CN217821583U - MCU supply circuit and MCU test system - Google Patents
MCU supply circuit and MCU test system Download PDFInfo
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- CN217821583U CN217821583U CN202222009011.9U CN202222009011U CN217821583U CN 217821583 U CN217821583 U CN 217821583U CN 202222009011 U CN202222009011 U CN 202222009011U CN 217821583 U CN217821583 U CN 217821583U
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Abstract
The application provides a MCU supply circuit and MCU test system relates to MCU test technology, and this circuit includes: the device comprises a signal generator, a voltage follower and an MCU; the voltage follower is provided with a first end and a second end, the first end of the voltage follower is connected with the signal generator, and the second end of the voltage follower is connected with the MCU; the signal generator is provided with power supply signal sending states respectively corresponding to the at least two test curves, wherein the gradients of different test curves are different; the voltage follower is used for converting the power supply signal that signal generator produced into the power supply signal that has the driving capability to MCU is given in the power supply signal who will have the driving capability, so that the MCU state is gathered to the collector, and the MCU state is used for verifying MCU is in power supply signal's performance, this application embodiment uses signal generator to export the power supply signal that two at least test curves correspond promptly, realizes the power supply under different test curves to MCU, solves MCU's the lower problem of efficiency of software testing.
Description
Technical Field
The application relates to the MCU test technology, in particular to an MCU power supply circuit and an MCU test system.
Background
After the design of the MCU or the circuit is completed, a verification stage is required to be entered to verify the performance of the MCU or the circuit design.
And in the verification stage, a plurality of power supply and electrifying curves are used for testing, and whether the MCU or the circuit design can be compatible with various power supply scenes or not is evaluated. For example, when the MCU is in use after leaving the factory, the power-on speed of the power supply is slow or fast due to the difference of the power adapters, which may cause the MCU not to start normally when the power-on speed is fast, and all the power-on speed is normal, and the prior art cannot perform a comprehensive test in the verification stage.
SUMMERY OF THE UTILITY MODEL
The application provides an MCU power supply circuit and an MCU test system, which are used for solving the problem of multi-party verification of different test curves of MCU power-on or power-off test.
In a first aspect, the present application provides an MCU power supply circuit, the circuit comprising: the device comprises a signal generator, a voltage follower and an MCU;
the voltage follower is provided with a first end and a second end, the first end of the voltage follower is connected with the signal generator, and the second end of the voltage follower is connected with the MCU;
the signal generator is provided with power supply signal sending states respectively corresponding to the at least two test curves, wherein the gradients of different test curves are different;
the voltage follower is used for converting a power supply signal generated by the signal generator into a power supply signal with driving capability, and transmitting the power supply signal with driving capability to the MCU, so that the MCU state is acquired by the collector, and the MCU state is used for verifying the performance of the MCU under the power supply signal. In one possible implementation, the test curves include a power-up test curve and a power-down test curve; the power-on test curve is used for testing the power-on performance of the MCU; the lower electric test curve is used for testing the lower electric performance of the MCU;
when the two test curves are used in the power-on performance test or the power-off performance test, the gradient of one test curve is larger than the preset value, and the gradient of the other test curve is smaller than the preset value.
In a possible implementation manner, when the number of the test curves is greater than or equal to 3, the power supply signal sending state of the signal generator has a switching sequence such that the output sequence of the test curve with the largest or smallest gradient is the first output sequence, and the gradient difference between the test curve corresponding to each of the remaining output sequences and the test curve corresponding to the previous output sequence is the largest.
In a second aspect, the present application provides an MCU test system, the system comprising: the system comprises an industrial personal computer, a power supply unit, an MCU and a collector; the output end of the industrial personal computer is connected with the input end of the power supply unit; the output end of the power supply unit is connected with the MCU; the collector is connected with the output end of the MCU; the input end of the industrial personal computer is connected with the output end of the collector;
the industrial personal computer is used for receiving parameter information corresponding to at least two test curves input by a user and transmitting the parameter information to the power supply unit;
the power supply unit is provided with power supply signal generation states respectively corresponding to the parameter information of at least two test curves;
the collector is used for collecting and outputting output signals generated by the MCU under the action of each power supply signal; the industrial personal computer is also used for receiving the test result sent by the collector; the test result is the result of whether the output signal is normal or not.
In one possible implementation, the power supply unit comprises a signal generator; the system further comprises a voltage follower;
the voltage follower is arranged between the signal generator and the MCU; the voltage follower is used for converting the power supply signal generated by the signal generator into a power supply signal with driving capability.
In a possible implementation manner, the collector and the voltage follower are arranged on a signal conversion board; the signal conversion board is provided with wiring terminals respectively corresponding to the collector and the voltage follower, the collector is connected with the MCU and the industrial personal computer through the corresponding wiring terminals, and the voltage follower is connected with the signal generator and the MCU through the corresponding wiring terminals.
In a possible implementation manner, the signal conversion board is further provided with a wiring terminal corresponding to the test equipment; the test equipment is used for displaying the output signals collected by the collector.
In one possible implementation, the system further includes a switching circuit; one end of the switch circuit is connected with the test equipment; the other end of the switch circuit is connected with the collector, and when the collector determines that the output signal is abnormal, the switch circuit is controlled to be closed so as to transmit the output signal to the test equipment.
In a possible implementation manner, when the number of the test curves is greater than or equal to 3, the output sequence of the test curve with the largest or smallest gradient is the first output sequence, and the gradient difference between the test curve corresponding to each of the remaining output sequences and the test curve corresponding to the previous output sequence is the largest.
In one possible implementation, the test curves include a power-up test curve and a power-down test curve; the power-on test curve is used for testing the power-on performance of the MCU; the lower electric test curve is used for testing the lower electric performance of the MCU;
when the two test curves are used in the power-on performance test or the power-off performance test, the gradient of one test curve is larger than the preset value, and the gradient of one test curve is smaller than the preset value.
In one possible implementation, the output current of the voltage follower is greater than a preset value.
In a possible implementation, the power supply unit includes a digitally controlled power supply module, or a digital-to-analog converter.
The application provides a MCU supply circuit and MCU test system relates to MCU test technology, and this circuit includes: the device comprises a signal generator, a voltage follower and an MCU; the voltage follower is provided with a first end and a second end, the first end of the voltage follower is connected with the signal generator, and the second end of the voltage follower is connected with the MCU; the signal generator is provided with power supply signal sending states respectively corresponding to the at least two test curves, wherein the gradients of different test curves are different; the voltage follower is used for with the power supply signal that signal generator produced converts the power supply signal that has the driving capability into to the power supply signal who has the driving capability transmits MCU, so that the collector gathers the MCU state, the MCU state is used for verifying MCU is in power supply signal's performance under, this application embodiment uses signal generator to export the power supply signal that two at least test curves correspond promptly, realizes the power supply of MCU under different test curves, solves MCU's the lower problem of efficiency of software testing.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and together with the description, serve to explain the principles of the disclosure.
Fig. 1 is a schematic structural diagram of an MCU power supply circuit provided in an embodiment of the present application;
fig. 2 is a schematic structural diagram of an MCU test system provided in the embodiment of the present application;
fig. 3 is a schematic structural diagram of another MCU test system provided in the embodiment of the present application;
fig. 4 is a schematic diagram of a slope variation of different test curves provided in the embodiment of the present application.
Specific embodiments of the present disclosure have been shown by way of example in the drawings and will be described in more detail below. The drawings and written description are not intended to limit the scope of the disclosed concepts in any way, but rather to illustrate the disclosed concepts to those skilled in the art by reference to specific embodiments.
Detailed Description
Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, like numbers in different drawings represent the same or similar elements unless otherwise indicated. The implementations described in the exemplary embodiments below are not intended to represent all implementations consistent with the present disclosure.
For an MCU or circuit design, verification is required after the design is complete. In the prior art, only one general power-on/power-off test curve is often set to test the MCU, but due to the difference of power adapters, the power-on speed of the power supply is high or low, which may cause the MCU to be incapable of being started normally when the power supply is high, and all the power supply is normal when the power supply is low, and the prior art cannot carry out comprehensive test in a verification stage. The present application therefore proposes to use multiple power supply test curves for testing to determine before shipping whether a chip or circuit design is compatible with various power supply scenarios. When testing whether the MCU is compatible with various power supply scenarios, a user usually selects a test curve manually, so that the signal source outputs a power supply signal corresponding to the test curve to test the start state of the MCU under the action of the power supply signal. However, when there are many test curves, the user is required to manually select all the test curves, which causes a problem of low test efficiency.
The application provides a MCU supply circuit and MCU test system, aims at solving prior art as above technical problem.
The following describes the technical solution of the present application and how to solve the above technical problems in detail by using specific embodiments. The following several specific embodiments may be combined with each other, and details of the same or similar concepts or processes may not be repeated in some embodiments. Embodiments of the present application will be described below with reference to the accompanying drawings.
Fig. 1 is a schematic structural diagram of an MCU power supply circuit provided in an embodiment of the present application, and as shown in fig. 1, the circuit includes: a signal generator 101, a voltage follower 102 and an MCU103; the voltage follower 102 has a first end and a second end, the first end of the voltage follower 102 is connected with the signal generator 101, and the second end of the voltage follower 102 is connected with the MCU103;
the signal generator 101 has power supply signal sending states respectively corresponding to at least two test curves, wherein the slopes of different test curves are different;
the voltage follower 102 is used for converting a power supply signal generated by the signal generator into a power supply signal with driving capability, and transmitting the power supply signal with driving capability to the MCU103 so as to enable the collector to collect the MCU state, wherein the MCU state is used for verifying the performance of the MCU103 under the power supply signal.
The signal generator 101 may receive parameter information of the test curve and generate a power supply signal. Specifically, when there are multiple test curves, the signal generator 101 may generate the power supply signal after receiving the parameter information of one test curve. The generated power supply signals correspond to the test curves, and different test curves correspond to different power supply signals. The device for sending the parameter information of the test curve can be an industrial personal computer.
After generating the power supply signal, the signal generator 101 may send the generated power supply signal to the voltage follower 102, because the power supply signal output by the signal generator 101 does not have the capability of driving the MCU, and the voltage follower 102 needs to be disposed after the signal generator 101. The function of the voltage follower 102 is to convert the supply signal generated by the signal generator 101 into a supply signal of a driving capability. The voltage follower 102 is connected to the MCU103, and can apply the generated power supply signal with driving capability to the MCU 103.
The signal generator 101 receives parameter information of each test curve according to a set interval. One implementation mode is to set a timer, and when the current moment is determined to meet the condition of receiving the parameter information of the test curve, the parameter information is received; another implementation manner is to set a set interval at one end of sending the parameter information, and send the parameter information of one test curve to the signal generator 101 when it is determined that the current time satisfies the condition for sending the parameter information.
The MCU103 has two states under the action of the power supply signal, the first state being: starting or working normally, and the second state is as follows: the MCU103 may output different output signals for the above two states without start-up or abnormal operation. The output signal may represent a power-on state of the MCU103, thereby verifying the performance of the MCU103 under the action of the power supply signal. Wherein, the output signal can be collected by the collector.
The process of judging the output signal generated by the MCU103 to determine whether the test is passed may include the following cases: first, the output signal generated by MCU103 may directly indicate that the test passed or that the test failed. For example, when the test is passed, the output signal can be high level, when the test is not passed, the output signal can be low level, and after the collector collects level information representing whether the test is passed, the information can be transmitted to the industrial personal computer. Secondly, the collector collects the output signal generated by the MCU103, judges the output signal and determines whether the test passes or fails. Optionally, the comparator is used to compare whether the collected output signal is consistent with a reference signal, and when the collected output signal is consistent with the reference signal, the test is passed, and the reference signal represents a signal output by the MCU103 during startup or normal operation. Thirdly, the collector collects output signals generated by the MCU103 and transmits the output signals to the industrial personal computer, and the industrial personal computer judges the output signals, wherein the specific process is similar to the judging process.
The MCU is a (Microcontroller Unit) micro-control Unit chip, and the collector can be an MCU collector.
Through the process, the power supply signal can be generated after the signal generator 101 receives the parameter information corresponding to one test curve, the voltage follower 102 converts the power supply signal and applies the converted power supply signal to the MCU103, so that the MCU103 outputs output signals under different test curves, and the rapid scanning test of all test curves of the MCU103 is realized by continuously receiving the parameter information of the test curves, thereby realizing automatic test, the test curves do not need to be manually selected to supply power for the MCU103, and the test efficiency is improved.
The MCU power supply circuit provided by the embodiment of the application comprises a signal generator, a voltage follower and an MCU; the voltage follower is provided with a first end and a second end, the first end of the voltage follower is connected with the signal generator, and the second end of the voltage follower is connected with the MCU; the signal generator is provided with power supply signal sending states respectively corresponding to the at least two test curves, wherein the gradients of different test curves are different; the voltage follower is used for with the power supply signal that signal generator produced converts the power supply signal that has the driving capability into to the power supply signal who has the driving capability transmits MCU, so that the collector gathers the MCU state, the MCU state is used for verifying MCU is in power supply signal's performance under, compare with prior art, realize the parameter information of two at least test curves of automatic receipt through signal generator and voltage follower, can be after receiving parameter information automatic production power supply signal, realize providing the power supply signal that different test curves correspond for MCU, need not at the in-process of test, the user sets up each test curve manually, improves efficiency of software testing.
In one possible implementation, the test curves include a power-up test curve and a power-down test curve; the power-on test curve is used for testing the power-on performance of the MCU; the lower electric test curve is used for testing the lower electric performance of the MCU;
when the two test curves are used in the power-on performance test or the power-off performance test, the gradient of one test curve is larger than the preset value, and the gradient of one test curve is smaller than the preset value.
When testing the MCU, the test curves may include an upper electrical test curve and a lower electrical test curve, which are respectively used for testing the upper electrical performance and the lower electrical performance of the MCU.
Aiming at the power-on test curve or the power-off test curve, when the MCU is verified, the number of the test curves is at least two. Optionally, one test curve has a smaller gradient, and the other test curve has a larger gradient, and is respectively used for verifying whether the MCU is started or works normally under two conditions of a higher power-on speed and a lower power-on speed.
Optionally, a benchmark test curve may be preset, the slope of the benchmark test curve is a preset value, and the power-on speed of the benchmark test curve is moderate. When two test curves are selected, a slope interval can be set, so that the absolute value of the difference between the slope of the test curve and the preset value is larger than or equal to the slope interval, the purpose that the slope difference of the two selected test curves is large is achieved, and the two selected test curves can represent the test curves with the higher power-on speed and the test curves with the lower power-on speed respectively.
Through the setting mode of the test curves, the selected test curves can represent two types of test curves with high electrifying speed and low electrifying speed, and the performance of the MCU can be determined under the action of fewer test curves.
Fig. 2 is a schematic structural diagram of an MCU test system provided in an embodiment of the present application, and as shown in fig. 2, the system includes: the system comprises an industrial personal computer 204, a power supply unit 201, an MCU202 and a collector 203; the output end of the industrial personal computer 204 is connected with the input end of the power supply unit 201; the output end of the power supply unit 201 is connected with the MCU 202; the collector 203 is connected with the output end of the MCU 202; the input end of the industrial personal computer 204 is connected with the output end of the collector 203; the industrial personal computer 204 is used for receiving parameter information corresponding to at least two test curves input by a user and transmitting the parameter information to the power supply unit 201; the power supply unit 201 has power supply signal generation states respectively corresponding to parameter information of at least two test curves; the collector 203 is used for collecting and outputting an output signal generated by the MCU under the action of each power supply signal; the industrial personal computer 204 is also used for receiving the test result sent by the collector; the test result is the result of whether the output signal is normal or not.
The industrial personal computer 204 supports functions of curve definition, curve storage, curve calling, curve sorting and the like; and simultaneously selecting a plurality of curves and requiring the signal generator to output waveforms in sequence.
The MCU test system comprises an industrial personal computer 204, wherein the industrial personal computer 204 can receive parameter information of at least two test curves input by a user through a keyboard and transmit the parameter information of the test curves.
The collector 203 can collect the output signal of the MCU202, and determine whether the MCU is in a normal state or not through the output signal. Optionally, the collector may collect the output signal of the MCU through GPIO (General-purpose input/output), protocol communication, or ADC (analog-to-digital converter) sampling. Wherein, the power supply signal is the excitation of the MCU, and the output signal is the response of the MCU under the excitation.
Optionally, the industrial personal computer 204 may be implemented by a plurality of circuit modules, and the user inputs parameter information of different test curve sequences by pressing different keys, where each key corresponds to a different test curve combination, and an input circuit module corresponds to a back of each key, and the circuit input module may sequentially generate parameter information of a test curve combination selected by the user. The input circuit module may generate the parameter information of each test curve at preset time intervals when generating the parameter information of each test curve, or after continuously generating the parameter information of each test curve, the input circuit module sends each parameter information to the power supply unit 201 one by one at certain time intervals until the parameter information corresponding to all test curves is sent completely. The determination of the interval time may be implemented using a timer.
The parameter information may be a gradient of a test curve, and the expression manner of the parameter information may be analog voltage, current, duty ratio, duration of high level, or a sequence of high and low levels. For example, when the parameter information is expressed as a high level duration, different durations correspond to different slopes of the test curve.
When the output signal received by the collector 203 from the MCU202 is abnormal, a signal may be sent to the industrial computer 204, for example, the low level is 0, when the output signal is normal, the high level 1 may be sent to the industrial computer 204, the industrial computer 204 determines the received information through the comparator, when the received signal is 0, the currently output parameter information is sent, when the received signal is 1, and after a preset time interval is met, the next parameter information is continuously sent, so as to continuously output the current parameter information of the test curve when the abnormal output signal is received.
Optionally, the industrial personal computer 204 may also be implemented by software, a user inputs parameter information of each test curve through a keyboard, the industrial personal computer 204 may generate and store each test curve, when performing a test, the user may select a plurality of test curves from all test curves, and set an output time interval of each test curve, and automatically set an output order of the selected plurality of test curves, and transmit the parameter information of each test curve to the power supply unit 201 through a USB line, so that the power supply unit 201 automatically generates a power supply signal corresponding to the received parameter information.
Optionally, the industrial personal computer 204 may transmit the parameter information to the power supply unit 201. The power supply unit 201 supports generation of a power supply signal with an arbitrary waveform, and in practice, when the power supply unit 201 receives the parameter information, a predefined test curve can be output.
The collector 203 may also determine whether the output signal is normal after collecting the output signal of the MCU 202. Optionally, the comparator may be used to compare whether the collected output signal is consistent with the reference signal, and when consistent, the output signal is normal, and the reference signal represents a signal output by the MCU202 during startup or normal operation.
After determining whether the output signal is normal, the collector 203 may send the test result to the industrial personal computer 204, for example, send the test result to the industrial personal computer 204 through a serial port line. The industrial personal computer can record the test result, does not need to manually record the test result, and improves the accuracy of the test result statistics.
In this embodiment, the output signal generated by the MCU103 may directly indicate that the test passed or that the test failed. For example, the output signal can be high level when the test is passed, the output signal can be low level when the test is not passed, and the information can be transmitted to the industrial personal computer after the collector collects the level information representing whether the test is passed or not.
The MCU test system provided by the embodiment of the application comprises an industrial personal computer, a power supply unit, an MCU and a collector; the output end of the industrial personal computer is connected with the input end of the power supply unit; the output end of the power supply unit is connected with the MCU; the collector is connected with the output end of the MCU; the input end of the industrial personal computer is connected with the output end of the collector; the industrial personal computer is used for receiving parameter information corresponding to at least two test curves input by a user and transmitting the parameter information to the power supply unit; the power supply unit is provided with power supply signal generation states respectively corresponding to the parameter information of at least two test curves; the collector is used for collecting and outputting output signals generated by the MCU under the action of each power supply signal; the industrial personal computer is also used for receiving the test result sent by the collector; compared with the prior art, the test result is the result of whether the output signal is normal, when the MCU is tested, the parameter information of at least two test curves can be output based on the industrial personal computer, the power supply signal is automatically output based on the power supply unit, and a user does not need to manually set each test curve in the test process, so that the test efficiency is improved.
In one possible implementation, the power supply unit comprises a signal generator; the system further comprises a voltage follower; the voltage follower is arranged between the signal generator and the MCU; the voltage follower is used for converting the power supply signal generated by the signal generator into a power supply signal with driving capability.
Fig. 3 is a schematic structural diagram of another MCU test system provided in this embodiment of the present application, where the power supply unit 201 may be a signal generator, and the signal generator may output power supply signals of each test curve according to received parameter information, but the power supply signals output by the signal generator do not have the capability of driving an MCU, and a voltage follower needs to be disposed behind the signal generator. The voltage follower functions to convert the power supply signal generated by the signal generator into a power supply signal with driving capability and apply the generated power supply signal with driving capability to the MCU, that is, the output terminal of the voltage follower is connected with the VDD terminal of the MCU.
When the number of the test curves is large, the signal generator and the voltage follower are adopted to provide power supply signals for the MCU, so that the power supply signals can be rapidly generated, and the test efficiency is further improved.
In a possible implementation manner, the collector and the voltage follower are arranged on a signal conversion board; the signal conversion board is provided with wiring terminals respectively corresponding to the collector and the voltage follower, the collector is connected with the MCU and the industrial personal computer through the corresponding wiring terminals, and the voltage follower is connected with the signal generator and the MCU through the corresponding wiring terminals.
The signal conversion board is provided with a connecting terminal corresponding to the collector and a connecting terminal corresponding to the voltage follower, and the connecting terminals corresponding to the collector can be connected with the MCU and the industrial personal computer; the connecting terminals corresponding to the voltage followers can be connected with the MCU and the signal generator, and the connecting terminals are provided through the signal conversion board, so that the connection of all parts in the whole system is realized conveniently.
In a possible implementation manner, the signal conversion board is further provided with a connecting terminal corresponding to the testing equipment; the test equipment is used for displaying the output signals collected by the collector.
When the collector receives the output signal, the output signal can be displayed by adopting the testing equipment, so that a user can conveniently analyze the output signal in real time.
Optionally, the testing device is an oscilloscope, and the connecting terminal corresponding to the oscilloscope is further connected to the collector, and can receive the output signal transmitted by the collector, and also can be connected to the output end of the MCU to be tested, and directly collect the signal output by the MCU.
When the industrial personal computer 204 transmits the parameter information of the test curve to the power supply unit 201 one by one, if the test result corresponding to a certain test curve is received and is abnormal, the industrial personal computer 204 continuously outputs the parameter information of the test curve to the power supply unit 201, so that the power supply unit 201 continuously outputs the power supply signal corresponding to the test curve, the test equipment can continuously output the waveform information of the output signal, and a user can continuously analyze the output signal of the test curve.
Through setting up the binding post that corresponds with test equipment, realize showing the signal of MCU output or the output signal that the collector gathered, the user of being convenient for carries out the analysis to output signal.
The test equipment can be always connected into the test system in the test process, and when the output signals collected by the collector are normal and abnormal, the output signals can be displayed. Or, because the user pays more attention to the abnormal condition of the output signal, when the output signal is abnormal, the test equipment is accessed to the test system; when the output signal is normal, the test equipment may not access the test system.
In one possible implementation, the system further includes a switching circuit; one end of the switch circuit is connected with the test equipment; the other end of the switch circuit is connected with the collector, and when the collector determines that the output signal is abnormal, the switch circuit is controlled to be closed so as to transmit the output signal to the test equipment.
In order to realize that the test equipment is accessed to the MCU test system when the output signal of the MCU is in an abnormal state, a switch circuit can be arranged. The MCU monitoring system comprises a sampling device, a switching circuit, a collector and a switch circuit, wherein one end of the switching circuit is connected with the testing device, the other end of the switching circuit is connected with the collector, the collector can control the on-off of the switching circuit, when the collector determines that the output signal of the MCU is abnormal, the switching circuit can be controlled to be closed, the testing device is connected into the system, the output signal collected by the collector is displayed on the testing device, and therefore a user can analyze the output signal. When the collector determines that the output signal of the MCU is normal, the switch circuit can be controlled to be opened, so that the test equipment cannot be accessed to the system.
In this embodiment, the other end of the switch circuit may also be connected to an output terminal of the MCU to be tested, and the switch is controlled to be turned on or off by an output signal of the MCU, and is switched into the test device when the power supply is abnormal.
In addition, the collector can also judge whether the output signal of the MCU is normal, at this moment, the switching circuit at least comprises two ends, the first end is connected with the testing equipment and is in a normally closed state, the second end is connected with the output end of the collector and is in a normally open state, and when the collector determines that the output signal is abnormal, the second end of the control switch is closed, so that the device to be tested is accessed into the system.
The industrial computer also can judge whether MCU's output signal is normal, and at this moment, switch circuit still contains the third end, and the third end links to each other with the output of industrial computer, and when the industrial computer received unusual output signal, the control second end was closed, realized the test equipment access system that awaits measuring.
By arranging the switch circuit, the test equipment can be connected into the test system when the test equipment is required to analyze the output signal, so that the test equipment is prevented from being connected into the test system all the time, and the power consumption is reduced.
In a possible implementation manner, when the number of the test curves is greater than or equal to 3, the output sequence of the test curve with the largest or smallest gradient is the first output sequence, and the gradient difference between the test curve corresponding to each of the other output sequences and the test curve corresponding to the previous output sequence is the largest.
When the number of the test curves is large, the output sequence of the test curves can be set, the gradient of the test curve with high electrifying speed is large, the gradient of the test curve with low electrifying speed is small, and the MCU is easy to cause problems when being electrified quickly or slowly, so that the test curves with large gradient or small gradient can be verified firstly to preferentially troubleshoot the possible problems of the MCU.
Fig. 4 is a schematic diagram illustrating a slope change of different test curves provided by an embodiment of the present application, and as shown in fig. 4, a plurality of test curves are shown, and the slopes of the test curves gradually decrease from left to right.
Optionally, for all the test curves, the test curve with the largest gradient or the smallest gradient may be used as a first output order, the test curve with the largest gradient difference from the test curve in the first output order may be used as a second output order, the test curve with the largest gradient difference from the test curve in the second output order may be used as a third output order, and so on, the output orders of all the test curves are determined, and the power supply unit sequentially outputs the power supply signal corresponding to each test curve.
Specifically, when the user inputs the parameter information of different test curves through the keys, the user can press the keys corresponding to the output sequence to output the parameter information of each test curve according to the output sequence.
By setting the output sequence of the plurality of test curves, whether the MCU has a problem can be determined as soon as possible.
In one possible implementation, the test curves include a power-up test curve and a power-down test curve; the power-on test curve is used for testing the power-on performance of the MCU; the lower electric test curve is used for testing the lower electric performance of the MCU;
when the two test curves are used in the power-on performance test or the power-off performance test, the gradient of one test curve is larger than the preset value, and the gradient of the other test curve is smaller than the preset value.
When testing the MCU, the test curves may include an upper electrical test curve and a lower electrical test curve, which are respectively used for testing the upper electrical performance and the lower electrical performance of the MCU.
Aiming at the power-on test curve or the power-off test curve, when the MCU is verified, the number of the test curves is at least two. Optionally, one test curve has a smaller gradient, and the other test curve has a larger gradient, and is respectively used for verifying whether the MCU is started or works normally under two conditions of a higher power-on speed and a lower power-on speed.
Optionally, a benchmark test curve may be preset, the slope of the benchmark test curve is a preset value, and the power-on speed of the benchmark test curve is moderate. When two test curves are selected, a slope interval can be set, so that the absolute value of the difference between the slope of the test curve and the preset value is larger than or equal to the slope interval, the two selected test curves have larger slope difference, and the two selected test curves can represent the test curves with higher electrifying speed and the test curves with lower electrifying speed respectively.
Through the setting mode of the test curves, the selected test curves can represent two types of test curves with high electrifying speed and low electrifying speed, and the performance of the MCU can be determined under the action of fewer test curves.
In one possible implementation, the output current of the voltage follower is greater than a preset value.
When the signal generator and the voltage follower are adopted to generate power supply signals, certain requirements exist on the type selection of the voltage follower. Because MCU test system not only can test this chip of waiting to test of MCU, can also be used for the test circuit design, in order to satisfy the demand of testing different products, can select the great voltage follower of driving force, specifically, can select the voltage follower that output current is greater than preset numerical value. For example, the output current of the voltage follower is 1A, and most of MCUs and circuit designs can be driven.
In a possible implementation, the power supply unit includes a digitally controlled power supply module, or a digital-to-analog converter.
The power supply unit can be realized by adopting a signal generator and a voltage follower, and can also adopt a digital-to-analog converter, a numerical control power supply module, a self-made signal generator and the like to generate a power supply signal corresponding to the test curve. When the device is adopted, a voltage follower is not required to be arranged in the system, and the device has the advantage of simple mechanism of a test system.
Other embodiments of the disclosure will be apparent to those skilled in the art from consideration of the specification and practice of the disclosure disclosed herein. This application is intended to cover any variations, uses, or adaptations of the disclosure following, in general, the principles of the disclosure and including such departures from the present disclosure as come within known or customary practice within the art to which the disclosure pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the disclosure being indicated by the following claims.
It will be understood that the present disclosure is not limited to the precise arrangements described above and shown in the drawings and that various modifications and changes may be made without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.
Claims (12)
1. An MCU power supply circuit, the circuit comprising: the device comprises a signal generator, a voltage follower and an MCU;
the voltage follower is provided with a first end and a second end, the first end of the voltage follower is connected with the signal generator, and the second end of the voltage follower is connected with the MCU;
the signal generator is provided with power supply signal sending states respectively corresponding to the at least two test curves, wherein the gradients of different test curves are different;
the voltage follower is used for converting a power supply signal generated by the signal generator into a power supply signal with driving capability, and transmitting the power supply signal with driving capability to the MCU, so that the MCU state is acquired by the collector, and the MCU state is used for verifying the performance of the MCU under the power supply signal.
2. The MCU supply circuit of claim 1, wherein the test curves comprise a power-up test curve and a power-down test curve; the power-on test curve is used for testing the power-on performance of the MCU; the lower electric test curve is used for testing the lower electric performance of the MCU;
when the two test curves are used in the power-on performance test or the power-off performance test, the gradient of one test curve is larger than the preset value, and the gradient of one test curve is smaller than the preset value.
3. The MCU power supply circuit according to claim 1, wherein when the number of the test curves is 3 or more, the power supply signal transmission states of the signal generator have a switching sequence such that the output sequence of the test curve with the largest or smallest gradient is the first output sequence, and the gradient difference between the test curve corresponding to each of the remaining output sequences and the test curve corresponding to the previous output sequence is the largest.
4. An MCU test system, the system comprising: the system comprises an industrial personal computer, a power supply unit, an MCU and a collector; the output end of the industrial personal computer is connected with the input end of the power supply unit; the output end of the power supply unit is connected with the MCU; the collector is connected with the output end of the MCU; the input end of the industrial personal computer is connected with the output end of the collector;
the industrial personal computer is used for receiving parameter information corresponding to at least two test curves input by a user and transmitting the parameter information to the power supply unit;
the power supply unit is provided with power supply signal generation states respectively corresponding to the parameter information of at least two test curves;
the collector is used for collecting and outputting output signals generated by the MCU under the action of each power supply signal; the industrial personal computer is also used for receiving the test result sent by the collector; the test result is the result of whether the output signal is normal or not.
5. The system of claim 4, wherein the power supply unit comprises a signal generator; the system further comprises a voltage follower;
the voltage follower is arranged between the signal generator and the MCU; the voltage follower is used for converting the power supply signal generated by the signal generator into a power supply signal with driving capability.
6. The system of claim 5, wherein the collector and the voltage follower are arranged on a signal conversion board; the signal conversion board is provided with wiring terminals respectively corresponding to the collector and the voltage follower, the collector is connected with the MCU and the industrial personal computer through the corresponding wiring terminals, and the voltage follower is connected with the signal generator and the MCU through the corresponding wiring terminals.
7. The system of claim 6, wherein the signal conversion board is further provided with a connection terminal corresponding to a test device; the test equipment is used for displaying the output signals collected by the collector.
8. The system of claim 6, further comprising a switching circuit; one end of the switch circuit is connected with the test equipment; the other end of the switch circuit is connected with the collector, and when the output signal is abnormal, the switch circuit is controlled to be closed so as to transmit the output signal to the test equipment.
9. The system according to claim 4, wherein when the number of the test curves is greater than or equal to 3, the output sequence of the test curve with the largest or smallest gradient is the first output sequence, and the gradient difference between the test curve corresponding to each of the other output sequences and the test curve corresponding to the previous output sequence is the largest.
10. The system of any of claims 4-9, wherein the test curves comprise a power-up test curve and a power-down test curve; the power-on test curve is used for testing the power-on performance of the MCU; the lower electric test curve is used for testing the lower electric performance of the MCU;
when the two test curves are used in the power-on performance test or the power-off performance test, the gradient of one test curve is larger than the preset value, and the gradient of one test curve is smaller than the preset value.
11. The system of claim 5, wherein the output current of the voltage follower is greater than a predetermined value.
12. The system of claim 4, wherein the power supply unit comprises a digitally controlled power module or a digital-to-analog converter.
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| CN202222009011.9U CN217821583U (en) | 2022-08-01 | 2022-08-01 | MCU supply circuit and MCU test system |
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| CN202222009011.9U CN217821583U (en) | 2022-08-01 | 2022-08-01 | MCU supply circuit and MCU test system |
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