CN217639387U

CN217639387U - Test system

Info

Publication number: CN217639387U
Application number: CN202220698595.2U
Authority: CN
Inventors: 廖光泽; 徐虎
Original assignee: Xuzhou Xinsijie Semiconductor Technology Co ltd
Current assignee: Xuzhou Xinsijie Semiconductor Technology Co ltd
Priority date: 2022-03-28
Filing date: 2022-03-28
Publication date: 2022-10-21
Anticipated expiration: 2032-03-28

Abstract

The application relates to the technical field of chip testing, and particularly discloses a testing system which comprises a testing box and a performance parameter detection device, wherein the testing box comprises a performance module, a channel module, a power supply module and a connection module, the performance module comprises a performance testing circuit and a performance switch, the channel module comprises a connection channel and a connection hole, the connection channel is connected with the performance module in series, and the connection channel is connected with a to-be-tested part; the test box is connected with a power supply, and the power supply module comprises a first power supply port and a second power supply port; the connection module comprises an input port and an output port, and the performance parameter detection device is connected with the performance module. The performance switch is selectively communicated with one performance testing circuit to realize chip performance detection, the performance parameter detection device displays performance testing parameters or performance testing charts and the like, the performance switch is controlled to be communicated with the other performance testing circuit to conveniently and quickly test the other performance of the chip, the testing efficiency is improved, and the operation of technicians is facilitated.

Description

Test system

Technical Field

The application generally relates to the technical field of chip testing, and particularly discloses a testing system.

Background

The quality and reliability determine the life of the chip product to some extent, and in order to ensure the reliability of the chip product, the chip needs to be tested by performance tests after the chip is manufactured. The existing test system usually adopts single-channel performance test when the chip performs performance test, and requires technical personnel to perform circuit connection again when the multiple performances of the chip are required to be tested, so that the test efficiency is low.

SUMMERY OF THE UTILITY MODEL

The application aims to provide a test system which can improve the chip test efficiency.

In order to realize the purpose of the utility model, the following technical scheme is adopted in the application:

in a first aspect, a test system is provided, which includes a test box and a performance parameter detection device, where the performance parameter detection device is used to detect a performance parameter of a piece to be tested, and the test box includes:

the performance module comprises at least two performance test circuits and a performance switch which are arranged in the test box, wherein the performance switch is selectively communicated with one of the performance test circuits;

the channel module comprises a connecting channel arranged in the test box and a connecting hole formed in the test box, the connecting channel is connected with the performance module in series, and the connecting channel is connected with the to-be-tested piece through the connecting hole;

the test box is connected with a power supply through the power supply module, and the power supply module comprises a first power supply port and a second power supply port which are arranged on the test box; and

and the connecting module comprises an input port and an output port which are arranged on the test box, and the performance parameter detection device is connected with the performance module through the input port and the output port.

According to an embodiment of the application, the test board further comprises a test board connected with the connecting hole, and the test piece to be tested is detachably arranged on the test board.

According to an embodiment of the application, wherein be provided with the plug connector on the test plug board, the plug connector with the cooperation is pegged graft to the connecting hole.

According to an embodiment of the application, the test box further comprises a temperature change box, and the temperature change box is used for covering the test box.

According to an embodiment of the application, the temperature change box is provided with a visualization window.

According to an embodiment of the application, the performance parameter detecting device comprises a graphic instrument, the input port comprises a first input port, the output port comprises a first output port, and the test box is connected with the graphic instrument through the first input port and the first output port.

According to an embodiment of the application, the performance parameter detecting device includes a pico-meter, the input port includes a second input port, the output port includes a second output port, and the test box is connected to the pico-meter through the second input port and the second output port.

According to an embodiment of the application, wherein the channel module further comprises a channel switch communicated with the connecting channel, a channel button is arranged on the test box, and the on-off button is connected with the channel switch.

According to an embodiment of the present application, a reset switch is connected in series to the channel switch.

According to an embodiment of the present application, an indicator is connected to the channel module.

According to the test system disclosed by the embodiment of the application, the test system comprises a test box and a performance parameter detection device, wherein the performance parameter detection device is used for detecting the performance parameters of a piece to be tested, the test box comprises a performance module, a channel module, a power supply module and a connection module, the performance module comprises at least two performance test circuits and a performance switch which are arranged in the test box, and the performance switch can be selectively communicated with one of the performance test circuits; the channel module comprises a connecting channel arranged in the test box and a connecting hole formed in the test box, the connecting channel is connected with the performance module in series, and the connecting channel is connected with the to-be-tested piece through the connecting hole; the test box is connected with a power supply through the power supply module, and the power supply module comprises a first power supply port and a second power supply port which are arranged on the test box; the connection module comprises an input port and an output port which are arranged on the test box, and the performance parameter detection device is connected with the performance module through the input port and the output port. The performance testing device comprises a power supply, a channel module, a performance testing circuit and a performance testing circuit, wherein the channel module is used for connecting a piece to be tested with the performance module, the performance testing circuit is used for detecting the performance of the piece to be tested, and the performance testing circuit is used for displaying the performance testing parameters or the performance testing chart of the piece to be tested. A technician can conveniently and quickly test the other performance of the piece to be tested by controlling the performance switch to be communicated with the other performance testing circuit, so that the testing efficiency is improved, and the operation of the technician is facilitated.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and together with the description, serve to explain the principles of the invention.

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the technical solutions in the prior art will be briefly described below, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.

FIG. 1 is a schematic diagram illustrating an overall configuration of a test system according to an exemplary embodiment.

Fig. 2 is a schematic structural diagram (one) of a test cartridge in a test system according to an exemplary embodiment.

Fig. 3 is a schematic structural diagram (ii) of a test cartridge in a test system according to an exemplary embodiment.

Fig. 4 is a schematic structural diagram (iii) of a test cartridge in a test system according to an exemplary embodiment.

Wherein the reference numerals are as follows:

1. a test cartridge; 2. a performance switch; 3. connecting holes; 4. a power supply first port; 5. a power supply second port; 6. a first input port; 7. a first output port; 8. a second input port; 9. a second output port; 10. a third input port; 11. a third output port; 12. a marking section; 13. a switch master button; 14. a power source; 15. a skin safety watch; 16. the instrument is shown in the figure.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

It is noted that in the description and claims of the present application and in the above-mentioned drawings, relational terms such as "first" and "second", and the like, are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the application described herein are, for example, capable of operation in sequences other than those illustrated or otherwise described herein.

Also, the terms "comprises," "comprising," and "having," as well as any variations thereof or any other variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements explicitly listed, but may include other steps or elements not explicitly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising a … …" does not exclude the presence of another identical element in a process, method, article, or apparatus that comprises the element.

For ease of description, spatially relative terms such as "over … …", "over … …", "over … …", "over", etc. may be used herein to describe the spatial positional relationship of one device or feature to another device or feature as shown in the figures. It will be understood that the spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. For example, if a device in the figures is turned over, devices described as "above" or "on" other devices or configurations would then be oriented "below" or "under" the other devices or configurations. Thus, the exemplary term "above … …" may include both orientations of "above … …" and "below … …". The device may be otherwise variously oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.

Referring to fig. 1 to 4, an embodiment of the present disclosure provides a test system, which includes a test box 1 and a performance parameter detection apparatus, where the performance parameter detection apparatus is configured to detect a performance parameter of a to-be-tested piece, and the test box 1 includes a performance module, a channel module, a power module, and a connection module. The performance module comprises at least two performance test circuits and a performance switch 2, wherein the performance test circuits and the performance switch 2 are arranged in the test box 1, and the performance switch 2 can be selectively communicated with one of the performance test circuits; the channel module comprises a connecting channel arranged in the test box 1 and a connecting hole 3 arranged on the test box 1, the connecting channel is connected with the performance module in series, and the connecting channel is connected with a to-be-tested piece through the connecting hole 3; the test box 1 is connected with a power supply 14 through a power supply module, and the power supply module comprises a power supply first port 4 and a power supply second port 5 which are arranged on the test box 1; the connecting module comprises an input port and an output port which are arranged on the test box 1, and the performance parameter detection device is connected with the performance module through the input port and the output port.

In the actual use process, the power supply 14 provides an electric signal to the test box 1, the channel module connects the piece to be tested with the performance module, the performance test circuit in the performance module is selected to realize the performance test of the piece to be tested, and the performance test parameters or the performance test chart of the piece to be tested are displayed through the performance parameter detection device. The technical personnel can conveniently and quickly test another performance of the piece to be tested by controlling the performance switch 2 to be communicated with another performance testing circuit, so that the testing efficiency is improved, and the operation of the technical personnel is facilitated.

In the embodiment of the disclosure, the device to be tested is a chip, so the test system is used for testing various performance parameters of the chip. Specifically, the specific type of the chip is not limited in this embodiment, and a person skilled in the art can change the connection mode with the connection hole 3 according to different types of chips, so that various types of chips can be stably electrically connected with the connection hole 3, so as to implement the test system to test the performance of the chip.

In an optional embodiment, the performance switch 2 comprises a neutral, and in a state that the performance switch 2 is in the neutral, the performance switch 2 is disconnected from each performance test line. The tester can switch the performance switch 2 to the neutral position when not beginning to test for the circuit disconnection of performance module, thereby ensure the circuit security of performance module. When the test is needed, the safety in the test process is ensured at the connection position of the switching performance switch 2.

Referring to fig. 1-4, in a specific embodiment, the test system further comprises a test socket for connecting with the connection hole 3, and the to-be-tested member is detachably disposed on the test socket. The test board is arranged to prevent the part to be tested from being directly connected with the test box 1, so that the service life of the connecting hole 3 is influenced or the part to be tested is damaged in the connecting process. Optionally, the to-be-tested piece is in plug-in or clamping fit with the test plug board so as to detachably arrange the chip on the test plug board.

In an optional embodiment, the test board is provided with a plug connector, the plug connector is in plug fit with the connecting hole 3, and the test board can be electrically connected with the connecting channel by inserting the plug connector into the connecting hole 3. Meanwhile, the operation of a user is facilitated through the plug-in connection mode.

In a specific embodiment, the test system further comprises a temperature-variable box for housing the test cartridge 1. The temperature change box is covered on the periphery of the test box 1, so that the environmental temperature of the test box 1 and the chip under the test condition can be controlled, the chip can be subjected to omnibearing performance detection, and the reliability of the chip in actual use can be ensured. Optionally, the temperature change box comprises a high temperature box, a low temperature box or a high and low temperature box, and a person skilled in the art can select an appropriate temperature change box for experimental connection according to actual test requirements of different chips.

In an optional embodiment, a visualization window is arranged on the temperature change box. Through the arrangement of the visual window, technicians can conveniently observe through the visual window during testing, and the safety in the testing process is guaranteed.

Referring to fig. 1-4, in a specific embodiment, the performance parameter detecting apparatus includes a pico-meter 15, the input port includes a second input port 8, the output port includes a second output port 9, and the test box 1 is connected to the pico-meter 15 through the second input port 8 and the second output port 9; and detecting the dark current parameter of the chip through a pico-ampere meter 15 after the power-on connection.

In an optional embodiment, when the chip is subjected to the dark current test, the temperature change box may be further disposed outside the test box 1, so that the performance test of the chip on the high-temperature dark current can be realized.

In a specific embodiment, the performance parameter detecting device comprises a graphic instrument 16, the input port comprises a first input port 6, the output port comprises a first output port 7, and the test box 1 is connected with the graphic instrument 16 through the first input port 6 and the first output port 7. The connection through the graphic display 16 can display the chart type performance parameters of the chip test. As an example, when the chip reverse breakdown voltage as well as the forward voltage are detected, i.e. connected by the graphic instrument 16 to display the performance parameters. However, when the two performance parameters are tested, although the performance parameters are displayed by connecting the graphic display instrument 16, the specific connection mode in the testing process is different.

Therefore, in actual use, two graphic instruments 16 may be provided, one of the graphic instruments 16 is used for testing the forward voltage, and the other graphic instrument 16 is used for testing the reverse breakdown voltage, so that one of the graphic instruments 16 is connected to the test box 1 through the first input port 6 and the first output port 7. The test box 1 is provided with a third input port 10 and a third output port 11, and the test box 1 is connected with another graphic instrument 16 through the third test port and the third output port 11.

To sum up, when the test box 1 needs to test two performances of the chip, the performance module can only have one, and the two performance test circuits are all connected with a performance parameter detection device, and the tester controls the communication position of the performance switch 2 to switch the performance test type of the chip, so as to facilitate the operation of the user.

When the test box 1 needs to test a plurality of performances of the chip, for example, when the chip needs to test the forward voltage, the dark current and the reverse breakdown voltage, two performance modules are arranged, the two performance modules are arranged in parallel, and the test system further comprises a change-over switch which can be selectively communicated with any one of the two performance modules; therefore, in actual test, a technician firstly controls the connection position of the selector switch and then controls the connection position of the performance switch 2, so that the whole circuit can be connected, and a chip is tested.

As an example, the test box 1 in the embodiment of the present disclosure may test the aforementioned three performances of the chip, so that two performance modules are provided, and the two performance modules are selectively communicated through the switch. One of the performance modules comprises two performance test circuits, wherein one performance test circuit is used for testing forward voltage, and the other performance test circuit is used for testing reverse breakdown voltage. The other performance module also comprises two performance test circuits, one performance test circuit in the other performance module is connected with the previous performance module in series, and the other performance test circuit is used for testing dark current. Therefore, when the forward voltage drop or the reverse breakdown voltage needs to be tested, a technician needs to firstly control the connection mode of the change-over switch and then control the connection mode of the performance switch 2. It should be noted that, the specific connection manner in this embodiment is only an exemplary description, and in practical use, a person skilled in the art may perform the connection according to actual requirements. For example, when three performances are tested, only one performance module can be arranged, the performance module comprises three performance test circuits, and the performance function switch can be selectively communicated with one of the performance test circuits at the moment to realize the test of the three performances.

Referring to fig. 1-4, in a specific embodiment, two or more channel modules may be provided, each channel module is arranged in an array, each channel module has a channel switch connected to the power supply 14 and normally open contacts connected to two ends of the channel switch in parallel, the normally open contacts of each channel module are connected in series in the previous channel module, and the normally open contacts are connected in series, and the channel modules are interlocked through the arrangement of the normally open contacts and the normally closed contacts. Before testing, each normally closed contact is closed, and each normally open contact is opened, so that the testing safety is ensured, and the disorder of the testing result is avoided.

In an optional embodiment, the box body is provided with channel buttons, the number of the channel buttons and the number of the channel switches are arranged in a one-to-one correspondence manner, and each channel button is connected with each channel switch; technicians can realize on-off control of the control channel switch by pressing the channel button.

In one embodiment, the control box further comprises a reset switch connected in series with the channel switch, in order to test a connection channel after testing the other connection channel. When the channel switch is provided in plurality, the reset switch is also provided in plurality. The reset switch is a normally closed switch, and is disconnected after being pressed, all the connecting channels are disconnected, and then the test can be restarted.

In an alternative embodiment, a plurality of marking portions 12 are arranged on the control box, each marking portion 12 is arranged corresponding to each connecting hole 3, and the structure of each marking portion 12 is different. Different connecting holes 3 are marked through the arrangement of the marking part 12, so that the test data of a technician can be recorded conveniently. The marking part 12 may be arabic numerals, roman numerals, english letters, or the like. As an example, the marking part 12 in the present embodiment adopts a labeling manner of marking the plurality of connection holes 3 with different arabic numerals, thereby facilitating the distinction of the respective connection holes 3.

Referring to fig. 1 to 4, in a specific embodiment, each channel module is connected to an indicator in parallel, and a tester can determine the access state of the current channel module through the indicator, so as to facilitate testing and recording. The indicator may be an indicator light, a cue generator, a display screen, or the like. In this embodiment, in order to reduce the cost and facilitate observation, the indicator is an indicator lamp, and when the channel module is connected to the circuit, the indicator lamp on the channel module emits light. Meanwhile, the tester can judge that the circuit has faults by simultaneously emitting light through 2 or more indicator lamps. In addition, the indicator light and the channel button may be integrated, such as a lighted button. And, be provided with the reset button that is connected with reset switch on the control box, reset button also can join in marriage reset pilot lamp as required.

In a specific embodiment, a switch master button 13 is arranged on the control box, and the switch master button 13 is used for controlling the on-off of the bus lines of the test module and the channel module in the control box. The switch master button 13 is connected with the test module in series, the setting of the switch master button 13 is performed before the test is started and after the test is finished, a technician can realize the connection and disconnection of the circuit master switch by pressing the switch master button 13, and the test safety can be guaranteed.

The previous description is only an example of the present application, and is provided to enable any person skilled in the art to understand or implement the present application. Various modifications and alterations to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the application. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present application shall be included in the protection scope of the present application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A test system comprising a test cartridge and a performance parameter detection device for detecting a performance parameter of a piece to be tested, the test cartridge comprising:

the performance module comprises at least two performance test circuits and a performance switch which are arranged in the test box, and the performance switch can be selectively communicated with one of the performance test circuits;

2. The test system as claimed in claim 1, further comprising a test socket for connecting with the connection hole, the to-be-tested member being detachably disposed on the test socket.

3. The test system according to claim 2, wherein the test board is provided with a plug member, and the plug member is in plug-fit with the connection hole.

4. The test system of claim 1, further comprising a temperature-sensing chamber for housing the test cartridge.

5. The testing system of claim 4, wherein a visualization window is disposed on the incubator.

6. The test system of claim 1, wherein the performance parameter detection device comprises a graphic meter, the input port comprises a first input port, the output port comprises a first output port, and the test cartridge is coupled to the graphic meter via the first input port and the first output port.

7. The test system of claim 1, wherein the performance parameter detection device comprises a picoammeter, the input port comprises a second input port, the output port comprises a second output port, and the test cartridge is coupled to the picoammeter via the second input port and the second output port.

8. The testing system of claim 1, wherein the channel module further comprises a channel switch in communication with the connection channel, and a channel button is provided on the testing cartridge, the channel button being connected to the channel switch.

9. The test system of claim 8, wherein a reset switch is coupled in series with the channel switch.

10. The test system of claim 1, wherein the channel module is coupled to and receives an indicator.