CN217717951U

CN217717951U - Device testing system

Info

Publication number: CN217717951U
Application number: CN202221337622.XU
Authority: CN
Inventors: 张文; 居宁; 苏东
Original assignee: Beijing Huafeng Test & Control Technology Co ltd
Current assignee: Beijing Huafeng Test & Control Technology Co ltd
Priority date: 2022-05-31
Filing date: 2022-05-31
Publication date: 2022-11-01
Anticipated expiration: 2032-05-31

Abstract

The utility model relates to a device test system. The device testing system comprises a testing cabinet, a board card and a wrench; the wrench comprises a rotating part and a handheld part which are connected with each other, the rotating part is arranged on the third side surface and is rotationally connected with the board card, a first groove is formed in the rotating part, and a first convex strip is arranged on one side of the side plate facing the board card; the one side of keeping away from the backplate on the first sand grip is first side, and when the spanner was in the first state, the opening of first recess was towards first side, and rotation portion and first side butt, when the spanner was in the second state, first sand grip inserted in first recess. The device testing system can assist the board card to be inserted and pulled out through the rotary wrench, improves the inserting and pulling efficiency of the board card, enables the board card to be stressed uniformly, avoids the second connector on the board card from being damaged, and reduces the testing cost.

Description

Device testing system

Technical Field

The utility model relates to a test equipment technical field especially relates to device testing system.

Background

In the field of Automatic Test Equipment (ATE), a plurality of boards are generally arranged to Test a Device Under Test (DUT). Each board card is provided with different functions, and different voltages, currents and time sequences are converted to test various tested devices through a certain test program, so that the rapid batch test of the tested devices is realized.

The automatic test equipment comprises a test cabinet for installing the board cards, and the test cabinet comprises a back plate provided with a plurality of connectors, so that the test cabinet can install the board cards at the same time. In the test process, the connector on the board card needs to be in butt joint with the connector on the backboard, the backboard is connected with the tested device, and then the test parameters are controlled through the automatic test equipment to complete the test of the tested device. After the test is finished, if the board card needs to be replaced or maintained, the board card is pulled out from the backboard.

In the process of inserting and pulling out the board card, manual plugging is generally adopted, the plugging mode is low in efficiency, and the connector of the board card is easily damaged due to uneven stress of the board card, so that the test cost is improved.

SUMMERY OF THE UTILITY MODEL

Therefore, it is necessary to provide a device testing system for solving the problems of low board plugging efficiency and high testing cost.

A device testing system, comprising:

the test cabinet comprises two side plates and a back plate provided with a first connector, the two side plates are arranged oppositely, and the side plates are vertically connected with the back plate;

the side surface of the board card facing the backboard is provided with a second connector, and the second connector is in butt joint with the first connector;

the wrench comprises a rotating portion and a handheld portion which are connected with each other, one surface, facing the side plate, of the board card is a third side surface, the rotating portion is arranged on the third side surface and is in rotating connection with the board card, the rotating portion rotates by a certain angle along a first rotating direction to enable the wrench to be switched from a first state to a second state, the rotating portion rotates by a certain angle along a second rotating direction to enable the wrench to be switched from the second state to the first state, the first rotating direction is opposite to the second rotating direction, the rotating portion is perpendicular to the board card relative to a rotating shaft of the board card, a first groove is formed in the rotating portion, and a first protruding strip is arranged on one side, facing the board card, of the side plate;

keep away from on the first sand grip the one side of backplate is first side, works as the spanner is in during the first state, the opening orientation of first recess first side, the rotation portion with first side butt, works as the spanner is in during the second state, first sand grip inserts in the first recess.

According to the device testing system, the wrench is rotatably connected with the board card, the wrench is provided with the first groove, and the first groove can be matched with the first convex strip, so that the effect of assisting the board card in being inserted or pulled out is realized. The one side of keeping away from the backplate on the first sand grip is first side, and the one side that is close to the backplate on the first sand grip is the second side, and when the operation integrated circuit board inserted the test cabinet, the spanner was in the first state, and unblock state promptly keeps away from on rotation portion and the first sand grip the one side butt of backplate is rotated along first turning the spanner this moment, and at the rotation in-process, the lateral wall of first recess supported the pressure atress with the second side of first sand grip, should support the pressure and transmit on the integrated circuit board through the junction of spanner and integrated circuit board to promote the integrated circuit board to remove to the direction that is close to the backplate, finally make the second connector on the integrated circuit board and the first connector butt joint on the backplate, during first sand grip inserted first recess, accomplished the plug-in work of integrated circuit board. When the test cabinet is extracted from the operation board card, the wrench is in a second state, namely a locking state, the wrench is rotated along a second turning direction at the moment, in the rotating process, the rotating portion is abutted to the first side face of the first convex strip to press the force, the abutting force is transmitted to the board card through the connecting position of the wrench and the board card to drive the board card to move towards the direction away from the backboard, finally, the second connector on the board card is separated from the first connector on the backboard, and the extracting work of the board card is completed. Therefore, the device testing system can assist the board card to be inserted and pulled out through the rotary wrench, the board card inserting and pulling-out efficiency is improved, the board card is enabled to be evenly stressed, the second connector on the board card is prevented from being damaged, and the device testing cost is reduced.

In one embodiment, the device testing system further comprises a connecting support and a rotating rod, the connecting support is arranged on the third side face, the rotating rod penetrates through the rotating portion and the connecting support and is connected with the rotating portion, the rotating portion can rotate relative to the connecting support by taking the rotating rod as a rotating shaft, and the axis of the rotating rod is perpendicular to the board card.

In one embodiment, the rotating part is provided with a second groove, a part of the connecting support is inserted into the second groove, and the second groove can rotate relative to the connecting support when the rotating part rotates relative to the connecting support.

In one embodiment, the device testing system further includes a first fixing member, the connection support includes a first connection portion and a second connection portion, one end of the first connection portion is connected to the board card, the other end of the first connection portion is connected to the second connection portion, the rotating rod passes through the first connection portion and the rotating portion and is connected to the rotating portion, the second connection portion is opposite to the first side face, and when the wrench is in the second state, the first fixing member can pass through the second connection portion and is connected to the first protruding strip.

In one embodiment, the rotation of the turning portion by 90 degrees in the first direction can switch the wrench from the first state to the second state, and the rotation of the turning portion by 90 degrees in the second direction can switch the wrench from the second state to the first state.

In one embodiment, when the wrench is in the first state, the handle is disposed parallel to the third side;

and/or the side surface of the board card far away from the back plate is a fourth side surface, and when the wrench is in the second state, the handheld part and the fourth side surface are spaced in parallel.

In one embodiment, the device testing system further includes a second fixing member, and the second fixing member can pass through the hand-held portion and be connected with the board when the wrench is in the second state.

In one embodiment, a first arc end surface is disposed on the rotating portion, the first arc end surface is disposed opposite to the first groove, and the first arc end surface is disposed with a rotating shaft of the rotating portion as an axis.

In one embodiment, a second arc end surface is arranged on the rotating part, and when the wrench is in the first state, the second arc end surface is abutted with the first side surface.

In one embodiment, the number of the wrenches is two, a plane which passes through a bisector of the board card and is parallel to the side plate is a virtual plane, and the two wrenches are symmetrically arranged relative to the virtual plane.

Drawings

FIG. 1 is a schematic diagram of a device testing system in one embodiment;

FIG. 2 is an enlarged view of a portion of a device testing system in one embodiment;

FIG. 3 is a cross-sectional view of a device testing system in one embodiment;

FIG. 4 is a front view of the board and wrench of an embodiment;

FIG. 5 is a schematic view of an embodiment of the assembly of the board and the wrench;

FIG. 6 is an exploded view of the board and wrench in one embodiment;

FIG. 7 is a schematic view of an embodiment of a wrench;

FIG. 8 is a schematic view of an embodiment of the wrench in a first position;

FIG. 9 is a schematic view of an intermediate position of the wrench from the first position to the second position in accordance with one embodiment;

fig. 10 is a schematic structural view of the wrench in the second state in one embodiment.

Reference numerals: 100. a device test system; 10. a wrench; 11. a rotating part; 12. a hand-held portion; 13. a first groove; 14. a second groove; 15. a first arc end surface; 16. a second arc end surface; 20. connecting a support; 21. a first connection portion; 22. a second connecting portion; 30. rotating the rod; 40. a first fixing member; 50. a second fixing member; 60. a test cabinet; 61. a back plate; 62. a side plate; 621. a first rib; 6211. a first side surface; 6212. a second side surface; 622. a second convex strip; 623. a guide rail; 624. a third groove; 70. a board card; 71. a second connector; 72. a third side; 73. a fourth side surface.

Detailed Description

In order to make the aforementioned objects, features and advantages of the present invention more comprehensible, embodiments accompanied with figures are described in detail below. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. The present invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein, as those skilled in the art will be able to make similar modifications without departing from the spirit and scope of the present invention.

The device testing system 100 in some embodiments is described in detail below with reference to the figures.

As shown in fig. 1-10, in one embodiment, a device testing system 100 is provided, including a test cabinet 60, a board card 70, and a wrench 10;

the test cabinet 60 comprises two side plates 62 and a back plate 61 provided with a first connector, wherein the two side plates 62 are arranged oppositely, and the side plates 62 are vertically connected with the back plate 61; a second connector 71 is arranged on the side surface of the board card 70 facing the back plate 61, and the second connector 71 is butted with the first connector; the wrench 10 comprises a rotating portion 11 and a handheld portion 12 which are connected with each other, one surface, facing the side plate 62, of the board card 70 is a third side surface 72, the rotating portion 11 is arranged on the third side surface 72 and is rotationally connected with the board card 70, the rotating portion 11 rotates by a certain angle in a first rotating direction to enable the wrench 10 to be switched from the first state to the second state, the rotating portion 11 rotates by a certain angle in a second rotating direction to enable the wrench 10 to be switched from the second state to the first state, the first rotating direction is opposite to the second rotating direction, the rotating portion 11 is perpendicular to the board card 70 relative to a rotating shaft of the board card 70, a first groove 13 is formed in the rotating portion 11, and a first convex strip 621 is arranged on one side, facing the board card 70, of the side plate 62;

as shown in fig. 8 to 10, a surface of the first protruding strip 621 away from the back plate 61 is a first side surface 6211, when the wrench 10 is in the first state, an opening of the first groove 13 faces the first side surface 6211, the rotating portion 11 abuts against the first side surface 6211, and when the wrench 10 is in the second state, the first protruding strip 621 is inserted into the first groove 13.

In the device testing system 100, the wrench 10 is rotatably connected with the board card 70, the wrench 10 is provided with the first groove 13, and the first groove 13 can be matched with the first protruding strip 621, so that the insertion or extraction of the board card 70 is assisted. The side of the first protruding strip 621 close to the back plate 61 is a second side face 6212, when the operating board card 70 is inserted into the test cabinet 60, the wrench 10 is in the first state, i.e., the unlocked state, the rotating portion 11 abuts against the side of the first protruding strip 621 far from the back plate 61, at this time, the wrench 10 is rotated along the first direction, during the rotation process, the side wall of the first groove 13 abuts against the second side face 6212 of the first protruding strip 621, the abutting force is transmitted to the board card 70 through the connection between the wrench 10 and the board card 70, so that the board card 70 is pushed to move in the direction close to the back plate 61, finally the second connector 71 on the board card 70 is abutted against the first connector on the back plate 61, the first protruding strip 621 is inserted into the first groove 13, and the insertion work of the board card 70 is completed. When the test cabinet 60 is pulled out by operating the board card 70, the wrench 10 is in the second state, i.e., the locking state, the wrench 10 is rotated along the second rotation direction at this time, in the rotation process, the rotation portion 11 and the first side face 6211 of the first protruding strip 621 support the pressure force, the support pressure force is transmitted to the board card 70 through the connection portion of the wrench 10 and the board card 70, the board card 70 is driven to move in the direction away from the back plate 61, finally, the second connector 71 on the board card 70 is separated from the first connector on the back plate 61, and the pulling-out work of the board card 70 is completed. Therefore, the device testing system 100 can assist the board card 70 to be inserted and pulled out by rotating the wrench 10, so that the inserting and pulling-out efficiency of the board card 70 is improved, the stress on the board card 70 is uniform, the damage of the second connector on the board card 70 is avoided, and the testing cost of the board card 70 is reduced.

The first groove 13 is a U-shaped groove, and the shape of the first protruding strip 621 is adapted to the shape of the first groove 13. The side wall of the first groove 13 can limit the maximum angle of rotation of the rotating portion in the first direction of rotation.

Specifically, as shown in fig. 5 and 6, in an embodiment, the device testing system 100 further includes a connecting support 20 and a rotating rod 30, a side of the board card 70 facing the side plate 62 is a third side 72, the connecting support 20 is disposed on the third side 72, the rotating rod 30 passes through the rotating portion 11 and the connecting support 20 and is connected to the rotating portion 11, the rotating portion 11 can rotate relative to the connecting support 20 by using the rotating rod 30 as a rotating shaft, and an axis of the rotating rod 30 is perpendicular to the board card 70.

Specifically, as shown in fig. 5 and 7, in one embodiment, the rotating part 11 is provided with a second groove 14, a portion of the connection holder 20 is inserted into the second groove 14, and the second groove 14 can rotate relative to the connection holder 20 when the rotating part 11 rotates relative to the connection holder 20.

In this embodiment, the upper side wall of the second groove 14 is provided with a countersunk hole, the lower side wall of the second groove 14 is provided with a threaded hole, the connecting support 20 is provided with a through hole, and the rotating rod 30 sequentially passes through the countersunk hole, the through hole and the threaded hole and is in threaded connection with the lower side wall of the second groove 14. Due to the through hole formed in the connecting support 20, the rotating rod 30 is driven to rotate relative to the connecting support 20 when the rotating portion 11 rotates. However, when the rotating portion 11 moves along the radial direction of the rotating rod 30, the rotating portion 11 can drive the connecting support 20 to move through the rotating rod 30, and then the connecting support 20 drives the board card 70 to move close to or away from the back plate 61, so as to implement the operation of inserting or extracting the board card 70. Specifically, as shown in fig. 5 and 6, in an embodiment, the device testing system 100 further includes a first fixing member 40, the connection support 20 includes a first connection portion 21 and a second connection portion 22, one end of the first connection portion 21 is connected to the board 70, the other end of the first connection portion 21 is connected to the second connection portion 22, the rotating rod 30 passes through the first connection portion 21 and the rotating portion 11 and is connected to the rotating portion 11, the second connection portion 22 is opposite to the first side face 6211, and when the wrench 10 is in the second state, the first fixing member 40 can pass through the second connection portion 22 and be connected to the first protruding strip 621.

The first fixing member 40 includes a screw and a bolt.

And, the second groove 14 penetrates the rotating portion along a direction close to the first groove 13, so that the second groove 14 communicates with the first groove 13, and the second connecting portion passes through the second groove 14 and is connected with the first protruding strip 621.

Referring to fig. 5 to 10, in the present embodiment, the second connecting portion 22 is located on a side of the first protruding strip 621 away from the back plate 61, when the wrench 10 is in the first state, the second connecting portion 22 and the first protruding strip 621 are disposed at an interval, the first fixing member 40 is not connected to the first protruding strip 621, when the wrench 10 is in the second state, the second connecting portion 22 abuts against the first side face 6211, and the first fixing member 40 passes through the second connecting portion 22 and is connected to the first protruding strip 621. Therefore, after the second connector 71 is butted with the first connector, the first fixing member 40 fixedly connects the support 20 with the first protruding strip 621, so that the board card 70 and the side plate 62 are kept relatively stationary, thereby preventing the second connector 71 from being disconnected from the first connector in the testing process, and ensuring the effectiveness of the test. Moreover, the board card in the test head can be prevented from dropping off due to the rotation of the test cabinet during testing, the board card is damaged, and the test is interrupted, so that the test efficiency is influenced.

Specifically, as shown in fig. 8 to 10, in one embodiment, the rotation of the rotating portion 11 by 90 degrees in the first direction can switch the wrench 10 from the first state to the second state, and the rotation of the rotating portion 11 by 90 degrees in the second direction can switch the wrench 10 from the second state to the first state.

Specifically, as shown in fig. 8 to 10, in an embodiment, a side of the board 70 facing the side plate 62 is a third side 72, and when the wrench 10 is in the first state, the handle 12 is parallel to the third side 72;

the side of the board 70 away from the back plate 61 is a fourth side 73, and when the wrench 10 is in the second state, the hand-held portion 12 is spaced from the fourth side 73 in parallel. The wrench is used to limit a maximum angle of rotation of the rotating portion in the first rotation direction.

Specifically, as shown in fig. 10, in an embodiment, the device testing system 100 further includes a second fixing member 50, and when the wrench 10 is in the second state, the second fixing member 50 can pass through the handle 12 to connect with the board 70. The second fixing member 50 is used for preventing the wrench 10 from rotating under the action of an artificial external force in the test process, so that the board card 70 falls off from the test cabinet 60, the second connector 71 is effectively connected with the first connector, and the test accuracy is improved.

The second fixing member 50 includes a screw and a bolt.

In this embodiment, a fourth groove is provided on the side of the handle 12 away from the back plate 61. The fourth groove is an arc groove, and the fourth groove is convenient for a worker to hold the rotary wrench 10.

Specifically, as shown in fig. 5 to 7, in an embodiment, the rotating portion 11 is provided with a first arc end surface 15, the first arc end surface 15 is disposed opposite to the first groove 13, and the first arc end surface 15 is disposed around the rotating shaft of the rotating portion 11. The first arc end surface 15 is used to ensure the maximum rotation angle of the rotating portion 11, and is used to prevent the rotating portion 11 from interfering with the third side surface 72 during the rotation.

Specifically, as shown in fig. 5 to 7, in one embodiment, the rotating portion 11 is provided with a second arc end surface 16, and when the wrench 10 is in the first state, the second arc end surface 16 abuts against the first side surface 6211. The second arc end face 16 is used to prevent the rotating portion 11 from interfering with the first protrusion 621 during rotation, thereby affecting the insertion and extraction of the card 70.

Specifically, as shown in fig. 1 to 4, in one embodiment, two wrenches 10 are provided, and a plane passing through a bisector of the board 70 and parallel to the side plate 62 is a virtual plane, and the two wrenches 10 are symmetrically arranged about the virtual plane. The two spanners 10 are symmetrically arranged to ensure that the board card 70 is evenly stressed on both sides when being pulled out and inserted.

It should be understood that the structure of the wrench 10 is one of any of the above-described embodiments, the two wrenches 10 may be the same or different, as long as the function of assisting the insertion and extraction of the board card 70 can be realized, and the two wrenches 70 may be used interchangeably. Particularly, when the two wrenches 10 have the same structure, the manufacturing process of the wrench 10 is simpler, which is beneficial to saving the processing cost.

In this embodiment, the end surface of the first protruding strip 621 facing the board card 70 is chamfered.

Specifically, as shown in fig. 2, in an embodiment, a plurality of guide rails 623 are disposed on two side plates 62 of the test cabinet 60, and a sliding block is disposed on a side surface of the board 70 facing the side plates 62, and the sliding block is in sliding fit with the guide rails 623 for guiding the board 70 to approach the back plate 61, so that the second connector 71 is butted with the first connector, and the first protruding strip 621 is located on a side of the guide rails 623 away from the back plate 61.

Specifically, as shown in fig. 9, in an embodiment, the side plate 62 is further provided with a second protruding strip 622, the second protruding strip 622 is located on a side of the first protruding strip 621 close to the back plate 61, and the second protruding strip 622 and the first protruding strip 621 are disposed at an interval, so that the second protruding strip 622 and the first protruding strip 621 form a third groove 624. The portion of the rotating portion 11 surrounding the first recess 13 and away from the handle portion 12 is a rear portion that is inserted into the third recess 624 when the wrench 10 is in the second state. Wherein the end surface of the rear upper surface facing the side plate 62 is chamfered. The chamfer is used to prevent interference during rotation.

In this embodiment, when the wrench 10 is in the second state, a chamfer is formed on the first protruding strip 621 of the side plate 62 on one side of the back plate. The chamfer is used to prevent interference during rotation.

In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", and the like, indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.

In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," and "fixed" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.

In the present application, unless expressly stated or limited otherwise, the first feature may be directly on or directly under the second feature or indirectly via intermediate members. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.

It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. As used herein, the terms "vertical," "horizontal," "upper," "lower," "left," "right," and the like are for purposes of illustration only and do not denote a single embodiment.

The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.

The above examples only represent some embodiments of the present invention, and the description thereof is more specific and detailed, but not to be construed as limiting the scope of the present invention. It should be noted that, for those skilled in the art, without departing from the concept of the present invention, several variations and modifications can be made, which all fall within the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the appended claims.

Claims

1. A device testing system, comprising:

the testing cabinet comprises two side plates and a back plate provided with a first connector, wherein the two side plates are arranged oppositely, and the side plates are vertically connected with the back plate;

the wrench comprises a rotating portion and a handheld portion which are connected with each other, one surface, facing the side plate, of the board card is a third side surface, the rotating portion is arranged on the third side surface and is in rotating connection with the board card, the rotating portion rotates for a certain angle along a first rotating direction to enable the wrench to be switched from a first state to a second state, the rotating portion rotates for a certain angle along a second rotating direction to enable the wrench to be switched from the second state to the first state, the first rotating direction is opposite to the second rotating direction, the rotating portion is perpendicular to the board card relative to a rotating shaft of the board card, a first groove is formed in the rotating portion, and a first protruding strip is arranged on one side, facing the board card, of the side plate;

2. The device test system according to claim 1, further comprising a connection support and a rotation rod, wherein the connection support is disposed on the third side surface, the rotation rod penetrates through the rotation portion and the connection support, and is connected to the rotation portion, the rotation portion can rotate relative to the connection support with the rotation rod as a rotation shaft, and an axis of the rotation rod is perpendicular to the board card.

3. The device testing system of claim 2, wherein the rotating portion is provided with a second groove into which a portion of the connection holder is inserted, the second groove being rotatable with respect to the connection holder when the rotating portion rotates with respect to the connection holder.

4. The device testing system of claim 2, further comprising a first fixing member, wherein the connection support comprises a first connection portion and a second connection portion, one end of the first connection portion is connected to the board, the other end of the first connection portion is connected to the second connection portion, the rotating rod penetrates through the first connection portion and the rotating portion and is connected to the rotating portion, the second connection portion is opposite to the first side, and when the wrench is in the second state, the first fixing member can penetrate through the second connection portion and is connected to the first protruding strip.

5. The device testing system of claim 1, wherein a 90 degree rotation of the turning portion in the first direction of rotation enables the wrench to switch from the first state to the second state, and a 90 degree rotation of the turning portion in the second direction of rotation enables the wrench to switch from the second state to the first state.

6. The device testing system of claim 1, wherein the handle is disposed parallel to the third side when the wrench is in the first state;

and/or the side face, far away from the back plate, of the board card is a fourth side face, and when the wrench is in the second state, the handheld portion and the fourth side face are spaced in parallel.

7. The device testing system of claim 6, further comprising a second fixture connectable to the board through the handle when the wrench is in the second state.

8. The device testing system according to any one of claims 1 to 7, wherein a first arc end surface is provided on the rotating portion, the first arc end surface is disposed opposite to the first groove, and the first arc end surface is disposed with a rotating shaft of the rotating portion as an axis.

9. The device testing system according to any one of claims 1 to 7, wherein a second circular arc end surface is provided on the rotating portion, the second circular arc end surface abutting against the first side surface when the wrench is in the first state.

10. The device testing system of any one of claims 1-7, wherein there are two of the wrenches, and a plane passing through a bisector of the board and parallel to the side plates is a virtual plane, and the two wrenches are symmetrically disposed about the virtual plane.