CN217766546U

CN217766546U - A draw structure outward for PCB board test

Info

Publication number: CN217766546U
Application number: CN202221089389.8U
Authority: CN
Inventors: 王皓吉; 滕浩宇
Original assignee: Tianjin Tianke Yunchuang Technology Co ltd
Current assignee: Tianjin Tianke Yunchuang Technology Co ltd
Priority date: 2022-04-27
Filing date: 2022-04-27
Publication date: 2022-11-08
Anticipated expiration: 2032-04-27

Abstract

The utility model provides an draw structure outward for PCB board test, the test box, the test system circuit board, install the probe on the test system circuit board, with probe connection's external interface, include: the base is used for placing a PCB to be tested; the base is arranged at the top of the test box and positioned above the current board of the test system, the base is provided with a plurality of test frames for placing the PCB to be tested, and each test frame is arranged in a height way; the probes are provided with a plurality of types, each type of probe respectively corresponds to a plurality of test racks, and the probes extend to the horizontal positions of the corresponding test racks. A draw structure outward for PCB board test, be convenient for to the investigation problem of multinomial PCB board detection circuitry, the cooperation uses a draw structure outward for PCB board test, combs the circuit through bunching device, helps the investigation to and cooperate a plurality of test support frames, be applicable to the PCB board test of different models, reduced artifical test through the test machine test, use manpower sparingly.

Description

A draw structure outward for PCB board test

Technical Field

The utility model belongs to the technical field of the PCB board test, especially, relate to an draw structure outward for PCB board test.

Background

When a PCB finished product board is produced, whether the PCB has the problem of insufficient soldering and missing soldering needs to be detected, general test items of a test system are hundreds, each item needs to be connected and inserted with a wire on a corresponding bonding pad of the PCB for signal test, but when the test contents are more, signal routing in a tester is very much, and the problem is not easy to check;

the test probes of the signal lines are connected with the pads of the detection board in an inserting mode through the outgoing lines, the outgoing lines of the PCB with a large number of signal lines are more, and workers familiar with the signal lines need to operate the PCB. The traditional outgoing line plugging detection mode is dangerous, and if an operator operates improperly, the PCB is easily damaged, and the resource waste is easily caused.

Disclosure of Invention

In view of this, the utility model aims at providing an introduce structure outward for PCB board test, the cooperation is used for solving among the prior art to welding detection probe circuit more be unfavorable for the investigation and the artifical problem that detects and cause the wasting of resources.

In order to achieve the above purpose, the technical scheme of the utility model is realized as follows:

the utility model provides an outer structure of drawing for PCB board test, the test box installs the test system circuit board in the test box, installs the probe on the test system circuit board, with the external interface of probe connection, still includes: the base is used for placing a PCB to be tested;

the base is arranged at the top of the test box and positioned above the current board of the test system, the base is provided with a plurality of test frames for placing the PCB to be tested, and each test frame is arranged in a height way; the probes are provided with a plurality of types, each type of probe respectively corresponds to a plurality of test racks, and the probes extend to the horizontal positions of the corresponding test racks.

Furthermore, the test jig comprises a plurality of first test jigs and a plurality of second test jigs, the first test jigs comprise four test jigs, the base is of a frame structure, the four test jigs are respectively arranged at four corners inside the base, the second test jigs comprise four test jigs, the four test jigs correspond to the four first test jigs, and the four second test jigs are adjacently installed with the four first test jigs and are located inside the four first test jigs.

Furthermore, the mounting height of the first four test racks is higher than that of the second four test racks, a plurality of mounting grooves are formed in each test rack, and the height and the size of each mounting groove are different.

Furthermore, the four corners inside the test box are provided with mounting seats, and the test system circuit board is fixed on the mounting seats through bolts.

Furthermore, the probes comprise a plurality of first probes and a plurality of second probes, the heights of the first probes are higher than those of the second probes, the heights of the first probes correspond to the first height of the test rack, and the heights of the second probes correspond to the second height of the test rack.

Furthermore, a plurality of wire bundling pieces are installed at the bottom in the test box and fixed through bolts, the probe is connected with an external interface installed on the outer wall of the test box through a line, and the line penetrates through the wire bundling pieces.

Further, bunch spare is including bunch buckle, limiting plate, and the bunch buckle is the hook shape, and the limiting plate is installed at the opening part of bunch buckle, and the limiting plate is installed with the tip dislocation of bunch buckle, and bunch buckle one end is equipped with the arc arch, and the one end of limiting plate is equipped with the arc chimb, the arc arch misplaces with the arc chimb.

Further, the limiting plate is installed on the bottom plate of bunch buckle through the pivot, installs the torsional spring in the pivot.

Compared with the prior art, a draw structure outward for PCB board test have following advantage:

a draw structure outward for PCB board test, be convenient for to the investigation problem of multinomial PCB board detection circuitry, the cooperation uses a draw structure outward for PCB board test, combs the circuit through bunching device, helps the investigation to and cooperate a plurality of test support frames, be applicable to the PCB board test of different models, reduced artifical test through the test machine test, use manpower sparingly.

Drawings

The accompanying drawings, which form a part of the present disclosure, are included to provide a further understanding of the present disclosure, and are incorporated in and constitute a part of this specification, illustrate embodiments of the present disclosure and together with the description serve to explain the present disclosure.

In the drawings:

fig. 1 is a schematic view of an external lead structure for PCB board testing according to an embodiment of the present invention;

fig. 2 is a schematic cross-sectional structural view of an external lead structure for PCB board testing according to an embodiment of the present invention;

fig. 3 is a schematic structural diagram of a wire harness according to an embodiment of the present invention.

Description of reference numerals:

1. a test box; 11. an external interface; 12. a base; 13. a mounting base; 2. testing the system circuit board; 3. a probe; 4. a first test support; 5. a second test bracket; 31. a first probe; 32. a second probe; 6. a wire harness member; 61. wire harness buckling; 62. a limiting plate; 63. a rotating shaft; 64. a torsion spring; 621. a convex edge; 65. a base plate.

Detailed Description

It should be noted that, in the case of no conflict, the embodiments and features of the embodiments of the present invention may be combined with each other.

In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are used merely for convenience of description and for simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention. Furthermore, the terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first," "second," etc. may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless otherwise specified.

In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art through specific situations.

The present invention will be described in detail below with reference to the accompanying drawings in conjunction with embodiments.

As shown in fig. 1 to 2, an external lead structure for PCB board testing, a test box 1, a test system circuit board 2 installed in the test box 1, a probe 3 installed on the test system circuit board 2, and an external interface 11 connected to the probe 3, includes: a base 12 for placing a PCB to be tested;

the base 12 is arranged at the top of the test box 1 and is positioned above a current board of the test system, the base 12 is provided with a plurality of test frames for placing the PCB to be tested, and each test frame is arranged in a height mode; the probes 3 are provided with a plurality of types, each type of probe 3 corresponds to a plurality of test racks respectively, and the probes 3 extend to the horizontal positions of the corresponding test racks.

The test jig comprises a plurality of first test jigs and a plurality of second test jigs, the first test jigs comprise four test jigs, the base 12 is of a frame structure, the first test jigs are respectively arranged at four corners inside the base 12, the second test jigs comprise four test jigs, the second test jigs correspond to the first test jigs, and the second test jigs are adjacently installed with the first test jigs and are located inside the first test jigs.

The mounting height of four test jig one is higher than the mounting height of four test jig two, all is equipped with a plurality of mounting grooves on every test jig, and the height and the size of every mounting groove are all inequality.

As shown in fig. 1, four test jig one are located the inside four corners department of base 12, and four test jig two are located the inside of four test jig one, and four test jig two highly are less than the height of four test jig one, and the top of four test jig two is parallel with the bottom of four test jig one, all be equipped with the mounting groove on every test jig, the mounting groove of the test jig that the four corners corresponds all corresponds the setting, form the rectangle and place the space, be convenient for await measuring placing of PCB board, because mounting groove height and variation in size, consequently, the space of placing that forms is all inequality, the test of the PCB board that awaits measuring of adaptable multiple model.

Wherein the first test frame and the second test frame are made of insulating rubber.

The four corners inside the test box 1 are provided with mounting seats 13, and the test system circuit board 2 is fixed on the mounting seats 13 through bolts.

As shown in fig. 2, the test system circuit board 2 is fixed on the mounting base 13 through bolts, so that the probe 3 is conveniently matched with the test rack in position, and the PCB board test is facilitated.

The probes 3 comprise a plurality of first probes 31 and a plurality of second probes 32, wherein the heights of the first probes 31 are higher than the heights of the second probes 32, the heights of the first probes 31 correspond to the first height of the test rack, and the heights of the second probes 32 correspond to the second height of the test rack.

As shown in fig. 2, the heights of the first probes 31 are higher than the heights of the second probes 32, and the first probes 31 and the second probes 32 are required to correspond to the test rack and to be adapted to the tests of the PCBs with different sizes, so that the heights of the first probes 31 and the second probes 32 are distributed uniformly, and the heights of the second probes 32 are lower than the heights of the first probes 31 and are located at the inner sides of the first probes 31, so that the second probes 32 and the test rack are adapted to the PCBs with small models.

Wherein the probe 3 adopts the probe 3 in the prior art and is a retractable probe 3.

A plurality of wire bundling pieces 6 are installed at the bottom in the test box 1, the wire bundling pieces 6 are fixed through bolts, the probe 3 is connected with an external interface 11 installed on the outer wall of the test box 1 through a circuit, and the circuit penetrates through the wire bundling pieces 6.

Bunch line spare 6 includes bunch buckle 61, limiting plate 62, and bunch buckle 61 is the hook shape, and limiting plate 62 is installed at bunch buckle 61's opening part, and limiting plate 62 and bunch buckle 61's tip dislocation mounting, bunch buckle 61 one end are equipped with the arc arch, and limiting plate 62's one end is equipped with arc chimb 621, and the arc is protruding to be misplaced with arc chimb 621.

The stopper plate 62 is mounted on the bottom plate 65 of the harness buckle 61 via a rotating shaft 63, and the torsion spring 64 is mounted on the rotating shaft 63.

As shown in fig. 2 and 3, bunch buckle 61 and bottom plate 65 of bunch spare 6 are integrated into one piece, bottom plate 65 passes through the bolt fastening at the bottom in test box 1, when probe 3 is connected with external interface 11, make interconnecting link run through bunch spare 6 in proper order, during the installation, inwards extrude limiting plate 62 along the arc tip of bunch buckle 61 tip with the circuit, limiting plate 62 rotates, the circuit gets into in bunch buckle 61, limiting plate 62 returns automatically, when dismantling, extrude the arc chimb 621 of limiting plate 62 top with the circuit, extrude limiting plate 62, limiting plate 62 inwards rotates, thereby the circuit takes out, and convenient operation, and avoided probe 3 and external interface 11 circuit in disorder through bunch spare 6, be not convenient for the investigation.

The method comprises the following specific steps:

when probe 3 is connected with external interface 11, inwards extrude limiting plate 62 with the arc tip of circuit along bunch buckle 61 tip, limiting plate 62 rotates, and in the circuit got into bunch buckle 61, limiting plate 62 returned automatically, but this installation will both ends need the part welding of connecting, the later stage investigation of being convenient for.

When the circuit is disassembled, the circuit extrudes the arc convex edge 621 above the limit plate 62, extrudes the limit plate 62, the limit plate 62 rotates inwards, so that the circuit is taken out, the operation is convenient,

during testing, the corresponding circuit board is placed on the appropriate test support, the test hole corresponding to the PCB to be tested is installed corresponding to the probe 3, testing is carried out after the installation is finished, the specific test process adopts the prior art, and detailed description is omitted here.

The above description is only a preferred embodiment of the present invention, and should not be taken as limiting the invention, and any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. The utility model provides an draw structure outward for PCB board test, test box (1), test system circuit board (2) of installing in test box (1), install probe (3) on test system circuit board (2), external interface (11) of being connected with probe (3), its characterized in that includes: a base (12) for placing a PCB to be tested;

the base (12) is arranged at the top of the test box (1) and is positioned above a current board of the test system, a test rack for placing a PCB to be tested is arranged on the base (12), the test rack comprises a plurality of test racks, and the height of each test rack is arranged; the probes (3) are arranged in various types, each type of probe (3) corresponds to a plurality of test frames respectively, and the probes (3) extend to the horizontal positions of the corresponding test frames.

2. The external lead structure for PCB board test of claim 1, wherein: the test jig comprises a plurality of test jig I and a plurality of test jig II, the plurality of test jig I comprises four test jig I, a base (12) is of a frame structure, the four test jig I are respectively arranged at four corners inside the base (12), the plurality of test jig II comprise four test jig II, the four test jig II correspond to the four test jig I, and the four test jig II and the four test jig I are adjacently installed and are located inside the four test jig I.

3. The external lead structure for PCB board test of claim 2, wherein: the mounting height of four test jig one is higher than the mounting height of four test jig two, all is equipped with a plurality of mounting grooves on every test jig, and the height and the size of every mounting groove are all inequality.

4. The external lead structure for PCB board test of claim 1, wherein: the four corners of the interior of the test box (1) are provided with mounting seats (13), and the test system circuit board (2) is fixed on the mounting seats (13) through bolts.

5. The external lead structure for PCB board test of claim 1, wherein: the probes (3) comprise a plurality of first probes (31) and a plurality of second probes (32), the height of the first probes (31) is higher than that of the second probes (32), the height of the first probes (31) corresponds to the first height of the test rack, and the height of the second probes (32) corresponds to the second height of the test rack.

6. The external lead structure for PCB board test of claim 1, wherein: a plurality of wire harness spare (6) are installed to the bottom in test box (1), and a plurality of wire harness spare (6) pass through bolt fastening, probe (3) are connected with external interface (11) of installing at test box (1) outer wall through the circuit, and the circuit runs through wire harness spare (6).

7. The external lead structure for PCB board test of claim 6, wherein: restraint line spare (6) are including bunch buckle (61), limiting plate (62), and bunch buckle (61) are the hook shape, and the opening part at bunch buckle (61) is installed in limiting plate (62), and limiting plate (62) and the tip dislocation installation of bunch buckle (61), and bunch buckle (61) one end is equipped with the arc arch, and the one end of limiting plate (62) is equipped with arc chimb (621), and the arc is protruding to be misplaced with arc chimb (621).

8. The external lead structure for PCB testing of claim 7, wherein: the limiting plate (62) is installed on a bottom plate (65) of the wire harness buckle (61) through a rotating shaft (63), and the rotating shaft (63) is provided with a torsion spring (64).