CN217655152U - Tester for transient voltage suppressor - Google Patents

Tester for transient voltage suppressor Download PDF

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Publication number
CN217655152U
CN217655152U CN202123400733.9U CN202123400733U CN217655152U CN 217655152 U CN217655152 U CN 217655152U CN 202123400733 U CN202123400733 U CN 202123400733U CN 217655152 U CN217655152 U CN 217655152U
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CN
China
Prior art keywords
disc
lead screw
tester
transient voltage
strip
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Active
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CN202123400733.9U
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Chinese (zh)
Inventor
田伟
廖兵
黄松
何丽江
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Suzhou Dajing Semiconductor Co ltd
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Suzhou Dajing Semiconductor Co ltd
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Abstract

The utility model discloses a transient voltage suppressor tester, one rotationally installs the gear with tooth's socket engagement in its disc outside, set up the bar groove that a plurality of and mount pad correspond on the disc upper surface, the lead screw of an edge disc radial extension is installed to every bar inslot internal rotation, the one end and the rotation of bar groove one end inner wall of lead screw are connected, the other end of lead screw is outwards stretched out on the periphery of disc, it has a sliding block to overlap to be located bar inslot thread on the lead screw, the mount pad is installed correspondingly on the sliding block, on the base plate and lie in support one side and install a support frame, the upper end of support frame extends to the disc top and install one be used for with the device under test on wait to measure point complex laser lamp, the laser lamp is located the detection instrument and has placed between the mount pad of device under test. The utility model discloses can also carry out preconditioning to the position that the device to be tested placed, further improve the precision of test.

Description

Tester for transient voltage suppressor
Technical Field
The utility model relates to a semiconductor device tests technical field, especially relates to a tester for transient voltage suppressor.
Background
The digital four-probe tester is a special instrument for testing resistivity and sheet resistance of semiconductor material, and is composed of main machine, test table, four-probe and computer, etc. its measured data can be directly displayed by main machine, or can be controlled by computer to test and collect the tested data, then the tested data can be analyzed in computer, and the tested result can be statistically analyzed and displayed in the form of table and graph, and the four-probe tester is a test instrument for testing resistivity of single crystal section and epidermis in the course of producing semiconductor single crystal.
However, in the existing testing method, the testing point is changed by moving the single crystal segment, and in the moving process, the testing precision is difficult to ensure, so that the testing effect is poor.
Disclosure of Invention
The utility model aims at providing a transient voltage is tester for suppressor, this transient voltage is tester for suppressor can also carry out the preconditioning to the position that the device to be tested was placed when realizing carrying out the fine setting to the position of mount pad, has further improved the precision of test.
In order to achieve the purpose, the utility model adopts the technical proposal that: a tester for a transient voltage suppressor, comprising: the disc type laser detector comprises a substrate, a disc and a detector, wherein the disc is rotatably arranged above the substrate, the detector is arranged right above the disc, the bottom of a support is arranged on the substrate and is positioned outside the disc, the upper part of the support extends to the upper part of the disc and is provided with the detector, a plurality of mounting seats are arranged on the disc at intervals along the circumferential direction, tooth grooves distributed along the whole circumferential direction are formed in the lower part of the outer circumferential surface of the disc, and a gear meshed with the tooth grooves is rotatably arranged outside the disc;
the device comprises a base plate, a disc, a plurality of mounting seats, a plurality of strip-shaped grooves, a lead screw, a sliding block, a support frame, a laser lamp and a detection instrument, wherein the strip-shaped grooves corresponding to the mounting seats are formed in the upper surface of the disc, the lead screw radially extends along the disc is rotatably mounted in each strip-shaped groove, one end of the lead screw is rotatably connected with the inner wall of one end of each strip-shaped groove, the other end of the lead screw extends outwards from the circumferential surface of the disc, the sliding block is sleeved in the strip-shaped groove and is positioned on the lead screw, the mounting seats are correspondingly mounted on the sliding block, the support frame is mounted on one side, positioned on the base plate, of the support frame, the upper end of the support frame extends to the upper side of the disc and is provided with the laser lamp matched with a point to be detected on the device to be detected, and the laser lamp is positioned between the detection instrument and the mounting seats on which the device to be detected is placed.
The further improved scheme in the technical scheme is as follows:
1. in the scheme, the screw rod is rotatably connected with the disc through the bearing.
2. In the above scheme, the strip-shaped grooves are distributed along the radial direction of the disc.
3. In the above scheme, a detector electrically connected with the detector is arranged below the substrate.
4. In the above scheme, the lower end of a rotating shaft is rotatably mounted on the base plate through a bearing, and the upper end of the rotating shaft is fixedly connected with the lower surface of the disc.
Because of above-mentioned technical scheme's application, compared with the prior art, the utility model have the following advantage:
the utility model discloses tester for transient voltage suppressor, set up a plurality of bar groove that corresponds with the mount pad on its disc upper surface, every bar inslot internal rotation is installed a lead screw that extends along disc radial direction, the one end of lead screw is connected with bar groove one end inner wall rotation, the other end of lead screw stretches out from the periphery of disc outwards, the threaded sleeve is equipped with a sliding block on the lead screw and in the bar inslot, the mount pad is installed on the sliding block correspondingly, can be after the mount pad rotates to the detection instrument below along with the disc, finely tune the position of mount pad through rotatory lead screw and make the device under test who clamps in the mount pad be located the detection instrument under, thereby improve the precision and the accuracy of test; furthermore, a support frame is arranged on the substrate and located on one side of the support frame, the upper end of the support frame extends to the upper portion of the disc and is provided with a laser lamp used for being matched with a point to be tested on a device to be tested, the laser lamp is located between the detecting instrument and an installation seat for placing the device to be tested, the position of the installation seat for placing the device to be tested in the radial direction of the disc can be preset through the matching of the laser lamp and a sliding block, the device to be tested is moved to the lower portion of the detecting instrument to be tested through rotating the disc, and the testing precision is further improved.
Drawings
FIG. 1 is a schematic view of the overall structure of the present invention;
FIG. 2 is a cross-sectional view of the present invention;
fig. 3 is a sectional view of the present invention.
In the drawings above: 1. a substrate; 2. a disc; 3. a detector; 4. a support; 5. a mounting base; 6. a gear; 7. a strip-shaped groove; 8. a screw rod; 9. a slider; 10. a support frame; 11. a laser light; 12. a detector; 13. a rotating shaft.
Detailed Description
In the description of this patent, it is noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, merely for convenience of description and simplification of description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore should not be construed as limiting the invention; the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance; furthermore, unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, as they may be fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The meaning of the above terms in this patent may be understood in a concrete sense to those of ordinary skill in the art.
The invention will be further described with reference to the following examples:
example 1: a transient voltage suppressor tester, comprising: the detection device comprises a base plate 1, a disc 2 and a detection instrument 3, wherein the disc 2 is rotatably arranged above the base plate 1, the detection instrument 3 is arranged right above the disc 2, the bottom of a support 4 is arranged on the base plate 1 and positioned on the outer side of the disc 2, the upper part of the support 4 extends to the upper part of the disc 2 and is provided with the detection instrument 3, a plurality of mounting seats 5 are arranged on the disc 2 at intervals along the circumferential direction, tooth grooves distributed along the whole circumferential direction are formed in the lower part of the outer circumferential surface of the disc 2, and a gear 6 meshed with the tooth grooves is rotatably arranged on the outer side of the disc 2;
the testing device comprises a disc 2 and is characterized in that the upper surface of the disc 2 is provided with a plurality of strip-shaped grooves 7 corresponding to a mounting seat 5, a lead screw 8 extending along the radial direction of the disc 2 is rotatably mounted in each strip-shaped groove 7, one end of the lead screw 8 is rotatably connected with the inner wall of one end of each strip-shaped groove 7, the other end of the lead screw 8 extends outwards from the circumferential surface of the disc 2, a sliding block 9 is sleeved in the strip-shaped groove 7 on the lead screw 8 and is positioned in the sliding block 9, the mounting seat 5 is correspondingly mounted on the sliding block 9, a support frame 10 is mounted on the substrate 1 and is positioned on one side of a support 4, the upper end of the support frame 10 extends to the upper side of the disc 2 and is provided with a laser lamp 11 matched with a point to be tested on a device to be tested, the laser lamp 11 is positioned between the detecting instrument 3 and the mounting seat 5 on which the device to be tested is placed, the point detecting instrument irradiated by the laser lamp is a point detecting instrument, the position of the semiconductor device can be pre-adjusted on the outside, and the next testing efficiency is improved.
The screw rod 8 is rotatably connected with the disc 2 through a bearing.
The grooves 7 are distributed in the radial direction of the disc 2.
A detector 12 electrically connected to the detector 3 is provided below the substrate 1.
Example 2: a tester for a transient voltage suppressor, comprising: the detection device comprises a base plate 1, a disc 2 and a detection instrument 3, wherein the disc 2 is rotatably arranged above the base plate 1, the detection instrument 3 is arranged right above the disc 2, the bottom of a support 4 is arranged on the base plate 1 and positioned on the outer side of the disc 2, the upper part of the support 4 extends to the upper part of the disc 2 and is provided with the detection instrument 3, a plurality of mounting seats 5 are arranged on the disc 2 at intervals along the circumferential direction, tooth grooves distributed along the whole circumferential direction are formed in the lower part of the outer circumferential surface of the disc 2, and a gear 6 meshed with the tooth grooves is rotatably arranged on the outer side of the disc 2;
the testing device comprises a disc 2 and is characterized in that the upper surface of the disc 2 is provided with a plurality of strip-shaped grooves 7 corresponding to a mounting seat 5, a lead screw 8 extending along the radial direction of the disc 2 is rotatably mounted in each strip-shaped groove 7, one end of the lead screw 8 is rotatably connected with the inner wall of one end of each strip-shaped groove 7, the other end of the lead screw 8 extends outwards from the circumferential surface of the disc 2, a sliding block 9 is sleeved in the strip-shaped groove 7 on the lead screw 8 and is positioned in the sliding block 9, the mounting seat 5 is correspondingly mounted on the sliding block 9, a support frame 10 is mounted on the substrate 1 and is positioned on one side of a support 4, the upper end of the support frame 10 extends to the upper side of the disc 2 and is provided with a laser lamp 11 matched with a point to be tested on a device to be tested, the laser lamp 11 is positioned between the detecting instrument 3 and the mounting seat 5 on which the device to be tested is placed, the point detecting instrument irradiated by the laser lamp is a point detecting instrument, the position of the semiconductor device can be pre-adjusted on the outside, and the next testing efficiency is improved.
The screw rod 8 is rotatably connected with the disc 2 through a bearing.
A rotating shaft 13 is rotatably mounted at a lower end thereof to the base plate 1 through a bearing, and an upper end of the rotating shaft 13 is fixedly connected to a lower surface of the disc 2.
When the tester for the transient voltage suppressor is adopted, the tester can drive the base on the sliding block to move by rotating the screw rod, the base is adjusted to be below the detecting instrument, then the gear on the fixed shaft is rotated to drive the disc to rotate, and the semiconductor device can be more accurately moved to be below the detecting instrument, so that the following test is facilitated.
The disc is provided with a plurality of mounting seats at intervals along the circumferential direction, the lower part of the outer circumferential surface of the disc is provided with tooth grooves distributed along the full circumferential direction, the outer side of the disc is rotatably provided with a gear meshed with the tooth grooves, the upper surface of the disc is provided with a plurality of strip-shaped grooves corresponding to the mounting seats, each strip-shaped groove is rotatably provided with a lead screw extending along the radial direction of the disc, one end of each lead screw is rotatably connected with the inner wall of one end of each strip-shaped groove, the other end of each lead screw extends outwards from the circumferential surface of the disc, a sliding block is sleeved on the lead screw and positioned in each strip-shaped groove through a thread, the mounting seats are correspondingly arranged on the sliding blocks, and after the mounting seats rotate to the lower part of the detecting instrument along with the disc, the positions of the mounting seats are finely adjusted through rotating the lead screws, so that devices to be tested and clamped in the mounting seats are positioned under the detecting instrument, and the accuracy and the test are improved;
furthermore, a support frame is arranged on the substrate and located on one side of the support frame, the upper end of the support frame extends to the upper portion of the disc and is provided with a laser lamp used for being matched with a point to be tested on a device to be tested, the laser lamp is located between the detecting instrument and an installation seat for placing the device to be tested, the position of the installation seat for placing the device to be tested in the radial direction of the disc can be preset through the matching of the laser lamp and a sliding block, the device to be tested is moved to the lower portion of the detecting instrument to be tested through rotating the disc, and the testing precision is further improved.
The above embodiments are only for illustrating the technical concept and features of the present invention, and the purpose of the embodiments is to enable those skilled in the art to understand the contents of the present invention and implement the present invention, which cannot limit the protection scope of the present invention. All equivalent changes and modifications made according to the spirit of the present invention should be covered by the protection scope of the present invention.

Claims (5)

1. A transient voltage suppressor tester, comprising: base plate (1), rotationally install disc (2) in base plate (1) top and set up detecting instrument (3) directly over disc (2), the bottom of a support (4) is installed on base plate (1) and is located the disc (2) outside, the upper portion of support (4) extends to disc (2) top and installs detecting instrument (3), its characterized in that: a plurality of mounting seats (5) are arranged on the disc (2) at intervals along the circumferential direction, tooth grooves distributed along the circumferential direction are formed in the lower portion of the outer circumferential surface of the disc (2), and a gear (6) meshed with the tooth grooves is rotatably mounted on the outer side of the disc (2);
the detection device is characterized in that a plurality of strip-shaped grooves (7) corresponding to the mounting seats (5) are formed in the upper surface of the disc (2), a lead screw (8) extending along the disc (2) in the radial direction is rotatably mounted in each strip-shaped groove (7), one end of each lead screw (8) is rotatably connected with the inner wall of one end of each strip-shaped groove (7), the other end of each lead screw (8) extends outwards from the circumferential surface of the disc (2), a sliding block (9) is sleeved on the lead screw (8) and located in the corresponding strip-shaped groove (7) in a threaded manner, the mounting seats (5) are correspondingly mounted on the sliding blocks (9), a support frame (10) is mounted on the base plate (1) and located on one side of the support (4), the upper end of the support frame (10) extends to the upper side of the disc (2) and is provided with a laser lamp (11) matched with a detection point on a device to be detected, and the laser lamp (11) is located between the detection instrument (3) and the mounting seat (5) on which the device to be detected.
2. The transient voltage suppressor tester as set forth in claim 1, wherein: the screw rod (8) is rotatably connected with the disc (2) through a bearing.
3. The transient voltage suppressor tester as set forth in claim 1, wherein: the strip-shaped grooves (7) are distributed along the radial direction of the disc (2).
4. The transient voltage suppressor tester as set forth in claim 1, wherein: and a detector (12) electrically connected with the detector (3) is arranged below the substrate (1).
5. The transient voltage suppressor tester as recited in claim 1, further comprising: the lower end of a rotating shaft (13) is rotatably arranged on the base plate (1) through a bearing, and the upper end of the rotating shaft (13) is fixedly connected with the lower surface of the disc (2).
CN202123400733.9U 2021-12-30 2021-12-30 Tester for transient voltage suppressor Active CN217655152U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202123400733.9U CN217655152U (en) 2021-12-30 2021-12-30 Tester for transient voltage suppressor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202123400733.9U CN217655152U (en) 2021-12-30 2021-12-30 Tester for transient voltage suppressor

Publications (1)

Publication Number Publication Date
CN217655152U true CN217655152U (en) 2022-10-25

Family

ID=83660873

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202123400733.9U Active CN217655152U (en) 2021-12-30 2021-12-30 Tester for transient voltage suppressor

Country Status (1)

Country Link
CN (1) CN217655152U (en)

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