901) of a reed (9) is fixedly connected with the upper surface of the other end of the probe seat (7), and a main body part (902) of the reed (9) extending above the through hole (10) is provided with an installation through hole (11) positioned between the connecting part (901) and the through hole (10);

install an articulated shaft (13) suspension plate (6) middle part top, perpendicular to suspension plate (6) length direction sets up articulated shaft (13) top both sides are provided with first round pin axle (14), second round pin axle (15) of parallel mount on body (5), are on a parallel with articulated shaft (13) setting first round pin axle (14) both ends are outwards stretched out and are installed first bearing (141), second bearing (142) from body (5) both sides surface, the both ends of second round pin axle (15) are outwards stretched out and are installed third bearing (151), fourth bearing (152) from body (5) both sides surface, the periphery of first bearing (141), second bearing (142), third bearing (151), the respective movable coil of fourth bearing (152) and the outer periphery rolling contact of articulated shaft (13).

2. The performance test apparatus for an optical communication chip according to claim 1, wherein: when the main body part (902) of the reed (9) is bent upwards, one end of the mounting through hole (11) far away from the connecting part (901) is collinear with the inclined through hole (10), and the upper end of the probe (8) with the lower end penetrating out of the through hole (10) penetrates into the mounting through hole (11).

3. The performance test apparatus for an optical communication chip according to claim 1 or 2, characterized in that: the hinge shaft (13) comprises a shaft body part (131) and flange parts (132) positioned at two ends of the shaft body part (131), the first bearing (141) and the third bearing (151) are positioned between one flange part (132) of the hinge shaft (13) and the body (5), and the second bearing (142) and the fourth bearing (152) are positioned between the other flange part (132) of the hinge shaft (13) and the body (5).

4. The performance test apparatus for an optical communication chip according to claim 3, wherein: the upper end of an elastic element (12) which is vertically arranged is connected with the body (5), the lower end of the elastic element (12) in a stretching state is connected with the central area of the shaft body part (131) of the articulated shaft (13), so that the outer circumferential surfaces of two ends of the shaft body part (131) of the articulated shaft (13) are in pressing contact with the circumferential surfaces of the respective moving rings of the first bearing (141), the second bearing (142), the third bearing (151) and the fourth bearing (152).

5. The performance test apparatus for an optical communication chip according to claim 4, wherein: the lower end of the elastic part (12) is provided with a lower hook (51) sleeved in the middle of the hinge shaft (13).