CN217819142U

CN217819142U - Thrust testing device

Info

Publication number: CN217819142U
Application number: CN202222008986.XU
Authority: CN
Inventors: 黄招凤; 陈罡彪; 游燚; 陈学志
Original assignee: Shenzhen Yitian Semiconductor Equipment Co ltd
Current assignee: Shenzhen Yitian Semiconductor Equipment Co ltd
Priority date: 2022-07-29
Filing date: 2022-07-29
Publication date: 2022-11-15
Anticipated expiration: 2032-07-29

Abstract

The application provides a thrust testing device, wherein a second driving mechanism drives a thrust detection mechanism to move in a second direction, a third driving mechanism drives a chip on a chip carrier to be detected to move in a third direction, and the second direction and the third direction are in the same plane, so that the thrust detection mechanism can detect the thrust of the chip on the chip carrier to be detected; because the thrust detection mechanism and the chip carrier to be detected move independently, the thrust detection mechanism and the chip carrier to be detected can be driven simultaneously, so that the contact end of the thrust detection mechanism can contact the chip on the chip carrier to be detected more quickly, and the thrust testing efficiency is improved. The dial indicator is used for measuring the amount of exercise of the thrust detection mechanism in the first direction, and the user can accurately adjust the amount of exercise of the thrust detection mechanism in the first direction by checking the reading on the dial indicator, so that the user can accurately adjust the amount of exercise.

Description

Thrust testing device

Technical Field

The application belongs to the technical field of chip test equipment, and particularly relates to a thrust test device.

Background

In order to ensure the normal use of the chip, a thrust test needs to be performed on the chip adhered to the substrate, and the existing thrust test is generally performed by using a thrust test platform. At present, a thrustmeter in the existing thrust test platform can measure a thrust test result of a chip on a substrate, and can also adjust the height of the thrustmeter aiming at chips with different thicknesses; however, the existing thrust test platform is difficult for users to accurately adjust the height of the thrust meter, so that the users are inconvenient to use.

SUMMERY OF THE UTILITY MODEL

The embodiment of the application provides a thrust testing device, a preparation method thereof and a display device, and aims to solve the problems that an existing thrust testing device is low in production efficiency and poor in structural stability.

The embodiment of the application provides a thrust testing arrangement, includes:

the thrust detection mechanism is used for detecting the thrust of the chip on the chip carrier to be detected;

the first driving mechanism is used for driving the thrust detection mechanism to move in a first direction;

the second driving mechanism is used for driving the first driving mechanism and the thrust detection mechanism to move in a second direction so that a contact end of the thrust detection mechanism contacts the chip carrier to be detected; the first direction and the second direction are perpendicular to each other;

the third driving mechanism is used for driving the chip on the chip carrier to be detected to move in a third direction so as to enable the chip on the chip carrier to be detected to contact the contact end of the thrust detection mechanism; the third direction is perpendicular to the first direction and the second direction;

and the measuring end of the dial indicator is in contact with the thrust detection mechanism, and the dial indicator is used for measuring the movement amount of the thrust detection mechanism in the first direction.

Optionally, the thrust testing device further includes a microscope assembly, and a lens of the microscope assembly faces the chip on the chip carrier to be tested.

Optionally, the microscope assembly is mounted to the second drive mechanism for movement in synchronism with the thrust detection mechanism in the second direction; and the lens of the microscope component faces the contact end of the thrust detection mechanism.

Optionally, the thrust detection mechanism is rotatably mounted to the first drive mechanism to rotate in a direction toward or away from the microscope assembly; the rotation axis of the thrust detection mechanism extends in the first direction.

Optionally, the first driving mechanism includes a supporting block and a rotating block rotatably mounted on the supporting block, and one end of the thrust detection mechanism, which is far away from the contact end, is connected to the rotating block.

Optionally, the first driving mechanism further includes a mounting shaft mounted to the support block, and the mounting shaft extends in the first direction; the turning block is provided with a shaft hole, and the shaft hole is rotatably matched with the mounting shaft.

Optionally, the first driving mechanism further includes a fixing column mounted on the supporting block, and the fixing column is located between the mounting shaft and the thrust detection mechanism; when the thrust detection mechanism rotates to a position close to the microscope assembly, the fixed column is detachably connected with the thrust contact mechanism.

Optionally, the dial indicator is mounted on the rotation block to rotate synchronously with the rotation block.

Optionally, the thrust testing device further includes a connecting piece, one end of the connecting piece is connected to the installation shaft, the other end of the connecting piece extends towards the direction close to the third driving mechanism, and the microscope assembly is installed at one end of the connecting piece far away from the installation shaft.

Optionally, the thrust testing device further includes a base, an accommodating groove is formed in the base, and the second driving mechanism and the third driving mechanism are installed in the accommodating groove; the thrust detection mechanism and the chip carrier to be detected are located on the upper surface of the base.

In the thrust testing device provided by the embodiment of the application, the second driving mechanism drives the thrust detection mechanism to move in the second direction, the third driving mechanism drives the chip on the chip carrier to be detected to move in the third direction, and the second direction and the third direction are in the same plane, so that the thrust detection mechanism can detect the thrust of the chip on the chip carrier to be detected; because the thrust detection mechanism and the chip carrier to be detected move independently, the thrust detection mechanism and the chip carrier to be detected can be driven simultaneously, so that the contact end of the thrust detection mechanism can contact the chip on the chip carrier to be detected more quickly, and the thrust testing efficiency is improved. The dial indicator is used for measuring the amount of exercise of the thrust detection mechanism in the first direction, and the user can accurately adjust the amount of exercise of the thrust detection mechanism in the first direction by checking the reading on the dial indicator, so that the user can accurately adjust the amount of exercise.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings used in the description of the embodiments will be briefly described below. It is obvious that the drawings in the following description are only some embodiments of the application, and that other drawings can be derived from these drawings by a person skilled in the art without inventive effort.

For a more complete understanding of the present application and its advantages, reference is now made to the following descriptions taken in conjunction with the accompanying drawings. Wherein like reference numerals refer to like parts in the following description.

Fig. 1 is a schematic structural diagram of a thrust testing apparatus according to an embodiment of the present application.

Fig. 2 is an exploded view of a thrust test apparatus according to an embodiment of the present disclosure.

Fig. 3 is a schematic structural diagram of a thrust testing apparatus according to another embodiment of the present application.

Fig. 4 is an exploded view of a partial structure of a thrust testing device provided in an embodiment of the present application.

10. A thrust detection mechanism; 20. a second drive mechanism; 30. a third drive mechanism; 40. a dial indicator; 50. a microscope assembly; 61. a support block; 62. rotating the block; 63. installing a shaft; 621. a shaft hole; 64. fixing a column; 65. a connecting member; 70. a base; 71. a containing groove; 66. a fine tuning component; 661. a guide rail 661; 662. a slider 662; 663. the hand wheel 663 is finely adjusted.

Detailed Description

The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. It is to be understood that the embodiments described are only a few embodiments of the present application and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

In order to ensure the normal use of the chip, a thrust test needs to be performed on the chip adhered to the substrate, and the existing thrust test is generally performed by using a thrust test platform. At present, a thrustmeter in the existing thrust test platform can measure a thrust test result of a chip on a substrate, and can also adjust the height of the thrustmeter according to chips with different thicknesses; however, the existing thrust test platform is difficult for users to accurately adjust the height of the thrust meter, so that the users are inconvenient to use.

In order to solve the above problem, an embodiment of the present application provides a thrust testing device, as shown in fig. 1 and fig. 2, fig. 1 is a schematic structural diagram of the thrust testing device provided in the embodiment of the present application. Fig. 2 is an exploded view of a thrust test apparatus provided in an embodiment of the present application.

This thrust test device includes: the thrust detection mechanism 10 is used for detecting the thrust of the chip on the chip carrier to be detected; a first driving mechanism for driving the thrust detection mechanism 10 to move in a first direction; the second driving mechanism 20 is used for driving the first driving mechanism and the thrust detection mechanism 10 to move in a second direction, so that the contact end of the thrust detection mechanism 10 contacts the chip carrier to be detected; the first direction and the second direction are perpendicular to each other; the third driving mechanism 30 is configured to drive the chip on the chip carrier to be detected to move in a third direction, so that the chip on the chip carrier to be detected contacts the contact end of the thrust detection mechanism 10; the third direction is perpendicular to the first direction and the second direction; and a dial indicator 40, wherein a measuring end of the dial indicator 40 is in contact with the thrust detection mechanism 10, and the dial indicator 40 is used for measuring the movement amount of the thrust detection mechanism 10 in the first direction.

In the thrust testing device provided in the embodiment of the present application, the second driving mechanism 20 drives the thrust detecting mechanism 10 to move in the second direction, the third driving mechanism 30 drives the chip on the chip carrier to be detected to move in the third direction, and the second direction and the third direction are in the same plane, so that the thrust detecting mechanism 10 can detect the thrust of the chip on the chip carrier to be detected; because the thrust detection mechanism 10 and the chip carrier to be detected move independently, the thrust detection mechanism 10 and the chip carrier to be detected can be driven simultaneously, so that the contact end of the thrust detection mechanism 10 can contact the chip on the chip carrier to be detected more quickly, and the thrust testing efficiency is improved. The dial indicator 40 is used for measuring the amount of movement of the thrust detection mechanism 10 in the first direction, and by checking the reading on the dial indicator 40, the user can accurately adjust the amount of movement of the thrust detection mechanism 10 in the first direction, so that the user can accurately adjust the movement.

Specifically, the first direction, the second direction and the third direction are perpendicular to each other; the first direction is shown by arrow Z in fig. 1, the second direction is shown by arrow X in fig. 1, and the third direction is shown by arrow Y in fig. 1. The chip carrier (not shown) to be tested comprises a substrate, i.e. a chip soldered on a substrate.

The third drive mechanism 30 comprises a carrier assembly for carrying the chip carrier to be tested. The bearing component comprises a bearing part and a locking part, and the locking part locks the chip carrier to be detected on the bearing part. The locking part is surrounded on the edge of the bearing part in a C shape, when the chip carrier to be detected is placed on the bearing part, the surface of the locking part above the bearing part presses the chip carrier to be detected, the surface of the locking part below the bearing part is provided with a threaded hole, and a screw penetrates through the threaded hole in the locking part from the lower part of the locking part. The screw is driven to pass through the threaded hole to move towards the bearing piece by screwing the screw, and when the screw is contacted with the lower surface of the bearing piece, the screw is abutted against the lower surface of the bearing piece so as to enable the locking piece to move downwards; the locking piece moves downwards so as to lock the chip carrier to be detected on the bearing piece.

Illustratively, as shown in fig. 1, the thrust test apparatus further includes a microscope assembly 50, and a lens of the microscope assembly 50 faces toward the chip on the chip carrier to be tested. Thus configured, the user can use the microscope assembly 50 to observe the chip soldering effect from the appearance of the chip, so that the user can simultaneously detect the appearance and the chip pushing force in the same device. The microscope assembly 50 may also assist in fine height and thrust testing when the chip is relatively small.

Since the thrust sensing mechanism 10 is movable in the second direction, the microscope assembly 50 needs to be kept stationary relative to the thrust sensing mechanism 10 in the second direction, i.e., the microscope assembly 50 also needs to be moved in the second direction, e.g., the microscope assembly 50 can also be driven by a separate driving mechanism. Illustratively, as shown in fig. 1 and 2, the microscope assembly 50 is mounted to the second driving mechanism 20 so as to move synchronously with the thrust detection mechanism 10 in the second direction; the lens of the microscope assembly 50 faces the contact end of the thrust detection mechanism 10. In this way, the second driving mechanism 20 can drive the microscope assembly 50 and the thrust detection mechanism 10 at the same time, so that the utilization rate of the second driving mechanism 20 can be improved and the overall structure of the thrust test apparatus can be simplified.

For example, please refer to fig. 3, wherein fig. 3 is a schematic structural diagram of a thrust testing apparatus according to another embodiment of the present disclosure. The thrust detection mechanism 10 is rotatably mounted to the first driving mechanism to rotate in a direction toward or away from the microscope assembly 50; the rotation axis of the thrust detection mechanism 10 extends in the first direction.

The thrust detection mechanism 10 can rotate in the plane of the second direction and the third direction, and the thrust detection mechanism 10 can rotate to a position where the contact end of the thrust detection mechanism is away from the lens of the microscope assembly 50; thus, when the chip needs to be observed more carefully through the microscope unit 50, the contact terminals of the thrust detection mechanism 10 can be shifted to reduce the influence on the chip observation process.

The rotation axis of the thrust detection mechanism 10 may pass through the thrust detection mechanism 10, or may be located on one side of the thrust detection mechanism 10, which is not limited herein. Illustratively, as shown in fig. 2 and 3, the first driving mechanism includes a supporting block 61 and a rotating block 62 rotatably mounted on the supporting block 61, and an end of the thrust detecting mechanism 10 away from the contact end is connected to the rotating block 62. The supporting block 61 provides a supporting base for the thrust detection mechanism 10 and the rotating block 62, and the rotating block 62 is used for realizing the rotation of the thrust detection mechanism 10 relative to the supporting block 61. The rotation axis of the thrust detection mechanism 10 passes through the rotation block 62, i.e. is located at one side of the thrust detection mechanism 10, so that the rotation amplitude of the contact end of the thrust detection mechanism 10 can be increased to ensure that the contact end of the thrust detection mechanism 10 can generate a sufficient distance with the lens of the microscope assembly 50 after rotating for a preset angle, thereby improving the rotation efficiency.

Specifically, as shown in fig. 2, the first driving mechanism further includes a mounting shaft 63 mounted to the supporting block 61, and the mounting shaft 63 extends in the first direction; the rotating block 62 is provided with a shaft hole 621, and the shaft hole 621 is rotatably engaged with the mounting shaft 63, so that the rotating block 62 and the thrust detection mechanism 10 can rotate around the mounting shaft 63 as a rotation axis.

Illustratively, as shown in fig. 1 and 3, the first driving mechanism further includes a fixing post 64 mounted to the supporting block 61, and the fixing post 64 is located between the mounting shaft 63 and the thrust detecting mechanism 10; when the thrust detection mechanism 10 rotates to a position close to the microscope assembly 50, the fixing column 64 is detachably connected with the thrust contact mechanism.

The thrust detection mechanism 10 has a first preset position close to the microscope component 50 on the moving track, when the thrust detection mechanism 10 rotates to the first preset position, the contact end is located right below the lens of the microscope component 50, and the contact end is used for contacting with the chip to detect the thrust, so that the thrust detection mechanism 10 needs to be fixed to prevent the chip from being pushed reversely. When the thrust detection mechanism 10 rotates to the first preset position, one end of the thrust detection mechanism 10, which is far away from the contact end of the thrust detection mechanism, is connected to the fixing column 64, so that the thrust detection mechanism 10 is fixed, and the thrust detection effect is ensured. When the thrust detection mechanism 10 needs to be rotated, the connection state between the thrust detection mechanism 10 and the fixed column 64 needs to be released first.

When the thrust detection mechanism 10 rotates, the dial indicator 40 may be stationary with respect to the thrust detection mechanism 10, or may rotate together with the thrust detection mechanism 10, which is not shown here. Illustratively, as shown in fig. 3, the dial indicator 40 is mounted to the turning block 62 to rotate in synchronization with the turning block 62. The dial indicator 40, the rotating block 62 and the thrust detection mechanism 10 rotate synchronously, so that the position avoidance dial indicator 40 is not needed when the thrust detection mechanism 10 rotates, and the rotation convenience of the thrust detection mechanism 10 is improved.

In practical application, as shown in fig. 4, fig. 4 is an exploded view of a partial structure of a thrust testing device provided in an embodiment of the present application. The first drive mechanism further includes a fine adjustment assembly 66, the fine adjustment assembly 66 finely adjusting the position of the thrust sensing mechanism 10 in the first direction, and the measuring end of the dial indicator 40 is in contact with the fine adjustment assembly 66. The fine adjustment component 66 comprises a guide rail 661, a slide block 662 and a fine adjustment hand wheel 663; the guide rail 661 is fixedly connected to the rotating block, and a guiding direction of the guide rail 661 is parallel to the first direction; the slider 662 is slidably connected to the guide rail 661, and the slider 662 is fixedly connected to the thrust detection mechanism 10. In addition, a first rack is arranged on the guide rail 661, the first rack is arranged in parallel with the first direction, one end of the fine adjustment hand wheel 663 penetrates through the sliding block 662, and a first gear is arranged at one end of the fine adjustment hand wheel 663 penetrating through the sliding block 662 and meshed with the first rack. Then, the user can rotate the fine adjustment hand wheel 663 to drive the sliding block 662 and the thrust detection mechanism 10 to move in the first direction through the engagement of the first gear and the first rack.

Illustratively, as shown in fig. 1 and 3, the thrust testing apparatus further includes a connector 65, one end of the connector 65 is connected to the mounting shaft 63, and the other end extends toward the direction close to the third driving mechanism 30, and the microscope assembly 50 is mounted at one end of the connector 65 away from the mounting shaft 63. The microscope assembly 50 is mounted above the thrust detection mechanism 10, so that the microscope assembly 50 can effectively avoid the rotation process of the thrust detection mechanism 10, and the rotation convenience of the thrust detection mechanism 10 is improved.

Illustratively, the thrust testing device further comprises a base 70, wherein a containing groove 71 is formed in the base 70, and the second driving mechanism 20 and the third driving mechanism 30 are installed in the containing groove 71; the thrust detection mechanism 10 and the chip carrier to be detected are located on the upper surface of the base 70. The second driving mechanism 20 and the third driving mechanism 30 are mounted in the upper surface of the base 70, so that the second driving mechanism 20 and the third driving mechanism 30 can be hidden and protected, and the integrity of the thrust testing device is improved.

In the foregoing embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.

In the description of the present application, the terms "first", "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implying any number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more features. The thrust test device provided by the embodiment of the present application is described in detail above, and the principle and the implementation of the present application are explained in the present application by applying a specific example, and the description of the above embodiment is only used to help understanding the method and the core idea of the present application; meanwhile, for those skilled in the art, according to the idea of the present application, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present application.

Claims

1. A thrust force testing device, comprising:

the third driving mechanism is used for driving the chip on the chip carrier to be detected to move in a third direction so that the chip on the chip carrier to be detected contacts the contact end of the thrust detection mechanism; the third direction is perpendicular to the first and second directions;

and the measuring end of the dial indicator is in contact with the thrust detection mechanism, and the dial indicator is used for measuring the amount of movement of the thrust detection mechanism in the first direction.

2. The thrust test device according to claim 1, further comprising a microscope assembly having a lens facing the chip on the chip carrier to be tested.

3. The thrust test apparatus according to claim 2, wherein the microscope assembly is mounted to the second drive mechanism for synchronous movement with the thrust detection mechanism in the second direction; and the lens of the microscope component faces the contact end of the thrust detection mechanism.

4. The thrust test apparatus according to claim 3, wherein said thrust detecting mechanism is rotatably mounted to said first driving mechanism so as to rotate in a direction toward or away from said microscope assembly; the rotation axis of the thrust detection mechanism extends in the first direction.

5. The thrust test device according to claim 4, wherein said first driving mechanism comprises a support block and a rotating block rotatably mounted on said support block, and an end of said thrust detecting mechanism remote from said contact end is connected to said rotating block.

6. The thrust test apparatus of claim 5, wherein said first drive mechanism further includes a mounting shaft mounted to said support block, said mounting shaft extending in said first direction; the turning block is provided with a shaft hole, and the shaft hole is rotatably matched with the mounting shaft.

7. The thrust test device according to claim 6, wherein said first driving mechanism further comprises a fixing post mounted to said support block, said fixing post being located between said mounting shaft and said thrust detecting mechanism; when the thrust detection mechanism rotates to a position close to the microscope assembly, the fixing column is detachably connected with the thrust detection mechanism.

8. The thrust test device according to claim 5, wherein the dial indicator is mounted to the rotary block so as to rotate in synchronization with the rotary block.

9. The thrust test device of claim 6, further comprising a connector, wherein one end of the connector is connected to the mounting shaft, and the other end of the connector extends toward the third driving mechanism, and the microscope assembly is mounted on the end of the connector away from the mounting shaft.

10. The thrust test device according to any one of claims 1 to 9, further comprising a base, wherein the base is formed with a receiving groove, and the second and third driving mechanisms are mounted in the receiving groove; the thrust detection mechanism and the chip carrier to be detected are located on the upper surface of the base.