CN214750738U - Automatic test system for secondary power supply - Google Patents
Automatic test system for secondary power supply Download PDFInfo
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- CN214750738U CN214750738U CN202023117900.4U CN202023117900U CN214750738U CN 214750738 U CN214750738 U CN 214750738U CN 202023117900 U CN202023117900 U CN 202023117900U CN 214750738 U CN214750738 U CN 214750738U
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Abstract
The utility model discloses an automatic test system of a secondary power supply, which comprises an adaptation module, a test host, a program-controlled power supply, a program-controlled electronic load and a temperature box; the adaptation module is provided with at least ten test channels, and each test channel corresponds to a product to be tested; the incubator is connected with the test host through a cable; the test host is also provided with a load output interface, a power input interface, a product interface and a switch control interface, and is connected with the adaptation module through the switch control interface; the test host is connected with the case interface of the adaptation module through the product interface; the test host is connected with the program-controlled power supply through the power supply input interface, and the test host is connected with the program-controlled electronic load through the load output interface. The utility model discloses an interconnection realizes full-automatic test function between test host and other equipment, can test the product that awaits measuring of a plurality of and different models simultaneously, improves the compatibility of system, improves efficiency of software testing.
Description
Technical Field
The utility model relates to a power detects technical field, especially relates to an automatic test system of secondary power source.
Background
The secondary power supply is a device for converting the electric energy of the main power supply into electric energy of another form or specification, is used for meeting the requirements of different electric equipment, and is an important component of an aircraft power supply system. The existing secondary power supply module test scheme basically tests products of specific models and specific test scenes, and has the following defects:
(1) the test requirement of a certain type of secondary power supply module product can only be met, and the universality is relatively poor;
(2) the conventional secondary power supply module test system can only complete basic test functions, cannot support different test modes such as normal temperature test, high and low temperature test, vibration test and the like, particularly has long time consumption for high and low temperature test, occupies too many human resources, and has poor compatibility;
(3) the existing secondary power supply module test system adopts more physical keys for control, the keys need to be frequently operated in the use process, the test process is complicated, and the efficiency is low;
(4) the conventional secondary power supply module test system can only be connected into one tested product for testing at a time, a connector needs to be frequently plugged and pulled in the using process, and multiple products cannot be connected simultaneously, so that the test efficiency is low.
SUMMERY OF THE UTILITY MODEL
In order to overcome the defects of the prior art, the utility model aims to provide a secondary power supply automatic test system realizes full-automatic test function through the test host computer, can improve the compatibility of system, improves efficiency of software testing.
The purpose of the utility model is realized by adopting the following technical scheme:
an automatic test system for a secondary power supply comprises an adaptation module, a test host, a program-controlled power supply, a program-controlled electronic load and an incubator; the adaptive module is provided with at least ten test channels, and each test channel corresponds to a product to be tested; each product to be tested is located in the incubator, and the incubator is connected with the test host through a cable; the test host is also provided with a load output interface, a power input interface, a product interface and a switch control interface, and is connected with the adaptation module through the switch control interface and used for outputting an IO signal to the adaptation module to control the specified test channel to be conducted and output; the test host is connected with the case interface of the adaptive module through the product interface, so that the signal interconnection between the product to be tested and the test host is realized, and the performance of the product to be tested is tested; the test host is connected with the program-controlled power supply through the power supply input interface, and the test host is connected with the program-controlled electronic load through the load output interface.
Furthermore, each test channel is connected with a relay daughter board, each relay daughter board is connected with a control interface of the adapter module, the adapter module is connected with the switch control interface of the test host through the control interface of the adapter module, and the adapter module controls the on/off of each relay daughter board according to an IO signal output by the test host to change the conduction state of each test channel.
Furthermore, the relay daughter board is also connected with a chassis interface of the adaptation module and used for outputting product parameters including a product identification resistor, a product voltage signal and a product current signal to the test host.
Furthermore, the input interface of the test channel is connected with the products to be tested in different models through different cables.
Furthermore, the test host is provided with a collection management unit, a test unit and a parameter setting unit which are connected with each other; the parameter setting unit is used for carrying out self-defining setting on the test channel, the test mode and relevant parameters of the test mode before testing; the test unit tests the output voltage and the input current of a product to be tested corresponding to the specified test channel according to the test mode and the parameters thereof; the acquisition management unit is used for acquiring a test result, the temperature parameter of the incubator, the program-controlled power supply and the current parameter of the program-controlled electronic load, and displaying and managing the parameters to generate a corresponding test report.
Furthermore, the test host is also connected with a vibration test device, the vibration test device drives the product to be tested to carry out vibration test on an xyz axis, and the test host collects and records vibration test data on the x, y or z axis according to user requirements.
Further, the incubator is provided with a normal temperature mode and a temperature circulation mode, the incubator is at a preset normal temperature in the normal temperature mode, and the incubator is switched between two preset different temperatures in the temperature circulation mode in a circulating manner.
Compared with the prior art, the beneficial effects of the utility model reside in that:
the test host is connected with the incubator, and the product performance of a product to be tested in the environment of normal temperature and temperature cycle is tested by changing the temperature of the incubator, so that the compatibility of different test modes is improved; meanwhile, multiple products can be connected simultaneously through the adaptive module, the test requirements of secondary power supply module products of different models can be met, and the test universality is improved; and the test host has high automation degree in the test process, and greatly improves the test efficiency.
Drawings
Fig. 1 is an overall schematic diagram of the automatic secondary power supply testing system of the present invention;
FIG. 2 is a block diagram of the automatic testing system for secondary power supply of the present invention;
FIG. 3 is a schematic structural diagram of a front panel of the testing host of the present invention;
FIG. 4 is a schematic circuit diagram of the current input to the load of the product to be tested in the testing system of the present invention;
FIG. 5 is a schematic circuit diagram of the voltage input to the oscilloscope of the product to be tested in the testing system of the present invention;
fig. 6 is a schematic circuit diagram of an acquisition unit in the test system of the present invention;
fig. 7 is a schematic view of a front panel of the adapter module of the present invention;
fig. 8 is a schematic view of a rear panel of the adapter module of the present invention;
fig. 9 is a functional schematic diagram of the relay daughter board of the present invention;
fig. 10 is a schematic diagram of a back plate of the adapter module of the present invention;
FIG. 11 is a test interface diagram of the software of the present invention;
fig. 12 is an interface diagram of the temperature profile of the software of the present invention.
In the figure: 1. an adaptation module; 2. a test host; 3. a program-controlled power supply; 4. a program controlled electronic load; 5. and (5) an incubator.
Detailed Description
The present invention will be further described with reference to the accompanying drawings and the detailed description, and it should be noted that the embodiments or technical features described below can be arbitrarily combined to form a new embodiment without conflict.
Example one
This embodiment provides a secondary power supply automatic test system, and this test system can test a plurality of secondary power supply module products of different models, can satisfy the test demand of different test modes such as high low temperature test, normal atmospheric temperature test and vibration test simultaneously, and degree of automation is high in the testing process, can promote efficiency of software testing by a wide margin.
As shown in fig. 1 to 2, the automatic test system for a secondary power supply of the present embodiment mainly includes an adaptation module 1, a test host 2, a programmable power supply 3, a programmable electronic load 4, an incubator 5, and a vibration test device; the adaptive module 1, the programmable power supply 3, the programmable electronic load 4 and the test host 2 can be placed on the same trolley, and the whole movement of the equipment can be conveniently carried out. In this embodiment, the test host 2 is a core device of the system, and the test host 2 adopts a modular design, so that the greatest system portability, functional flexibility and expandability are provided, and users are helped to greatly save space and compress use cost. The test host 2 is internally integrated with a test computer, an oscilloscope, a universal meter, a multifunctional data acquisition module and other modules used in secondary power supply test, supports and expands various desktop instruments, has high integration level, high automation degree, simple operation and accurate and reliable test, and can meet the test requirements of various power supply products. By the expansion of the functional module, the test requirement of the secondary power supply is met, and the test method can be subsequently applied to the test of products such as radio frequency, signal processing and the like.
In this embodiment, as shown in fig. 3, a front panel of the test host 2 is provided with a product interface, a switch control interface, a power input interface, a load output interface, and other interfaces; the test host 2 is connected with the programmable power supply 3 through the power supply input interface, and the programmable power supply 3 also becomes a primary power supply and can adjust the input voltage according to the requirement of a user; the test host 2 is connected with the program-controlled electronic load 4 through the load output interface, as shown in fig. 4, so as to realize current input into the load; the program-controlled electronic load 4 can also adjust various parameters of a load connected with the system according to user requirements, so that the test requirement that whether the output voltage is within a specified deviation range or not is measured under the conditions that the input voltage is a maximum value, a minimum value and a nominal value and the output load is a rated load or not, and whether the input current exceeds an allowable maximum value or not is tested under the condition that each output channel is a standard load or not is realized. In addition, the test host 2 may further include a USB interface, an RS232 interface, a PT100 interface, a LAN interface, and the like, and the RS232 interface, the USB interface, and the LAN interface may be used to implement instrument control and remote interconnection, and the PT100 interface may be used to connect with a temperature sensor in the incubator 5, so as to obtain temperature data of the incubator 5 in real time.
In order to realize that a plurality of products to be tested are simultaneously accessed into the test system, the number of channels of the test host 2 is expanded through the adaptation module 1, in this embodiment, the adaptation module 1 is provided with at least ten test channels, each test channel corresponds to one product to be tested, and the effects of inputting a plurality of products to be tested and outputting one product can be realized. In this embodiment, as shown in fig. 8, ten product input interfaces are arranged on the rear panel of the adaptation module 1, each interface can be connected to different products to be tested through cables, and meanwhile, the product input interfaces can be connected to different products to be tested through different cables, so that the effect of testing power modules of different models is achieved, and the universality of the system is improved.
As shown in fig. 7, a control interface and a chassis interface are disposed on a front panel of the adaptation module 1, and both interfaces adopt aviation connectors conforming to the GJB; the control interface of the adaptation module 1 is connected with the switch control interface of the test host 2 and used for receiving IO control signals and realizing relay control so as to control the conduction and output of a specified test channel; and the case interface of the adaptive module 1 is connected with the product interface of the test host 2, so that the signal interconnection between the product to be tested and the test host 2 is realized.
An internal relay is further arranged in the adaptation module 1 and can output a product to the test host 2. As shown in fig. 9 and 10, in the embodiment, the internal relay of the adapter module 1 is formed by combining a plurality of relay daughter boards, each test channel is connected to a relay daughter board, and the relay daughter boards are inserted into the chassis of the adapter module 1. In this embodiment, the adaptation module 1 is provided with a back plate, the front surface of the back plate is connected with ten relay daughter boards by adopting ten 96Pin european connectors, when any one of the relay daughter boards is in an open state, the corresponding test channel is in a conducting state, at this time, a product to be tested connected with the test channel can be tested, and product parameters including a product identification resistor, a product voltage signal and a product current signal are output to the test host 2; a DB62 type socket is provided on the reverse side of the back plate and is used for being connected to the front panel of the adapter module 1 and connected with the product interface of the test host 2 through the case interface of the adapter module 1; the socket that still is equipped with DB25 model on adaptation module 1's the backplate is used for being connected to on adaptation module 1's the front panel, through adaptation module 1's control interface with test host 2's on-off control interface realizes receiving IO signal and output machine case identification resistance that test host 2 sent.
In addition, the test host 2 is further connected with the incubator 5 and the vibration testing device through signals, and is used for controlling the working states of the incubator 5 and the vibration testing device and collecting working parameters of the incubator 5 and the vibration testing device. The vibration testing device can drive the product to be tested to perform vibration testing on an xyz axis, and the testing host machine 2 collects and records vibration testing data on the x, y or z axis according to user requirements.
In this embodiment, the test host 2 is provided with an acquisition management unit, a test unit and a parameter setting unit which are connected with each other; a user can input parameters in the test host 2, and the parameter setting unit of the test host 2 is used for carrying out self-defined setting on a test channel, a test mode and relevant parameters of the test mode; the test host 2 controls the relay daughter board according to the test channel selected by the user, so that the test channel selected by the user is conducted, and other test channels are closed, thereby realizing the independent test of the product to be tested corresponding to the test channel; then, the test unit can test the output voltage and the input current of the product to be tested corresponding to the appointed test channel according to the test mode and the parameters thereof; in this embodiment, as shown in fig. 5, the test unit may use an oscilloscope or a multimeter in the test host 2 to test the voltage and the current of the product to be tested, and display the test result in the designated software of the test computer built in the test host 2.
The acquisition management unit of the test host 2 may be a data acquisition card as shown in fig. 6, various data acquisition is realized among the devices through the data acquisition card, for example, acquisition of a test result, a temperature parameter of the incubator 5, a current parameter of the programmable power supply 3 and the programmable electronic load 4 is acquired, and the test host 2 displays and manages the parameters to generate a corresponding test report, and also displays the test report in designated software.
The test host 2 tests the product to be tested, wherein the test host comprises an output voltage test and an input current test, wherein the output voltage test specifically refers to measuring whether the output voltage is within a specified deviation range under the conditions that the input voltage is a maximum value, a minimum value and a nominal value and the output load is a rated load; the input voltage can be changed by the programmable power supply 3, and the output load can be adjusted by the programmable electronic load 4. The input current test specifically refers to testing whether the input current exceeds an allowable maximum value under the condition that each output channel is a standard load.
The test modes of the present embodiment include a normal temperature mode, a random vibration mode, and a temperature cycle mode, wherein the temperature cycle mode includes a high-low temperature manual cycle test and a high-low temperature automatic cycle test. The normal temperature mode is a default test mode, after a product to be tested and the test mode are selected, the temperature of the incubator 5 is kept at the preset normal temperature, a user clicks a start button to start the test, the software automatically executes the test, records test data and stores a test report. And the random vibration mode is suitable for a random vibration test, after a product to be tested is selected and the test mode is selected, a test report is newly built at first, a start button is clicked to start the test, the software automatically executes the test process, and after the test is executed, a user manually selects the direction (X, Y, Z) of the vibration test according to the requirement to store test data. The temperature cycle mode is suitable for the temperature cycle test, and the product to be tested is in the incubator 5 with high and low temperature cycle for testing, wherein the specific temperature values of high temperature and low temperature can be adjusted according to the actual situation, the low temperature can be set to be-35 ℃, and the high temperature is set to be 60 ℃. The temperature cycle mode has a manual mode and an automatic mode, in the automatic mode, a 'temperature cycle start' button is clicked, software automatically generates a report template according to a selected test channel, starts timing and monitors the temperature of the incubator 5, triggers testing according to temperature and time parameters and automatically records data; in the manual mode, a data report needs to be manually generated firstly, then a start button is clicked, and the number of current temperature cycles needs to be manually selected after the test is completed.
Example two
The embodiment provides an automatic test method of a secondary power supply, which is applied to the automatic test system of the secondary power supply according to the first embodiment, and specifically includes the following steps:
step S1: the test host 2 receives a test mode configuration instruction, changes the test mode according to the instruction and configures the relevant parameters of the test mode;
step S2: the test host 2 receives a test channel selection instruction, and outputs an IO signal to the adaptation module 1 according to the instruction to control the conduction of the specified test channel;
a test parameter configuration area is arranged in the designated software of the test host 2, and a user can configure parameters related to the test by using the test parameter configuration area before the test is started, wherein the configuration content comprises:
1) selection of test mode: comprises 4 modes of normal temperature, random vibration, high and low temperature (automatic) and high and low temperature (manual);
2) selecting a channel: selecting a channel to be tested, wherein all channels or one channel can be selected;
3) and (4) data storage: checking, namely storing the data after testing, and not checking and storing;
4) low temperature: triggering the timing temperature during low-temperature test in a high-low temperature circulating (automatic) mode;
5) high temperature: triggering the timing temperature during high-temperature test in a high-low temperature circulating (automatic) mode;
6) retardation (low temperature): in a high-low temperature circulating (automatic) mode, the low-temperature test is started by delaying a certain time from the triggering timing;
7) retardation (high temperature): in a high-low temperature circulating (automatic) mode, the high-temperature test is started by delaying a certain time from the triggering timing;
8) current cycle number: in the high-low temperature circulation (automatic) mode, the circulation frequency of the current time point is 7 times in total;
9) the current test products: the channel number and the product code number of the current test product;
10) beginning of temperature cycle: controlling the start of a high and low temperature cycling (automatic) mode;
11) timing: in the high and low temperature cycle (automatic) mode, the timer is started for the total duration.
The test host 2 configures the test mode, the test channel and the relevant parameters in the test process according to the configuration content, so that the test host 2 performs automatic test according to the configuration content, and the automation degree is improved. The test host 2 tests the product to be tested, wherein the test host comprises an output voltage test and an input current test, wherein the output voltage test specifically refers to measuring whether the output voltage is within a specified deviation range under the conditions that the input voltage is a maximum value, a minimum value and a nominal value and the output load is a rated load; the input current test specifically refers to testing whether the input current exceeds an allowable maximum value or not under the condition that each output channel is a standard load; therefore, when configuring the parameters, the voltage of the programmable power supply 3 needs to be set, and the output load of the programmable electronic load 4 needs to be set to meet the test requirement.
Step S3: the test host 2 tests the output voltage and the input current of a product to be tested corresponding to the specified test channel according to the test mode and the parameters thereof; and recording test data in the test process and generating a corresponding test report.
As shown in fig. 11 and 12, the designated software of the test host 2 is further provided with a test result display area, and the display area is used for displaying test values such as input current and output voltage of the product during the test process. The first column is the channel name, the second column is the measured value when the voltage is 24V, the third column is the measured value when the voltage is 27V, and the fourth column is the measured value when the voltage is 31V. According to the test requirement, if the test is not needed under the condition, the cell is displayed as a dotted line, and if the test value exceeds the allowable error range, the cell is displayed as red.
In addition, the test host 2 also collects the input and output voltage and current parameters of the product to be tested in real time, monitors the input and output voltage and current changes of the product to be tested in real time, and displays the monitoring result. Similarly, an input/output voltage and current monitoring area is arranged in the designated software and is used for monitoring the changes of input and output voltage and current, wherein the voltage is monitored in real time, and the current parameters cannot be read in real time due to the fact that the current parameters need to be read from an instrument and are measured values in a stable state. A temperature curve display area is arranged in the appointed software and is positioned under a temperature curve page label, the temperature curve is mainly used for recording the temperature in a temperature cycle test (automatic) mode, the change process of the temperature of the incubator 5 is displayed, and an operator can visually judge the temperature change.
In the embodiment, the test result is presented in a report form, so that a new report form needs to be manually added or automatically generated during the test, so as to add the test result and the data in the test process to the report form. In this embodiment, for the random vibration test and temperature cycle (manual) test mode, a report needs to be manually created before the test, and after a single test is completed, the software pops up a dialog box for parameter configuration for data storage; the direction of the main configuration vibration (X/Y/Z) for the random vibration test, the number of main configuration cycles for high and low temperature cycles (manual). For normal temperature test and high and low temperature (automatic), the work of creating the report forms is automatically completed by software, and all the report forms are stored in a path preset by a user.
Compared with the prior art, the utility model has strong universality, and can be suitable for testing any secondary power module product on the premise of meeting the hardware resources; the compatibility is high, and three test modes of normal temperature, high and low temperature and vibration are supported; the automation degree is high, and one-key test can be realized; can simultaneously access 10-path products and automatically identify the product models. Compared with the prior art, the utility model discloses can improve efficiency of software testing more than 8 times, practice thrift the cost more than 50%.
The above embodiments are only preferred embodiments of the present invention, and the protection scope of the present invention cannot be limited thereby, and any insubstantial changes and substitutions made by those skilled in the art based on the present invention are all within the protection scope of the present invention.
Claims (7)
1. An automatic test system for a secondary power supply is characterized by comprising an adaptation module, a test host, a program-controlled power supply, a program-controlled electronic load and an incubator; the adaptive module is provided with at least ten test channels, and each test channel corresponds to a product to be tested; each product to be tested is located in the incubator, and the incubator is connected with the test host through a cable; the test host is also provided with a load output interface, a power input interface, a product interface and a switch control interface, and is connected with the adaptation module through the switch control interface and used for outputting an IO signal to the adaptation module to control the specified test channel to be conducted and output; the test host is connected with the case interface of the adaptive module through the product interface, so that the signal interconnection between the product to be tested and the test host is realized, and the performance of the product to be tested is tested; the test host is connected with the program-controlled power supply through the power supply input interface, and the test host is connected with the program-controlled electronic load through the load output interface.
2. The automatic test system for the secondary power supply of claim 1, wherein each test channel is connected with a relay daughter board, each relay daughter board is connected with a control interface of the adapter module, the adapter module is connected with the switch control interface of the test host through the control interface of the adapter module, and the adapter module controls on/off of each relay daughter board according to an IO signal output by the test host to change the conduction state of each test channel.
3. The automatic test system for the secondary power supply of claim 2, wherein the relay daughter board is further connected to a chassis interface of the adapter module, and is configured to output product parameters including a product identification resistor, a product voltage signal, and a product current signal to the test host.
4. The automatic test system for the secondary power supply according to claim 1, wherein the input interface of the test channel is connected with different models of products to be tested through different cables.
5. The automatic test system for the secondary power supply according to claim 1, wherein the test host is provided with a collection management unit, a test unit and a parameter setting unit which are connected; the parameter setting unit is used for carrying out self-defining setting on the test channel, the test mode and relevant parameters of the test mode before testing; the test unit tests the output voltage and the input current of a product to be tested corresponding to the specified test channel according to the test mode and the parameters thereof; the acquisition management unit is used for acquiring a test result, the temperature parameter of the incubator, the program-controlled power supply and the current parameter of the program-controlled electronic load, and displaying and managing the parameters to generate a corresponding test report.
6. The automatic test system for the secondary power supply according to claim 1, wherein the test host is further connected with a vibration test device, the vibration test device drives the product to be tested to perform vibration test on an xyz axis, and the test host collects and records vibration test data on the x, y or z axis according to user requirements.
7. The automatic test system for the secondary power supply according to claim 1, wherein the incubator is provided with a normal temperature mode and a temperature circulation mode, the incubator is at a preset normal temperature in the normal temperature mode, and the incubator is cyclically switched between two preset different temperatures in the temperature circulation mode.
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| CN116381414A (en) * | 2023-04-27 | 2023-07-04 | 河南思维轨道交通技术研究院有限公司 | Cable test bench and test method thereof |
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| CN116381414A (en) * | 2023-04-27 | 2023-07-04 | 河南思维轨道交通技术研究院有限公司 | Cable test bench and test method thereof |
| CN116381414B (en) * | 2023-04-27 | 2023-12-12 | 河南思维轨道交通技术研究院有限公司 | Cable test bench and test method thereof |
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