CN217845450U

CN217845450U - Clamping structure for testing chip multilayer thermistor

Info

Publication number: CN217845450U
Application number: CN202221738577.9U
Authority: CN
Inventors: 徐敬东; 张大力
Original assignee: Wuhu Kailong Electron Co ltd
Current assignee: Wuhu Kailong Electron Co ltd
Priority date: 2022-07-06
Filing date: 2022-07-06
Publication date: 2022-11-18
Anticipated expiration: 2032-07-06

Abstract

The utility model relates to a piece formula multilayer thermistor tests technical field, specific clamping structure is used in test of piece formula multilayer thermistor that says so, include: the surface of the mounting shell is provided with clamping grooves, and the surface of the mounting shell is provided with uniformly distributed scale marks; the inner wall of the mounting shell is connected with a clamping mechanism in a sliding mode, and the lower end of the clamping mechanism extends into the clamping groove; through setting up fixture and regulation structure, thereby can adjust fixture's position through regulation structure and cooperate the draw-in groove to treat that the resistance carries out the centre gripping spacing, effectively avoided in the resistance test process because resistance rocks the condition that influences the test structure, simultaneously under the effect of gag lever post, can carry out spacing avoiding resistance to slide to the baffle in the clamping process, only need stimulate the connecting rod and make it drive the gag lever post and relieve the spacing resistance that can take out the test and accomplish to the baffle when needing to take out resistance.

Description

Clamping structure for testing chip multilayer thermistor

Technical Field

The utility model relates to a piece formula multilayer thermistor tests technical field, very much relates to a piece formula multilayer thermistor tests and uses clamping structure.

Background

The chip type multilayer thermistor needs to be tested after production is completed, and the existing chip type multilayer thermistor is small in size and easy to cause bad contact between an electrode and a test instrument due to shaking in the test process.

Therefore, a clamping structure for chip multilayer thermistor testing is proposed to solve the above problems.

SUMMERY OF THE UTILITY MODEL

The utility model discloses a following technical scheme realizes above-mentioned purpose, a clamping structure is used in test of chip multilayer thermistor, include: the mounting device comprises a mounting shell, a clamping groove and a clamping mechanism, wherein the surface of the mounting shell is provided with uniformly distributed scale marks; the inner wall of the mounting shell is connected with a clamping mechanism in a sliding mode, the lower end of the clamping mechanism extends into the clamping groove, and the clamping mechanism can be matched with the clamping groove to clamp the chip multilayer thermistor; the adjusting structure is arranged in the mounting shell and used for adjusting the position of the clamping mechanism.

Preferably, fixture includes sliding connection in the slider of installation shell inner wall, the bottom fixedly connected with mount pad of slider, the inboard of mount pad articulates there is the baffle, the lower extreme of baffle runs through mount pad and draw-in groove in proper order and extends to the inside of draw-in groove.

Preferably, the both sides of baffle all are provided with the torsional spring, the one end of torsional spring is connected with the fixed surface of baffle, the other end of torsional spring and the inner wall fixed connection of mount pad.

Preferably, the inner wall sliding connection of mount pad has the gag lever post, the lower extreme of gag lever post runs through the mount pad and contacts with the surface of baffle, the upper end of gag lever post runs through mount pad, slider and installation shell and fixedly connected with connecting rod in proper order, the other end fixedly connected with of connecting rod instructs the piece, fixedly connected with spring between the surface of connecting rod and the top of slider.

Preferably, adjust the structure including rotating the lead screw of connecting in the installation shell inner wall, the other end of lead screw runs through the slider and is connected with the inner wall rotation of installation shell, the fixed surface of lead screw is connected with the second cone pulley, the surface meshing of second cone pulley is connected with first cone pulley, one side fixedly connected with runner of first cone pulley, the runner runs through out the installation shell.

Preferably, the inner wall of the installation shell is fixedly connected with guide rods which are symmetrically distributed with the screw rod, and the other ends of the guide rods penetrate through the sliding block and are fixedly connected with the inner wall of the installation shell.

The utility model has the advantages that:

1. by arranging the clamping mechanism and the adjusting structure, the position of the clamping mechanism can be adjusted through the adjusting structure so as to be matched with the clamping groove to clamp and limit the resistor to be tested, the situation that the test structure is influenced by resistor shaking in the resistor test process is effectively avoided, meanwhile, under the action of the limiting rod, the baffle can be limited in the clamping process so as to avoid the sliding of the resistor, and when the resistor needs to be taken out, the tested resistor can be taken out only by pulling the connecting rod to drive the limiting rod to relieve the limitation on the baffle;

2. through setting up fixture and scale mark, can be through adjusting mutually supporting of structure and fixture under, can obtain resistance length specification under the cooperation of instruction piece with the scale mark after the centre gripping is accomplished to follow-up record data has avoided the chaotic condition of record in a plurality of different specification resistance test processes.

Drawings

Fig. 1 is a schematic structural view of the present invention;

FIG. 2 is a sectional perspective view of the present invention;

FIG. 3 is a schematic view of the connection between the clamping mechanism and the adjusting mechanism of the present invention;

fig. 4 is a schematic structural view of the clamping mechanism of the present invention.

In the figure: 1. mounting a shell; 2. an adjustment structure; 3. a clamping mechanism; 101. a card slot; 102. scale marks; 201. a rotating wheel; 202. a first cone pulley; 203. a second cone; 204. a guide bar; 205. a screw rod; 301. a slider; 302. a mounting seat; 303. a baffle plate; 304. a torsion spring; 305. a limiting rod; 306. a connecting rod; 307. an indication block; 308. a spring.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

In the specific implementation: as shown in fig. 1 to 4, a clamping structure for a chip type multilayer thermistor test, includes: the mounting structure comprises a mounting shell 1, wherein a clamping groove 101 is formed in the surface of the mounting shell 1, and scale marks 102 are uniformly distributed on the surface of the mounting shell 1; the clamping mechanism 3 is connected to the inner wall of the mounting shell 1 in a sliding mode, the lower end of the clamping mechanism 3 extends into the clamping groove 101, and the clamping mechanism 3 can clamp the chip multilayer thermistor in cooperation with the clamping groove 101; adjust structure 2, adjust structure 2 and set up in the inside of installation shell 1, and adjust structure 2 and be used for adjusting fixture 3's position.

As shown in fig. 1-4, the clamping mechanism 3 includes a sliding block 301 slidably connected to the inner wall of the mounting housing 1, a mounting seat 302 is fixedly connected to the bottom of the sliding block 301, a baffle plate 303 is hinged to the inner side of the mounting seat 302, the lower end of the baffle plate 303 sequentially penetrates through the mounting seat 302 and the slot 101 and extends into the slot 101, torsion springs 304 are disposed on both sides of the baffle plate 303, one end of each torsion spring 304 is fixedly connected to the surface of the baffle plate 303, the other end of each torsion spring 304 is fixedly connected to the inner wall of the mounting seat 302, a limiting rod 305 is slidably connected to the inner wall of the mounting seat 302, the lower end of the limiting rod 305 penetrates through the mounting seat 302 and contacts with the surface of the baffle plate 303, the upper end of the limiting rod 305 sequentially penetrates through the mounting seat 302, the sliding block 301 and the mounting housing 1 and is fixedly connected with a connecting rod 306, the other end of the connecting rod 306 is fixedly connected with an indicating block 307, a spring 308 is fixedly connected between the surface of the connecting rod 306 and the top of the sliding block 301, when a chip multilayer thermistor to be tested is put in, the chip multilayer thermistor is placed in the clamping groove 101, electrodes at two ends of the chip multilayer thermistor are located on two sides of the mounting shell 1 to facilitate wiring, the resistor is pushed to penetrate through the baffle plate 303, in the process, the resistor can push the baffle plate 303 to rotate along a hinge point with the mounting seat 302, so that normal movement of the resistor is not influenced, meanwhile, the torsion spring 304 is compressed, the baffle plate 303 can be driven to reset under the action of the torsion spring 304 after the whole resistor penetrates through the baffle plate 303, meanwhile, the reverse rotation of the baffle plate 303 can be avoided under the action of the limiting rod 305, so that the resistor in the clamping groove 101 can be limited, when the resistor needs to be taken out, the connecting rod 306 can be pulled to drive the limiting rod 305 to move the stretching spring 308 upwards, meanwhile, the limitation on the baffle plate 303 is relieved, then the resistor is moved to push the baffle plate 303 to reversely turn over, and the torsion spring 304 is stretched, the baffle 303 can be reset under the action of the torsion spring 304 after the resistor integrally passes through the torsion spring 304, and then the connecting rod 306 is loosened, so that the limiting rod 305 can be driven to limit the baffle 303 again under the action of the spring 308.

As shown in fig. 1-4, the adjusting structure 2 comprises a screw 205 rotatably connected to the inner wall of the mounting housing 1, the other end of the screw 205 penetrates through a sliding block 301 and is rotatably connected to the inner wall of the mounting housing 1, a second cone 203 is fixedly connected to the surface of the screw 205, a first cone 202 is engaged with the surface of the second cone 203, a rotating wheel 201 is fixedly connected to one side of the first cone 202, the rotating wheel 201 penetrates out of the mounting housing 1, a guide rod 204 symmetrically distributed with the screw 205 is fixedly connected to the inner wall of the mounting housing 1, the other end of the guide rod 204 penetrates through the sliding block 301 and is fixedly connected to the inner wall of the mounting housing 1, the first cone 202 can be rotated synchronously by rotating the rotating wheel 201, so as to drive the second cone 203 engaged with the screw to rotate the screw 205, the lead screw 205 can be prevented from rotating under the action of the guide rod 204, the sliding block 301 is driven to rotate synchronously, the sliding block 301 can be driven to enable the mounting seat 302 to slide along the inner wall of the mounting shell 1, the mounting seat 302 drives the baffle 303 to move synchronously in the process, the baffle 303 can push the resistor to slide along the inner wall of the clamping groove 101 under the limiting action of the limiting rod 305, the resistor can be clamped and limited until the resistor is tightly abutted against the inner wall of the other side of the clamping groove 101, the condition that the resistor slides to influence the detection structure in the subsequent detection process is avoided, meanwhile, the indicating block 307 can be driven to move synchronously in the process of moving the mounting seat 302, the length specification of the resistor can be measured by matching with the scale mark 102 after the resistor is tightly abutted against the inner wall of the other side of the clamping groove 101, the subsequent data recording is facilitated, and the disordered condition of recording in the process of testing resistors with different specifications is avoided.

The utility model discloses when using, place piece formula multilayer thermistor in draw-in groove 101, make its both ends electrode be located the both sides of installation shell 1, and promote resistance and make it pass baffle 303, can electronic first cone pulley 202 synchronous revolution through rotating runner 201, thereby the second cone pulley 203 that the drive is connected with it meshing makes lead screw 205 rotate, can avoid lead screw 205 to drive slider 301 synchronous revolution when rotatory under the effect of guide bar 204, and thereby can drive slider 301 and make mount pad 302 slide along the inner wall of installation shell 1, mount pad 302 drives baffle 303 synchronous movement at this in-process, baffle 303 can promote resistance to slide along the inner wall of draw-in groove 101 under the spacing of gag lever post 305, it is spacing to accomplish the centre gripping of resistance until supporting tightly with the opposite side inner wall of draw-in groove 101, and then avoid the condition that follow-up in-up detection in-process resistance slip influences the detection structure, can drive instruction piece 307 synchronous movement at the in-process that mount pad 302 removed simultaneously, thereby cooperate the length specification that scale mark line 102 can measure resistance after supporting tightly, be convenient for follow-up record data, it makes its tensile connecting rod 306 drive the reverse rotation of gag lever post 305 and can remove whole upset mechanism 303 again and make it drive spacing again and can push up again and push up the reverse side of turning back of the turning mechanism 201.

Furthermore, it should be understood that although the present specification describes embodiments, not every embodiment includes only a single embodiment, and such description is for clarity purposes only, and it is to be understood that all embodiments may be combined as appropriate by one of ordinary skill in the art to form other embodiments as will be apparent to those of skill in the art from the description herein.

Claims

1. The utility model provides a clamping structure is used in test of chip multilayer thermistor which characterized in that includes:

the device comprises a mounting shell (1), wherein a clamping groove (101) is formed in the surface of the mounting shell (1), and scale marks (102) which are uniformly distributed are arranged on the surface of the mounting shell (1);

the inner wall of the mounting shell (1) is connected with the clamping mechanism (3) in a sliding mode, the lower end of the clamping mechanism (3) extends into the clamping groove (101), and the clamping mechanism (3) can clamp the chip multilayer thermistor in a matching mode with the clamping groove (101);

adjust structure (2), adjust structure (2) and set up in the inside of installation shell (1), and adjust structure (2) and be used for adjusting the position of fixture (3).

2. The clamping structure for testing the chip multilayer thermistor according to claim 1, characterized in that: fixture (3) are including slider (301) of sliding connection in installation shell (1) inner wall, the bottom fixedly connected with mount pad (302) of slider (301), the inboard of mount pad (302) articulates there is baffle (303), the lower extreme of baffle (303) runs through in proper order mount pad (302) and draw-in groove (101) and extends to the inside of draw-in groove (101).

3. The clamping structure for testing the chip multilayer thermistor according to claim 2, characterized in that: the two sides of the baffle (303) are provided with torsion springs (304), one ends of the torsion springs (304) are fixedly connected with the surface of the baffle (303), and the other ends of the torsion springs (304) are fixedly connected with the inner wall of the mounting seat (302).

4. The clamping structure for testing the chip multilayer thermistor according to claim 3, characterized in that: the inner wall sliding connection of mount pad (302) has gag lever post (305), the lower extreme of gag lever post (305) runs through mount pad (302) and contacts with the surface of baffle (303), the upper end of gag lever post (305) runs through mount pad (302), slider (301) and installation shell (1) and fixedly connected with connecting rod (306) in proper order, other end fixedly connected with of connecting rod (306) instructs piece (307), fixedly connected with spring (308) between the surface of connecting rod (306) and the top of slider (301).

5. The clamping structure for testing the chip multilayer thermistor according to claim 2, characterized in that: adjust structure (2) including rotating lead screw (205) of connecting in installation shell (1) inner wall, the other end of lead screw (205) runs through slider (301) and rotates with the inner wall of installation shell (1) and be connected, the fixed surface of lead screw (205) is connected with second cone pulley (203), the surface meshing of second cone pulley (203) is connected with first cone pulley (202), one side fixedly connected with runner (201) of first cone pulley (202), runner (201) run through out installation shell (1).

6. The clamping structure for the test of the chip multilayer thermistor according to claim 5, characterized in that: the inner wall of the installation shell (1) is fixedly connected with guide rods (204) which are symmetrically distributed with the screw rod (205), and the other ends of the guide rods (204) penetrate through the sliding block (301) and are fixedly connected with the inner wall of the installation shell (1).