CN217878314U

CN217878314U - Automatic testing arrangement of subway gate fan door

Info

Publication number: CN217878314U
Application number: CN202222255913.0U
Authority: CN
Inventors: 刘明丽
Original assignee: Tianjin Line 3 Rail Transit Operation Co Ltd
Current assignee: Tianjin Line 3 Rail Transit Operation Co Ltd
Priority date: 2022-08-26
Filing date: 2022-08-26
Publication date: 2022-11-22
Anticipated expiration: 2032-08-26

Abstract

The utility model discloses an automatic testing device for a metro gate fan door, which comprises an upper computer and a testing circuit board; the testing circuit board comprises an I/O module and a signal interface module, the signal interface module comprises an MCU controller, a door driving circuit and an AD acquisition circuit, the door driving circuit and the AD acquisition circuit are connected with the MCU controller, and the MCU controller is connected with an upper computer through the I/O module; the AD acquisition circuit is connected with a position sensor; the leaf door driving circuit is connected with a leaf door travel switch; the leaf door is arranged at the leaf door travel switch; and a position sensor is arranged above the door leaf travel switch, and the acquisition end of the position sensor is in discontinuous contact with the door leaf travel switch. The door is tested by adopting the travel switch and the position sensor, and the door opening/closing angle deviation is judged by utilizing the position data acquired when the door touches the travel switch, so that the manual operation is replaced, and the automatic door opening/closing test is realized.

Description

Automatic testing arrangement of subway gate fan door

Technical Field

The utility model relates to a subway floodgate machine test technical field especially relates to an automatic testing arrangement of subway floodgate machine fan door.

Background

When a subway enters or leaves a station, the gate plays an important role, the leaf door is an important component module of the gate, and passengers are controlled to enter or leave the gate through the opening and closing actions of the leaf door. Because the door leaves are in a working state for a long time, and the door leaves are frequently opened and closed, various key parts of the door leaves are damaged and offset in different degrees, accelerated abrasion of the door leaves and noise increase are caused, and therefore maintenance is often needed.

During maintenance, an operation test is required to adjust the switching angle and check operation noise. At present, when the door is maintained, the door opening and closing actions of each time need to be manually controlled, the feedback signal of a door opening and closing position detection sensor cannot be checked, and whether the detection result of the position sensor is correct or not is not known. Since the manual operation is required, the deviation of the opening/closing angle of the door leaf caused by the slight deviation of the assembly can not be found, and the potential failure that the parts are abraded or the screw bevel gear screw is not fastened in place due to the deviation of the opening/closing angle of the door leaf in the past can not be found.

Therefore, it is necessary to research an automatic testing device for a door leaf of a subway brake, which replaces manual operation, realizes automatic door opening and closing test, and can realize detection of a position sensor in the test process.

SUMMERY OF THE UTILITY MODEL

Therefore, an object of the utility model is to provide a subway brake machine fan door automatic testing arrangement adopts travel switch and position sensor to test the door, and when utilizing a door touch travel switch, the positional data who gathers judges door opening/closing angular deviation replaces manual operation, realizes the automatic switch door test.

In order to achieve the purpose, the utility model provides an automatic testing device for a subway gate machine door, which comprises an upper computer and a testing circuit board; the testing circuit board comprises an I/O module and a signal interface module, the signal interface module comprises an MCU controller, a door driving circuit and an AD acquisition circuit, the door driving circuit and the AD acquisition circuit are connected with the MCU controller, and the MCU controller is connected with an upper computer through the I/O module; the AD acquisition circuit is connected with a position sensor; the leaf door driving circuit is connected with a leaf door travel switch; the leaf door travel switch is provided with a leaf door; and a position sensor is arranged above the door leaf travel switch, and the acquisition end of the position sensor is in discontinuous contact with the door leaf travel switch.

Further preferably, the test circuit board further comprises an alarm, and the alarm is connected with the MCU controller.

Further preferably, the test circuit board further comprises a temperature sensor, and the temperature sensor is connected with the MCU controller and used for monitoring the temperature of the circuit board.

Further preferably, the door travel switch is provided with three contact pieces arranged side by side, and each contact piece is connected with a contact of the position sensor.

Further preferably, the door leaf driving circuit comprises a driver and a relay, the driver is connected with the relay, and the relay is connected with the door leaf driving motor and the door leaf travel switch.

Furthermore, the driver adopts a Darlington driver, the input end of the Darlington driver is connected with the output end of the MCU controller, and the output end of the Darlington driver is connected with the relay.

Preferably, the test circuit board is further provided with a rechargeable power supply module, and the power supply module is used for providing a working power supply for the signal interface module.

The application discloses subway floodgate machine fan door automatic testing arrangement compares in prior art, has following advantage at least:

1. the door is tested by adopting the travel switch and the position sensor, and the door opening/closing angle deviation is judged by utilizing the position data acquired when the door touches the travel switch, so that the manual operation is replaced, and the automatic door opening/closing test is realized.

2. Through setting up the alarm, carry out automatic alarm to unsatisfied test requirement's fan door, realize automatic monitoring, need not artifical inspection tour. The circuit structure is simple, and the operation is simple and convenient.

Drawings

Fig. 1 is a schematic structural view of an automatic testing device for a metro gate door of the present invention.

Fig. 2 is a schematic circuit diagram of a door driving circuit in the automatic testing device for the door of the subway gate.

In the figure:

1. an upper computer; 2. an I/O module; 3. an MCU controller; 4. a darlington driver; 5. an AD acquisition circuit; 6. an alarm; 7. a temperature sensor; 8. a position sensor.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings and specific embodiments.

As shown in fig. 1, an embodiment of the invention provides an automatic testing device for a subway brake door, which includes an upper computer 1 and a testing circuit board; the testing circuit board comprises an I/O module 2 and a signal interface module, the signal interface module comprises an MCU (microprogrammed control unit) controller 3, a door driving circuit and an AD acquisition circuit 5, the door driving circuit and the AD acquisition circuit are connected with the MCU controller 3, and the MCU controller 3 is connected with an upper computer 1 through the I/O module 2; the AD acquisition circuit 5 is connected with a position sensor 8; the leaf door driving circuit is connected with a leaf door travel switch; the leaf door is arranged at the leaf door travel switch; and a position sensor 8 is arranged above the door travel switch, and the acquisition end of the position sensor 8 is in discontinuous contact with the door travel switch.

The testing circuit board further comprises an alarm 6, and the alarm 6 is connected with the MCU controller 3. The MCU controller 3 adopts a PIC series singlechip. The test circuit board further comprises a temperature sensor 7, and the temperature sensor 7 is connected with the MCU controller 3 and used for monitoring the temperature of the circuit board. And inaccurate test data caused by overheating of the ambient temperature is avoided.

The door travel switch is three contact pieces arranged side by side, and each contact piece is connected with a contact of the position sensor 8. The position data of gathering at every turn is three numerical value, avoids single numerical value to influence the accuracy of data collection.

The fan door driving circuit comprises a driver and a relay, the driver is connected with the relay, and the relay is connected with a fan door driving motor and a fan door travel switch. The driver adopts darlington driver 4, the output of MCU controller 3 is connected to darlington driver 4's input, the relay is connected to darlington driver 4's output.

As shown in fig. 2, in the embodiment of the present application, two relays are provided, namely, a forward relay and a reverse relay for controlling the forward and reverse rotation of the motor; the two travel switches are respectively a forward travel switch and a reverse travel switch for detecting the door opening position and the door closing position of the leaf door, and the position sensor is arranged at any one travel switch. During testing, according to the duty ratio of a main control chip in the MCU controller and a set pulse sequence, when a pulse arrives, SB1 is a stop button, SB2 is a motor starting button, SQ1 is a motor reverse rotation-to-forward rotation travel switch, and SQ2 is a motor forward rotation-to-reverse rotation travel switch. When the forward rotation starting button SB2 is pressed, the motor starts to rotate in the forward direction, the door leaves rotate clockwise to open the door, when the door leaves press the travel switch SQ2, the coil of the forward rotation contactor KM1 is powered off and released, the coil of the reverse rotation contactor KM2 is powered on and closed, the motor changes from the forward rotation to the reverse rotation, the door leaves are closed, and when the door leaves touch the travel switch SQ1, the coil of the KM2 is powered off and released, and one-time testing is completed.

And the testing circuit board is also provided with a rechargeable power supply module, and the power supply module is used for providing a working power supply for the signal interface module. The power supply can be a UPS or other rechargeable batteries.

When the door is tested, the upper computer is connected with the test circuit board according to the wiring mode, and the AD acquisition circuit is connected with the position sensor; the power supply module starts to supply power, the upper computer sends a test instruction to the test circuit board, the MCU controller sends a drive level to the door driving circuit after receiving the test instruction, the door driving circuit amplifies the drive level by using a Darlington driver and outputs the amplified drive level to the relay, the relay drives the door driving motor to rotate, meanwhile, the relay is connected with a door travel switch, when the door driving motor drives the door to move, the door is opened, the travel switch is touched, the door driving motor reversely moves, the door is closed, sequential opening and closing tests are completed, in the process, a position sensor is arranged above the travel switch and acquires the action position of the travel switch, the acquired signal is converted into a digital signal through an AD acquisition circuit, the MCU controller sends the signal to the upper computer by using an IO interface, the upper computer records the position information of each test, the difference between the position information of each action of the door and the originally set position is judged, if the difference exceeds a preset range, the upper computer judges that the door position has a fault, the MCU controller issues an alarm command value, and the MCU controller triggers the alarm to perform acousto-optic alarm. If no problem exists, repeated door opening and closing tests are carried out for many times, for example, the test program is set to be repeated for 500 times, the tests are passed through the repeated tests, if no alarm exists, the door opening and closing performance is good.

It should be understood that the above examples are only for clarity of illustration and are not intended to limit the embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. And obvious variations or modifications can be made without departing from the scope of the invention.

Claims

1. An automatic testing device for a metro gate machine door is characterized by comprising an upper computer and a testing circuit board; the testing circuit board comprises an I/O module and a signal interface module, the signal interface module comprises an MCU controller, a door driving circuit and an AD acquisition circuit, the door driving circuit and the AD acquisition circuit are connected with the MCU controller, and the MCU controller is connected with an upper computer through the I/O module; the AD acquisition circuit is connected with a position sensor; the leaf door driving circuit is connected with a leaf door travel switch; the leaf door is arranged at the leaf door travel switch; and a position sensor is arranged above the door leaf travel switch, and the acquisition end of the position sensor is in discontinuous contact with the door leaf travel switch.

2. The automatic testing device for the gate leaves and the doors of the subway station as claimed in claim 1, wherein said testing circuit board further comprises an alarm, and said alarm is connected with the MCU controller.

3. The automatic testing device for the gate of the subway station according to claim 2, wherein the testing circuit board further comprises a temperature sensor, and the temperature sensor is connected with the MCU controller and used for monitoring the temperature of the circuit board.

4. The automatic testing device for the door leaves of the subway gate machine as claimed in claim 1, wherein said door travel switch is three contact pieces arranged side by side, each contact piece being connected with a contact of a position sensor.

5. The automatic testing device for the gates of the subway station as claimed in claim 1, wherein said gate driving circuit comprises a driver and a relay, said driver is connected with the relay, said relay is connected with the gate driving motor and the gate travel switch.

6. The automatic testing device for the gate of the subway station gate machine as claimed in claim 5, wherein said driver is a Darlington driver, an input end of said Darlington driver is connected to an output end of said MCU controller, and an output end of said Darlington driver is connected to said relay.

7. The automatic testing device for the gate of the subway station according to claim 1, wherein a rechargeable power supply module is further arranged on the testing circuit board, and the power supply module is used for providing a working power supply for the signal interface module.