CN217505679U - Workpiece defect detection device - Google Patents
Workpiece defect detection device Download PDFInfo
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- CN217505679U CN217505679U CN202220933768.4U CN202220933768U CN217505679U CN 217505679 U CN217505679 U CN 217505679U CN 202220933768 U CN202220933768 U CN 202220933768U CN 217505679 U CN217505679 U CN 217505679U
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Abstract
The utility model provides a work piece defect detecting device, include: a support; the mounting rack is arranged on the bracket in a sliding manner; the placing table is arranged on the bracket; the image acquisition assembly is arranged on the mounting frame in a sliding mode, arranged towards the placing table and used for acquiring image information of the workpiece to be detected; and the lighting assembly is arranged on the mounting frame in a sliding manner and is arranged towards the placing table. The workpiece defect detection device provided by the embodiment of the application can collect the image information of the workpiece to be detected, reduces the influence of the personnel state on the detection result in the workpiece defect identification process, improves the defect detection efficiency, reduces the labor cost of the detection process, provides reliable guarantee for improving the stability of the workpiece quality, improves the illumination environment where the workpiece to be detected is located in the detection process, and greatly improves the adaptability of the workpiece defect detection device to the workpiece structure.
Description
Technical Field
The utility model relates to a work piece defect detection technical field especially relates to a work piece defect detection device.
Background
In industrial production, especially in processing trade and equipment trade, mostly by the operating personnel through the visual inspection, whether there is the defect in the inspection work piece, and the illumination environment of inspection scene very easily arouses operating personnel's visual fatigue, operating personnel need carry out the rest of stage nature in order to alleviate fatigue, thereby in the middle of the process of inspection work piece defect, consumed a large amount of manpowers and efficiency lower, and the inspection result is influenced by operating personnel's state, the easy hourglass is examined, the false retrieval problem appears, and then cause the stability of work piece quality to be difficult to further promote.
SUMMERY OF THE UTILITY MODEL
The present invention aims at least solving one of the technical problems existing in the prior art or the related art.
In view of this, according to the embodiment of the present application, there is provided a workpiece defect detecting apparatus, including:
a support;
the mounting rack is arranged on the bracket in a sliding manner;
the placing table is arranged on the bracket;
the image acquisition assembly is arranged on the mounting frame in a sliding mode, arranged towards the placing table and used for acquiring image information of the workpiece to be detected;
and the lighting assembly is arranged on the mounting frame in a sliding manner and is arranged towards the placing table.
In a possible embodiment, the support is provided with a first guide rail, which is arranged perpendicularly to the placement table, and the mounting frame is slidably arranged on the first guide rail.
In one possible embodiment, the workpiece defect detecting apparatus further includes:
and the image processing assembly is connected with the image acquisition assembly and is used for identifying the defects of the workpiece to be detected based on the image information.
In one possible embodiment, the image acquisition assembly comprises:
the camera support is arranged on the mounting frame in a sliding manner;
and the camera is arranged on the camera support and comprises a body and a lens which are connected, and the lens is arranged towards the placing table.
In a possible embodiment, a second guide rail is provided on the mounting frame, which is arranged perpendicularly to the placement table, on which second guide rail the camera mount is slidably arranged.
In one possible embodiment, the lighting assembly comprises:
the first light source is arranged on the mounting frame in a sliding mode and located between the placing table and the lens, the first light source is of an annular structure, and the first light source and the lens are arranged coaxially;
the second light source is arranged on the mounting frame and located between the placing table and the first light source, the second light source is of an annular structure, and the second light source and the lens are coaxially arranged.
In a possible embodiment, the mounting frame is provided with a third rail, which is arranged perpendicular to the placing table and on which the first light source is slidingly arranged.
In a possible embodiment, the first light source and/or the second light source is a diffuse reflective light source.
In one possible embodiment, the workpiece defect detecting apparatus further includes:
the locating piece is arranged on the placing table.
In one possible embodiment, the workpiece defect detecting apparatus further includes:
the guide piece sets up in placing the bench, is provided with the fourth guide rail on the guide piece, and the fourth guide rail be on a parallel with place the bench and arrange, setting element sliding connection in fourth guide rail.
Compared with the prior art, the utility model discloses at least, including following beneficial effect: the workpiece defect detection device provided by the embodiment of the application comprises a support, a mounting frame, a placing table, an image acquisition assembly and a lighting assembly, wherein the mounting frame and the placing table are arranged on the support, the mounting frame can slide relative to the support, the mounting frame can provide a mounting structure basis for the image acquisition assembly and the lighting assembly, the mounting frame can drive the image acquisition assembly and the lighting assembly to move relative to the support through sliding relative to the support so as to adjust the positions of the image acquisition assembly and the lighting assembly, the placing table is used for placing a workpiece to be detected, the image acquisition assembly and the lighting assembly are arranged on the mounting frame and face the placing table, so that the image acquisition assembly can be used for acquiring image information of the workpiece to be detected, the lighting assembly is used for providing illumination for the workpiece to be detected, the definition of the image information is improved, and the accuracy of defect detection is guaranteed, and then based on the image information that the image acquisition subassembly gathered, can discern the defect characteristic on waiting to detect the work piece, realize the replacement to human eye detection, reduced the influence of personnel state to the testing result in the work piece defect identification process to a great extent to improve defect detection efficiency, reduced the testing process cost of labor, provide reliable guarantee for the stability that improves the work piece quality. Meanwhile, when the mounting frame can slide relative to the support, the image acquisition assembly and the illumination assembly can also slide relative to the mounting frame, so that the relative position between the image acquisition assembly and the workpiece to be detected and the relative position between the illumination assembly and the workpiece to be detected can be further adjusted according to the structural parameters of the workpiece to be detected, the image acquisition assembly can conveniently acquire the image information of the workpiece to be detected, the illumination environment where the workpiece to be detected is located in the detection process is improved, the adaptability of the workpiece defect detection device to the workpiece structure is greatly improved, and the replaceability of the workpiece defect detection device to human eyes is improved.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the exemplary embodiments. The drawings are only for purposes of illustrating exemplary embodiments and are not to be construed as limiting the application. Also, like reference numerals are used to refer to like parts throughout the drawings. In the drawings:
FIG. 1 is a schematic structural diagram of a workpiece defect detecting apparatus according to an embodiment of the present disclosure;
fig. 2 is a schematic usage scenario diagram of a workpiece defect detection apparatus according to an embodiment of the present disclosure.
Wherein, the correspondence between the reference numbers and the component names in fig. 1 and fig. 2 is:
100, a bracket; 200 of a mounting rack; 300 placing a table; 400 an image acquisition component; 500 an illumination assembly; 600 positioning elements; 700 a guide member; 800 a first stop; 900 second limiting piece;
410 a camera mount; 420 a camera; 510 a first light source; 520 a second light source;
421 a machine body; 422 lens;
100' to inspect the workpiece.
Detailed Description
Exemplary embodiments of the present application will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present application are shown in the drawings, it should be understood that the present application may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
According to an embodiment of the present application, there is provided a workpiece defect detecting apparatus, as shown in fig. 1 and 2, including: a bracket 100; a mounting bracket 200 slidably disposed on the bracket 100; a placing table 300 provided on the stand 100; the image acquisition assembly 400 is slidably arranged on the mounting frame 200, the image acquisition assembly 400 is arranged towards the placing table 300, and the image acquisition assembly 400 is used for acquiring image information of the workpiece to be detected; and a lighting assembly 500 slidably disposed on the mounting bracket 200, wherein the lighting assembly 500 is disposed toward the placing table 300.
As shown in fig. 1, the workpiece defect detecting apparatus provided by the embodiment of the present application includes a support 100, a mounting bracket 200, a placing table 300, an image capturing assembly 400, and an illuminating assembly 500, wherein the mounting bracket 200 and the placing table 300 are both disposed on the support 100, and the mounting bracket 200 is slidable with respect to the support 100, the mounting bracket 200 can provide a structural basis for mounting the image capturing assembly 400 and the illuminating assembly 500, and the mounting bracket 200 can drive the image capturing assembly 400 and the illuminating assembly 500 to move with respect to the support 100 through sliding with respect to the support 100, so as to adjust positions of the image capturing assembly 400 and the illuminating assembly 500.
Place platform 300 and be used for placing and wait to detect the work piece, image acquisition subassembly 400 and lighting assembly 500 all set up on mounting bracket 200, and the orientation with place platform 300 and arrange, thereby can utilize image acquisition subassembly 400 to gather the image information who waits to detect the work piece, and utilize lighting assembly 500 to treat that the detection subassembly provides the illumination, with the definition that improves image information, guarantee is provided for the accuracy of defect detection, and then based on the image information that image acquisition subassembly 400 gathered, can discern the defect characteristic on waiting to detect the work piece, realize the replacement to the human eye detection, the influence of work piece defect identification in-process personnel state to the testing result has been reduced to a very big extent, and defect detection efficiency has been improved, the testing process cost of labor has been reduced, provide reliable guarantee for the stability that improves the work piece quality.
It can be understood that the defect detection of the workpiece mainly aims at the appearance defects of the workpiece, such as marks, sand holes, protrusions, black skin, scratches and the like, and the sizes of some defects are small, and the mode of eye inspection is adopted, so that the operation intensity and difficulty of operators are increased, and the problems of misjudgment and misjudgment are easily caused, so that the clear image information of the workpiece to be detected can be obtained by utilizing the image acquisition assembly 400 and the illumination assembly 500 in the workpiece defect detection device, the possibility of misjudgment and misjudgment is reduced, illumination can be matched, the defect characteristics of bright prints, black spots and the like caused by the defects or other defects on the workpiece to be detected can be further conveniently found, and the quality of the workpiece can be further improved.
Meanwhile, when the mounting bracket 200 can slide relative to the bracket 100, the image acquisition assembly 400 and the illumination assembly 500 can also slide relative to the mounting bracket 200, so that the relative position between the image acquisition assembly 400 and the workpiece to be detected and the relative position between the illumination assembly 500 and the workpiece to be detected can be further flexibly adjusted according to the structural parameters of the workpiece to be detected, the image acquisition assembly 400 is convenient to acquire the image information of the workpiece to be detected, the illumination environment where the workpiece to be detected is located in the detection process is improved, the adaptability of the workpiece defect detection device to the workpiece structure is greatly improved, and the replacement of the workpiece defect detection device to human eyes is improved.
In some examples, the bracket 100 is provided with a first rail disposed perpendicular to the placing table 300, and the mounting bracket 200 is slidably provided on the first rail.
The first guide rail perpendicular to the placing table 300 is arranged on the support 100, and the mounting frame 200 is arranged on the first guide rail of the support 100 in a sliding manner, so that the sliding direction of the mounting frame 200 relative to the support 100 can be further restrained, and further, in the detection process, the mounting frame 200 is operated to slide along the first guide rail, so that the mounting frame 200 is close to or far away from the placing table 300, and further, the image acquisition assembly 400 and the illumination assembly 500 can be close to or far away from the workpiece to be detected on the placing table 300, on one hand, the illumination effect of the illumination assembly 500 on the workpiece to be detected can be further improved, the definition of image information is improved, on the other hand, the acquisition range of the image acquisition assembly 400 can also be changed, and the adaptability of the workpiece defect detection device to the workpiece structure is improved.
In some feasible examples, the workpiece defect detecting device further includes a first limiting member 800, the first limiting member 800 is disposed on the bracket 100 and located at one end of the first guide rail close to the placing table 300, so that the first limiting member 800 can be used to limit the stroke of the mounting block 200, prevent the lighting assembly 500 and the image capturing assembly 400 from being excessively close to the workpiece to be detected to cause collision and damage, and prolong the service life of the workpiece defect detecting device.
In some examples, the workpiece defect detection apparatus further includes: and the image processing component is connected with the image acquisition component 400 and is used for identifying the defects of the workpiece to be detected based on the image information.
The workpiece defect detection device further comprises an image processing assembly, the image processing assembly is connected with the image acquisition assembly 400, can receive image information of the workpiece to be detected acquired by the image acquisition assembly 400, and identifies the defect of the workpiece to be detected based on the image information, so that the automation and intelligence level of the workpiece defect detection device is further improved, the accuracy and reliability of a detection result are improved, and the misjudgment rate are reduced.
It can be understood that, in practical applications, the image processing component may include a processor and a memory connected to each other, wherein AI (Artificial Intelligence) vision software is stored in the memory, and the processor may call a program instruction of the AI vision software in the memory to execute a corresponding AI algorithm, so as to identify the defect of the workpiece to be detected according to the image information. Wherein, the AI vision software can be developed secondarily to realize the function improvement.
For example, when being executed, the AI vision software may perform area division on the structure of the workpiece to be detected in the image information according to the image information of the workpiece to be detected, for example, for the workpiece to be detected with a circular ring structure, under the condition that the acquired image information corresponds to the axial end face of the workpiece, the geometric center of the end face may be first positioned, and then an image interval where the end face is located in the image information is intercepted, and the end face is sequentially divided into an inner edge area, a main body area and an outer edge area along the radial direction of the workpiece to be detected.
After the area division of the workpiece structure is completed, defect identification is further performed on each area, and it can be understood that in the image information, brightness differences are formed at defective positions and non-defective positions of the workpiece, for example, bright prints or black spots are formed at the defective positions, so that the positions where the defects exist can be determined based on the brightness differences and the areas where the bright prints or the black spots are located, the types of the defects are determined based on the geometric characteristics of the bright prints or the black spots, the defective areas are determined to be good-quality areas, the non-defective areas are determined to be bad-quality areas, the workpieces including the bad-quality areas are determined to be bad-quality workpieces, and the workpieces not including the bad-quality areas are good-quality workpieces.
Furthermore, in the process of batch detection, defective workpieces and non-defective workpieces can be classified according to the detection result, and further the defective workpieces are classified according to the defect types, so that batch detection data is formed and stored, and the workpieces can be conveniently subjected to workpiece shunting processing by operators.
Meanwhile, in the batch detection data, the detection time, the number of workpieces, the number of defective workpieces, the number of good workpieces, the number of various types of defects, and the number of missed detections can be counted.
Furthermore, the AI vision software can have a deep learning function, and can continuously and deeply learn by accumulating detection data in the production process, so that the identification accuracy is improved, the misjudgment rate and the missed judgment rate are reduced, the quality of workpieces is ensured, and the work efficiency of workpiece detection is improved.
In some examples, as shown in fig. 1, image acquisition assembly 400 includes: a camera mount 410 slidably disposed on the mounting bracket 200; and a camera 420 provided on the camera mount 410, the camera 420 including a body 421 and a lens 422 coupled, the lens 422 being disposed toward the placing table 300.
As shown in fig. 1, the image capturing assembly 400 may include a camera support 410 and a camera 420, wherein the camera support 410 is slidably disposed on the mounting frame 200, a relative position between the camera 420 and the placing table 300 can be adjusted by sliding relative to the mounting frame 200, the camera 420 is used for capturing image information of a workpiece to be detected, and the camera 420 includes a body 421 and a lens 422 connected to the body 421, and the lens 422 is disposed toward the placing table 300 so as to capture image information of the workpiece to be detected.
In some possible examples, camera 420 may be an industrial camera having pixels greater than or equal to 2000 ten thousand.
In some examples, a second guide rail is provided on the mounting bracket 200, the second guide rail being arranged perpendicular to the placing stage 300, and the camera mount 410 being slidably provided on the second guide rail.
The second guide rail perpendicular to the placing table 300 is arranged on the mounting frame 200, and the camera support 410 is arranged on the second guide rail of the mounting frame 200 in a sliding manner, so that the sliding direction of the camera support 410 relative to the mounting frame 200 can be further restricted, and further, in the detection process, the camera support 410 is operated to slide along the second guide rail, so that the camera support 410 is close to or away from the placing table 300, and further, the machine body 421 and the lens 422 can be close to or away from the workpiece to be detected on the placing table 300, so that the acquisition range of the camera 420 is changed, and the adaptability of the workpiece defect detection device to the workpiece structure is improved.
In some feasible examples, as shown in fig. 2, in the case where the workpiece 100 'to be detected is disposed on the placing table 300, a distance H3 between one end of the lens 422 close to the workpiece 100' to be detected and one end of the workpiece 100 'to be detected close to the lens 422 may be set to be greater than or equal to 260mm and less than or equal to 300mm, and a specific value of H3 may be set according to a structural parameter of the workpiece 100' to be detected, preferably, H3 is equal to 280 mm. Meanwhile, the axial length H4 of the lens 422 may be set to be greater than or equal to 30mm and less than or equal to 50mm, preferably, H4 is equal to 38.5 mm.
In some examples, as shown in fig. 1, lighting assembly 500 includes: the first light source 510 is slidably disposed on the mounting frame 200 and located between the placing table 300 and the lens 422, the first light source 510 is of an annular structure, and the first light source 510 and the lens 422 are coaxially arranged; and a second light source 520 disposed on the mounting frame 200 and located between the placing stage 300 and the first light source 510, wherein the second light source 520 is an annular structure, and the second light source 520 is coaxially arranged with the lens 422.
As shown in fig. 1, the lighting assembly 500 includes a first light source 510 and a second light source 520 disposed on the mounting frame 200, wherein the first light source 510 is slidable relative to the mounting frame 200, the first light source 510 is disposed between the placing stage 300 and the lens 422, and the second light source 520 is disposed between the placing stage 300 and the first light source 510, so that under the condition that the workpiece to be detected is disposed on the placing stage 300, multiple illuminations are provided to the workpiece to be detected by the first light source 510 and the second light source 520, thereby further enhancing the illumination effect, improving the illumination environment where the workpiece to be detected is disposed, and improving the definition of image information. Meanwhile, based on the sliding arrangement of the first light source 510 relative to the mounting bracket 200 and the sliding arrangement of the mounting bracket 200 relative to the bracket 100, the relative positions of the first light source 510 and the second light source 520 between the workpieces to be detected can be flexibly adjusted, so that the illumination effect of the workpieces to be detected is further enhanced.
Meanwhile, the first light source 510 and the second light source 520 are both in an annular structure, and the first light source 510 and the second light source 520 are both arranged coaxially with the lens 422, so that the hollow parts of the first light source 510 and the second light source 520 can be utilized, the visual angle of the lens 422 is avoided, and the illumination range and the illumination effect of the workpiece to be detected are improved.
In some feasible examples, the inner diameter of the second light source 520 is larger than the outer diameter of the first light source 510, so that the light emitted by the first light source 510 can be irradiated onto the workpiece to be detected to a greater extent, the illumination effect of the workpiece to be detected is further improved, and the definition of image information is improved.
In some examples, a third guide rail is provided on the mounting frame 200, the third guide rail being arranged perpendicular to the placing stage 300, and the first light source 510 being slidably provided on the third guide rail.
The third guide rail perpendicular to the placing table 300 is arranged on the mounting frame 200, and the first light source 510 is arranged on the third guide rail of the mounting frame 200 in a sliding manner, so that the sliding direction of the first light source 510 relative to the mounting frame 200 can be further restrained, and further, in the detection process, the first light source 510 is operated to slide along the third guide rail, so that the first light source 510 is close to or away from the placing table 300, and therefore, the lighting effect of the first light source 510 on the workpiece to be detected is changed, and more illumination position combinations are formed between the first light source 510 and the second light source 520 by matching with the sliding of the mounting frame 200 along the first guide rail, the lighting flexibility of the workpiece to be detected is improved, the definition of image information is further improved, and the accuracy of a defect detection result is further guaranteed.
In some possible examples, as shown in fig. 1, the workpiece defect detecting apparatus further includes a second limiting member 900, and the second limiting member 900 is disposed on the mounting plate and located between the camera support 410 and the first light source 510, so that the sliding range of the camera support 410 and the sliding range of the first light source 510 can be limited by the second limiting member 900, the camera support 410 and the first light source 510 are prevented from interfering with each other during the sliding process, the possibility of damage to the lens 422 is reduced, the adaptive life of the workpiece defect detecting apparatus is prolonged, and the maintenance cost is reduced.
In some possible examples, as shown in fig. 2, in the case where the workpiece to be detected 100 ' is provided on the placing table 300, a distance H2 between an end of the first light source 510 distant from the workpiece to be detected 100 ' and an end of the workpiece to be detected 100 ' close to the first light source 510 may be set to be greater than or equal to 230mm and less than or equal to 270mm, preferably, H2 is equal to 250 mm. Meanwhile, a distance H1 between an end of the second light source 520 distant from the workpiece 100 'to be inspected and an end of the workpiece 100' to be inspected near the second light source 520 may be set to be greater than or equal to 45mm and less than or equal to 85mm, preferably, H2 is equal to 65 mm.
In some examples, the first light source 510 and/or the second light source 520 are diffuse reflective light sources.
At least one of the first light source 510 and the second light source 520 is a diffuse reflection light source, so that the light emitting characteristic of the diffuse reflection light source can be utilized, and the illumination effect of the workpiece to be detected is further enhanced under the condition that the workpiece to be detected is arranged on the placing table 300, thereby improving the definition of image information and improving the accuracy of a defect detection result.
In some examples, as shown in fig. 1, the workpiece defect detecting apparatus further includes: the positioning member 600 is disposed on the placement stage 300.
As shown in fig. 1, workpiece defect detection device is still including setting up setting element 600 on placing platform 300, is provided with on placing platform 300 and waits to detect under the condition of work piece, and setting element 600 is used for the butt to detect the work piece to treat and detect the work piece and fix a position, thereby in the middle of the image acquisition subassembly 400 gathers image information's process, avoid waiting to detect the work piece and take place the displacement, improve image acquisition efficiency and collection stability, be favorable to promoting image information's definition.
In some examples, as shown in fig. 1, the workpiece defect detecting apparatus further includes: the guide member 700 is disposed on the placing table 300, a fourth guide rail is disposed on the guide member 700, the fourth guide rail is parallel to the placing table 300, and the positioning member 600 is slidably connected to the fourth guide rail.
As shown in fig. 1, the workpiece defect detecting apparatus further includes a guiding element 700 disposed on the placing table 300, a fourth guide rail parallel to the placing table 300 is disposed on the guiding element 700, a positioning element 600 is slidably connected to the fourth guide rail, so that the positioning element 600 can move along a direction parallel to the fourth guide rail, in the process of placing the workpiece to be detected, the positioning position of the workpiece to be detected on the placing table 300 is adjusted, so that the workpiece to be detected is located within the range of the viewing angle of the image collecting assembly 400, the image information of the workpiece to be detected is convenient to collect, and the work efficiency of defect detection is improved.
In the present application, the terms "first", "second", "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance; the term "plurality" means two or more unless expressly limited otherwise. The terms "mounted," "connected," "fixed," and the like are to be construed broadly, and for example, "connected" may be a fixed connection, a removable connection, or an integral connection; "coupled" may be direct or indirect through an intermediary. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.
In the description of the present invention, it should be understood that the terms "upper", "lower", "left", "right", "front", "back", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplification of description, but do not indicate or imply that the device or unit indicated must have a specific direction, be constructed and operated in a specific orientation, and therefore, should not be construed as limiting the present invention.
In the description of the present specification, the terms "one embodiment," "some embodiments," "specific embodiments," and the like, mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
The above is only a preferred embodiment of the present invention, and is not intended to limit the present invention, and various modifications and changes will occur to those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. A workpiece defect detecting apparatus, comprising:
a support;
the mounting rack is arranged on the bracket in a sliding manner;
the placing table is arranged on the bracket;
the image acquisition assembly is arranged on the mounting rack in a sliding manner, is arranged towards the placing table and is used for acquiring image information of the workpiece to be detected;
and the lighting assembly is arranged on the mounting frame in a sliding mode and is arranged towards the placing table.
2. The apparatus for detecting defects in a workpiece according to claim 1,
the support is provided with a first guide rail, the first guide rail is perpendicular to the placing table and is arranged, and the mounting frame is arranged on the first guide rail in a sliding mode.
3. The apparatus for detecting defects in a workpiece according to claim 1, further comprising:
and the image processing component is connected with the image acquisition component and used for identifying the defects of the workpiece to be detected based on the image information.
4. The workpiece defect detection apparatus of claim 1, wherein the image acquisition assembly comprises:
the camera support is arranged on the mounting frame in a sliding mode;
and the camera is arranged on the camera support and comprises a body and a lens which are connected, and the lens is arranged towards the placing table.
5. The apparatus for detecting defects in a workpiece according to claim 4,
the mounting frame is provided with a second guide rail, the second guide rail is perpendicular to the placing table and is arranged, and the camera support is arranged on the second guide rail in a sliding mode.
6. The workpiece defect inspection apparatus of claim 4, wherein the illumination assembly comprises:
the first light source is arranged on the mounting frame in a sliding mode and located between the placing table and the lens, the first light source is of an annular structure, and the first light source and the lens are arranged coaxially;
the second light source is arranged on the mounting frame and located between the placing table and the first light source, the second light source is of an annular structure, and the second light source and the lens are coaxially arranged.
7. The apparatus for detecting defects in a workpiece according to claim 6,
and a third guide rail is arranged on the mounting rack, the third guide rail is perpendicular to the placing table, and the first light source is arranged on the third guide rail in a sliding manner.
8. The apparatus for detecting defects in a workpiece according to claim 6,
the first light source and/or the second light source is a diffuse reflection light source.
9. The workpiece defect detecting apparatus according to any one of claims 1 to 8, further comprising:
the locating piece is arranged on the placing table.
10. The apparatus for detecting defects in a workpiece as set forth in claim 9, further comprising:
the guide piece set up in place the bench, be provided with the fourth guide rail on the guide piece, the fourth guide rail be on a parallel with place the platform and arrange, setting element sliding connection in the fourth guide rail.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220933768.4U CN217505679U (en) | 2022-04-20 | 2022-04-20 | Workpiece defect detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220933768.4U CN217505679U (en) | 2022-04-20 | 2022-04-20 | Workpiece defect detection device |
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| CN217505679U true CN217505679U (en) | 2022-09-27 |
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| CN202220933768.4U Expired - Fee Related CN217505679U (en) | 2022-04-20 | 2022-04-20 | Workpiece defect detection device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116539629A (en) * | 2023-07-06 | 2023-08-04 | 钛玛科（北京）工业科技有限公司 | Integrated machine device for online defect detection |
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2022
- 2022-04-20 CN CN202220933768.4U patent/CN217505679U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116539629A (en) * | 2023-07-06 | 2023-08-04 | 钛玛科（北京）工业科技有限公司 | Integrated machine device for online defect detection |
| CN116539629B (en) * | 2023-07-06 | 2023-11-21 | 钛玛科(江苏)工业科技有限公司 | Integrated machine device for online defect detection |
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