CN218122026U - Probe quick change device - Google Patents
Probe quick change device Download PDFInfo
- Publication number
- CN218122026U CN218122026U CN202220678225.2U CN202220678225U CN218122026U CN 218122026 U CN218122026 U CN 218122026U CN 202220678225 U CN202220678225 U CN 202220678225U CN 218122026 U CN218122026 U CN 218122026U
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- quick
- fixing plate
- change
- probe
- dovetail
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Abstract
The utility model discloses a probe quick change device belongs to equipment testing technical field. The device comprises a probe, a bracket, a lifting cylinder, a fixing plate, a quick-change dovetail movable plate, a quick-change dovetail plate, a probe fixing plate frame and a locking assembly; the lifting cylinder is fixedly connected to the support, and the fixing plate is fixedly connected with the lifting cylinder; the quick-change dovetail fixing plate is fixedly connected with the fixing plate, and the quick-change dovetail movable plate is connected below the fixing plate in a sliding manner; the quick-change dovetail plate is fixedly connected with the probe fixing plate frame, the quick-change dovetail plate is slidably connected between the quick-change dovetail fixing plate and the quick-change dovetail movable plate, and the quick-change dovetail plate and the probe fixing plate frame are locked through a locking assembly; the probe is fixedly connected to the probe fixing plate frame. The utility model discloses compact structure, the quick change is simple, and the contact conductivity of the multiple product of quick test improves the product yields.
Description
Technical Field
The utility model relates to a probe quick change device belongs to equipment testing technical field.
Background
The probe is used for conducting test of parts and components, and is an important test item in an automatic assembly line of automobile parts. A set of stable and reliable conduction testing mechanism directly influences the working level of the whole automatic production.
Use on the automatic line body of accessories equipment, whether the contact in the accessories that need test switches on, improves the yields of product. One set of automatic assembly line body will be compatible a plurality of products, need test the contact conduction function of multiple product, and the conduction mechanism will accomplish the function of quick change, accurate location.
Disclosure of Invention
An object of the utility model is to overcome not enough among the prior art, provide a probe quick change device to solve among the prior art technical problem of quick change difficulty when the contact conduction test is done to the probe.
In order to solve the technical problem, the utility model discloses an adopt following scheme to realize:
the utility model provides a probe quick-change device, which comprises a probe, a bracket, a lifting cylinder, a fixing plate, a quick-change dovetail movable plate, a quick-change dovetail plate, a probe fixing plate frame and a locking component;
the lifting cylinder is fixedly connected to the support, and the fixing plate is fixedly connected with the lifting cylinder;
the quick-change dovetail fixing plate is fixedly connected with the fixing plate, and the quick-change dovetail movable plate is connected below the fixing plate in a sliding manner;
the quick-change dovetail plate is fixedly connected with the probe fixing plate frame, the quick-change dovetail plate is slidably connected between the quick-change dovetail fixing plate and the quick-change dovetail movable plate, and the quick-change dovetail plate and the probe fixing plate frame are locked through the locking assembly;
the probe is fixedly connected to the probe fixing plate frame.
Preferably, a round handle is fixedly connected to the quick-change dovetail plate.
Preferably, one side of the fixing plate, which is close to the bracket, is fixedly connected with a limiting plate.
Preferably, the locking assembly comprises a locking screw and a locking nut, the locking screw is fixedly connected to the quick-change dovetail fixing plate and penetrates through the quick-change dovetail movable plate and the locking nut in threaded connection.
Preferably, a plurality of groups of equal-height screws are fixedly connected to the quick-change dovetail fixing plate, and the quick-change dovetail movable plate is slidably connected to the lower portion of the fixing plate through the plurality of groups of equal-height screws.
Preferably, a plurality of groups of positioning columns and connecting columns are arranged on the probe fixing plate frame.
Preferably, a plurality of groups of spring columns are arranged on the probe fixing plate frame, and the free lengths of the spring columns are greater than the length of the probe.
Compared with the prior art, the utility model discloses the beneficial effect who reaches is:
1. the utility model discloses can the fixed grillage of quick replacement probe, realize the contact conduction test of a plurality of products, compact structure, the quick change is simple, has improved the product yields.
2. The utility model discloses a probe fixing plate frame positioning accuracy is high, and locking performance is good.
Drawings
Fig. 1 is a schematic structural diagram of a probe quick-change device provided in an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a probe fixing plate frame of a probe quick-change device provided in an embodiment of the present invention;
in the figure: 1. a cylinder fixing plate; 2. a first lateral fixing plate; 3. a second lateral fixing plate; 4. a bottom fixing plate; 5. a tested piece and a carrier; 6. a probe fixing plate frame; 7. a circular handle; 8. quickly replacing the dovetail plate; 9. a dovetail fixing plate is quickly replaced; 10. a dovetail movable plate is quickly replaced; 11. a first fixing plate; 12. a reinforcing plate; 13. a second fixing plate; 14. a lifting cylinder; 15. a limiting plate; 16. locking the nut; 17. an equal-height screw; 18. a probe; 19. a spring post; 20. connecting columns; 21. and a positioning column.
Detailed Description
The present invention will be further described with reference to the accompanying drawings. The following examples are only for illustrating the technical solutions of the present invention more clearly, and the protection scope of the present invention is not limited thereby.
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, are not to be construed as limiting the present invention.
As shown in fig. 1 and 2, the utility model provides a probe quick-change device, which comprises a probe 18, a bracket, a lifting cylinder 14, a fixing plate, a quick-change dovetail fixing plate 9, a quick-change dovetail movable plate 10, a quick-change dovetail plate 8, a probe fixing plate frame 6 and a locking component; the support comprises a first lateral fixing plate 2, a second lateral fixing plate 3 and a bottom fixing plate 4, the three fixing plates are formed by splicing, each fixing plate comprises a first fixing plate 11, a second fixing plate 13 and a reinforcing plate 12, the first fixing plate 11 is used for being connected with a quick-change dovetail fixing plate 9, the second fixing plate 13 is used for being connected with a lifting cylinder 14, the reinforcing plate 12 is used for reinforcing the first fixing plate 11 and the second fixing plate 13, the lifting cylinder 14 is fixedly connected to the support and fixedly connected with the lifting cylinder 14, the lifting cylinder 14 is used for lifting movement of the whole probe quick-change device, when the probe quick-change device descends, a contact conduction test of a probe is carried out, and when the probe quick-change device ascends, the test work is finished or the probe 18 is replaced; quick change forked tail fixed plate 9 and fixed plate fixed connection, quick change forked tail fly leaf 10 sliding connection is in the fixed plate below, the fixed plate is the fixed action that provides of quick change forked tail fixed plate 9 and quick change forked tail fly leaf 10, quick change forked tail board 8 and the fixed grillage 6 fixed connection of probe, 8 sliding connection of quick change forked tail board are between quick change forked tail fixed plate 9 and quick change forked tail fly leaf 10, through locking Assembly, locking quick change forked tail board 8 and the fixed grillage 6 of probe, 18 fixed connection of probe is on the fixed grillage 6 of probe.
The round handle 7 is fixedly connected to the quick-change dovetail plate 8, so that the quick-change dovetail plate can be conveniently pulled and pulled, and quick change of the quick-change dovetail plate 8 and the probe fixing plate frame 6 is realized.
One side of the fixing plate, which is close to the bracket, is fixedly connected with a limiting plate 15 for limiting the quick-change dovetail plate 8.
The locking assembly comprises a locking screw and a locking nut 16, the locking screw is fixedly connected to the quick-change dovetail fixing plate 9 and penetrates through the quick-change dovetail movable plate 10 to be in threaded connection with the locking nut 16. In addition, a plurality of groups of equal-height screws 17 are fixedly connected to the quick-change dovetail fixing plate 9, the quick-change dovetail moving plate 10 is slidably connected below the fixing plate through the plurality of groups of equal-height screws 17, and the equal-height screws 17 provide a guiding effect for the sliding of the quick-change dovetail moving plate 10, so that the overall structure is reinforced.
Be equipped with multiunit reference column 21 and spliced pole 20 on the probe fixing plate frame 6, spliced pole 20 sets up in the top of probe fixing plate frame 6 for connect quick change forked tail fixed plate 9, reference column 21 sets up in the below of probe fixing plate frame 6, is used for the location to be surveyed piece and carrier 5.
Be equipped with multiunit spring post 19 on the probe fixing plate frame, the free length of spring post 19 is greater than probe 18's length for 18 end contact conduction test backs at probe, probe 18 leaves the measured piece, and spring post 19's elasticity is kick-backed, is used for withdrawing from the measured piece, conveniently changes quick change dovetail plate 8 and probe fixing plate frame 6, circulates the contact conduction test of probe 18 next time.
The working principle is as follows: according to different products of test conduction, the quick-change dovetail plate 8 and the probe fixing plate frame 6 are correspondingly replaced, the round handle 7 is lifted to insert the quick-change dovetail plate 8 between the quick-change dovetail fixing plate 9 and the quick-change dovetail movable plate 10 until the quick-change dovetail fixing plate 10 is inserted into the limiting plate 15, the quick-change dovetail fixing plate 10 slides on the shaft of the equal-height screw 17 until the quick-change dovetail movable plate 10 is completely matched with the quick-change dovetail fixing plate 9, and the locking nut 16 is locked after the quick-change dovetail plate 8 is pressed tightly.
The measured piece is placed on the carrier and is arranged below the lifting cylinder (on a station), the lifting cylinder 14 lowers the probe fixing support 6 and the fixed plate, the positioning column 21 is positioned with the measured piece, the spring column 19 is in contact with the measured piece before the probe 18, the rear probe 18 is in contact with the measured piece to perform contact conduction test, after the test is finished, the lifting cylinder 14 is lifted to drive the probe fixing support 6 and the fixed plate, after the spring column 19 leaves the measured piece, the spring column rebounds, the measured piece is withdrawn, the piece is automatically withdrawn, the loss of the probe 18 is reduced, the probe is lifted to a high point, and the next working cycle is performed.
To sum up, the utility model discloses can the fixed grillage of quick replacement probe, realize the contact conduction test of a plurality of products, compact structure, the quick replacement is simple, has improved the product yields to the grillage positioning accuracy is high for the probe is fixed, and locking performance is good.
The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, a plurality of modifications and variations can be made without departing from the technical principle of the present invention, and these modifications and variations should also be regarded as the protection scope of the present invention.
Claims (7)
1. A probe quick-change device is characterized by comprising a probe, a bracket, a lifting cylinder, a fixing plate, a quick-change dovetail movable plate, a quick-change dovetail plate, a probe fixing plate frame and a locking assembly;
the lifting cylinder is fixedly connected to the support, and the fixing plate is fixedly connected with the lifting cylinder;
the quick-change dovetail fixing plate is fixedly connected with the fixing plate, and the quick-change dovetail movable plate is connected below the fixing plate in a sliding manner;
the quick-change dovetail plate is fixedly connected with the probe fixing plate frame, the quick-change dovetail plate is slidably connected between the quick-change dovetail fixing plate and the quick-change dovetail movable plate, and the quick-change dovetail plate and the probe fixing plate frame are locked through the locking assembly;
the probe is fixedly connected to the probe fixing plate frame.
2. The quick-change device for probes according to claim 1, characterized in that a circular handle is fixedly connected to the quick-change dovetail plate.
3. The quick-change device for the probe according to claim 1, wherein a limiting plate is fixedly connected to one side of the fixing plate close to the bracket.
4. The quick-change device for the probe according to claim 1, wherein the locking assembly comprises a locking screw and a locking nut, the locking screw is fixedly connected to the quick-change dovetail fixing plate and penetrates through the quick-change dovetail movable plate to be in threaded connection with the locking nut.
5. The quick-change device for probes according to claim 1, wherein a plurality of sets of equal-height screws are fixedly connected to the quick-change dovetail fixing plate, and the quick-change dovetail movable plate is slidably connected below the fixing plate through the plurality of sets of equal-height screws.
6. The quick-change device for probes according to claim 1, wherein the probe fixing plate frame is provided with a plurality of groups of positioning columns and connecting columns.
7. The quick-change device for probes according to claim 1, wherein a plurality of groups of spring columns are arranged on the probe fixing plate frame, and the free length of the spring columns is greater than the length of the probes.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220678225.2U CN218122026U (en) | 2022-03-28 | 2022-03-28 | Probe quick change device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220678225.2U CN218122026U (en) | 2022-03-28 | 2022-03-28 | Probe quick change device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN218122026U true CN218122026U (en) | 2022-12-23 |
Family
ID=84493479
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202220678225.2U Active CN218122026U (en) | 2022-03-28 | 2022-03-28 | Probe quick change device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN218122026U (en) |
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2022
- 2022-03-28 CN CN202220678225.2U patent/CN218122026U/en active Active
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| GR01 | Patent grant | ||
| GR01 | Patent grant |