CN217821071U - Two-photon microscope and sample detection system - Google Patents
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- CN217821071U CN217821071U CN202222044691.8U CN202222044691U CN217821071U CN 217821071 U CN217821071 U CN 217821071U CN 202222044691 U CN202222044691 U CN 202222044691U CN 217821071 U CN217821071 U CN 217821071U
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Abstract
The application provides a two-photon microscope and sample detection system, wherein, this two-photon microscope includes: the device comprises an excitation beam emitting module, a light splitting element, a super lens array and a detection array; an excitation beam emitting module capable of emitting a plurality of excitation beams; each of the plurality of excitation beams has a first wavelength; after each laser beam in the multiple excitation beams penetrates through the light splitting element, the laser beams are converged to different detection points of the sample by the super lens array respectively, and the different detection points in the sample are excited to generate fluorescence respectively; wherein the fluorescence has a second wavelength; the second wavelength is less than the first wavelength; the fluorescence is collimated by the super lens array, then enters the light splitting element, and is reflected to the detection array by the light splitting element. Through the two-photon microscope and the sample detection system provided by the embodiment of the application, a plurality of detection points in a sample can be detected at one time, and the detection efficiency of the two-photon microscope is greatly improved.
Description
Technical Field
The application relates to the technical field of superlens application, in particular to a two-photon microscope and a sample detection system.
Background
At present, a two-photon microscope is a microscope using a fluorescence imaging technology, and in general, the two-photon microscope irradiates a sample with a strongly focused infrared laser beam to excite the sample to generate fluorescence and perform imaging detection on the sample generating the fluorescence, but only the sample can be detected point by point, which results in low detection efficiency.
SUMMERY OF THE UTILITY MODEL
To solve the above problems, it is an object of the embodiments of the present application to provide a two-photon microscope and a sample detection system.
In a first aspect, embodiments of the present application provide a two-photon microscope for detecting a sample, including: the device comprises an excitation light beam emitting module, a light splitting element, a super lens array and a detection array;
the excitation light beam emitting module can emit a plurality of excitation light beams; each laser beam of the plurality of excitation beams has a first wavelength;
after transmitting through the light splitting element, each laser beam in the multiple excitation beams is converged to different detection points of the sample by the superlens array respectively, and the different detection points in the sample are excited to generate fluorescence respectively; wherein the fluorescent light has a second wavelength; the second wavelength is less than the first wavelength;
the fluorescence is collimated by the super lens array, enters the light splitting element and is reflected to the detection array by the light splitting element.
In a second aspect, embodiments of the present application further provide a sample detection system, including: a sample stage and a two-photon microscope according to the first aspect; and the two-photon microscope detects the sample placed on the sample stage.
In the solutions provided in the first aspect to the second aspect of the embodiment of the present application, different detection points of a sample are detected by multiple excitation light beams emitted by an excitation light beam emission module arranged in a two-photon microscope, and compared with a mode in which a two-photon microscope can only detect a sample point by point in the related art, multiple detection points in a sample can be detected by multiple excitation light beams at a time, which greatly improves the detection efficiency of the two-photon microscope; moreover, a moving platform which is used for placing a sample and has large volume and heavy weight is not needed in the two-photon microscope, so that the detection of multiple detection points of the sample can be completed, the volume and the weight of the two-photon microscope are favorably reduced, and the portability of the two-photon microscope is improved.
In order to make the aforementioned objects, features and advantages of the present application comprehensible, preferred embodiments accompanied with figures are described in detail below.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a two-photon microscope employing an adjustable superlens in a two-photon microscope provided in an embodiment of the present application;
fig. 2 is a schematic structural diagram of a two-photon microscope with a light source array in a two-photon microscope provided in an embodiment of the present application;
fig. 3 is a schematic diagram of a converging superlens including a plurality of structural units in a two-photon microscope according to an embodiment of the present disclosure.
Icon: 10. a sample; 100. a light splitting element; 102. a superlens array; 104. a detection array; 106. a light source; 108. a collimating superlens; 110. a tunable superlens; 112. the beam is steered towards the super-surface array; 114. a sample stage; 200. an array of light sources; 202. a collimating metalens array.
Detailed Description
In the description of the present application, it is to be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," and the like are used in an orientation or positional relationship indicated in the drawings for convenience in describing the present application and to simplify the description, and are not intended to indicate or imply that the device or element so referred to must have a particular orientation, be constructed in a particular orientation, and be operated in a particular orientation, and thus are not to be construed as limiting the present application.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present application, "a plurality" means two or more unless specifically limited otherwise.
In this application, unless expressly stated or limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can include, for example, fixed connections, removable connections, or integral connections; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present application can be understood by those of ordinary skill in the art as the case may be.
At present, a two-photon microscope is a microscope using a fluorescence imaging technology, and in general, the two-photon microscope irradiates a sample with a strongly focused infrared laser beam to excite the sample to generate fluorescence and perform imaging detection on the sample generating the fluorescence, but only the sample can be detected point by point, which results in low detection efficiency. Moreover, the two-photon microscope has the defect of being bulky and not portable.
Based on this, the embodiment provides a two-photon microscope and a sample detection system, which can simultaneously detect different detection points of a sample by a plurality of excitation light beams emitted by an excitation light beam emission module arranged in the two-photon microscope, and can detect a plurality of detection points in the sample at one time, thereby greatly improving the detection efficiency of the two-photon microscope; moreover, a moving platform which is used for placing a sample and has large volume and heavy weight is not needed in the two-photon microscope, so that the detection of multiple detection points of the sample can be completed, the volume and the weight of the two-photon microscope are favorably reduced, and the portability of the two-photon microscope is improved. In order to make the aforementioned objects, features and advantages of the present application more comprehensible, the present application is described in further detail with reference to the accompanying drawings and examples.
Examples
Referring to fig. 1, a schematic structural diagram of a two-photon microscope using a tunable superlens is shown, in this embodiment, a two-photon microscope is provided for detecting a sample 10, including: an excitation beam emission module, a beam splitting element 100, a superlens array 102, and a detection array 104.
The excitation light beam emitting module can emit a plurality of excitation light beams; each of the plurality of excitation light beams has a first wavelength.
After each laser beam in the multiple excitation beams penetrates through the light splitting element, the laser beams are converged to different detection points of the sample by the superlens array respectively, and the different detection points in the sample are excited to generate fluorescence respectively; wherein the fluorescent light has a second wavelength; the second wavelength is less than the first wavelength.
The fluorescence is collimated by the super lens array, enters the light splitting element and is reflected to the detection array by the light splitting element.
In one embodiment, the first wavelength may be any wavelength with a wavelength band between 780 nm and 850 nm.
The excitation light beam can be a single-wavelength light beam with any wavelength in a wave band between 780 nanometers and 850 nanometers.
In one embodiment, the first wavelength may be any wavelength with a wavelength band between 550 nanometers and 620 nanometers.
The fluorescence may be a single wavelength beam of light having any wavelength in the wavelength range of 550 nm to 620 nm.
The light splitting element has a function of transmitting and reflecting incident light beams, and can transmit laser light beams and reflect fluorescence.
In one embodiment, the light splitting element includes, but is not limited to: beam splitters and beam splitters.
The detection array can receive the fluorescence reflected by the light splitting element.
In order to receive the fluorescence reflected by the light splitting element, in the two-photon microscope proposed in this embodiment, the detection array includes: a plurality of detection elements arranged in an array.
The detection element adopts a photodiode or a single photon avalanche diode.
The detection element can convert the received fluorescence into an electric signal and transmit the electric signal obtained by conversion into a control unit connected with the detection element for imaging processing.
The specific imaging process of the control unit is prior art and is not within the scope of the discussion of the present embodiment.
The control unit may be any microprocessor or microcontroller in the prior art, and is not described in detail herein.
Specifically, the superlens array includes: a plurality of converging superlenses arranged in an array.
The converging superlens has the same focus position for the excitation beam and the fluorescence in order to achieve the purpose of converging the excitation beam to the detection point of the sample and collimating the fluorescence excited at the detection point of the sample.
The converging super lens converges the received excitation light beam to a detection point in the sample and at the focus position of the converging super lens, and collimates the fluorescence generated after the detection point is excited. The fluorescence is collimated and reflected by the light splitting element and then received by the detection array.
In particular, the converging superlens comprises: a substrate and a plurality of nanostructures disposed on the substrate.
The phase distribution of the converging superlens satisfies the following equation 1:
wherein (x, y) represents the position coordinates of the nanostructures in the converging superlens relative to the center of the converging superlens;
represents the modulation phase of the (x, y) position of the nanostructure in the converging superlens on the excitation beam;
indicating the modulation phase of the nanostructures at the (x, y) position in the converging superlens on the fluorescence; lambda exci Represents a first wavelength; lambda emi Represents a second wavelength; f denotes the focal length of the converging superlens.
In one embodiment, the first nanostructure satisfying both of the above equations 1 can be directly searched from the nano-database, and then, in the two-photon microscope proposed in this embodiment, the nanostructure includes: a first nanostructure. The first nanostructure is capable of phase modulating both the excitation light beam and the fluorescence. The converging super lens can converge the exciting light beam to the detecting point of the sample and collimate the excited fluorescence of the detecting point of the sample.
Optionally, if the difficulty of finding the first nanostructure satisfying two formulas in the above formula 1 from the nano database is large, the design difficulty of the nanostructure may be reduced, two different nanostructures satisfying two formulas in the above formula 1 are found from the nano database, and the excitation beam and the fluorescence are respectively phase-modulated by the two different nanostructures, in the two-photon microscope proposed in this embodiment, the nanostructures include: a second nanostructure and a third nanostructure.
The second nanostructure is capable of phase modulating the excitation beam.
The third nanostructure is capable of phase modulating the fluorescence.
The second nanostructure and the third nanostructure are nanostructures that differ in shape, period, and/or size.
Alternatively, the materials used for the second nanostructure and the third nanostructure may be different.
In order to provide the second nanostructure and the third nanostructure on the substrate, in the two-photon microscope proposed in the present embodiment, the substrate is divided into a plurality of phase modulation regions.
The second nanostructure or the third nanostructure is disposed in each of the plurality of phase modulation regions.
Optionally, the substrate may be divided into a plurality of sector-shaped phase modulation regions, and the substrate may also be divided into a plurality of phase modulation regions according to a ring shape or other arbitrary shapes, which is not described herein again.
In addition to the above-mentioned manner in which the second nanostructures and the third nanostructures may be disposed on the substrate by dividing the phase modulation region, in the two-photon microscope proposed in this embodiment, the second nanostructures and the third nanostructures may be disposed on the substrate in an interlaced manner.
After the nanostructure meeting the requirement of the formula 1 is obtained, a plurality of excitation light beams can be obtained in the following two different modes, and a plurality of detection points of the sample can be detected.
In a first mode, as shown in fig. 1, a tunable superlens is used to perform phase modulation on a single-wavelength light beam with a first wavelength emitted from a light source, so that the phase-modulated single-wavelength light beam can be incident on each of a plurality of supersurfaces, respectively, to form a plurality of excitation light beams. In the two-photon microscope proposed in the present embodiment, the excitation-beam emission module includes: a light source 106, a collimating metalens 108, a tunable metalens 110, and a beam-steering metalens array 112.
The beam-steering super-surface array comprising: a plurality of super-surfaces arranged in an array.
The collimating super lens is used for collimating the single-wavelength light beam with the first wavelength emitted by the light source.
The adjustable super lens carries out phase modulation of different phases on the collimated single-wavelength light beam in a time-sharing mode, so that the single-wavelength light beam after phase modulation can be respectively incident on each super surface of the plurality of super surfaces.
The super-surface performs phase modulation on the incident single-wavelength light beam to form an excitation light beam incident on the light splitting element, wherein the incident direction of the excitation light beam incident on the light splitting element is the same as the emergent direction of the single-wavelength light beam after being collimated by the collimating super-lens.
Because the single-wavelength light beams with different incident angles are respectively subjected to phase modulation, the formed excitation light beams have the same emergent angle and can be emitted in a collimating way; the modulation phase of each of the plurality of metasurfaces is different and enables an excitation beam formed by the incident single-wavelength beam to be collimated out of the metasurface. The specific implementation of such a super surface is prior art and will not be described in detail here.
And excitation beams emitted by each super surface in the beam steering super surface array are respectively incident into the converging super lenses which are arranged in the super lens array and correspond to each super surface after penetrating through the light splitting element.
In one embodiment, the tunable superlens may be electrically controlled, optically controlled, or otherwise implemented to perform phase modulation on the collimated single-wavelength light beam according to a modulation phase corresponding to each time, so that the phase-modulated single-wavelength light beam can be incident on each of the plurality of super-surfaces.
Here, the modulation phases corresponding to the respective timings are different from each other, so that the single-wavelength light beam phase-modulated in accordance with the modulation phase corresponding to the respective timings can be incident on each of the plurality of super-surfaces.
The specific process of the adjustable superlens for performing phase modulation on the collimated single-wavelength light beam according to the modulation phase corresponding to each moment is the prior art, and is not in the discussion range of the embodiment.
For example, in the array of beam-steering super-surfaces, the super-surfaces may be arranged in an array arrangement of M × N; meanwhile, the adjustable superlens can be provided with the corresponding relation between M × N modulation phases and different moments. Moreover, the super lens array can also arrange M × N converging super lenses in the super lens array according to the arrangement mode of the super surfaces in the light beam steering super surface array, so that the arranged converging super lenses correspond to the super surfaces one by one.
In the actual working process of the two-photon microscope, the adjustable super lens can perform phase modulation on the collimated single-wavelength light beam by using modulation phases corresponding to different moments in the corresponding relation between the M × N modulation phases and the different moments, so that the single-wavelength light beam after phase modulation can be respectively incident on each super surface of the M × N super surfaces at different moments to form M × N excitation light beams which penetrate through the light splitting element, and the M × N excitation light beams are respectively converged on M × N detection points on the sample by the M × N converging super lenses in the super lens array after penetrating through the light splitting element, so that the M × N detection points arranged in the M × N array on the sample are respectively detected through the M × N excitation light beams.
That is, in the two-photon microscope proposed in this embodiment, in the scheme of forming a plurality of excitation light beams by using the adjustable superlens, the arrangement manner of the super surfaces in the light beam steering supersurface array is consistent with the arrangement manner of the converging superlenses in the superlens array. So that the two-photon microscope can scan a sample.
In a second way, a plurality of excitation light beams can be emitted by using a light source array, referring to a schematic structural diagram of a two-photon microscope with a light source array shown in fig. 2, in the two-photon microscope proposed in this embodiment, the excitation light beam emitting module includes: a light source array 200 and a collimating metalens array 202.
The light source array, comprising: a plurality of light sources arranged in an array.
The collimating metalens array comprising: a plurality of collimating metalens arranged in an array.
And each collimating super lens in the collimating super lenses collimates the single-wavelength light beam emitted by the light source which is arranged in the light sources and corresponds to each collimating super lens to form an excitation light beam incident to the light splitting element.
After the excitation light beams penetrate through the light splitting element, the excitation light beams enter the converging super lenses which are arranged in the super lens array and correspond to the collimating super lenses. The converging superlens converges the incident excitation beam onto the sample, thereby detecting a detection point on the sample.
For example, M × N light sources may be arranged in an array arrangement of M × N in the array of light sources; meanwhile, the collimating superlenses may be arranged in an array arrangement of M × N in the collimating superlens array. So that the arranged light sources correspond to the collimating super lenses in the collimating super lens array one by one.
In the actual working process of the two-photon microscope, the light sources arranged in the array of M × N in the light source array can emit M × N single-wavelength light beams, each collimating superlens in the M × N collimating superlenses in the collimating superlens array collimates the single-wavelength light beams emitted by the light sources arranged corresponding to the collimating superlenses in the M × N light sources to form M × N excitation light beams incident to the light splitting element; after the M × N excitation light beams transmit through the light splitting element, the M × N converging super lenses in the super lens array respectively converge on the M × N detection points on the sample, so that the M × N excitation light beams respectively detect the M × N detection points arranged in the array on the sample.
That is, in the two-photon microscope proposed in this embodiment, in the scheme of forming a plurality of excitation light beams by using the light source array, the arrangement manner of the light sources in the light source array is consistent with the arrangement manner of the collimating superlens in the collimating superlens array. So that the two-photon microscope can scan a sample in a linear array/area array mode.
It can be known from the above description that the two ways can be utilized to emit multiple excitation light beams to perform multi-detection point detection on a sample, and under the condition that the surface area of the sample is smaller than the total surface area of multiple convergent superlenses in the superlens array, the two-photon microscope can scan the sample in a linear array/area array way without using a large-size and heavy-weight moving platform for placing the sample in the two-photon microscope, which is beneficial to reducing the size and weight of the two-photon microscope and increasing the portability of the two-photon microscope.
In order to obtain the excitation beam of the infrared light, in the two-photon microscope proposed in this embodiment, the light source employs an infrared laser or an infrared semiconductor laser.
Referring to fig. 3, a schematic diagram of a converging superlens comprising a plurality of structural units, each structural unit comprising at least one nanostructure, the structural units being capable of modulating incident light, and the nanostructures being capable of directly adjusting and controlling characteristics of light, such as phase; in this embodiment, the nanostructure is an all-dielectric structural unit, which has high transmittance at least in the visible light band, and the selectable materials include: titanium oxide, silicon nitride, fused silica, aluminum oxide, gallium nitride, gallium phosphide, hydrogenated amorphous silicon, and the like. Wherein the plurality of nanostructures are arranged in an array, thereby being capable of dividing the structural unit; the structural units can be regular hexagons, squares, sectors and the like, and the central position of each structural unit, or the central position and the vertex position of each structural unit are respectively provided with a nano structure. All the nanostructures may be located on the same side of the substrate, or a part of the nanostructures is located on one side of the substrate, and another part of the nanostructures is located on the other side of the substrate, which is not limited in this embodiment.
It should be noted that, the substrate of the converging super lens is an integral layer structure, and a plurality of structural units in the converging super lens can be artificially divided, that is, a plurality of nanostructures are arranged on the substrate, so that the structural unit containing one or more nanostructures can be divided, or a plurality of structural units can form the converging super lens of an integral structure.
The present embodiment further provides a sample detection system, including: sample stage 114 and the two-photon microscope described above; the two-photon microscope detects a sample placed on the sample stage.
In summary, according to the two-photon microscope and the sample detection system provided by the embodiment, the plurality of excitation light beams emitted by the excitation light beam emission module arranged in the two-photon microscope are used for simultaneously detecting different detection points of the sample, and compared with a mode that the two-photon microscope can only detect the sample point by point in the related art, the detection system can detect the plurality of detection points in the sample at one time, so that the detection efficiency of the two-photon microscope is greatly improved; moreover, a mobile platform which is used for placing a sample and has large volume and heavy weight is not needed in the two-photon microscope, so that the detection of multiple detection points of the sample can be completed, the volume and the weight of the two-photon microscope are reduced, and the portability of the two-photon microscope is improved.
The above description is only for the specific embodiments of the present application, but the scope of the present application is not limited thereto, and any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present application, and shall be covered by the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (13)
1. A two-photon microscope for inspecting a sample, comprising: the device comprises an excitation light beam emitting module, a light splitting element, a super lens array and a detection array;
the excitation light beam emitting module can emit a plurality of excitation light beams; each laser beam of the plurality of excitation beams has a first wavelength;
after transmitting through the light splitting element, each laser beam in the multiple excitation beams is converged to different detection points of the sample by the superlens array respectively, and the different detection points in the sample are excited to generate fluorescence respectively; wherein the fluorescent light has a second wavelength; the second wavelength is less than the first wavelength;
the fluorescence is collected and collimated by the super lens array, then enters the light splitting element, and is reflected to the detection array by the light splitting element.
2. A two-photon microscope according to claim 1, wherein the superlens array comprises: a plurality of converging superlenses arranged in an array;
the converging superlens has the same focal position for the excitation light beam and the fluorescence;
the converging super lens converges the received excitation light beam to a detection point in the sample and at the focus position of the converging super lens, and collimates the fluorescence generated after the detection point is excited.
3. A two-photon microscope according to claim 2, wherein the converging superlens comprises: a substrate and a plurality of nanostructures disposed on the substrate.
4. A two-photon microscope according to claim 3, wherein the phase distribution of the converging superlens satisfies the following equation:
wherein (x, y) represents the position coordinates of the nanostructures in the converging superlens relative to the center of the converging superlens;
represents the modulation phase of the (x, y) position of the nanostructure in the converging superlens on the excitation beam;
indicating the modulation phase of the nanostructures at the (x, y) position in the converging superlens on the fluorescence; lambda exci Represents a first wavelength; lambda emi Represents a second wavelength; f denotes the focal length of the converging superlens.
5. A two-photon microscope according to claim 4, wherein the nanostructures comprise: a first nanostructure;
the first nanostructure is capable of phase modulating both the excitation light beam and the fluorescence.
6. A two-photon microscope according to claim 4, wherein the nanostructures comprise: a second nanostructure and a third nanostructure;
the second nanostructure capable of phase modulating the excitation light beam;
the third nanostructure capable of phase modulating the fluorescence;
the second nanostructure and the third nanostructure are nanostructures that differ in shape, period, and/or size.
7. A two-photon microscope according to claim 6, wherein the substrate is divided into a plurality of phase modulation regions;
the second nanostructure or the third nanostructure is disposed in each of the plurality of phase modulation regions.
8. A two-photon microscope according to claim 6, wherein the second and third nanostructures are arranged on the substrate in an interleaved manner.
9. A two-photon microscope according to any one of claims 1 to 8, wherein the excitation beam emission module comprises: a light source, a collimating metalens, an adjustable metalens, and a beam steering metalens array;
the beam-steering super-surface array comprising: a plurality of super-surfaces arranged in an array;
the collimating super lens is used for collimating a single-wavelength light beam with a first wavelength emitted by the light source;
the adjustable super lens is used for carrying out different-phase modulation on the collimated single-wavelength light beam in a time-sharing manner, so that the single-wavelength light beam after phase modulation can be respectively incident on each super surface of the plurality of super surfaces;
the super surface is used for carrying out phase modulation on the incident single-wavelength light beam to form an excitation light beam incident on the light splitting element, wherein the incident direction of the excitation light beam incident on the light splitting element is the same as the emergent direction of the single-wavelength light beam after being collimated by the collimating super lens;
and the excitation light beams emitted by the super surfaces in the light beam steering super surface array are respectively incident into the converging super lenses which are arranged in the super lens array and correspond to the super surfaces after penetrating through the light splitting element.
10. A two-photon microscope according to any one of claims 1 to 8, wherein the excitation beam emission module comprises: a light source array and a collimating metalens array;
the light source array, comprising: a plurality of light sources arranged in an array;
the collimating metalens array comprising: a plurality of collimating metalens arranged in an array;
each collimating super lens in the collimating super lenses collimates a single-wavelength light beam emitted by a light source which is arranged in the light sources and corresponds to each collimating super lens to form an excitation light beam incident to the light splitting element;
after the excitation light beams penetrate through the light splitting element, the excitation light beams enter the converging super lenses which are arranged in the super lens array and correspond to the collimating super lenses.
11. A two-photon microscope according to claim 9, wherein the light source is an infrared laser or an infrared semiconductor laser.
12. A two-photon microscope according to claim 1, wherein the detection array comprises: a plurality of detection elements arranged in an array;
the detection element adopts a photodiode or a single photon avalanche diode.
13. A sample detection system, comprising: a sample stage and the two-photon microscope of any one of claims 1-12; and the two-photon microscope detects the sample placed on the sample stage.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11927769B2 (en) | 2022-03-31 | 2024-03-12 | Metalenz, Inc. | Polarization sorting metasurface microlens array device |
| US11978752B2 (en) | 2019-07-26 | 2024-05-07 | Metalenz, Inc. | Aperture-metasurface and hybrid refractive-metasurface imaging systems |
| US11988844B2 (en) | 2017-08-31 | 2024-05-21 | Metalenz, Inc. | Transmissive metasurface lens integration |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11988844B2 (en) | 2017-08-31 | 2024-05-21 | Metalenz, Inc. | Transmissive metasurface lens integration |
| US11978752B2 (en) | 2019-07-26 | 2024-05-07 | Metalenz, Inc. | Aperture-metasurface and hybrid refractive-metasurface imaging systems |
| US11927769B2 (en) | 2022-03-31 | 2024-03-12 | Metalenz, Inc. | Polarization sorting metasurface microlens array device |
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