CN217560513U

CN217560513U - High-frequency probe card measuring structure

Info

Publication number: CN217560513U
Application number: CN202220471797.3U
Authority: CN
Inventors: 张磊
Original assignee: Wuxi Proka Technology Co ltd
Current assignee: Wuxi Proka Technology Co ltd
Priority date: 2022-03-04
Filing date: 2022-03-04
Publication date: 2022-10-11
Anticipated expiration: 2032-03-04

Abstract

The utility model discloses a high frequency probe card measures structure relates to probe card and detects technical field. The utility model discloses a bottom plate, the upper end of bottom plate is provided with fixed picture peg, transversely has seted up a plurality of fixed slots on the fixed picture peg for high frequency probe card's fixing, the one end of bottom plate upper end is fixed with fixed baseplate. The utility model discloses a multi-structure's cooperation design, can move the movable measuring scale with the movable measuring frame drive and move to the one end of keeping away from fixed baseplate, transversely place a plurality of high frequency probe cards between movable measuring scale and fixed baseplate, and insert fixed picture peg upper end and fix, it moves the direction removal of movable measuring scale to fixed baseplate to drive the movable measuring scale again to move the movable measuring frame, when the movable measuring scale is laminated with high frequency probe card for the first time, take out the overlength, move to after the qualified size until the movable measuring scale, when the movable measuring scale is laminated with high frequency probe card for the second time, take out the overlength, remaining is qualified size promptly.

Description

High-frequency probe card measuring structure

Technical Field

The utility model belongs to the technical field of the probe card detects, especially, relate to a high frequency probe card measures structure.

Background

The probe card is a test interface, mainly tests a bare chip, tests chip parameters by connecting a test machine and a chip and transmitting signals, and the high-frequency probe card is also one of the probe cards;

during the production of the high-frequency probe card, the high-frequency probe card is extracted for detection during production for quality assurance; however, some existing high-frequency probe card measuring structures are complex in structure and complex in operation, and the detection efficiency is seriously affected.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a high frequency probe card measures structure to solve current problem: some existing high-frequency probe card measuring structures are complex in structure and complex in operation, and detection efficiency is seriously affected.

In order to solve the technical problem, the utility model discloses a realize through following technical scheme: the utility model provides a high frequency probe card measurement structure, includes the bottom plate, the upper end of bottom plate is provided with fixed picture peg, a plurality of fixed slots have transversely been seted up on the fixed picture peg for high frequency probe card's is fixed, the one end of bottom plate upper end is fixed with fixed base, the both ends position department of bottom plate upper end one side all is fixed with the mount, two be fixed with two horizontal poles between the mount, one of them the horizontal pole is located the upper end of another horizontal pole, two sliding connection has a removal measuring rack on the horizontal pole, the position department that removes one side of measuring rack and be located fixed picture peg upper end is fixed with the removal dipperstick.

Furthermore, the fixed inserting plate is connected with the bottom plate in a sliding mode through the sliding groove.

Furthermore, a return spring is arranged between the movable measuring frame and a fixing frame close to the fixed base, one end of the return spring is fixed with the movable measuring frame, and the other end of the return spring is fixed with the fixing frame close to the fixed base.

Further, the top of the movable measuring frame is further connected with a fixed screw in a threaded mode, the lower end of the fixed screw penetrates through a cross rod at the upper end and is attached to a cross rod at the lower end, and the fixed screw is connected with the cross rod at the upper end in a sliding mode.

Furthermore, the upper end of the bottom plate and one side far away from the fixing frame are provided with scales.

Furthermore, the fixed inserting plate is made of rubber.

The utility model discloses following beneficial effect has:

1. the utility model discloses a multi-structure's cooperation design, can move the movable measuring scale with the movable measuring frame drive and move to the one end of keeping away from fixed baseplate, transversely place a plurality of high frequency probe cards between movable measuring scale and fixed baseplate, and insert fixed picture peg upper end and fix, it moves the direction removal of movable measuring scale to fixed baseplate to drive the movable measuring scale again to move the movable measuring frame, when the movable measuring scale is first with the laminating of high frequency probe card, take the overlength out, move to after the qualified size until the movable measuring scale, when the movable measuring scale is second with the laminating of high frequency probe card, take out the overlength, remaining be qualified size promptly, a structure is simple, high operation convenience, the selective examination efficiency of high frequency probe card has been improved effectively.

2. The utility model discloses a structure cooperation design of mount, horizontal pole, removal measuring rack, reset spring and fixed spiral for when the device uses, can remove the removal measuring rack to the production requirement size according to the production demand, then fix the removal measuring rack through screwing fixed spiral, make things convenient for the high frequency probe card to insert the selective examination on the fixed picture peg one by one; after the fixed screw is unscrewed, the movable measuring frame is driven to reset and be attached to the fixed base to perform zeroing operation through elastic deformation of the reset spring.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to these drawings without creative efforts.

FIG. 1 is a schematic view of the overall structure of the present invention;

fig. 2 is a top view of the overall structure of the present invention;

FIG. 3 is a schematic view of the connection structure between the fixed board and the bottom board of the present invention;

FIG. 4 is a schematic view of the sliding part of the present invention;

fig. 5 is a side sectional view of the sliding part of the present invention.

In the drawings, the components represented by the respective reference numerals are listed below:

1. a base plate; 2. a fixed base; 3. a fixed mount; 4. a cross bar; 5. moving the measuring stand; 6. moving the measuring scale; 7. fixing the inserting plate; 8. calibration; 9. a return spring; 10. the helix is fixed.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by a person skilled in the art without making creative efforts belong to the protection scope of the present invention.

Referring to fig. 1-4, the present invention is a measurement structure of a high frequency probe card, including a bottom plate 1, a fixed board 7 is disposed at the upper end of the bottom plate 1, and a plurality of fixing slots are transversely disposed on the fixed board 7 for fixing the high frequency probe card; in order to facilitate the disassembly of the fixed inserting plate 7 and the cleaning of the fixed inserting plate 7, the fixed inserting plate 7 is connected with the bottom plate 1 in a sliding way through a sliding chute; in order to fix the high-frequency probe card conveniently and reduce the friction of the fixed inserting plate 7 on the high-frequency probe card, the fixed inserting plate 7 is made of rubber;

a fixed base 2 is fixed at one end of the upper end of a bottom plate 1, fixing frames 3 are fixed at the positions of two ends of one side of the upper end of the bottom plate 1, two cross rods 4 are fixed between the two fixing frames 3, one cross rod 4 is positioned at the upper end of the other cross rod 4, a movable measuring frame 5 is connected on the two cross rods 4 in a sliding manner, and a movable measuring scale 6 is fixed at the position of one side of the movable measuring frame 5 and the position of the upper end of a fixed inserting plate 7; the movable measuring scale 6 can be driven to transversely move on the fixed inserting plate 7 through the movable measuring frame 5, and the movable measuring frame 5 is connected with the two cross rods 4 in a sliding manner, so that the effect of limiting the movable measuring frame 5 is achieved, and the movable measuring frame 5 is prevented from rotating when moving; wherein, in order to view the measuring result intuitively, the upper end of the bottom plate 1 and one side far away from the fixed frame 3 are provided with scales 8.

Specifically, in order to realize that the mobile measuring rack 5 can automatically reset each time of moving, a reset spring 9 is arranged between the mobile measuring rack 5 and the fixed rack 3 close to the fixed base 2, one end of the reset spring 9 is fixed with the mobile measuring rack 5, and the other end of the reset spring 9 is fixed with the fixed rack 3 close to the fixed base 2; when the movable measuring frame 5 moves towards the direction far away from the fixed base 2 each time, the reset spring 9 is stretched, and the reset spring 9 accumulates force; when the mobile measuring frame 5 is released, the reset spring 9 releases the stored force through elastic deformation, and pulls the mobile measuring frame 5 to reset for zero operation;

in order to fix the mobile measuring frame 5 after moving and facilitate the one-by-one sampling inspection of the high-frequency probe card, the top end of the mobile measuring frame 5 is further in threaded connection with a fixed spiral 10, the lower end of the fixed spiral 10 penetrates through the cross rod 4 at the upper end to be attached to the cross rod 4 at the lower end, and the fixed spiral 10 is in sliding connection with the cross rod 4 at the upper end; by screwing the fixing screw 10, the fixing screw 10 is attached to the cross rod 4 at the lower end, friction force is increased, and then the movable measuring frame 5 is fixed.

One specific application of this embodiment is:

when in use, the device has two measurement modes:

1. when a plurality of high-frequency probe cards are collectively used for measurement, the movable measuring frame 5 drives the movable measuring scale 6 to move towards the direction far away from the fixed base 2, and the temporary fixation can be carried out by screwing the fixed screw 10; transversely placing a plurality of high-frequency probe cards between a movable measuring scale 6 and a fixed base 2, inserting the high ends of fixed inserting plates 7 for fixing, driving the movable measuring scale 6 to move towards the direction of the fixed base 2 by a movable measuring frame 5, when the movable measuring scale 6 is firstly attached to the high-frequency probe card, drawing out overlong probe cards until the movable measuring scale 6 is moved to a qualified size, and when the movable measuring scale 6 is secondly attached to the high-frequency probe card, drawing out overlong probe cards, and taking out the residual probe cards to be qualified sizes;

2. after the mobile measuring frame 5 drives the mobile measuring scale 6 to directly move to a qualified size position, the mobile measuring frame 5 is fixed by screwing the fixing screw 10, and the high-frequency probe cards are inserted between the mobile measuring scale 6 and the fixed base 2 one by one, wherein the high-frequency probe cards which cannot be inserted are overlong; what can move after insertion is too short.

In the description herein, references to the description of "one embodiment," "an example," "a specific example," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

The preferred embodiments of the present invention disclosed above are intended only to help illustrate the present invention. The preferred embodiments are not intended to be exhaustive or to limit the invention to the precise embodiments disclosed. Obviously, many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles of the invention and its practical applications, to thereby enable others skilled in the art to best understand the invention for and utilize the invention. The present invention is limited only by the claims and their full scope and equivalents.

Claims

1. A high-frequency probe card measurement structure comprising a base plate (1), characterized in that: the upper end of bottom plate (1) is provided with fixed picture peg (7), a plurality of fixed slots have been seted up transversely on fixed picture peg (7) for the fixing of high frequency probe card, the one end of bottom plate (1) upper end is fixed with fixed baseplate (2), the both ends position department of bottom plate (1) upper end one side all is fixed with mount (3), two be fixed with two horizontal poles (4) between mount (3), one of them horizontal pole (4) are located the upper end of another horizontal pole (4), two sliding connection has a removal measuring rack (5) on horizontal pole (4), the one side of removal measuring rack (5) and the position department that is located fixed picture peg (7) upper end are fixed with removal dipperstick (6).

2. The high-frequency probe card measurement structure according to claim 1, wherein: the fixed inserting plate (7) is connected with the bottom plate (1) in a sliding mode through a sliding groove.

3. The high-frequency probe card measurement structure according to claim 1, wherein: a reset spring (9) is arranged between the movable measuring frame (5) and the fixing frame (3) close to the fixing base (2), one end of the reset spring (9) is fixed with the movable measuring frame (5), and the other end of the reset spring (9) is fixed with the fixing frame (3) close to the fixing base (2).

4. The high-frequency probe card measurement structure according to claim 1, wherein: the top of the movable measuring frame (5) is further connected with a fixed screw (10) in a threaded mode, the lower end of the fixed screw (10) penetrates through the transverse rod (4) at the upper end and is attached to the transverse rod (4) at the lower end, and the fixed screw (10) is connected with the transverse rod (4) at the upper end in a sliding mode.

5. The high-frequency probe card measurement structure according to claim 1, wherein: and scales (8) are arranged at the upper end of the bottom plate (1) and on one side far away from the fixing frame (3).

6. The high-frequency probe card measurement structure according to claim 1, wherein: the fixed inserting plate (7) is made of rubber.