CN215813167U

CN215813167U - Board card plugging mechanism of semiconductor test equipment

Info

Publication number: CN215813167U
Application number: CN202122054489.9U
Authority: CN
Inventors: 黄锐; 丁浩; 裴敬; 邓标华
Original assignee: Wuhan Jinghong Electronic Technology Co ltd; Wuhan Jingce Electronic Group Co Ltd
Current assignee: Wuhan Jinghong Electronic Technology Co ltd; Wuhan Jingce Electronic Group Co Ltd
Priority date: 2021-06-18
Filing date: 2021-08-27
Publication date: 2022-02-11
Anticipated expiration: 2031-08-27
Also published as: CN215812910U; CN215812912U; CN113835014A; CN215813109U; CN215812914U; CN215728313U

Abstract

The application relates to a board card plugging mechanism of semiconductor test equipment, wherein an aging test board is horizontally arranged and movably assembled on a third mounting rack, a plurality of limiting spaces are sequentially arranged on two sides of the end part of the third mounting rack from top to bottom at intervals, and two ends of the aging test board correspond to one limiting space respectively; the plugging mechanism comprises a second plugging tool, and the second plugging tool comprises a fifth connecting piece, a second clamping hook and two handles; the second clamping hook is detachably arranged on the fifth connecting piece and is used for being clamped in a second clamping hook groove on the aging test board; the two handles are respectively connected to the two ends of the fifth connecting piece in a rotating mode, when the aging test board is used, the fifth connecting piece is horizontally arranged, one part of each of the two handles extends into a limiting space on two sides of the end portion of the third mounting frame respectively, and meanwhile when the two handles are rotated outwards, the aging test board is pulled out. The problem that the amount of labour of workers is large and the plugging efficiency is low due to manual plugging in and plugging out in the related technology can be solved.

Description

Board card plugging mechanism of semiconductor test equipment

Technical Field

The application relates to the technical field of high and low temperature aging tests of semiconductor integrated circuits, in particular to a board card plugging mechanism of semiconductor test equipment.

Background

The semiconductor memory has certain failure probability, the relation between the failure probability and the use times accords with the characteristic of a bathtub curve, the failure probability of the memory is high when the semiconductor memory is used, the failure probability is greatly reduced after the semiconductor memory is used for a certain number of times, and the failure probability of the memory is increased until the semiconductor memory is close to or reaches the service life of the semiconductor memory. To date, no memory manufacturer has been willing to ignore the failure problem of semiconductor memories, and generally the problem is solved by accelerating the occurrence of memory failure probability through a Test Duringburn-in (TDBI) and directly entering the product stability period.

The general scheme of the chip semiconductor aging test is to supply a power supply signal and a test signal to a tested chip semiconductor, and continuously work the tested chip semiconductor for a set time at high and low temperatures or normal temperature, wherein the process is called aging (burn-in), so that the failure of a semiconductor memory is accelerated, and a good product is screened out. Because of the wide variety of chip semiconductors, wide application, large quantity, high performance and wide working temperature range, an aging test system with flexible capacity, good expandability, wide temperature range, rich functions, high architecture reliability and high cost performance is required to meet the practical application.

In the related art, when the burn-in board is replaced, the burn-in board is usually inserted and pulled out on the mounting frame by a hand, which increases the labor intensity of workers and is inefficient.

Disclosure of Invention

The embodiment of the application provides a board card plugging mechanism of semiconductor test equipment to solve the problems of large labor capacity of workers and low plugging efficiency caused by manual plugging in the related art.

The embodiment of the application provides a board card plugging mechanism of semiconductor testing equipment, wherein an aging test board is horizontally arranged and movably assembled on a third mounting rack, a plurality of limiting spaces are sequentially arranged on two sides of the end part of the third mounting rack from top to bottom at intervals, and two ends of the aging test board correspond to one limiting space respectively;

it includes second plug instrument, second plug instrument includes:

a fifth connecting member;

the second clamping hook is arranged on the fifth connecting piece and is used for being clamped in a second clamping hook groove on the aging test board;

and the two handles are respectively and rotatably connected to two ends of the fifth connecting piece.

In some embodiments, two sides of an end portion of the third mounting frame are respectively provided with a sixth connecting piece, the sixth connecting pieces are vertically arranged, the sixth connecting pieces are connected to the third mounting frame through a plurality of second bearing portions, and the second bearing portions are arranged at intervals from top to bottom;

the limiting space is formed between the two second bearing parts which are adjacent up and down, and the handle is borne on the second bearing parts when the handle is used.

In some embodiments, the handle comprises a first section, a second section and a third section, wherein the first section is connected to one end of the second section and is used for extending into the limiting space, the third section is connected to the other end of the second section and is used for holding by hand, and one end of the second section close to the first section is rotatably connected to the fifth connecting piece.

In some embodiments, an included angle between the first segment and the second segment is an obtuse angle, an included angle between the third segment and the second segment is an obtuse angle, a straight line where the third segment is located intersects a straight line where the first segment is located, and the first segment and the third segment are located on two sides of the second segment.

In some embodiments, an anti-slip sleeve is disposed on the third segment.

In some embodiments, the slip resistant sleeve is removably attached to the third section.

In some embodiments, the second hook includes a hook base plate and a hook protrusion adapted to the second hook groove, the hook base plate is connected to the fifth connecting member, and one end of the hook base plate protrudes upward to form the hook protrusion.

In some embodiments, the hook base plate is further provided with a limiting convex part, the limiting convex part and the hook convex part are located on the same wall surface of the hook base plate and are arranged at intervals, and when the hook convex part extends into the second hook groove, the limiting convex part contacts with the side wall of the burn-in board or has a set interval.

In some embodiments, the fifth connecting member includes a main rod and two adjusting rods, the second hook is disposed on the main rod, one end of each of the two adjusting rods is rotatably connected to a handle, and the other end of each of the two adjusting rods is movably disposed at two ends of the main rod, so as to adjust the length of the fifth connecting member.

In some embodiments, one of the main rod and the adjusting rod is provided with a first strip-shaped hole, and the other is provided with a second strip-shaped hole, and the main rod and the adjusting rod are movably connected through a fastener screwed on the first hole and the second hole.

The beneficial effect that technical scheme that this application provided brought includes:

according to the board card plugging and unplugging mechanism of the semiconductor test equipment, the two handles are respectively and rotatably connected to the two ends of the fifth connecting piece, when the board card plugging and unplugging mechanism is used, the second clamping hook is clamped in the second clamping hook groove on the aging test board, the second clamping hook is installed on the fifth connecting piece, meanwhile, one part of each of the two handles respectively extends into a limiting space on the two sides of the end part of the third mounting frame, then the two handles are simultaneously and outwardly rotated, the handles drive the fifth connecting piece to move outwards through reverse thrust under the limiting of the limiting space, and then the aging test board moves outwards under the driving of the second clamping hook, so that the aging test board is pulled out; because the burn-in test boards are generally arranged vertically, and the space between two adjacent burn-in test boards is small, so that hands are not easy to hold, the plugging mechanism can be conveniently plugged, and the working efficiency is improved.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.

FIG. 1 is a schematic diagram of a burn-in board provided in an embodiment of the present application;

fig. 2 is a schematic view of a third mounting frame provided in the embodiment of the present application;

fig. 3 is a schematic diagram of a second plugging tool according to an embodiment of the present disclosure;

fig. 4 is a schematic view of a second plugging tool according to an embodiment of the present disclosure in use;

fig. 5 is a schematic diagram of a second plugging tool according to another embodiment of the present disclosure.

In the figure: 3. an aging test board; 33. a second hook groove; 7. a third mounting bracket; 70. a large frame body; 700. a frame body roller; 708. a sixth connecting member; 709. a second bearing part; 71. a small frame body; 710. a third guide groove; 72. a second plugging tool; 720. a fifth connecting member; 7200. a main rod; 7201. adjusting a rod; 7202. a first hole; 7203. a second hole; 7204. a fastener; 721. a second hook; 7210. a hook bottom plate; 7211. a hook protrusion; 7212. a limiting convex part; 722. a handle; 7220. a first segment; 7221. a second segment; 7222. a third segment; 7223. an anti-slip sleeve.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

The embodiment of the application provides a board card plugging mechanism of semiconductor test equipment, which can solve the problems of large labor capacity of workers and low plugging efficiency caused by manual plugging in the related technology.

Referring to fig. 1, 2, and 3, in the board card plugging mechanism of the semiconductor test equipment provided in the embodiment of the present application, the burn-in board 3 is in a horizontal arrangement state and movably assembled on the third mounting frame 7, that is, the burn-in board 3 may be disposed on the third mounting frame 7 in a sliding manner or may be mounted on the third mounting frame 7 in a rolling manner, two sides of an end portion of the third mounting frame 7 are sequentially provided with a plurality of limiting spaces from top to bottom at intervals, and the limiting spaces on the two sides are disposed in a one-to-one correspondence manner, so that two ends of the burn-in board 3 respectively correspond to one limiting space; the plugging mechanism comprises a second plugging tool 72, wherein the second plugging tool 72 comprises a fifth connecting piece 720, a second clamping hook 721 and two handles 722; the second hook 721 is detachably disposed on the fifth connecting member 720 and is used for being hooked in the second hook slot 33 of the burn-in board 3, and the two handles 722 are respectively rotatably connected to two ends of the fifth connecting member 720; in use, the fifth connecting member 720 is horizontally disposed, a part of the two handles 722 respectively extend into a limiting space at two sides of the end of the third mounting frame 7, and the burn-in board 3 is pulled out when the two handles 722 are rotated outwards. In other implementations, the second hook 721 may be non-detachably fixed to the fifth connecting member 720, or integrally formed with the fifth connecting member 720, which is not limited in this application.

In the board card plugging mechanism of the semiconductor test equipment provided by the embodiment of the present application, the two handles 722 are respectively rotatably connected to the two ends of the fifth connecting member 720, the second hook 721 is engaged with the second hook slot 33 of the burn-in board 3, and the second hook 721 is installed on the fifth connecting member 720, meanwhile, a part of the two handles 722 is respectively extended into a limit space at both sides of the end of the third mounting bracket 7, and then the two handles 722 are simultaneously rotated outwards, under the limit of the limit space, the reverse thrust makes the handle 722 with the fifth connecting piece 720 move outwards, further, under the driving of the second hook 721, the burn-in board 3 is moved outward, so that the burn-in board 3 is pulled out, and compared with the direct manual insertion, the mode greatly reduces the acting force applied by the worker and reduces the labor amount of the worker; because the burn-in test boards are generally arranged vertically, and the space between two adjacent burn-in test boards is small, so that hands are not easy to hold, the plugging mechanism can be conveniently plugged, and the working efficiency is improved.

Referring to fig. 2, the third mounting frame 7 includes a large frame body 70 and at least two small frame bodies 71, the small frame bodies 71 are arranged in the large frame body 70 from top to bottom, the two side walls of the small frame bodies 71 are provided with third guide grooves 710, two ends of the burn-in test board 3 are respectively matched with the third guide grooves 710 on the two side walls of the small frame bodies 71 to realize sliding, and based on this, the limiting space is arranged on the large frame body 70. Be provided with support body gyro wheel 700 on two lateral walls of big support body 70, little support body 71 can bear on support body gyro wheel 700, with the help of support body gyro wheel 700, can conveniently carry out the dismouting to little support body 71, for the sliding mode, adopt roll connection, can reduce the frictional resistance between little support body 71 and the big support body 70.

Referring to fig. 2, in some preferred embodiments, a sixth connecting member 708 is disposed on each of two sides of an end portion of the third mounting frame 7, the sixth connecting member 708 is disposed vertically, and the sixth connecting member 708 is connected to the third mounting frame 7 through a plurality of second bearing portions 709, the second bearing portions 709 are arranged at intervals from top to bottom, or in other words, the sixth connecting member 708 is mounted on the large frame body 70; the space is formed between two adjacent second bearing parts 709, so that when in use, the part of the handle 722 in the space can be borne on the second bearing parts 709. When the handle 722 is rotated, the portion of the handle 722 located in the limiting space pushes the large frame 70, and since the large frame 70 does not move, the handle 722 drives the fifth connecting member 720 to move outwards, so as to pull the burn-in board 3 out.

In order to facilitate the butt joint with the second hook groove 33, the second hook 721 is detachably connected to the fifth connecting member 720, and specifically, the detachable connection may be implemented by using a bolt or the like.

In some preferred embodiments, the sixth connecting member 708 may have a long plate-like structure; in other preferred embodiments, referring to fig. 4, the sixth connecting member 708 has a U-shaped cross-section, and the openings of the sixth connecting member 708 at both sides of the end of the third mounting bracket 7 are oppositely disposed.

Referring to fig. 3 and 4, in some preferred embodiments, the handle 722 includes a first segment 7220, a second segment 7221, and a third segment 7222, wherein the first segment 7220 is coupled to one end of the second segment 7221 and is configured to extend into the retaining space, the third segment 7222 is coupled to the other end of the second segment 7221 and is configured to be held in the hand for rotational manipulation, and the second segment 7221 is rotatably coupled to the fifth coupling 720 near the end of the first segment 7220. When the wrist plugging device is used, the first segment 7220 extends into the limiting space and is borne on the second bearing part 709, and the plugging mechanism is prevented from being suspended during operation, so that the operation difficulty of an operator can be reduced, the operation is convenient, and the wrist strength is reduced.

Referring to fig. 4, in some preferred embodiments, the included angle between the first segment 7220 and the second segment 7221 is an obtuse angle, which can prevent the third segment 7222 from colliding with the sixth link 708 during rotation, and increase the rotation angle of the third segment 7222; the included angle between the third section 7222 and the second section 7221 is an obtuse angle, the straight line where the third section 7222 is located is intersected with the straight line where the first section 7220 is located, and the first section 7220 and the third section 7222 are located on two sides of the second section 7221, so that the situation that the third section 7222 is too close to each other is avoided, and the hand holding space of a worker is increased.

Referring to FIG. 3, in some preferred embodiments, third segment 7222 is provided with an anti-slip sleeve 7223 to facilitate gripping by a worker's hand.

Since the anti-slip sleeve 7223 is easily worn by hand, in some preferred embodiments, the anti-slip sleeve 7223 is detachably connected to the third segment 7222, such as by bolting, and when the anti-slip sleeve 7223 is worn, it can be removed to replace a new anti-slip sleeve 7223, thereby increasing the service life of the plugging mechanism and improving the experience.

Referring to fig. 3, in some preferred embodiments, the second hook 721 includes a hook base 7210 and a hook protrusion 7211 matched with the second hook groove 33, the hook base 7210 is connected to the fifth connector 720 by means of screws, bolts or the like, one end of the hook base 7210 protrudes upward to form the hook protrusion 7211, and the hook protrusion 7211 is detachably assembled in use, so that the hook protrusion 7211 is conveniently abutted to the second hook groove 33.

Referring to fig. 3, in some preferred embodiments, the hook base plate 7210 is further provided with a limiting protrusion 7212, the limiting protrusion 7212 and the hook protrusion 7211 are located on the same wall surface of the hook base plate 7210, and are spaced apart from each other, when the hook protrusion 7211 extends into the second hook groove 33, the limiting protrusion 7212 contacts with the sidewall of the burn-in board 3 or has a set distance, and the limiting protrusion 7212 is provided, so that the burn-in board 3 can be more stable and cannot shift during the pull-out process.

In order to adapt to the plugging and unplugging of the burn-in test boards with various length sizes, a plugging and unplugging mechanism with adjustable length needs to be provided, as shown in fig. 5, in some preferred embodiments, the fifth connecting member 720 includes a main rod 7200 and two adjusting rods 7201, the second snap 721 is arranged on the main rod 7200, one end of each of the two adjusting rods 7201 is rotatably connected with a handle 722, the other end of each of the two adjusting rods 7201 is movably arranged at two ends of the main rod 7200, and the relative positions of the main rod 7200 and the adjusting rods 7201 are adjusted along the length direction of the main rod 7200, so that the length of the fifth connecting member 720 can be adjusted.

The length is adjustable, and the device has multiple modes:

for example, one of the main rod 7200 and the adjustment rod 7201 may be provided with a first bar-shaped hole 7202, the other may be provided with a second bar-shaped hole 7203, the length extension directions of the first and

second holes

7202 and 7203 are both the length direction of the main rod 7200, the main rod 7200 and the adjustment rod 7201 may be movably connected by a fastening member 7204 screwed to the first and

second holes

7202 and 7203, and the fastening member 7204 may be a bolt and nut combination.

For another example, one of the main rod 7200 and the adjustment rod 7201 has an end surface that is recessed to form an accommodation space, and the other is inserted into the accommodation space, and a fastening member 7204 is inserted into the accommodation space to abut against a member in the accommodation space, thereby achieving fastening.

In the description of the present application, it should be noted that the terms "upper", "lower", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, which are only for convenience in describing the present application and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and operate, and thus, should not be construed as limiting the present application. Unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are intended to be inclusive and mean, for example, that they may be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present application can be understood by those of ordinary skill in the art as appropriate.

It is noted that, in the present application, relational terms such as "first" and "second", and the like, are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.

The above description is merely exemplary of the present application and is presented to enable those skilled in the art to understand and practice the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A board card plugging mechanism of semiconductor testing equipment is characterized in that an aging test board (3) is horizontally arranged and movably assembled on a third mounting rack (7), a plurality of limiting spaces are sequentially arranged on two sides of the end part of the third mounting rack (7) from top to bottom at intervals, and two ends of the aging test board (3) correspond to the limiting spaces respectively;

characterized in that it comprises a second plugging tool (72), said second plugging tool (72) comprising:

a fifth link (720);

the second clamping hook (721) is arranged on the fifth connecting piece (720) and is used for being clamped in a second clamping hook groove (33) on the aging test board (3);

and two handles (722) rotatably connected to both ends of the fifth link (720), respectively.

2. A board card inserting and extracting mechanism of a semiconductor test apparatus as claimed in claim 1, characterized in that:

two sides of the end part of the third mounting rack (7) are respectively provided with a sixth connecting piece (708), the sixth connecting pieces (708) are vertically arranged, the sixth connecting pieces (708) are connected to the third mounting rack (7) through a plurality of second bearing parts (709), and the second bearing parts (709) are arranged at intervals from top to bottom;

the limiting space is formed between the two second bearing parts (709) which are adjacent up and down, and when the handle (722) is used, the handle is borne on the second bearing parts (709).

3. A board card inserting and extracting mechanism of a semiconductor test apparatus as claimed in claim 1, characterized in that: the handle (722) comprises a first section (7220), a second section (7221) and a third section (7222), wherein the first section (7220) is connected to one end of the second section (7221) and used for extending into the limiting space, the third section (7222) is connected to the other end of the second section (7221) and used for holding, and one end of the second section (7221) close to the first section (7220) is rotatably connected to the fifth connecting piece (720).

4. A board card inserting and extracting mechanism of a semiconductor test apparatus as claimed in claim 3, characterized in that: the included angle between the first section (7220) and the second section (7221) is an obtuse angle, the included angle between the third section (7222) and the second section (7221) is an obtuse angle, the straight line where the third section (7222) is located intersects the straight line where the first section (7220) is located, and the first section (7220) and the third section (7222) are located on two sides of the second section (7221).

5. A board card inserting and extracting mechanism of a semiconductor test apparatus as claimed in claim 3, characterized in that: an anti-slip sleeve (7223) is arranged on the third section (7222).

6. A board card plugging mechanism of semiconductor test equipment according to claim 5, characterized in that: the anti-slip sleeve (7223) is removably attached to the third section (7222).

7. A board card inserting and extracting mechanism of a semiconductor test apparatus as claimed in claim 1, characterized in that: the second trip (721) includes trip bottom plate (7210) and trip convex part (7211) with second trip groove (33) looks adaptation, trip bottom plate (7210) with fifth connecting piece (720) are connected, just the one end of trip bottom plate (7210) is upwards protruding to be established and is formed trip convex part (7211).

8. A board card inserting and extracting mechanism of a semiconductor test apparatus as claimed in claim 7, wherein: still be provided with spacing convex part (7212) on trip bottom plate (7210), spacing convex part (7212) with trip convex part (7211) are located on the same wall of trip bottom plate (7210), and the interval sets up, when trip convex part (7211) stretch into second trip groove (33), spacing convex part (7212) perhaps have the settlement interval with the lateral wall contact of ageing testing board (3).

9. A board card inserting and extracting mechanism of a semiconductor test apparatus as claimed in claim 1, characterized in that: the fifth connecting piece (720) comprises a main rod (7200) and two adjusting rods (7201), the second clamping hook (721) is arranged on the main rod (7200), one ends of the two adjusting rods (7201) are respectively and rotatably connected with a handle (722), and the other ends of the two adjusting rods are respectively and movably arranged at two ends of the main rod (7200) so as to adjust the length of the fifth connecting piece (720).

10. A board card inserting and extracting mechanism of a semiconductor test apparatus as claimed in claim 9, wherein: the novel adjustable solar energy water heater is characterized in that one of the main rod (7200) and the adjusting rod (7201) is provided with a first strip-shaped hole (7202), the other one of the main rod and the adjusting rod is provided with a second strip-shaped hole (7203), and the main rod (7200) and the adjusting rod (7201) are movably connected through a fastener (7204) screwed on the first hole (7202) and the second hole (7203).