CN217954602U - High-temperature high-humidity high-air-pressure anti-bias aging test system - Google Patents
High-temperature high-humidity high-air-pressure anti-bias aging test system Download PDFInfo
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- CN217954602U CN217954602U CN202222124155.9U CN202222124155U CN217954602U CN 217954602 U CN217954602 U CN 217954602U CN 202222124155 U CN202222124155 U CN 202222124155U CN 217954602 U CN217954602 U CN 217954602U
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Abstract
The utility model discloses a high-temperature, high-humidity and high-pressure anti-bias aging test system, which relates to the technical field of device reliability test and comprises an environment control device, a test circuit and an interactive display screen; the environment control device comprises a test box, a temperature control module, a humidity control module, an air pressure control module, a fixing plate and a controller, wherein the controller is sequentially connected with the temperature control module, the humidity control module and the air pressure control module; the test circuit comprises a power module, a protection indicating circuit, a device to be tested and a monitoring module which are connected in sequence, wherein the device to be tested is installed on the fixing plate. The utility model discloses can provide reliable and stable experimental environment for anti-ageing tests partially to environmental parameter is controllable adjustable, and can prevent the harm that the short circuit condition caused other devices, protects device and experimental security often.
Description
Technical Field
The utility model relates to a device reliability test technical field, more specifically the utility model relates to a high humid tropical high pressure anti-inclined to one side ageing tests system that says so.
Background
With the development of intelligent technology and electronic technology, various types of electronic devices are applied more and more, and the reliability of the electronic devices is particularly critical.
In the production process of products such as transistors or field effect transistors (generally called triodes), various defects inevitably exist in links such as raw materials, semiconductor triode chips, technological processes and the like, and early failure products with obvious defects and hidden defects need to be removed before the products are applied. The effective method is that reverse bias voltage is applied to the electrodes of the triode at high temperature within a certain time, and the early failure product is accelerated to fail under the combined action of temperature stress, voltage stress and time stress, so that the aim of eliminating the early failure product is fulfilled.
However, the controllability of the reverse bias aging test environment of various devices to be tested is low at present, the ideal high-temperature and high-humidity environment for the test cannot be provided, the test environment can not be adjusted in real time, and the safety performance of the circuit is difficult to guarantee, so that how to provide a flexibly adjustable high-temperature, high-humidity and high-air-pressure reverse bias aging test system to perform the aging test on the devices is a problem that needs to be solved urgently by technical personnel in the field.
SUMMERY OF THE UTILITY MODEL
In view of this, the utility model provides a high humid tropical high pressure anti-inclined to one side ageing tests system.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
a high-temperature high-humidity high-pressure anti-bias aging test system comprises an environment control device and a test circuit;
the environment control device comprises a test box, a temperature control module, a humidity control module, an air pressure control module, a fixing plate and a controller, wherein the controller is sequentially connected with the temperature control module, the humidity control module and the air pressure control module;
the test circuit comprises a power supply module, a protection indicating circuit, a device to be tested and a monitoring module which are connected in sequence, wherein the device to be tested is arranged on the fixing plate;
the monitoring module is also connected with the controller.
Optionally, the test device further comprises an interactive display screen, wherein the interactive display screen is connected with the controller and is used for setting the temperature, the humidity and the air pressure in the test chamber and displaying the current temperature, the humidity and the air pressure in the test chamber; the interactive display screen is also connected with the monitoring module through the controller and used for displaying monitoring results of the monitoring module, including voltage and current.
Optionally, the temperature control module includes a heater and a temperature sensor, the humidity control module includes a humidifier and a humidity sensor, and the air pressure control module includes an air blower and an air pressure sensor.
Optionally, the protection indication circuit and the monitoring module are integrated on an aging board, and the fixing board is mounted on the aging board.
Optionally, the protection indication circuit includes a thermistor, a current limiting resistor, and a light emitting diode, wherein the thermistor is connected in series to the power line, and the current limiting resistor and the light emitting diode are connected in series and then connected in parallel to two ends of the thermistor.
Optionally, the power module includes a positive dc power supply and a negative dc power supply, where the positive dc power supply is connected to the positive electrode of the aging board, and the negative dc power supply is connected to the negative electrode of the aging board.
Optionally, the monitoring module includes a voltage monitoring module and a current monitoring module.
According to the technical scheme, the utility model discloses a high humid tropical high pressure anti-inclined to one side ageing tests system compares with prior art, has following beneficial effect:
the utility model discloses can provide reliable and stable test environment to anti-inclined to one side aging test to environmental parameter is controllable adjustable, carries out real-time adjustment to temperature, humidity, the atmospheric pressure in the proof box, reflects the true condition of device work more comprehensively, accelerates the ageing speed of device, carries out high-efficient the detection to the quality of device to be measured.
A protection indicating circuit is arranged on a test circuit of each device to be tested, so that damage to other devices caused by short circuit conditions is prevented, and the devices and test safety are protected from time to time.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
Fig. 1 is a schematic diagram of the system structure of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
The embodiment of the utility model discloses anti inclined to one side ageing tests system of humid tropical high atmospheric pressure, including environmental control device and test circuit, mutual display screen, see figure 1.
The environment control device comprises a test box, a temperature control module, a humidity control module, an air pressure control module, a fixing plate and a controller, wherein the controller is sequentially connected with the temperature control module, the humidity control module and the air pressure control module, and the temperature control module, the humidity control module, the air pressure control module and the fixing plate are all arranged in the test box.
In a specific embodiment, the temperature control module comprises a heater and a temperature sensor, and is used for monitoring the temperature in the test chamber in real time and adjusting the temperature. In another embodiment, the temperature control module further comprises a cooling device, and the temperature inside the test box can be cooled through a liquid cooling mode outside the test box.
The humidity control module comprises a humidifier and a humidity sensor and is used for monitoring the humidity in the test box in real time and adjusting the humidity. In another embodiment, the humidity control module further comprises a dehumidifying device, and specifically, dehumidifying can be performed by adding a dehumidifying substance such as diatom ooze or diatomite.
The air pressure control module comprises an air blower and an air pressure sensor and is used for monitoring the air pressure in the test box in real time and adjusting the air pressure in real time. The air blower is communicated with the test box through a ventilation pipeline, and a switch valve is arranged in the ventilation pipeline or at the opening of the ventilation pipeline. In another embodiment, the air pressure control module further comprises an air outlet for exhausting air in the test chamber to reduce the air pressure value in the test chamber. And the air outlet is also provided with a sealing plug in a matching way.
The controller can select devices such as a single chip microcomputer, the input end of the controller is connected with devices such as a temperature sensor, a humidity sensor and an air pressure sensor, and the output end of the controller is connected with devices such as a heater, a humidifier and a blower.
The test circuit comprises a power supply module, a protection indicating circuit, a device to be tested and a monitoring module which are connected in sequence, wherein the device to be tested is installed on the fixing plate and is a semiconductor device; the monitoring module is also connected with the controller.
In a specific embodiment, the protection indication circuit and the monitoring module can be integrated on an aging board, and the fixing board is installed on the aging board.
The protection indicating circuit comprises a thermistor, a current limiting resistor and a light emitting diode, wherein the thermistor is connected in series with a power line, and the current limiting resistor and the light emitting diode are connected in series and then connected in parallel at two ends of the thermistor. The thermistor is used for being changed into a high-resistance state when the testing device is in failure and short circuit, so that the circuit is protected; the current limiting resistor and the light emitting diode are used for electrifying and emitting light when the thermosensitive electrons are changed into a high-resistance state, so that the failure short circuit of the testing device is indicated.
The power module comprises a positive direct-current power supply and a negative direct-current power supply, wherein the positive direct-current power supply is connected with the positive pole of the aging board, and the negative direct-current power supply is connected with the negative pole of the aging board. In a specific embodiment, the tested device can be powered by a positive and negative high-voltage power supply with the type of a Difco power supply HAPS 06-1500. The positive bias of the triode, i.e. the voltage applied between the two electrodes, is consistent with the conduction direction of the PN junction, for example, the NPN tube, the B junction and the E junction, the potential of the B electrode is higher than that of the E electrode, and the positive bias is called, and the reverse bias is called if the reverse bias is opposite. The reverse bias aging test is to apply a reverse bias voltage to the device to be tested, accelerate the aging of the device under a specific environment, and detect whether the device is qualified.
The monitoring module comprises a voltage monitoring module and a current monitoring module, the voltage, the leakage current and the like of each device to be tested are monitored, whether the aged device to be tested meets the standard or not is judged, and when the monitoring index reaches a related preset threshold value, the unqualified device to be tested is indicated.
In a specific implementation process, the aging board is provided with a plurality of aging boards, namely, the aging boards comprise a plurality of protection indicating circuits and monitoring modules so as to realize reverse bias aging tests on a plurality of devices to be tested. The protection indicating circuit is arranged on each device to be tested, so that the light-emitting diodes can be observed to know whether each device to be tested has a failure short circuit or not, and the failure short circuit of any device to be tested does not influence the aging tests of other devices.
The interactive display screen is arranged on the outer side of the box body of the test box. The interactive display screen is connected with the controller and used for enabling workers to manually set the temperature, the humidity and the air pressure in the test box and displaying the actual values of the temperature, the humidity and the air pressure in the current test box. The interactive display screen is also connected with the monitoring module through the controller and used for displaying monitoring results of the monitoring module, including voltage, current and the like of each device to be tested.
In the present specification, the embodiments are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (7)
1. A high-temperature high-humidity high-air-pressure anti-bias aging test system is characterized by comprising an environment control device and a test circuit;
the environment control device comprises a test box, a temperature control module, a humidity control module, an air pressure control module, a fixing plate and a controller, wherein the controller is sequentially connected with the temperature control module, the humidity control module and the air pressure control module;
the test circuit comprises a power supply module, a protection indicating circuit, a device to be tested and a monitoring module which are connected in sequence, wherein the device to be tested is arranged on the fixing plate;
the monitoring module is also connected with the controller.
2. The system for testing the anti-aging of high temperature, high humidity and high pressure and anti-bias aging of claim 1, further comprising an interactive display screen, wherein the interactive display screen is connected with the controller and is used for setting the temperature, humidity and pressure in the test chamber and displaying the current temperature, humidity and pressure in the test chamber; the interactive display screen is also connected with the monitoring module through the controller and used for displaying monitoring results of the monitoring module, including voltage and current.
3. The system of claim 1, wherein the temperature control module comprises a heater and a temperature sensor, the humidity control module comprises a humidifier and a humidity sensor, and the air pressure control module comprises an air blower and an air pressure sensor.
4. The system according to claim 1, wherein the protection indication circuit and the monitoring module are integrated on an aging board, and the fixing plate is mounted on the aging board.
5. The system of claim 1, wherein the protection indication circuit comprises a thermistor, a current limiting resistor, and a light emitting diode, wherein the thermistor is connected in series to a power line, and the current limiting resistor and the light emitting diode are connected in series and then connected in parallel to two ends of the thermistor.
6. The system according to claim 4, wherein the power module comprises a positive DC power supply and a negative DC power supply, wherein the positive DC power supply is connected with the positive electrode of the aging board, and the negative DC power supply is connected with the negative electrode of the aging board.
7. The system for testing reverse bias aging of high temperature, high humidity and high pressure according to claim 1, wherein the monitoring module comprises a voltage monitoring module and a current monitoring module.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202222124155.9U CN217954602U (en) | 2022-08-12 | 2022-08-12 | High-temperature high-humidity high-air-pressure anti-bias aging test system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202222124155.9U CN217954602U (en) | 2022-08-12 | 2022-08-12 | High-temperature high-humidity high-air-pressure anti-bias aging test system |
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| Publication Number | Publication Date |
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| CN217954602U true CN217954602U (en) | 2022-12-02 |
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| CN202222124155.9U Active CN217954602U (en) | 2022-08-12 | 2022-08-12 | High-temperature high-humidity high-air-pressure anti-bias aging test system |
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| CN (1) | CN217954602U (en) |
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- 2022-08-12 CN CN202222124155.9U patent/CN217954602U/en active Active
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Address after: 311107 No.16, No.2 Yongtai Road, Renhe Street, Yuhang District, Hangzhou, Zhejiang Patentee after: Hangzhou Gaoyu Electronic Technology Co.,Ltd. Address before: No. 16, No. 2, Yongtai Road, Renhe Street, Yuhang District, Hangzhou City, Zhejiang Province 310000 Patentee before: HANGZHOU GAOYU ELECTRONIC TECHNOLOGY CO.,LTD. |