CN217931942U

CN217931942U - Chip test is with pushing down test seat

Info

Publication number: CN217931942U
Application number: CN202222003784.6U
Authority: CN
Inventors: 吴炜奇
Original assignee: Shenzhen Wenzhi Electronics Co ltd
Current assignee: Shenzhen Wenzhi Electronics Co ltd
Priority date: 2022-08-01
Filing date: 2022-08-01
Publication date: 2022-11-29
Anticipated expiration: 2032-08-01

Abstract

The utility model relates to the technical field of chip testing, in particular to a downward-pressing test seat for chip testing, which comprises an upper cover and a base, wherein the upper cover is arranged into a square frame structure with an upper opening and a lower opening, the upper cover is connected with the base in a vertical sliding manner, the upper side of the base is provided with a mounting groove aligned with the opening of the upper cover, a probe assembly is arranged in the mounting groove, the base is rotatably connected with fasteners used for pressing a chip on the upper side of the probe assembly on two opposite sides of the mounting groove, and the rotation of the fasteners is driven by the upward and downward movement of the upper cover; the probe assembly is internally provided with a movable cavity, a stamping spring piece needle is arranged in the movable cavity, the upper end and the lower end of the stamping spring piece needle respectively penetrate out of the movable cavity through an upper communicating hole and a lower communicating hole and are arranged above and below the probe assembly, and the middle part of the upper end of the stamping spring piece needle is downwards sunken to form a claw head. After the stamping spring sheet pin is contacted with the soldering tin ball on the pin, the stamping spring sheet pin is pressed and bent, so that the contact force between the stamping spring sheet pin and the soldering tin ball is lighter, and the surface of the soldering tin ball cannot be damaged.

Description

Chip test is with pushing down test seat

Technical Field

The utility model relates to a chip test technical field, concretely relates to chip test is with pushing down test seat.

Background

With the recent advances in technology, the demand for electronic products such as PCs, network terminals, communications and network-related devices has increased, which has led to the vigorous development of the semiconductor industry in the world. Integrated circuit chips with various functions become the core of electronic product hardware circuits.

In the process of chip processing and production, not only the chip needs to be tested, but also some programs need to be recorded in the chip according to the requirements. At present, there are two methods for testing and burning the chip. One is manual testing or burning, and the method adopts a manual operation mode to test or burn the chips one by one. The method has low efficiency and high labor cost, and is only suitable for a small amount of production and use. The other is to adopt automatic test equipment to test or burn the chip.

When the chip is burned or tested, the distance between the pins on the chip is small, and the pins of different chips are arranged and have different distances, so that the test equipment can be connected with the chip, the test seat is often required to be matched with the test equipment to test or burn the chip, and the test seat is used as a high-precision adapter to connect the chip and the test equipment.

In the prior art, the front surface of the test socket is mostly connected with pins on the chip in a pin hole mode, and the chip is fixed on the front surface of the test socket in a pressing cover or pressing sheet matching mode. Although the connection mode is simple and firm, when the pin is inserted into the pin hole, the solder ball at the connection part of the pin and the chip can be directly contacted and extruded with the hole opening of the pin hole, so that the surface of the solder ball is easily damaged.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a chip test is with pushing down test seat solves prior art, and when the chip was installed on the test seat, the welding tin ball of chip pin can be direct and the drill way contact extrusion in pin hole, causes the problem of welding tin ball surface damage easily.

In order to solve the technical problem, the utility model adopts the following technical scheme:

a downward-pressing test seat for chip testing comprises an upper cover and a base, wherein the upper cover is of a square frame structure with an upper opening and a lower opening, the upper cover is connected with the base in a vertical sliding mode, an installation groove aligned with the opening of the upper cover is formed in the upper side of the base, a probe assembly is installed in the installation groove, fasteners used for pressing a chip on the upper side of the probe assembly are rotatably connected to two opposite sides of the installation groove of the base, and the rotation of the fasteners is driven by the upward and downward movement of the upper cover; the probe assembly is internally provided with a movable cavity, a stamping spring piece needle is arranged in the movable cavity, the upper end and the lower end of the stamping spring piece needle penetrate out of the movable cavity through an upper communicating hole and a lower communicating hole respectively and are arranged above and below the probe assembly, and the middle of the upper end of the stamping spring piece needle is sunken downwards to form a claw head.

The probe assembly comprises a plurality of thin plates which are vertically arranged and horizontally overlapped, wherein one side of each of the thin plates is recessed to form a movable groove, when two adjacent thin plates are overlapped, the movable groove on one thin plate is matched with the side surface of the other thin plate to form a movable cavity, the middle part of the punching elastic sheet needle is arranged in the movable cavity in an arched manner, an upper limiting block is convexly formed on the lower side of an upper communicating hole on the outer wall of the punching elastic sheet needle, and a first lower limiting block is convexly formed on the upper side of a lower communicating hole; the lower communicating hole comprises a first hole section and a second hole section which are communicated with each other, the first hole section is communicated with the movable cavity, the second hole section is communicated with the lower side of the thin plate, a second lower limiting block is convexly formed on the side face of the lower end of the stamping spring piece needle, the whole width of the second lower limiting block and the stamping spring piece needle is matched with the inner diameter of the second hole section, and the second lower limiting block is larger than the aperture of the first hole section.

According to a further technical scheme, the probe assembly further comprises two check blocks, and when the thin plates are arranged in the mounting grooves in an overlapped mode, the two check blocks clamp the thin plates from two opposite sides of the probe assembly respectively.

A further technical scheme is that the upper cover is connected with the base in a sliding mode up and down through two guide plates which are arranged oppositely, the two guide plates are arranged on the lower sides of two opposite sides of the upper cover respectively, a first limit stop is arranged on the inner side of the lower end of each guide plate, the two opposite sides of the base are recessed to form guide grooves, the two guide grooves are arranged towards the front side and the rear side of the base respectively, a second limit stop is arranged at the bottom of each guide groove, when the upper cover is assembled on the base, the two guide plates are arranged in the two guide grooves in a sliding mode respectively, the first limit stop is arranged below the second limit stop, and the first limit stop and the second limit stop are matched to limit the upward stroke of the upper cover.

A further technical scheme is that the fastener is rotationally connected with the base through a first bolt and a second bolt, the base is provided with first rotating grooves with upward openings on the left side and the right side of the mounting groove, sliding grooves which incline downwards from outside to inside are arranged on groove walls on the front side and the rear side of each first rotating groove, the first rotating grooves are communicated with the mounting groove through gaps, the outer sides of the check blocks are connected with a pair of supporting blocks, bolt grooves are formed on the upper sides of the pair of supporting blocks in a recessed mode, and when the check blocks are mounted in the mounting grooves, the pair of supporting blocks are arranged in the corresponding gaps; the fastener is the arc setting, and the downside at fastener middle part is connected with the rotor arm, the side of rotor arm link up and is provided with first bolt hole, the side of fastener link up and is provided with second bolt hole, and the cross-section in second bolt hole is arc rectangular form, the downside of the upper cover left and right sides all is provided with connecting portion, the downside of connecting portion is provided with the second and rotates the groove, the second rotates the groove and all is provided with the opening of mutual intercommunication in the downside and the inboard of connecting portion, all be provided with the second rectangular hole with connecting portion surface intercommunication on the cell wall of both sides around the second rotates the groove, when the fastener assembles on the base, the rotor arm is arranged in between a pair of supporting shoe, and when first bolt hole and bolt groove align, first bolt passes bolt groove and first bolt hole in proper order, connecting portion slide from top to bottom sets up in first connecting groove, the fastener is arranged in the second and is rotated the inslot, the second bolt hole, second rectangular hole and sliding tray align, the middle part of second bolt is arranged in the second bolt hole, the both ends of second bolt are worn into two sliding tray holes of both sides respectively in the past back.

A further technical scheme is that two rotating holes are formed in the front inner wall and the rear inner wall of the notch in an aligned mode, the two rotating holes are respectively communicated with the bottoms of the guide grooves on the front side and the rear side of the base, and vertical strip-shaped through holes penetrating through the front side and the rear side are formed in the two guide plates; when the first bolt is inserted into the first bolt hole and the bolt groove, two ends of the first bolt respectively penetrate out of the two rotating holes and are arranged in the two strip through holes.

According to a further technical scheme, the probe assembly further comprises a limiting frame and a floating plate which are detachably connected up and down, pin holes penetrating through two sides are formed in the floating plate, and when the floating plate is assembled on the upper side of a thin plate, the upper ends of the stamping spring piece needles penetrate through the pin holes and are arranged in the limiting frame; the left and right sides of kickboard inwards caves in and forms the bayonet socket, and the inboard arch of lower extreme of rotor arm is formed with the sledge piece, and when the kickboard assembled in the sheet metal upside, bayonet socket and breach alignment, the sledge piece card was located in the bayonet socket.

A further technical scheme is that the limiting frame and the floating plate are connected in a vertically detachable mode through the connecting column, the connecting column is vertically arranged on the upper side of the edge of the floating plate, the lower side of the edge of the limiting frame is provided with a connecting hole, and the connecting column is clamped in the connecting hole when the limiting frame is assembled on the upper side of the floating plate.

According to a further technical scheme, the inner wall of the limiting frame is inclined inwards from top to bottom to form a guide surface.

Compared with the prior art, the beneficial effects of the utility model are that: the upper cover is arranged to be of a square frame structure with an upper opening and a lower opening, so that the mechanical arms on the test equipment can open the covers differently when the chips are taken and placed, and the chips can be taken and placed directly from the openings. Through setting up the fastener, the upside at the probe subassembly is fixed to messenger's chip that can be fine to be convenient for test equipment tests or burns record etc.. Through setting up the rotation that drives the fastener through the upper cover, only need drive the upper cover through the arm on the test equipment like this and reciprocate, just can make the fastener rotate to with the chip pressfitting at probe subassembly upside, perhaps lift up from the chip, the robotic arm of being convenient for gets and puts the chip. Through setting up the cooperation of punching press bullet piece needle and activity chamber and last intercommunicating pore, can be in the punching press bullet piece needle with the welding tin ball on the pin after the contact, the bending under pressure makes punching press bullet piece needle lighter with welding tin ball contact strength, can not harm the surface of welding tin ball. By arranging the claw head, the contact area with the welding tin ball and the connection contact quality are improved.

Drawings

Fig. 1 is a schematic perspective view of a push-down test socket for chip testing according to the present invention.

Fig. 2 is a schematic diagram showing the separation between the upper cover and the base of the push-down test socket for testing chips according to the present invention.

Fig. 3 is an exploded view of the push-down test socket for chip testing according to the present invention.

Fig. 4 is a schematic side view of a thin sheet of the push-down test socket for testing a chip according to the present invention.

Fig. 5 is a schematic view of a fastener of a push-down test socket for testing a chip according to the present invention.

Icon: 1-upper cover, 2-base, 3-mounting groove, 4-probe assembly, 5-fastener, 6-movable cavity, 7-punching spring sheet needle, 8-upper communicating hole, 9-lower communicating hole, 10-claw head, 11-thin plate, 12-upper limiting block, 13-first lower limiting block, 14-first hole section, 15-second hole section, 16-second lower limiting block, 17-stop, 18-guide plate, 19-first limiting stop, 20-guide groove, 21-second limiting stop, 22-first bolt, 23-second bolt, 24-first rotating groove, 25-sliding groove, 26-notch, 27-support block, 28-bolt groove, 29-rotating arm, 30-first bolt hole, 31-second bolt hole, 32-connecting part, 33-second rotating groove, 34-second strip hole, 35-rotating hole, 36-vertical strip through hole, 37-limiting frame, 38-floating plate, 39-40-bayonet, 39-connecting column, and 42-connecting hole.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the invention.

Fig. 1 to 5 show an embodiment of the present invention.

Example 1:

as shown in fig. 1-3, a press-down test socket for chip testing comprises an upper cover 1 and a base 2, wherein the upper cover 1 is provided with a square frame structure with an upper opening and a lower opening, the upper cover 1 is connected with the base 2 in a vertical sliding manner, an installation groove 3 aligned with the opening of the upper cover 1 is arranged on the upper side of the base 2, a probe assembly 4 is installed in the installation groove 3, fasteners 5 for pressing a chip on the upper side of the probe assembly 4 are rotatably connected to two opposite sides of the base 2 on the installation groove 3, and the rotation of the fasteners 5 is driven by the upper cover 1 moving up and down; be provided with movable chamber 6 in the probe subassembly 4, install punching press shell fragment needle 7 in the movable chamber 6, the upper and lower both ends of punching press shell fragment needle 7 are passed out movable chamber 6 through last intercommunicating pore 8 and lower intercommunicating pore 9 respectively, arrange probe subassembly 4's top and below in, and the middle part undercut of the upper end of punching press shell fragment needle 7 forms claw head 10. By arranging the upper cover 1 into a square frame structure with an upper opening and a lower opening, the mechanical arms on the test equipment can open the covers differently when taking and placing the chips, and the operation of taking and placing the chips can be finished directly from the openings. Through setting up fastener 5, the upside at probe subassembly 4 is fixed to messenger's chip that can be fine to be convenient for test equipment tests or burns record etc.. Through setting up the rotation that drives fastener 5 through upper cover 1, only need drive upper cover 1 through the arm on the test equipment like this and reciprocate, just can make fastener 5 rotate to with the chip pressfitting at probe assembly 4 upside, perhaps lift from the chip, be convenient for robotic arm gets puts the chip. Through setting up the cooperation of punching press bullet piece needle 7 and activity chamber 6 and last intercommunicating pore 8, can press the bending after the welding tin ball contact on 7 and the pin of punching press bullet piece, make 7 and the welding tin ball contact strength of punching press bullet piece needle lighter, can not harm the surface of welding tin ball. By arranging the claw 10, the contact area with the welding tin ball and the connection contact quality are improved. Through setting up the downside that intercommunicating pore 9 can be convenient for punching press bullet piece needle 7 follow probe unit 4 and wear out to the tank bottom and the test equipment that pass mounting groove 3 link together, just so can be fine play switching effect, and in the conventional setting, the tank bottom central zone of mounting groove 3 sets up to the fretwork, and the punching press of being convenient for plays piece needle 7 and wears out. The test socket is mainly suitable for full-automatic chip test and burn-in aging.

As shown in fig. 2, the probe assembly 4 includes a plurality of thin plates 11 which are vertically arranged and horizontally overlapped together, one side of each of the plurality of thin plates 11 is recessed to form a movable groove, when two adjacent thin plates 11 are overlapped together, the movable groove on one thin plate 11 is matched with the side surface of the other thin plate 11 to form a movable cavity 6, the middle part of the punching spring sheet needle 7 is arranged in an arc shape in the movable cavity 6, an upper limit block 12 is convexly formed on the outer wall of the punching spring sheet needle 7 at the lower side of an upper communication hole 8, and a first lower limit block 13 is convexly formed at the upper side of a lower communication hole 9; the lower communication hole 9 comprises a first hole section 14 and a second hole section 15 which are communicated with each other, the first hole section 14 is communicated with the movable cavity 6, the second hole section 15 is communicated with the lower side of the thin plate 11, a second lower limiting block 16 is convexly formed on the side face of the lower end of the punching spring piece needle 7, and the overall width of the second lower limiting block 16 and the punching spring piece needle 7 is matched with the inner diameter of the second hole section 15 and is larger than the aperture of the first hole section 14. By means of the arrangement, the thin plates 11 are overlapped together, the number of the thin plates 11 can be well adjusted according to the number of pins of different chips, and therefore the chip packaging box is suitable for chips of more models. In a conventional arrangement, as shown in fig. 4, the punched leaf spring needles 7 are all mounted in movable slots, and a plurality of punched leaf spring needles 7 are mounted in each movable slot. Through the arrangement of the upper limiting block 12 and the cooperation of the first lower limiting block 13, the middle part of the punching elastic sheet needle 7 can be well arched in the movable groove. And the upper limit block 12 can well control the distance of the punching spring sheet needle 7 penetrating out of the upper end of the thin plate 11, so that the punching spring sheet needle is convenient to contact with a chip. Through the cooperation of the first lower limiting block 13 and the second lower limiting block 16 with the lower communicating hole 9, the lower end of the punching spring piece needle 7 can have a certain up-and-down moving space, but cannot be completely retracted into the moving groove, so that the lower end of the punching spring piece needle 7 cannot be connected with a testing device.

As shown in fig. 3, the probe assembly 4 further includes two stoppers 17, and when the plurality of thin plates 11 are mounted in the mounting groove 3 in an overlapped manner, the two stoppers 17 respectively hold the plurality of thin plates 11 from opposite sides of the probe assembly 4. Through setting up dog 17, when a plurality of sheets 11 coincide and install in mounting groove 3, carry out fine centre gripping through two dogs 17 to a plurality of sheets 11 and fix, two dogs 17 can have different thickness according to the demand simultaneously, ensure that a plurality of sheets 11 can be stable fix in mounting groove 3.

The upper cover 1 is connected with the base 2 in an up-and-down sliding mode through two guide plates 18 which are arranged oppositely, the two guide plates 18 are arranged on the lower sides of the two opposite sides of the upper cover 1 respectively, first limit stops 19 and stop blocks 17 are arranged on the inner sides of the lower ends of the guide plates 18, the two opposite sides of the base 2 are both inwards recessed to form guide grooves 20, the two guide grooves 20 are arranged towards the front side and the rear side of the base 2 respectively, second limit stops 21 and stop blocks 17 are arranged at the bottoms of the guide grooves 20, when the upper cover 1 is assembled on the base 2, the two guide plates 18 are arranged in the two guide grooves 20 in a sliding mode respectively, the first limit stops 19 and stop blocks 17 are arranged below the second limit stops 21 and stop blocks 17, and the first limit stops 19 and the second limit stops 21 and stop blocks 17 are matched to limit the upward stroke of the upper cover 1. With such an arrangement, the upper cover 1 can slide up and down above the base 2 by the cooperation of the guide plate 18 and the guide groove 20, and the first limit stopper 19, the stopper 17, and the second limit stopper 21, the stopper 17 can be well engaged to limit the upward movement of the upper cover 1, thereby preventing the upper cover 1 from falling off from the base 2.

As shown in fig. 4, the fastener 5 is rotatably connected to the base 2 through a first bolt 22 and a second bolt 23, the base 2 is provided with first rotating grooves 24 with upward openings on the left and right sides of the mounting groove 3, sliding grooves 25 inclined downward from outside to inside are provided on the groove walls on the front and rear sides of the first rotating grooves 24, the first rotating grooves 24 are communicated with the mounting groove 3 through notches 26, the outer side of the stopper 17 is connected with a pair of supporting blocks 27, the upper sides of the pair of supporting blocks 27 are both recessed to form bolt grooves 28, and when the stopper 17 is mounted in the mounting groove 3, the pair of supporting blocks 27 are both disposed in the corresponding notches 26; fastener 5 is the arc setting, and the downside at fastener 5 middle part is connected with rotor arm 29, the side of rotor arm 29 link up and is provided with first bolt hole 30, the side of fastener 5 link up and is provided with second bolt hole 31, and the cross-section of second bolt hole 31 is arc rectangular form, the downside of the upper cover 1 left and right sides all is provided with connecting portion 32, the downside of connecting portion 32 is provided with second rotation groove 33, second rotation groove 33 all is provided with the opening of intercommunication in the downside and the inboard of connecting portion 32, all be provided with the second rectangular hole 34 with connecting portion 32 surface intercommunication on the cell wall of second rotation groove 33 front and back both sides, when fastener 5 assembles on base 2, rotor arm 29 arranges in between a pair of supporting shoe 27, and when first bolt hole 30 aligns with bolt groove 28, first bolt 22 passes bolt groove 28 and first bolt hole 30 in proper order, connecting portion 32 slides from top to bottom and sets up in first connecting groove, fastener 5 arranges in second rotation groove 33, second bolt hole 31, second rectangular hole 34 aligns with sliding groove 25, the middle part of second bolt hole 23 is arranged in the middle part, two sides of second bolt hole 31 slip in the front and back two rectangular groove 25 respectively. In the conventional arrangement, besides the upward movement and the downward movement of the upper cover 1 can be controlled completely by the mechanical arm, the upward movement of the upper cover 1 can be pushed by arranging a spring between the upper cover 1 and the base 2, so that the mechanical arm is only required to press the upper cover 1 for downward movement. The spring can be arranged on the upper side of the edge of the base 2, the spring is fixed through the spring groove with the upward opening, and meanwhile, the compressed spring can be stored conveniently. All set up spring groove and spring at four angles of base 2, can play the effect of even support. Meanwhile, the same spring groove or a spring connecting column 39 matched with the spring groove is arranged at the corresponding position of the lower book of the upper cover 1 to be connected with the upper end of the spring. When pressing upper cover 1, be the upper cover 1 downstream in the time of, connecting portion 32 can move down, can drive second bolt 23 and move down simultaneously, and the both ends of second bolt 23 will move down along sliding tray 25 like this, and the long banding second bolt hole 31 of arc that is on the cooperation fastener 5 can make fastener 5 rotate around first bolt 22, just so can make the one end perk of fastener 5 pressfitting chip to accomodate in the second rotation groove 33. The second elongated hole 34 is horizontally arranged in the conventional arrangement, and when the second bolt 23 moves downwards, the second bolt 23 can move horizontally due to the inclined arrangement of the sliding groove 25, so that a part of the second bolt 23 in the second elongated hole 34 can well slide in the second elongated hole 34, and the second elongated hole is prevented from being stuck. On the contrary, when the upper cover 1 moves upwards, the upper cover 1 can drive the second pin 23 to move upwards, so as to drive the fastener 5 to press downwards towards the upper side of the probe assembly 4, and the chip is stably attached to the upper side of the probe assembly 4.

Two rotating holes 35 are formed in the front inner wall and the rear inner wall of the notch 26 in an aligned mode, the two rotating holes 35 are respectively communicated with the bottoms of the guide grooves 20 on the front side and the rear side of the base 2, and the two guide plates 18 are provided with vertical strip-shaped through holes 36 penetrating through the front side and the rear side; when the first plug 22 is inserted into the first plug hole 30 and the plug groove 28, two ends of the first plug 22 respectively penetrate out of the two rotating holes 35 and are placed in the two strip through holes. With this arrangement, when the second plug 23 is mounted, the second plug 23 is inserted from the side surface of the guide plate 18, and the second plug 23 passes through the rotation hole 35 and the first plug hole 30 in this order, whereby the hook 5 can be rotatably fixed in the first rotation groove 24.

The probe assembly 4 further comprises a limiting frame 37 and a floating plate 38 which are connected up and down in a detachable mode, a needle hole penetrating through two sides is formed in the floating plate 38, and when the floating plate 38 is assembled on the upper side of the thin plate 11, the upper end of the stamping spring piece needle 7 penetrates through the needle hole and is placed in the limiting frame 37. Through setting up spacing frame 37, the position after the restriction chip that can be fine is put into. By providing the floating plate 38, the claw head 10 of the punch blade needle 7 can be further guided by the vacuum on the floating plate 38 to move up and down smoothly.

The limiting frame 37 and the floating plate 38 are detachably connected up and down through a connecting column 39, the connecting column 39 is vertically arranged on the upper side of the edge of the floating plate 38, a connecting hole 40 is formed in the lower side of the edge of the limiting frame 37, and when the limiting frame 37 is assembled on the upper side of the floating plate 38, the connecting column 39 is clamped in the connecting hole 40; the left and right sides of the floating plate 38 are recessed inwards to form bayonets 41, the inner side of the lower end of the rotating arm 29 is protruded to form a sled 42, when the floating plate 38 is assembled on the upper side of the thin plate 11, the bayonets 41 are aligned with the notches 26, and the sled 42 is clamped in the bayonets 41. Such setting, when the one end perk of 5 pressfitting chips of fastener accomodate the in-process to second rotation groove 33, can rotate through skid 42 and upwards perk a bit with spacing frame 37, through the relation of spliced pole 39 and connecting hole 40 joint, can drive the one end distance of the upward motion of kickboard 38 to hold up the chip, the arm of being convenient for absorbs the chip. When the mechanical arm presses the edge of the upper cover 1 downwards and moves downwards, the floating plate 38 slowly supports the chip to be tested and leaves the top of the punching elastic sheet needle 7, so that the suction nozzle can take the core again more easily, and the taking rate is improved.

The inner wall of the limiting frame 37 is inclined inwards from top to bottom to form a guide surface. By arranging the guide surface, the chip and the floating plate 38 can be aligned conveniently, so that the chip can be well aligned and installed with the stamping spring sheet needle 7 penetrating out of the upper side of the floating plate 38.

The plastic main body is made of PEI materials, and the spring plate needle is made of beryllium copper by electroplating. The bottom of the stamping spring piece needle 7 is connected and locked with the test scheme board without applying external force on the top, and the bottom of the stamping spring piece needle can have contact allowance of 0.15-0.2 mm with a contact surface, so that the stamping spring piece needle can be more effectively connected and conducted.

Although the invention has been described herein with reference to a number of illustrative embodiments thereof, it should be understood that numerous other modifications and embodiments can be devised by those skilled in the art that will fall within the spirit and scope of the principles of this invention. More specifically, various variations and modifications are possible in the component parts and/or arrangements of the subject combination arrangement within the scope of the disclosure, the drawings and the appended claims. In addition to variations and modifications in the component parts and/or arrangements, other uses will also be apparent to those skilled in the art.

Claims

1. A press-down test seat for chip testing comprises an upper cover (1) and a base (2), wherein the upper cover (1) is of a square frame structure with an upper opening and a lower opening, and is characterized in that the upper cover (1) is connected with the base (2) in a vertical sliding manner, the upper side of the base (2) is provided with a mounting groove (3) aligned with the opening of the upper cover (1), a probe assembly (4) is mounted in the mounting groove (3), the base (2) is rotatably connected with fasteners (5) for pressing a chip on the upper side of the probe assembly (4) on two opposite sides of the mounting groove (3), and the rotation of the fasteners (5) is driven by the vertical movement of the upper cover (1);

be provided with movable chamber (6) in probe subassembly (4), install punching press shell fragment needle (7) in activity chamber (6), the upper and lower both ends of punching press shell fragment needle (7) wear out movable chamber (6) through last intercommunicating pore (8) and intercommunicating pore (9) down respectively, arrange the top and the below of probe subassembly (4) in, the middle part undercut of the upper end of punching press shell fragment needle (7) forms claw head (10).

2. The push-down test socket for chip testing of claim 1, wherein: the probe assembly (4) comprises a plurality of thin plates (11) which are vertically arranged and horizontally overlapped together, one side of each of the plurality of thin plates (11) is recessed to form a movable groove, when two adjacent thin plates (11) are overlapped together, the movable groove on one thin plate (11) is matched with the side surface of the other thin plate (11) to form the movable cavity (6), the middle part of the stamping spring piece needle (7) is arranged in the movable cavity (6) in an arched manner, an upper limiting block (12) is convexly formed on the lower side of an upper communicating hole (8) on the outer wall of the stamping spring piece needle (7), and a first lower limiting block (13) is convexly formed on the upper side of a lower communicating hole (9);

the lower communicating hole (9) comprises a first hole section (14) and a second hole section (15) which are communicated with each other, the first hole section (14) is communicated with the movable cavity (6), the second hole section (15) is communicated with the lower side of the thin plate (11), a second lower limiting block (16) is convexly formed on the side face of the lower end of the stamping spring piece needle (7), the second lower limiting block (16) is matched with the inner diameter of the second hole section (15) in the whole width direction of the stamping spring piece needle (7), and the second lower limiting block is larger than the aperture of the first hole section (14).

3. The push-down test socket for chip testing of claim 2, wherein: probe subassembly (4) still include two dog (17), and is a plurality of when sheet metal (11) coincide is installed in mounting groove (3), two dog (17) are followed the relative both sides of probe subassembly (4) respectively and are held a plurality of sheet metals (11).

4. The push-down test socket for chip testing of any one of claims 1 to 3, wherein: the upper cover (1) is connected with the base (2) in an up-and-down sliding mode through two guide plates (18) which are arranged oppositely, the two guide plates (18) are arranged on the lower sides of two opposite sides of the upper cover (1) respectively, a first limit stop (19) stop (17) is arranged on the inner side of the lower end of each guide plate (18), two opposite sides of the base (2) are recessed inwards to form guide grooves (20), the two guide grooves (20) are arranged towards the front side and the rear side of the base (2) respectively, a second limit stop (21) stop (17) is arranged at the bottom of each guide groove (20), when the upper cover (1) is assembled on the base (2), the two guide plates (18) are arranged in the two guide grooves (20) in a sliding mode respectively, the first limit stop (19) stop (17) is arranged below the second limit stop (21) stop (17), and the first limit stop (19) stop (17) and the second limit stop (21) stop (17) are matched with the upper cover (1) to limit the upward travel of the upper cover (1).

5. The push-down test socket for chip testing of claim 4, wherein: the fastener (5) is rotatably connected with the base (2) through a first bolt (22) and a second bolt (23), the left side and the right side of the mounting groove (3) of the base (2) are respectively provided with a first rotating groove (24) with an upward opening, the groove walls of the front side and the rear side of the first rotating groove (24) are respectively provided with a sliding groove (25) inclining downwards from outside to inside, the first rotating groove (24) is communicated with the mounting groove (3) through a notch (26), the outer side of the block (17) is connected with a pair of supporting blocks (27), the upper sides of the pair of supporting blocks (27) are recessed to form bolt grooves (28), and when the block (17) is mounted in the mounting groove (3), the pair of supporting blocks (27) are arranged in the corresponding notches (26);

the fastener (5) is arranged in an arc shape, the lower side of the middle part of the fastener (5) is connected with a rotating arm (29), the side surface of the rotating arm (29) is provided with a first bolt hole (30) in a penetrating manner, the side surface of the fastener (5) is provided with a second bolt hole (31) in a penetrating manner, the cross section of the second bolt hole (31) is in an arc-shaped long strip shape, the lower sides of the left side and the right side of the upper cover (1) are provided with connecting parts (32), the lower side of the connecting part (32) is provided with a second rotating groove (33), the lower side and the inner side of the connecting part (32) are provided with mutually communicated openings in the second rotating groove (33), and second long strip holes (34) communicated with the surfaces of the connecting parts (32) are formed in the groove walls of the front side and the rear side of the second rotating groove (33);

when the fastener (5) is assembled on the base (2), the rotating arm (29) is arranged between the pair of supporting blocks (27), when the first bolt hole (30) is aligned with the bolt groove (28), the first bolt (22) sequentially penetrates through the bolt groove (28) and the first bolt hole (30), the connecting part (32) is arranged in the first connecting groove in a vertical sliding mode, the fastener (5) is arranged in the second rotating groove (33), the second bolt hole (31), the second strip hole (34) and the sliding groove (25) are aligned, the middle of the second bolt (23) is arranged in the second bolt hole (31), and two ends of the second bolt (23) respectively penetrate into the two sliding grooves (25) from the strip holes on the front side and the back side.

6. The push-down test socket for chip testing of claim 5, wherein: two rotating holes (35) are formed in the front inner wall and the rear inner wall of the notch (26) in an aligned mode, the two rotating holes (35) are communicated with the bottoms of the guide grooves (20) on the front side and the rear side of the base (2) respectively, and vertical strip-shaped through holes (36) penetrating through the front side and the rear side are formed in the two guide plates (18);

when the first bolt (22) is inserted into the first bolt hole (30) and the bolt groove (28), two ends of the first bolt (22) respectively penetrate out of the two rotating holes (35) and are arranged in the two strip through holes.

7. The push-down test socket for chip testing of claim 6, wherein: probe subassembly (4) still include can dismantle continuous spacing frame (37) and kickboard (38) from top to bottom, be provided with the pinhole that link up both sides on kickboard (38), when kickboard (38) assemble in sheet metal (11) upside, the upper end of punching press shell fragment needle (7) is passed the pinhole and is placed in spacing frame (37).

8. The push-down test socket for testing chips of claim 7, wherein: the limiting frame (37) and the floating plate (38) are detachably connected up and down through a connecting column (39), the connecting column (39) is vertically arranged on the upper side of the edge of the floating plate (38), a connecting hole (40) is formed in the lower side of the edge of the limiting frame (37), and when the limiting frame (37) is assembled on the upper side of the floating plate (38), the connecting column (39) is clamped in the connecting hole (40);

the left and right sides of kickboard (38) inwards caves in and forms bayonet socket (41), the inboard arch of lower extreme of rotor arm (29) is formed with sled piece (42), when kickboard (38) assemble in sheet metal (11) upside, bayonet socket (41) and breach (26) align, sled piece (42) card is located in bayonet socket (41).

9. The push-down test socket for testing chips of claim 8, wherein: the inner wall of the limiting frame (37) is inclined inwards from top to bottom to form a guide surface.